ELECTRONICS TESTING CENTER, TAIWAN Report No.:13-12-RBO-024 EMC TESTING DEPARTMENT Page: 1/24

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Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 1/24 CONFORMNCE TEST REPORT FOR EN 50155 & EN 50121-3-2 Report No.: 13-12-RBO-024 ccording to: Electromagnetic Compatibility Directive: 2004/108/EC Low Voltage Directive: 2006/95/EC Radio Equipment and Telecommunications Terminal Equipment: 1999/5/EC Machinery Directives: 98/37/EC Client: Product: Model No.: Comment Issues: Manufacturer/supplier: Date test item received: 2013/12/10 Date test campaign completed: 2014/02/05 Date of issue 2014/02/10 Vecow Embedded Computing System Vecow ECS Series; ECS-XXXX; ECS-7XXX; ECS-5XXX; ECS-5600-3R510EW4 N/ Vecow The test result only corresponds to the tested sample. It is not permitted to copy this report, in part or in full, without the permission of the test laboratory. Total number of pages of this test report: 24 pages Total number of pages of this test photos: 11 pages Test Engineer Checked By pproved By ndy Chang Licher Chen nderson Ku ELECTRONICS TESTING CENTER, TIWN NO. 34. LIN 5. DINGFU, LINKOU DIST., NEW TIPEI CITY, TIWN, 24442, R.O.C. TEL: (02) 26023052 INT: +886-2-26023052 FX: (02) 26010910 INT: +886-2-26010910 Laboratory Introduction: Electronics Testing Center, Taiwan is recognized, filed and mutual recognition arrangement as following: ISO9001: TüV Product Service ISO/IEC 17025: BSMI, CNL, DGT, NVLP, CCIBLC, UL, Compliance Filing: FCC, Industry Canada, VCCI MR: ustralia, Hong Kong, New Zealand, Singapore, US, Japan, Korea, China, PLC through CNL FCC Registration Number: 90588, 91094, 91095

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 2/24 CONTENTS EMC TEST REPORT... 1 CONTENTS... 2 1 TEST REPORT CERTIFICTION... 4 2 GENERL INFORMTIONS... 5 2.1 Description of EUT:... 5 2.2 Related Information of EUT:... 5 2.3 Tested Configuration:... 5 2.4 Deviation Record:... 5 2.5 Modification Record:... 5 2.6 Note:... 5 2.7 Measurement Uncertainty... 6 3 SUMMRY OF TEST RESULTS... 7 3.1 Emissions:... 7 3.1.1 Conducted Emissions... 7 3.1.2 Radiated Emissions... 7 3.2 Immunity:... 8 3.2.1 Immunity Criteria:... 8 3.2.2 Electrostatic Discharge Immunity:... 8 3.2.3 RF Radiated Fields Immunity:... 8 3.2.4 EFT/Burst Immunity:... 8 3.2.5 Surge Immunity:... 9 3.2.6 RF Common Mode Immunity:... 9 4 TEST DT & RELTED INFORMTIONS... 10 4.1 Emissions:... 10 4.1.1 Conducted Emissions Test:... 10 4.1.1.1 Conducted Emissions Test Data:... 10 4.1.2 Radiated Emissions Test:... 13 4.1.2.1 Radiated Emissions Test Data:... 13 4.2 Immunity:... 16 4.2.1 Electrostatic Discharge Immunity Test:... 16 4.2.1.1 Electrostatic Discharge Immunity Test Data:... 16 4.2.2 RF Radiated Fields Immunity Test:... 19 4.2.2.1 RF Radiated Fields Immunity Test Data:... 19 4.2.3 EFT/Burst Immunity Test:... 21 4.2.3.1 EFT/Burst Immunity Test Data:... 21 4.2.4 Surge Immunity Test:... 22 4.2.4.1 Surge Immunity Test Data:... 22

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 3/24 4.2.5 RF Common Mode Immunity Test:... 23 4.2.5.1 RF Common Mode Immunity Test Data:... 23 5 EQUIPMENTS LIST FOR TESTING... 24 NNEX : PHOTOS... 1~11

