NI Contents CALIBRATION PROCEDURE

CALIBRATION PROCEDURE NI 5412 Contents Conventions... 2 Introduction... 3 Software and Documentation Requirements... 3 Software...3 Documentation... 4 Self-Calibration Procedures... 5 MAX...5 FGEN Soft Front Panel... 5 NI-FGEN... 6 External Calibration Options... 6 Complete Calibration... 7 Optional Calibration... 9 External Calibration Requirements... 11 Test Equipment... 11 Test Conditions... 12 External Calibration Procedures... 12 Writing the Calibration Procedure... 12 Calibration Procedures in LabVIEW... 13 Calibration Procedures in LabWindows/CVI... 13 Calibration Procedures in C... 13 Verifying NI 5412 Specifications... 13 Verifying the Oscillator Frequency Accuracy... 15 Verifying the DC Gain and Offset Accuracy... 18 Verifying the Main Analog Path Gain... 18 Verifying the Main Analog Path Offset... 23 Verifying the AC Voltage Amplitude Absolute Accuracy... 26 Verifying Frequency Response (Flatness)... 29 Verifying Phase Noise Density and Jitter... 32 Phase Noise Density Measurements (CH 0, 10 MHz)... 33 Jitter Measurement (CH 0, 10 MHz)... 35 Adjusting the NI 5412... 35 Initializing the External Calibration Session... 37 Adjusting the Analog Output... 38

Initializing Analog Output Calibration...38 Adjusting the Main Path Pre-Amplifier Offset...40 Adjusting the Main Path Pre-Amplifier Gain...43 Adjusting the Main Path Post-Amplifier Gain and Offset...46 Adjusting the Oscillator Frequency...49 Adjusting the Calibration ADC...52 Closing the External Adjustment Session...57 Calibration Utilities...57 MAX...57 FGEN SFP...58 NI-FGEN...58 Where to Go for Support...59 Conventions The following conventions are used in this manual:» The» symbol leads you through nested menu items and dialog box options to a final action. The sequence Options»Settings»General directs you to pull down the Options menu, select the Settings item, and select General from the last dialog box. This icon denotes a note, which alerts you to important information. This icon denotes a caution, which advises you of precautions to take to avoid injury, data loss, or a system crash. When this symbol is marked on a product, refer to the Read Me First: Safety and Radio-Frequency Interference for information about precautions to take. bold italic monospace Bold text denotes items that you must select or click in the software, such as menu items and dialog box options. Bold text also denotes parameter names. Italic text denotes variables, emphasis, a cross-reference, or an introduction to a key concept. Italic text also denotes text that is a placeholder for a word or value that you must supply. Text in this font denotes text or characters that you should enter from the keyboard, sections of code, programming examples, and syntax examples. This font is also used for the proper names of disk drives, paths, directories, programs, subprograms, subroutines, device names, functions, operations, variables, filenames, and extensions. NI 5412 Calibration Procedure 2 ni.com

Introduction This document contains instructions for calibrating the NI 5412 arbitrary waveform generator. This calibration procedure is intended for metrology labs. It describes specific programming steps for writing an external calibration procedure for the NI 5412. Refer to ni.com/calibration for additional information about calibration solutions from National Instruments. Software and Documentation Requirements This section describes the software and documentation required for both self-calibration and external calibration of the NI 5412. Software Calibrating the NI 5412 requires installing NI-FGEN version 2.3 or later on the calibration system. You can download NI-FGEN from the National Instruments Web site at ni.com/updates. NI-FGEN supports programming the Self-Calibration Procedures and the External Calibration Procedures in the LabVIEW, LabWindows /CVI, and C application development environments (ADEs). When you install NI-FGEN, you need to install support only for the ADE that you intend to use. NI-FGEN 2.3 or later includes all the functions and attributes necessary for calibrating the NI 5412. For LabWindows/CVI, the NI-FGEN function panel (nifgen.fp) provides help about the functions available. LabVIEW support is in the nifgen.llb file, and all calibration VIs appear in the Functions palette. Calibration functions are C function calls or LabVIEW VIs in NI-FGEN. In this document, the C function call is shown first, followed by the corresponding LabVIEW VI or NI-FGEN LabVIEW property node, in parentheses. The C function calls are valid for any compiler capable of calling a 32-bit DLL. Many of the functions use constants defined in the nifgen.h file. To use these constants in C, you must include nifgen.h in your code when you write the calibration procedure. Refer to Table 1 for file locations. National Instruments Corporation 3 NI 5412 Calibration Procedure

Table 1. Calibration File Locations File Name and Location IVI\Bin\niFgen_32.dll IVI\Lib\msc\niFgen.lib IVI\Lib\bc\niFgen.lib IVI\Include\niFgen.h <LabVIEW>\instr.lib\niFgen\niFgen.llb (LabVIEW) IVI\Drivers\niFgen\niFgen.fp (CVI) Description The NI-FGEN library, which provides the functionality for calibrating the NI 5412. Allows you to create applications that call functions in the nifgen_32.dll: For Microsoft Visual C/C++, link to msc\nifgen.lib. For LabWindows/CVI, link to the library appropriate to your current compatibility mode (msc for Microsoft Visual C/C++). A header file for the accessible functions in the nifgen_32.dll. You must include this file in any C code that you write to call these functions. Contains VIs that correspond to the functions in the nifgen_32.dll. Contains the function panels for the functions in nifgen32.dll. The calibration process is described in the Self-Calibration Procedures and the External Calibration Procedures sections, including step-by-step instructions on calling the appropriate calibration functions. Documentation For information about NI-FGEN and the NI 5412, you may find the following documents helpful: NI Signal Generators Getting Started Guide NI Signal Generators Help NI PXI/PCI-5412 Specifications The NI Signal Generators Getting Started Guide provides instructions for installing and configuring NI signal generators. The NI Signal Generators Help includes detailed information about the NI 5412 and the NI-FGEN functions. You can access this help file by selecting Start»Programs»National Instruments»NI-FGEN» Documentation»NI Signal Generators Help. For the latest versions of NI documentation, refer to ni.com/manuals. NI 5412 Calibration Procedure 4 ni.com

