EMIF0-SIM05F EMI filter with SWP protection for SIM interface Datasheet production data Features Lead-free package Very low PCB space consumption Very thin package: < 0.55 mm after reflow High efficiency in ESD suppression IEC6 000-- level High reliability offered by monolithic integration High reduction of parasitic elements through integration and WLCSP packaging Complies with the following standards: IEC 6000-- level ± 5 kv (air discharge) ± 8 kv (contact discharge) Application Mobile phones Description The EMIF0-SIM05F is a highly integrated device designed to protect SIM interface and SWP line against ESD transients and EMI emission. The device is the ideal fit for applications using NFC. Figure. Figure. WLCSP package (9 bumps) Pin configuration (bump side) SWP Functional schematic November 0 Doc ID 08 Rev /9 This is information on a product in full production. www.st.com 9
Characteristics EMIF0-SIM05F Characteristics Table. Absolute maximum ratings (T amb = 5 C) Symbol Parameter Value Unit V PP Internal pins (A, B, C): ESD discharge IEC 6000-- (), level Air discharge Contact discharge External pins (A, A, B, C, C): ESD discharge IEC 6000--, level Air discharge Contact discharge 6 6 kv T j Maximum junction temperature 50 T op Operating temperature range - 0 to + 85 C T stg Storage temperature range - 55 to 50. Measurements done on IEC 6000-- test bench. For further details see Application note AN5, IEC 6000-- standard testing. Figure. Electrical characteristics (definitions) I Symbol Parameter V BR = Breakdown voltage I RM = Leakage current @ V V RM = Stand-off voltage V = Clamping voltage I = Peak pulse current PP RM V V BR V RM I RM V I PP Table. Electrical characteristics (T amb = 5 C) Symbol Test conditions Min. Typ. Max. Unit I RM V RM = V 00 na V BR I R = ma 6 V R, R RST, DATA serial resistor 00 R K serial resistor 7 C line C SWP Line capacitance on RST, DATA, K lines V line = 0 V, V osc = 0 mv, F = MHz (measured under zero light conditions) Line capacitance on SWP line V line = 0 V, V osc = 0 mv, F = MHz (measured under zero light conditions) pf pf /9 Doc ID 08 Rev
EMIF0-SIM05F Characteristics Figure. Attenuation measurements C-C, A-A, B-B Figure 5. Attenuation measurements A-C S(dB) S(dB) 0.00 0.00-5.00-5.00-0.00-0.00-5.00-5.00-0.00-0.00-5.00-0.00 F(Hz) -5.00 F(Hz) 00.0k.0M 0.0M 00.0M.0G -0.00 00.0k.0M 0.0M 00.0M.0G Data Rst Clk SWP Vcc Figure 6. Analog Xtalk measurements Figure 7. Digital crosstalk measurements 0.00 XTalk (db) -0.00 V K = V t R = t F = ns -0.00 Clk -0.00-0.00 Data -50.00-60.00-70.00-80.00-90.00-00.00 F(Hz) -0.00 00.0k.0M 0.0M 00.0M.0G Clk -SWP Rst -Data Clk -Rst Figure 8. Dynamic characteristic (SWP) Figure 9. Dynamic characteristic (V CC ) 0 8 6 0 8 6 0 8 6 I PP (A) V (V) Breakdown Direct Poly. (Breakdown) Poly. (Direct) t P = 00 ns T J initial = 5 C 0 0 5 0 5 0 5 0 5 0 0 8 6 0 8 6 0 8 6 I PP (A) V (V) Breakdown Direct Poly. (Breakdown) Poly. (Direct) t P = 00 ns T J initial = 5 C 0 0 5 0 5 0 5 0 Doc ID 08 Rev /9
