MOSFET Self-Turn-On Phenomenon Outline:

Similar documents
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type 2SK1829

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type 2SK2009

SSM3J118TU SSM3J118TU. High-Speed Switching Applications. Absolute Maximum Ratings (Ta = 25 C) Electrical Characteristics (Ta = 25 C)

TPW1R005PL TPW1R005PL. 1. Applications. 2. Features. 3. Packaging and Internal Circuit Rev Toshiba Corporation

TOSHIBA Field Effect Transistor Silicon P Channel MOS Type 2SJ200

(Note 1) (Note 1) (Note 2) (Note 1) (Note 1)

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type SSM3K17FU

(Note 1,2) (Note 1,3) (Note 1) (Silicon limit) (t = 1 ms) (T c = 25 ) (Note 4)

(Note 1), (Note 2) (Note 1) (Note 1) (Silicon limit) (T c = 25 ) (t = 1 ms) (t = 10 s) (t = 10 s) (Note 3) (Note 4) (Note 5)

SSM3K35CTC SSM3K35CTC. 1. Applications. 2. Features. 3. Packaging and Pin Assignment Rev.3.0. Silicon N-Channel MOS

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type SSM3K37FS. JEDEC Storage temperature range T stg 55 to 150 C

SSM3K36FS N X SSM3K36FS. High-Speed Switching Applications. Equivalent Circuit (top view) Absolute Maximum Ratings (Ta = 25 C)

TOSHIBA Field-Effect Transistor Silicon N-Channel MOS Type SSM3K35MFV. DC I D 180 ma Pulse I DP 360

V Gate-source voltage. ±20 Drain current (DC) (Note 1) A Drain current (pulsed) (Note 1) 99 Power dissipation. (Note 2)

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type SSM3K16FU

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (L 2 π MOSV) 2SK2615

SSM6K202FE SSM6K202FE. High-Speed Switching Applications Power Management Switch Applications. Absolute Maximum Ratings (Ta = 25 C)

SSM3K339R SSM3K339R. 1. Applications. 2. Features. 3. Packaging and Pin Assignment Rev.1.0. Silicon N-Channel MOS

SSM3K357R SSM3K357R. 1. Applications. 2. Features. 3. Packaging and Pin Assignment Rev.2.0. Silicon N-Channel MOS.

TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (U-MOSⅥ-H) TPCA8048-H

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type 2SK302

SSM6J507NU SSM6J507NU. 1. Applications. 2. Features. 3. Packaging and Pin Assignment Rev Toshiba Corporation

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (L 2 -π-mos V) 2SK2963

TOSHIBA Field-Effect Transistor Silicon N-Channel MOS Type SSM3K35MFV. DC I D 180 ma Pulse I DP 360

TK4P60DB TK4P60DB. 1. Applications. 2. Features. 3. Packaging and Internal Circuit Rev.1.0. Silicon N-Channel MOS (π-mos )

TOSHIBA Field Effect Transistor Silicon N Channel Junction Type 2SK mw

TOSHIBA Field Effect Transistor Silicon P Channel MOS Type SSM3J01T. A Pulse. 3.4 (Note 2) 1250 mw

TJ8S06M3L TJ8S06M3L. 1. Applications. 2. Features. 3. Packaging and Internal Circuit Rev.6.0. Silicon P-Channel MOS (U-MOS )

TOSHIBA Field Effect Transistor Silicon N Channel Junction Type 2SK211. Characteristics Symbol Test Condition Min Typ. Max Unit

TOSHIBA Field-Effect Transistor Silicon N Channel MOS Type SSM3K7002F

TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (L 2 π MOSV) 2SJ360

Reverse Recovery Operation and Destruction of MOSFET Body Diode

TPCC8103 TPCC8103. Notebook PC Applications Portable Equipment Applications. Absolute Maximum Ratings (Ta = 25 C) Circuit Configuration

TOSHIBA INSULATED GATE BIPOLAR TRANSISTOR SILICON N CHANNEL IGBT GT30J322

TOSHIBA Field-Effect Transistor Silicon N-Channel MOS Type SSM3K36MFV. DC I D 500 ma Pulse I DP 1000

TOSHIBA Field Effect Transistor Silicon P Channel MOS Type SSM3J36FS

TOSHIBA Field-Effect Transistor Silicon N-Channel MOS Type SSM3K329R. DC I D (Note 1) 3.5 A. 1: Gate Pulse I DP (Note 1) 7.