Self-Calibration Procedures The NI 5412 can perform self-calibration, which adjusts the gain and offset of the main analog path. Self-calibration uses only an onboard ADC to measure the output voltage. You can implement self-calibration on the NI 5412 by following procedures similar to the Verifying the DC Gain and Offset Accuracy and the Adjusting the Analog Output procedures. However, output impedance, oscillator frequency, and the calibration ADC are not adjusted during self-calibration. You can initiate self-calibration interactively from Measurement & Automation Explorer (MAX) or from the FGEN Soft Front Panel (SFP). Alternatively, you can initiate self-calibration programmatically using NI-FGEN. MAX To initiate self-calibration from MAX, complete the following steps: 1. Launch MAX. 2. Select My System»Devices and Interfaces»PXI System from the tree control. 3. Select the device that you want to calibrate. 4. Initiate self-calibration in one of the following ways: Click Self-Calibrate in the upper right corner. Right-click the device name and select Self-Calibrate from the drop-down menu. FGEN Soft Front Panel To initiate self-calibration from the FGEN SFP, complete the following steps: 1. Select the device that you want to calibrate using the Device Configuration dialog box (Edit»Device Configuration). 2. Open the Calibration dialog box (Utility»Calibration). 3. Click Perform self-calibration. National Instruments Corporation 5 NI 5412 Calibration Procedure

NI-FGEN To self-calibrate the NI 5412 programmatically using NI-FGEN, complete the following steps: 1. Call nifgen_init (nifgen Initialize VI) to open an NI-FGEN session using the following parameters: resourcename: The name of the device that you want to calibrate. You can find this name under Devices and Interfaces in MAX. IDQuery: VI_TRUE resetdevice: VI_TRUE vi: A pointer to a ViSession. The variable passed by reference through this parameter receives the value that identifies the session created by this function. This value acts as the session handle and is passed as the first parameter to all subsequent NI-FGEN functions. 2. Call nifgen_selfcal (nifgen Self Cal VI) using the following parameter: 3. Call nifgen_close (nifgen Close VI) to close the NI-FGEN session using the following parameter: External Calibration Options External calibration involves both verification and adjustment. Verification is the process of testing the device to ensure that the output accuracy is within certain specifications. You can use verification to ensure that the adjustment process was successful or to determine if the adjustment process needs to be performed. Adjustment is the process of measuring and compensating for device performance to improve the output accuracy. Performing an adjustment updates the calibration date, resetting the calibration interval. The device is guaranteed to meet or exceed its published specifications for the duration of the calibration interval. This document provides two sets of test limits for most verification stages, the calibration test limits and the published specifications. The calibration test limits are more restrictive than the published specifications. If all the output errors determined during verification fall within the calibration test limits, the device is guaranteed to meet or exceed its published specifications for a full calibration interval (two years). For this reason, NI 5412 Calibration Procedure 6 ni.com

Complete Calibration you must verify against the calibration test limits when performing verification after adjustment. If all the output errors determined during verification fall within the published specifications, but not within the calibration test limits, the device meets its published specifications. However, the device may not remain within these specifications for another two years. The device will meet published specifications for the rest of the current calibration interval. In this case, you can perform an adjustment if you want to improve the output accuracy or reset the calibration interval. If some output errors determined during verification do not fall within the published specifications, you must perform an adjustment to restore the device operation to its published specifications. The Complete Calibration section describes the recommended calibration procedure. The Optional Calibration section describes alternate procedures that allow you to skip adjustment if the device already meets its calibration test limits or published specifications. Performing a complete calibration is the recommended way to guarantee that the NI 5412 meets or exceeds its published specifications for a two-year calibration interval. At the end of the complete calibration procedure, you verify that the output error falls within the calibration test limits. Figure 1 shows the programming flow for complete calibration. National Instruments Corporation 7 NI 5412 Calibration Procedure

Self-Calibrate Verify Document Pre-Adjustment Results Adjust (Cal Dates and Temperatures Updated) Verify Document Post-Adjustment Results Yes Meets Calibration Test Limits? No Calibration/ Verification Complete Review Verification/ Adjustment Procedure or Return Device Figure 1. Complete Calibration Programming Flow NI 5412 Calibration Procedure 8 ni.com

Optional Calibration You can choose to skip the adjustment steps of the calibration procedure if the output error is within the calibration test limits or the published specifications during the first verification. If all the output errors determined during the first verification fall within the calibration test limits, the device is guaranteed to meet or exceed its published specifications for a full calibration interval. In this case, you can update the calibration date, effectively resetting the calibration interval, without actually performing an adjustment. Refer to the Adjusting the NI 5412 section for more information. If all the output errors determined during the first verification fall within the published specifications, but not within the calibration test limits, adjustment is also optional. However, you cannot update the calibration date because the device cannot necessarily operate within the published specifications for an additional two years. Note Regardless of the results of the first verification, if you choose to perform an adjustment, you must verify that the output error falls within the calibration test limits at the end of the calibration procedure. National Instruments Corporation 9 NI 5412 Calibration Procedure

Figure 2 shows the programming flow for the optional calibration. Self-Calibrate Verify Document Pre-Adjustment Results Yes Meets Calibration Test Limits? No Yes Meets Published Specifications? No Update Calibration Dates and Temperatures Without Adjusting Results Within Published Specs (Adjustment Optional) No Adjust Anyway? Yes Adjust (Cal Dates and Temperatures Updated) Verify Document Post-Adjustment Results Calibration/ Verification Complete Yes Meets Calibration Test Limits? No Review Verification/ Adjustment Procedure or Return Device Figure 2. Optional Calibration Programming Flow NI 5412 Calibration Procedure 10 ni.com

External Calibration Requirements This section describes the test equipment and test conditions required for calibration. Test Equipment External calibration requires different equipment for each applicable specification. Refer to Table 2 for a list of equipment. Table 2. Equipment Required for Calibrating the NI 5412 Instrument Digital multimeter (DMM) Male banana to female BNC adapter Male BNC to female SMB cable Spectrum analyzer, frequency meter, or signal source analyzer Male BNC to female SMB cable Applicable Specification AC accuracy, DC gain and offset Frequency accuracy Minimum Specifications DCV accuracy: 0.05% DC input impedance: 1 GΩ ACV accuracy: 0.16% AC input impedance: 1 MΩ Bandwidth: 100 khz Recommended Instrument NI PXI-4070 Agilent HP 34401A Keithley 2000 50 Ω, RG-223 Ability to measure 10 MHz or greater sine waves Frequency accuracy to 500 ppb NI PXI-5660 Agilent HP 8560E Agilent HP 53131A or HP 53132A with timebase option 001, 010, or 012 Rohde & Schwarz (R&S) FSUP 50 Ω, RG-223 National Instruments Corporation 11 NI 5412 Calibration Procedure

