Supplementary Materials for

Similar documents
Electronic supporting information

*Corresponding author.

Structural, optical, and electrical properties of phasecontrolled cesium lead iodide nanowires

Solar Cells, Modules, Arrays, and Characterization

Supplementary Information

Nd:YSO resonator array Transmission spectrum (a. u.) Supplementary Figure 1. An array of nano-beam resonators fabricated in Nd:YSO.

Beams and Scanning Probe Microscopy

Supporting Information

Jian-Wei Liu, Jing Zheng, Jin-Long Wang, Jie Xu, Hui-Hui Li, Shu-Hong Yu*

Advancing EDS Analysis in the SEM Quantitative XRF. International Microscopy Congress, September 5 th, Outline

Supplementary Materials for

Add CLUE to your SEM. High-efficiency CL signal-collection. Designed for your SEM and application. Maintains original SEM functionality

Supplementary Figure S1 X-ray diffraction pattern of the Ag nanowires shown in Fig. 1a dispersed in their original solution. The wavelength of the

High-Resolution Bubble Printing of Quantum Dots

SUPPLEMENTARY INFORMATION

Department of Electrical Engineering, Indian Institute of Technology Hyderabad, Hyderabad, , India.

By emitter degradation analysis of high power diode laser bars. Outline Part I

Composite Thermal Damage Measurement with Handheld FTIR. April 9, 2013 Brian D. Flinn, Ashley Tracey, and Tucker Howie University of Washington

National Science Foundation Center for Lasers and Plasmas for Advanced Manufacturing. Mool C. Gupta Applied Research Center Old Dominion University

Supporting Information

Supporting Information

photolithographic techniques (1). Molybdenum electrodes (50 nm thick) are deposited by

Georgia O'Keeffe. THE Alfred Stieglitz COLLECTION OBJECT RESEARCH Palladium print Alfred Stieglitz Collection. AIC accession number: 1949.

Applications of Steady-state Multichannel Spectroscopy in the Visible and NIR Spectral Region

Diamond Analysis. Innovation with Integrity. Reliable identification and type determination by FTIR spectroscopy FTIR

The equipment used share any common features regardless of the! being measured. Electronic detection was not always available.

Human Retina. Sharp Spot: Fovea Blind Spot: Optic Nerve

Magnesium and Magnesium-Silicide coated Silicon Nanowire composite Anodes for. Lithium-ion Batteries

Nanoscale Systems for Opto-Electronics

Supplementary Materials for

Supplementary Information: Nanoscale. Structure, Dynamics, and Aging Behavior of. Metallic Glass Thin Films

Lecture 19 Optical Characterization 1

Characterization using laser-based technique for failure Si PV module

FTIR microscopy and imaging for failure analysis in electronics manufacturing

Supplementary information for: Surface passivated GaAsP single-nanowire solar cells exceeding 10% efficiency grown on silicon

ANALYTICAL STUDY OF THE MATERIALS USED IN

Supplementary Materials for

Spectroscopy in the UV and Visible: Instrumentation. Spectroscopy in the UV and Visible: Instrumentation

Development and Applications of a Sample Compartment FTIR Microscope

SUPPLEMENTARY INFORMATION

Supplementary Materials for

Nanonics Systems are the Only SPMs that Allow for On-line Integration with Standard MicroRaman Geometries

Visible light emission and metal-semiconductor transition in single walled carbon nanotube composites T. Pradeep Department of Chemistry and

High-Speed Scalable Silicon-MoS 2 P-N Heterojunction Photodetectors

plasmonic nanoblock pair

Instructions for the Experiment

SUPPLEMENTARY INFORMATION

Electrical Characterization

NanoSpective, Inc Progress Drive Suite 137 Orlando, Florida

SUPPLEMENTAL MATERIAL

Design, Fabrication, Characterization, and Application of Semiconductor Nanocomposites

Terahertz control of nanotip photoemission

Spectroscopy of Ruby Fluorescence Physics Advanced Physics Lab - Summer 2018 Don Heiman, Northeastern University, 1/12/2018

A Framed Monochromatic X-Ray Microscope for ICF

Electronic Supplementary Information

5795 DE GASPE AVENUE, #222 MONTREAL, QUEBEC, H2S 2X3 CANADA TECHNICAL SPECIFICATIONS. Maximum input average power. Peak Efficiency

