OMI-SWIR. SpotOptics FAST & ACCURATE WAVEFRONT SENSOR S W I R

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potoptics OM- FAT & ACCUATE AVEFONT ENO Acquisition speed up to 300 Hz, analysis speed up to 200Hz Optimized for wavelength range with ngaas camera Accurate metrology in single pass (OM) and double pass (Optino) Optical elements, lasers and laser diodes Test any focal length and diameter (with accessories) Large dynamic range High sampling Adaptable for production More than 25 years experience in accurate metrology

OM TECHNCAL PECFCATON Hardware Test Power of laser diode that can be tested No of spots (see cameras below) Optical elements, lasers and laser diodes Few m. Higher powers require reduction system (available) 35x35 (standard camera), 60x60 (large format camera) 2 Diameter and focal length of standard lenslets ( =0.2mm,f=11mm),( =0.15mm,f=7mm) oftware oftware (control and analysis) ensoft for 64bit in7, in 8.1, in 10 M repeatability of Zernike coefficients <2nm rms (λ/800 @ 1550nm) M repeatability of modal wavefront measurements < λ/100 Accuracy and dynamic range λ/20- λ/100 (calibration dependent), -±50 λ Camera (see next page for details) Detector, wavelength range and cooling Connection, bits Acquisition speed Triggering Exposure time range ngaas. 0.90μ -1.7μ, Uncooled or Peltier cooled version Gigabit Ethernet, 12-bits or 14-bits From 100Hz up to 340Hz at full resolution. peeds up to 1700Hz available with custom cameras Yes 5ums-100msec (uncooled), 5ums-1s (cooled) Accessories Light sources, beam expanders and compressors High quality LD at test wavelength, beam expanders/compressors

OM models: cooled and uncooled. High acquisition and computational speed tandard resolution OM esolution : 35x35 spots Chip size: 9.6x7.68 mm 2 Pixel size: 30 m High acquisition speed: up to 344fps High computation speed: up to 200Hz ngaas detector for high accuracy avelength range: 0.9-1.7 (µ) Giga Ethernet connection High resolution esolution : 60x60 spots Chip size: 15.9x12.7 mm 2 Pixel size: 25 m High acquisition speed: up to 301fps High computation speed: up to 100Hz 3 ngaas detector for high accuracy avelength range: 0.9-1.7 (µ) Giga Ethernet connection

OM models details (standard resolution models) OM Model of wavefront sensor OM--H-340 OM--118 OM--118-C Highlights High-speed, Uncooled, 344fps Uncooled, 118fps Cooled, 118fps Peltier cooling No. Temperature stabilized TEC1 No. Temperature stabilized TEC1 Yes Output(bits) 14 12 12 Operating temp ( C) Minimum +10 Minimum +10-20 to +55 (case) Power requirement (V DC) 10.8-30 or via PoE 12 12 Power consumption () 10.8 (@ 12V DC)-12.5 (@ PoE) 7.2 33.6 eight (Camera+OM) (g) 340+50=390 660+50=710 1420+50=1470 Dimension (L,,H in mm) 78x55x55 80x90x71 116x90x99 Acquisition speed (fps) 344 118 118 Analysis speed for Zernike coefficients in loop mode( Hz) ~200 ~100 ~100 4

OM OM models details (high resolution models) Model of wavefront sensor OM--100-H OM--301-H-H OM--100-H-C OM--30-H Highlights High-resolution, Uncooled, 100fps High-resolution, Uncooled, 301fps High resolution, Cooled, 100fps High resolution, Cooled, 30fps Peltier cooling No. Temperature No. Temperature Yes. TEC2 Yes. TEC2 stabilized TEC1 stabilized TEC1 Output(bits) 14 14 14 12 Operating temp ( C) Minimum +10 Minimum +10-20 to +55 (case) -20 to +55 (case) Power requirement (V DC) 10.8-30 or via PoE 10.8-30 or via PoE or via PoE 12V Power consumption () 10.8(@12VDC)- 10.8(@12VDC)- 19(@12VDC)- 15.6 12.95(PoE) 12.95(PoE) 22(PoE) eight (Camera+OM) (g) 370+50=420 370+50=420 810+50=860 1110+50=1160 Dimension (L,,H in mm) 78x55x55 78x55x55 90 80 80 116x90x99 Acquisition speed (fps) 100 301 100 30 Analysis speed for Zernike coefficients in loop mode( Hz) ~50 ~100 ~50 ~30 5

OM 6 OM--H-340 and OM--100-H OM--100-H-C H OM-118(C) and OM--30-H

OM Quantum efficiency curve of ngaas sensor 7

OM ENOFT: THE OFTAE ensoft: The modular software package - Fully controls the hardware of OM 8 - Performs the hack-hartmann (H) analysis - Computes Zernike coefficients, diagnostics (alignment and correct focal plane), wavefront, MTF, spot diagram - Has a Loop mode for on-line adjustment of optical systems OM in your production line: - OM with its own PC - can easily be adapted to the production line - t can work in a closed-loop with the PC of the manufacturing machine - A software module defines the P communication protocol and transfers the results between the PCs in the Local Area Network

OM ON-LNE ALGNMENT N A FAT LOOP MTF MEAUEMENT 9 Alignment started Coma decreases The alignment of complex optical systems becomes easy by monitoring coma and astigmatism in a continuous loop The individual (x, y) components of coma and astigmatism, as well as the total coefficients are displayed The optimization can be done for one component at a time, as the software can display one component of interest MTF after subtracting the contributions of tilt and defocus present in the data.

OM 900-1700nm ngaas standard camera () OM with large format ngaas camera. Max. resolution: 60x60 OM with CAMEA Gigabit connection OM (fl=11mm, = 0.2mm) Max. esolution 35x35 spots PHYCAL Dimensions 89 (L) x 90 () x 71(H) mm (with standard camera) 90 (L) x 80 () x 80(H) mm (with large format camera) eight 400g-1500g Cameras ngaas, Gigabit Ethernet connection, 12-14bit KEY FEATUE Measurement technique hack-hartmann wavefront sensor Test in parallel light or at the lens focus Parallel light (with a calibration unit) At the focus of the lens (with pinhole calibration unit) Light sources with different wavelength available Calibration units available High-quality parallel light source (motorized or manual) Pinhole calibration unit Versatile Test any optical element and lasers in single pass Accessories Full set of accessories available (e.g. light sources) 10 Calibration light source (parallel or pinhole): LD at different wavelengths available nput test beam OFTAE Easy alignment of lens group via software: the software gives graphical indication of the misalignment of the optical system, using coma and astigmatism. tabilization of lasers: the software gives graphical indication of focusing of the laser beam