DATA SHEET SWITCHING N-CHANNEL POWER MOS FET INDUSTRIAL USE

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DATA SHEET SWITCHING N-CHANNEL POWER MOS FET INDUSTRIAL USE MOS FIELD EFFECT TRANSISTOR 2SK3357 DESCRIPTION The 2SK3357 is N-channel MOS Field Effect Transistor designed for high current switching applications. FEATURES Super low on-state resistance: RDS(on) = 5.8 mω MAX. (VGS = V, ID = 38 A) RDS(on)2 = 8.8 mω MAX. (VGS = 4. V, ID = 38 A) Low Ciss: Ciss = 98 pf TYP. Built-in gate protection diode ORDERING INFORMATION PART NUMBER PACKAGE 2SK3357 TO-3P (TO-3P) ABSOLUTE MAXIMUM RATINGS (TA = 25 C) Drain to Source Voltage VDSS 6 V Gate to Source Voltage VGSS(AC) ±2 V Drain Current (DC) ID(DC) ±75 A Drain Current (pulse) Note ID(pulse) ±3 A Total Power Dissipation (TC = 25 C) PT 5 W Total Power Dissipation (TA = 25 C) PT 3. W Channel Temperature Tch 5 C Storage Temperature Tstg 55 to +5 C Single Avalanche Current Note2 IAS 75 A Single Avalanche Energy Note2 EAS 562 mj Notes. PW µs, Duty cycle % 2. Starting Tch = 25 C, RG = 25 Ω, VGS = 2 V V THERMAL RESISTANCE Channel to Case Rth(ch-C).83 C/W Channel to Ambient Rth(ch-A) 4.7 C/W The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version. Not all devices/types available in every country. Please check with local NEC representative for availability and additional information. Document No. Date Published Printed in Japan D434EJ2VDS (2nd edition) May 2 NS CP(K) The mark shows major revised points. 999, 2

ELECTRICAL CHARACTERISTICS (TA = 25 C) CHARACTERISTICS SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT Drain to Source On-state Resistance RDS(on) VGS = V, ID = 38 A 4.6 5.8 mω RDS(on)2 VGS = 4. V, ID = 38 A 6. 8.8 mω Gate to Source Cut-off Voltage VGS(off) VDS = V, ID = ma.5 2. 2.5 V Forward Transfer Admittance yfs VDS = V, ID = 38 A 38 72 S Drain Leakage Current IDSS VDS = 6 V, VGS = V µa Gate to Source Leakage Current IGSS VGS = ±2 V, VDS = V ± µa Input Capacitance Ciss VDS = V, VGS = V, f = MHz 98 pf Output Capacitance Coss 5 pf Reverse Transfer Capacitance Crss 63 pf Turn-on Delay Time td(on) ID = 38 A, VGS(on) = V, VDD = 3 V, 5 ns Rise Time tr RG = Ω 35 ns Turn-off Delay Time td(off) 5 ns Fall Time tf 48 ns Total Gate Charge QG ID = 75 A, VDD = 48 V, VGS = V 7 nc Gate to Source Charge QGS 28 nc Gate to Drain Charge QGD 46 nc Body Diode Forward Voltage VF(S-D) IF = 75 A, VGS = V.96 V Reverse Recovery Time trr IF = 75 A, VGS = V, 64 ns Reverse Recovery Charge Qrr di/dt = A/µs 3 nc TEST CIRCUIT AVALANCHE CAPABILITY TEST CIRCUIT 2 SWITCHING TIME D.U.T. RG = 25 Ω PG. 5 Ω VGS = 2 V BVDSS IAS ID VDD VDS L VDD VGS PG. τ RG D.U.T. RL VDD VGS Wave Form ID Wave Form VGS ID % % 9 % VGS(on) ID 9 % 9 % td(on) tr td(off) t f % Starting Tch τ = µ s Duty Cycle % ton toff TEST CIRCUIT 3 GATE CHARGE D.U.T. IG = 2 ma RL PG. 5 Ω VDD 2 Data Sheet D434EJ2VDS

TYPICAL CHARACTERISTICS (TA = 25 C ) dt - Percentage of Rated Power - % 8 6 4 2 DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA 2 4 6 8 2 4 6 Tch - Channel Temperature - C PT - Total Power Dissipation - W 75 5 25 75 5 25 TOTAL POWER DISSIPATION vs. CASE TEMPERATURE 2 4 6 8 2 4 6 TC - Case Temperature - C FORWARD BIAS SAFE OPERATING AREA ID(pulse) RDS(on) Limited (at VGS = V) ID(DC) ms ms Power Dissipation Limited µs PW = µs TC = 25 C Single Pulse. VDS - Drain to Source Voltage - V TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH rth(t) - Transient Thermal Resistance - C/W.. µ µ Rth(ch-A) = 4.7 C/W Rth(ch-C) =.83 C/W Single Pulse m m m PW - Pulse Width - s Data Sheet D434EJ2VDS 3