ISG Gemology Tools and Techniques

Cavity QED with quantum dots in semiconductor microcavities

A Parallel Radial Mirror Energy Analyzer Attachment for the Scanning Electron Microscope

Thermochromic Solid-State Emission of Dipyridyl Sulfoxide Cu(I) Complexes

A New, Digital Imaging Method to Study Device Lifetime of Multiple Dyes (D35, N719, SQ1 and SQ2) in Dye-sensitized Solar Cells

Supporting Information

Components of Optical Instruments 1

Beam Shaping and Simultaneous Exposure by Diffractive Optical Element in Laser Plastic Welding

Introduction of New Products

Characterisation of Photovoltaic Materials and Cells

Hybrid Group IV Nanophotonic Structures. Incorporating Diamond Silicon-Vacancy Color

Phase-Transfer Ligand Exchange of Lead. Chalcogenide Quantum Dots for Direct Deposition. of Thick, Highly Conductive Films

SUPPORTING INFORMATION

Components of Optical Instruments

SYNTHESIS AND ANALYSIS OF SILICON NANOWIRES GROWN ON Si (111) SUBSTRATE AT DIFFERENT SILANE GAS FLOW RATE

GaAs polytype quantum dots

Spectral phase shaping for high resolution CARS spectroscopy around 3000 cm 1

Chemical Imaging. Whiskbroom Imaging. Staring Imaging. Pushbroom Imaging. Whiskbroom. Staring. Pushbroom

Selective improvement of NO 2 gas sensing behavior in. SnO 2 nanowires by ion-beam irradiation. Supporting Information.

Lesson 2 Diffractometers

Horiba LabRAM ARAMIS Raman Spectrometer Revision /28/2016 Page 1 of 11. Horiba Jobin-Yvon LabRAM Aramis - Raman Spectrometer

Nanotechnology in Consumer Products

Thermal management and thermal properties of high-brightness diode lasers

Imaging the Subcellular Structure of Human Coronary Atherosclerosis Using 1-µm Resolution

Microscopic Structures

Mini-project report. Nanowire Photovoltaics Correlating the Optical and Structural Properties of GaAs Nanowires Containing InGaAs Quantum Dots

Compositional depth profile analysis of coatings on hard disks by X-ray photoelectron spectroscopy and imaging

ANALYTICAL MICRO X-RAY FLUORESCENCE SPECTROMETER

Micropulse Duty Cycle. # of eyes (20 ms) Total spots (200 ms)

Monolithically integrated InGaAs nanowires on 3D. structured silicon-on-insulator as a new platform for. full optical links

Generation of a Line Focus for Material Processing from an Array of High Power Diode Laser Bars R. Baettig, N. Lichtenstein, R. Brunner, J.

ESCALAB 250: High Performance Imaging XPS

SCIENTIFIC INSTRUMENT NEWS. Introduction. Design of the FlexSEM 1000

Long-distance propagation of short-wavelength spin waves. Liu et al.

Fabrication of Probes for High Resolution Optical Microscopy

Sensitivity Enhancement of Bimaterial MOEMS Thermal Imaging Sensor Array using 2-λ readout

Infrared Single Shot Diagnostics for the Longitudinal. Profile of the Electron Bunches at FLASH. Disputation

YOUR INSTRUMENT YOUR SOLUTION

SUPPLEMENTARY INFORMATION

M. Senoner 1), Th. Wirth 1), W. E. S. Unger 1), M. Escher 2), N. Weber 2), D. Funnemann 3) and B. Krömker 3) INTRODUCTION

Introduction to the operating principles of the HyperFine spectrometer

Dual Light and Temperature Responsive Cotton Fabric Functionalized with a Surface- Grafted Spiropyran- NIPAAM- hydrogel

Quantum Sensors Programme at Cambridge

Supplementary Figure 1. Effect of the spacer thickness on the resonance properties of the gold and silver metasurface layers.

