Optoelectronic Components Testing with a VNA(Vector Network Analyzer) VNA Roadshow Budapest 17/05/ PDF Free Download

Optoelectronic Components Testing with a VNA(Vector Network Analyzer) VNA Roadshow Budapest 17/05/2016

Content Introduction Photonics & Optoelectronics components Optical Measurements VNA (Vector Network Analyzer) Setup Optical VNA Calibration and uncertainties VectorStar family Optical Analyzers solution from Anritsu Summary 2 2

Introduction Many Applications use Photonics Telecoms - higher bit rate; fiber lighter electrical cable Medicine - accurate and less intrusive Consumer equipment - CD/DVD; Mouse; scanner. Applications using Photonics is still innovating and growing Transmission up to 400Gb/s Printing circuit board Automotive Some Photonics Applications use Optoelectronic components Electrical and Optical signals are needed Telecom, the optical signal is the carrier Optical Scanner, Detector the results are treated with electric signal Radio Frequency Over Fiber 4

Optoelectronic and optical Components Optoelectronic components, (semiconductor) use material characteristics to link optical and electrical signals. Discrete devices Optical modulators E/O Lasers diode Photodiodes Integrated TX/RX modules O/E Transmitters (modulator + driver + laser) Photo-receivers (photodiode + trans-impedance amplifier) Complete transceivers Optical components Cable (Fiber) Amplifier Switch 5

Testing Optoelectronic and optical Components Depending on the components several tests are needed Optical source Optical power, Wavelength, Spectral response, Responsivity Modulator Signal waveforms, extinction ratio, modulation rate,. Several test equipment are required, Electrical and Optical: Power Meters & sensor Optical/Electrical Spectrum Analyzer Optical/Electrical Oscilloscope OTDR Optical sources The Optical VNA is a part of these equipment, and Anritsu propose a solution for this 6

Basic measurements using a VNA DUTs used in optical systems, several test configuration are possible: - O/O, Fiber - O/E, Optical receivers - E/O, Optical modulators - E/E, Amplifier (trans-impedance and driver) Optical Source Optical Modulator O.O O/E Detector Display Electrical Source E.E Ampli Receiver DUT 8

Example, Basic measurements for Photodetector The Optical VNA can measure the responsivity of the photodetector. Amplitude Modulated Optical signal Responsivity (W/A)= Optical power/ Electrical current (Output current per unit incident light power) ηe R = M hν Frequency Phase Electrical Out Frequency 9

Tests capability with the optical VNA E/O and O/E Transfer function (S 21 ) Bandwidth and flatness Phase linearity (group delay) Electrical return loss (S 11 or S 22 ) Electrical/Electrical S-Parameters (S 11, S 21, S 12, S 22 ) Gain compression P out vs. P in Time domain Optical/Optical Rise time and propagation delay using time domain transmission Transfer function (S 21 ) Bandwidth and flatness Phase linearity (group delay) 10

Example, O/E device measurements Test results for a 50 GHz photodetector Magnitude response, the 3-dB bandwidth is indeed around 50 GHz but the roll-off is sufficiently slow, so this device is commonly used beyond 65 GHz The phase response is also shown in the figure but the linear portion has not been removed. The group delay (derivative of phase to frequency) is often a more convenient way of looking at the phase behavior. Towards 50 GHz, there are some deviations from flat group delay (equivalent to deviations from linear phase) that are not surprising in view of the device s bandwidth. 11

Optical VNA Set-up The Electrical VNA is the main part of the set-up Electrical tests are needed Same Functionalities will be used for optics tests The Optical VNA is created in adding O/E and E/O converters That modular solution allows to adapt the setup following tests required Anritsu proposes converters, but the customer can use its own converter Configuration menu allows to simplify the setup Important! As all VNA a calibration is requested, it means the setup needs an optical reference 13

