PZ-FLIM-110. Piezo Scanning FLIM System. Based on bh s Megapixel FLIM Technology. Complete FLIM Microscopes FLIM Upgrades for Existing Microscopes

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Based on bh s Megapixel FLIM Technology Complete FLIM Microscopes FLIM Upgrades for Existing Microscopes Multidimensional TCSPC technique Sample Scanning by Piezo Stage Compact Electronics, Controlled by Laptop Computer Fully Integrated Scanner Control Confocal detection Suppression of out-of-focus light Suppression of lateral scattering Excellent contrast and resolution Excitation by bh BDL or BDS series picosecond diode laser Laser wavelengths 375nm, 405 nm, 445 nm, 473 nm, 488 nm, 515 nm, 640 nm, 685 nm, 785 nm Compatible with supercontinuum lasers 64-bit SPCM Software for Windows 7, 8, 10 Becker & Hickl GmbH Nahmitzer Damm 30 12277 Berlin, Germany Tel. +49 / 30 / 787 56 32 email: info@becker-hickl.com Fax. +49 / 30 / 787 57 34 www.becker-hickl.com More than 22 years experience in multi-dimensional TCSPC. More than 1500 TCSPC systems worldwide.

Megapixel FLIM Technology Record Images with up to 2048 x 2048 pixels Record FLIM data of a large number of cells under identical conditions Select regions of interest from recorded data of a large field of view Lateral and Vertical Scanning Select between a scan in the x-y plane or a scan in the x-z plane Run a vertical scan within a fraction of the time needed for a full Z stack Phosphorescence Lifetime Imaging Simultaneously with FLIM Obtain unprecedented PLIM sensitivity by multi-pulse excitation Record phosphorescence and fluorescence lifetime images simultaneously More than 22 years experience in multi-dimensional TCSPC. More than 1500 TCSPC systems worldwide.

Interactive Scanner Control Conveniently select scan field, pixel numbers, and scan speed Select a region of interest within a previously recorded image Record an image of the region selected Predefined Setups Pass from one operation mode or system configuration to another by selecting from a list of Predefined Setups Precision FLIM and PLIM Data Analysis Analyse FLIM and PLIM data pixel by pixel No need to record an IRF Up to three exponential decay components Calculate lifetimes and amplitudes of decay components Calculate ratios of lifetimes or amplitudes, fractional intensities, FRET efficiencies Calulate 1D and 2D histograms of decay parameters over the pixels Analyse large data volumes by batch processing More than 22 years experience in multi-dimensional TCSPC. More than 1500 TCSPC systems worldwide.

System Components Laser BDL-SMN series BDS-SM Series High power High repetition rate Single-mode fibre coupling Repetition rates 20 MHz, 50 MHz, 80 MHz, CW 20 MHz, 50 MHz, CW Available wavelengths 375nm, 405 nm, 445 nm, 473 nm, 488 nm, 515nm, 640nm, 685nm, 785nm Pulse width typ. 60 ps, depending on wavelength version and power PZ FLIM Confocal Optics Assembly to Detector BDL-SMN or BDS series ps diode laser Fibre Adapter Filter Dichroic Mirror Side Port Microscope Laser input Excitation / Emission Beamsplitter Emission Filter Output to detector Confocal pinhole Qioptiq Kineflex fibre manipulator Dichroic, different transition wavelength available In filter slider, long-pass and bandpass filters available Multi-mode fibre, FCS connector Core diameter of detector fibre PZ FLIM Confocal Optics Assembly Microscope Lens Scan Stage Sample Scan Stage Mad City Labs Nano View 200-3 1 Detector Id 100-50-FC SPAD (Standard) HPM-100-40 (optional) 4 MW FLIM GaAsP (optional) 4 Wavelength Range 400nm to 1000nm 400 nm to 700 nm 400 nm to 700 nm Wavelength Channels 1 1 16 TCSPC Module SPC-150 (Standard) SPC-150N (Optional) SPC-160 (Optional) Scan Control Module GVD-120 Generation of scan signals Hardware, digital signal synthesis Image size 16 x 16 to 2048 x 2048 pixels Laser multiplexing Inside pixel, line by line, or frame by frame 2 Laser on/off for PLIM Selectable in % of pixel time Beam park function Any location within scan area System Computer and Electronics Box Lap-top PC with PCI-extension box Also available: Extension box contains: SPC-150, SPC-150N, SPC-160 TCSPC modules GVD-120 scan controller DCC-100 detector controller (optional) SPC, GVD, and DCC modules installed in standard PC More than 20 years experience in multi-dimensional TCSPC. More than 1500 TCSPC systems worldwide.

