Large area position-sensitive CVD diamond detectors for X-ray beam monitoring with extreme position resolution M. Pomorski, P. Bergonzo, Ch. Mer, M. Rebisz-Pomorska D. Tromson, N. Tranchant Diamond Sensors Laboratory, CEA LIST, France S.Hustache, K. Desjardins Synchrotron Soleil, France J. Morse ESRF, France J. Gruenert, Ch.Bressler, W. Gawelda European XFEL, Germany
Talk Outline Motivation/Goal Why Diamond? Detector Fabrication and Read-out Measurements and Results in-beam duo-lateral sccvd-psd pulse-mode XBPM @ MHz regime four-corner PSD - lab tests Summary and Outlook 1/78
X-ray Synchrotron Beam Monitoring Motivation/Goal Development of novel solid-state PSDs for x-ray beam monitoring including: a hodoscope for EU XFEL commissioning (and normal operation?) beam tracking within ~700m (pulse-mode, 4mm 2, σ 7µm) EU XFEL (Jan Gruenert talk 1st CARAT workshop) 2/15
Why Diamond? Physical Properties transmission 1.0 0.8 0.6 0.4 0.2 0.0 transparency 1 10 diamond 40 microns Si 40 microns Si 5 microns diamond 3 microns X-ray energy [kev] induced signal [a.u.] 1.2 1.0 0.8 0.6 0.4 0.2 0.0 40 µm Diam ~ 5 µm Si fast response sccvd-psd, 3x3x0.04 10pF, 1kΩ Si-PSD, 3x3x0.005 mm 166pF,1kΩ 0 1000 2000 3000 time [ns] equivalent (absorption) diamond and Si PSDs heat conductivity, radiation hardness, solar-blind, no dark-current, compact device 3/15
CVD Diamond Radiation (Particles) Detectors Basics diamond position sensitive detectors for X-ray beam monitoring pixel, strip large sensitive area beam position and profile quadrant fast only 4 channels resistive electrode large sensitive area only 4 channels sophisticated electronic pixel size limits position resolution small active area beam size dependence speed limited by RC 4/15
Detector Fabrication duo-lateral PSD four-corner PSD metal collecting electrodes metal collecting electrodes DLC resistive layer DLC resistive layer intr. diamond slab intr. diamond slab DLC resistive layer metal collecting electrode metal collecting electrodes diamond material: electronic grade sccvd DLC resistive layer: PVD, R from 1kOhm to few MOHms metal collecting electrodes: PVD, Al or CrAu, photolithogr. 5/15
Duo-lateral PSD: Read-out Electronics X-ray beam DAQ DAQ DAQ DAQ position coordinates from signal division (reconstucted position) σ pos ~ L*σ ele /I0 ( slope.. similar to timing) DC mode (10Hz) Keithley electrometers ; pulse mode FEMTO ampl. (200MHz) 6/15
Duo-lateral PSD: Experimental Environment masurement setup @ ID06 ESRF sccvd Si y x measurement setup@µxas SLS sccvd X-ray beam y x X-ray beam ESRF, Grenoble FR, ID06 Beam energy: 10.5 kev Beam size: 100 x 100 µm (slits limited) Beam flux: 1.6 x 10 11 ph/sec Flux absorbed = 1.56 x 10 8 ph/sec/µm sccvd XBIC ~ 0.5 µa DC DC Soleil, Gif-sur-Yvette FR, Proxima1 & SIXS Beam energy: 12.6 kev & 5.6 kev Beam size: 300 x 300 µm (slits limited) Beam flux: 2.3 x 10 12 ph/sec Flux absorbed = 4.6 x 10 8 ph/sec/µm sccvd XBIC ~ 10 µa DC DC Swiss Light Source, Villigen CH, µxas Beam energy: 7.05 kev Beam size: 50 µm FWHM Beam flux: 4.8 x 10 12 ph/sec Flux absorbed = 10 3 ph/pulse sccvd XBIC ~ 19 µa DC pulse 7/15
XBIC (normalized to beam decay) [a.u.] 0.008 0.000-0.008 In-beam Performance: Beam Intensity Monitoring (DC mode) Beam intensity monitoring @ ID06 ESRF (X1+X2 and Y1+Y2 ) sccvd-psd 40 µm -50-25 0 25 50 bias voltage [V] 0.0 0 17 33 50 67 83 100 117 Beam intensity monitoring @ Proxima 1 Soleil (X1+X2) sccvd-psd 300 µm current [A] 10-7 10-8 10-9 10-10 10-11 10-12 10-13 beam intensity [normalised] -100-50 0 50 100 8/15 stable non-injecting 100% CCE with E avg ~13eV/e-h XTIC dark current bias voltage [V] 1.0 0.8 0.6 0.4 0.2 0.822 0.816 0.810 X1+X2 - X plane Y1+Y2 - Y plane Si photodiode XBIC X1+X2 [µa] 21,340 21,335 21,330 21,325 21,320 21,315 21,310 21,305 time [min] refill beam intensity variation ~0.6 % 0 500 1000 1500 2000 2500 3000 measurement point 0,738 0,737 0,736 0,735 0,734 0,733 0,732 beam intensity [normalized] 0.5% 1,00 0,99 0,98 0,97 0,003 0,002 0,001 0,000