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 4/24 1 TEST REPORT CERTIFICTION Client ddress Manufacturer ddress EUT Trade Name Model No. Comment Issues : Vecow : 12F., No. 111, Zhongcheng Rd., Tucheng Dist., New Taipei City 23674 Taiwan (R. O. C.) : Vecow : 12F., No. 111, Zhongcheng Rd., Tucheng Dist., New Taipei City 23674 Taiwan (R. O. C.) : Embedded Computing System : Vecow : Vecow ECS Series; ECS-XXXX; ECS-7XXX; ECS-5XXX; ECS-5600-3R510EW4 : N/ Test Standard : EN 50121-3-2:2006 Emissions EN 50155:2007 CISPR11:2009/1:2010 Immunity EN 61000-4-2:2009 EN 61000-4-3:2006/1:2008 EN 61000-4-4:2004/1:2010/:2012 EN 61000-4-5:2006 EN 61000-4-6:2009 The testing described in this report has been carried out to the best of our knowledge and ability, and our responsibility is limited to the exercise of reasonable care. This certification is not intended to believe the sellers from their legal and/or contractual obligations.

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 5/24 2.1 Description of EUT: 2 GENERL INFORMTIONS Embedded Computing System DRM: Vecow Wide-Temp DDR3 4GB RM M340S-W28M1 2.2 Related Information of EUT: Power Supply : DC 24V Power Line : Nonshielded Shielded None, length: m Signal Line : Nonshielded Shielded None, length: m Control Line : Nonshielded Shielded None, length: m * For more detailed features, please refer to User s Manual. 2.3 Tested Configuration: The EUT connected with the following peripheral devices. Following peripheral devices and interface cables were connected during the measurement: Product Manufacturer Model No. Power/Line Embedded Computing System Vecow Vecow ECS Series; ECS-XXXX; ECS-7XXX; ECS-5XXX; ECS-5600-3R510E W4 ---- 2.4 Deviation Record: (If any deviation from additions to or exclusions from test method must be stated) N/ 2.5 Modification Record: No modifications were required. (That is the EUT complied with the requirement as tested.) 2.6 Note: Implementation of the EN 50121-3-2 tests, This Product is no Ground Line.

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 6/24 2.7 Measurement Uncertainty Electromagnetic Interference Measurement Frequency Uncertainty Conducted emissions 150kHz ~ 30MHz ±2.5dB(Mains) Conducted emission at telecommunication ports 150kHz ~ 30MHz ±2.22dB(Voltage) ±2.88dB(Current) Magnetic emissions 9kHz ~ 30MHz ±2.5dB Radiated emissions 30MHz ~ 1GHz ±3.90dB(30MHz f 300MHz) ±3.95dB(300MHz<f 1GHz) bove 1GHz ±4.42dB(1GHz f 18GHz) ±4.86dB(18GHz f 40GHz) Electromagnetic Susceptibility Measurement Item Uncertainty Electrostatic Discharges (ESD) --- ±0.22() 58.67(V) Radiated RF electromagnetic Fields --- ±1.2(dBμV) Electrical Fast Transients and bursts --- ±2.95(V) Surges --- ±2.95(V) Conducted Disturbances, induced by RF fields --- ±0.7(dB) Power-frequency Magnetic Field --- ±1.49(dB) Voltage Dips, Interruptions, and variations --- ±4.18(V) This uncertainty represents an expanded uncertainty expressed at approximately the 95% confidence level using a coverage factor of k=2.

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 7/24 3.1 Emissions: 3 SUMMRY OF TEST RESULTS 3.1.1 Conducted Emissions PSS(Negative) EMI value to the limit: -17.5 db at 2.4480 MHz PSS(Positive) EMI value to the limit: -19.1 db at 2.4480 MHz 3.1.2 Radiated Emissions (30MHz to 1GHz) PSS(Horizontal) EMI value to the limit: PSS(Vertical) EMI value to the limit: -3.90 db at 164.8300 MHz -9.00 db at 112.4500 MHz Notes: The measured value lies in the limited range that is the limit plus or minus estimated measurement uncertainty. The judgment between pass or fail is decided by buyers.