Table 2. Equipment Required for Calibrating the NI 5412 (Continued) Instrument Power meter/sensor Type N female to SMB plug adapter Signal source analyzer Male SMA to female SMB cable Applicable Specification Frequency response (flatness) Phase noise and jitter Minimum Specifications VSWR: (50 khz to 120 MHz) 1.11 Relative power accuracy: 0.022 db VSWR: 1.3 SSB phase noise (1 Hz) at the offset frequencies must be at least 3 db better than the NI 5412 specification Recommended Instrument R&S NRP-Z91 Pasternak PE9316 R&S FSUP 50 Ω, RG-223 Test Conditions Follow these guidelines to optimize the connections and the environment during calibration: Keep connections to the NI 5412 short. Keep relative humidity below 80%. Maintain a temperature between 18 C and 28 C. Observe the 15 minute warm-up time. External Calibration Procedures Writing the Calibration Procedure The complete external calibration procedure consists of self-calibrating, verifying the performance of the NI 5412, adjusting the calibration constants, and verifying again after the adjustments. In some cases, the complete calibration procedure may not be required. Refer to the External Calibration Options section for more information. The external calibration procedure automatically stores the calibration date to allow traceability. Before you begin to write the calibration program, review the programming flowcharts in Figures 1 and 2. NI 5412 Calibration Procedure 12 ni.com

Verifying NI 5412 Specifications Calibration Procedures in LabVIEW To write calibration procedures in LabVIEW, you must use the VIs included in the nifgen.llb file. After installation, these VIs appear within the NI-FGEN Calibration palette under Functions» Instrument I/O»Instrument Drivers»NI-FGEN»Calibration. Calibration Procedures in LabWindows/CVI To write calibration procedures in LabWindows/CVI, you must use the function panels included in the nifgen.fp file. After installation, you can locate the calibration functions under the Calibration class node. Calibration Procedures in C To write calibration procedures in C, you must include the nifgen.h file in the code that calls the calibration functions, and you must link the nifgen.lib file into the build of your executable. Note Always self-calibrate the NI 5412 before beginning a verification procedure. This section provides instructions for verifying the NI 5412 specifications and for updating the calibration cycle. Verification determines whether the device is performing within its specifications prior to external adjustment. Verification and external adjustment together compose a complete calibration. To verify that the NI 5412 still meets its specifications, you must use NI-FGEN to control the NI 5412. The steps in the verification procedures describe the code that you use to generate the appropriate signals, as well as the NI-FGEN function calls that you make to verify specifications. You can verify the following specifications for the NI 5412: Oscillator frequency accuracy DC gain and offset accuracy AC accuracy Flatness Phase noise The verification procedure for each of these specifications includes setting up, programming, and cleaning up. National Instruments Corporation 13 NI 5412 Calibration Procedure

Note If any of these tests fail immediately after you perform an external adjustment, verify that you have met the required test conditions before you return the NI 5412 to NI for repair. Refer to Table 2 for information about which instrument to use for verifying each specification. Refer to Figure 3 for the names and locations of the NI PXI-5412 and the NI PCI-5412 front panel connectors. Figure 3. NI PXI-5412 and NI PCI-5412 Front Panel Connectors NI 5412 Calibration Procedure 14 ni.com

Verifying the Oscillator Frequency Accuracy This test verifies the frequency accuracy of the oscillator on the NI 5412. The verification involves generating a 10 MHz sine wave with the NI 5412 and measuring the sine wave frequency with one of the instruments from Table 2. To verify the frequency accuracy of the oscillator on the NI 5412, complete the following steps: 1. Connect the NI 5412 CH 0 front panel connector to the instrument measuring the frequency accuracy with a male BNC to female SMB cable. 2. Call nifgen_init (nifgen Initialize VI) using the following parameters: resourcename: The name of the device that you want to verify. You can find this name under Devices and Interfaces in MAX. IDQuery: VI_TRUE resetdevice: VI_TRUE vi: A pointer to a ViSession. The variable passed by reference through this parameter receives the value that identifies the session created by this function. This value acts as the session handle and is passed as the first parameter to all subsequent NI-FGEN functions. 3. Call nifgen_setattributevireal64 to set the sample rate (nifgen property node: Arbitrary Waveform Output»Sample Rate) using the following parameters: attributeid: NIFGEN_ATTR_ARB_SAMPLE_RATE value: 100000000 4. Call nifgen_setattributevireal64 to set the gain (nifgen property node: Arbitrary Waveform Output»Arbitrary Waveform Gain) using the following parameters: attributeid: NIFGEN_ATTR_ARB_GAIN value: 1 Note You can adjust the gain value based on which measuring device you use. National Instruments Corporation 15 NI 5412 Calibration Procedure

5. Call nifgen_setattributevireal64 to set the offset (nifgen property node: Arbitrary Waveform Output»Arbitrary Waveform Offset) using the following parameters: attributeid: NIFGEN_ATTR_ARB_OFFSET value: 0 Note You can adjust the offset value based on which measuring device you use. 6. Call nifgen_setattributeviboolean to set the digital filter state (nifgen property node: Output Attributes»Digital Filter Enabled) using the following parameters: attributeid: NIFGEN_ATTR_DIGITAL_FILTER_ENABLED value: VI_TRUE 7. Call nifgen_setattributevireal64 to set the digital filter interpolation factor (nifgen property node: Output Attributes» Digital Filter Interpolation Factor) using the following parameters: attributeid: NIFGEN_ATTR_DIGITAL_FILTER_INTERPOLATION_FACTOR value: 4 8. Generate an array of waveform samples. Each waveform should have 10 samples per cycle with a total of 500 samples and 50 sine wave cycles. Because you set the sample rate to 100 MS/s and because you are using 10 samples per cycle, the resulting waveform is a 10 MHz sine wave. Note The sample values of this waveform must fall between 1.0 and 1.0. NI 5412 Calibration Procedure 16 ni.com

