SDN136-STR. Features. Description. Agency Approvals. Applications. Absolute Maximum Ratings. Schematic Diagram. Ordering Information

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Description The is a high speed optocoupler consisting of an infrared GaAs LED optically coupled through a high isolation barrier to an integrated high speed transistor and photodiode. Separate access to the photodiode and transistor allow users to reduce base-collector capacitance, enabling much higher switching speeds. Signals with frequencies of up to 2.0MHz can be switched, giving the a much broader application range than traditional optocouplers. The comes standard in an 8 pin DIP package. Applications High Speed Logic Ground Isolation Replace Slower Speed Optocouplers Line Receivers Power Transistor Isolation Pulse Transformer Replacement Switch Mode Power Supplies High Voltage Insulation Ground Isolation Analog Signals Schematic Diagram NC Anode Cathode 1 2 3 8 V CC 7 6 V B V O Features TTL Compatible High Bit Rate: 1Mb/s Bandwidth: 2.0MHz Open Collector Output High Isolation Voltage (5000V RMS ) High Common Mode Interference Immunity RoHS / Pb-Free / REACH Compliant Agency Approvals UL / C-UL: File # E201932 VDE: File # 40035191 (EN 60747-5-2) Absolute Maximum Ratings The values indicated are absolute stress ratings. Functional operation of the device is not implied at these or any conditions in excess of those defined in electrical characteristics section of this document. Exposure to absolute Maximum Ratings may cause permanent damage to the device and may adversely affect reliability. Storage Temperature..-55 to +125 C Operating Temperature -40 to +85 C Continuous Input Current..40mA Transient Input Current...400mA Reverse Input Control Voltage.. 5V Input Power Dissipation 40mW Peak Output Current (Pin 6).16mA Max Emitter-Base Reverse Voltage (Pin 5-7)..5V Max Supply Voltage (Pin 8-5)..15V Max Output Voltage (Pin 6-5)..15V Max Base Current (Pin 7) 5mA Output Power Dissipation..100mW NC 4 5 Ground Ordering Information Part Number Description Truth Table (Positive Logic) LED ON OFF V O LOW HIGH -H -S -STR 8 pin DIP, (50/Tube) 0.40 (10.16mm) Lead Spacing (VDE0884) 8 pin SMD, (50/Tube) 8 pin SMD, Tape and Reel (1000/Reel) ** A 0.1μF bypass Capacitor must be connected between pins 5 & 8 (GND & V CC ) NOTE: Suffixes listed above are not included in marking on device for part number identification Page # 1 /H/S/TR

Electrical Characteristics, T A = 25 C (unless otherwise specified) Parameter Symbol Min. Typ. Max. Units Test Conditions Input Specifications LED Forward Voltage V F - 1.4 1.7 V I F = 16mA LED Reverse Voltage BV R 5 - - V I R = 10μA Detector Specifications Current Transfer Ratio 1 CTR 19 24 50 % I F =16mA, V CC =4.5V, V O =0.4V Logic Low Output Voltage V OL - 0.25 0.4 V I F =0mA, V O =V CC =4.5V, I O =3mA Logic High Output Current I OH - - 1 A I F =0mA, V O =V CC =5.5V Logic Low Supply Current 2 I CCL - 400 - A I F =16mA, V O =OPEN (V CC =15V) Logic High Supply Current 2 I CCH - - 1 A I F =0mA, V O =OPEN (V CC =15V) Offset Voltage Switching Specifications, T A = 0~70 C, V CC = 5V (unless otherwise specified) Propagation Delay Time to Low Output Level 3 t PHL - 0.1 0.8 S T A =25 C (R L =1.9K, I F =16mA) Propagation Delay Time to High Output Level 3 t PLH - 0.4 0.8 S T A =25 C (R L =1.9K, I F =16mA) Logic High Common Mode Transient Immunity 3 CM H 1 - - KV/ S I F =0mA, V CM =10V P-P, R L =1.9K Logic High Common Mode Transient Immunity 3 CM L 1 - - KV/ S I F =16mA, V CM =10V P-P, R L =1.9K Coupled Capacitance Contact Transient Ratio S S Isolation Specifications Input-Output Insulation Leakage Current I I-O - - 1.0 μa 45% RH, t=5s, V I-O =3kV Withstand Insulation Test Voltage V ISO 5000 - - V RMS RH 50%, t=1min Input-Output Resistance R I-O - 10 12 - V I-O = 500V DC Notes 1. Current Transfer Ratio (CTR) as a percentage is defined as the ratio of output collector current (I O ) to the forward LED input current (I F ) times 100 2. A 0.1µF or bigger bypass capacitor for V CC is needed as shown in Figure 1 on following page 3. The 1.9KΩ load represents 1TTL unit load of 1.6mA and the 5.6KΩ pull-up resistor. Page # 2 /H/S/TR