FORWARD TRANSFER CHARACTERISTICS DRAIN CURRENT vs. DRAIN TO SOURCE VOLTAGE 5 TA = 5 C 25 C 75 C 5 C 4 3 2 VGS = V 4. V. VDS = V 2 3 4 5 6 VGS - Gate to Source Voltage - V. 2. 3. 4. VDS - Drain to Source Voltage - V yfs - Forward Transfer Admittance - S FORWARD TRANSFER ADMITTANCE vs. DRAIN CURRENT VDS = V.... TA = 5 C 75 C 25 C 5 C RDS(on) - Drain to Source On-state Resistance - mω DRAIN TO SOURCE ON-STATE RESISTANCE vs. GATE TO SOURCE VOLTAGE 5 5 ID = 38 A VGS - Gate to Source Voltage - V 5 2 RDS(on) - Drain to Source On-state Resistance - mω 5 5 DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT VGS = 4. V V VGS(th) - Gate to Source Threshold Voltage - V 3. 2.5 2..5..5 GATE TO SOURCE THRESHOLD VOLTAGE vs. CHANNEL TEMPERATURE VDS = V ID = ma 5 5 5 Tch - Channel Temperature - C 4 Data Sheet D434EJ2VDS

RDS(on) - Drain to Source On-state Resistance - mω 2 2 DRAIN TO SOURCE ON-STATE RESISTANCE vs. CHANNEL TEMPERATURE 8 6 4 5 VGS = 4. V V 5 5 Tch - Channel Temperature - C ID = 38 A ISD - Diode Forward Current - A SOURCE TO DRAIN DIODE FORWARD VOLTAGE VGS = V VGS = V..5..5 VSD - Source to Drain Voltage - V Ciss, Coss, Crss - Capacitance - pf. CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE VGS = V f = MHz VDS - Drain to Source Voltage - V Ciss Coss Crss td(on), tr, td(off), tf - Switching Time - ns. SWITCHING CHARACTERISTICS tr td(off) tf td(on) trr - Reverse Recovery Time - ns. REVERSE RECOVERY TIME vs. DRAIN CURRENT IF - Drain Current - A di/dt = A/ µ s VGS = V. VDS - Drain to Source Voltage - V 8 6 4 2 DYNAMIC INPUT/OUTPUT CHARACTERISTICS VDD = 48 V 3 V 2 V VDS VGS 2 4 6 8 2 4 6 QG - Gate Charge - nc ID = 75 A 8 6 4 2 VGS - Gate to Source Voltage - V Data Sheet D434EJ2VDS 5

IAS - Single Avalanche Energy - mj SINGLE AVALANCHE ENERGY vs. INDUCTIVE LOAD IAS = 75 A VDD = 3 V RG = 25 Ω VGS = 2 V V µ µ EAS = 562 mj L - Inductive Load - H m m Energy Derating Factor - % 6 4 2 8 6 4 2 SINGLE AVALANCHE ENERGY DERATING FACTOR 25 5 75 VDD = 3 V RG = 25 Ω VGS = 2 V V IAS 75 A 25 5 Starting Tch - Starting Channel Temperature - C 6 Data Sheet D434EJ2VDS

PACKAGE DRAWING (Unit: mm) TO-3P (MP-88) 2.±.2 6.. 5.7 MAX. 3.2±.2 4 2 3 4.5±.2 4.7 MAX..5 7. EQUIVALENT CIRCUIT Gate Drain Body Diode 9 MIN. 3.±.2 Gate Protection Diode Source 2.2±.2 5.45 5.45.±.2.6±..Gate 2.Drain 3.Source 4.Fin (Drain) 2.8±. Remark The diode connected between the gate and source of the transistor serves as a protector against ESD. When this device actually used, an additional protection circuit is externally required if a voltage exceeding the rated voltage may be applied to this device. Data Sheet D434EJ2VDS 7

The information in this document is current as of May, 2. The information is subject to change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products and/or types are available in every country. Please check with an NEC sales representative for availability and additional information. No part of this document may be copied or reproduced in any form or by any means without prior written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document. NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from the use of NEC semiconductor products listed in this document or any other liability arising from the use of such products. No license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC or others. Descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software and information in the design of customer's equipment shall be done under the full responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information. While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize risks of damage to property or injury (including death) to persons arising from defects in NEC semiconductor products, customers must incorporate sufficient safety measures in their design, such as redundancy, fire-containment, and anti-failure features. NEC semiconductor products are classified into the following three quality grades: "Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products developed based on a customer-designated "quality assurance program" for a specific application. The recommended applications of a semiconductor product depend on its quality grade, as indicated below. Customers must check the quality grade of each semiconductor product before using it in a particular application. "Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots "Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) "Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems and medical equipment for life support, etc. The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness to support a given application. (Note) () "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries. (2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for NEC (as defined above). M8E. 4