Series Resistance Compensation

Similar documents
What are the steps to use the Axoclamp-2B for whole-cell patch clamp in continuous single-electrode voltage clamp (csevc) mode?

USING THE AXOCLAMP-2B TUTORIALS

Practical Testing Techniques For Modern Control Loops

Technical Information

Testing and Stabilizing Feedback Loops in Today s Power Supplies

Chapter 16 Microelectrode electronics DAVID OGDEN. 1. Introduction

EE 42/100: Lecture 8. 1 st -Order RC Transient Example, Introduction to 2 nd -Order Transients. EE 42/100 Summer 2012, UC Berkeley T.

Experiment 9. PID Controller

Numerical Oscillations in EMTP-Like Programs

User s Manual for Integrator Short Pulse ISP16 10JUN2016

Single Electrode Voltage Clamping

Experiment 1 LRC Transients

Notes. 1. Midterm 1 Thursday February 24 in class.

CHAPTER 7. Response of First-Order RL and RC Circuits

Procidia Control Solutions Dead Time Compensation

DLVP A OPERATOR S MANUAL

Although shunt capacitors

CHAPTER 6 INTRODUCTION TO SYSTEM IDENTIFICATION

CHAPTER 7 HARDWARE IMPLEMENTATION

Chapter 7. Response of First-Order RL and RC Circuits

RC and RL Circuits. Figure 1: Capacitor charging circuit.

University of Jordan School of Engineering Electrical Engineering Department. EE 219 Electrical Circuits Lab

INSTRUCTION MANUAL FOR CELL SIMULATOR MODEL 2410

1) Consider the circuit shown in figure below. Compute the output waveform for an input of 5kHz

Application Note 1024

SCRIPT. Voltage Dividers

Basic Electronics Learning by doing Prof. T.S. Natarajan Department of Physics Indian Institute of Technology, Madras

Section 7 - Measurement of Transient Pressure Pulses

User s Manual for Integrator Long Pulse ILP8 22AUG2016

HOW DIODES WORK CONTENTS. Solder plated Part No. Lot No Cathode mark. Solder plated 0.

ENGR-4300 Fall 2006 Project 3 Project 3 Build a 555-Timer

DESIGN TIP DT Variable Frequency Drive using IR215x Self-Oscillating IC s. By John Parry

Mechatronics. Analog and Digital Electronics: Studio Exercises 1 & 2

LECTURE 2: PD, PID, and Feedback Compensation. ( ) = + We consider various settings for Zc when compensating the system with the following RL:

INSTANTANEOUS POWER CONTROL OF D-STATCOM FOR ENHANCEMENT OF THE STEADY-STATE PERFORMANCE

PCB layout guidelines. From the IGBT team at IR September 2012

Exclusive Technology Feature. Magnetically Isolated Digital Coupling Circuit Solves Gate Drive and Communications Dilemmas

University of Pennsylvania Department of Electrical and Systems Engineering ESE319

Lecture -1: p-n Junction Diode

IR-183A & IR-283A Intracellular Recording Amplifier Instruction Manual

change (PABX) systems. There must, however, be isolation between and the higher voltage, transientprone

Lab 2: Capacitors. Integrator and Differentiator Circuits

Lab 1: Basic RL and RC DC Circuits

Chapter 10: Compensation of Power Transmission Systems

PAiA 4780 Twelve Stage Analog Sequencer Design Analysis Originally published 1974

Lab 3: RC Circuits. Construct circuit 2 in EveryCircuit. Set values for the capacitor and resistor to match those in figure 2 and set the frequency to

Experiment 9: AC circuits

Lauren Gresko, Elliott Williams, Elaine McVay Final Project Proposal 9. April Analog Synthesizer. Motivation

Background (What Do Line and Load Transients Tell Us about a Power Supply?)

