CE Marking For the EverPro Technologies Company Ltd. Model: EPU3HC-NNMMXYYYL WLL Report#14WB1121040E Rev. 0 Prepared for: EverPro Technologies Company Ltd. 4# Guanshan Er Road, Wuhan 430073 P,R, China Prepared by: WASHINGTON TECHNOLOGY INTERNATIONAL LIMITED This report applies only to the sample evaluated prior to the preparation date stated above. This report must be copied in its entirety, including all technical documents Certificates and reports shall not be reproduced except in full.
CE Marking For the EverPro Technologies Company Ltd. Model: EPU3HC-NNMMXYYYL WLL Report#14WB1121040E Rev. 0 Prepared by: Henry guo Reviewed by: Steven yang WLL Report #14WB1121040E Rev. 0 - ii - 2015 Washington Laboratories, Ltd.
Abstract This report has been prepared on behalf of EverPro Technologies Company Ltd. to document the findings of the emissions and immunity testing performed on the EverPro Technologies Company Ltd.. The purpose of this testing is to determine compliance with emissions and immunity requirements set forth by the European Community under the requirements of the EMC Directive (2004/108/EC). This test report supports the EverPro Technologies Company Ltd. Declaration of Conformity for compliance with applicable specifications under the EMC Directive. The requirements of the EMC Directive specify compliance with emissions and immunity standards. This report is based on testing methods and levels called out in: EN 55022:2010+AC:2011: Limits and methods of measurement of radio Emission characteristics of information technology equipment EN 550024:2010: Information technology equipment-immunity characteristics limits and methods of measurement EN 61000-3-2:2006+A1:2009+A2:2009: Electromagnetic compatibility(emc)-part 3 : Limits- Section 2 : Limits for harmonic current emissions EN 61000-3-3:2013: Electromagnetic compatibility(emc)-part 3 :Limits Section 3 : Limits of voltage fluctuations and flicker in low-voltage supply systems for equipment with rated IEC 61000-4-2:2008, Electromagnetic compatibility (EMC) Part 4-2: Testing and measurement techniques Electrostatic discharge immunity test IEC 61000-4-3:2010, Electromagnetic compatibility (EMC) Part 4-3: Testing and measurement techniques Radiated, radio-frequency, electromagnetic field immunity test IEC 61000-4-4:2012, Electromagnetic compatibility (EMC) Part 4-4: Testing and measurement techniques Electrical fast transient/burst immunity test IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) Part 4-5: Testing and measurement techniques Surge immunity test IEC 61000-4-6:2013, Electromagnetic compatibility (EMC) Part 4-6: Testing and measurement techniques Immunity to conducted disturbances, induced by radio-frequency fields IEC 61000-4-8:2009, Electromagnetic compatibility (EMC) Part 4-8: Testing and measurement techniques Power frequency magnetic field IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) Part 4-11: Testing and measurement techniques Voltage dips, short interruptions and voltage variations immunity tests WLL Report #14WB1121040E Rev. 0 - iii - 2015 Washington Laboratories, Ltd.
The affixation of the "CE" marking is contingent on the product's compliance with all applicable "New Approach Directives. The conduct of this test supports the emissions and immunity requirements specified under the EMC Directive. Other directives or standards may apply (Low Voltage Directive, for example) for which a separate certification effort may be required. Other national standards may apply on a country-by-country basis for which a separate approval may be required. Testing was performed at Audix Technology (Shenzhen) Co., Ltd. The CNAS Registration No.: L4117 The EverPro Technologies Company Ltd. complied with the EMC requirements of and EN 55022, EN 55024. Revision History Reason Date Rev 0 Initial Release WLL Report #14WB1121040E Rev. 0 - iv - 2015 Washington Laboratories, Ltd.
Table of Contents Abstract... ii 1 Introduction... 1 1.1 Compliance Statement... 1 1.2 Test Scope Summary... 2 1.3 Contract Information... 3 1.4 Test and Support Personnel... 3 2 Equipment Under Test... 4 2.1 EUT Identification... 4 2.2 Test Configuration... 4 2.3 EUT Description... 4 2.4 Equipment Configuration... 7 2.5 Interface Cables... 7 2.6 Support Equipment... 7 2.7 EUT Modifications... 7 2.8 Testing Algorithm... 7 2.9 Test Location... 8 3 Test Deviations and Sequence... 10 3.1 Deviations to the Standard... 10 4 Performance Criteria... 11 5 Test Result... 12 5.1 Conducted Emissions... 12 5.2 Radiated Emissions... 17 5.3 HARMONIC CURRENT TEST... 26 5.4 VOLTAGE FLUCTUATIONS & FLICKER... 32 5.5 Electrostatic Discharge... 35 5.6 Radiated RF Susceptibility... 39 5.7 Electrical Fast Transient/Burst... 43 5.8 Voltage Surge... 47 5.9 Conducted RF Susceptibility... 51 5.10 Magnetic field immunity test... 55 5.11 VOLTAGE DIPS AND INTERRUPTIONS TEST... 59 6 Attachment (EUT Photograph)... 62 7 Appendix... 65 WLL Report #14WB1121040E Rev. 0 - v - 2015 Washington Laboratories, Ltd.
List of Tables Table 1: Overview of, Equipment Under Test... 4 Table 2: Equipment Configuration... 7 Table 3: Interface Cables... 7 Table 4: Conducted Emission Test Data... 14 Table 5: Radiated Emission Test Data AC Power... 20 Table 6: Harmonic Test Data... 28 Table 7: Flicker Test Data... 33 Table 8: ESD Test Results... 37 Table 9: Radiated RF Susceptibility Test Results... 41 Table 10: Electrical Fast Transient/Burst Test Results... 45 Table 11: Voltage Surge Test Results... 49 Table 12: Conducted RF Susceptibility Test Results... 53 Table 13: Magnetic field immunity Test Results... 57 Table 14: Voltage Dips/Interrupts Test Results... 60 Table 15: Expanded Uncertainty List... 70 List of Figures Figure 1: Test Configuration... 4 List of Photographs Photograph 1: Conducted Emission Test Configuration, Front... 16 Photograph 2: Conducted Emission Test Configuration, Side... 16 Photograph 3: Radiated Emission Test Configuration, Front... 24 Photograph 4: Radiated Emission Test Configuration, Back... 24 Photograph 5: Radiated Emission Test Configuration, (Above 1GHz) Front... 25 Photograph 6: Harmonics Test Configuration... 31 Photograph 7: Voltage Fluctuation and Flick Test Configuration... 34 Photograph 8: ESD Test Configuration, V Plate... 38 Photograph 9: ESD Test Configuration, H Plate... 38 Photograph 10: Radiated RF Susceptibility Test Configuration... 42 Photograph 11: Electrical Fast Transient/Burst Test Configuration Mains /Port... 46 Photograph 12: Electrical Fast Transient/Burst Test Configuration Telecommunication /Port... 46 Photograph 13: Voltage Surge Immunity Test Configuration Mains /Telecommunication Port... 50 Photograph 14: Conducted RF Susceptibility Test Configuration Mains / Port... 54 Photograph 15: Conducted RF Susceptibility Test Configuration Telecommunication / Port... 54 Photograph 16: Magnetic field immunity Test Configuration Mains /Port... 58 Photograph 17: Voltage Dips/Interrupts Test Configuration... 61 WLL Report #14WB1121040E Rev. 0 - vi - 2015 Washington Laboratories, Ltd.