Electrical Test Circuits Figure 1: Single Channel Test Circuit for t PHL and t PLH Figure 2: Single Channel Test Circuit for Common Mode Transient Immunity Page # 3 /H/S/TR

Performance & Characteristics Plots, T A = 25 C, V CC =5V (unless otherwise specified) Figure 3: Output Current (I O ) vs. Output Voltage (V O ) Figure 4: Input Current (I F ) vs. Forward Voltage (V F ) Figure 5: Logic High Output Current (I OH ) vs. Temperature ( C) Figure 6: Current Transfer Ratio (CTR) vs. Input Current (I F ) I Figure 7: Current Transfer Ratio (CTR) vs. Temperature ( C) Figure 8: Small Signal Current Transfer Ratio ( O ) vs. I F Quiescent Input Current (I F ) [R L = 100) I O I F Page # 4 /H/S/TR

Performance & Characteristics Plots, T A = 25 C, V CC =5V (unless otherwise specified) Figure 9: Propagation Delay Time (t p ) vs. Temperature ( C) Figure 10: Load Resistance (R L ) vs. Propagation Delay Time (t p ) T PLH SDN135 T PLH T PHL T PHL SDN135 Page # 5 /H/S/TR

Solder Reflow Temperature Profile Recommendations (1) Infrared Reflow: Refer to the following figure as an example of an optimal temperature profile for single occurrence infrared reflow. Soldering process should not exceed temperature or time limits expressed herein. Surface temperature of device package should not exceed 250ºC: G F D B A E H C Figure 11 Process Step Description A Preheat Start Temperature (ºC) 150ºC B Preheat Finish Temperature (ºC) 180ºC C Preheat Time (s) 90-120s D Melting Temperature (ºC) 230ºC E Time above Melting Temperature (s) 30s F Peak Temperature, at Terminal (ºC) 260ºC G Dwell Time at Peak Temperature (s) 10s H Cool-down (ºC/s) <6ºC/s Parameter (2) Wave Solder: Maximum Temperature: 260ºC (at terminal) Maximum Time: 10s Pre-heating: 100-150ºC (30-90s) Single Occurrence (3) Hand Solder: Maximum Temperature: 350ºC (at tip of soldering iron) Maximum Time: 3s Single Occurrence Page # 6 /H/S/TR

Package Dimensions 8 PIN DIP Package Note: All dimensions in millimeters [mm] with inches in parenthesis () Page # 7 /H/S/TR

Package Dimensions 8 PIN WIDE Lead Space Package (-H) Note: All dimensions in millimeters [mm] with inches in parenthesis () Page # 8 /H/S/TR

Package Dimensions 8 PIN SMD Surface Mount Package (-S) Note: All dimensions in millimeters [mm] with inches in parenthesis () Page # 9 /H/S/TR

Packaging Specifications Tape & Reel Specifications (T&R) Note: All dimensions in millimeters [mm] with inches in parenthesis () Specification Symbol Dimensions, mm ( inches ) Tape Width W 16 0.3 ( 0.63 ) Sprocket Hole Pitch P0 4 0.1 ( 0.15 ) Compartment Location F P2 7.5 0.1 ( 0.295 ) 2 0.1 ( 0.079 ) Compartment Pitch P1 12 0.1 ( 0.472 ) Page # 10 /H/S/TR

DISCLAIMER Solid State Optronics (SSO) makes no warranties or representations with regards to the completeness and accuracy of this document. SSO reserves the right to make changes to product description, specifications at any time without further notices. SSO shall not assume any liability arising out of the application or use of any product or circuit described herein. Neither circuit patent licenses nor indemnity are expressed or implied. Except as specified in SSO s Standard Terms & Conditions, SSO disclaims liability for consequential or other damage, and we make no other warranty, expressed or implied, including merchantability and fitness for particular use. LIFE SUPPORT POLICY SSO does not authorize use of its devices in life support applications wherein failure or malfunction of a device may lead to personal injury or death. Users of SSO devices in life support applications assume all risks of such use and agree to indemnify SSO against any and all damages resulting from such use. Life support devices are defined as devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when used properly in accordance with instructions for use can be reasonably expected to result in significant injury to the user, or (d) a critical component of a life support device or system whose failure can be reasonably expected to cause failure of the life support device or system, or to affect its safety or effectiveness. Page # 11 /H/S/TR