Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-1 LECTURE 160 CDR EXAMPLES INTRODUCTION Objective The objective of this presentation is: 1.) Show two examples of clock and data recovery circuits in CMOS technology Outline A 2.5-GB/s CDR in 0.25µm CMOS A 10-GB/s CDR in 0.18µm CMOS Course Summary Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-2 A 2.5-GB/s CLOCK AND DATA RECOVERY CIRCUIT Introduction Important considerations in this design are: Jitter VCO tuning range 2.5 GHz speed in 0.25µm CMOS technology Skew in phase detector and decision circuit General block diagram of the architecture: D in Decision Circuit D out Charge PD LPF VCO Pump f osc Fig. 4.2-23 B. Razavi, "A 2.5-Gb/s 15-mW clock recovery circuit," IEEE Journal of Solid-State Circuits, vol. 31, pp. 472-480, April 1996.
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-3 Jitter Issues Source of jitter: Input jitter, VCO device noise, VCO jitter due to ripple on control, supply and substrate noise. Trade-offs in the choice of VCO gain, K VCO : Low supply voltage necessitates high K VCO for a given tuning range. For a given ripple on the control line, higher K VCO results in higher jitter. Solution: Decompose the control line into fine and coarse control lines. The coarse control will be driven by the frequency detector and will remain quiet. NRZ Data Frequency Detector Phase Detector Digital Search Algorithm Capacitor Array Voltage-controlled oscillator Charge Pump Counter Loop Filter 8-bit coarse control word Fine control voltage Retimed Data Recovered Clock Fig. 4.2-24 Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-4 Frequency Detector Uses the Pottbacker quadrature frequency detector: D in 90 D D D V FD Lock Time (µs) 20 15 10 5 Fig. 4.2-25 0.03 0.06 0.09 0.12 Fractional Deviation between Clock and Data Rate
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-5 Frequency Detector Continued Add a charge pump to the previous circuit to get: V DD I p V FD D in 90 D D D I p V FD C Far from Lock Near-Lock Low Near-Lock High Far from Lock Fig. 4.2-26 t Comments: In the near-lock regions, the output carries enough DC content to signify the polarity of the frequency difference. In the far-from-lock regions, the output carries little information. Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-6 Digital Search Algorithm with a Broad Range V H B D D stop VCO Frequency Detector V FD V L A D Counter Fig. 4.2-27 Comments: 8 bits of resolution in the capacitor array allows a frequency step of 2.1 MHz. The fine VCO control can have a gain of only 50MHz/V. V FD A VCO step size V H V L t t B t D stop t Fig. 4.2-28
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-7 VCO Circuit Implementation M4 M3 V out1 V out2 V control M1 M2 V out2 V out1 Fig. 4.2-29 Comments: Continuous frequency tuning is obtained by varying the coupling between oscillators. The VCO has a fully differential control. The input V/I converter, M1-M2, linearizes the input transconductance with M3-M4. Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-8 Capacitor Array Segmented Section Binary Section 2C 2C 2C 2C C C C/2 C/4 C C/2 C/4 Binary/Thermometer Converter D 0 D 1 D 2 D 3 D 4 D 5 D 6 D 7 Fig. 4.2-30 Comments: The capacitors are divided into a 4-bit (MSB) segmented section and a 4-bit (LSB) binary-weighted section. Monotonicity guaranteed with up to 12.5% capacitor mismatch. Requires only 20 switched elements and has a worst case of 10.
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-9 uadrature Frequency Detector Implementation Use dummy loading to balance out delays. Dummy Gate D in D D D Delay Cell Circuit Implementation: V up Vdown Fig. 4.2-31 Symmetric XOR V DD Delay Cell V DD A B V out B A "1" M1 M2 M3 M4 V out V Bias "0" I B I B V in I B Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-10 Charge Pump Implementation Charge-Pump Circuit: V DD V out1 M4 M5 M9 M10 V out2 C 1 C M1 M8 2 M2 M3 M6 M7 Down Up I B I B Pump-Down Operation: V out1 M9 C 1 M1 Down M2 V DD M10 V out2 C 2 No Up or Down Pulses: Down Up M3 V DD M6 I B I B I B Fig. 4.2-33 This charge-pump has no current mismatch or charge mismatch.