SUPPLEMENTARY INFORMATION

EEE118: Electronic Devices and Circuits

LM125 Precision Dual Tracking Regulator

Laboratory Project 1: Design of a Myogram Circuit

Digital Systems Power, Speed and Packages II CMPE 650

Lab #11 Rapid Relaxation Part I... RC and RL Circuits

Warner Instruments 1125 Dixwell Avenue, Hamden, CT (800) / (203) (203) fax

Difference between BJTs and FETs. Junction Field Effect Transistors (JFET)

MultiClamp 700B COMPUTER-CONTROLLED MICROELECTRODE AMPLIFIER. Theory and Operation. Part Number Rev D March 2005 Printed in USA

Experiment 2: Transients and Oscillations in RLC Circuits

PHYS 536 The Golden Rules of Op Amps. Characteristics of an Ideal Op Amp

DESIGN TIP DT Managing Transients in Control IC Driven Power Stages 2. PARASITIC ELEMENTS OF THE BRIDGE CIRCUIT 1. CONTROL IC PRODUCT RANGE

Experienced Worker Assessment Blueprint Industrial Electronics

Impedance Matching: Terminations

Lab 4: Transmission Line

CHAPTER 5 CONTROL SYSTEM DESIGN FOR UPFC

EMG Electrodes. Fig. 1. System for measuring an electromyogram.

INTEGRATED CIRCUITS. AN1221 Switched-mode drives for DC motors. Author: Lester J. Hadley, Jr.

Step Response of RC Circuits

High-Voltage Switch Using Series-Connected IGBTs With Simple Auxiliary Circuit

Physics 623 Transistor Characteristics and Single Transistor Amplifier Sept. 12, 2017

1. Consider the closed loop system shown in the figure below. Select the appropriate option to implement the system shown in dotted lines using

Electric Stresses on Surge Arrester Insulation under Standard and

EDC Lecture Notes UNIT-1

DESIGN AND ANALYSIS OF FEEDBACK CONTROLLERS FOR A DC BUCK-BOOST CONVERTER

Load Transient Tool User Manual

DC and AC Circuits. Objective. Theory. 1. Direct Current (DC) R-C Circuit

Chaos and Analog Signal Encryption

Equipment and materials to be checked out from stockroom: ECE 2210 kit, optional, if available. Analog BK precision multimeter or similar.

Simulating Inductors and networks.

BIO 365L Neurobiology Laboratory. Training Exercise 1: Introduction to the Computer Software: DataPro

EE584 (Fall 2006) Introduction to VLSI CAD Project. Design of Ring Oscillator using NOR gates

LABORATORY 4. Palomar College ENGR210 Spring 2017 ASSIGNED: 3/21/17

Special Internal Circuits

State the application of negative feedback and positive feedback (one in each case)

UNIT I LINEAR WAVESHAPING

EXPERIMENT 4: RC, RL and RD CIRCUITs

Laboratory Assignment 5 Digital Velocity and Position control of a D.C. motor

A battery transforms chemical energy into electrical energy. Chemical reactions within the cell create a potential difference between the terminals

EXPERIMENT 8: LRC CIRCUITS

TRANSISTOR SWITCHING WITH A REACTIVE LOAD

Generation of Sub-nanosecond Pulses

Type Ordering Code Package TDA Q67000-A5066 P-DIP-8-1

The measurement of loop gain in feedback seismometers Brett M. Nordgren April 9, 1999 Rev.

