Silicon PIN Photodiode, RoHS Compliant, Released for Lead (Pb)-free Solder Process, AEC-Q101 Released

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TEMD511X1 Silicon PIN Photodiode, RoHS Compliant, Released for Lead (Pb)-free Solder Process, AEC-Q11 Released Description TEMD511X1 is a high speed and high sensitive PIN photodiode. It is a miniature Surface Mount Device (SMD) including the chip with a 7.5 mm 2 sensitive area and an infrared bandpass filter matched to IR Emitters operating at wavelength 87 nm or 95 nm. 2535 Features Product designed and qualified acc. AEC-Q11 for the automotive market Large radiant sensitive area: A = 7.5 mm 2 e4 Wide angle of half sensitivity ϕ = ± 65 High photo sensitivity Fast response times Small junction capacitance Plastic package with IR filter: λ = 87...95 nm Floor life: 72 h, MSL 4, acc. J-STD-2 Lead (Pb)-free component Component in accordance to ELV 2/53/EC, RoHS 22/95/EC and WEEE 22/96/EC Applications Automotive sensors Infrared detectors High speed photo detectors Absolute Maximum Ratings T amb = 25 C, unless otherwise specified Parameter Test condition Symbol Value Unit Reverse voltage V R 6 V Power dissipation T amb 25 C P V 215 mw Junction temperature T j C Operating temperature range T amb - 4 to + C Storage temperature range T stg - 4 to + C Soldering temperature In accordance with fig. 8 T sd 26 C Thermal resistance junction/ ambient R thja 35 K/W 1

I - Relative Reverse Light Current ra rel TEMD511X1 Electrical Characteristics T amb = 25 C, unless otherwise specified Parameter Test condition Symbol Min Typ. Max Unit Forward voltage I F = 5 ma V F 1 1.3 V Breakdown voltage I R = µa, E = V (BR) 6 V Reverse dark current V R = 1 V, E = I ro 2 3 na Diode capacitance V R = V, f = 1 MHz, E = C D 7 pf V R = 3 V, f = 1 MHz, E = C D 25 4 pf Optical Characteristics T amb = 25 C, unless otherwise specified Parameter Test condition Symbol Min Typ. Max Unit Open circuit voltage E e = 1 mw/cm 2, λ = 95 nm V o 35 mv Temperature coefficient of V o E e = 1 mw/cm 2, λ = 95 nm TK Vo - 2.6 mv/k Short circuit current E e = 1 mw/cm 2, λ = 95 nm I k 5 µa Temperature coefficient of I k E e = 1 mw/cm 2, λ = 95 nm TK Ik.1 %/K Reverse light current E e = 1 mw/cm 2, λ = 95 nm, V R = 5 V I ra 45 55 µa Angle of half sensitivity ϕ ± 65 deg Wavelength of peak sensitivity λ p 94 nm Range of spectral bandwidth λ.5 79 to 15 nm Noise equivalent power V R = 1 V, λ = 95 nm NEP 4 x 1-14 W/ Hz Rise time V R = 1 V, R L = 1 kω, λ = 82 nm t r ns Fall time V R = 1 V, R L = 1 kω, λ = 82 nm t f ns Typical Characteristics T amb = 25 C, unless otherwise specified 1.4 1.2 V R =5V λ = 95 nm 1. 1.8 I ro - Reverse Dark Current (na) V R = 1 V 1 2 4 6 8.6 2 4 6 8 94 843 T amb - Ambient Temperature ( C) 94 849 T amb - Ambient Temperature ( C) Figure 1. Reverse Dark Current vs. Ambient Temperature Figure 2. Relative Reverse Light Current vs. Ambient Temperature 2

TEMD511X1 I ra - Reverse Light Current (μa) 12787 1 1.1.1.1 1 V R =5V λ= 95 nm E e - Irradiance (mw/cm 2) Figure 3. Reverse Light Current vs. Irradiance 1 S(λ) rel - Relative Spectral Sensivity 1.2 1..8.6.4.2. 75 85 95 15 115 94 8426 λ - Wavelength (nm) Figure 6. Relative Spectral Sensitivity vs. Wavelength I ra - Reverse Light Current (μa) 12788 1 1mW/cm 2.5mW/cm 2.2 mw/cm 2.1 mw/cm 2.5 mw/cm 2 λ = 95 nm 1.1 1 1 V R - Reverse Voltage (V) S rel - Relative Sensitivity 94 846 1..9.8.7.6 1 2 3 4 5 6 7 8.4.2.2.4.6 Figure 4. Reverse Light Current vs. Reverse Voltage Figure 7. Relative Radiant Sensitivity vs. Angular Displacement 8 C D - Diode Capacitance (pf) 6 4 2 E = f = 1 MHz.1 1 1 94847 V R - Reverse Voltage (V) Figure 5. Diode Capacitance vs. Reverse Voltage 3