1 Introduction Washington Technology International Limited was contracted by EverPro Technologies Company Ltd. to perform testing on the. This document describes the test setups, test methods, required test equipment, and the test limit criteria used to perform compliance testing of the EverPro Technologies Company Ltd. 1.1 Compliance Statement After the modification listed in Section 2.7 were installed: The EverPro Technologies Company Ltd. complied with the EMC emission requirements of EN 55022, EN 55024 Tests for radiated and conducted emissions were performed. Tests were performed according to: EN 55022:2010+AC:2011, Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement EN 550024:2010: Information technology equipment-immunity characteristics limits and methods of measurement EN 61000-3-2:2006+A1:2009+A2:2009, Electromagnetic compatibility (EMC) Part 3-2: Testing and measurement techniques Harmonic immunity test EN 61000-3-3:2013, Electromagnetic compatibility (EMC) Part 3-3: Testing and measurement techniques Flicker immunity test IEC 61000-4-2:2008, Electromagnetic compatibility (EMC) Part 4-2: Testing and measurement techniques Electrostatic discharge immunity test IEC 61000-4-3:2010, Electromagnetic compatibility (EMC) Part 4-3: Testing and measurement techniques Radiated, radio-frequency, electromagnetic field immunity test IEC 61000-4-4:2012, Electromagnetic compatibility (EMC) Part 4-4: Testing and measurement techniques Electrical fast transient/burst immunity test IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) Part 4-5: Testing and measurement techniques Surge immunity test IEC 61000-4-6:2013, Electromagnetic compatibility (EMC) Part 4-6: Testing and measurement techniques Immunity to conducted disturbances, induced by radio-frequency fields IEC 61000-4-8:2009, Electromagnetic compatibility (EMC) Part 4-8: Testing and measurement techniques Power frequency magnetic field IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) Part 4-11: Testing and measurement techniques Voltage dips, short interruptions and voltage variations immunity tests Report #14WB1121040E Rev. 0 - Page 1 of 70 2015 Washington Laboratories, Ltd.
1.2 Test Scope Summary Test Specific Description Date Completed Result EN 55022:2010+ AC:2011 CISPR 22:2008 EN 55022:2010+ AC:2011 CISPR 22:2008 EN 55022:2010+ AC:2011 CISPR 22:2008 EN 61000-3- 2:2006+A1:2009+A2: 2009 EN 61000-3-3:2013 Conducted Emissions at the Mains Port Conducted Emission at telecommunication port Radiated Emissions Harmonic Current Emissions Voltage Fluctuation & Flicker Modifications Installed (Y/N) Dec.23, 2014 Complied N N/A N/A N Dec.13, 2014-Jan.04, 2015 Complied Jan.06, 2015 Complied N Jan.06, 2015 Complied N N EN 55024 IEC 61000-4-2 Electrostatic Discharge Dec.11, 2014 Complied N EN 55024 IEC 61000-4-3 EN 55024 IEC 61000-4-4 EN 55024 IEC 61000-4-5 EN 55024 IEC 61000-4-6 EN 55024 IEC 61000-4-8 EN 55024 IEC 61000-4-11 Radiated RF Susceptibility Electrical Fast Transient/Burst Dec.13, 2014 Dec.11, 2014 Voltage Surge Dec.11, 2014 Radio-frequency, Continuous conducted Emission Power frequency magnetic field Voltage Dips, Interruptions and Variations Dec.13, 2014 Dec.13, 2014 Dec.13, 2014 Complied Complied Complied Complied Complied Complied N N N N N N Report #14WB1121040E Rev. 0 - Page 2 of 70 2015 Washington Laboratories, Ltd.
1.3 Contract Information Customer: EverPro Technologies Company Ltd. 4# Guanshan Er Road, Wuhan 430073 P,R, China 1.4 Test and Support Personnel Mario Wu Audix Technology (Shenzhen) Co., Ltd. No. 6, Ke Feng Rd., 52 Block, Shenzhen Science & Industrial Park, Nantou, Shenzhen, Guangdong, China Test Engineer Report #14WB1121040E Rev. 0 - Page 3 of 70 2015 Washington Laboratories, Ltd.
2 Equipment Under Test 2.1 EUT Identification The results obtained relate only to the item(s) tested. Table 1: Overview of, Equipment Under Test Model(s) EUT Specifications: EPU3HC-A1A4K050M 5V DC from USB port Equipment Emissions Class: B Test Date(s): Dec.11, 2014~Jan.06, 2015 2.2 Test Configuration The EverPro Technologies Company Ltd., Equipment Under Test (EUT), was operated from 5V DC from USB port. The was configured as below: Mouse AC Mains Monitor a Notebook EUT U-Disk Adaptor a: HDMI Cable AC Mains Figure 1: Test Configuration 2.3 EUT Description Product Name: Model No. : EPU3HC-A1A4K050M EUT Rated Voltage: 5V DC from USB port Report #14WB1121040E Rev. 0 - Page 4 of 70 2015 Washington Laboratories, Ltd.
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2.4 Equipment Configuration The EUT were set up as outlined in Figure 1. The EUT was comprised of the following equipment. (All Modules, PCBs, etc. listed were considered as part of the EUT, as tested.) Table 2: Equipment Configuration Slot # Name / Description Model Number Part Number Serial Number Revision 1. USB3.0 Hybrid Active Optical Cable EPU3HC-A1A4K050M / / / 2.5 Interface Cables Table 3: Interface Cables Port Connector Cable Shielded Slot # Termination Point Identification Type Length (Y/N) 1. HDMI Cable Shielded; Detachable 1.5m Y AE 2.6 Support Equipment No. Description ACS No. Manufacturer Model Serial Number Approved type 1 U-Disk1 -- Kingston DT100G3/16G -- -- 2 U-Disk2(Test For RE) 3 Monitor ACS-EMC-LM10R -- Sandisk SDCZ43/16G -- -- DELL U3011t -- FCC DOC 4 Notebook 5 USB Mouse -- LENOVO Lenovo B490 -- -- Power Adapter: Manufacturer: LENOVO, M/N: ADLX90NCT3A Power Cord: Unshielded, Detachable, 1.8m M-U0002- S26381-K426- ACS-EMC-M11R FUJITSU FSC1 V102 USB Cord: shielded, Undetectable, 2.0m FCC ID BSMI ID 2.7 EUT Modifications None. 2.8 Testing Algorithm The was operated continuously by normal operating conditions. During the test, there has a software to control the USB disk continuously communicate with Notebook via the. In immunity testing, if the data transfer from USB disk to Notebook is work normally, then judged as A. If the data Report #14WB1121040E Rev. 0 - Page 7 of 70 2015 Washington Laboratories, Ltd.
transfer from USB disk to Notebook disordered but can be recovered without manual involve, then judged as B. If the EUT stop work and need manual involve to restart then judged as C. 2.9 Test Location NAME: Audix Technology (Shenzhen) Co., Ltd. by CNAS. The CNAS Registration No.: L4117. Address: No. 6, Ke Feng Rd., 52 Block, Shenzhen Science & Industrial Park, Nantou, Shenzhen, Guangdong, China Report #14WB1121040E Rev. 0 - Page 8 of 70 2015 Washington Laboratories, Ltd.
