CD74HC534, CD74HCT534, CD74HC564, CD74HCT564

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Transcription:

Data sheet acquired from Harris Semiconductor SCHS188 January 1998 CD74HC534, CD74HCT534, CD74HC564, CD74HCT564 High Speed CMOS Logic Octal D-Type Flip-Flop, Three-State Inverting Positive-Edge Triggered [ /Title (CD74 HC534, CD74 HCT53 4, CD74 HC564, CD74 HCT56 Features Buffered Inputs Common Three-State Output-Enable Control Three-State Outputs Bus Line Driving Capability Typical Propagation Delay = 13ns at = 5V, C L = 15pF, T A = 25 o C (Clock to Output) Fanout (Over Temperature Range) - Standard Outputs............... 10 LSTTL Loads - Bus Driver Outputs............. 15 LSTTL Loads Wide Operating Temperature Range... -55 o C to 125 o C Balanced Propagation Delay and Transition Times Significant Power Reduction Compared to LSTTL Logic ICs HC Types - 2V to 6V Operation - High Noise Immunity: N IL = 30%, N IH = 30% of at = 5V HCT Types - 4.5V to 5.5V Operation - Direct LSTTL Input Logic Compatibility, V IL = 0.8V (Max), V IH = 2V (Min) - CMOS Input Compatibility, I l 1µA at V OL, V OH Description The Harris CD74HC534, CD74HCT534, CD74HC564 and CD74HCT564 are high speed Octal D-Type Flip-Flops manufactured with silicon gate CMOS technology. They possess the low power consumption of standard CMOS integrated circuits, as well as the ability to drive 15 LSTTL loads. Due to the large output drive capability and the three-state feature, these devices are ideally suited for interfacing with bus lines in a bus organized system. The two types are functionally identical and differ only in their pinout arrangements. The CD74HC534, CD74HCT534, CD74HC564 and CD74HCT564 are positive edge triggered flip-flops. Data at the D inputs, meeting the setup and hold time requirements, are inverted and transferred to the Q outputs on the positive going transition of the CLOCK input. When a high logic level is applied to the ENABLE input, all outputs go to a high impedance state, regardless of what signals are present at the other inputs and the state of the storage elements. The CD74HCT logic family is speed, function, and pin compatible with the standard 74LS logic family. Ordering Information PART NUMBER TEMP. RANGE ( o C) PACKAGE PKG. NO. CD74HC534E -55 to 125 20 Ld PDIP E20.3 CD74HCT534E -55 to 125 20 Ld PDIP E20.3 CD74HC564E -55 to 125 20 Ld PDIP E20.3 CD74HCT564E -55 to 125 20 Ld PDIP E20.3 CD74HC564M -55 to 125 20 Ld SOIC M20.3 CD74HCT564M -55 to 125 20 Ld SOIC M20.3 NOTES: 1. When ordering, use the entire part number. Add the suffix 96 to obtain the variant in the tape and reel. 2. Wafer and die for this part number is available which meets all electrical specifications. Please contact your local sales office or Harris customer service for ordering information. Pinouts CD74HC534, CD74HCT534 (PDIP) CD74HC564, CD74HCT564 (PDIP, SOIC) TOP VIEW TOP VIEW OE 1 20 OE 1 20 Q0 2 19 Q7 D0 2 19 Q0 D0 D1 Q1 Q2 D2 D3 Q3 3 4 5 6 7 8 9 18 17 16 15 14 13 12 D7 D6 Q6 Q5 D5 D4 Q4 D1 D2 D3 D4 D5 D6 D7 3 4 5 6 7 8 9 18 17 16 15 14 13 12 Q1 Q2 Q3 Q4 Q5 Q6 Q7 10 11 CP 10 11 CP CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures. Copyright Harris Corporation 1998 1 File Number 1640.1

Functional Diagram CD74HC534, CD74HCT534, CD74HC564, CD74HCT564 D 0 D 1 D 2 D 3 D 4 D 5 D 6 D 7 D Q D Q D Q D Q D Q D Q D Q D Q CP CP CP CP CP CP CP CP CP OE Q 0 Q 1 Q 2 Q 3 Q 4 Q 5 Q 6 O 7 TRUTH TABLE S OE CP Dn Qn L H L L L H L L X No Change H X X Z NOTE: H = High Level (Steady State) L = Low Level (Steady State) X = Don t Care = Transition from Low to High Level Z = High Impedance State 2

