Geometric image distortion in flat-panel X-ray detectors and its influence on the accuracy of CT-based dimensional measurements

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Geometric image distortion in flat-panel X-ray detectors and its influence on the accuracy of CT-based dimensional measurements Daniel Weiß, Ronald Lonardoni, Andreas Deffner, Christoph Kuhn Carl Zeiss IMT GmbH, 73447 Oberkochen, Germany, e-mail: d.weiss@zeiss.de, lonardoni@zeiss.de, deffner@zeiss.de, c.kuhn@zeiss.de Abstract In order to make optimal use of the photons emitted from an isotropic X-ray emitter such as an X-ray tube, many industrial computed-tomography (CT) setups employ area detectors in the cone-beam configuration. In addition to inspection tasks, these CT setups may also be used for dimensional measurements. To achieve maximum measurement accuracy, the X-ray imaging conditions must be as close to ideal as possible. Among others, this means that the detector should exhibit no geometric image distortion. While it is well known that image intensifiers show significant geometric distortion, detectors based on flat-panel photodiode arrays are often assumed to be effectively distortion-free. We have found that some flat-panel detectors display a small amount of reproducible image distortion (mean distortion approx. 0.05 pixels) of unknown origin, and that the measurement accuracy according to guideline VDI 2630 can be improved significantly by compensating this distortion. Keywords: X-ray computed tomography, dimensional measurement, flat-panel detector, geometric image distortion, measurement accuracy, VDI 2630 1 Introduction Nowadays, industrial X-ray CT setups used for non-destructive testing usually employ area detectors in the cone-beam configuration, rather than line or point detectors, in order to minimize measurement time. The prevalent detector technology is based on the combination of an X-ray scintillator such as gadolinium oxysulfide (GadOx) or cesium iodide (CsI), and an amorphous-silicon transistor/photodiode array [1]. This indirect flat-panel detector (FPD), when compared to precursor technologies such as image intensifiers and image plates, excels in many regards, such as ease of use, detective quantum efficiency, resolution, linearity of response and dynamic range [2]. In addition, FPDs are often assumed to be effectively distortion-free [2, 3], especially when compared to the considerable geometric image distortion present in image intensifiers, where it is owing to photocathode curvature and electron optics [4, 5]. 2 Observation of measurement variability With regard to the geometric fidelity of the detector, CT-based dimensional metrology is obviously a much more demanding application than non-destructive testing. The starting point for this investigation was the observation of an unexpectedly high variability of the measurement result when using a PaxScan 2520V detector (Varian Medical Systems Inc.) with a CsI scintillator. By performing several CT measurements (with circular source trajectory) of the same object using different regions of the detector, a reproducible variation of the measurement result was observed that, on closer inspection, could not be attributed to detector misalignment, the influence of Feldkamp artifacts or movement of the X-ray source from one measurement to the next. Turning the detector by 180 degrees about its plane normal caused a corresponding change of the observed variation. 175

Figure 1: Scanning electron micrograph of CsI needle crystals (source: internet). This indicated the presence of a reproducible geometric distortion of the detector image occurring in the plane of the detector array, and not as a consequence of e.g. imperfect alignment of detector and object rotation axis. This postulated in-plane geometric image distortion is unexpected, but possibly a cause for this might be found by looking at the FPD manufacturing process. The pixel array of a FPD is created in a photolithographic process, where a reticle is translated step by step in order to create a final exposure pattern the size of the active area of the detector (with subsequent processing steps). There are a number of geometric errors associated with this procedure, such as lens distortion, magnification error, and stitching error; however, panel manufacturers quote aggregate geometric errors of less than one micrometer for the resulting structure (Rick Colbeth, personal communication, November 21, 2008). In combination with pixel pitches of at least 50 micrometers, ranging up to several hundred micrometers for large FPDs, the resulting relative geometric error of the pixel array should be negligible. However, there might be other causes for overall geometric distortion: in the case of a directlydeposited CsI scintillator, the deposition process might warp the panel, or the light-guiding columnar structure of the CsI layer (see fig. 1) might have different angular orientation at different positions, thus introducing a location-dependent shift of the incident intensity. It is known that the CsI crystals exhibit some degree of light guiding, i.e. internal reflection of the visible light within individual crystal grains [1]. This is the reason why CsI scintillators can be thicker than GadOx scintillators while maintaining the same resolution. If the grains are not perfectly perpendicular to the panel, the light guiding could explain the local offsets. In our case, the CsI layer is 600 µm thick [6], and the mean observed distortion of approx. 0.05 pixels corresponds to approx. 6 µm at the pixel pitch of 127 µm. Thus an angular incline of only 0.6 degrees of the CsI grains with respect to the plane normal would be sufficient for the mean distortion that we observed. 3 Measurement of the geometric image distortion In order to measure the geometric image distortion, a suitable object with grid-like structure was designed, and the exact geometry determined with a tactile coordinate measurement machine (CMM) with high precision. By acquiring and evaluating several X-ray projections of this object, a vectorial distortion map is generated (fig. 2). This map can then be used to correct ( undistort ) the X-ray projections during reconstruction. 176