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3 Test Deviations and Sequence 3.1 Deviations to the Standard There were no deviations to the requirements established in the specification. Report #14WB1121040E Rev. 0 - Page 10 of 70 2015 Washington Laboratories, Ltd.
4 Performance Criteria Performance Criterion A B C Description The unit shall continue to operate as intended. No degradation of performance or loss of function is allowed below the performance level specified by the manufacturer. The performance level may be replaced by a permissible loss of performance. If the minimum performance level or the permissible performance loss is not specified by the manufacturer then either of these may be derived from the product description and documentation and what the user may reasonably expect from the equipment if used as intended. After the test, the equipment shall continue to operate as intended without user intervention. No degradation of performance or loss of function is allowed, after the application of the phenomena below the performance level specified by the manufacturer. The performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is allowed. However, no change of operating state or stored data is allowed to persist after the test. If the minimum performance level or the permissible performance loss is not specified by the manufacturer then either of these may be derived from the product description and documentation and what the user may reasonably expect from the apparatus if used as intended. Loss of function is allowed, provided the function is self-recoverable or can be restored by the operation of the controls by the user in accordance with the manufacturer s instructions. Functions, and/or information stored in non-volatile memory, or protected by a battery backup, shall not be lost. Report #14WB1121040E Rev. 0 - Page 11 of 70 2015 Washington Laboratories, Ltd.
5 Test Result 5.1 Conducted Emissions 5.1.1 Requirements Test Arrangement: Table Top Compliance Standard: EN 55022 Clause 5 Reference Standard: CISPR 22 Clause 5 Compliance Requirement: Class B Frequency Range Tested: 150 khz to 30MHz Frequency 150kHz~500kHz 500kHz~5MHz 5MHz ~30MHz Class A Compliance Limits Quasi-Peak Level db(µv) 66 ~ 56* 56 60 Average Level db(µv) 56 ~ 46* 46 60 5.1.2 Test Equipment Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval 1. 1# Shielding Room AUDIX N/A N/A Apr.17,14 1 Year 2. Test Receiver Rohde & Schwarz ESHS10 838693/001 Oct.29, 14 1 Year 3. L.I.S.N.#1 Rohde & Schwarz ESH2-Z5 100429 Oct.29, 14 1 Year 4. L.I.S.N.#3 Kyoritsu KNW-242C 8-1920-1 Apr.28,14 1 Year 5. Terminator Hubersuhner 50Ω No. 1 Apr.28,14 1 Year 6. Terminator Hubersuhner 50Ω No. 2 Apr.28,14 1 Year 7. RF Cable Hubersuhner RG58 0100.6954.20# Jan.22,14 1 Year 8. Coaxial Switch Anritsu MP59B 6200298346 Apr.28,14 1 Year 9. Pulse Limiter Rohde & Schwarz ESH3-Z2 101838 Oct.29, 14 1 Year Report #14WB1121040E Rev. 0 - Page 12 of 70 2015 Washington Laboratories, Ltd.
5.1.3 Test Setup PC System Receiver EUT Peripheral 80cm 80cm LISN#1 LISN#3 :50Ω Terminator 5.1.4 Test Procedure Summary The EUT was placed on a non-metallic table, 80cm above the ground plane. The EUT Power connected to the power mains through a line impedance stabilization network (L.I.S.N. 1#). This provided a 50-ohm coupling impedance for the EUT (Please refer to the block diagram of the test setup and photographs). Both sides of power line were checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipments and all of the interface cables were changed according to CISPR 22 on conducted Emission test. The bandwidth of test receiver (R & S ESHS10) is set at 9kHz. The frequency range from 150kHz to 30MHz is checked. 5.1.5 Conducted Data Reduction and Reporting To convert the EMI Receiver radiated data into a form that can be compared with the limits, it is necessary to account for various calibration factors that are supplied with the antennas and other measurement accessories. These factors are included the antenna factor (AF) and the cable factor (CF). The AF (in db/m) and the CF (in db) is algebraically added to the EMI Receiver Voltage in dbµv to obtain the Radiated Electric Field in dbµv/m. The following data lists the significant emission frequencies, measured levels, correction factors (including cable and antenna correction factors), and the corrected readings against the limits. Explanation of the data is given as follows: Example: EMI Receiver Voltage: VdBµV Antenna Correction Factor: AFdB/m Cable Correction Factor: CFdB Amplifier Gain: AGdB Standard Limits: LdBµV/m Electric Field: EdBµV/m = V dbµv + AFdB/m + CFdB- AGdB Margin: db = LdBµV/m - EdBµV/m 5.1.6 Results Summary The EUT complied with the emission requirements throughout the test. 5.1.7 Test Data Table 4 provides the test results for Conducted emissions. Photograph 1 and 2 show the Conducted emission test configuration. 5.1.8 Areas of Concern None. Report #14WB1121040E Rev. 0 - Page 13 of 70 2015 Washington Laboratories, Ltd.
Table 4: Conducted Emission Test Data Report #14WB1121040E Rev. 0 - Page 14 of 70 2015 Washington Laboratories, Ltd.
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Photograph 1: Conducted Emission Test Configuration, Front Photograph 2: Conducted Emission Test Configuration, Side Report #14WB1121040E Rev. 0 - Page 16 of 70 2015 Washington Laboratories, Ltd.
5.2 Radiated Emissions 5.2.1 Requirements Test Arrangement: Table Top Compliance Standard: EN 55022 Clause 5 Reference Standard: CISPR 22 Clause 6 Compliance Requirement: Class B Frequency Range Tested: 30MHz to 1000MHz All emanations from a Class B computing devices or system, including any network of conductors and apparatus connected thereto, shall not exceed the level of field strengths specified below: FREQUENCY DISTANCE FIELD STRENGTHS LIMITS Note: (MHz) 5.2.2 Test Equipment (Meters) (dbµv/m) 30 ~ 230 3 40 230 ~ 1000 3 47 1000~3000 3 70(Peak) 50(Average) 3000~6000 3 74(Peak) 54(Average) (1) Emission level = Antenna Factor + Cable Loss + Reading Emission level = Antenna Factor -Amp Factor +Cable Loss + Reading (above 1000MHz) (2) The lower limit shall apply at the transition frequencies. (3) Distance refers to the distance in meters between the test instrument antenna and the closed point of any part of the E.U.T. For frequency range 30MHz~1000MHz (In 3m Anechoic Chamber) Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval 1. 3#Chamber AUDIX N/A N/A Nov.23, 14 1 Year 2. EMI Spectrum Agilent E4407B MY41440292 Apr. 28,14 1 Year 3. Test Receiver Rohde & Schwarz ESVS10 834468/011 Apr. 28,14 1 Year 4. Amplifier HP 8447D 2648A04738 Apr. 28,14 1 Year 5. Bilog Antenna TESEQ CBL6112D 35375 Jun. 18, 14 1 Year 6. RF Cable MIYAZAKI CFD400-NL 3# Chamber No.1 Apr. 28,14 1 Year 7. Coaxial Switch Anritsu MP59B 6200313662 Apr. 28,14 1 Year Report #14WB1121040E Rev. 0 - Page 17 of 70 2015 Washington Laboratories, Ltd.