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 8/24 3.2 Immunity: 3.2.1 Immunity Criteria: The results of all of the immunity tests performed on the EUT were evaluated according to the following criteria, and according to the manufacturer s specifications for the EUT: Performance criterion : Performance criterion B: Performance criterion C: The EUT continued to operate as intended. No degradation of performance or loss of function was allowed below a performance level specified by the manufacturer, when the EUT was used as intended. The EUT continued to operate as intended after the test. No degradation of performance or loss of function was allowed below a performance level specified by the manufacturer, when the EUT was used as intended. During the test, degradation of performance was however allowed. No change of actual operating state or stored data was allowed. Temporary loss of function was allowed, provided the function was self recoverable or could be restored by the operation of the controls. 3.2.2 Electrostatic Discharge Immunity: - No Degradation of Function - Distortion of Function - Error of Function Requirement: Criterion B (or better) - Satisfies Criterion - Satisfies Criterion B - Satisfies Criterion C 3.2.3 RF Radiated Fields Immunity: - No Degradation of Function - Distortion of Function - Error of Function Requirement: Criterion - Satisfies Criterion - Satisfies Criterion B - Satisfies Criterion C 3.2.4 EFT/Burst Immunity: - No Degradation of Function - Distortion of Function - Error of Function Requirement: Criterion - Satisfies Criterion - Satisfies Criterion B - Satisfies Criterion C

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 9/24 3.2.5 Surge Immunity: - No Degradation of Function - Distortion of Function - Error of Function Requirement: Criterion B (or better) - Satisfies Criterion - Satisfies Criterion B - Satisfies Criterion C 3.2.6 RF Common Mode Immunity: - No Degradation of Function - Distortion of Function - Error of Function Requirement: Criterion - Satisfies Criterion - Satisfies Criterion B - Satisfies Criterion C

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 10/24 4 TEST DT & RELTED INFORMTIONS 4.1 Emissions: 4.1.1 Conducted Emissions Test: 4.1.1.1 Conducted Emissions Test Data:. Operating Conditions of the EUT: Operation Test Date: Dec.17,2013 Test Specification EN 50155 (CISPR11) Climatic Condition mbient Temperature: 23 Relative Humidity: 52 % RH Power Supply System DC Power: 24 Vdc Test data see the next pages.

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 11/24 Site : conducted #1 Date : 12-17-2013 Condition : EN50121-3-2 QP LISN : NEUTRL Tem / Hum : 23 / 52% Test Mode : Operation Mode EUT : Embedded Computing System Power Rating : DC24V Memo : Memo : Freq Reading Factor Emission Level Limit Line Over Limit Remark (MHz) (dbuv) (db) (dbuv) (dbuv) (db) 0.4062 63.7 10.3 74.0 99.0-25.0 QP 1.2230 63.8 10.5 74.3 93.0-18.7 QP 2.0330 64.6 10.5 75.1 93.0-17.9 QP 2.4480 65.0 10.5 75.5 93.0-17.5 QP 2.8390 46.2 10.5 56.7 93.0-36.3 QP 4.0700 58.3 10.5 68.8 93.0-24.2 QP Note : 1. Result = Reading + Factor 2. Factor = LISN Factor + Cable Loss

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 12/24 Site : conducted #1 Date : 12-17-2013 Condition : EN50121-3-2 QP LISN : LINE Tem / Hum : 23 / 52% Test Mode : Operation Mode EUT : Embedded Computing System Power Rating : DC24V Memo : Memo : Freq (MHz) Reading (dbuv) Factor (db) Emission Level (dbuv) Limit Line (dbuv) Over Limit (db) Remark 0.4083 63.9 10.3 74.2 99.0-24.8 QP 0.8131 54.5 10.3 64.8 93.0-28.2 QP 1.2230 62.7 10.4 73.1 93.0-19.9 QP 2.0330 61.3 10.5 71.8 93.0-21.2 QP 2.4480 63.4 10.5 73.9 93.0-19.1 QP 2.8390 38.1 10.5 48.6 93.0-44.4 QP Note : 1. Result = Reading + Factor 2. Factor = LISN Factor + Cable Loss