SSM3J356R SSM3J356R. 1. Applications. 2. Features. 3. Packaging and Pin Assignment Rev.3.0. Silicon P-Channel MOS (U-MOS )

TOSHIBA Original CMOS 16-Bit Microcontroller. TLCS-900/H Series TMP95C061BFG TMP95C061BDFG. Semiconductor Company

TOSHIBA Field-Effect Transistor Silicon N-Channel MOS Type (U-MOS VII-H) SSM3K333R. W t = 10s 2

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type SSM3K15FV

TK20A60W TK20A60W. 1. Applications. 2. Features. 3. Packaging and Internal Circuit Rev Toshiba Corporation

SSM6N55NU SSM6N55NU. 1. Applications. 2. Features. 3. Packaging and Pin Configuration Rev.2.0. Silicon N-Channel MOS

TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (L 2 π MOSV) 2SK2201

TOSHIBA Field-Effect Transistor Silicon N / P Channel MOS Type SSM6L36FE

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type SSM3K316T. P D (Note 2) 700 t = 10s 1250

TOSHIBA Field-Effect Transistor Silicon N-Channel MOS Type SSM3K37MFV. ma Pulse I DP 500

TK6P60W. Preliminary TK6P60W

TOSHIBA Field Effect Transistor Silicon N-Channel Dual Gate MOS Type 3SK292

SSM5H01TU. Unit: mm Combined Nch MOSFET and Schottky Diode into one Package. Low R DS (ON) and Low V F 40~100 C

TOSHIBA Field Effect Transistor Silicon P Channel MOS Type(U-MOS-V) SSM6P41FE Q1 Q2

RN4987 RN4987. Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications. Equivalent Circuit and Bias Resister Values

TPCA8128 TPCA8128. Lithium Ion Battery Applications Power Management Switch Applications. Absolute Maximum Ratings (Ta = 25 C) Circuit Configuration

TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (U-MOS V-H) TPCA8030-H

TOSHIBA Field Effect Transistor Silicon N-Channel Dual Gate MOS Type 3SK294

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (π-mos VII) TK10A60D

SSM3K341R SSM3K341R. 1. Applications. 2. Features. 3. Packaging and Pin Assignment Rev.5.0. Silicon N-channel MOS (U-MOS -H)

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (L 2 π MOSV) 2SK2376

JJN SSM3J135TU. Absolute Maximum Ratings (Ta = 25 C) Equivalent Circuit (top view)

TOSHIBA Field-Effect Transistor Silicon P-Channel MOS Type (U-MOSⅥ) SSM3J327R. Power Management Switch Applications Unit: mm. P D (Note 2) 1 t = 10s 2

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (π-mosⅦ) TK12A60D

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (DTMOS ) TK20E60U

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (π MOSV) 2SK2992

Derating of the MOSFET Safe Operating Area

SSM5G10TU. P D (Note 1) 0.5 W t = 10 s 0.8

Preliminary TK100E10N1

TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (U-MOSⅥ) TPC8120

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (DTMOS II) TK15J60U

TOSHIBA Field-Effect Transistor Silicon P-Channel MOS Type (U-MOSⅥ) SSM3J328R. Power Management Switch Applications Unit: mm. P D (Note 3) 1 t = 10s 2

MOSFET Secondary Breakdown

TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (Ultra-High-Speed U-MOSIII) TPCA8004-H

TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (U-MOSⅥ) TPC8120

TA75W01FU TA75W01FU. Dual Operational Amplifier. Features Pin Connection (Top View)

TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (U-MOSV) TPC6111

LDO Regulators Glossary

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (π MOSIII) 2SK2607

TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process) 2SC4213

TOSHIBA Field-Effect Transistor Silicon P-Channel MOS Type (U-MOSVI) SSM3J332R. Power Management Switch Applications Unit: mm

TOSHIBA Field Effect Transistor Silicon P-Channel MOS Type (U-MOS III) TPCA8105

(Note 1) (Note 1) (Note 2) (Note 3) (Note 4) (t = 10 s) (t = 10 s)

TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (U-MOSⅥ) TPC6113

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (π-mosⅦ) TK15A60D

TC7W04FU, TC7W04FK TC7W04FU/FK. 3 Inverters. Features. Marking TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic

Note: The product(s) described herein should not be used for any other application.

TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (π- MOSⅣ) 2SK4115

TLP206A TLP206A. Measurement Instrument Data Acquisition Programmable Control. Pin Configuration (top view) Internal Circuit

TC4069UBP, TC4069UBF, TC4069UBFT

TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (U-MOS III) TPCF8101

Toshiba Intelligent Power Device Silicon Monolithic Power MOS Integrated Circuit TPD1036F

TOSHIBA Schottky Barrier Rectifier Schottky Barrier Type CRS (50 Hz) 22 (60 Hz)

TOSHIBA Insulated Gate Bipolar Transistor Silicon N Channel IGBT GT40T321. DC I C 40 A 1ms I CP 80. DC I F 30 A 1ms I FP 80

TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process) 2SC2240

TOSHIBA Field-Effect Transistor Silicon P-Channel MOS Type (U-MOSVI) SSM3J334R. Power Management Switch Applications Unit: mm

RN2101MFV, RN2102MFV, RN2103MFV RN2104MFV, RN2105MFV, RN2106MFV

TLP3924 TELECOMMUNICATION PROGRAMMABLE CONTROLLERS MOSFET GATE DRIVER. Features. Pin Configuration (top view)

TLP206A TLP206A. Measurement Instrument Data Acquisition Programmable Control. Pin Configuration (top view) Internal Circuit

TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process) RN1110MFV,RN1111MFV

TOSHIBA Schottky Barrier Rectifier Schottky Barrier Type CMS (Note 1)

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type RFM12U7X

HN1B01F HN1B01F. Audio-Frequency General-Purpose Amplifier Applications Q1: Q2: Marking. Q1 Absolute Maximum Ratings (Ta = 25 C)

Transcription:

Outline: When a rising voltage is applied sharply to a MOSFET between its drain and source, the MOSFET may turn on due to malfunction. This document describes the cause of this phenomenon and its countermeasures.

Table of Contents Outline:... 1 Table of Contents... 2 Self-turn-on... 3 What is self-turn-on?... 3 Self-turn-on mechanism... 4 Simulation of self-turn-on... 5 Non-isolated DC-DC converter... 5 2.1.1. Method of checking for self-turn-on... 5 2.1.2. Adding an external gate-source capacitor to prevent self-turn-on... 6 2.1.3. Changing the slope of the voltage-versus-time curve (dv/dt) to prevent self-turn-on... 8 2.1.4. Effect of the gate resistor on self-turn-on...10 Inverter circuit configured as a bridge... 12 2.2.1. Method of checking for self-turn-on...12 2.2.2. Effect of the gate resistor on self-turn-on...13 2.2.3. Effect of the slope of the voltage-versus-time curve (dv/dt) on self-turn-on...15 Preventing self-turn-on... 17 Preventing MOSFET self-turn-on in a non-isolated DC-DC converter... 17 Preventing MOSFET self-turn-on in an inverter configured as a bridge... 18 RESTRICTIONS ON PRODUCT USE... 19 2 / 19

Self-turn-on What is self-turn-on? For example, inverter and non-isolated synchronous rectification converter circuits consist of a bridge using MOSFETs. When the MOSFETs switch at high speed, a fast rising voltage is applied across the drain and source terminals of the MOSFET in the off state. Depending on the voltage change over time dv/dt, a voltage is induced at the gate input of the MOSFET according to the ratio between its gate-drain capacitance Cgd and gate-source capacitance Cgs. A current flowing to the gate resistor RG via Cgd causes an excessive gate voltage. The induced gate voltage exceeding the gate threshold voltage Vth leads to false turn-on of the MOSFET. This phenomenon is called self-turn-on. Figure 1.1 shows a non-isolated synchronous rectification converter. When the MOSFET Q1 turns on while the MOSFET Q2 is off, a fast rising voltage (with a high dv/dt rate) is applied to Q2. Figure 1.2 shows an inverter circuit configured as a bridge. If either one of the upper- or lower-arm MOSFETs (Q1 or Q2) turns on while the other one is off, a high-dv/dt voltage appears across the drain and source terminals of the MOSFET in the off state. A self-turn-on event creates a short circuit between Q1 and Q2. This not only increases power losses, but also might permanently damage the devices. Turn-on of the high-side Q 1 V + - Change in current caused by dv/dt i= Q 2 dv/dt Load R G C gs C ds Low-side MOSFET in the off state Figure 1.1 Non-isolated synchronous rectification converter Q 1 Turn-on of the high-side Change in current caused by dv/dt i= R G Q 2 C gs C ds dv/dt Low-side MOSFET in the off state Figure 1.2 Inverter circuit configured as a bridge 3 / 19