For frequency range 1GHz~6GHz (In Anechoic 3m Chamber) Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval 1. 3#Chamber AUDIX N/A N/A Nov.02,14 1 Year 2. Spectrum Analyzer Agilent E4407B MY41440292 Apr.28,14 1 Year 3. Horn Antenna ETS 3115 9607-4877 Sep.20,14 1 Year 4. Amplifier Agilent 8449B 3008A00863 Apr.28,14 1 Year 5. RF Cable Hubersuhner SUCOFLEX106 77977/6 Apr.28,14 1 Year 6. RF Cable Hubersuhner SUCOFLEX106 28616/2 Apr.28,14 1 Year 5.2.3 Test Setup Setup below 1GHz Setup above 1GHz Report #14WB1121040E Rev. 0 - Page 18 of 70 2015 Washington Laboratories, Ltd.
5.2.4 Test Procedure Summary The system was configured at the 3 meter semi-chamber on an 80 cm high 1 X 1.5 m nonconductive table above a ground plane a turntable. During test the system under test was rotated 360 while the antenna was varied in height from 1 to 4 meters. The system under test was examined for emissions with both horizontal and vertical antenna polarizations. 5.2.5 Measurement Method All emission measurements herein were performed according to CISPR 22. Calibration checks are made periodically to verify proper performance of the measuring instrumentation. 5.2.6 Radiated Data Reduction and Reporting To convert the EMI Receiver radiated data into a form that can be compared with the limits, it is necessary to account for various calibration factors that are supplied with the antennas and other measurement accessories. These factors are included the antenna factor (AF) and the cable factor (CF). The AF (in db/m) and the CF (in db) is algebraically added to the EMI Receiver Voltage in dbµv to obtain the Radiated Electric Field in dbµv/m. The following data lists the significant emission frequencies, measured levels, correction factors (including cable and antenna correction factors), and the corrected readings against the limits. Explanation of the data is given as follows: Example: EMI Receiver Voltage: VdBµV Antenna Correction Factor: AFdB/m Cable Correction Factor: CFdB Amplifier Gain: AGdB Standard Limits: LdBµV/m Electric Field: EdBµV/m = V dbµv + AFdB/m + CFdB- AGdB Margin: db = LdBµV/m - EdBµV/m 5.2.7 Results Summary The EUT complied with the emission requirements throughout the test. 5.2.8 Test Data Table 5 provides the test results for radiated emissions. Photograph 3,4,5 show the radiated emission test configuration. 5.2.9 Areas of Concern None. Report #14WB1121040E Rev. 0 - Page 19 of 70 2015 Washington Laboratories, Ltd.
Table 5: Radiated Emission Test Data AC Power Report #14WB1121040E Rev. 0 - Page 20 of 70 2015 Washington Laboratories, Ltd.
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Photograph 3: Radiated Emission Test Configuration, Front Photograph 4: Radiated Emission Test Configuration, Back Report #14WB1121040E Rev. 0 - Page 24 of 70 2015 Washington Laboratories, Ltd.
Photograph 5: Radiated Emission Test Configuration, (Above 1GHz) Front Report #14WB1121040E Rev. 0 - Page 25 of 70 2015 Washington Laboratories, Ltd.
5.3 HARMONIC CURRENT TEST 5.3.1 Requirements Test Arrangement: Table Top Reference Standard: EN 61000-3-2 Clause 7 5.3.2 Test Equipment Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval 1. AC Source California Instruments 5001ix 58481 Oct.26, 14 1 Year 2. Power Analyzer California Instruments PACS-1 72627 Oct.26, 14 1 Year 5.3.3 Test Setup EUT AC Mains Power Analyzer 0.8m AC Source 5.3.4 Test Procedure Summary The EUT was placed on the top of a wooden table 0.8 meters above the ground and operated to produce the maximum harmonic components under normal operating conditions for each successive harmonic component in turn. The correspondent test program of test instrument to measure the current harmonics emanated from EUT is chosen. The measure time shall be not less than the necessary for the EUT to be exercised. Report #14WB1121040E Rev. 0 - Page 26 of 70 2015 Washington Laboratories, Ltd.
5.3.5 Limits of Harmonic Current Limits for Class D Equipment Maximum permissible harmonic Maximum permissible Harmonic order (n) current per watt (ma/w) harmonic current (A) 3 3.4 0.23 5 1.9 1.14 7 1.0 0.77 9 0.5 0.40 11 0.35 0.33 13 0.30 0.21 15 n 39 (odd harmonic only) 3.85/n 0.15 15/n Remark: if the EUT Power level is below 75 Watts and therefore has no defined limits. 5.3.6 Test Results Table 6 provides the test results for Harmonics. Photograph 6 shows the Harmonics test configuration. 5.3.7 Areas of Concern None. Report #14WB1121040E Rev. 0 - Page 27 of 70 2015 Washington Laboratories, Ltd.
Table 6: Harmonic Test Data Report #14WB1121040E Rev. 0 - Page 28 of 70 2015 Washington Laboratories, Ltd.
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Photograph 6: Harmonics Test Configuration Report #14WB1121040E Rev. 0 - Page 31 of 70 2015 Washington Laboratories, Ltd.
5.4 VOLTAGE FLUCTUATIONS & FLICKER 5.4.1 Requirements Test Arrangement: Table Top Reference Standard: EN 61000-3-3 Clause 5 5.4.2 Test Equipment Same as Section 5.3.2 5.4.3 Block Diagram of Test Setup Same as Section 5.3.3 5.4.4 Test Procedure The EUT was placed on the top of a wooden table 0.8 meters above the ground and operated to produce the most unfavorable sequence of voltage changes under normal conditions During the flick measurement, the measure time shall include that part of whole operation changes. The observation period for short-term flicker indicator is 10 minutes and the observation period for long-term flicker indicator is 2 hours. 5.4.5 Limits of Voltage Fluctuation and Flick Test Item Limit Note P st 1.0 P st means Short-term flicker indicator P lt 0.65 P lt means long-term flicker indicator T max 500ms T max means maximum time that d(t) exceeds 3.3% d max (%) 4% d max means maximum relative voltage change. d c (%) 3.3% d c means relative steady-state voltage change. 5.4.6 Test Results Table 7 provides the test results for Voltage Fluctuation and Flick. Photograph 7 shows the Voltage Fluctuation and Flick test configuration. 5.4.7 Areas of Concern None. Report #14WB1121040E Rev. 0 - Page 32 of 70 2015 Washington Laboratories, Ltd.