Calibration Test Limit 9. Call nifgen_createarbwaveform (nifgen Create Arbitrary Waveform VI) using the following parameters: wfmsize: The size in samples (500) of the waveform you created in step 8 wfmdata: The array of waveform samples that you created in step 8 wfmhandle: The variable passed by reference through this parameter receives the value (waveform handle) that identifies the waveform created by this function. 10. Call nifgen_initiategeneration (nifgen Initiate Generation VI) to initiate the waveform generation using the following parameter: 11. Measure the frequency out of the NI 5412. A frequency error of 45 Hz for a 10 MHz signal corresponds to an error of 4.5 ppm. This limit accounts for the initial accuracy and the frequency deviation caused by temperature and aging. Refer to Table 3 for frequency ranges. Table 3. Frequency Ranges Published Specifications ±25 ppm Low High Low High 9,999,955 Hz 10,000,045 Hz 9,999,750 Hz 10,000,250 Hz 12. Call nifgen_abortgeneration (nifgen Abort Generation VI) to abort the waveform generation using the following parameter: 13. Call nifgen_close (nifgen Close VI) to close the instrument driver session, to destroy the instrument driver session and all of its properties, and to release any memory resources NI-FGEN uses. Use the following parameter: National Instruments Corporation 17 NI 5412 Calibration Procedure

Verifying the DC Gain and Offset Accuracy This test verifies the DC gain and offset accuracy of the NI 5412 into a high-impedance load by generating a number of DC voltages and offsets, measuring the voltage with a DMM, and comparing the NI 5412 to the error limits. The DC gain and offset accuracy verification procedure has two subprocedures that verify the following: Main analog path gain Main analog path offset Verifying the Main Analog Path Gain To verify the gain of the NI 5412 main analog path, complete the following steps: 1. Connect the NI 5412 CH 0 front panel connector to the DMM for measuring DC gain and offset accuracy. 2. Call nifgen_init (nifgen Initialize VI) using the following parameters: resourcename: The name of the device that you want to verify. You can find this name under Devices and Interfaces in MAX. IDQuery: VI_TRUE resetdevice: VI_TRUE vi: A pointer to a ViSession. The variable passed by reference through this parameter receives the value that identifies the session created by this function. This value acts as the session handle and is passed as the first parameter to all subsequent NI-FGEN functions. 3. Call nifgen_setattributevireal64 to set the load impedance (nifgen property node: Output»Load Impedance) using the following parameters: attributeid: NIFGEN_ATTR_LOAD_IMPEDANCE value: 10000000000 NI 5412 Calibration Procedure 18 ni.com

4. Call nifgen_setattributeviint32 to set the analog path (nifgen property node: Output Attributes»Analog Path) using the following parameters: attributeid: NIFGEN_ATTR_ANALOG_PATH value: NIFGEN_VAL_MAIN_ANALOG_PATH 5. Call nifgen_setattributevireal64 to set the output impedance (nifgen property node: Basic Operation»Output Impedance) using the following parameters: attributeid: NIFGEN_ATTR_OUTPUT_IMPEDANCE value: 50 6. Call nifgen_setattributeviboolean to enable the analog output (nifgen property node: Basic Operation»Output Enabled) using the following parameters: attributeid: NIFGEN_ATTR_OUTPUT_ENABLED value: VI_TRUE 7. Create an array of waveform samples for the positive full-scale DC waveform. This array should contain 500 samples with each sample having the value 1.0 (representation: double). 8. Call nifgen_createarbwaveform (nifgen Create Arbitrary Waveform VI) using the following parameters: wfmsize: The size in samples (500) of the waveform you created in step 7 wfmdata: The array of waveform samples that you created in step 7 wfmhandle: The variable passed by reference through this parameter receives the value (waveform handle) that identifies the waveform created by this function (positive full-scale handle). 9. Create an array of waveform samples for the negative full-scale DC waveform. This array should contain 500 samples with each sample having the value 1.0 (representation: double). National Instruments Corporation 19 NI 5412 Calibration Procedure

10. Call nifgen_createarbwaveform (nifgen Create Arbitrary Waveform VI) using the following parameters: wfmsize: The size in samples (500) of the waveform that you created in step 9 wfmdata: The array of waveform samples that you created in step 9 wfmhandle: The variable passed by reference through this parameter receives the value (waveform handle) that identifies the waveform created by this function (negative full-scale handle). 11. Call nifgen_setattributevireal64 to set the offset (nifgen property node: Arbitrary Waveform Output»Arbitrary Waveform Offset) using the following parameters: attributeid: NIFGEN_ATTR_ARB_OFFSET value: 0 Repeat steps 12 through 22 for each of the 24 iterations listed in Table 4, changing the Gain value for each iteration. Table 4. Values for Verifying the Gain of the Main Analog Path Iteration Gain Ideal Positive Full-Scale (Volts) Ideal Negative Full-Scale (Volts) Calibration Test Limit (Volts) Published Specification (Volts) 1 12.000000 12.000000 12.000000 ±0.019700 ±0.048500 2 10.000000 10.000000 10.000000 ±0.016500 ±0.040500 3 7.000000 7.000000 7.000000 ±0.011700 ±0.028500 4 5.000000 5.000000 5.000000 ±0.008500 ±0.020500 5 3.500000 3.500000 3.500000 ±0.006100 ±0.014500 6 2.500000 2.500000 2.500000 ±0.004500 ±0.010500 7 2.000000 2.000000 2.000000 ±0.003700 ±0.008500 8 1.650000 1.650000 1.650000 ±0.003140 ±0.007100 9 1.250000 1.250000 1.250000 ±0.002500 ±0.005500 10 0.850000 0.850000 0.850000 ±0.001860 ±0.003900 11 0.600000 0.600000 0.600000 ±0.001460 ±0.002900 12 0.415000 0.415000 0.415000 ±0.001164 ±0.002160 13 0.300000 0.300000 0.300000 ±0.000980 ±0.001700 NI 5412 Calibration Procedure 20 ni.com