Self-turn-on mechanism When a voltage with a dv/dt ramp is applied to a MOSFET, a current flows through its gate-drain capacitance Cgd. as: i = dv dt This current i induces a voltage across the gate and source terminals of the MOSFET, which is expressed v GS = R G dv dt t {1 exp ( )} (1) (C gs + )R G (Here, the assumption is that the MOSFET capacitances, Cgs and Cgd, do not change with the voltage.) The cause of self-turn-on depends on the length of the period during which a high-dv/dt voltage is applied across the drain and source terminals: Phenomenon a: When the dv/dt period is shorter than (Cgs+ Cgd ) RG (i.e., when t (Cgs+ Cgd ) RG) Approximating the term exp{ t/ [(Cgs+ Cgd ) RG]} in Equation (1) to 1-t/[(Cgs+ Cgd ) RG] gives the following: (Maclaurin expansion at exp x using primary approximation exp x=1+x) v GS v(t) (2) (C gs + ) When a MOSFET switches at very high speed in switching applications such as non-isolated synchronous rectification converters, the resulting rise in its gate voltage can be calculated using Equation (2). Phenomenon b: When the dv/dt period is longer than (Cgs+ Cgd ) RG (i.e., t (Cgs+ Cgd ) RG) Since exp{ t/ [(Cgs+ Cgd ) RG]} 1, vgs is approximated as follows: v GS R G dv dt (3) Self-turn-on occurs: 1) when vgs calculated using Equation (2) or (3) exceeds the gate threshold voltage Vth of the MOSFET, or 2) when the sum of vgs and the residual gate-source voltage that has been driving the gate exceeds Vth. v(t) i= dv/dt R G C ds v GS C gs Figure 1.3 Circuit with a MOSFET 4 / 19

Simulation of self-turn-on Non-isolated DC-DC converter 2.1.1. Method of checking for self-turn-on Suppose that the MOSFET Q2 in Figure 2.1 turns off after synchronous rectification mode (in the on state shown by #2) and that the following dead-time period overlaps the turn-on of the MOSFET Q1. Then, a high-dv/dt voltage is applied to Q2, causing self-turn-on. This is the mechanism of the MOSFET self-turn-on in a DC/DC converter. The MOSFET self-turn-on occurs in a DC/DC converter as follows: 1. The MOSFET Q1 turns on, causing a current to flow to L. 2. When the MOSFET Q1 turns off, the energy accumulated on L flows back through the source and drain of the MOSFET Q2. During this period, the low-side MOSFET Q2 turns on, acting as a synchronous rectifier. 3. Next, the MOSFET Q2 turns off. After a dead-time period, the MOSFET Q1 turns on. This causes a high dv/dt voltage to be applied to the MOSFET Q2. At this point in time, the gate and drain-source voltages and currents of the MOSFET Q2 are measured. (The gate current caused by the dv/dt ramp is calculated as ig Cgd.) (During the dead-time period from the turn-off of the MOSFET Q2 to the turn-on of Q1, a current flows through the body diode of the MOSFET Q2. Synchronous rectification MOSFETs in motor applications operate in the same manner while a current flows back through the body diode.) #3 #1 Turn-on of the high-side MOSFET Q 1 Assuming the use of surface-mount MOSFETs, their lead inductances are not concedered here. + - Driver IC RG2 C gs C ds Q 2 i= #2 Turn-on of the low-side MOSFET Load Gate signal of MOSFET Q 1 #1 #2 Gate signal of MOSFET Q 2 #3 /(C gs + ) v(t) Current and voltage of MOSFET Q 2 Current Voltage dv/dt Figure 2.1 Simulation circuit model and simplified waveforms 5 / 19

2.1.2. Adding an external gate-source capacitor to prevent self-turn-on When a MOSFET switches at high speed, a voltage is induced according to the ratio between its gate-drain and gate-source capacitances. The induced voltage is superimposed on its gate voltage and might cause undesired self-turn-on. In our first simulation, the MOSFET used did not experience self-turn-on under typical conditions. So, we added a large gate resistor (RG2=20 Ω) only to Q2 to force a self-turn-on phenomenon to occur and then simulated the effect of an external gate-source capacitor. Because the MOSFETs in a DC/DC converter are driven at a very high frequency (300 to 500 khz), the dead-time period from the turn-off of the MOSFET Q2 to the turn-on of the MOSFET Q1 is very short. A simulation showed that the external gate-source capacitor is effective in reducing a rise in the gate voltage, Cgd/(Cgs+Cgd) v(t), which is a function of the ratio between gate-source and gate-drain capacitances. However, because the MOSFET Q2 had a large gate resistor RG2, the effect of the external gate-source capacitor was affected by a rise in the gate voltage due to RG2 Cgd. The addition of a capacitor also increased the time required to discharge the gate charge after the MOSFET Q2 turned off. As a result, the gate discharge current remained when the MOSFET Q1 turned on, making Q2 more susceptible to self-turn-on, contrary to our expectation. As demonstrated by this simulation, you should examine both the gate discharge time and the dead time when adding a capacitor between the gate and source terminals of a MOSFET for the purpose of self-turn-on prevention. For accurate simulation, it is important to select appropriate devices and conditions. Q 1 Turn-on of the high-side MOSFET : 5 Ω L: 0.33 μh 12 V i= + 1.5 V - Driver IC : 20 Ω C ds Low-side MOSFET Load C C gs Q 2 MOSFET used 30 V/16 A C iss :1350 pf C rss :63 pf C: 0, 650 or 1300 pf Assuming the use of surface-mount MOSFETs, their lead inductances are not concedered here. Figure 2.2a Simulation circuit model 6 / 19