Table 7: Flicker Test Data Report #14WB1121040E Rev. 0 - Page 33 of 70 2015 Washington Laboratories, Ltd.
Photograph 7: Voltage Fluctuation and Flick Test Configuration Report #14WB1121040E Rev. 0 - Page 34 of 70 2015 Washington Laboratories, Ltd.
5.5 Electrostatic Discharge 5.5.1 Requirements Test Arrangement: Table Top Compliance Standard: EN 55024 Clause 10 Reference Standard: IEC 61000-4-2 Clause 5 Compliance Requirement: Air = ±8kV, Severity Level 3, Performance Criterion B Contact = ±4kV, Severity Level 2, Performance Criterion B 5.5.2 Test Equipment Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval 1 ESD Tester EM Test Dito P1349126669 Jun. 05,14 1 Year 5.5.3 Test Setup 5.5.4 Test Procedure Summary The requirements of IEC 61000-4-2:2008 call out an Electrostatic Discharge (ESD) test level and procedure. The intent of this test is to determine the effect of electrostatic discharge events on equipment operation. ESD is the result of potential build-up and the subsequent rapid discharge and equalization of that potential. The result of the discharge is a transient waveform that produces peak voltages up to tens of kilovolts, peak currents of a few amperes, and rise times on the order of a few nanoseconds (ns). This discharge may produce malfunction and damage to sensitive electronic equipment. Table-top EUTs are placed on a Horizontal Coupling Plane (HCP) and isolated from it by 0.5mm. The HCP was connected to a Ground Reference Plane (GRP) via a bonding strap with 470k-ohm resistors located at each end. When the Vertical Coupling Plane (VCP) was used, it was also connected to the GRP with a second bonding strap with 470k-ohm resistors located at each end. The VCP is located 10 cm from the EUT for test. The earth cable of the ESD generator was attached to the GRP. Report #14WB1121040E Rev. 0 - Page 35 of 70 2015 Washington Laboratories, Ltd.
Contact discharge points were metallic points on the EUT that are subject to contact by operators or maintenance personnel. Air discharge points were non-conductive surfaces, indicators, and other points subject to contact. The voltage was stepped at 1 kv, 2 kv, 4 kv for contact discharge and 2 kv, 4 kv, 8 kv for air discharges. The ESD simulator was then set at the test voltage and applied 10 times (positive and negative) at intervals of one second at each discharge test point. Two ESD modes were applied: direct application of the discharge to the EUT, and indirect application of the discharge to the horizontal and vertical coupling planes. Direct application simulates a static discharge to the EUT itself and indirect application simulates a static discharge to objects placed or installed near the EUT. During test the system was monitored for performance degradation. Environmental Conditions during Electrostatic Discharge Testing Ambient Temperature: 23.1 C Relative Humidity: 49% 5.5.5 Results Summary The EUT complied with the required performance throughout the test. Table 8 shows the ESD test results. Photograph 8,9 show the ESD test configuration. 5.5.6 Areas of Concern None. Report #14WB1121040E Rev. 0 - Page 36 of 70 2015 Washington Laboratories, Ltd.
Table 8: ESD Test Results Applicant : EverPro Technologies Company Ltd. Test Date : Dec.11, 2014 EUT : Temperature : 23.1±0.6 M/N : EPU3HC-A1A4K050M Humidity : 49±3% Test Voltage : 5V DC from USB port Test Mode : Data Transmitting Test Engineer : Sun Pressure : 101.2±1KPa Required Performance : B Actual Performance : A&B* Air Discharge: ±2kV ±4kV ±8kV # For Air Discharge each Point Positive 10 times and negative 10 times discharge. Contact Discharge: ±2kV ±4kV # For Contact Discharge each point positive 25 times and negative 25 times discharge For the time interval between successive single discharges an initial value of one second. Performance Result Discharge Type of Voltage (kv) discharge Dischargeable Points Required Observation (Pass/Fail) ±2 Contact 1,2 B A Pass ±4 Contact 1,2 B B* Pass ±2 Air - - - - ±4 Air - - - - ±8 Air - - - - ±2 HCP-Bottom Edge of the HCP B A Pass ±2 VCP-Front Center of the VCP B A Pass ±2 VCP-Left Center of the VCP B A Pass ±2 VCP-Back Center of the VCP B A Pass ±2 VCP-Right Center of the VCP B A Pass ±4 HCP-Bottom Edge of the HCP B A Pass ±4 VCP-Front Center of the VCP B A Pass ±4 VCP-Left Center of the VCP B A Pass ±4 VCP-Back Center of the VCP B A Pass ±4 VCP-Right Center of the VCP B A Pass Discharge Points Description 1 USB Port 5 2 Metal 6 3 7 4 8 Remark: B* Means the transmission speed slow during test, But it can be recover by itself. Discharge was considered on Contact and Air and Horizontal Coupling Plane (HCP) and Vertical Coupling Plane (VCP). Report #14WB1121040E Rev. 0 - Page 37 of 70 2015 Washington Laboratories, Ltd.
Photograph 8: ESD Test Configuration, V Plate Photograph 9: ESD Test Configuration, H Plate Report #14WB1121040E Rev. 0 - Page 38 of 70 2015 Washington Laboratories, Ltd.
5.6 Radiated RF Susceptibility 5.6.1 Requirements Test Arrangement : Table Top Compliance Standard: EN 55024 Clause 10 Reference Standard: EN 61000-4-3 Clause 5 Compliance Limits: Severity Level 2 3V/m (80%AM, 1kHz), 80MHz-1GHz, Performance Criterion A 5.6.2 Test Equipment Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval 1. 2#Chamber AUDIX N/A N/A Apr. 28,14 1Year 2. Signal Generator Agilent N5181A MY49061013 Oct.29, 14 1Year 3 Amplifier A&R 100W/1000M1 17028 NCR NCR 4. Power Meter Anritsu ML2487A 6K00002472 Aug. 20,14 1Year 5. Power Sensor Anritsu MA2491A 032516 Aug. 20,14 1Year 6. Log-periodic Antenna A&R AT1080 16512 NCR NCR 5.6.3 Test Setup 5.6.4 Test Procedure Summary The requirements of IEC 61000-4-3:2010 call out a Radiated Immunity test level and procedure. The system was placed in an anechoic chamber calibrated for IEC 61000-4-3 testing. The system was oriented to face the radiating antenna and cables were configured to expose at least one meter of each cable bundle. The antenna was positioned 3 meters from the equipment under test and the signal generator/amplifier operated under computer control to generate the radiated field and sweep the Report #14WB1121040E Rev. 0 - Page 39 of 70 2015 Washington Laboratories, Ltd.
interfering signal through the test frequency range. The test level is maintained by computer control along with application of the 80% AM. During test the system was monitored for performance degradation. Environmental Conditions during Radiated RF Susceptibility Testing Ambient Temperature: 25.2 C Relative Humidity: 47 % 5.6.5 Results Summary The EUT complied with the required performance throughout the test. Table 9 shows the Radiated RF Susceptibility test results. Photograph 10 shows the Radiated RF Susceptibility test configuration. 5.6.6 Areas of Concern None. Report #14WB1121040E Rev. 0 - Page 40 of 70 2015 Washington Laboratories, Ltd.
