The Measurement of (1/f) AM noise of Oscillators

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The Measurement of (1/f) AM noise of Oscillators Enrico Rubiola FEMTO-ST Institute, Besançon, France (CNRS and Université de Franche Comté) Outline Introduction Power detectors Experimental method Results Perspectives and conclusions http://rubiola.org

introduction 1 Motivations for AM noise metrology 2 Emerging need, after the progress of oscillators and sources phase noise metrology (bridge/interferometric) method Impacts on frequency synthesis AM/PM conversion oscillators power effects on the resonator microwave photonic systems laser RIN... Measurement the AM noise of a source relies on instruments

introduction 2 AM noise 3 polar coordinates v(t) = V 0 [1 + α(t)] cos [ω 0 t + ϕ(t)] Cartesian coordinates In low noise conditions Relates to power fluctuations v(t) = V 0 cos ω 0 t + n c (t) cos ω 0 t n s (t) sin ω 0 t α(t) = n c(t) V 0 and ϕ(t) = n s(t) V 0 α(t) = 1 2 δp P 0 Same formulae as for frequency noise 0 Power-law S α (f) = h i f i h 2/f 2 random walk i= 2 α(t) y(t) h 1/f h0 flicker white Allan variance σ 2 α(τ) = h 0 2τ + 2 ln(2) h 1 + 4π2 6 h 2 τ white flicker random walk

detectors 1 The diode power detector 4 law: v = kd P same form as in optical quantum detectors differential resistance R d = V T I 0 V T = kt/q 25 mv thermal voltage rf in video out rf in video out ~60 Ω 10 200 pf external 50 Ω to 100 kω ~60 Ω 10 200 pf external 50 Ω to 100 kω 1000 500 two-diode detector output voltage, mv 200 100 50 20 10 5 2 100 kω 1 kω 100 Ω linear region (power detector) linear region (envelope detector) 1 30 20 10 0 10 input power, dbm

detectors 2 Tunnel and Schottky power detectors 5 parameter Schottky tunnel input bandwidth up to 4 decades 1 3 octaves 10 MHz to 20 GHz up to 40 GHz vsvr max. 1.5:1 3.5:1 max. input power (spec.) 15 dbm 15 dbm absolute max. input power 20 dbm or more 20 dbm output resistance 1 10 kω 50 200 Ω output capacitance 20 200 pf 10 50 pf gain 300 V/W 1000 V/W cryogenic temperature no yes electrically fragile no yes The tunnel diode is actually a backward diode. The negative resistance region is absent. Measured detector gain, A 1 load resistance, Ω DZR124AA DT8012 (Schottky) (tunnel) 1 10 2 35 292 3.2 10 2 98 505 1 10 3 217 652 3.2 10 3 374 724 1 10 4 494 750 conditions: power 50 to 20 dbm output voltage, dbv 0-20 -40-60 -80-100 -120 Herotek DZR124AA s.no. 227489 Schottky 3.2 kω 10 kω 100 Ω 320 Ω 1 kω -60-50 -40-30 -20-10 0 10 input power, dbm ampli dc offset output voltage, dbv -20-40 -60-80 -100 Herotek DT8012 s.no. 232028 Tunnel 10 kω 3.2 kω 1 kω 320 Ω 100 Ω ampli dc offset -60-50 -40-30 -20-10 0 10 input power, dbm

detectors 3 Noise mechanisms 6 Shot noise SI (f ) = 2qI0 Rothe-Dahlke model of the amplifier detector rf in video out amplifier in v n noise free out ~60 Ω 10 200 pf external 50 Ω to 100 kω i n Thermal noise SV (f ) = 4kBT0R Flicker (1/f ) noise is also present Never say that it s not fundamental, unless you know how to remove it In practice the amplifier white noise turns out to be higher than the detector noise and the amplifier flicker noise is even higher