Table 4. Values for Verifying the Gain of the Main Analog Path (Continued) Iteration Gain Ideal Positive Full-Scale (Volts) Ideal Negative Full-Scale (Volts) Calibration Test Limit (Volts) Published Specification (Volts) 14 0.205000 0.205000 0.205000 ±0.000828 ±0.001320 15 0.150000 0.150000 0.150000 ±0.000740 ±0.001100 16 0.105000 0.105000 0.105000 ±0.000668 ±0.000920 17 0.075000 0.075000 0.075000 ±0.000620 ±0.000800 18 0.055000 0.055000 0.055000 ±0.000588 ±0.000720 19 0.037500 0.037500 0.037500 ±0.000560 ±0.000650 20 0.026000 0.026000 0.026000 ±0.000542 ±0.000604 21 0.018500 0.018500 0.018500 ±0.000530 ±0.000574 22 0.013000 0.013000 0.013000 ±0.000521 ±0.000552 23 0.009000 0.009000 0.009000 ±0.000514 ±0.000536 24 0.006500 0.006500 0.006500 ±0.000510 ±0.000526 Error Positive Full-Scale Value = (Measured Positive Full-Scale Value) (Ideal Positive Full-Scale Value) Error Negative Full-Scale Value = (Measured Negative Full-Scale Value) (Ideal Negative Full-Scale Value) 12. Call nifgen_setattributevireal64 to set the gain (nifgen property node: Arbitrary Waveform Output»Arbitrary Waveform Gain) using the following parameters: attributeid: NIFGEN_ATTR_ARB_GAIN value: The Gain value listed in Table 4 for the current iteration 13. Call nifgen_setattributeviint32 to choose the positive full-scale DC waveform (nifgen property node: Arbitrary Waveform Output»Arbitrary Waveform Handle) using the following parameters: attributeid: NIFGEN_ATTR_ARB_WAVEFORM_HANDLE value: The wfmhandle from step 8 (positive full-scale handle) 14. Call nifgen_initiategeneration (nifgen Initiate Generation VI) to initiate the waveform generation using the following parameter: 15. Measure the DC voltage output of the NI 5412. This value is the Measured Positive Full-Scale Value. National Instruments Corporation 21 NI 5412 Calibration Procedure

16. Determine the error for positive full-scale using the following formula: Error Positive Full-Scale = (Measured Positive Full-Scale Value) (Ideal Positive Full-Scale Value) Compare this error to the Published Specification or the Calibration Test Limit listed in Table 4. 17. Call nifgen_abortgeneration (nifgen Abort Generation VI) to abort the waveform generation using the following parameter: 18. Call nifgen_setattributeviint32 to choose the negative full-scale DC waveform (nifgen property node: Arbitrary Waveform Output»Arbitrary Waveform Handle) using the following parameters: attributeid: NIFGEN_ATTR_ARB_WAVEFORM_HANDLE value: The wfmhandle from step 10 (negative full-scale handle) 19. Call nifgen_initiategeneration (nifgen Initiate Generation VI) to initiate the waveform generation using the following parameter: 20. Measure the DC voltage out of the NI 5412. This value is the Measured Negative Full-Scale Value. 21. Calculate the error for negative full-scale using the following formula: Error Negative Full-Scale = (Measured Negative Full-Scale Value) (Ideal Full-Scale Value) Compare this error to the Published Specification or the Calibration Test Limit listed in Table 4. 22. Call nifgen_abortgeneration (nifgen Abort Generation VI) to abort the waveform generation using the following parameter: 23. If any of the errors are greater than the Calibration Test Limit, perform an external adjustment. NI 5412 Calibration Procedure 22 ni.com

Verifying the Main Analog Path Offset To verify the offset of the NI 5412 main analog path, complete the following steps: 1. Create an array of waveform samples for the mid-scale DC waveform (0 VDC). This array should contain 500 samples with each sample having the value 0.0 (representation: double). 2. Call nifgen_createarbwaveform (nifgen Create Arbitrary Waveform VI) using the following parameters: wfmsize: The size in samples (500) of the waveform that you created in step 1 wfmdata: The array of waveform samples that you created in step 1 wfmhandle: The variable passed by reference through this parameter receives the value (waveform handle) that identifies the waveform created by this function (mid-scale handle). 3. Call nifgen_setattributeviint32 to choose the mid-scale handle DC waveform (nifgen property node: Arbitrary Waveform Output»Arbitrary Waveform Handle) using the following parameters: attributeid: NIFGEN_ATTR_ARB_WAVEFORM_HANDLE value: The wfmhandle from step 2 (mid-scale handle) Repeat steps 4 through 14 for each of the 24 iterations listed in Table 5, changing the Ideal Positive Offset, Ideal Negative Offset, and Gain values for each iteration. National Instruments Corporation 23 NI 5412 Calibration Procedure

Table 5. Values for Verifying the Offset of the Main Analog Path Iteration Gain Ideal Positive Offset (Volts) Ideal Negative Offset (Volts) Calibration Test Limit (Volts) Published Specification (Volts) 1 12.000000 6.000000 6.000000 ±0.021500 ±0.051500 2 10.000000 5.000000 5.000000 ±0.018000 ±0.043000 3 7.000000 3.500000 3.500000 ±0.012750 ±0.030250 4 5.000000 2.500000 2.500000 ±0.009250 ±0.021750 5 3.500000 1.750000 1.750000 ±0.006625 ±0.015375 6 2.500000 1.250000 1.250000 ±0.004875 ±0.011125 7 2.000000 1.000000 1.000000 ±0.004000 ±0.009000 8 1.650000 0.825000 0.825000 ±0.003388 ±0.007513 9 1.250000 0.625000 0.625000 ±0.002688 ±0.005813 10 0.850000 0.425000 0.425000 ±0.001988 ±0.004113 11 0.600000 0.300000 0.300000 ±0.001550 ±0.003050 12 0.415000 0.207500 0.207500 ±0.001226 ±0.002264 13 0.300000 0.150000 0.150000 ±0.001025 ±0.001775 14 0.205000 0.102500 0.102500 ±0.000859 ±0.001371 15 0.150000 0.075000 0.075000 ±0.000763 ±0.001138 16 0.105000 0.052500 0.052500 ±0.000684 ±0.000946 17 0.075000 0.037500 0.037500 ±0.000631 ±0.000819 18 0.055000 0.027500 0.027500 ±0.000596 ±0.000734 19 0.037500 0.018750 0.018750 ±0.000566 ±0.000659 20 0.026000 0.013000 0.013000 ±0.000546 ±0.000611 21 0.018500 0.009250 0.009250 ±0.000532 ±0.000579 22 0.013000 0.006500 0.006500 ±0.000523 ±0.000555 23 0.009000 0.004500 0.004500 ±0.000516 ±0.000538 24 0.006500 0.003250 0.003250 ±0.000511 ±0.000528 Error Positive Offset Value = (Measured Positive Offset Value) (Ideal Positive Offset Value) Error Negative Offset Value = (Measured Negative Offset Value) (Ideal Negative Offset Value) NI 5412 Calibration Procedure 24 ni.com