Table 9: Radiated RF Susceptibility Test Results Applicant : EverPro Technologies Company Ltd. Test Date : Dec.13, 2014 EUT : USB3.0 Hybrid Active Optical Cable Temperature : 25.2±0.6 M/N : EPU3HC-A1A4K050M Humidity : 47±3% Test Voltage : 5V DC from USB port Test Mode : Data Transmitting Test Engineer : Rick Pressure : 101.2±1KPa Required Performance : A Actual Performance : A Frequency Range : 80 MHz -1000MHz Field Strength : 3V/m Modulation: AM Pulse none 1 khz 80% Frequency Rang :80 MHz -1000MHz Steps 1% Horizontal Vertical Result Required Observation Required Observation (Pass / Fail) Front A A A A Pass Right A A A A Pass Rear A A A A Pass Left A A A A Pass Remark: Report #14WB1121040E Rev. 0 - Page 41 of 70 2015 Washington Laboratories, Ltd.
Photograph 10: Radiated RF Susceptibility Test Configuration Report #14WB1121040E Rev. 0 - Page 42 of 70 2015 Washington Laboratories, Ltd.
5.7 Electrical Fast Transient/Burst 5.7.1 Requirements Test Arrangement: Table Top Compliance Standard: EN 55024 Clause 10 Reference Standard: IEC 61000-4-4 Clause 5 Compliance Limits: Severity Level 2, AC Power, ±1kV, Performance Criterion B 5.7.2 Test Equipment Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval 1. Burst Tester TESEQ NSG3025 28017 Apr. 28,14 1 Year 2. CDN TESEQ CDN8014 29638 Apr. 28,14 1 Year 5.7.3 Test Setup Mains Port 5.7.4 Test Procedure Summary The requirements of IEC 61000-4-4:2012 call for testing the immunity of the device to "Electrical Fast Transients" or "EFTs. The EFT requirement simulates the effect on the EUT of noise generated by other users connected to the same power mains, such as that caused by contact arcing, switch closure and relay operation. EFT simulators produce a series of bursts that contain a collection of high frequency transients at predetermined intervals. Both positive and negative transient bursts were applied at the required transient repetition rate and burst repetition rate for a period not less than one minute for each line or bundle under test. During test the system was monitored for performance degradation. Report #14WB1121040E Rev. 0 - Page 43 of 70 2015 Washington Laboratories, Ltd.
Environmental Conditions during Electrical Fast Transient/Burst Testing Ambient Temperature: 23.1 C Relative Humidity: 49 % 5.7.5 Results Summary The EUT complied with the required performance throughout the test. Table 10 shows the Electrical Fast Transient/Burst test results. Photograph 11 and Photograph 12 show the test configuration. 5.7.6 Areas of Concern None. Report #14WB1121040E Rev. 0 - Page 44 of 70 2015 Washington Laboratories, Ltd.
Applicant EUT Table 10: Electrical Fast Transient/Burst Test Results : EverPro Technologies Company Ltd. : USB3.0 Hybrid Active Optical Cable Test Date : Dec.11, 2014 Temperature : 23.1±0.6 M/N : EPU3HC-A1A4K050M Humidity :49±3% Test Voltage : 5V DC from USB port Test Mode :Data Transmitting Test Engineer : Sun Pressure :101.3±1KPa Required Performance : B Actual Performance : A&B* Repetition Frequency : 5 khz Burst Duration : 15ms Burst Period: 300ms Inject Time(s): 120s Inject Method: Direct Inject Line: AC Mains DC Supply Signal Line Test Voltage Performance Result Required Observation(+ ) Observation( - ) (Pass/Fail) L 0.5kV B A A Pass 1kV B B* B* Pass N 0.5kV B A A Pass 1kV B B* B* Pass PE 0.5kV B A A Pass 1kV B B* B* Pass L N 0.5kV B A A Pass 1kV B B* B* Pass L PE 0.5kV B A A Pass 1kV B B* B* Pass N PE 0.5kV B A A Pass 1kV B B* B* Pass L N PE 0.5kV B A A Pass 1kV B B* B* Pass Signal Line 0.5kV B B* B* Pass Remark: B* Means transmission speed slow during test, But it can be recover by itself. Report #14WB1121040E Rev. 0 - Page 45 of 70 2015 Washington Laboratories, Ltd.
Photograph 11: Electrical Fast Transient/Burst Test Configuration Mains /Port Photograph 12: Electrical Fast Transient/Burst Test Configuration Telecommunication /Port Report #14WB1121040E Rev. 0 - Page 46 of 70 2015 Washington Laboratories, Ltd.
5.8 Voltage Surge 5.8.1 Requirements Test Arrangement: Table Top Compliance Standard: EN 55024 Clause 10 Reference Standard: IEC 61000-4-5 Clause 5 Compliance Limits: Severity Level 2 AC Power, ±0.5kV, ±1kV (Line to Line); Performance Criterion B 5.8.2 Test Equipment Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval 1 Transient Test System EMC PARTNER TRANSIENT 2000 TRA2006 F-S-T- D-R -1500 Oct.26, 14 1 Year 2 CDN EMC PARTNER CDN-UTP8 CDN-UTP8-1508 Oct.26, 14 1 Year 3 CDN EMC PARTNER CDN2000-06-25 CDN2000-06-25 0111 Oct.26, 14 1 Year 5.8.3 Test Setup Mains Port Report #14WB1121040E Rev. 0 - Page 47 of 70 2015 Washington Laboratories, Ltd.
5.8.4 Test Procedure Summary For line-to-line coupling mode, provide a 1kV 1.2/50us voltage surge (at open-circuit condition) and 8/20us current surge to EUT selected points. At least 5 positive and 5 negative (polarity) tests with a maximum 1/min repetition rate are applied during test. Different phase angles are done individually. Record the EUT operating situation during compliance test and decide the EUT,immunity criterion for above each test. During test the system was monitored for performance degradation. Environmental Conditions during Voltage Surge Testing Ambient Temperature: 23.2 C Relative Humidity: 49 % 5.8.5 Results Summary The EUT complied with the required performance throughout the test. Table 11 shows the Voltage Surge test results. Photograph 13 shows the Voltage Surge test configuration. 5.8.6 Areas of Concern None. Report #14WB1121040E Rev. 0 - Page 48 of 70 2015 Washington Laboratories, Ltd.
