Features. 8.8 A, 250 V, R DS(on) =430 GS =10 V, I D =4.4 A Low Gate Charge (Typ nc) Low C rss (Typ pf) 100% Avalanche Tested

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FQP9N25C / FQPF9N25C N-Channel QFET MOSFET 250 V, 8.8 A, 430 mω Description This N-Channel enhancement mode power MOSFET is produced using Fairchild Semiconductor s proprietary planar stripe and DMOS technology. This advanced MOSFET technology has been especially tailored to reduce on-state resistance, and to provide superior switching performance and high avalanche energy strength. These devices are suitable for switched mode power supplies, active power factor correction (PFC), and electronic lamp ballasts. Features 8.8 A, 250 V, R DS(on) =430 mω(max.)@ =10 V, =4.4 A Low Gate Charge (Typ. 26.5 nc) Low C rss (Typ. 45.5 pf) 100% Avalanche Tested March 2013 D G D S TO-220 G D S TO-220F G S Absolute Maximum Ratings T C = 25 C unless otherwise noted Symbol Parameter FQP9N25C FQPF9N25C Unit S Drain-Source Voltage 250 V Drain Current - Continuous (T C = 25 C) 8.8 8.8 * A Maximum lead temperature for soldering purposes, T L 1/8" from case for 5 seconds * Drain current limited by maximum junction temperature. Thermal Characteristics - Continuous (T C = 100 C) 5.6 5.6 * A M Drain Current - Pulsed (Note 1) 35.2 35.2 * A S Gate-Source Voltage ± 30 V E AS Single Pulsed Avalanche Energy (Note 2) 285 mj I AR Avalanche Current (Note 1) 8.8 A E AR Repetitive Avalanche Energy (Note 1) 7.4 mj dv/dt Peak Diode Recovery dv/dt (Note 3) 5.5 V/ns P D Power Dissipation (T C = 25 C) 74 38 W - Derate above 25 C 0.59 0.3 W/ C T J, T STG Operating and Storage Temperature Range -55 to +150 C 300 C Symbol Parameter FQP9N25C FQPF9N25C Unit R θjc Thermal Resistance, Junction-to-Case 1.69 3.29 C/W R θjs Thermal Resistance, Case-to-Sink Typ. 0.5 -- C/W R θja Thermal Resistance, Junction-to-Ambient 62.5 62.5 C/W

Electrical Characteristics T C = 25 C unless otherwise noted Symbol Parameter Test Conditions Min Typ Max Unit Off Characteristics BS Drain-Source Breakdown Voltage = 0 V, = 250 µa 250 -- -- V BS Breakdown Voltage Temperature / T J Coefficient = 250 µa, Referenced to 25 C -- 0.30 -- V/ C SS = 250 V, = 0 V -- -- 10 µa Zero Gate Voltage Drain Current = 200 V, T C = 125 C -- -- 100 µa I GSSF Gate-Body Leakage Current, Forward = 30 V, = 0 V -- -- 100 na I GSSR Gate-Body Leakage Current, Reverse = -30 V, = 0 V -- -- -100 na On Characteristics (th) Gate Threshold Voltage =, = 250 µa 2.0 -- 4.0 V R DS(on) Static Drain-Source V On-Resistance GS = 10 V, = 4.4 A -- 0.35 0.43 Ω g FS Forward Transconductance = 40 V, = 4.4 A (Note 4) -- 7.0 -- S Dynamic Characteristics C iss Input Capacitance = 25 V, = 0 V, -- 545 710 pf C oss Output Capacitance f = 1.0 MHz -- 115 150 pf C rss Reverse Transfer Capacitance -- 45.5 60 pf Switching Characteristics t d(on) Turn-On Delay Time -- 15 40 ns V DD = 125 V, = 8.8 A, t r Turn-On Rise Time R G = 25 Ω -- 85 180 ns t d(off) Turn-Off Delay Time -- 90 190 ns t f Turn-Off Fall Time (Note 4, 5) -- 65 140 ns Q g Total Gate Charge = 200 V, = 8.8 A, -- 26.5 35 nc Q gs Gate-Source Charge = 10 V -- 3.5 -- nc Q gd Gate-Drain Charge (Note 4, 5) -- 13.5 -- nc Drain-Source Diode Characteristics and Maximum Ratings I S Maximum Continuous Drain-Source Diode Forward Current -- -- 8.8 A I SM Maximum Pulsed Drain-Source Diode Forward Current -- -- 35.2 A V SD Drain-Source Diode Forward Voltage = 0 V, I S = 8.8 A -- -- 1.5 V t rr Reverse Recovery Time = 0 V, I S = 8.8 A, -- 218 -- ns Q rr Reverse Recovery Charge di F / dt = 100 A/µs (Note 4) -- 1.58 -- µc Notes: 1. Repetitive Rating : Pulse width limited by maximum junction temperature 2. L = 5.9mH, I AS = 8.8A, V DD = 50V, R G = 25 Ω, Starting T J = 25 C 3. I SD 8.8A, di/dt 300A/µs, V DD BS, Starting T J = 25 C 4. Pulse Test : Pulse width 300µs, Duty cycle 2% 5. Essentially independent of operating temperature