ig (ma) Gate discharge current C : 0pF 650pF 1300pF i G Low-side High-side vgs (V) Gate voltage exceeding V th 1300pF V th C : 0pF 650pF vds (V) C : 0pF 650pF 1300pF C : 0pF 650pF id (A) 1300pF A rise in voltage caused by the insertion of a capacitor was reduced. However, the capacitor increased the time required to discharge the gate charge. When a large capacitor was used, the gate charge could not be discharged within the dead-time period; consequently, the capacitor increased the short-circuit current due to self-turn-on. Self-turn-on phenomenon Figure 2.2b Waveforms of the circuit of Figure 2.2a 7 / 19

2.1.3. Changing the slope of the voltage-versus-time curve (dv/dt) to prevent self-turn-on Next, we simulated the impact of the fast changing drain-source voltage (with a high dv/dt rate) on the MOSFET self-turn-on. (We intentionally selected simulation conditions that would cause self-turn-on.) We experimented with different gate resistors RG1 for the high-side MOSFET Q1 in order to change the dv/dt rate of the drain-source voltage of the MOSFET Q2 and determined whether self-turn-on occurs as a result. The voltage superimposed on the gate is expressed as Cgd/(Cgs+Cgd) v(t). A simulation showed that reducing the dv/dt rate of the drain-source voltage helped prevent self-turn-on. This is probably because when the dv/dt rate is small, t is outside the range of v(t) in which the equation is satisfied and v(t) became smaller as a result. R G1 : 5 or 20 Ω Q 1 Turn-on of the high-side MOSFET L: 0.33 μh + i= 12 V - Driver IC : 15 Ω Load 1.5 V C gs C ds Q 2 MOSFET used 30 V/16 A C iss :1350 pf C rss :63 pf Assuming the use of surface-mount MOSFETs, their lead inductances are not considered here. Figure 2.3a Simulation circuit model 8 / 19

Gate discharge current 5Ω : 20Ω i G @=15Ω Gate voltage exceeding V th ig (ma) High-side Q1 : 5 Ω 20Ω vgs (V) V th 5Ω : 20 Ω @=15Ω Low-side Q2 5Ω vds (V) : 20Ω @=15Ω Self-turn-on current id (A) 5Ω : 20Ω @=15Ω Figure 2.3b Waveforms of the circuit of Figure 2.3a 9 / 19

2.1.4. Effect of the gate resistor on self-turn-on We simulated the occurrence of self-turn-on in the circuit shown in Figure 2.4a using different gate resistors RG2 for the low-side MOSFET Q2. (We intentionally selected simulation conditions that would cause self-turn-on.) Our simulation showed that the circuit with a larger gate resistor is more susceptible to self-turn-on. This is probably because the increase in the gate resistance caused the current and voltage resulting from the discharging of the gate charge persisted longer, offsetting the positive effect of the reduced dv/dt rate on the gate voltage. In reality, increasing the gate resistance did not significantly affect the gate current for the MOSFET Q2 during the dv/dt period. Because the MOSFETs in a real-world DC/DC converter switch at a very high frequency (300 to 500 khz), a small gate resistor and a short dead-time period are typically used. Although we used a large gate resistor for this simulation in order to force self-turn-on to occur, such a large resistor is unlikely to be used in an actual DC/DC converter. In the event of self-turn-on, it will be difficult to work around the self-turn-on problem by adding an external gate resistor. + 12 V - Driver IC : 5 Ω i= Q 1 Turn-on of the high-side MOSFET L: 0.33 μh Load 1.5 V R G2 C gs C ds Q 2 MOSFET used R G2 : 5, 10,15 or 20 Ω 30 V/16 A, C iss:1350 pf, C rss:63 pf Figure 2.4a Simulation circuit model Assuming the use of surface-mount MOSFETs, their lead inductances are not considered here. Gate discharge current i G ig (ma) 5Ω : 20 Ω : 20 Ω Self-turn-on gate voltage vgs (V) V th 5Ω Figure 2.4b Gate current and voltage of the low-side MOSFET Q2 10 / 19

v GS waveforms of high-side MOSFET : 20Ω vgs (V) 15Ω 5, 10Ω v GS waveforms of low-side MOSFET Gate voltage exceeding V th vgs (V) : 20Ω 15Ω 10Ω V th 5Ω i D waveforms of high-side MOSFET id (A) 15Ω : 20Ω Short-circuit current due to self-turn-on 5, 10Ω i D waveforms of low-side MOSFET : 20Ω Self-turn-on current id (A) 15Ω Freewheel current 5, 10Ω Figure 2.4c vgs and id waveforms of the high-side and low-side MOSFETs 11 / 19