Table 11: Voltage Surge Test Results Applicant : EverPro Technologies Company Ltd. Test Date : Dec.11, 2014 EUT : Temperature : 23.2±0.6 M/N : EPU3HC-A1A4K050M Humidity : 49±3% Power Supply : 5V DC from USB port Test Mode : Data Transmitting Test Engineer : Sun Pressure : 101.2±1KPa Required Performance : B Actual Performance : No.of pluse: ±5 A&B* Line : 1. AC Mains : 1.2/50us 10/700us 2. DC Supply : 1.2/50us 10/700us 3. Signal : 1.2/50us 10/700us Location L-N L-PE N-PE Volt Phase 500V 1kV 2kV Performance Performance Performance Required + - Required + - Required + - Result (Pass/Fail) 0 B A A B B* B* - - - Pass 90 B A A B B* B* - - - Pass 180 B A A B B* B* - - - Pass 270 B A A B B* B* - - - Pass 0 B A A B B* B* B B* B* Pass 90 B A A B B* B* B B* B* Pass 180 B A A B B* B* B B* B* Pass 270 B A A B B* B* B B* B* Pass 0 B A A B B* B* B B* B* Pass 90 B A A B B* B* B B* B* Pass 180 B A A B B* B* B B* B* Pass 270 B A A B B* B* B B* B* Pass Signal Line - - - - - - - - - - - Remark: B* Means the transmission speed slow during test, But it can be recover by itself. Report #14WB1121040E Rev. 0 - Page 49 of 70 2015 Washington Laboratories, Ltd.
Photograph 13: Voltage Surge Immunity Test Configuration Mains /Telecommunication Port Report #14WB1121040E Rev. 0 - Page 50 of 70 2015 Washington Laboratories, Ltd.
5.9 Conducted RF Susceptibility 5.9.1 Requirements Test Arrangement: Table Top Compliance Standard: EN 55024 Clause 10 Reference Standard: IEC 61000-4-6 Clause 5 Compliance Limits: Severity Level 2 3Vrms (80%AM, 1kHz), 150kHz-80MHz, Performance Criterion A 5.9.2 Test Equipment Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval 1. Signal Generator Agilent N5181A MY49061013 Oct.29, 14 1 Year 2. Amplifier AR 25A250A 19152 NCR NCR 3. Amplifier AR 100A250 19368 NCR NCR 4. Power meter HP 436A 2016A07891 Apr. 28,14 1Year 5. Power sensor Agilent 8482B MY41090514 Nov.06, 14 1Year 6. CDN FCC FCC-801-M2-25 47 Apr. 28,14 1 Year 7. CDN FCC FCC-801-M3-25 107 Apr. 28,14 1 Year 8. CDN FCC FCC-801-M2-25 07035 Apr. 28,14 1 Year 9. CDN FCC FCC-801-M3-25 07045 Apr. 28,14 1 Year 10. PC N/A N/A N/A N/A N/A 11. Attenuator Weinschel 40-6-34 LJ092 Apr. 28,14 1 Year 12. EM Injection Clamp FCC F-203I-23mm 403 Apr. 28,14 1 Year 13. RF Cable MICABLE A04-07-07-2M 09111340 NCR NCR 14. RF Cable STORM MFR-57500 90-195-2MTR NCR NCR Report #14WB1121040E Rev. 0 - Page 51 of 70 2015 Washington Laboratories, Ltd.
5.9.3 Test Setup 5.9.4 Test Procedure Summary Let the EUT work in test mode and test it. Mains Port The EUT are placed on an insulating support 0.1m high above a ground reference plane. CDN (coupling and decoupling device) is placed on the ground plane about 0.3m from EUT. Cables between CDN and EUT are as short as possible, and their height above the ground reference plane shall be between 10 and 30 mm (where possible). The disturbance signal described below is injected to EUT through CDN. The EUT operates within its operational mode(s) under intended climatic conditions after power on. The frequency range is swept from 0.150MHz to 80MHz using 3V signal level, and with the disturbance signal 80% amplitude modulated with a 1kHz sine wave. The rate of sweep shall not exceed 1.5*10-3decades/s. Where the frequency is swept incrementally, the step size shall not exceed 1% of the start and thereafter 1% of the preceding frequency value. Recording the EUT operating situation during compliance testing and decide the EUT immunity criterion. During test the system was monitored for performance degradation. Environmental Conditions during Conducted RF Susceptibility Testing Ambient Temperature: 24.8 C Relative Humidity: 52 % 5.9.5 Results Summary The EUT complied with the required performance throughout the test. Table 12 shows the Conducted RF Susceptibility test results. Photograph 14,15 show the Conducted RF Susceptibility test configuration. 5.9.6 Areas of Concern None. Report #14WB1121040E Rev. 0 - Page 52 of 70 2015 Washington Laboratories, Ltd.
Table 12: Conducted RF Susceptibility Test Results Applicant : EverPro Technologies Company Ltd. Test Date : Dec.13, 2014 EUT : Temperature : 24.8±0.6 M/N : EPU3HC-A1A4K050M Humidity : 52±3% Power Supply : 5V DC from USB port Test Mode : Data Transmitting Test Engineer : Mark Pressure : 101.2±1KPa Required Performance Frequency Range (MHz) : A Actual Performance Injected Position Voltage Level (e.m.f.) : A Required Observation Result (Pass / Fail) 0.15 ~ 20 AC Mains 3V A A PASS 20 ~ 80 AC Mains 3V A A PASS 0.15 ~ 20 Signal Mains 3V A A PASS 20 ~ 80 Signal Mains 3V A A PASS Remark: Report #14WB1121040E Rev. 0 - Page 53 of 70 2015 Washington Laboratories, Ltd.
Photograph 14: Conducted RF Susceptibility Test Configuration Mains / Port Photograph 15: Conducted RF Susceptibility Test Configuration Telecommunication / Port Report #14WB1121040E Rev. 0 - Page 54 of 70 2015 Washington Laboratories, Ltd.
5.10 Magnetic field immunity test 5.10.1 Test Equipments Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval 1. Magnetic Field Tester HEAFELY MAG100.1 083858-10 Apr. 28,14 1 Year 5.10.2 Block Diagram of Test Setup Size: 1*1m 10cm wood EUT 0.8m Magnetic Field Tester AC Source 5.10.3 Test Standard Compliance Standard: EN 55024 Clause 10 Reference Standard: IEC 61000-4-8 Clause 5 Compliance Requirement: Severity Level 1, 1A/m, Performance Criterion A 5.10.4 Severity Levels and Performance Criterion Severity Level Magnetic Field Strength A/m Performance criterion 1. 1 2. 3 3. 10 A 4. 30 5. 100 X. Special 5.10.5 Test Procedure The EUT was subjected to the test magnetic field by using the induction coil of standard dimensions (1m*1m) and shown in Section 5.10.2. The induction coil was then rotated by 90 in Report #14WB1121040E Rev. 0 - Page 55 of 70 2015 Washington Laboratories, Ltd.
order to expose the EUT to the test field with different orientations. 5.10.6 Test Results The EUT complied with the required performance throughout the test. Table 13 shows the Conducted RF Susceptibility test results. Photograph 16 shows the Conducted RF Susceptibility test configuration. 5.10.7 Areas of Concern None. Report #14WB1121040E Rev. 0 - Page 56 of 70 2015 Washington Laboratories, Ltd.