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-11 Implementation of the Charge Pump Continued Conventional Implementation: This implementation: V DD V out1 Charge Pump V out2 I B V out1 Charge Pump V out2 V B MB1 I B MB2 IB MB3 MB1 I B MB2 IB MC1 MC2 V CM MC3 MC1 MC2 Fig. 4.2-34 The modified implemention stabilizes the common-mode output of the charge pump to a specific value, V CM. Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-12 Theoretical Jitter Analysis (Open Loop) Block diagram of the jitter model: X VCO (t) V c (t) v n (t) - σn 2 + K VCO s X VCO (mt s ) f s m = 1 m = 2 m t 1/2 T cc T cc m/2 T cc Fig. 4.2-35 The variation of the jitter as a function of mt s can be written as, T(mT s ) K VCO Therefore, f o t T(t) 2 T cc mt s 2 σ n T s 2π
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-13 Jitter Analysis Continued Recall that timing jitter creates phase noise, i.e., Phase Noise TimingJitter S φ (f) S φ (f) f o K 2 VCO σ 2 n 2(2π) 2 (f - f o ) 2 σ 2 T = Tcc 2 2 f o 3 Illustration: S φ (f) (f f o ) 2 f T Fig. 4.2-36 t Approximation A m 2 A m 2 VCO - f 0 + f f - f 0 + f f f o - f f o f o + f f Fig. 4.2-37 Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-14 Simulated Open- and Closed-Loop Jitter Open- Loop RMS Jitter Closed-Loop Fig. 4.2-40 t = 1 2πf L Time Maximum closed-loop jitter = (J. McNeill, JSSCC, June 1997) f o 2 T cc 1 2πf L
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-15 Measured VCO Characteristics Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-16 Chip Microphotograph
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-17 Jitter Measurements PRBS of length 2 23-1: Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-18 Recovered Clock Spectrum
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-19 Eye Diagram Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-20 Theoretical Jitter versus Measured Jitter Phase Noise S φ (f) Measured free-running VCO phase noise = -85 dbc/hz Closed-loop bandwidth = 3.1 MHz Theoretical closed-loop jitter = 5.08 ps f o f Fig. 4.2-38 TimingJitter T t Fig. 4.2-39 Experimental closed-loop jitter = 5.1 ps
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-21 Summary of Experimental Results Specification Value Bit Rate 2.5 Gb/s Capture Range 540 MHz Phase Noise at 1-MHz Offset -92 dbc/hz Jitter for PRBS 2 23-1 5.1 ps Power Dissipation: VCO VCO Buffer Phase detector and charge pump Frequency detector and comparator Total 11mW 8mW 28.5mW 7.5mW 55mW Supply Voltage 2.5V Die Area 0.9 mm x 0.6 mm Technology 0.25 µm CMOS Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-22 Summary of 2.5 Gb/s Example A method to resolve the conflict between a wide tuning range and low VCO sensitivity is described utilizing a dual-loop topology. An LC-based VCO with a segmented capacitor array is used to discretely tune the oscillation frequency. A charge pump that reduces drift in the event of no UP or DOWN pump signal is introduced. A method is proposed to estimate the closed-loop jitter based on the phase noise of the free-running VCO.
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-23 A 10-Gb/s CMOS CLOCK AND DATA RECOVERY CIRCUIT WITH FREUENCY DETECTION Specification and Technology Generic Clock and Data Recovery Block Diagram: D in Decision Circuit D out Charge PD LPF VCO Pump f osc Fig. 4.2-23 Issues are: Jitter Skew between D in and Suitability for implementation in VLSI technology Power dissipation Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-24 Choice of Technology Technology will be 0.18µm CMOS Consequences: Limited speed: - Digital latches < 10 GHz - Phase detector < 10 GHz Low supply voltage (1.8V): - Limits the choice of circuit topologies - Leads to a large VCO gain and potentially high jitter Choice of VCO LC - Small jitter - High center frequency - Narrow tuning range - Single-ended control Ring Oscillator - Large jitter - Low center frequency - Wide tuning range - Differential control
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-25 Phase Detector Design Issues 1.) System level Linear PD versus a bang-bang (Alexander) 2.) Technology limitations Full rate PD versus a half rate PD 3.) Skew problems No regeneration versus inherent regeneration Frequency Detector Design Issues 1.) Capture range Analog versus digital 2.) System complexity Additional frequency detector versus phase detector compatibility 3.) Technology limitations Full rate FD versus a half rate FD Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-26 Clock Data Recovery Architecture for this Example 030904-05
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-27 Multiphase VCO Use a 4-stage ring oscillator with spiral inductors and MOS varactors. V DD RO 1 RO2 RO3 RO4 V out 135 90 45 0 Vin V tune Fig. 4.2-47 Comments: The LC tank improves the phase noise of the oscillator The oscillation frequency is only a weak function of the number of stages If we model each stage by a parallel RLC circuit, the phase shift of each stage should be 45. Therefore, Arg[Z(jω)] = 45 tan -1 Lω R p (1-LCω 2 ) = 45 ω 1 osc = 1-1 LC The oscillator s common mode level is shifter to provide a large tuning range. Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-28 Half-Rate Phase Detection 030904-06 If V 1 makes a high-to-low transition, V must be inverted to provide consistent phase error information.