Absolute Maximum Ratings DC Supply,........................ -0.5V to 7V DC Input Diode, I IK For V I < -0.5V or V I > + 0.5V......................±20mA DC Output Diode, I OK For V O < -0.5V or V O > + 0.5V....................±20mA DC Drain, per Output, I O For -0.5V < V O < + 0.5V..........................±35mA DC Output Source or Sink per Output Pin, I O For V O > -0.5V or V O < + 0.5V....................±25mA DC or Ground, I CC.........................±50mA Thermal Information Thermal Resistance (Typical, Note 3) θ JA ( o C/W) PDIP Package............................. 125 SOIC Package............................. 120 Maximum Junction Temperature....................... 150 o C Maximum Storage Temperature Range..........-65 o C to 150 o C Maximum Lead Temperature (Soldering 10s)............. 300 o C (SOIC - Lead Tips Only) Operating Conditions Temperature Range, T A...................... -55 o C to 125 o C Supply Range, HC Types.....................................2V to 6V HCT Types.................................4.5V to 5.5V DC Input or Output, V I, V O................. 0V to Input Rise and Fall Time 2V...................................... 1000ns (Max) 4.5V...................................... 500ns (Max) 6V....................................... 400ns (Max) CAUTION: Stresses above those listed in Absolute Maximum Ratings may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. NOTE: 3. θ JA is measured with the component mounted on an evaluation PC board in free air. DC Electrical Specifications PARAMETER HC TYPES High Level Input Low Level Input High Level Output CMOS Loads High Level Output TTL Loads Low Level Output CMOS Loads Low Level Output TTL Loads Input Leakage SYMBOL TEST CONDITIONS 25 o C -40 o C TO 85 o C -55 o CTO125 o C V I (V) I O (ma) (V) MIN TYP MAX MIN MAX MIN MAX V IH - - 2 1.5 - - 1.5-1.5 - V 4.5 3.15 - - 3.15-3.15 - V 6 4.2 - - 4.2-4.2 - V V IL - - 2 - - 0.5-0.5-0.5 V 4.5 - - 1.35-1.35-1.35 V 6 - - 1.8-1.8-1.8 V V OH V IH or V IL -0.02 2 1.9 - - 1.9-1.9 - V -0.02 4.5 4.4 - - 4.4-4.4 - V -0.02 6 5.9 - - 5.9-5.9 - V - - - - - - - - - V -6 4.5 3.98 - - 3.84-3.7 - V -7.8 6 5.48 - - 5.34-5.2 - V V OL V IH or V IL 0.02 2 - - 0.1-0.1-0.1 V 0.02 4.5 - - 0.1-0.1-0.1 V 0.02 6 - - 0.1-0.1-0.1 V I I or - - - - - - - - - V 6 4.5 - - 0.26-0.33-0.4 V 7.8 6 - - 0.26-0.33-0.4 V - 6 - - ±0.1 - ±1 - ±1 µa 3

DC Electrical Specifications (Continued) PARAMETER Quiescent Device Three- State Leakage HCT TYPES High Level Input Low Level Input High Level Output CMOS Loads High Level Output TTL Loads Low Level Output CMOS Loads Low Level Output TTL Loads Input Leakage Quiescent Device Three- State Leakage Additional Quiescent Device Per Input Pin: 1 Unit Load SYMBOL I CC V IL or V IH or V O = or V IH - - 4.5 to 5.5 V IL - - 4.5 to 5.5 0 6 - - 8-80 - 160 µa - 6 - - ±0.5 - ±5.0 - ±10 µa 2 - - 2-2 - V - - 0.8-0.8-0.8 V V OH V IH or V IL -0.02 4.5 4.4 - - 4.4-4.4 - V -6 4.5 3.98 - - 3.84-3.7 - V V OL V IH or V IL 0.02 4.5 - - 0.1-0.1-0.1 V I I I CC V IL or V IH I CC TEST CONDITIONS 25 o C -40 o C TO 85 o C -55 o CTO125 o C V I (V) I O (ma) (V) MIN TYP MAX MIN MAX MIN MAX and or V O = or -2.1 6 4.5 - - 0.26-0.33-0.4 V 0 5.5 - ±0.1 - ±1 - ±1 µa 0 5.5 - - 8-80 - 160 µa - 5.5 - - ±0.5 - ±5.0 - ±10 µa - 4.5 to 5.5 NOTE: For dual-supply systems theoretical worst case (V I = 2.4V, = 5.5V) specification is 1.8mA. HCT Input Loading Table - 100 360-450 - 490 µa UNIT LOADS D0 - D7 0.15 CP 0.30 OE 0.55 NOTE: Unit load is I CC limit specific in DC Electrical Specifications Table, e.g., 360µA max. at 25 o C. 4