Optical VNA setup, 70KHz to 70GHz Depending on DUT the setup will change, two examples: 1) VNA Port 1 Port 2 The VectorStar VNA, MS464XB Optical Source Optical Modulator O DUT (Fiber) O O/E Detector 2) E DUT Modulator (internal source) VNA Port 1 Port 2 O O/E Detector Source and Modulator (Partner Anritsu) Reference O/E module MN4765B 14

Optical VNA setup, 70KHz to 110GHz Depending on DUT the setup will change, The VectorStar VNA, ME7838A VNA Port 1 Port 2 110GHz Module 110GHz Module O O/E Detector Reference O/E module MN4765B 15

E/O & O/E Measurement set-up Required equipment: VectorStar VNA (MS4647B) MN4765B O/E calibration module (Transfer standard for E/O) Photline ModBox (Transfer Standard for O/E) ModBox - Photline & Anritsu (Option) Internal optical source (Option) Up to 70GHz ModBox Fiber MN4765B-0070 (Option 70): 70 GHz at 1550 nm (cover 1480 to 1620 nm) MN4765B-0071 (Option 71): 70 GHz at 1310 nm (cover 1300 to 1330 nm) MN4765B-0072 (Option 72): 70 GHz at 1310 & 1550 nm MN4765B-0110 (Option 110): 110 GHz at 1550 nm (cover 1480 to 1620 nm) MN4765B MS4647B Port 1 Port 2 MS4647B (option 070) 70kHz to 70GHz ME7838A 70kHz to 110GHz 16

VNA Calibration Considerations for accurate results Electrical measurements on VNA are controlled and accurate Calibration methodology (SOLT, LRL ) Reference Components and standards What do we do for Optical VNA? Considering only S21 tests are measured Transmission Calibration is required We need optical reference MN4765B, O/E module, characterized at specified wavelength, input optical level, and temperature Protected from physical and static damage Bias regulation Temperature stable NIST derived characterization to from 70 khz to 110 GHz (magnitude & phase) 18

Anritsu O/E Calibration Standards MN4765B O/E Calibration Module supplied with characterization data derived directly from NIST measurements (1550 nm and 1310 nm). A S2P file is supplied NIST Characterization (Magnitude and Phase using EO Sampling Technique) Golden Standard Silver Standard (MN4765B) Tier 1: Held in Anritsu Calibration Lab, used to characterize silver standards Tier 2: Measurement accessory with characterization data in S2P format for use in calibration and/or verification 19

MN4765B-0070 & MN4765B-0110 Specifications Specification Value Unit Frequency Range (1) 0.00007 to 70 GHz Characterized Wavelength 1550 +/- 20 nm Linear Optical Input Power (2) < 6 dbm Max Optical Input Power 10 dbm Operating Temperature (3) 18 to 28 C Storage Temperature -20 to 70 C Electrical Return Loss < 50 GHz < 70 GHz < -8 < -5 db db Operating Wavelength Range 1480 to 1620 nm DC Responsivity > 0.7 A/W Optical Return Loss < -24 db Specification Value Unit Frequency Range (1) 0.00007 to 110 GHz Characterized Wavelength 1550 +/- 20 nm Linear Optical Input Power (2) < 6 dbm Max Optical Input Power 10 dbm Operating Temperature (3) 18 to 28 C Storage Temperature -20 to 70 C Electrical Return Loss < 50 GHz < 110 GHz < -6 < -4 db db Operating Wavelength Range 1480 to 1620 nm DC Responsivity > 0.5 A/W Optical Return Loss < -24 db (1) Frequency Range over which the MN4765B is calibrated by Anritsu Cal Lab. (2) Linear operating range over which S21 is accurate to < 0.25 db. (3) Calibrated temperature is 23 C ± 3 C. 20

MN4765B-110GHz Frequency response (Magnitude and Phase) Below the response of the MN4765B, connected to the 110GHz VNA, this solution is unique. Calibrated with NIST reference, small modules (electrical and optical), from 70KHz to 110GHz. DUT (E/O) MN4765B Electrical modules 21

