64K x V Static RAM Module

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831V33 Features High-density 3.3V 2-megabit SRAM module High-speed SRAMs Access time of 12 ns Low active power 1.512W (max.) at 12 ns 64 pins Available in ZIP format Functional Description CYM1831V33 64K x 32 3.3V Static RAM Module The CYM1831V33 is a high-performance 3.3V 2-megabit static RAM module organized as 64K words by 32 bits. This module is constructed from two 64K x SRAMs in SOJ packages mounted on an epoxy laminate substrate. Four chip selects are used to independently enable the four bytes. Reading or writing can be executed on individual bytes or any combination of multiple bytes through proper use of selects. The CYM1831V33 is designed for use with standard 64-pin ZIP sockets. The pinout is compatible with the 64-pin JEDEC ZIP module family (CYM1821, CYM1831, CYM1836, and CYM1841). Thus, a single motherboard design can be used to accommodate memory depth ranging from K words (CYM1821) to 256K words (CYM1841). The CYM1831V33 is offered in a vertical ZIP configuration. Presence detect pins (PD 0 PD 1 ) are used to identify module memory density in applications where modules with alternate word depths can be interchanged. Logic Block Diagram Pin Configuration A 0 A 15 CS 1 CS 2 CS 3 CS 4 A [0:15] 64K x BLE BHE A [0:15] 64K x BLE BHE PD 0 - PD 1 - OPEN I/O 0 I/O 15 I/O I/O 31 PD 0 I/O 0 I/O 1 I/O 2 I/O 3 A 7 A 8 A 9 I/O 4 I/O 5 I/O 6 I/O 7 A 14 CS 1 CS 3 NC I/O I/O 17 I/O 18 I/O 19 A 10 A 11 A 12 A 13 I/O 20 I/O 21 I/O 22 I/O 23 64-pin ZIP Top View 2 4 6 8 10 12 14 18 20 22 24 26 28 30 32 34 36 38 40 42 44 46 48 50 52 54 56 58 60 62 64 1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 33 35 37 39 41 43 45 47 49 51 53 55 57 59 61 63 PD 1 I/O 8 I/O 9 I/O 10 I/O 11 A 0 A 1 A 2 I/O 12 I/O 13 I/O 14 I/O 15 A 15 CS 2 CS 4 NC I/O 24 I/O 25 I/O 26 I/O 27 A 3 A 4 A 5 A 6 I/O 28 I/O 29 I/O 30 I/O 31 Selection Guide 1831V33-12 1831V33-15 1831V33-20 1831V33-25 1831V33-35 Maximum Access Time (ns) 12 15 20 25 35 Maximum Operating Current (ma) 420 400 380 380 380 Maximum Standby Current (ma) 250 250 250 250 250 Cypress Semiconductor Corporation 3901 North First Street San Jose CA 95134 408-943-2600 March 3, 1999

Maximum Ratings (Above which the useful life may be impaired. For user guidelines, not tested.) Storage Temperature... 55 C to +125 C Ambient Temperature with Power Applied... 10 C to +85 C Supply Voltage to Ground Potential... 0.5V to +4.6V DC Voltage Applied to Outputs in High Z State... 0.5V to + DC Input Voltage... 0.5V to +4.6V Operating Range Range Ambient Temperature Commercial 0 C to +70 C 3.3V (+10%/ 5%) Electrical Characteristics Over the Operating Range Parameter Description Test Conditions Min. Max. Unit V OH Output HIGH Voltage = Min., I OH = 4.0 ma 2.4 V V OL Output LOW Voltage = Min., I OL = 4.0 ma 0.4 V V IH Input HIGH Voltage 2.0 + 0.3 V V IL Input LOW Voltage 0.3 0.8 V I IX Input Load Current < V I < 10 +10 µa I OZ Output Leakage Current < V O <, Output Disabled 10 +10 µa I CC I SB1 I SB2 Operating Supply Current Automatic CS Power-Down Max., CS > V IH, Current [1] Min. Duty Cycle = 100% Automatic CS Power-Down Max., Current [1] CS > 0.2V, V IN > 0.2V, or V IN < 0.2V = Max., I OUT = 0 ma, 12 420 ma CS N < V IL 15 400 20, 25, 35 380 12, 15, 20, 25, 35 12, 15, 20, 25, 35 250 ma 250 ma Capacitance [2] Parameter Description Test Conditions Max. Unit C INA Input Capacitance (,, A 0-19 ) T A = 25 C, f = 1 MHz, 12 pf C INB Input Capacitance (CS) = 5.0V 6 pf C OUT Output Capacitance 8 pf Notes: 1. A pull-up resistor to on the CS input is required to keep the device deselected during power-up, otherwise I SB will exceed values given. 2. Tested on a sample basis. 2

