Features. = +25 C, Vdd = 5V, Idd = 85mA*

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Typical Applications The is ideal for use as a medium power amplifier for: Point-to-Point and Point-to-Multi-Point Radios VSAT Functional Diagram Features Saturated Power: +23 dbm @ 25% PAE Gain: 15 db Supply Voltage: +5V 5 Ohm Matched Input/Output Die Size: 1.3 x 1.13 x.1 mm General Description The is an efficient GaAs PHEMT MMIC Medium Power Amplifier which operates between 17.5 and 25.5 GHz. The provides 15 db of gain, +23 dbm of saturated power and 25% PAE from a +5V supply voltage. The amplifier chip can easily be integrated into Multi-Chip-Modules (MCMs) due to its small size. All data is tested with the chip in a 5 Ohm test fixture connected via.25mm (1 mil) diameter wire bonds of minimal length.31mm (12 mils). Electrical Specifications, T A = +25 C, Vdd = 5V, Idd = 85mA* Parameter Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. Units Frequency Range 17.5-21. 21. - 2. 2. - 25.5 GHz Gain 12 1.5 12 15 13.5 16 db Gain Variation Over Temperature.2.3.2.3.2.3 db/ C Input Return Loss 15 13 db Output Return Loss db Output Power for 1 db Compression (P1dB) 21.5 21.5 19 dbm Saturated Output Power (Psat) 23 23 23.5 dbm Output Third Order Intercept (IP3) 29 28 27 dbm Noise Figure 6.5 5.5 6 db Supply Current (Idd)(Vdd = 5V, Vgg = -1V Typ.) 85 1 85 1 85 1 ma * Adjust Vgg between -1.5 to -.5V to achieve Idd = 85mA typical. 1

Broadband Gain & Return Loss Gain vs. Temperature RESPONSE (db) - - -3 1 17 23 29 S21 S11 S Input Return Loss vs. Temperature RETURN LOSS (db) -5 - -15 - -25-3 16 17 19 21 23 2 25 27 GAIN (db) 16 12 8 16 17 19 21 23 2 25 27 Output Return Loss vs. Temperature RETURN LOSS (db) -5 - -15 - -25-3 16 17 19 21 23 2 25 27 P1dB vs. Temperature 3 Psat vs. Temperature 3 P1dB (dbm) Psat (dbm) 1 1 16 17 19 21 23 2 25 27 16 17 19 21 23 2 25 27 2

Power Compression @ 21 GHz 28 Power Compression @ 25 GHz 35 Pout (dbm), GAIN (db), PAE (%) 2 16 12 8 - -6-2 2 6 1 INPUT POWER (dbm) Pout (dbm) Gain (db) PAE (%) Output IP3 vs. Temperature IP3 (dbm) 3 3 1 16 17 19 21 23 2 25 27 Pout (dbm), GAIN (db), PAE (%) 3 25 15 5 - -6-2 2 6 1 INPUT POWER (dbm) Pout (dbm) Gain (db) PAE (%) Noise Figure vs. Temperature NOISE FIGURE (db) 8 6 2 16 17 19 21 23 2 25 Gain & Power vs. Supply Voltage @ 25 GHz Reverse Isolation vs. Temperature GAIN (db), P1dB (dbm), Psat (dbm) 2 16 1 12 2.7 3.1 3.5 3.9.3.7 5.1 5.5 Vdd Supply Voltage (Vdc) Gain P1dB Psat ISOLATION (db) - - -3 - -5-6 16 17 19 21 23 2 25 27 3

Absolute Maximum Ratings Typical Supply Current vs. Vdd Drain Bias Voltage (Vdd) Gate Bias Voltage (Vgg) RF Input Power (RFIN)(Vdd = +5Vdc) Outline Drawing +5.5 Vdc - to Vdc + dbm Channel Temperature 175 C Continuous Pdiss (T= 85 C) (derate 7.1 mw/ C above 85 C) Thermal Resistance (channel to die bottom).6 W 11 C/W Storage Temperature -65 to +15 C Operating Temperature -55 to +85 C Vdd (Vdc) Idd (ma) +.5 82 +5. 85 +5.5 89 +2.7 79 +3. 83 +3.3 86 Note: Amplifier will operate over full voltage ranges shown above ELECTROSTATIC SENSITIVE DEVICE OBSERVE HANDLING PRECAUTIONS Die Packaging Information [1] Standard Alternate GP-2 (Gel Pack) [2] [1] Refer to the Packaging Information section for die packaging dimensions. [2] For alternate packaging information contact Hittite Microwave Corporation. NOTES: 1. ALL DIMENSIONS ARE IN INCHES [MM] 2. DIE THICKNESS IS. 3. TYPICAL BOND IS. SQUARE. BACKSIDE METALLIZATION: GOLD 5. BOND PAD METALLIZATION: GOLD 6. BACKSIDE METAL IS GROUND. 7. CONNECTION NOT REQUIRED FOR UNLABELED BOND PADS.