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-29 Overall Phase Detector (Anderson U.S. Patent #3,626,298, 1971) 030904-07 Comments: CK I and CK are 5GHz quadrature clock phases Data is a 10 Gb/s input data signal V out is a 10 Gb/s output data signal Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-30 Half-Rate Frequency Detection 030906-01 V PD2 = 0 Slow Clock V PD1 (0 1) V PD2 = 1 Fast Clock V PD2 = 0 Fast Clock V PD1 (1 0) V PD2 = 1 Slow Clock
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-31 Half-Rate Frequency Detector Comments: V FD must carry unipolar pulses for fast and slow clock signals. V FD must be a tri-state signal in the locked condition. 030906-02 Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-32 Modified Multiplexer 030906-03
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-33 Charge Pump 030906-04 Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-34 Output Buffer V DD 50 Ω 50 Ω On-chip Termination V out V in Fig. 4.2-55 50 Ω 50 Ω External Termination The inductors have a line width of 4µm to achieve a high self-resonance frequency.
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-35 Measured Open-Loop VCO Characteristics 030906-05 Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-36 Measured Recovered Clock Phase noise: -107 dbc/hz at 1MHz offset. Input Sequence (PRBS) Jitter (pp) (ps) 2 23-1 9.9 0.8 Jitter (rms) (ps) 2 7-1 2.4 0.4 030906-06
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-37 Measured Data 030906-07 Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-38 Measured Jitter Transfer Characteristic Loop Bandwidth = 5.2 MHz Jitter Peaking = 0.04 db 030906-08
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-39 Measured Jitter Tolerance Characteristic BER@10Gb/s = 10-9 BER@5Gb/s = 10-12 Output buffer probably increases the BER at lower bit rates. Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-40 Performance Summary Characteristic Performance Input Bit Rate 10 Gb/s Output Bit Rate 10 Gb/s Output Clock 5 GHz Capture Range 1.43 GHz RMS Jitter 0.8 ps Loop Bandwidth 5.2 MHz Power Dissipation Oscillator: PFD: Buffers and Bias Circuits Total 30.6 mw 42.2 mw 18.2 mw 91 mw Area 1.75 mm x 1.55 mm Supply Voltage 1.8V Technology 0.18 µm CMOS
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-41 Summary of 10Gb/s Example A half-rate architecture relaxes the speed constraints of the system. A four-stage LC oscillator provide multiple phases with low jitter. A half-rate phase and frequency detector with inherent retiming is introduced. Inductive peaking enhances speed of the output buffers. Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-42 COURSE SUMMARY Outline of Material Covered Introduction to Phase Locked Loops (PLLs) Systems Perspective of PLLs Linear PLLs Digital PLLs (DPLLs) All-Digital PLL (ADPLLs) PLL Measurements Circuits Perspective of PLLs Phase/Frequency Detectors Filters and Charge Pumps Voltage Controlled Oscillators (VCOs) Phase Noise in VCOs PLL Applications and Examples Applications of PLLs Frequency Synthesizers for Wireless Applications Clock and Data Recovery Circuits
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-43 Objective Understand and demonstrate the principles and applications of phase locked loops using integrated circuit technology with emphasis on CMOS technology. CMOS Technology How well does CMOS implement the PLL? Very good for digital circuits and lower speed analog circuits Practical speed limits are found around 5-10 GHz. The primary challenge here is the VCO. At this point, circuit cleverness should allow most PLL applications to be possible and practical. With time, CMOS technology should allow the speed barrier to be pushed out. Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-44 Some Key Points CMOS is capable of implementing all types of PLLs LPLL, DPLL, and ADPLL Noise in the PLL consists of component noise and timing jitter, both resulting in phase noise. Blocks of the PLL include the PFD/PD, filter, and VCO. To reduce phase noise in PLLs due to the VCO: - Make the tank or resonator large - Maximize the signal power - Minimize the impulse sensitivity function (ISF) - Force the energy restoring circuit to function when the ISF is at a minimum and to deliver its energy in the shorted possible time. - The best oscillators will possess symmetry which leads to minimum upconversion of 1/f noise. Applications of PLLs 1.) Frequency synthesizer GSM Bluetooth 2.) Clock and data recovery 2.5 Gb/s 10 Gb/s
Lecture 160 Examples of CDR Circuits in CMOS (09/04/03) Page 160-45 Pertinent References 1. F.M Gardner, Phaselock Techniques, 2 nd edition, John-Wiley & Sons, Inc., New York, 1979. 2. B. Razavi (ed.), Monolithic Phase-Locked Loops and Clock Recovery Circuits, IEEE Press, 1997. 3. R.E. Best, Phase-Locked Loops: Design, Simulation, and Applications, 4 th edition, McGraw-Hill, 1999. 4. T. H. Lee and A. Hajimiri, Oscillator Phase Noise: A Tutorial, IEEE J. of Solid- State Circuits, Vol. 35, No. 3, March 2000, pp. 326-335. 5. A. Hajimiri, S. Limotyrakis, and T. H. Lee, Jitter and Phase Noise in Ring Oscillators, IEEE J. of Solid-State Circuits, Vol. 34, No. 6, June 1999, pp. 790-336. 6. B. Razavi, Design of Integrated Circuits for Optical Communications, McGraw-Hill, 2003 7. Recent publications of the IEEE Journal of Solid-State Circuits and the proceedings of the International Solid-State Circuits Conference.