Inverter circuit configured as a bridge 2.2.1. Method of checking for self-turn-on Figure 2.5 shows an inverter circuit configured as a bridge. When the MOSFET Q1 in this circuit turns on, a high dv/dt voltage is applied across the drain and source terminals of the MOSFET Q2. Consequently, a current flows to the gate resistor via the gate-drain capacitance Cgd of Q2, lifting its gate voltage. As a result, the MOSFET Q2 might falsely turn on. The basic operation of the inverter circuit is shown in Figure 2.5. In a simulation, we applied a train of two pulses to the gate of the MOSFET Q1 in order to examine the self-turn-on of the MOSFET Q2 as follows: 1. The first gate pulse applied to the MOSFET Q1 causes a current to flow to the inductor L. 2. When the MOSFET Q1 turns off, this current flows back through the body diode of the MOSFET Q2. 3. Upon application of the second gate pulse to Q1, the body diode of Q2 enters reverse recovery trr mode. Thereafter, a high-dv/dt drain-source voltage is applied Q2. As a result, a current flows to the gate resistor RG2 for the MOSFET Q2, lifting its gate voltage. Q #3 1 #1 The assumption is that through-hole MOSFETs are used. L is the inductance of the package lead. V + - Q 2 #2 Load (L) Gate signal of MOSFET Q 1 #1 0 #2 #3 A self-turn-on phenomenon occurs here. Current and voltage of MOSFET Q 1 0 0 Current and voltage of MOSFET Q 2 0 High-dv/dt drain-source voltage Drain-source current Drain-source voltage Body diode current Drain-source voltage 0 Figure 2.5 Simulation circuit model and simplified waveforms 12 / 19

2.2.2. Effect of the gate resistor on self-turn-on In order to examine the effect of the gate resistor, we performed simulations, changing the value of the gate resistor RG2 for the MOSFET Q2 (in the off state) in the range from 50 Ω to 200 Ω. The larger the gate resistance RG2, the more susceptible the MOSFET becomes to self-turn-on. (vgs=rg Cgd ) The current flowing to the gate of a MOSFET is limited by the associated gate resistor. The greater the gate resistance, the smaller the gate current. However, because voltage is the product of current and resistance, the greater the gate resistance, the greater the gate voltage becomes. Self-turn-on occurs when the gate voltage exceeds Vth. (We intentionally selected simulation conditions that would cause self-turn-on.) Q 1 : 50 Ω MOSFET used 600 V/30.8 A C iss :3000 pf C rss :9.5 pf + - V: 400 V C ds R G2 Load (L) C gs Q 2 50-, 100-, 150- and 200-Ω resistors were used for. The assumptions are that through-hole MOSFETs are used and that the package lead has an inductance of 2 nh. Figure 2.6a Simulation circuit model 13 / 19

Drain current and voltage waveforms of upper arm MOSFET at self-turning on Drain current and voltage waveforms of upper arm MOSFET at self-turning on vds (V) id (A) v DS Self-turn-on current t (μs) Gate current of lower arm MOSFET vds (V) 50Ω 150Ω 100Ω : 200Ω i D id (A) ig (ma) vgs (V) Large gate resistance Small gate current t (μs) Gate voltage of lower arm MOSFET V th: 3 to 4.5 V Large gate resistance Large gate voltage : 200Ω 150Ω 100Ω 50Ω t (μs) The self-turn-on of the Q 2 causes a short-circuit current to flow to both Q 1 and Q 2 upon turn-on of Q 1. t (μs) Figure 2.6b Turn-on curves 14 / 19

2.2.3. Effect of the slope of the voltage-versus-time curve (dv/dt) on self-turn-on This section discusses the effect of the dv/dt rate of the drain-source voltage on self-turn-on. Since vgs=rg Cgd, a rise in the gate voltage can be reduced by reducing dv/dt. In order to adjust the dv/dt rate while the MOSFET Q2 is in reverse recovery trr mode, the value of the gate resistor RG1 for the MOSFET Q1 in the gate driver was changed under the conditions in which self-turn-on occurs (with a 200-Ω gate resistor connected to the MOSFET Q2). The MOSFET Q2 can be made less susceptible to self-turn-on by increasing the RG1 value to reduce the dv/dt rate. (We intentionally selected simulation conditions that would cause self-turn-on.) R G1 : 50 or 200 Ω Q 1 MOSFET used 600 V/30.8 A C iss :3000 pf C rss :9.5 pf + - V: 400 V Q 2 : 200 Ω C ds Load (L) C gs Simulations were performed with 50- and 200-Ω. Figure 2.7a Simulation circuit model The assumptions are that through-hole MOSFETs are used and that the package lead has an inductance of 2 nh. 15 / 19