Prerequisite for Switching Specifications 25 o C -40 o C TO 85 o C -55 o C TO 125 o C PARAMETER SYMBOL (V) MIN TYP MAX MIN TYP MAX MIN TYP MAX HC TYPES Maximum Clock Frequency f MAX 2 6 - - 5 - - 4 - - MHz 4.5 30 - - 25 - - 20 - - MHz 6 35 - - 29 - - 23 - - MHz Clock Pulse Width t W 2 80 - - 100 - - 120 - - ns 4.5 16 - - 20 - - 24 - - ns 6 14 - - 17 - - 20 - - ns Setup Time Data to Clock t SU 2 60 - - 75 - - 90 - - ns 4.5 12 - - 15 - - 18 - - ns 6 10 - - 13 - - 15 - - ns Hold Time Data to Clock t H 2 5 - - 5 - - 5 - - ns 4.5 5 - - 5 - - 5 - - ns 6 5 - - 5 - - 5 - - ns HCT TYPES Maximum Clock Frequency f MAX 4.5 25 - - 20 - - 16 - - MHz Clock Pulse Width t W 4.5 20 - - 25 - - 30 - - ns Setup Time Data to Clock Hold Time Data to Clock (534) Hold Time Data to Clock (564) t SU 4.5 20 - - 25 - - 30 - - ns t H 4.5 5 - - 5 - - 5 - - ns t H 4.5 3 - - 3 - - 3 - - ns Switching Specifications C L = 50pF, Input t r, t f = 6ns PARAMETER SYMBOL TEST CONDITIONS (V) 25 o C -40 o C TO 85 o C -55 o C TO 125 o C MIN TYP MAX MIN MAX MIN MAX HC TYPES Propagation Delay t PLH, t PHL C L = 50pF Clock to Output 2 - - 165-205 - 250 ns 4.5 - - 33-41 - 50 ns C L = 15pF 5-13 - - - - - ns C L = 50pF 6 - - 28-35 - 43 ns Output Disable to Q (534) t PLZ,t PHZ C L = 50pF 2 - - 150-190 - 225 ns 4.5 - - 30-38 - 45 ns C L = 15pF 5-12 - - - - - ns C L = 50pF 6 - - 26-33 - 38 ns 5

Switching Specifications C L = 50pF, Input t r, t f = 6ns (Continued) PARAMETER SYMBOL TEST CONDITIONS (V) 25 o C -40 o C TO 85 o C -55 o C TO 125 o C MIN TYP MAX MIN MAX MIN MAX Output Disable to Q (564) t PLZ,t PHZ C L = 50pF 2 - - 135-170 - 205 ns 4.5 - - 27-34 - 41 ns C L = 15pF 5-12 - - - - - ns C L = 50pF 6 - - 23-29 - 35 ns Output Enable to Q t PZL,t PZH C L = 50pF 2 - - 150-190 - 225 ns 4.5 - - 30-38 - 45 ns C L = 15pF 5-12 - - - - - ns C L = 50pF 6 - - 26-33 - 38 ns Maximum Clock Frequency f MAX C L = 15pF 5-60 - - - - - MHz Output Transition Time t THL, t TLH C L = 50pF 2 - - 60-75 - 90 ns 4.5 - - 12-15 - 18 ns 6 - - 10-13 - 15 ns Input Capacitance C I C L = 50pF - 10-10 - 10-10 pf Three-State Output Capacitance Power Dissipation Capacitance (Notes 4, 5) C O - - 20-20 - 20-20 pf C PD - 5-32 - - - - - pf HCT TYPES Propagation Delay t PHL, t PLH Clock to Output C L = 50pF 4.5 - - 35-44 - 53 ns C L = 15pF 5-14 - - - - - ns Output Disable to Q t PLZ,t PHZ C L = 50pF 4.5 - - 30-38 - 45 ns C L = 15pF 5-12 - - - - - ns Output Enable to Q t PZL,t PZH C L = 50pF 4.5 - - 35-44 - 53 ns C L = 15pF 5-14 - - - - - ns Maximum Clock Frequency f MAX C L = 15pF 5-50 - - - - - MHz Output Transition Time t TLH, t THL C L = 50pF 4.5 - - 12-15 - 18 ns Input Capacitance C I C L = 50pF - 10-10 - 10-10 pf Three-State Output Capacitance Power Dissipation Capacitance (Notes 4, 5) C O - - 20-20 - 20-20 pf C PD - 5-36 - - - - - pf NOTES: 4. C PD is used to determine the dynamic power consumption, per package. 5. P D =C PD V 2 CC fi + C L V 2 CC fo where f i = Input Frequency, f O = Output Frequency, C L = Output Load Capacitance, = Supply. 6