In-beam Performance: Reconstructed Position Pattern and Linearity 40 µm sccvd-psd cartography (ESRF ID06) 1,0 fine raster scan with 25 µm step (80x80 points) 450µm local linearity 70 60 50 FWHM=1,15 µm FWHM=0,51 µm Calculated vertical distance from centre (mm) 0,5 0,0-0,5-1,0-1,0-0,5 0,0 0,5 1,0 Calculated horizontal distance from centre (mm) 30 (µm) 20 10 Counts 2D beam tracking 40 30 20 10 with beam stabilization 0-2,0-1,5-1,0-0,5 0,0 0,5 1,0 1,5 2,0 no beam-stabilization residuals [µm] deviation from linear fits in the probed region plane X σ L 0.1% plane Y σ L 0.25% step motors crash (during the second scan): 0 integral absorbed dose ~0.3 Giga Gy no radiation damage signs -10-10 0 10 20 30 (µm) 9/15
In-beam Performance: Position resolution (DC mode) Counts X beam position [µm] 20 kωsq. sccvd-psd 40 µm, S/N ~10 4, active area 2 x 2 mm 2, ESRF ID06 80 60 40 20 34 32 30 28 26 0 33 67 100 time [min] 0-1.0-0.5 0.0 0.5 1.0 residuals [µm] 44 42 40 38 beam position Y [µm] σ y 258 nm Counts 1 MΩsq. sccvd-psd 300 µm, S/N ~10 5, active area 2.5 x 2.5 mm 2, Soleil Proxima1 15 min. beam position X [µm] 120 100 80 60 40 20 0,50 0,25 0,00-0,25-0,50 0 1000 2000 3000 4000 measurement point 0-1.0-0.5 0.0 0.5 1.0 residuals [µm] σ 27 nm 10/15
In-beam Performance: Long Term Stability @ ESRF ID06 40 µm sccvd-psd permanently mounted at the ID06, vacuum 10-7 mbar beam drift measurement with sccvd-psd and IC-PSD after few months in the X-ray beam I0 X IC-PSD 30µm Y sccvd-psd Y IC+scCVD PSDs 11/15 no feed-back data here courtesy: Thomas Roth and Carsten Detlefs ID06, ESRF
In-beam Performance: Pulse-mode XBPM @ MHz Regime PRELIMINARY 1kΩsq. lateral 1D sccvd-psd 400µm, active area 1.4 x 2 mm 2 test @ SLS to understand applicability range of diamond detectors for XBPM @ EU XFEL irradiation geometry L electrode collimator induced signal [V] beam time structure with sccvd-psd 0.00-0.08-0.16-0.24 pulse train cam shaft 20 ns pulse train signal amplitude [a.u]] 7 6 5 4 3 2 1 detector's active area ~1.4 mm refill right electrode left electrode I0 collimator cut 0 3,0 3,5 4,0 4,5 5,0 X motor displacement [mm] 12/15 beam scan R electrode reconstucted position [a.u.] 1.00 0.75 0.50 0.25 0.00-0.25-0.50-0.75 σ L ~0.2% central area detector's active area ~1.4 mm center of the device 100 200 300 400 500 time [ns] collimator cut σ~2µm -1.00 3.0 3.5 4.0 4.5 5.0 X motor displacement [mm]
Four-corner PSD: preliminary lab tests irradiation throught a metal mesh -1,0 1,0-0,5 0,5 0,0 0,0 Y[L] Y [L] full area irradiation 0,5 1,0 1,0-0,5 0,5 0,0-0,5-1,0 X [L] -1,0-1,0-0,5 0,0 X[L] 0,5 1,0 0,3 241Am α-particles injection ~ 4MeV (50 fc) (measurement in air) 0,0 Pulse mode with, fast CSA (Mircea Ciobanu), 200ns integration time -0,3-0,3 13/15 0,0 0,3 Michal Pomorski, Diamond Sensors Laboratory, 2nd CARAT workshop@gsi, Darmstadt, 14/12/2010
Summary A novel type of PSD based on sccvd diamond and DLC resistive electrodes has been built and tested for XBPM at synchrotrons: semitransparent in-beam detector, stable and reliable operation absolute beam intensity monitoring with a precision of ~0.1% sub-micron position resolution (reaching 27 nm σ) very good (<<1%) linearity up to 4x4 mm 2 active area pulse-mode operation within 20ns integration time demonstrated (can be used also as a single particle PSD) 14/15
Future Work to build and test more prototypes long term stability tests detector performance evaluation in function of the bandwidth tests in extreme conditions: white beams, XFEL ultra-thin sccvd-psd for low energy (<3keV) lines tetra-lateral approach + resistive lateral lines boron doped CVD diamond layer (PIM structure) dedicated electronics missing Thank you for your attention! 15/15