4. Call nifgen_setattributevireal64 to set the offset (nifgen property node: Arbitrary Waveform Output»Arbitrary Waveform Offset) using the following parameters: attributeid: NIFGEN_ATTR_ARB_OFFSET value: The Ideal Positive Offset value listed in Table 5 for the current iteration 5. Call nifgen_setattributevireal64 to set the gain (nifgen property node: Arbitrary Waveform Output»Arbitrary Waveform Gain) using the following parameters: attributeid: NIFGEN_ATTR_ARB_GAIN value: The Gain value listed in Table 5 for the current iteration 6. Call nifgen_initiategeneration (nifgen Initiate Generation VI) to initiate the waveform generation using the following parameter: 7. Measure the positive DC voltage out of the NI 5412. This value is the Measured Positive Offset Value. 8. Calculate the error for positive offset using the following formula: Error Positive Offset = (Measured Positive Offset Value) (Ideal Positive Offset Value) Compare this error to the Published Specification or the Calibration Test Limit listed in Table 5. 9. Call nifgen_abortgeneration (nifgen Abort Generation VI) to abort the waveform generation using the following parameter: 10. Call nifgen_setattributevireal64 to set the offset (nifgen property node: Arbitrary Waveform Output»Arbitrary Waveform Offset) using the following parameters: attributeid: NIFGEN_ATTR_ARB_OFFSET value: The Ideal Negative Offset value listed in Table 5 for the current iteration National Instruments Corporation 25 NI 5412 Calibration Procedure

11. Call nifgen_initiategeneration (nifgen Initiate Generation VI) to initiate the waveform generation using the following parameter: 12. Measure the negative DC voltage out of the NI 5412. This value is the Measured Negative Offset Value. 13. Calculate the error for positive offset using the following formula: Error Negative Offset = (Measured Negative Offset Value) (Ideal Negative Offset Value) Compare this error to the Published Specification or the Calibration Test Limit listed in Table 5. 14. Call nifgen_abortgeneration (nifgen Abort Generation VI) to abort the waveform generation using the following parameter: 15. If any of the errors are greater than the Calibration Test Limit, perform an external adjustment. Verifying the AC Voltage Amplitude Absolute Accuracy This test verifies the AC voltage amplitude absolute accuracy of the NI 5412 using a DMM. To verify the AC accuracy of the NI 5412, complete the following steps: 1. Connect the NI 5412 CH 0 front panel connector to the DMM. Connect positive terminal to the center pin of the NI 5412 SMB connector, and connect the negative terminal to the shield. 2. Call nifgen_init (nifgen Initialize VI) using the following parameters: resourcename: The name of the device that you want to verify. You can find this name under Devices and Interfaces in MAX. IDQuery: VI_TRUE resetdevice: VI_TRUE vi: A pointer to a ViSession. The variable passed by reference through this parameter receives the value that identifies the session created by this function. This value acts as the session handle and is passed as the first parameter to all subsequent NI-FGEN functions. 3. Call nifgen_configurechannels (nifgen Configure Channels VI) using the following parameters: Channels: "0" NI 5412 Calibration Procedure 26 ni.com

4. Call nifgen_configuresamplerate (nifgen Set Sample Rate VI) using the following parameters: Sample Rate: 100 Ms/s (100000000) 5. Call nifgen_setattributevireal64 to set the load impedance (nifgen property node: Output»Load Impedance) using the following parameters: attributeid: NIFGEN_ATTR_LOAD_IMPEDANCE value: 1000000 6. Call nifgen_configureoutputmode (nifgen Configure Output Mode VI) using the following parameters: Output Mode: NIFGEN_VAL_OUTPUT_ARB (Arbitrary Waveform) 7. Call nifgen_createwaveformf64 (nifgen Create Waveform (DBL) VI) using the following parameters: wfmsize: The size in samples (2000) of the waveform. wfmdata: The array of waveform samples (double representation). wfmhandle: A pointer to a waveform. The variable passed by reference through this parameter acts as a handle to the waveform and can be used for setting the active waveform, changing the data in the waveform, building sequences of waveforms, or deleting the waveform when it is no longer needed. Note In LabVIEW, you must call the nifgen Util Create Waveform Data VI to generate a single cycle sine wave with 2,000 samples and an amplitude of 1. Wire the output of the nifgen Util Create Waveform Data VI to the Waveform Data Array input of the nifgen Create Waveform (DBL) VI. 8. Configure the DMM using the following settings: Function: AC voltage Range: Refer to Table 6 Input impedance: 1 MΩ National Instruments Corporation 27 NI 5412 Calibration Procedure

Average readings: 4 Digits: 6.5 Note These values assume you are using an NI 4070 DMM. For other DMMs, use the range closest to the values listed in step 8. The input impedance should be equal to or greater than the values indicated in Table 2, Equipment Required for Calibrating the NI 5412. 9. Repeat steps 10 through 15 for each of the 24 iterations listed in Table 6, changing the Gain and DMM Range (V RMS ) values for each iteration. Table 6. Values for Verifying the AC Voltage Amplitude Absolute Accuracy Iteration Gain DMM Range (V RMS ) Expected Amplitude (V RMS ) Test Limit ( V RMS ) Test Limit (+V RMS ) 1 12.000000 50 8.485281 0.085560 0.170413 2 10.000000 50 7.071068 0.0714178 0.142128 3 7.000000 5 4.949747 0.050205 0.099702 4 5.000000 5 3.535534 0.036062 0.071418 5 3.500000 5 2.474874 0.025456 0.050205 6 2.500000 5 1.767767 0.018385 0.036062 7 2.000000 5 1.414214 0.014849 0.028991 8 1.650000 5 1.166726 0.012374 0.024042 9 1.250000 5 0.883883 0.009546 0.018385 10 0.850000 5 0.601041 0.006718 0.012728 11 0.600000 0.5 0.424264 0.004950 0.009192 12 0.415000 0.5 0.293449 0.003642 0.006576 13 0.300000 0.5 0.212132 0.002828 0.004950 14 0.205000 0.5 0.144957 0.0021587 0.003606 15 0.150000 0.5 0.106066 0.001768 0.002828 16 0.105000 0.5 0.074246 0.001450 0.002192 17 0.075000 0.5 0.053033 0.001237 0.001768 18 0.055000 0.5 0.038809 0.001096 0.001485 19 0.037500 0.5 0.026517 0.003359 0.006010 20 0.026000 0.5 0.018385 0.0008910 0.001075 21 0.018500 0.5 0.013081 0.000838 0.000969 NI 5412 Calibration Procedure 28 ni.com