The self-turn-on of the Q 2 causes a short-circuit current to flow through Q 1 and Q 2 upon turn-on of Q 1. v DS Drain current and voltage waveforms of upper arm MOSFET at self-turning on vds (V) i D id (A) : 50 Ω (Self-turn-on) 200Ω : 50Ω (Large dv/dt) 200Ω (Small dv/dt) t (μs) Gate current of lower arm MOSFET ig (ma) : 50 Ω 200Ω t (μs) Gate voltage of lower arm MOSFET : 200 Ω V th: 3 to 4.5 V vgs (V) 50Ω t (μs) Figure 2.7b Turn-on curves 16 / 19

Preventing self-turn-on Preventing MOSFET self-turn-on in a non-isolated DC-DC converter When a voltage is applied to a MOSFET, a current generally flows via its gate-drain capacitance Cgd. This dv current is expressed as i =. dt As a result, a voltage is induced across the gate and source terminals: dv t v GS = R G {1 exp ( )} dt (C gs + )R G (Here, the assumption is that MOSFET capacitances, Cgs and Cgd, do not change with the voltage.) In an ultra-high-frequency (300- to 500-kHz) non-isolated DC/DC converter, the MOSFETs in it also switch at a very high frequency. In this case, a self-turn-on phenomenon occurs when the gate-source voltage vgs of the MOSFET exceeds its Vth. vgs is expressed as follows: When the dv/dt transient is shorter than (Cgs+ Cgd ) RG (i.e., when t (Cgs+Cgd) RG) v GS (C gs + ) v(t) (where, v(t) can be considered to be equal to the supply voltage V when t is short.) Preventing self-turn-on Selecting MOSFETs with a high Vth and a low Cgd/Cgs ratio is of primary importance. In addition, a DC/DC converter circuit can be designed with: a capacitor between the gate and source terminals of the MOSFET in order to further reduce the Cgd/Cgs ratio. (Figure 3.1) Care should be exercised, however, because adding a capacitor between the gate and source terminals of a MOSFET affects its switching speed. It might be possible to reduce the dv/dt rate by slowing the turn-on of only the high-side device. However, this does not often serve as an effective solution because switching losses increase, considering many DC/DC converters are designed to operate at a high frequency. R G Gate Source Figure 3.1 Adding a capacitor across the gate and source terminals 17 / 19

Preventing MOSFET self-turn-on in an inverter configured as a bridge When a voltage is applied to a MOSFET, a current generally flows via its gate-drain capacitance (Cgd). This dv current is expressed as i =. dt As a result, a voltage is induced across the gate and source terminals: dv t v GS = R G {1 exp ( )} dt (C gs + )R G (Here, the assumption is that MOSFET capacitances, Cgs and Cgd, do not change with the voltage.) Inverter circuits are typically used at a switching frequency of around 20 khz. So, the MOSFETs in an inverter circuit are not required to switch as fast as those in a non-isolated DC/DC converter. vgs fluctuates early during the dv/dt period according to the ratio between the gate-drain and gate-source capacitances, but a self-turn-on phenomenon is affected most significantly by the result of the following equation. When vgs, which is calculated as follows, exceeds the Vth of a MOSFET, it experiences self-turn-on. When the dv/dt transient is longer than (Cgs+ Cgd ) RG (i.e., t (Cgs+ Cgd ) RG) v GS R G dv dt Preventing self-turn-on Selecting MOSFETs with a high Vth and a low Cgd is of primary importance. In addition, an inverter circuit can be designed as follows to prevent self-turn-on: Reduce the dv/dt rate during turn-on. (Increase the turn-on resistance.) (Figure 3.2) Reduce RG during turn-off. (Reduce the turn-off resistance.) (Figure 3.2) Use a negative gate voltage. (Figure 3.3) Use a shunt circuit at the gate. (Figure 3.4) SBD > Figure 3.2 Using separate gate resistors for turn-on and turn-off R G R G Negative power supply + - Figure 3.3 Using a negative gate power supply Figure 3.4 Adding a shunt circuit 18 / 19