Applicant EUT : : Table 13: Magnetic field immunity Test Results EverPro Technologies Company Ltd. Test Date : Dec.13, 2014 USB3.0 Hybrid Active Optical Cable Temperature : 24.7±0.6 M/N : EPU3HC-A1A4K050M Humidity : 51±3% Test Voltage : 5V DC from USB port Test Mode : Data Transmitting Test Engineer : Mark Pressure : 101.2±1KPa Required Performance : A Actual Performance Test Level Testing Duration Coil Orientation Required Observation : A Result (Pass/Fail) 1A/m 5 min / coil X A A PASS 1A/m 5 min / coil Y A A PASS Remark: 1A/m 5 min / coil Z A A PASS Report #14WB1121040E Rev. 0 - Page 57 of 70 2015 Washington Laboratories, Ltd.
Photograph 16: Magnetic field immunity Test Configuration Mains /Port Report #14WB1121040E Rev. 0 - Page 58 of 70 2015 Washington Laboratories, Ltd.
5.11 VOLTAGE DIPS AND INTERRUPTIONS TEST 5.11.1 Test Equipment Item Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval 1. Main Interference Simulator HAEFELY PLINE 1610 083690-05 Apr. 28,14 1 Year 5.11.2 Block Diagram of Test Setup EUT AC Mains Main Interference Simulator AC Mains 0.8m 5.11.3 Requirements Test Arrangement: Table Top Compliance Standard: EN 55024 Clause 10 Reference Standard: IEC 61000-4-11 Clause 5 Compliance Requirement: Performance Criterion: B, C 5.11.4 Severity Levels and Performance Criterion Test Level %UT Voltage dip and short interruptions %UT Duration (in period) Performance Criterion 0 100 0.5 B 70 30 25 B 0 100 250 C 5.11.5 Test Results The EUT complied with the required performance throughout the test. Table 14 shows the Voltage Dips/Interrupts test results. Photograph 17 shows the Voltage Dips/Interrupts test configuration. 5.11.6 Areas of Concern None. Report #14WB1121040E Rev. 0 - Page 59 of 70 2015 Washington Laboratories, Ltd.
Applicant : EUT : M/N : Power Supply : Test Engineer : Table 14: Voltage Dips/Interrupts Test Results EverPro Technologies Company Ltd. USB3.0 Hybrid Active Optical Cable EPU3HC-A1A4K050M 5V DC from USB port Mark Test Date : Temperature : Humidity : Test Mode : Pressure : Dec.13, 2014 24.7±0.6 51±3% Data Transmitting 101.1±1KPa Required Performance Test Level % U T : B&C Actual Performance : Voltage Dips & Short Interruptions % U T Duration (in period) A&C* Phase Angle Required Observation Result (Pass / Fail) 0 100 0.5P 0-360 B A PASS 70 30 25P 0-360 C A PASS 0 100 250P 0-360 C C* PASS Note 1: UT is the rated voltage for the equipment. Note 2: The frequency of the test voltage shall be within ±2% of the rated frequency, the output voltage shall be within ±5% of the rated voltage. Remark: C* Means the EUT stop working, required manual involved to restart the data transfer. Report #14WB1121040E Rev. 0 - Page 60 of 70 2015 Washington Laboratories, Ltd.
Photograph 17: Voltage Dips/Interrupts Test Configuration Report #14WB1121040E Rev. 0 - Page 61 of 70 2015 Washington Laboratories, Ltd.
6 Attachment (EUT Photograph) EUT Model: EPU3HC-A1A4K050M EUT Photo #1 Front View EUT Photo #2 Uncover View Report #14WB1121040E Rev. 0 - Page 62 of 70 2015 Washington Laboratories, Ltd.
EUT Photo #3 Uncover View EUT Photo #4 Uncover View Report #14WB1121040E Rev. 0 - Page 63 of 70 2015 Washington Laboratories, Ltd.
EUT Photo #5 Uncover View Report #14WB1121040E Rev. 0 - Page 64 of 70 2015 Washington Laboratories, Ltd.
7 Appendix A. Declaration of Conformity According to the European EMC Directive (2004/108/EC), the conformity of a device to the Directive shall be certified by an EC declaration of conformity issued by the manufacturer or his authorized representative established within the European Community. If neither the manufacturer nor his authorized representative is established in the European Community, the EC declaration of conformity shall be the responsibility of the person who places the device on the European Community market. The EC declaration of conformity shall be held at the disposal of the competent authority for ten years following the last placement of the device on the market (i.e., 10 years after that last device has been sold) and must contain the following information: - Description of the device to which the declaration refers, - Reference to the specifications under which conformity is declared, and, where appropriate, the national measures implemented to ensure the conformity of the provisions of the Directive, - Identification of the signatory empowered to bind the manufacturer or his authorized representative. An example of an EC declaration of conformity is shown on the next page. Please note that Audix Technology (Shenzhen) Co., Ltd. operates as a contract-testing laboratory and provides test results to support the EC declaration of conformity. However, under the EC's current regulations, it is up to the manufacturer/importer to declare conformity to the proper standards. Although WLL can provide technical guidance, the final determinations as to which standards apply to the product and whether the product conforms to the standards is the responsibility of the manufacturer/importer.. Report #14WB1121040E Rev. 0 - Page 65 of 70 2015 Washington Laboratories, Ltd.
Manufacturer's Name : S a m p l e DECLARATION OF CONFORMITY Application of Council Directive(s): 2004/108/EC Standard(s) to which Conformity is Declared: EN 55022:2010+AC:2011 EN 55024:2010 EverPro Technologies Company Ltd. Manufacturer's Address: 4# Guanshan Er Road, Wuhan 430073 P,R, China Importer's Name: Importer's Address: Type of Equipment: Model Number: EPU3HC-NNMMXYYYL Year of Manufacture: I, the undersigned, hereby declare that the equipment specified above conforms to the above Directive(s) and Standard(s). Place: (Signature) Date: (Full Name) Report #14WB1121040E Rev. 0 - Page 66 of 70 2015 Washington Laboratories, Ltd.
B. Marketing and Labeling Instructions Labeling Requirements According to the European EMC Directive (2004/108/EC), the EC conformity marking for a device shall be affixed by the manufacturer, or his authorized representative established within the European Community. The EC conformity marking can be affixed to the device, packaging, instructions for use, or guarantee certificate. The EC conformity marking shall consist of the letters "CE" (as shown below). NOTE: The grid is to show proportions only. Marketing Requirements This report and the manufacturer's subsequent EC declaration of conformity are only valid for the technical standards (i.e. European Norms) noted in this report. If these technical standards are updated or additional technical standards are adopted, that are applicable to this device, then the device should be tested to these updated or new standards to ensure continued compliance with the EMC Directive (2004/108/EC). If changes to the original equipment are made, then these changes should be reviewed to ensure that they do not effect compliance with the technical standards. If the changes are determined to change the EMC characteristics of the device then the device should be retested to the applicable technical standards. Report #14WB1121040E Rev. 0 - Page 67 of 70 2015 Washington Laboratories, Ltd.