Small, Low Power, 3-Axis ±5 g Accelerometer ADXL325

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Product Specification

Transcription:

Small, Low Power, 3-Axis ±5 g Accelerometer ADXL325 FEATURES 3-axis sensing Small, low profile package 4 mm 4 mm 1.45 mm LFCSP Low power: 35 μa typical Single-supply operation: 1.8 V to 3.6 V 1, g shock survival Excellent temperature stability Bandwidth adjustment with a single capacitor per axis RoHS/WEEE lead-free compliant APPLICATIONS Cost-sensitive, low power, motion- and tilt-sensing applications Mobile devices Gaming systems Disk drive protection Image stabilization Sports and health devices GENERAL DESCRIPTION The ADXL325 is a small, low power, complete 3-axis accelerometer with signal conditioned voltage outputs. The product measures acceleration with a minimum full-scale range of ±5 g. It can measure the static acceleration of gravity in tilt-sensing applications, as well as dynamic acceleration, resulting from motion, shock, or vibration. The user selects the bandwidth of the accelerometer using the CX, CY, and CZ capacitors at the XOUT, YOUT, and ZOUT pins. Bandwidths can be selected to suit the application with a range of.5 Hz to 16 Hz for X and Y axes and a range of.5 Hz to 55 Hz for the Z axis. The ADXL325 is available in a small, low profile, 4 mm 4 mm 1.45 mm, 16-lead, plastic lead frame chip scale package (LFCSP_LQ). +3V FUNCTIONAL BLOCK DIAGRAM V S ADXL325 OUTPUT AMP ~32kΩ X OUT C DC 3-AXIS SENSOR AC AMP DEMOD OUTPUT AMP ~32kΩ C X Y OUT C Y OUTPUT AMP ~32kΩ Z OUT C Z COM ST Figure 1. 7946-1 Rev. Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 916, Norwood, MA 262-916, U.S.A. Tel: 781.329.47 www.analog.com Fax: 781.461.3113 29 Analog Devices, Inc. All rights reserved.

TABLE OF CONTENTS Features... 1 Applications... 1 General Description... 1 Functional Block Diagram... 1 Revision History... 2 Specifications... 3 Absolute Maximum Ratings... 4 ESD Caution... 4 Pin Configuration and Function Descriptions... 5 Typical Performance Characteristics... 6 Theory of Operation... 1 Mechanical Sensor... 1 Performance... 1 Applications Information... 11 Power Supply Decoupling... 11 Setting the Bandwidth Using CX, CY, and CZ... 11 Self Test... 11 Design Trade-Offs for Selecting Filter Characteristics: The Noise/BW Trade-Off... 11 Use with Operating Voltages Other Than 3 V... 11 Axes of Acceleration Sensitivity... 12 Layout and Design Recommendations... 13 Outline Dimensions... 14 Ordering Guide... 14 REVISION HISTORY 8/9 Revision : Initial Version Rev. Page 2 of 16