Characteristics EMIF0-SIM05F Figure 0. ESD response to IEC 6000-- (+8 kv contact discharge) K line Figure. ESD response to IEC 6000-- (-8 kv contact discharge) K line 5.0 V / Div 5.0 V / Div V :clamping voltage @ 0 ns V :clamping voltage @ 00 ns 0.0 V 7. V 6.8 V. V -9. V - m V -. V -9 m V 0 ns / Div 0 ns / Div V :clamping voltage @ 0 ns V :clamping voltage @ 00 ns Figure. ESD response to IEC 6000-- Figure. ESD response to IEC 6000-- (+8 kv contact discharge) DATA line (-8 kv contact discharge) DATA line 5.0 V / Div 5.0 V / Div V :clamping voltage @ 0 ns V :clamping voltage @ 00 ns 8.8 V 6.6 V 6. V.9 V -9.7 V -5 m V -.7 V -9 m V 0 ns / Div V :clamping voltage @ 0 ns V :clamping voltage @ 00 ns /9 Doc ID 08 Rev
EMIF0-SIM05F Characteristics Figure. ESD response to IEC 6000-- (+8 kv contact discharge) SWP line Figure 5. ESD response to IEC 6000-- (-8 kv contact discharge) SWP line 0 V / Div 0 V / Div 07.6 V V :clamping voltage @ 0 ns V :clamping voltage @ 00 ns -.9 V -.7 V.5 V.5 V 5.6 V -5.0 V V :clamping voltage @ 0 ns V :clamping voltage @ 00 ns -5.0 v 0 ns / Div 0 ns / Div Figure 6. ESD response to IEC 6000-- (+8 kv contact discharge) V CC line Figure 7. ESD response to IEC 6000-- (-8 kv contact discharge) V CC line 0 V / Div 5 V / Div V :clamping voltage @ 0 ns V :clamping voltage @ 00 ns -. V -. V 6. V.V 0V 5.0 V -. V V :clamping voltage @ 0 ns V :clamping voltage @ 00 ns -0.0 v 0 ns / Div 0 ns / Div Doc ID 08 Rev 5/9
Ordering information scheme EMIF0-SIM05F Ordering information scheme Figure 8. Ordering information scheme EMIF yy - xxx zz Fx EMI filter Number of lines Information x = resistance value (ohms) z = capacitance value / 0 (pf) or letters = application digits = version Package F = Flip Chip x = : lead-free, pitch = 00 µm, bump = 55 µm 6/9 Doc ID 08 Rev
EMIF0-SIM05F Package information Package information In order to meet environmental requirements, ST offers these devices in different grades of ECOPACK packages, depending on their level of environmental compliance. ECOPACK specifications, grade definitions and product status are available at: www.st.com. ECOPACK is an ST trademark. Figure 9. WLCSP package dimensions 55 ± 0 µm 00 µm A B C. mm ± 0.05 µm. mm ± 0.05 µm Figure 0. Footprint recommendations Figure. Marking Copper pad Diameter: 0 µm recommended 60 µm maximum Solder mask opening: 00 µm minimum Solder stencil opening: 0 µm recommended Dot, ST logo ECOPACK grade xx = marking z = manufacturing location yww = datecode (y = year ww = week) x y x w z w Doc ID 08 Rev 7/9
Ordering information EMIF0-SIM05F Figure. Tape and reel specification Dot identifying Pin A location 0.0 ± 0.0.0± 0.05.0 ± 0. Ø.50 ± 0.0 8.0 +0. -0.0.0 ± 0.05.75 ± 0..5 ±- 0.05 0.69± 0.05.0 ± 0.05.0 ± 0. All dimensions are typical values in mm User direction of unreeling Note: More information is available in the application notes: AN8, IPAD 00 µm Flip Chip: package description and recommendations for use AN75, EMI filters: recommendations and measurements Ordering information Table. Ordering information Order code Marking Package Weight Base qty Delivery mode EMIF0-SIM05F LB WLCSP.9 mg 5000 Tape and reel (7 ) 5 Revision history Table. Document revision history Date Revision Changes -Nov-0 Initial release. 8/9 Doc ID 08 Rev
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