TEMD511X1 Package Dimensions in millimeters Drawing-No.: 6.541-56.1-4 Issue: 2; 26.4.7 2536 Not indicated tolerances ±.1 Minimum order quantity (MOQ): 15 pcs (1 reel) 4

TEMD511X1 Taping Dimensions in millimeters 2537 5

TEMD511X1 Reflow Solder Profiles Temperature ( C) 28 26 24 22 2 18 16 14 12 8 6 4 2 193 125 C 3 6 Preheat Reflow Cooling 9 26 C 25 C 21 C 145 C ~ 3 s 12 s ~ 4 s 12 15 18 Time (s) 21 ~ 2 s 24 27 3 Drypack Devices are packed in moisture barrier bags (MBB) to prevent the products from moisture absorption during transportation and storage. Each bag contains a desiccant. Floor Life Floor life (time between soldering and removing from MBB) must not exceed the time indicated in J-STD-2. TEMD511 is released for: Moisture Sensitivity Level 4, according to JEDEC, J-STD-2 Floor Life: 72 h Conditions: T amb < 3 C, RH < 6 % Figure 8. Lead (Pb)-free (Sn) Reflow Solder Profile 948625 3 max. 24 C ca. 23 C 1 s 25 Drying In case of moisture absorption devices should be baked before soldering. Conditions see J-STD-2 or Label. Devices taped on reel dry using recommended conditions 192 h at 4 C (+ 5 C), RH < 5 % or 96 h at 6 C (+ 5 C), RH < 5 %. Temperature ( C) 2 15 5 2 K/s - 4 K/s 5 215 C max. 16 C 9 s - 12 s 15 Time (s) max 4s Lead Temperature full line: typical dotted: process limits 2 25 Figure 9. Lead Tin (SnPb) Reflow Solder Profile 6

Ozone Depleting Substances Policy Statement It is the policy of Vishay Semiconductor GmbH to TEMD511X1 1. Meet all present and future national and international statutory requirements. 2. Regularly and continuously improve the performance of our products, processes, distribution and operating systems with respect to their impact on the health and safety of our employees and the public, as well as their impact on the environment. It is particular concern to control or eliminate releases of those substances into the atmosphere which are known as ozone depleting substances (ODSs). The Montreal Protocol (1987) and its London Amendments (199) intend to severely restrict the use of ODSs and forbid their use within the next ten years. Various national and international initiatives are pressing for an earlier ban on these substances. Vishay Semiconductor GmbH has been able to use its policy of continuous improvements to eliminate the use of ODSs listed in the following documents. 1. Annex A, B and list of transitional substances of the Montreal Protocol and the London Amendments respectively 2. Class I and II ozone depleting substances in the Clean Air Act Amendments of 199 by the Environmental Protection Agency (EPA) in the USA 3. Council Decision 88/54/EEC and 91/69/EEC Annex A, B and C (transitional substances) respectively. Vishay Semiconductor GmbH can certify that our semiconductors are not manufactured with ozone depleting substances and do not contain such substances. We reserve the right to make changes to improve technical design and may do so without further notice. Parameters can vary in different applications. All operating parameters must be validated for each customer application by the customer. Should the buyer use products for any unintended or unauthorized application, the buyer shall indemnify against all claims, costs, damages, and expenses, arising out of, directly or indirectly, any claim of personal damage, injury or death associated with such unintended or unauthorized use. Vishay Semiconductor GmbH, P.O.B. 3535, D-7425 Heilbronn, Germany 7

Notice Legal Disclaimer Notice Vishay Specifications of the products displayed herein are subject to change without notice. Vishay Intertechnology, Inc., or anyone on its behalf, assumes no responsibility or liability for any errors or inaccuracies. Information contained herein is intended to provide a product description only. No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted by this document. Except as provided in Vishay's terms and conditions of sale for such products, Vishay assumes no liability whatsoever, and disclaims any express or implied warranty, relating to sale and/or use of Vishay products including liability or warranties relating to fitness for a particular purpose, merchantability, or infringement of any patent, copyright, or other intellectual property right. The products shown herein are not designed for use in medical, life-saving, or life-sustaining applications. Customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Vishay for any damages resulting from such improper use or sale. Document Number: 9 Revision: 8-Apr-5 1