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 13/24 4.1.2 Radiated Emissions Test: 4.1.2.1 Radiated Emissions Test Data:. Operating Conditions of The EUT: Operation Mode Test Date: Dec. 18, 2013 Test Specification EN 50155 (CISPR11) Climatic Condition mbient Temperature: 23 Relative Humidity: 56 % RH Power Supply System DC Power: 24 Vdc Test data see the next pages.

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 14/24 (30MHz to 1GHz) Site :Open site #2 Date :2013-12-18 EUT :Embedded Computing System nt. Pol. :HORIZONTL Model :Vecow ECS Series ECS-5600-3R510EW4 Detector :QP Power Rating :DC24V Engineer :ndy.chang Limit :CLSS- Temp. :23 C Memo : Humi. :56 % Freq MHz Reading dbuv Correction Factor db Result dbuv/m Limits dbuv/m Over limit db 114.3900 15.91 13.19 29.10 40.00-10.90 164.8300 22.75 13.35 36.10 40.00-3.90 194.9000 15.81 14.29 30.10 40.00-9.90 255.0400 18.15 16.05 34.20 47.00-12.80 292.8700 16.64 18.26 34.90 47.00-12.10 314.2100 16.39 18.51 34.90 47.00-12.10 Note : 1. Result = Reading + Corrected Factor 2. Corrected Factor = ntenna Factor + Cable Loss - mplifier Gain (if any) 3. The margin value=limit - Result

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 15/24 Site :Open site #2 Date :2013-12-18 EUT :Embedded Computing System nt. Pol. :VERTICL Model :Vecow ECS Series ECS-5600-3R510EW4 Detector :QP Power Rating :DC24V Engineer :ndy.chang Limit :CLSS- Temp. :23 C Memo : Humi. :56 % Freq MHz Reading dbuv Correction Factor db Result dbuv/m Limits dbuv/m Over limit db 47.4600 19.61 11.19 30.80 40.00-9.20 112.4500 17.97 13.03 31.00 40.00-9.00 190.0500 17.00 13.00 30.00 40.00-10.00 255.0400 8.95 16.05 25.00 47.00-22.00 306.4500 6.06 18.44 24.50 47.00-22.50 336.5200 6.39 18.71 25.10 47.00-21.90 Note : 1. Result = Reading + Corrected Factor 2. Corrected Factor = ntenna Factor + Cable Loss - mplifier Gain (if any) 3. The margin value=limit - Result

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 16/24 4.2 Immunity: 4.2.1 Electrostatic Discharge Immunity Test: 4.2.1.1 Electrostatic Discharge Immunity Test Data:. Operating Conditions of the EUT: Operation Mode Test Date: Feb. 23, 2014 Test Specification EN 61000-4-2 Climatic Condition mbient Temperature: 23 Relative Humidity: 52 % RH tmospheric Pressure: 990 mbar Power Supply System DC Power: 24 Vdc Energy-Storage Capacitor :150 pf Contact Discharge Times :25 times/each condition Discharge Resistor :330 ir Discharge Times :10 times/each condition \ Discharge Mode Contact Discharge ir Discharge \ESD Voltage 2 kv 4 kv 6 kv kv 2 kv 4 kv 8 kv kv \Points\Result\Polarity VCP --- --- --- --- --- --- --- --- --- --- HCP --- --- --- --- --- --- --- --- --- --- P1 ~ P8, P12 ~ P13 --- --- --- --- --- --- --- --- --- --- P9 ~ P11, P14 ~ P18 --- --- --- --- --- --- --- --- --- --- Result: Complied Does not comply Criterion Required: B Criterion Met: Note: means the EUT continued to operate as intended. No degradation of performance or loss of function was allowed below a performance level specified by the manufacturer, when the EUT was used as intended.