SPECIFICATIONS ADXL325 TA = 25 C, VS = 3 V, CX = CY = CZ =.1 μf, acceleration = g, unless otherwise noted. All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed. Table 1. Parameter Conditions Min Typ Max Unit SENSOR INPUT Each axis Measurement Range ±5 ±6 g Nonlinearity Percent of full scale ±.2 % Package Alignment Error ±1 Degrees Interaxis Alignment Error ±.1 Degrees Cross-Axis Sensitivity 1 ±1 % SENSITIVITY (RATIOMETRIC) 2 Each axis Sensitivity at XOUT, YOUT, ZOUT VS = 3 V 156 174 192 mv/g Sensitivity Change Due to Temperature 3 VS = 3 V ±.1 %/ C ZERO g BIAS LEVEL (RATIOMETRIC) g Voltage at XOUT, YOUT, ZOUT VS = 3 V 1.3 1.5 1.7 V g Offset vs. Temperature ±1 mg/ C NOISE PERFORMANCE Noise Density XOUT, YOUT, ZOUT 25 μg/ Hz rms FREQUENCY RESPONSE 4 Bandwidth XOUT, YOUT 5 No external filter 16 Hz Bandwidth ZOUT 5 No external filter 55 Hz RFILT Tolerance 32 ± 15% kω Sensor Resonant Frequency 5.5 khz SELF TEST 6 Logic Input Low +.6 V Logic Input High +2.4 V ST Actuation Current +6 μa Output Change at XOUT Self test to 1 9 19 35 mv Output Change at YOUT Self test to 1 +9 +19 +35 mv Output Change at ZOUT Self test to 1 +9 +32 +58 mv OUTPUT AMPLIFIER Output Swing Low No load.1 V Output Swing High No load 2.8 V POWER SUPPLY Operating Voltage Range 1.8 3.6 V Supply Current VS = 3 V 35 μa Turn-On Time 7 No external filter 1 ms TEMPERATURE Operating Temperature Range 4 +85 C 1 Defined as coupling between any two axes. 2 Sensitivity is essentially ratiometric to VS. 3 Defined as the output change from ambient-to-maximum temperature or ambient-to-minimum temperature. 4 Actual frequency response controlled by user-supplied external filter capacitors (CX, CY, CZ). 5 Bandwidth with external capacitors = 1/(2 π 32 kω C). For CX, CY =.3 μf, bandwidth = 1.6 khz. For CZ =.1 μf, bandwidth = 5 Hz. For CX, CY, CZ = 1 μf, bandwidth =.5 Hz. 6 Self test response changes cubically with VS. 7 Turn-on time is dependent on CX, CY, CZ and is approximately 16 CX or CY or CZ + 1 ms, where CX, CY, CZ are in μf. Rev. Page 3 of 16

ABSOLUTE MAXIMUM RATINGS Table 2. Parameter Rating Acceleration (Any Axis, Unpowered) 1, g Acceleration (Any Axis, Powered) 1, g VS.3 V to +3.6 V All Other Pins (COM.3 V) to (VS +.3 V) Output Short-Circuit Duration Indefinite (Any Pin to Common) Temperature Range (Powered) 55 C to +125 C Temperature Range (Storage) 65 C to +15 C Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. ESD CAUTION Rev. Page 4 of 16

PIN CONFIGURATION AND FUNCTION DESCRIPTIONS NC V S V S NC NC 1 ST 2 COM 3 16 15 14 13 ADXL325 12 TOP VIEW (Not to Scale) 11 +Y +Z 1 X OUT NC Y OUT NC 4 +X 5 6 7 8 9 NC COM COM COM Z OUT NC = NO CONNECT Figure 2. Pin Configuration 7946-3 Table 3. Pin Function Descriptions Pin No. Mnemonic Description 1 NC No Connect (or Optionally Ground) 2 ST Self Test 3 COM Common 4 NC No Connect 5 COM Common 6 COM Common 7 COM Common 8 ZOUT Z Channel Output 9 NC No Connect (or Optionally Ground) 1 YOUT Y Channel Output 11 NC No Connect 12 XOUT X Channel Output 13 NC No Connect 14 VS Supply Voltage (1.8 V to 3.6 V) 15 VS Supply Voltage (1.8 V to 3.6 V) 16 NC No Connect EP Exposed pad Not internally connected. Solder for mechanical integrity. Rev. Page 5 of 16

TYPICAL PERFORMANCE CHARACTERISTICS N > 1 for all typical performance plots, unless otherwise noted. 5 6 4 5 3 2 4 3 2 1 1 1.46 1.47 1.48 1.49 1.5 1.51 1.52 1.53 1.54 OUTPUT (V) Figure 3. X-Axis Zero g Bias at 25 C, VS = 3 V 7946-5.22.2.18.16.14.12 VOLTAGE (V) Figure 6. X-Axis Self Test Response at 25 C, VS = 3 V 7946-8 4 6 3 5 2 1 4 3 2 1 1.46 1.47 1.48 1.49 1.5 1.51 1.52 1.53 1.54 OUTPUT (V) Figure 4. Y-Axis Zero g Bias at 25 C, VS = 3 V 7946-6.12.13.14.15.16.17.18.19.2.21.22 VOLTAGE (V) Figure 7. Y-Axis Self Test Response at 25 C, VS = 3 V 7946-9 3 6 25 5 2 15 1 4 3 2 5 1 1.46 1.47 1.48 1.49 1.5 1.51 1.52 1.53 1.54 OUTPUT (V) Figure 5. Z-Axis Zero g Bias at 25 C, VS = 3 V 7946-7.26.27.28.29.3.31.32.33.34.35.36 VOLTAGE (V) Figure 8. Z-Axis Self Test Response at 25 C, VS = 3 V 7946-1 Rev. Page 6 of 16