(c) (d) Figure 2: Vectorial distortion map for PaxScan 2520V detector with CsI scintillator, with four independent distortion measurements shown in color (a); histogram of the distortion magnitude ; and x- and y-components shown separately, color-coded between +/- 0.15 pixels (c, d). 4 Influence on measurement accuracy The effect of distortion correction on measurement accuracy was evaluated for two objects. According to guideline VDI/VDE 2617/2630 for DIN EN ISO 10360, the length measurement error E can be determined by measuring a suitable assembly of spheres. In this case, the test object MetrotomCheck mini (fig. 3.a) was measured three times at the same magnification, but using three different regions of the detector (fig. 3.c). 177

(c) (d) (e) Figure 3: CT measurements of VDI 2630-compliant test object MetrotomCheck mini (a) using three different regions of a PaxScan 2520V CsI detector (c) exhibit different behavior of the measurement error for the center-tocenter distances depending on the detector region used (d). Note that the error is plotted for all 231 possible pairings of the 22 spheres. Applying an independently determined, detector-specific distortion map (b, shows x- component only) reduces the variability (e). The maximum permissible error MPE E for the METROTOM 800 is indicated by dashed blue lines. 178

Figure 4: Constant-in-z test object (acrylic-glass cylinder) (a); result of CT measurements of the inner and outer radius (using the region between the green markers) at different detector heights, with and without distortion correction. The terms bl corr and bc corr refer to bilinear and bicubic interpolation used in the distortion correction. After scaling all three volumetric images with a common scale factor to achieve an approximately symmetric measurement error range, the measurement error range was -2.3 to +3.2 µm (fig. 3.d). The scaling was done to remove any common scaling error in the three volumetric images, such as is caused by measurement errors in the locations of source and detector; however it cannot compensate those differences between the volumetric images that are the result of distorted projections. Note that since the measurement using the central detector region apparently shows a larger scale than those measurements using the lower and upper detector, the variability cannot be explained by angular misalignment between object rotation axis and detector (which could introduce a location-dependent but monotonic scaling error). Applying the distortion map to correct the projections, and performing the same evaluation, reduces the error range to -1.6 to +2 µm (fig. 3.e). Additionally, an acrylic-glass cylinder (fig. 4.a) was measured nine times in a similar fashion, i.e., by translating the cylinder along its axis between measurements. In this way, the inner and outer radius of a specific region of the cylinder was determined using different ranges of detector rows. This object was chosen to exclude the possibility of Feldkamp artifacts causing the observed error variability, since it is known that the Feldkamp algorithm, despite its approximate character, is exact for objects with constant density in the z-direction [7]. For an ideal detector, the measured radii are expected to be constant and independent of the detector row range used. For the uncorrected projections, the radii show a pronounced and non-linear dependence on the region of the detector used for the measurement (fig. 4.b). For the corrected projections, this dependence is approximately linear (and may thus be a result of e.g. detector tilt) and considerably smaller in magnitude. Thus, both test objects confirm the validity of the independentlymeasured geometric image distortion of the FPD. 179

Figure 5: Measured distortion maps for eight individual PaxScan 2520V detectors, x- and y-components (a, b). Since distortion measurements cannot be made arbitrarily close to the detector edge, they are extrapolated for the detector border region. The strong distortion shown in the corners may be spurious; these regions are seldom used for CT measurements and verification is difficult. Numbers indicate the mean length of the distortion vectors in pixels. 180

5 Additional observations A dependence of the measured distortion on the temperature of the detector was not observed. Installation and de-installation of a detector including handling also did not affect the measured distortion. Fig. 5 shows the measured distortion maps for eight individual detectors. As can be seen, it is necessary to measure the distortion individually. 6 Summary We have described a small but reproducible variability of length measurement error observed when performing X-ray CT measurements using different regions of a detector with CsI scintillator. This effect was explained as the result of an in-plane geometric distortion which might be caused by the microscopic structure of the scintillator. The distortion varies among individual detectors. Compensating the distortion improves the measurement error range. Acknowledgements We would like to thank Rick Colbeth of Varian Medical Systems Inc. for helpful discussions about the PaxScan detector and for providing additional information about panel manufacture accuracy. References [1] Varian Medical Systems Inc., Flat Panel X-ray Imaging, white paper, 2004. [2] Seibert, J., Flat-panel detectors: how much better are they?, Pediatric Radiology 36, 173, 2006. [3] Ning, R., Tang, X., Yu, R., Conover, D. L., Zhang, D., "Flat-panel-detector-based cone beam volume CT imaging: detector evaluation", Proc. SPIE 3659, 192 (1999). [4] Boone, J. M., Seibert, J. A., Barrett, W. A., Blood, E. A., Analysis and correction of imperfections in the image intensifier TV digitizer imaging chain, Med. Phys. 18, 236, 1991. [5] Rudin, S., Bednarek, D. R., Wong, R., Accurate characterization of image intensifier distortion, Med. Phys. 18, 1145, 1991. [6] Varian Medical Systems Inc., PaxScan 2520V FDA Non-Clinical Data, 2006. [7] Feldkamp, L.A., Davis, L.C., Kress, J.W., "Practical cone-beam algorithm", J. Opt. Soc. Am. A 1, pp. 612-619, 1984. 181