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 17/24 TEST POINTS

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 18/24 TEST POINTS

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 19/24 4.2.2 RF Radiated Fields Immunity Test: 4.2.2.1 RF Radiated Fields Immunity Test Data:. Operating Conditions of the EUT: Operation Mode Test Date: Feb. 23, 2014 Test Specification EN 61000-4-3 Climatic Condition mbient Temperature: 22 Relative Humidity: 52 RH Power Supply System DC Power: 24 Vdc Frequency Range 80 MHz ~ 1000 MHz Field Strength 20 V/m Modulation (M 1kHz 80%) Sweep Rate : 1.5 10-3 ecades/s Step Size : 1 % of preceding frequency value Dwell Time : 3 s Frequency Range (MHz) Polarization of Device Directing of Device Test Result Front 80 MHz ~ 1000 MHz Horizontal Rear Left Right Front 80 MHz ~ 1000 MHz Vertical Rear Left Right Frequency Range 1400 MHz ~ 2100 MHz Field Strength 10 V/m Modulation (M 1kHz 80%) Sweep Rate : 1.5 10-3 ecades/s Step Size : 1 % of preceding frequency value Dwell Time : 3 s Frequency Range (MHz) Polarization of Device Directing of Device Test Result Front 1400 MHz ~ 2100 MHz Horizontal Rear Left Right Front 1400 MHz ~ 2100 MHz Vertical Rear Left Right

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 20/24 Frequency Range 2100 MHz ~ 2500 MHz Field Strength 5 V/m Modulation (M 1kHz 80%) Sweep Rate : 1.5 10-3 ecades/s Step Size : 1 % of preceding frequency value Dwell Time : 3 s Frequency Range (MHz) Polarization of Device Directing of Device Test Result Front 2100 MHz ~ 2500 MHz Horizontal Rear Left Right Front 2100 MHz ~ 2500 MHz Vertical Rear Left Right Result: Complied Does not comply Criterion Required: Criterion Met: Note: means the EUT continued to operate as intended. No degradation of performance or loss of function was allowed below a performance level specified by the manufacturer, when the EUT was used as intended.

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 21/24 4.2.3 EFT/Burst Immunity Test: 4.2.3.1 EFT/Burst Immunity Test Data:. Operating Conditions of the EUT: Operation Mode Test Date : Dec. 23, 2013 Test Specification EN 61000-4-4 Climatic Condition mbient Temperature: 22 C Relative Humidity: 52 %RH tmospheric Pressure: 990 mbar Power Supply System DC Power: 24 Vdc Pulse : 5 /50ns Burst : 15ms /300ms Voltage\Polarity\Test Point\Mode\Result Repetition Rate : 5kHz Test time : 1 min/each condition 2.0 kv + - Power Line Signal Line PV+ to PV- LN Cable Result: Complied Does not comply Criterion Required: B Criterion Met: Note: means the EUT continued to operate as intended. No degradation of performance or loss of function was allowed below a performance level specified by the manufacturer, when the EUT was used as intended.

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 22/24 4.2.4 Surge Immunity Test: 4.2.4.1 Surge Immunity Test Data:. Operating Conditions of the EUT: Operation Mode Test Date : Feb. 23, 2014 Test Specification EN 61000-4-5 Climatic Condition mbient Temperature: 22 C Relative Humidity: 52 %RH tmospheric Pressure: 990 mbar Power Supply System DC Power : POWER OFF Waveform : 1.2/50 s(8/20 s) Repetition rate : 60 sec Times : POWER 5 time/each condition Phase\Voltage \Mode \Polarity \Result 1kV PV+ to PV- + Result: Complied Does not comply Criterion Required: B Criterion Met: Note: means the EUT continued to operate as intended. No degradation of performance or loss of function was allowed below a performance level specified by the manufacturer, when the EUT was used as intended.