5 45 4 1.55 1.54 1.53 N = 8 35 3 25 2 15 OUTPUT (V) 1.52 1.51 1.5 1.49 1.48 1 5 1.4 1..6.2.2.6 1. 1.4 TEMPERATURE COEFFICIENT (mg/ C) Figure 9. X-Axis Zero g Bias Temperature Coefficient, VS = 3 V 7946-11 1.47 1.46 1.45 4 3 2 1 1 2 3 4 5 6 7 8 9 1 TEMPERATURE ( C) Figure 12. X-Axis Zero g Bias vs. Temperature, Eight Parts Soldered to PCB 7946-14 5 4 1.55 1.54 1.53 N = 8 3 2 OUTPUT (V) 1.52 1.51 1.5 1.49 1.48 1 1.4 1..6.2.2.6 1. 1.4 TEMPERATURE COEFFICIENT (mg/ C) Figure 1. Y-Axis Zero g Bias Temperature Coefficient, VS = 3 V 7946-12 1.47 1.46 1.45 4 3 2 1 1 2 3 4 5 6 7 8 9 1 TEMPERATURE ( C) Figure 13. Y-Axis Zero g Bias vs. Temperature, Eight Parts Soldered to PCB 7946-15 4 35 3 25 2 15 1 5 OUTPUT (V) 1.54 N = 8 1.52 1.5 1.48 1.46 1.44 1.42 3.5 3. 2.5 2. 1.5 1..5.5 1. 1.5 2. 2.5 TEMPERATURE COEFFICIENT (mg/ C) Figure 11. Z-Axis Zero g Bias Temperature Coefficient, VS = 3 V 7946-13 1.4 4 3 2 1 1 2 3 4 5 6 7 8 9 1 TEMPERATURE ( C) Figure 14. Z-Axis Zero g Bias vs. Temperature, Eight Parts Soldered to PCB 7946-16 Rev. Page 7 of 16

3 25.187 N = 8.182 2 15 1 SENSITIVITY (V/g).177.172.167 5.162.164.166.168.17.172.174.176.178.18.182 SENSITIVITY (V/g) Figure 15. X-Axis Sensitivity at 25 C, VS = 3 V 7946-17.157 4 3 2 1 1 2 3 4 5 6 7 8 9 1 TEMPERATURE ( C) Figure 18. X-Axis Sensitivity vs. Temperature, Eight Parts Soldered to PCB, VS = 3 V 7946-2 4 35.187 N = 8 3.182 25 2 15 1 SENSITIVITY (V/g).177.172.167 5.162.164.166.168.17.172.174.176.178.18.182 SENSITIVITY (V/g) Figure 16. Y-Axis Sensitivity at 25 C, VS = 3 V 7946-18.157 4 3 2 1 1 2 3 4 5 6 7 8 9 1 TEMPERATURE ( C) Figure 19. Y-Axis Sensitivity vs. Temperature, Eight Parts Soldered to PCB, VS = 3 V 7946-21 35 3.187.182 N = 8 25 2 15 1 SENSITIVITY (V/g).177.172.167 5.162.164.166.168.17.172.174.176.178.18.182 SENSITIVITY (V/g) Figure 17. Z-Axis Sensitivity at 25 C, VS = 3 V 7946-19.157 4 3 2 1 1 2 3 4 5 6 7 8 9 1 TEMPERATURE ( C) Figure 2. Z-Axis Sensitivity vs. Temperature, Eight Parts Soldered to PCB, VS = 3 V 7946-22 Rev. Page 8 of 16