AC Test Loads and Waveforms R1 317Ω 3.3V OUTPUT 30 pf INCLUDING JIG AND SCOPE (a) R1 317Ω 3.3V OUTPUT R2 351Ω 5 pf INCLUDING JIG AND SCOPE (b) R2 351Ω 1831V33 3 3.0V <5ns ALL INPUT PULSES 90% 90% 10% 10% <5ns 1831V33 4 Equivalent to: THÉ VENIN EQUIVALENT OUTPUT 7Ω 1.73V Switching Characteristics Over the Operating Range [3] 1831V33-12 1831V33-15 Parameter Description Min. Max. Min. Max. Unit READ CYCLE t RC Read Cycle Time 12 15 ns t AA Address to Data Valid 12 15 ns t OHA Data Hold from Address Change 3 3 ns t ACS CS LOW to Data Valid 12 15 ns t D LOW to Data Valid 7 8 ns t LZ LOW to Low Z 0 0 ns t HZ HIGH to High Z 7 8 ns t LZCS CS LOW to Low Z [4] 3 3 ns t HZCS CS HIGH to High Z [4, 5] 7 8 ns t PD CS HIGH to Power-Down 12 15 ns WRITE CYCLE [6] t WC Write Cycle Time 12 15 ns t SCS CS LOW to Write End 9 10 ns t AW Address Set-Up to Write End 9 10 ns t HA Address Hold from Write End 0 0 ns t SA Address Set-Up to Write Start 1 1 ns t P Pulse Width 10 12 ns t SD Data Set-Up to Write End 7 8 ns t HD Data Hold from Write End 1 1 ns t LZ HIGH to Low Z 3 3 ns t HZ LOW to High Z [5] 0 7 0 8 ns Notes: 3. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified I OL /I OH and 30-pF load capacitance. 4. At any given temperature and voltage condition, t HZCS is less than t LZCS for any given device. These parameters are guaranteed and not 100% tested. 5. t HZCS and t HZ are specified with C L = 5 pf as in part (b) of AC Test Loads and Waveforms. Transition is measured ±500 mv from steady-state voltage. 6. The internal write time of the memory is defined by the overlap of CS LOW and LOW. Both signals must be LOW to initiate a write and either signal can terminate a write by going HIGH. The data input set-up and hold timing should be referenced to the rising edge of the signal that terminates the write. 3

Switching Characteristics Over the Operating Range [3] (continued) 1831V33-20 1831V33-25 1831V33-35 Parameter Description Min. Max. Min. Max. Min. Max. Unit READ CYCLE t RC Read Cycle Time 20 25 35 ns t AA Address to Data Valid 20 25 35 ns t OHA Data Hold from Address Change 3 3 3 ns t ACS CS LOW to Data Valid 20 25 35 ns t D LOW to Data Valid 12 15 18 ns t LZ LOW to Low Z 0 0 0 ns t HZ HIGH to High Z 10 12 15 ns t LZCS CS LOW to Low Z [4] 3 3 3 ns t HZCS CS HIGH to High Z [4, 5] 10 12 15 ns t PD CS HIGH to Power-Down 20 25 35 ns WRITE CYCLE [6] t WC Write Cycle Time 20 25 35 ns t SCS CS LOW to Write End 17 20 30 ns t AW Address Set-Up to Write End 17 20 30 ns t HA Address Hold from Write End 3 3 3 ns t SA Address Set-Up to Write Start 2 2 2 ns t P Pulse Width 15 20 30 ns t SD Data Set-Up to Write End 12 15 20 ns t HD Data Hold from Write End 2 2 2 ns t LZ HIGH to Low Z 3 3 3 ns t HZ LOW to High Z [5] 0 12 0 12 0 15 ns Switching Waveforms Read Cycle No. 1 [7, 8] ADDRESS t RC t OHA t AA PREVIOUS 1831V33 5 Notes: 7. is HIGH for read cycle. 8. Device is continuously selected, CS = V IL, and = V IL. 4

Switching Waveforms (continued) Read Cycle No. 2 [7, 9] CS t RC t ACS t D t HZ t LZ HIGH IMPEDANCE t HZCS HIGH IMPEDANCE t LZCS t PU t PD SUPPLY CURRENT 50% 50% 1831V33 6 I CC I SB [6] WriteCycleNo.1(Controlled) t WC ADDRESS t SCS CS t AW t SA t P t HA t SD t HD DATA IN t HZ t LZ DATA UNDEFINED HIGH IMPEDANCE 1831V33 7 Note: 9. Address valid prior to or coincident with CS transition LOW. 5

Switching Waveforms (continued) [6,10] WriteCycleNo.2(CSControlled) t WC ADDRESS t SA t SCS CS t AW t P t HA t SD t HD DATA IN DATA UNDEFINED t HZ HIGH IMPEDANCE 1831V33 8 Note: 10. If CS goes HIGH simultaneously with HIGH, the output remains in a high-impedance state. Truth Table CS Inputs/Output Mode H X X High Z Deselect/Power-Down L H L Data Out Read L L X Data In Write L H H High Z Deselect Ordering Information Speed (ns) Ordering Code Package Type Package Type Operating Range 12 CYM1831V33PZ-12C PZ12 64-Pin Plastic ZIP Module Commercial 15 CYM1831V33PZ-15C 20 CYM1831V33PZ-20C 25 CYM1831V33PZ-25C 35 CYM1831V33PZ-35C Document #: 38-M-00087-A 6

Package Diagram 64-Pin Plastic ZIP Module PZ12 Cypress Semiconductor Corporation, 1999. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.