Specifications Scanning Mad City Labs Nano-View 200-3 1 Optical principle Sample scanning by piezo stage, confocal detection Laser input Single-mode fibre coupled, Qioptiq fibre coupling system Output to detector Fibre coupling, FC connector, multi-mode fibre Main beamsplitter Dichroic Mirror Pinhole Pinhole is core of detection fibre Emission filter Filter slider Connection to microscope adapter to left side port Scan Controller bh GVD-120 Principle Digital waveform generation, scan waveforms generated by hardware [1] Scan waveform Linear ramp with cycloid flyback. Parameters configurable for different scanners Scan format line, frame, or single point Frame size, frame scan 16x16 to 2048x2048 pixels Line scan 16 to 2048 pixels X scan continuous or pixel-by-pixel Y scan line by line Laser power control, electrical via electrical signal to lasers Laser multiplexing 2 frame by frame, line by line, or within one pixel Beam blanking during flyback and when scan is stopped Scan rate automatic selection of fastest possible rate or manual selection Fastest scan rate with piezo stage 3 5 lines / second Scan area definition via zoom and offset or interactive via image cursors Beam park position selectable via cursor in FLIM image Laser control On/off, power, wavelength multiplexing 2 Excitation Source bh BDL-SMC Series or BDS-Series picosecond diode laser Available Wavelengths 375nm, 405nm, 445nm, 473nm, 488nm, 510nm, 640nm, 685nm, 785nm Pulse width, typical 40 to 70 ps Pulse frequency BDL-Series: 20MHZ, 50MHz, 80MHz BDS Series: 20 MHZ, 50 MHz Power in picosecond mode Typ. 0.2 mw to 2 mw injected into fibre. Depends on wavelength version Fast on/off modulation < 1µs, for PLIM and excitation wavelength multiplexing 2 Detector (standard) Id Quantique id100-50-fc SPAD Spectral Range 400 to 1000 nm Peak quantum efficiency 50% IRF width with bh diode laser 70 to 130 ps Background count rate, thermal Typ. 100 to 200. LN version with <10 available Power supply 6V wall-mounted power supply Detector (optional) bh HPM-100-40 hybrid detector [1] 4 Spectral Range 400 to 700nm Cathode type GaAsP Peak quantum efficiency 40 to 50% IRF width with bh diode laser 120 to 130 ps Background count rate, thermal 300 to 2000 counts per second Background from afterpulsing not detectable Power supply and overload shutdown via DCC-100 controller of TCSPC system Detector (optional) bh Multi-Wavelength MW-FLIM Detector [1] 4 No. of wavelength channels 16 Wavelength channel width 12.5 nm, other on requets Spectral Range 200 nm within a range of 400 to 700nm Cathode type GaAsP IRF width with bh diode laser 250 ps Power supply and overload shutdown via DCC-100 controller of TCSPC system More than 20 years experience in multi-dimensional TCSPC. More than 1500 TCSPC systems worldwide.