6 5 CH4: Z OUT, 5mV/DIV CH3: Y OUT, 5mV/DIV CURRENT (µa) 4 3 2 4 3 2 CH2: X OUT, 5mV/DIV CH1: POWER, 2V/DIV 1 1.5 2. 2.5 3. 3.5 4. SUPPLY (V) Figure 21. Typical Current Consumption vs. Supply Voltage 7946-23 1 OUTPUTS ARE OFFSET FOR CLARITY TIME (1ms/DIV) Figure 22. Typical Turn-On Time, VS = 3 V, CX = CY = CZ =.47 μf 7946-24 Rev. Page 9 of 16

THEORY OF OPERATION The ADXL325 is a complete 3-axis acceleration measurement system. The ADXL325 has a measurement range of ±5 g minimum. It contains a polysilicon surface micromachined sensor and signal conditioning circuitry to implement an openloop acceleration measurement architecture. The output signals are analog voltages that are proportional to acceleration. The accelerometer can measure the static acceleration of gravity in tilt-sensing applications, as well as dynamic acceleration, resulting from motion, shock, or vibration. The sensor is a polysilicon surface micromachined structure built on top of a silicon wafer. Polysilicon springs suspend the structure over the surface of the wafer and provide a resistance against acceleration forces. Deflection of the structure is measured using a differential capacitor that consists of independent fixed plates and plates attached to the moving mass. The fixed plates are driven by 18 out-of-phase square waves. Acceleration deflects the moving mass and unbalances the differential capacitor resulting in a sensor output whose amplitude is proportional to acceleration. Phase-sensitive demodulation techniques are then used to determine the magnitude and direction of the acceleration. The demodulator output is amplified and brought off-chip through a 32 kω resistor. The user then sets the signal bandwidth of the device by adding a capacitor. This filtering improves measurement resolution and helps prevent aliasing. MECHANICAL SENSOR The ADXL325 uses a single structure for sensing the X, Y, and Z axes. As a result, the three axes sense directions are highly orthogonal with little cross-axis sensitivity. Mechanical misalignment of the sensor die to the package is the chief source of cross-axis sensitivity. Mechanical misalignment can, of course, be calibrated out at the system level. PERFORMANCE Rather than using additional temperature compensation circuitry, innovative design techniques ensure that high performance is built-in to the ADXL325. As a result, there is neither quantization error nor nonmonotonic behavior, and temperature hysteresis is very low (typically <3 mg over the 25 C to +7 C temperature range). Rev. Page 1 of 16