Test Circuits and Waveforms t r C L CLOCK t f C L I t WL + t WH = fcl t r C L = 6ns CLOCK t f C L = 6ns I t WL + t WH = fcl 2.7V 0. 0. t WL t WH t WL t WH NOTE: Outputs should be switching from to in accordance with device truth table. For f MAX, input duty cycle =. FIGURE 1. HC CLOCK PULSE RISE AND FALL TIMES AND PULSE WIDTH NOTE: Outputs should be switching from to in accordance with device truth table. For f MAX, input duty cycle =. FIGURE 2. HCT CLOCK PULSE RISE AND FALL TIMES AND PULSE WIDTH t r = 6ns t f = 6ns t r = 6ns t f = 6ns 2.7V 0. t THL t TLH t THL t TLH INVERTING t PHL t PLH INVERTING t PHL t PLH FIGURE 3. HC TRANSITION TIMES AND PROPAGATION DELAY TIMES, COMBINATION LOGIC FIGURE 4. HCT TRANSITION TIMES AND PROPAGATION DELAY TIMES, COMBINATION LOGIC CLOCK t r C L t f C L CLOCK t r C L 2.7V 0. t f C L t H(H) t H(L) t H(H) t H(L) DATA t SU(H) t SU(L) DATA t SU(H) t SU(L) t TLH t THL t TLH t THL t PLH t PHL t PLH t PHL t REM SET, RESET OR PRESET t REM SET, RESET OR PRESET IC C L 50pF IC C L 50pF FIGURE 5. HC SETUP TIMES, HOLD TIMES, REMOVAL TIME, AND PROPAGATION DELAY TIMES FOR EDGE TRIGGERED SEQUENTIAL LOGIC CIRCUITS FIGURE 6. HCT SETUP TIMES, HOLD TIMES, REMOVAL TIME, AND PROPAGATION DELAY TIMES FOR EDGE TRIGGERED SEQUENTIAL LOGIC CIRCUITS 7

Test Circuits and Waveforms (Continued) 6ns DISABLE 6ns t r DISABLE 6ns t f 2.7 1.3 0.3 6ns tplz t PZL t PLZ t PZL LOW TO OFF LOW TO OFF HIGH TO OFF t PHZ t PZH HIGH TO OFF t PHZ t PZH S ENABLED S DISABLED S ENABLED S ENABLED S DISABLED S ENABLED FIGURE 7. HC THREE-STATE PROPAGATION DELAY WAVEFORM FIGURE 8. HCT THREE-STATE PROPAGATION DELAY WAVEFORM OTHER S TIED HIGH OR LOW DISABLE IC WITH THREE- STATE R L = 1kΩ C L 50pF FOR t PLZ AND t PZL FOR t PHZ AND t PZH NOTE: Open drain waveforms t PLZ and t PZL are the same as those for three-state shown on the left. The test circuit is Output R L =1kΩto, C L = 50pF. FIGURE 9. HC AND HCT THREE-STATE PROPAGATION DELAY TEST CIRCUIT 8

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