Features SLEW VDD. TA=25 o C unless otherwise noted

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FDG90D Slew Rate Control Driver IC for P-Channel MOSFETs April 2002 FDG90D General Description The FDG90D is specifically designed to control the turn on of a P-Channel MOSFET in order to limit the inrush current in battery switching applications with high capacitance loads. During turn-on the FDG90D drives the MOSFET s gate low with a regulated current source, thereby controlling the MOSFET s turn on. For turn-off, the IC pulls the MOSFET gate up quickly, for efficient turn off. Features Three Programmable slew rates Reduces inrush current Minimizes EMI Normal turn-off speed Low-Power CMOS operates over wide voltage range Applications Power management Battery Load switch Compact industry standard SC70-5 surface mount package GATE 5 GND pin SLEW 2 VDD 3 LOGIC IN Absolute Maximum Ratings TA=25 o C unless otherwise noted Symbol Parameter Ratings Units V DD Supply Voltage -0.5 to 0 V V IN DC Input Voltage (Logic Inputs) -0.7 to 6 V P D Power Dissipation for Single Operation @ 85 C 50 mw T J, T STG Operating and Storage Junction Temperature Range -65 to +50 C Recommended Operating Range V DD Supply Voltage 2.7 to 6.0 V T J Operating Temperature -0 to +25 C Thermal Characteristics R θja Thermal Resistance, Junction-to-Ambient (Note ) 25 C/W Package Marking and Ordering Information Device Marking Device Reel Size Tape width Quantity 9 FDG90D 7 8mm 3000 units 2002 Fairchild Semiconductor Corporation FDG90D rev. E (W)

Electrical Characteristics T A = 25 C unless otherwise noted Symbol Parameter Test Conditions Min Typ Max Units Logic Levels V IH Logic HIGH Input Voltage V DD = 2.70V to 6.0 V V IL Logic LOW Input Voltage V DD = 2.70V to 6.0 V 75% of V DD 25% of V DD OFF Characteristics BV IN Logic Input Breakdown Voltage I IN = 0µA, V SLEW = 0 V 9 V BV SLEW Slew Input Breakdown Voltage I SLEW = 0µA, V IN = 0 V 9 V BV DG Supply Input Breakdown Voltage I DG = 0µA, V IN = 0 V, V SLEW = 0 V 9 V I RIN LOGIC Input Leakage Current V IN = 8 V, V SLEW = 0 V 00 na I RSLEW SLEW Input Leakage Current V SLEW = 8 V, V IN = 0 V 00 na I RDG Supply Input Leakage Current V DG = 8 V, V IN = 0 V, V SLEW = 0 V 00 na ON Characteristics I G Gate Current V IN = 6V SLEW = OPEN 90 20 µa V GATE = 2V SLEW = GND 0 µa Switching Characteristics t don Output Turn-On Delay Time Slew Pin = OPEN t don Output Turn-On Delay Time Slew Pin = GROUND t don Output Turn-On Delay Time Slew Pin = VDD t rise Output Rise Time Slew Pin = OPEN t rise Output Rise Time Slew Pin = GROUND t rise Output Rise Time Slew Pin = VDD dv/dt Output Slew Rate Slew Pin = OPEN dv/dt Output Slew Rate Slew Pin = GROUND dv/dt Output Slew Rate Slew Pin = VDD V Supply = 5.5 V, V DD = 5.5 V, Logic IN = 5.5 V, C LOAD = 50 pf, Test Circuit V Supply = 5.5 V, V DD = 5.5 V, Logic IN = 5.5 V, C LOAD = 50 pf, Test Circuit V Supply = 5.5 V, V DD = 5.5 V, Logic IN = 5.5 V, C LOAD = 50 pf, Test Circuit SLEW = V DD 0 50 na V V 8.3 µs 0.6 ms 2.2 ms 28 µs.8 ms ms 62 V/ms 2.6 V/ms 0.3 V/ms FDG90D Notes: R θja is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. R θjc is guaranteed by design while R θca is determined by the user's board design. VDD V SUPPLY SLEW 2 3 C Load LOGIC IN 0% 90% LOGIC IN 5 OUTPUT (Inverted) 0% tdon Test Circuit trise Switching Waveforms FDG90D rev. D (W)