APPLICATIONS INFORMATION POWER SUPPLY DECOUPLING For most applications, a single.1 μf capacitor, CDC, placed close to the ADXL325 supply pins adequately decouples the accelerometer from noise on the power supply. However, in applications where noise is present at the 5 khz internal clock frequency (or any harmonic thereof), additional care in power supply bypassing is required because this noise can cause errors in acceleration measurement. If additional decoupling is needed, a 1 Ω (or smaller) resistor or ferrite bead can be inserted in the supply line. Additionally, a larger bulk bypass capacitor (1 μf or greater) can be added in parallel to CDC. Ensure that the connection from the ADXL325 ground to the power supply ground is low impedance because noise transmitted through ground has a similar effect as noise transmitted through VS. SETTING THE BANDWIDTH USING C X, C Y, AND C Z The ADXL325 has provisions for band limiting the XOUT, YOUT, and ZOUT pins. Capacitors must be added at these pins to implement low-pass filtering for antialiasing and noise reduction. The 3 db bandwidth equation is f 3 db = 1/(2π(32 kω) C(X, Y, Z)) or more simply f 3 db = 5 μf/c(x, Y, Z) The tolerance of the internal resistor (RFILT) typically varies as much as ±15% of its nominal value (32 kω), and the bandwidth varies accordingly. A minimum capacitance of.47 μf for CX, CY, and CZ is recommended in all cases. Table 4. Filter Capacitor Selection, CX, CY, and CZ Bandwidth (Hz) Capacitor (μf) 1 4.7 1.47 5.1 1.5 2.27 5.1 SELF TEST The ST pin controls the self test feature. When this pin is set to VS, an electrostatic force is exerted on the accelerometer beam. The resulting movement of the beam allows the user to test whether the accelerometer is functional. The typical change in output is 1.8 g (corresponding to 19 mv) in the X axis, +1.8 g (+19 mv) on the Y axis, and +1.83 g (+32 mv) on the Z axis. This ST pin can be left open circuit or connected to common (COM) in normal use. Never expose the ST pin to voltages greater than VS +.3 V. If this cannot be guaranteed due to the system design (for instance, there are multiple supply voltages), then a low VF clamping diode between ST and VS is recommended. Rev. Page 11 of 16 ADXL325 DESIGN TRADE-OFFS FOR SELECTING FILTER CHARACTERISTICS: THE NOISE/BW TRADE-OFF The selected accelerometer bandwidth ultimately determines the measurement resolution (smallest detectable acceleration). Filtering can be used to lower the noise floor to improve the resolution of the accelerometer. Resolution is dependent on the analog filter bandwidth at XOUT, YOUT, and ZOUT. The output of the ADXL325 has a typical bandwidth greater than 5 Hz. The user must filter the signal at this point to limit aliasing errors. The analog bandwidth must be no more than half the analog-to-digital sampling frequency to minimize aliasing. The analog bandwidth can be further decreased to reduce noise and improve resolution. The ADXL325 noise has the characteristics of white Gaussian noise, which contributes equally at all frequencies and is described in terms of μg/ Hz (the noise is proportional to the square root of the accelerometer bandwidth). The user should limit bandwidth to the lowest frequency needed by the application to maximize the resolution and dynamic range of the accelerometer. With the single-pole roll-off characteristic, the typical noise of the ADXL325 is determined by rms Noise = Noise Density ( BW 1.6 ) Often, the peak value of the noise is desired. Peak-to-peak noise can only be estimated by statistical methods. Table 5 is useful for estimating the probabilities of exceeding various peak values, given the rms value. Table 5. Estimation of Peak-to-Peak Noise % of Time That Noise Exceeds Peak-to-Peak Value Nominal Peak-to-Peak Value 2 rms 32 4 rms 4.6 6 rms.27 8 rms.6 USE WITH OPERATING VOLTAGES OTHER THAN 3 V The ADXL325 is tested and specified at VS = 3 V; however, it can be powered with VS as low as 1.8 V or as high as 3.6 V. Note that some performance parameters change as the supply voltage is varied. The ADXL325 output is ratiometric; therefore, the output sensitivity (or scale factor) varies proportionally to the supply voltage. At VS = 3.6 V, the output sensitivity is typically 29 mv/g. At VS = 2 V, the output sensitivity is typically 116 mv/g. The zero g bias output is also ratiometric; therefore, the zero g output is nominally equal to VS/2 at all supply voltages. The output noise is not ratiometric but is absolute in volts; therefore, the noise density decreases as the supply voltage increases. This is because the scale factor (mv/g) increases while the noise voltage remains constant. At VS = 3.6 V, the X- and Y-axis noise density is typically 2 μg/ Hz, while at VS = 2 V, the X- and Y-axis noise density is typically 3 μg/ Hz.

Self test response in g is roughly proportional to the square of the supply voltage. However, when ratiometricity of sensitivity is factored in with supply voltage, the self test response in volts is roughly proportional to the cube of the supply voltage. For example, at VS = 3.6 V, the self test response for the ADXL325 is approximately 328 mv for the X-axis, +328 mv for the Y axis, and +553 mv for the Z axis. At VS = 2 V, the self test response is approximately 56 mv for the X axis, +56 mv for the Y axis, and 95 mv for the Z axis. The supply current decreases as the supply voltage decreases. Typical current consumption at VS = 3.6 V is 375 μa, and typical current consumption at VS = 2 V is 3 μa. AXES OF ACCELERATION SENSITIVITY A Z TOP A Y A X Figure 23. Axes of Acceleration Sensitivity (Corresponding Output Voltage Increases When Accelerated Along the Sensitive Axis) 7946-25 X OUT = 1g Y OUT = g Z OUT = g TOP GRAVITY X OUT = g Y OUT = 1g Z OUT = g TOP TOP X OUT = g Y OUT = 1g Z OUT = g TOP X OUT = 1g Y OUT = g Z OUT = g TOP X OUT = g Y OUT = g Z OUT = 1g Figure 24. Output Response vs. Orientation to Gravity X OUT = g Y OUT = g Z OUT = 1g 7946-26 Rev. Page 12 of 16