Table 6. Values for Verifying the AC Voltage Amplitude Absolute Accuracy (Continued) Iteration Gain DMM Range (V RMS ) Expected Amplitude (V RMS ) Test Limit ( V RMS ) Test Limit (+V RMS ) 22 0.013000 0.5 0.009192 0.000799 0.000891 23 0.009000 0.5 0.006364 0.000771 0.000834 24 0.006500 0.5 0.004596 0.000753 0.000799 10. Call nifgen_setattributevireal64 (nifgen property node: Arbitrary Waveform»Gain) to set the gain using the following parameters: attributeid: NIFGEN_ATTR_ARB_GAIN value: The Gain value listed in Table 6 for the current iteration 11. Call nifgen_initiategeneration (nifgen Initiate Generation VI) using the following parameter: 12. Wait 15 seconds for the output of the NI 5412 to settle. 13. Measure and record the output voltage amplitude with the DMM. This value is the measured amplitude, measuredv RMS. 14. Calculate the peak amplitude error using the following equation: expectedvrms measuredv RMS = error 15. Compare the output error to the test limits in Table 6 for the current iteration. 16. Call nifgen_abortgeneration (nifgen Abort Generation VI) to abort the current generation using the following parameter: 17. If any of the errors are greater than the test limits, perform an external adjustment. Verifying Frequency Response (Flatness) This test verifies the frequency response (flatness) of the NI 5412 using a power meter. To verify the flatness of the NI 5412, complete the following steps: 1. Connect the NI 5412 CH 0 front panel connector to the power meter using the required adapter. National Instruments Corporation 29 NI 5412 Calibration Procedure

2. Call nifgen_init (nifgen Initialize VI) using the following parameters: resourcename: The name of the device that you want to verify. You can find this name under Devices and Interfaces in MAX. IDQuery: VI_TRUE resetdevice: VI_TRUE vi: A pointer to a ViSession. The variable passed by reference through this parameter receives the value that identifies the session created by this function. This value acts as the session handle and is passed as the first parameter to all subsequent NI-FGEN functions. 3. Call nifgensetattributeviboolean (nifgen property node: Output»Output Enabled) to disable the NI 5412 output. Use the following parameters: attributeid: NIFGEN_ATTR_OUTPUT_ENABLED value: VI_FALSE 4. Null the power meter according to the power meter documentation. 5. Configure the power meter using the following settings: Average: 16 Measure watts Channel 0 power sensor connected to the NI 5412 High accuracy 6. Call nifgen_configurechannels (nifgen Configure Channels VI) using the following parameters: Channels: "0" 7. Call nifgen_configuresamplerate (nifgen Set Sample Rate VI) using the following parameters: Sample Rate: 100 MS/s (100000000) 8. Call nifgen_createwaveformf64 (nifgen Create Waveform (DBL) VI) using the following parameters: wfmsize: The size in samples of the waveform NI 5412 Calibration Procedure 30 ni.com

wfmarray: The array of waveform samples (double representation) wfmhandle: A pointer to a waveform. The variable passed by reference through this parameter acts as a handle to the waveform and can be used for setting the active waveform, changing the data in the waveform, building sequences of waveforms, or deleting the waveform when it is no longer needed. Note In LabVIEW, you must call the Sine Pattern VI to create an array of waveform samples with an amplitude of 1, and samples and cycles that correspond to the current iteration in Table 7. Wire the Sinusoidal Pattern output of the Sine Pattern VI to the Waveform Data Array input of the nifgen Create Waveform (DBL) VI. Table 7. NI 5412 Setup for Frequency Response (Flatness) Verification Iteration Frequency (Hz) Number of Samples Number of Cycles 1 50,000 2,000 1 2 1,000,000 1,000 10 3 2,000,000 1,000 20 4 3,000,000 1,000 30 5 4,000,000 1,000 40 6 5,000,000 1,000 50 7 6,000,000 1,000 60 9. Call nifgen_configurearbwaveform (nifgen Configure Arbitrary Waveform VI) using the following parameters: wfmhandle: The waveform handle returned from nifgen_createwaveformf64. Gain: 1 Offset: 0 10. Call nifgen_initiategeneration (nifgen Initiate Generation VI) using the following parameter: 11. Allow the power meter to stabilize for 10 seconds. National Instruments Corporation 31 NI 5412 Calibration Procedure

12. Measure and record the reference (50 khz) power (W ref ) of the positive output in Watts. 13. Configure the NI 5412 and power meter frequency according to the next iteration in Table 7. 14. Using the recorded power values, calculate the deviation from the reference (50 khz) power using the following equation: W f W ref Flatness( db) = 10 log --------- 15. Call nifgen_abortgeneration (nifgen Abort Generation VI) to abort the current generation using the following parameter: 16. Repeat steps 8 through 15 for each iteration in Table 7. 17. If any of the errors are greater than the test limits, perform an external adjustment. Verifying Phase Noise Density and Jitter This test verifies the phase noise density and jitter measurements of the NI 5412 using a signal source analyzer. To verify the phase noise density and jitter of the NI 5412, complete the following steps: 1. Set the signal source analyzer to the default device configuration, and configure it using the following settings: Measurement mode: Phase noise Center frequency: 10 MHz Level: 0 dbm Spot noise offset frequencies: Refer to Table 8 Sweep mode: Normal Frequency span: 100 Hz to 10 khz Table 8. Offset Frequency Field Settings for Spot Noise Offset Freq Field Offset Freq1 Offset Freq2 Offset Freq3 Set to Frequency 100 Hz 1 khz 10 khz NI 5412 Calibration Procedure 32 ni.com