Typical Characteristics 00 95 Slew = Open Vdd=Vin=6V 2.0 Slew = Gnd Vdd=Vin=6V FDG90D 90.5 Gate Current, (µa) 85 80 75 Gate Current (µa).0 70 0.5 65 60-50 0 50 00 50 Temperature, ( o C) 0.0-50 0 50 00 50 Temperature, ( o C) Figure. GATE Output current vs. Temperature. SLEW = OPEN Figure 2. GATE Output current vs. Temperature. SLEW = Ground Gate Current, (na) 2 0 8 6 Slew = Vdd Vdd=Vin=6V Output Risetime, microseconds (µsec) 00 0 Slew = Open Vdd=Vin=5.5V -50 0 50 00 50 Temperature, ( o C) 0. 0 00 000 Load Capacitance, picofarad (pf) Figure 3. GATE Output current vs. Temperature. SLEW = V DD Figure. t rise vs. Load Capacitance. SLEW = OPEN Output Risetime, microseconds (µs) 0000 000 00 0 Slew = Gnd Vdd=Vin=5.5V Output Risetime, milliseconds (ms) 00 0 Slew = Vdd Vdd=Vin=5.5V 0 00 000 Load Capacitance, picofarad (pf) 0. 0 00 000 Load Capacitance, picofarad (pf) Figure 5. t rise vs. Load Capacitance. SLEW = GROUND Figure 6. t rise vs. Load Capacitance. SLEW = V DD FDG90D rev. D (W)

I Source Drain Gate Load Logic Signal Slew Rate Control 2 VDD 3 5 Ig Application Circuit Typical Application Battery powered systems make extensive usage of load switching, turning the power to subsystems off, in order to extend battery life. Power MOSFETs are used to accomplish this task. In PDA s and Cell phones, these MOSFETs are usually low threshold P-Channels. Since the loads typically include bypass capacitor components (high capacitive component), a high inrush current can occur when the load is switched on. This inrush current can cause transients on the main power supply disturbing circuitry supplied by it. The simplest method of limiting the inrush current is to control the slew rate of the MOSFET switch. This can be done with external R/C circuits, but this approach can occupy significant PCB area, and involves other compromises in performance. The slew rate control driver IC FDG90D is specifically designed to interface low voltage digital circuitry with power MOSFETs and reduce the rapid inrush current in load switch applications. The IC limits inrush current by controlling the current, which drives the gate of the P-Channel MOSFET switch. The control input is a CMOS compatible input with a minimum high input voltage of 2.55V with a power rail voltage of 6V. Therefore, it is compatible with any CMOS logic voltages between 2.55V and 5V and under these conditions there is no additional configuration required. FDG90D rev. D (W)

The Slew Rate Control Driver (FDG90D) is designed to give a programmed choice of one of three steady dv/dt states on the output during turn-on. To change the dv/dt value, the user needs to use the Slew Rate Control Pin (Pin 2). To utilize the smallest current setting ( 0 na) from the IC, a voltage equal to Vdd must be applied to the Slew Rate Control Pin 2. To use the next higher current setting ( µa) a voltage equal to Ground must be applied to Pin 2. To achieve the highest current setting ( 80 µa) or obtain a faster switching speed, the Slew Rate Pin2 must be open (floating). A higher value of capacitance will result in a slower switching rate. To determine the switching times of each setting use the simple equation: Q t = I where Q g is the Gate charge in nc for a given MOSFET and I G is the gate current controlled by the slew rate pin. Below is a captured image from an oscilloscope depicting the device response. The FDG90D was connected to control an FDG258P P-Channel DMOS. The Slew Rate control pin was set to open (floating state). g G Test Conditions: V DD = 5.5V V IN = 5.5V R LOAD =.5Ω V IN V gate (inverted) V RLoad Circuit waveforms for an FDG90D controlling a P-Channel FDG258P MOSFET. FDG90D rev. D (W)

TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks ACEx Bottomless CoolFET CROSSVOLT DenseTrench DOME EcoSPARK E 2 CMOS TM EnSigna TM FACT FACT Quiet Series STAR*POWER is used under license DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS LIFE SUPPORT POLICY FAIRCHILD S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION As used herein: Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user PRODUCT STATUS DEFINITIONS Definition of Terms FAST â FASTr FRFET GlobalOptoisolator GTO HiSeC I 2 C ISOPLANAR LittleFET MicroFET MicroPak MICROWIRE OPTOLOGIC â OPTOPLANAR PACMAN POP Power27 PowerTrench QFET QS 2 A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness Datasheet Identification Product Status Definition â QT Optoelectronics Quiet Series SILENT SWITCHER â SMART START SPM STAR*POWER Stealth SuperSOT -3 SuperSOT -6 SuperSOT -8 SyncFET TinyLogic TruTranslation UHC UltraFET â VCX Advance Information Preliminary No Identification Needed Formative or In Design First Production Full Production This datasheet contains the design specifications for product development Specifications may change in any manner without notice This datasheet contains preliminary data, and supplementary data will be published at a later date Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design This datasheet contains final specifications Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor The datasheet is printed for reference information only Rev H5