LAYOUT AND DESIGN RECOMMENDATIONS ADXL325 The recommended soldering profile is shown in Figure 25, followed by a description of the profile features in Table 6. The recommended PCB layout or solder land drawing is shown in Figure 26. T P RAMP-UP t P CRITICAL ZONE T L TO T P TEMPERATURE T L T SMIN T SMAX t S PREHEAT t L RAMP-DOWN t25 C TO PEAK TIME Figure 25. Recommended Soldering Profile 7946-2 Table 6. Recommended Soldering Profile Profile Feature Sn63/Pb37 Pb-Free Average Ramp Rate (TL to TP) 3 C/sec maximum 3 C/sec maximum Preheat Minimum Temperature (TSMIN) 1 C 15 C Maximum Temperature (TSMAX) 15 C 2 C Time (TSMIN to TSMAX), ts 6 sec to 12 sec 6 sec to 18 sec TSMAX to TL Ramp-Up Rate 3 C/sec maximum 3 C/sec maximum Time Maintained Above Liquidous (TL) Liquidous Temperature (TL) 183 C 217 C Time (tl) 6 sec to 15 sec 6 sec to 15 sec Peak Temperature (TP) 24 C + C/ 5 C 26 C + C/ 5 C Time Within 5 C of Actual Peak Temperature (tp) 1 sec to 3 sec 2 sec to 4 sec Ramp-Down Rate 6 C/sec maximum 6 C/sec maximum Time 25 C to Peak Temperature 6 minutes maximum 8 minutes maximum.5 MAX.65.325 4.35 MAX.65 1.95.325 4 CENTER PAD IS NOT INTERNALLY CONNECTED BUT SHOULD BE SOLDERED FOR MECHANICAL INTEGRITY 1.95 DIMENSIONS SHOWN IN MILLIMETERS Figure 26. Recommended PCB Layout 7946-4 Rev. Page 13 of 16

OUTLINE DIMENSIONS PIN 1 INDICATOR 1.5 1.45 1.4 SEATING PLANE TOP VIEW.35.3.25 4.15 4. SQ 3.85.5 MAX.2 NOM.2 MIN.65 BSC COPLANARITY.5.55.5.45 9 13 8.2 MIN 16 12 1 EXPOSED PAD (BOTTOM VIEW) 5 4 PIN 1 INDICATOR 2.43 1.75 SQ 1.8 1.95 BSC FOR PROPER CONNECTION OF THE EXPOSED PAD, REFER TO THE PIN CONFIGURATION AND FUNCTION DESCRIPTIONS SECTION OF THIS DATA SHEET. *STACKED DIE WITH GLASS SEAL. Figure 27. 16-Lead Lead Frame Chip Scale Package [LFCSP_LQ] 4 mm 4 mm Body, 1.45 mm Thick Quad (CP-16-5a*) Dimensions shown in millimeters 1128-A ORDERING GUIDE Model Measurement Range Specified Voltage Temperature Range Package Description Package Option ADXL325BCPZ 1 ±5 g 3 V 4 C to +85 C 16-Lead LFCSP_LQ CP-16-5a ADXL325BCPZ RL 1 ±5 g 3 V 4 C to +85 C 16-Lead LFCSP_LQ CP-16-5a ADXL325BCPZ RL7 1 ±5 g 3 V 4 C to +85 C 16-Lead LFCSP_LQ CP-16-5a EVAL-ADXL325Z 1 Evaluation Board 1 Z = RoHS Compliant Part. Rev. Page 14 of 16

NOTES Rev. Page 15 of 16

NOTES Analog Devices offers specific products designated for automotive applications; please consult your local Analog Devices sales representative for details. Standard products sold by Analog Devices are not designed, intended, or approved for use in life support, implantable medical devices, transportation, nuclear, safety, or other equipment where malfunction of the product can reasonably be expected to result in personal injury, death, severe property damage, or severe environmental harm. Buyer uses or sells standard products for use in the above critical applications at Buyer's own risk and Buyer agrees to defend, indemnify, and hold harmless Analog Devices from any and all damages, claims, suits, or expenses resulting from such unintended use. 29 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D7946--8/9() Rev. Page 16 of 16