Nonlinear Dynamical Behavior in a Semiconductor Laser System Subject to Delayed Optoelectronic Feedback

Project 3 Build a 555-Timer

Address for Correspondence

ZERO LAG DATA SMOOTHERS By John Ehlers

How to Select the Right Current Probe APPLICATION NOTE

Electronic Circuits EE359A

Operational Amplifiers: Part II

Transcription:

Series Resistance Compensation 1. Patch clamping Patch clamping is a form of voltage clamping, a technique that uses a feedback circuit to set the membrane potential, V m, of a cell to a desired command value, V com. With membrane potential fixed, the quantity that is measured is membrane current. The patch clamp amplifier thus must function as a current-to-voltage converter to allow this current to be displayed on an oscilloscope or computer. A. The patch clamp amplifier is a differential amplifier that operates to make the output equal to the difference between the two inputs. V o = V com V p. B When a feedback resistor, R f, is placed between the output and the negative input of the amplifier (point 1) a current flows through the feedback resistor to make the voltage at 1 (i.e. V p ) equal to that at V com. V com becomes the command for voltage clamping the pipette voltage, V p. Ohm s Law states that a current will flow through this resistance proportional to the voltage difference between the two ends of the resistor. I f = (V o V p ) / R f Rearranging this equation gives: V o =I f R f + V p Since current must be conserved, the current flowing into point 1 must be equal to the pipette current, I p, which flows out of this point. (We can assume that no current flows into the negative input to the amplifier.) I f = - I p Substituting into the previous equation: V o = -I p R f + V p As mentioned above, the feedback resistor forces V p to be equal to V com so we can substitute V com for V p to get: V o = -I p R f + V com or I p = (V com V o )/R f Since we know V com and R f, we can now determine I p by measuring V o. Thus the patch clamp amplifier is a current (I p ) -to-voltage (V o ) converter.

C. V p is, however, connected through the electrode to the cell both of which contain capacitance elements that need to be charged when V com is changed suddenly. To accomplish this, patch clamp amplifiers contain additional compensatory circuits that add waveforms at either input 1 or 2 in order to force V m to follow more accurately the timecourse of V com. The feedback resistor, R f, is the component in the patch clamp amplifier circuit that makes it into a current-to-voltage converter. All of the current that flows down the pipette flows through R f. This resistor determines the gain of the amplifier in V-clamp mode and the amount of current that can be passed in I-clamp mode. In V-clamp, larger values of R f are selected for single channel recordings where low noise is important and smaller values of R f are selected in whole-cell recordings where larger currents are necessary. As stated above, voltage clamping results from the amplifier operating with negative feedback to clamp the pipette voltage, V p, to the command voltage V com, which you set as part of the experimental protocol. Two important points to consider are: 1. The speed at which V m can respond to a change of V com, which is affected by various capacitances in the electrode and amplifier and 2. The fact that V p is separated from the inside of the cell, V m, by a significant resistance. 1. Electrode in the bath With the electrode in the bath, the pipette resistance, R p, can be measured by measuring the current flow in response to steps of voltage. To do this command pulses, V seal test, are applied at V com. By Ohm s Law: R p = V seal test / I p. In this measurement as with all others below, voltages are measured with respect to the bath, which is set to ground potential. Thus with the electrode in the bath, V p is referenced to ground so current flowing down the pipette flows to ground across R p. Furthermore, the outside of the cell is also at ground potential, so in whole cell configuration, potentials are measured across the membrane with reference to ground and current flows across the membrane to ground.

2. Cell attached configuration. Once a Giga Ω seal has been formed, current can no longer simply flow through the pipette tip to ground, but it must now flow through the seal between the pipette tip and the cell membrane. The seal resistance, R seal, can now be calculated by Ohm s law as was the pipette resistance, although it is necessary to increase the size of the seal test pulse V seal test appropriately to calculate the much larger seal resistance: R seal = V seal test /I p. Because the glass tip of the electrode is a thin insulator or dielectric separating two conductors (the bath solution and the pipette filling solution) the pipette tip behaves as a capacitor. The current through a capacitor, I c = C dv/dt, is large whenever there is a rapid change in voltage (dv/dt) such as at the beginning and ends of square pulses. Another way of saying this is that the pipette resistance and capacitance cause the pipette to act on the signal as a low pass filter with a time constant, τ p = R p C p. The unwanted filtering produced by the pipette capacitance can be minimized by increasing the pipette tip diameter and thereby decreasing R p. Since this is not always an option, an alternative is to accomplish this electronically by injecting a current at the input of the patch amplifier (point 1 in the first figure) whose waveform has the effect of negating the effect of C p. This is called capacitance compensation or capacitance neutralization. It is important to remember that neutralization of C p is never more than 90% effective so signals are always filtered to some extent by the pipette tip. 3. Whole Cell Once the membrane patch has been broken and the whole cell condition is obtained, the membrane resistance, R m, and membrane capacitance, C m can be measured since current flowing down the pipette now flows across these components to the grounded bath. Voltage pulses applied as V com will produce current transients at I p whose exponentially decaying waveform is determined approximately by C m and the input resistance, R in. As with C p, C m can be compensated by adding an appropriate waveform to the amplifier input at point 1.