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 23/24 4.2.5 RF Common Mode Immunity Test: 4.2.5.1 RF Common Mode Immunity Test Data:. Operating Conditions of the EUT: Operation Mode Test Date : Dec.23,2013 Test Specification EN 61000-4-6 Climatic Condition mbient Temperature: 22 C Relative Humidity: 52 %RH Power Supply System DC Power: 24 Vdc Frequency Range 0.15MHz ~80MHz Test Level 10Vrms Modulation (M 1kHz 80%) Sweep Rate : 1.5 10-3 decades/s Step Size : 1 % of preceding frequency value Dwell Time : 3 s Frequency Range (MHz) Tested Line Test Result 0.15MHz ~80MHz CDN-M2 0.15MHz ~80MHz CDN-RJ45 Result: Complied Does not comply Criterion Required: Criterion Met: Note: means the EUT continued to operate as intended. No degradation of performance or loss of function was allowed below a performance level specified by the manufacturer, when the EUT was used as intended.

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 24/24 5 EQUIPMENTS LIST FOR TESTING Item Name Manufacturer Model Calibration Date Recommended Recal. Date 1 EMI Test Receiver Rohde & Schwarz ESCI 2013/08/02 2014/08/01 2 LISN EMCO 3625/2 2013/05/07 2014/05/06 3 LISN Rohde & Schwarz ESH2-Z5 2013/04/12 2014/04/11 4 Current Probe Rohde & Schwarz ESH2-Z1 2013/08/06 2014/08/05 5 ISN FCC FCC-TLISN-T2-02 2013/10/05 2014/10/04 6 ISN FCC FCC-TLISN-T4-02 2013/09/20 2014/09/19 7 Test Receiver Rohde & Schwarz ESVS30 2013/05/06 2014/05/05 8 mplifier HP 8447D 2013/08/08 2014/08/07 9 EMI Test Receiver Rohde & Schwarz ESL 2013/09/11 2014/09/10 10 Bi-Log ntenna ETC MCTD 2756 2014/01/03 2015//01/02 11 Test Receiver Rohde & Schwarz ESU40 2013/09/24 2014/09/23 12 mplifier HP 8449B 2014/01/15 2015/01/14 13 Horn ntenna EMCO 3115 2013/08/02 2014/08/01 14 ESD Simulator NoiseKen ESS-2002 2013/07/30 2014/07/29 15 ntenna Sunal Sciences JB6 N/ N/ 16 signal Generator glient EMC330 2013/3/13 2014/3/12 17 mplifier Ophir 5172 N/ N/ 18 mplifier Ophir 5127 N/ N/ 19 POWER METER Booton 4232 2013/9/27 2014/9/26 20 EMC Immunity tester EMC-PRTNER Harmonics-2000 2013/08/07 2014/08/06 21 CS TESTER FRNKONI CIT-10 2013/05/06 2014/05/05 22 CDN-M2/M3 FRNKONI M2/M3 2013/05/10 2014/05/09 23 SCHFFUER CS-CLMP KEMZ801 2013/05/11 2014/05/10

Report No.: 13-12-RBO-024 EMC TESTING DEPRTMENT Page: 1/11 NNEX : PHOTOS 1. Conducted Emissions Test Setup Photos

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 2/11 2. Radiated Emissions Test Setup Photos (30MHz to 1GHz)

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 3/11 3. Electrostatic Discharge Immunity Test Setup Photo

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 4/11 4. RF Radiated Fields Immunity Test Setup Photo

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 5/11 5. EFT/Burst Immunity Test Setup Photo TEST MODE: DC TEST MODE: LN

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 6/11 6. Surge Immunity Test Setup Photo

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 7/11 7. RF Common Mode Immunity Test Setup Photo TEST MODE:DC TEST MODE:LN

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 8/11 8. Outside view 1 of EUT 9. Outside view 2 of EUT

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 9/11 10. Outside view 3 of EUT 11. Inside view 1 of EUT

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 10/11 12. Inside view 2 of EUT 13. Front view of PCB 1

Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 11/11 14. Rear view of PCB 1