Transcription:

advances.sciencemag.org/cgi/content/full/3/10/eaao4204/dc1 Supplementary Materials for Enhanced mobility CsPbI3 quantum dot arrays for record-efficiency, high-voltage photovoltaic cells Erin M. Sanehira, Ashley R. Marshall, Jeffrey A. Christians, Steven P. Harvey, Peter N. Ciesielski, Lance M. Wheeler, Philip Schulz, Lih Y. Lin, Matthew C. Beard, Joseph M. Luther This PDF file includes: Published 27 October 2017, Sci. Adv. 3, eaao4204 (2017) DOI: 10.1126/sciadv.aao4204 Supplementary Materials and Methods fig. S1. Performance of FAI-coated and control devices. fig. S2. Light absorption following FAI posttreatment. fig. S3. Comparison of EQE with AX posttreatment. fig. S4. Reproducibility of FAI-coated CsPbI3 QD device performance. fig. S5. XPS spectroscopy. fig. S6. FTIR spectra of CsPbI3 QDs. fig. S7. Crystal structure of CsPbI3 QDs. fig. S8. CsPbI3 QD film morphology. fig. S9. Comparison of terahertz μs τ product. fig. S10. PL lifetime of CsPbI3. Reference (34)

Supplementary Materials and Methods X-ray photoemission spectroscopy. XPS data was taken on a Kratos NOVA spectrometer calibrated to the Fermi edge and core level positions of sputter-cleaned metal (Au, Ag, Cu, Mo) surfaces. Spectra were acquired using monochromated Al Kα radiation (1486.7 ev) at a resolution of 600 mev (pass energy 20 ev). The data was averaged from multiple spots on the sample while the X-ray intensity was held low (15 W anode power) to avoid sample degradation (34) and fit using Pseudo-Voigt profiles. Scanning electron microscopy. Samples were mounted on aluminum stubs with double-sided carbon tape and sputter-coated with 3 nm of Iridium prior to imaging. Images were obtained with a FEI Quanta 400 FEG instrument (FEI, Hillsboro, OR). Imaging was performed with a beam accelerating voltages of 30 kev. Time-resolved photoluminescence. Time resolved photoluminescence was measured using a Hamamatsu streak camera system (C10910-05), while the excitation source was a Fianium Supercontinuum high power broadband fiber laser (SC400-2-PP). The chosen excitation wavelength was 530 nm at ~25 μw power on a spot size of 0.02 mm 2.

fig. S1. Performance of FAI-coated and control devices. (A) J-V scans in the forward (dotted) and reverse (solid) directions for FAI-coated (pink) and control (grey) devices. The SPO for each device is indicated by the diamond marker. (B) EQE (solid) and integrated current (dotted) for the FAI-coated (pink) and control (grey) devices. fig. S2. Light absorption following FAI posttreatment. Absorptance spectra of CsPbI3 QD films on glass with (pink) and without (grey) the FAI post-treatment.

fig. S3. Comparison of EQE with AX posttreatment. EQE of devices treated with different AX salts observe similar EQE onset at ~700 nm. fig. S4. Reproducibility of FAI-coated CsPbI3 QD device performance. Histograms of the PCE, VOC, JSC and FF of FAI-coated CsPbI3 QD devices (n=78).

fig. S5. XPS spectroscopy. XPS core level spectra of CsPbI3 QD films on TiO2/FTO/glass. The presence of FA + species is observed by an additional peak centered at 401 ev binding energy in the N 1s core level region. Furthermore, the surface composition changes upon FAI treatment. The Cs + :Pb 2+ ratio drops from 0.91 to 0.74 indicating a decrease in Cs + content at the surface. At the same time, the I - :Pb 2+ ratio rises from 2.73 to 2.83 corroborating the results of the ToF-SIMS measurements. A decrease in the oxygen content upon FAI treatment indicates the further removal of residual oleate groups from the QD surface.

fig. S6. FTIR spectra of CsPbI3 QDs. Fourier-transformed infrared (FTIR) spectra of CsPbI3 QD films with (green) and without (black) FAI post-treatment. The emergence of the peak at 1712 cm -1 is indicative of the presence of FA. fig. S7. Crystal structure of CsPbI3 QDs. X-ray diffraction pattern for CsPbI3 QD films with (green) and without (black) FAI post-treatment.

fig. S8. CsPbI3 QD film morphology. SEM micrographs of the surface of the control and FAI-coated QD films show closely-packed assemblies of discrete nanoparticles in both cases. fig. S9. Comparison of terahertz μs τ product. Comparison of the μs τ product calculated from THz spectroscopy for the control CsPbI3 QD and FAI-coated CsPbI3 QD films compared to a PbS QD film, a PbSe QD film, and a MAPbI3 thin film.

fig. S10. PL lifetime of CsPbI3. Time resolved photoluminescence decay plots for CsPbI3 QD films with (pink) and without (blue) FAI post-treatment.