MTM761110LBF MTM761110LBF. Silicon P-channel MOSFET. for Switching. Internal Connection. Pin name

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Transcription:

MTM76111LBF Silicon P-channel MOSFET for Switching MTM76111LBF Unit: mm Features Low drain-source ON resistance:rds(on) typ = 26 mω (VGS = -4.5 V) Low drive voltage: 1.8 V drive Halogen-free / RoHS compliant (EU RoHS / UL-94 V- / MSL:Level 1 compliant) Marking Symbol: GS Packaging MTM76111LBF Embossed type (Thermo-compression sealing): 3 pcs / reel (standard) 1. Drain 4. Source 2. Drain 5. Drain 3. Gate 6. Drain Panasonic JEITA Code WSMini6-F1-B SC13DA Absolute Maximum Ratings Ta = 25 C Parameter Symbol Rating Unit Drain-source Voltage VDS 2 V Gate-source Voltage VGS ±8 V Drain current ID -4. A Drain Current (Pulsed) IDp -2 A Total Power Dissipation *1 PD 7 mw Channel Temperature Tch 15 C Storage Temperature Range Tstg -55 to +15 C Note *1 Measuring on ceramic substrate at 4 mm 38 mm.2 mm Absolute maximum rating without heat sink for PD is 15 mw. Internal Connection 6 5 4 1 2 3 Pin name 1. Drain 4. Source 2. Drain 5. Drain 3. Gate 6. Drain Publication date: October 212 1

MTM76111LBF Electrical Characteristics Ta = 25 C ± 3 C Parameter Symbol Conditions Min Typ Max Unit Drain-source Breakdown Voltage VDSS ID = ma, VGS = V 2 V Zero Gate Voltage Drain Current IDSS VDS = V, VGS = V -.1 μa Gate-source Leakage Current IGSS VGS = ±8 V, VDS = V ± 1 μa Gate-source Threshold Voltage Vth ID =. ma, VDS = -6. V -.3 -.65. V RDS(on)1 ID =. A, VGS = -4.5 V 26 34 Drain-source On-state Resistance RDS(on)2 ID = -.5 A, VGS = -2.5 V 3 41 mω RDS(on)3 ID = -.5 A, VGS =.8 V 36 54 Forward transfer admittance Yfs ID =. A, VDS = V 4. S Input Capacitance Ciss 1 4 pf Output Capacitance Coss VDS = V, VGS = V, f = 1 MHz 135 pf Reverse Transfer Capacitance Crss 15 pf Turn-on Delay Time *1 td(on) VDD = -6 V, VGS = to -4 V 9 ns Rise time *1 tr ID =. A 11 ns Turn-off Delay Time *1 td(off) VDD = -6 V, VGS = -4 to V 27 ns Fall time *1 tf ID =. A 16 ns Note Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 73 Measuring methods for transistors. *1 See test circuit 2

MTM76111LBF *1 Test circuit VDD = -6 V ID = A RL = 1 Ω V -4 V PW = 1 μs D.C. 1 % 5 Ω ton toff 3

MTM76111LBF -4 -.1 Drain current ID (A) -3-2 -4.5 V -2.5 V -2. V.5 V VGS =. V Drain Current ID (A) -.8 -.6 -.4 -.2 Ta = 85 C 25 C -3 C -.1 -.2 -.3 -.4 -.5 -.2 -.4 -.6 -.8 Gate-source Voltage VGS (V) ID - VDS ID - VGS -.2 1 -.1 -.5 A ID = -2. A. A Drain source On-state Resistance RDS (on) (mω) -2.5 V.8 V VGS = -4.5 V 1-2 -3-4 -5 -.1 Gate-source voltage VGS (V) Drain current ID (A) VDS - VGS RDS(on) - ID 1-6 Capacitance C (pf) 1 1 Ciss Coss Crss Gate-source Voltage VGS (V) -5-4 -3-2 VDD = -6 V 1 -.1 Capacitance - VDS 5 1 15 2 Total Gate Charge Qg (nc) Dynamic Input/Output Characteristics 4

MTM76111LBF Gate-source Threshold Voltage Vth (V) -.9 -.5 -.1-5 5 1 15 Temperature Ta ( C) Drain-source On-state Resistance RDS(on) (mω) 6.8 V -2.5 V 4 VGS = -4.5 V 2-5 5 1 15 2 Temperature Ta ( C) 1 Vth - Ta RDS(on) - Ta Total Power Dissipation PD (W).8.6.4.2 Mounted on ceramic board (4 38.2 mm) Non-heat sink 5 1 15 Temperature Ta ( C) PD - Ta Thermal Resistance Rth ( C/W) 1 1 1.1 1 1 1 1 Pulse Width tsw (s) Rth -tsw Drain Current ID (A) -.1 -.1 IDp = -2 A Operation in this area is limited by RDS(on) Ta = 25 C, Glass epoxy board (25.4 25.4 t.8 mm) coated with copper foil, which has more than 3 mm 2. -.1 -.1 Safe Operating Area 1 ms 1 ms 1 ms 1 s DC 5

WSMini6-F1-B Unit: mm MTM76111LBF Land Pattern (Reference) (Unit: mm) 6

2122 Request for your special attention and precautions in using the technical information and semiconductors described in this book (1) If any of the products or technical information described in this book is to be exported or provided to non-residents, the laws and regulations of the exporting country, especially, those with regard to security export control, must be observed. (2) The technical information described in this book is intended only to show the main characteristics and application circuit examples of the products. No license is granted in and to any intellectual property right or other right owned by Panasonic Corporation or any other company. Therefore, no responsibility is assumed by our company as to the infringement upon any such right owned by any other company which may arise as a result of the use of technical information described in this book. (3) The products described in this book are intended to be used for general applications (such as office equipment, communications equipment, measuring instruments and household appliances), or for specific applications as expressly stated in this book. Consult our sales staff in advance for information on the following applications: Special applications (such as for airplanes, aerospace, automotive equipment, traffic signaling equipment, combustion equipment, life support systems and safety devices) in which exceptional quality and reliability are required, or if the failure or malfunction of the products may directly jeopardize life or harm the human body. It is to be understood that our company shall not be held responsible for any damage incurred as a result of or in connection with your using the products described in this book for any special application, unless our company agrees to your using the products in this book for any special application. (4) The products and product specifications described in this book are subject to change without notice for modification and/or improvement. At the final stage of your design, purchasing, or use of the products, therefore, ask for the most up-to-date Product Standards in advance to make sure that the latest specifications satisfy your requirements. (5) When designing your equipment, comply with the range of absolute maximum rating and the guaranteed operating conditions (operating power supply voltage and operating environment etc.). Especially, please be careful not to exceed the range of absolute maximum rating on the transient state, such as power-on, power-off and mode-switching. Otherwise, we will not be liable for any defect which may arise later in your equipment. Even when the products are used within the guaranteed values, take into the consideration of incidence of break down and failure mode, possible to occur to semiconductor products. Measures on the systems such as redundant design, arresting the spread of fire or preventing glitch are recommended in order to prevent physical injury, fire, social damages, for example, by using the products. (6) Comply with the instructions for use in order to prevent breakdown and characteristics change due to external factors (ESD, EOS, thermal stress and mechanical stress) at the time of handling, mounting or at customer's process. When using products for which damp-proof packing is required, satisfy the conditions, such as shelf life and the elapsed time since first opening the packages. (7) This book may be not reprinted or reproduced whether wholly or partially, without the prior written permission of our company.