VNA calibration for E/O test 1) VNA Electrical calibration at reference plan 3) Start VNA optical measurement. This menu setup & prepare E/O test, mainly it De-embeds the O/E of the test system 4) Install the DUT (E/O component) VNA Port 1 Port 2 VNA Ref. plan Port 1 Port 2 Ref. plan 2ports cal DUT λ O/E 2) connect the MN4765B (O/E characterized) to one reference plan VNA port 1 De-embedding function remove characterized O/E, (S2P file). Ref. plane O/E VNA port 2 Components as modulator can be tested. The wavelength range should be compatible 22

VNA calibration for O/E test We need to create E/O characterized. 4) Use previous slide step 1 to 3. VNA Port 1 Port 2 5) Continue the procedure in the menu to De-Embed E/O module 6) Install the DUT (O/E component) VNA Port 1 Port 2 Modulator & Source λ O/E Modulator & Source λ DUT S2P data file is created and saved. The characterization is transferred from O/E to E/O. We created a golden E/O. De-embedding function remove characterize E/O (S2P file) VNA port 1 E/O Ref. plane VNA port 2 Components as photodiode can be tested. The wavelength range should be compatible 23

VNA calibration for O/O test For O/O transmission test, the O/E and E/O are needed. For calibration, we cumulate the two previous O/E and E/O calibration. Also for simple test, we do a Transmission cal, this capability exists in the VNA menu VNA Port 1 Port 2 VNA Port 1 Port 2 Modulator & Source λ O/E Modulator & Source DUT O/E A thru ( short fiber) can be used The DUT is inserted between the E/O O/E converters 24

O/E Test 70GHz uncertainties At 50 GHz -40dBm 0.38dB 2.8 25

O/E 110GHz uncertainties At 50 GHz -40dBm 0.48dB 4 26

VNA Measurement Advantages Bandwidth up to 110 GHz Amplitude and phase measurements High Frequency resolution up to 1 Hz Fast Measurement speed Vector error correction reduces ripple and uncertainty in measurement Repeatable measurements Synthesized microwave source Stable microwave test set and receiver O/E module characterization derived from NIST 27

VectorStar VNA Family Start Frequency: 10 MHz (Optional 70 khz) GHz 20 40 50 70 MS4642B MS4644B MS4645B MS4647B 110/145 1000 ME7838 Systems OML/VDI 8 MS464xB: 2 and 4 Port Microwave VNAs 29 11 18 ME7838: 2 and 4 Port Broadband, 14 mm-wave and THz-region VNA Systems

VectorStar VNA options VectorStar Options and Accessories MS4640B-002 Time Domain MS4640B-007 Receiver Offset Independent Source & Receive, Multiple Source Control, NxN MS464xB-051 Direct Access Loops MS464xB-061/062 Active Measurements Suite Add 2 or 4 step attenuators, bias tees, direct access loops, and gain compression MS4640B-070 70 khz Low End Frequency Extension MS464xB-08x Broadband/mmWave Interface MS464xB-031 Dual Source MS464xB-032 Internal Combiner MS4640B-035 IF Digitizer MS4640B-041 Noise Figure MS4640B-042 PulseView MS4640B-043 DifferentialView MS4640B-044 IMDView 36585K/V Precision AutoCal 2-port, 40 / 70 GHz MN4765B O/E Calibration Module 30

Additional analyzers for testing Optoelectronic components MP1800A Signal Quality Analyzer (up to 64Gb/s) MS9740A, Optical Spectrum Analyzer (600-1750nm) OTDR (optical Time Domain reflectometer) Multimode and single mode 32 CM5 Optical Source and power meter

Summary Anritsu VNA Solution for Optoelectronic Measurements Measurement capability from 70 khz to 110 GHz with MN4765B O/E O/E module with characterization derived from NIST Dual wavelength coverage, 1550 nm and 1310 nm, to 70 GHz O/E, E/O and O/O capabilities Wizard menu and VNA de-embedding for simplified calibration Excellent stability and repeatability Typical uncertainties: <0.5 db at 50 GHz Total flexibility and upgradeability Cost-effective application solution 34

ThankYou Questions? VNA Roadshow 2016

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