In contrast to C p, C m has important biological significance. Since capacitance is defined as C=ε 0 A/d (where ε 0 is a property of the lipid in the membrane, and d is the membrane thickness both of which are relatively constant) C m can be used to determine A, the surface area of the cell. After C m has been effectively compensated, the remaining fairly square step of current is the result of V seal test falling ohmically across R in. The biological portion of R in is R m, which in the resting condition, when ligand-gated and V-gated channels are all closed, is a leak resistance produced by ungated leak channels. This too can be eliminated by a process known as leak subtraction. 4. Series Resistance Compensation. Series Resistance is the sum of all of the resistances between the input 1 of the patch clamp amplifier and the cell membrane. It is predominately the sum of R p, and any access resistance, R access, located between the pipette tip and the interior of the cell. Series resistance adds two types of errors in patch clamping: 1. Steady state errors. These result because the amplifier clamps V p, but you are actually interested in clamping V m. If there is any current flowing through R series, V p will not be equal to V m. Namely: V m = V p I m R series This difference can be minimized by making R series as small as possible or by keeping I m small neither of which is always possible. 2. Dynamic errors. Step changes in V com produce changes in V m with a lag whose time constant is determined by: τ R series C m This can put millisecond delays in the rise and fall times of changes of V m. Thus R series causes I m to be low pass filtered.

Series Resistance can be compensated by adding a waveform to input 2 of the patch clamp amplifier that has an effect similar to that in compensating for pipette and membrane capacitance. This has the effect of removing some of the load from R f when this current pathway is required to supply the current to charge C m in response to rapid changes in V com. Series resistance compensation becomes important either when I m is large or when rapid changes of V m are necessary. There are two unfortunate downsides to R series compensation: 1. It adds noise to the I m signal. 2. Because it is a positive feedback element, it is prone to oscillation. Such oscillation or ringing is especially prevalent when the percent of compensation exceeds about 90%. The procedure for R series compensation consists basically of 4 steps: 1. Compensating C m, 2. Predicting the amount of R series compensation that will be necessary, 3. Applying this compensation, 4. Making fine adjustments in C m and C p compensation. The overall goal is to speed up the rise time of the change in V m to more nearly match the rise time of V com. The figures below show the effects of these steps on V p, V m, and I m in response to a step in V com. Without any compensation, V p, mimics V com, but V m rises exponentially with a τ R series C m and I m rises to an initial peak I m(peak) = V p /R series, then falls exponentially with τ R series C m to a steady value of I m(ss) = V p /R m. When C m is compensated, but R series is still uncompensated, V p, still mimics V com and V m still rises exponentially with a τ R series C m, however, I m now has no initial transient, but rises slowly to the same steady value of I m(ss) = V p /R m.

When C m and R series are both compensated, V p no longer mimics V com because the R series compensation is now being added at input 2 to the patch clamp amplifier. There is still some lag, but now V m rises much faster than the previous τ R series C m. I m also rises much faster and suffers from some added noise. Appropriate compensation is a trade off between too slow a rise in I m and overshoot and oscillations in the rise of I m.