Typical Characteristics 10 1 1.25 Top : 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 V 5.5 V 5.0 V Bottom : 4.5 V 1. 250µ s Pulse Test 2. T C = 25 10 1, Drain-Source Voltage [V] Figure 1. On-Region Characteristics 10 1 150 o C 25 o C -55 o C 2 4 6 8 10, Gate-Source Voltage [V] 1. = 40V 2. 250µ s Pulse Test Figure 2. Transfer Characteristics R DS(ON) [Ω ], Drain-Source On-Resistance 1.00 0.75 0.50 0.25 = 10V = 20V Note : T = 25 J R, Reverse Drain Current [A] 10 1 150 25 1. = 0V 2. 250µ s Pulse Test 0.00 0 10 20 30 0.2 0.4 0.6 0.8 1.0 1.2 1.4 V SD, Source-Drain voltage [V] Figure 3. On-Resistance Variation vs Drain Current and Gate Voltage Figure 4. Body Diode Forward Voltage Variation with Source Current and Temperature Capacitance [pf] 2000 1500 1000 500 1. = 0 V 2. f = 1 MHz C iss C oss C rss 0 10 1, Drain-Source Voltage [V] C iss = C gs + C gd (C ds = shorted) C oss = C ds + C gd C rss = C gd, Gate-Source Voltage [V] 12 10 8 6 4 2 = 50V = 125V = 200V Note : I = 8.8A D 0 0 5 10 15 20 25 30 Q G, Total Gate Charge [nc] Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics

Typical Characteristics (Continued) BS, (Normalized) Drain-Source Breakdown Voltage 1.2 1.1 1.0 0.9 0.8-100 -50 0 50 100 150 200 10 2 T J, Junction Temperature [ o C] Operation in This Area is Limited by R DS(on) Notes : 1. = 0 V 2. = 250 µ A Figure 7. Breakdown Voltage Variation vs Temperature R DS(ON), (Normalized) Drain-Source On-Resistance 10 2 3.0 2.5 2.0 1.5 1.0 0.5 0.0-100 -50 0 50 100 150 200 T J, Junction Temperature [ o C] Operation in This Area is Limited by R DS(on) 1. = 10 V 2. = 4.4 A Figure 8. On-Resistance Variation vs Temperature 10 1 Notes : 1. T C = 25 o C 2. T J = 150 o C 3. Single Pulse 100 µs 1 ms 10 ms DC 10 1 1. T C = 25 o C 2. T J = 150 o C 3. Single Pulse 10 µs 100 µs 1 ms 10 ms DC 10 1 10 2, Drain-Source Voltage [V] 10 1 10 2, Drain-Source Voltage [V] Figure 9-1. Maximum Safe Operating Area for FQP9N25C Figure 9-2. Maximum Safe Operating Area for FQPF9N25C 10 8 6 4 2 0 25 50 75 100 125 150 T C, Case Temperature [ ] Figure 10. Maximum Drain Current vs Case Temperature

Typical Characteristics (Continued) Z θjc (t), Thermal Response 10-2 D=0.5 0.2 0.1 0.05 0.02 0.01 single pulse N otes : 1. Z θ JC (t) = 1.69 /W M ax. 2. D uty F actor, D =t 1 /t 2 3. T JM - T C = P DM * Z θ JC (t) 10-5 10-4 10-3 10-2 10 1 t 1, Square W ave Pulse Duration [sec] Figure 11-1. Transient Thermal Response Curve for FQP9N25C P DM t 1 t 2 D=0.5 Z θjc (t), Thermal Response 0.2 N otes : 1. Z θ JC (t) = 3.29 /W Max. 0.1 2. D uty Factor, D =t 1 /t 2 3. T JM - T C = P DM * Z θ JC (t) 0.05 0.02 0.01 single pulse P DM t 1 t 2 10-2 10-5 10-4 10-3 10-2 10 1 t 1, Square W ave Pulse Duration [sec] Figure 11-2. Transient Thermal Response Curve for FQPF9N25C

12V 200nF 3mA 50KΩ 300nF Gate Charge Test Circuit & Waveform Same Type as DUT 10V Q gs DUT Resistive Switching Test Circuit & Waveforms Q g Q gd Charge R L 90% R G V DD 10V DUT 10% t d(on) t r t d(off) tf t on t off Unclamped Inductive Switching Test Circuit & Waveforms L E AS = ---- 1 LI 2 2 AS BS -------------------- BS -V DD BS I AS R G V DD (t) 10V DUT V DD (t) t p t p Time

Peak Diode Recovery dv/dt Test Circuit & Waveforms DUT + I SD _ L Driver R G Same Type as DUT dv/dt controlled by RG I SD controlled by pulse period V DD ( Driver ) Gate Pulse Width D = -------------------------- Gate Pulse Period 10V I FM, Body Diode Forward Current I SD ( DUT ) di/dt I RM Body Diode Reverse Current ( DUT ) Body Diode Recovery dv/dt V SD V DD Body Diode Forward Voltage Drop

Mechanical Dimensions TO-220 Dimensions in Millimeters

Mechanical Dimensions TO-220F Dimensions in Millimeters

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Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only. Rev. I64