Phase Noise Density Measurements (CH 0, 10 MHz) 1. Connect the NI 5412 CH 0 front panel connector to the signal source analyzer. Note Use high-quality 50 Ω cables. Keep the cables as short as possible for all connections. 2. Call nifgen_init (nifgen Initialize VI) using the following parameters: resourcename: The name of the device that you want to verify. You can find this name under Devices and Interfaces in MAX. IDQuery: VI_TRUE resetdevice: VI_TRUE vi: A pointer to a ViSession. The variable passed by reference through this parameter receives the value that identifies the session created by this function. This value acts as the session handle and is passed as the first parameter to all subsequent NI-FGEN functions. 3. Call nifgen_configurechannels (nifgen Configure Channels VI) using the following parameters: Channels: "0" 4. Call nifgen_configuresamplerate (nifgen Set Sample Rate VI) using the following parameters: Sample Rate: 100 MS/s (100000000) 5. Call nifgen_setattributevireal64 to set the load impedance (nifgen property node: Output»Load Impedance) using the following parameters: attributeid: NIFGEN_ATTR_LOAD_IMPEDANCE value: 50 6. Call nifgen_configureoutputmode (nifgen Configure Output Mode VI) using the following parameters: Output Mode: Arbitrary Waveform 7. Call nifgen_cleararbmemory (nifgen Clear Arbitrary Memory VI) using the following parameter: National Instruments Corporation 33 NI 5412 Calibration Procedure

8. Create an array of waveform samples. Call nifgen_createwaveformf64 (nifgen Create Waveform (DBL) VI) using the following parameters: wfmsize: The size in samples of the waveform wfmdata: The array of waveform samples (double representation) wfmhandle: The wfmhandle value returned by nifgen_createwaveformf64 Note In LabVIEW, you must call the Sine Pattern VI to create an array of waveform samples. Specify 20 samples, an amplitude of 1, and 2 cycles. Wire the Sinusoidal Pattern output of the Sine Pattern VI to the Waveform Data Array input of the nifgen Create Waveform (DBL) VI. 9. Call nifgen_configurearbwaveform (nifgen Configure Arbitrary Waveform VI) using the following parameters: wfmhandle: The wfmhandle value returned by nifgen_createwaveformf64 Gain: 1 Offset: 0 10. Call nifgen_initiategeneration (nifgen Initiate Generation VI) using the following parameter: 11. Take a new phase noise measurement. 12. Record the 10 MHz output Spot Noise readings. 13. Compare the readings to the appropriate System Phase Noise Density (dbc/hz) Offset in Table 9. Device (Sample Clock Source) Table 9. Phase Noise Density Accuracy Verification System Phase Noise Density (dbc/hz) Offset 100 Hz 1 khz 10 khz NI PXI-5412 100 118 120 NI PCI-5412 90 110 120 NI 5412 Calibration Procedure 34 ni.com

Jitter Measurement (CH 0, 10 MHz) Note The jitter measurement uses the same waveform that you generated for phase noise measurements. 1. Set the signal source analyzer start frequency to 100 Hz. 2. Set the signal source analyzer span stop frequency to 100 khz. 3. Take a new phase noise measurement. 4. Record the CH 0, 10 MHz RMS jitter reading. 5. Compare the reading to Integrated Jitter in Table 10 for the appropriate device. Table 10. Jitter Accuracy Verification Device (Sample Clock Source) Integrated Jitter * NI PXI-5412 NI PCI-5412 <6 ps RMS <7 ps RMS * Jitter is integrated from 100 Hz to 100 khz using the internal Reference clock. Adjusting the NI 5412 If the NI 5412 successfully passes all verification within the calibration test limits, adjustment is recommended, but not required, to guarantee its published specifications for the next two years. If the NI 5412 was not within the calibration test limits for each verification procedure, perform the adjustment procedure to improve the accuracy of the NI 5412. Refer to the External Calibration Options section to determine which procedures to perform. An adjustment is required only once every two years. The adjustment procedure automatically updates the calibration date and temperature in the EEPROM of the NI 5412. National Instruments Corporation 35 NI 5412 Calibration Procedure

If the NI 5412 passed verification within the calibration test limits and you do not want to do an adjustment, you can update the calibration date and onboard calibration temperature without making any adjustments by completing the following steps: 1. Call nifgen_initextcal (nifgen Init Ext Cal VI) to open an NI-FGEN external calibration session using the following parameters: resourcename: The name of the device you want to calibrate. You can find this name under Devices and Interfaces in MAX. password: The password required to open an external calibration session. If this password has not been changed since manufacturing, the password is "NI". vi: A pointer to a ViSession. The variable passed by reference through this parameter receives the value that identifies the external calibration session created by this function. This value acts as the session handle and is passed as the first parameter to all subsequent NI-FGEN functions. 2. Call nifgen_closeextcal (nifgen Close Ext Cal VI) using the following parameters: action: NIFGEN_VAL_EXT_CAL_COMMIT The external calibration procedure adjusts the analog output, the oscillator frequency, and the calibration ADC. Analog output adjustment characterizes the DC gains and the offsets of the analog path to ensure the analog output voltage accuracy. Adjusting the oscillator frequency adjusts the onboard oscillator to ensure frequency accuracy. Calibration ADC adjustment characterizes the onboard ADC gain and offset so that self-calibration results in an accurately calibrated device. You cannot perform an external calibration using a standard NI-FGEN session. You must create an external calibration session using nifgen_initextcal (nifgen Init Ext Cal VI). An external calibration session allows you to use NI-FGEN functions and attributes that are specifically for external calibration, while still allowing you to use all the standard NI-FGEN functions and attributes with the external calibration session. Along with the standard NI-FGEN attributes, the external calibration session uses a set of calibration constants that are determined during the calibration procedure and stored in the device onboard memory when the session is closed. NI-FGEN uses these calibration constants during a standard NI-FGEN session to ensure that the device operates within its specifications. NI 5412 Calibration Procedure 36 ni.com