RESTRICTIONS ON PRODUCT USE Toshiba Corporation and its subsidiaries and affiliates are collectively referred to as TOSHIBA. Hardware, software and systems described in this document are collectively referred to as Product. TOSHIBA reserves the right to make changes to the information in this document and related Product without notice. This document and any information herein may not be reproduced without prior written permission from TOSHIBA. Even with TOSHIBA's written permission, reproduction is permissible only if reproduction is without alteration/omission. Though TOSHIBA works continually to improve Product's quality and reliability, Product can malfunction or fail. Customers are responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily injury or damage to property, including data loss or corruption. Before customers use the Product, create designs including the Product, or incorporate the Product into their own applications, customers must also refer to and comply with (a) the latest versions of all relevant TOSHIBA information, including without limitation, this document, the specifications, the data sheets and application notes for Product and the precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the instructions for the application with which the Product will be used with or for. Customers are solely responsible for all aspects of their own product design or applications, including but not limited to (a) determining the appropriateness of the use of this Product in such design or applications; (b) evaluating and determining the applicability of any information contained in this document, or in charts, diagrams, programs, algorithms, sample application circuits, or any other referenced documents; and (c) validating all operating parameters for such designs and applications. TOSHIBA ASSUMES NO LIABILITY FOR CUSTOMERS' PRODUCT DESIGN OR APPLICATIONS. PRODUCT IS NEITHER INTENDED NOR WARRANTED FOR USE IN EQUIPMENTS OR SYSTEMS THAT REQUIRE EXTRAORDINARILY HIGH LEVELS OF QUALITY AND/OR RELIABILITY, AND/OR A MALFUNCTION OR FAILURE OF WHICH MAY CAUSE LOSS OF HUMAN LIFE, BODILY INJURY, SERIOUS PROPERTY DAMAGE AND/OR SERIOUS PUBLIC IMPACT ("UNINTENDED USE"). Except for specific applications as expressly stated in this document, Unintended Use includes, without limitation, equipment used in nuclear facilities, equipment used in the aerospace industry, medical equipment, equipment used for automobiles, trains, ships and other transportation, traffic signaling equipment, equipment used to control combustions or explosions, safety devices, elevators and escalators, devices related to electric power, and equipment used in finance-related fields. IF YOU USE PRODUCT FOR UNINTENDED USE, TOSHIBA ASSUMES NO LIABILITY FOR PRODUCT. For details, please contact your TOSHIBA sales representative. Do not disassemble, analyze, reverse-engineer, alter, modify, translate or copy Product, whether in whole or in part. Product shall not be used for or incorporated into any products or systems whose manufacture, use, or sale is prohibited under any applicable laws or regulations. The information contained herein is presented only as guidance for Product use. No responsibility is assumed by TOSHIBA for any infringement of patents or any other intellectual property rights of third parties that may result from the use of Product. No license to any intellectual property right is granted by this document, whether express or implied, by estoppel or otherwise. ABSENT A WRITTEN SIGNED AGREEMENT, EXCEPT AS PROVIDED IN THE RELEVANT TERMS AND CONDITIONS OF SALE FOR PRODUCT, AND TO THE MAXIMUM EXTENT ALLOWABLE BY LAW, TOSHIBA (1) ASSUMES NO LIABILITY WHATSOEVER, INCLUDING WITHOUT LIMITATION, INDIRECT, CONSEQUENTIAL, SPECIAL, OR INCIDENTAL DAMAGES OR LOSS, INCLUDING WITHOUT LIMITATION, LOSS OF PROFITS, LOSS OF OPPORTUNITIES, BUSINESS INTERRUPTION AND LOSS OF DATA, AND (2) DISCLAIMS ANY AND ALL EXPRESS OR IMPLIED WARRANTIES AND CONDITIONS RELATED TO SALE, USE OF PRODUCT, OR INFORMATION, INCLUDING WARRANTIES OR CONDITIONS OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, ACCURACY OF INFORMATION, OR NONINFRINGEMENT. Do not use or otherwise make available Product or related software or technology for any military purposes, including without limitation, for the design, development, use, stockpiling or manufacturing of nuclear, chemical, or biological weapons or missile technology products (mass destruction weapons). Product and related software and technology may be controlled under the applicable export laws and regulations including, without limitation, the Japanese Foreign Exchange and Foreign Trade Law and the U.S. Export Administration Regulations. Export and re-export of Product or related software or technology are strictly prohibited except in compliance with all applicable export laws and regulations. Please contact your TOSHIBA sales representative for details as to environmental matters such as the RoHS compatibility of Product. Please use Product in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances, including without limitation, the EU RoHS Directive. TOSHIBA ASSUMES NO LIABILITY FOR DAMAGES OR LOSSES OCCURRING AS A RESULT OF NONCOMPLIANCE WITH APPLICABLE LAWS AND REGULATIONS. 19 / 19