method 1 Cross-spectrum method 7 v a (t) = 2k a P a α(t) + noise source under test power meter monitor P a P b v a v b dual channel FFT analyzer v b (t) = 2k a P b α(t) + noise The cross spectrum Sba(f ) rejects the single-channel noise because the two channels are independent. S ba (f) = 1 4k a k b P a P b S α (f) Sα (f) log/log scale 1 2m single channel cross spectrum meas. limit Averaging on m spectra, the singlechannel noise is rejected by 1/2m A cross-spectrum higher than the averaging limit validates the measure The knowledge of the single-channel noise is not necessary f

method 2 Calibration 8 source under test atten 0.1 db step P a P b power meter v a v b voltm. Set a reference P/Pa (0.1 db) with a by-step attenuator Measure va at the output k a P a = v a P/P a Repeat interchanging the channels Note that only the kp product is needed because 1 S ba (f) = S α (f) 4k a k b P a P b source under test ν 0 atten P a P b power meter v a v b voltm. Alternate (and complex) calibration method. It exploits the sensitivity and the accuracy of a lock-in amplifier. As before, it requires a reference power-ratio ν b = ν 0 ν s reference ν s atten ref in lock in amplifier input Im Re out

results 1 Example of AM noise spectrum 9 123.1 Wenzel 501 04623E 100 MHz OCXO P0 = 10.2 dbm avg 2100 spectra 133.1 Sα ( f ) db/hz 143.1 153.1 Fourier frequency, Hz 163.1 10 10 2 10 3 10 4 10 5 flicker: h 1 = 1.5 10 13 Hz 1 ( 128.2 db) σ α = 4.6 10 7 Single-arm 1/f noise is that of the dc amplifier (the amplifier is still not optimized)

results 2 AM noise of some sources 10 source h 1 (flicker) (σ α ) floor Anritsu MG3690A synthesizer (10 GHz) 2.5 10 11 106.0 db 5.9 10 6 Marconi synthesizer (5 GHz) 1.1 10 12 119.6 db 1.2 10 6 Macom PLX 32-18 0.1 9.9 GHz multipl. 1.0 10 12 120.0 db 1.2 10 6 Omega DRV9R192-105F 9.2 GHz DRO 8.1 10 11 100.9 db 1.1 10 5 Narda DBP-0812N733 amplifier (9.9 GHz) 2.9 10 11 105.4 db 6.3 10 6 HP 8662A no. 1 synthesizer (100 MHz) 6.8 10 13 121.7 db 9.7 10 7 HP 8662A no. 2 synthesizer (100 MHz) 1.3 10 12 118.8 db 1.4 10 6 Fluke 6160B synthesizer 1.5 10 12 118.3 db 1.5 10 6 Racal Dana 9087B synthesizer (100 MHz) 8.4 10 12 110.8 db 3.4 10 6 Wenzel 500-02789D 100 MHz OCXO 4.7 10 12 113.3 db 2.6 10 6 Wenzel 501-04623E no. 1 100 MHz OCXO 2.0 10 13 127.1 db 5.2 10 7 Wenzel 501-04623E no. 2 100 MHz OCXO 1.5 10 13 128.2 db 4.6 10 7 worst best

persp. & concl. 1 Measurement of the detector noise 11 In progress P a A v a adj. gain diff. ampli g(p c P a ) R a low noise source P c C v c JFET input dual channel FFT analyzer AM input osc. out lock in amplifier monitor power meter input Im Re out P b B R c R b v b adjust the gain for the Re output to be zero adj. gain Basic ideas diff. ampli g(p c P b ) Remove the noise of the source by balancing C A and C B Use a lock-in amplifier to get a sharp null measurement Channels A and B are independent > noise is averaged out Two separate JFET amplifiers are needed in the C channel JFETs have virtually no bias-current noise Only the noise of the detector C remains In all previous experiments, the amplifier noise was higher than the detector noise

persp. & concl. 1 12 Conclusions Method for the measurement of AM noise in oscillators High sensitivity and accurate calibration Suitable to optics and to microwave photonics Measurement of some RF/microwave sources Single-channel sensitivity still limited by the dc amplifier Measurement of the detector noise in progress http://rubiola.org Free downloads (text and slides) http://arxiv.org/abs/physics/0512082 (text only)