TCSPC System Principle Electrical timing jitter Electrical IRF width Minimum time channel width Dead time Saturated count rate Dual-time-base operation Source of macro time clock Input from detector Reference (SYNC) input Synchronisation with scanning Scan rate Synchronisation with laser multiplexing 2 Recording of multi-wavelength data 5 Basic acquisition principles, see [1] Operation modes, see [1] bh SPC-150, SPC-150N, or SPC-160 module, see [1] for details Advanced TAC/ADC principle 2.3 ps rms 6.8 ps FWHM 813 fs 100 ns (80 ns for SPC-160) 10 MHz (12 MHz for SPC-160) via micro times from TAC and via macro time clock internal 40MHz clock or from laser constant-fraction discriminator constant-fraction discriminator via frame clock, line clock and pixel clock pulses any scan rate 3, automatic accumulation of frames via routing function simultaneous in all wavelength channels, via routing function on-board-buildup of photon distributions buildup of photon distributions in computer memory generation of parameter-tagged single-photon data online auto or cross correlation and PCH f(t), oscilloscope, f(txy), f(t,t), f(t) continuous flow FIFO (correlation / FCS / MCS) mode Scan Sync In imaging, Scan Sync In with continuous flow FIFO imaging, with MCS imaging, mosaic imaging 6, time-series imaging 6 Multi-wavelength operation 5, laser multiplexing operation 2 cycle and repeat function, autosave function Max. Image size, pixels (SPCM 64 bit software) 2048x2048 1024x1024 512x512 256x256 Max. no of time channels, see [1] 256 1024 4096 4096 SPCM Data Acquisition Software, please see [1] for details Operating system Windows 7, Windows 8, or Windows 10, 64 bit Loading of system configuration single click in predefined-setup panel Start / stop of measurement by operator or by timer, starts with start of scan, stops with end of current frame Online calculation and display, FLIM, PLIM in intervals of Display Time, min. 1 second Online calculation and display, FCS, PCH in intervals of Display Time, min. 1 second Number of images diplayed simultaneously max 8 Number of curves (Decay, FCS, PCH, Multiscaler) 8 in one curve window Cycle, repeat, autosave functions user-defined, used for for time-series recording 6, Z stack FLIM 6, microscope-controlled time series Saving of measurement data User command or autosave function Optional saving of parameter-tagged single-photon data Link to SPCImage data analysis automatically after end of measurement or by user command SPCImage FLIM and PLIM Data Analysis, please see [1] for details Data types FLIM, PLIM, single fluorescence or phosphorescence decay curves Decay models Single-, double-, triple-exponential decay models, incomplete decay models, first moment Procedure Iterative convolution or direct calculation by first moment Batch processing for multi-file FLIM data Parameters delivered by analysis lifetimes of components, amplitudes, ratios of amplitudes or lifetimes, FRET efficiency, fractional intensities of decay components Display Colour-coded images of decay parameters Histogram of decay parameters over pixels 2D histograms of decay parameters, phasor plot Remarks 1. Other scan stages on request. Stage controller must have analog inputs. 2. Laser multiplexing requires second laser and single-mode beam combiner. 3. Limited by piezo stage. Fastest system scan rate depends on stage type. Configurable for different stages. 4. Requires DCC-100 detector controller card. 5. Requires MW FLIM detector. 6. Limited applicability due to slow scan rate of piezo stage. More than 20 years experience in multi-dimensional TCSPC. More than 1500 TCSPC systems worldwide.

Literature (please contact bh for printed copies) 1. The bh TCSPC Handbook, www.becker-hickl.com 2. W. Becker, Advanced Time-correlated single photon counting techniques. Springer 2005 3. W. Becker (ed.), Advanced time-correlated single photon counting applications. Springer (2015) 4. The PZ-FLIM piezo-scanning FLIM system. Application note, available on www.becker-hickl.com Related Products DCS-120 Confocal Scanning FLIM Systems - Scanning by fast galvanometer mirrors - 2 laser channels, 2 detector channels - FLIM, Multi-Wavelength FLIM, PLIM, Z Stack FLIM, Fast Time-Series by temporal mosaic FLIM DCS-120 MACRO System -Imaging of cm-size objects - Scanning by fast galvanometer mirrors - 2 laser channels, 2 detector channels - FLIM, Multi-Wavelength FLIM, PLIM, Z Stack FLIM, Fast Time-Series by temporal mosaic FLIM Modular FLIM Systems for Zeiss LSM 710 / 780 / 880 Family Laser Scanning Microscopes - Fast galvanometer scanning - One or two ps diode lasers - Multiphoton excitation by Ti:Sa laser - Confocal detection or NDD detection - One, two, three, or four detection channels - FLIM, Multi-wavelength FLIM, PLIM, Lateral Mosaic FLIM, Z Stack FLIM, Fast Time-Series by temporal mosaic FLIM Modular FLIM Systems for Zeiss LSM 510 NLO Family Laser Scanning Microscopes - Fast galvanometer scanning - Multiphoton excitation - One or two NDD detection channels - FLIM, Multi-wavelength FLIM, Lateral Mosaic FLIM, Z Stack FLIM, Fast Time-Series by Temporal Mosaic FLIM Modular FLIM Systems for Leica, Nikon, Olympus Laser Scanning Microscopes - Fast galvanometer scanning - Diode laser excitation and multiphoton excitation - Various system configurations, please see Handbook [1] International Sales Representatives US: Boston Electronics Corp tcspc@boselec.com www.boselec.com UK: Photonic Solutions sales@photonicsolutions.co.uk www.photonicsolutions.co.uk Japan: Tokyo Instruments Inc. sales@tokyoinst.co. jp www.tokyoinst.co.jp China: DynaSense Photonics Co. Ltd. info@dyna-sense.com www.dyna-sense.com