Pad Descriptions Pad Number Function Description Pin Schematic 1 Vgg 2 RFIN 3 Vdd RFOUT Assembly Diagram Gate control for amplifier. Adjust to achieve Id of 85mA. Please follow MMIC Amplifier Biasing Procedure Application Note. This pad is AC coupled and matched to 5 Ohms Power Supply Voltage for the amplifier. External bypass capacitors of pf and.1 µf are required. This pad is AC coupled and matched to 5 Ohms. 5

Mounting & Bonding Techniques for Millimeterwave GaAs MMICs The die should be attached directly to the ground plane eutectically or with conductive epoxy (see HMC general Handling, Mounting, Bonding Note). 5 Ohm Microstrip transmission lines on.127mm (5 mil) thick alumina thin film substrates are recommended for bringing RF to and from the chip (Figure 1). If.25mm ( mil) thick alumina thin film substrates must be used, the die should be raised.15mm (6 mils) so that the surface of the die is coplanar with the surface of the substrate. One way to accomplish this is to attach the.2mm ( mil) thick die to a.15mm (6 mil) thick molybdenum heat spreader (moly-tab) which is then attached to the ground plane (Figure 2). Microstrip substrates should be located as close to the die as possible in order to minimize bond wire length. Typical die-to-substrate spacing is.76mm to.152 mm (3 to 6 mils). Handling Precautions Follow these precautions to avoid permanent damage. Storage: All bare die are placed in either Waffle or Gel based ESD protective containers, and then sealed in an ESD protective bag for shipment. Once the sealed ESD protective bag has been opened, all die should be stored in a dry nitrogen environment. Cleanliness: Handle the chips in a clean environment. DO NOT attempt to clean the chip using liquid cleaning systems. Static Sensitivity: Follow ESD precautions to protect against > ± 25V ESD strikes. Transients: Suppress instrument and bias supply transients while bias is applied. Use shielded signal and bias cables to minimize inductive pickup..2mm (. ) Thick GaAs MMIC.76mm (.3 ) RF Ground Plane Wire Bond.127mm (.5 ) Thick Alumina Thin Film Substrate Figure 1..2mm (. ) Thick GaAs MMIC.76mm (.3 ) RF Ground Plane Wire Bond.15mm (.5 ) Thick Moly Tab.25mm (. ) Thick Alumina Thin Film Substrate Figure 2. General Handling: Handle the chip along the edges with a vacuum collet or with a sharp pair of bent tweezers. The surface of the chip may have fragile air bridges and should not be touched with vacuum collet, tweezers, or fingers. Mounting The chip is back-metallized and can be die mounted with AuSn eutectic preforms or with electrically conductive epoxy. The mounting surface should be clean and flat. Eutectic Die Attach: A 8/ gold tin preform is recommended with a work surface temperature of 255 C and a tool temperature of 5 C. When hot 9/ nitrogen/hydrogen gas is applied, tool tip temperature should be 29 C. DO NOT expose the chip to a temperature greater than 3 C for more than seconds. No more than 3 seconds of scrubbing should be required for attachment. Epoxy Die Attach: Apply a minimum amount of epoxy to the mounting surface so that a thin epoxy fillet is observed around the perimeter of the chip once it is placed into position. Cure epoxy per the manufacturer s schedule. Wire Bonding Ball or wedge bond with.25mm (1 mil) diameter pure gold wire. Thermosonic wirebonding with a nominal stage temperature of 15 C and a ball bonding force of to 5 grams or wedge bonding force of to grams is recommended. Use the minimum level of ultrasonic energy to achieve reliable wirebonds. Wirebonds should be started on the chip and terminated on the package or substrate. All bonds should be as short as possible <.31mm (12 mils). 6