PD-93754G RADIATION HARDENED POWER MOSFET SURFACE MOUNT (SMD-.5) Product Summary Part Number Radiation Level RDS(on) ID QPL Part Number IRHNJ573 K Rads (Si).6Ω 22A* JANSR2N748U3 IRHNJ533 3K Rads (Si).6Ω 22A* JANSF2N748U3 IRHNJ543 5K Rads (Si).6Ω 22A* JANSG2N748U3 IRHNJ583 K Rads(Si).75Ω 22A* JANSH2N748U3 International Rectifier s R5 TM technology provides high performance power MOSFETs for space applications.these devices have been characterized for Single Event Effects (SEE) with useful performance up to an LET of 8 (MeV/(mg/cm 2 )). The combination of low RDS(on) and low gate charge reduces the power losses in switching applications such as DC to DC converters and motor control. These devices retain all of the well established advantages of MOSFETs such as voltage control, fast switching, ease of paralleling and temperature stability of electrical parameters. Absolute Maximum Ratings Parameter ID @ VGS = 2V, TC = 25 C Continuous Drain Current 22* ID @ VGS = 2V, TC = C Continuous Drain Current 6 IDM Pulsed Drain Current À 88 IRHNJ573 JANSR2N748U3 V, N-CHANNEL REF: MIL-PRF-95/73 Units PD @ TC = 25 C Max. Power Dissipation 75 W Linear Derating Factor.6 W/ C VGS Gate-to-Source Voltage ±2 V EAS Single Pulse Avalanche Energy Á 7 mj IAR Avalanche Current À 22 A EAR Repetitive Avalanche Energy À 7.5 mj dv/dt Peak Diode Recovery dv/dt Â.4 V/ns TJ Operating Junction -55 to 5 TSTG Storage Temperature Range Pckg. Mounting Surface Temp. 3 (for 5s) C Weight. (Typical) g * Current is limited by package For footnotes refer to the last page 5 TECHNOLOGY SMD-.5 Features: n Single Event Effect (SEE) Hardened n Ultra Low RDS(on) n Low Total Gate Charge n Simple Drive Requirements n Ease of Paralleling n Hermetically Sealed n Surface Mount n Ceramic Package n Light Weight www.irf.com A /27/
IRHNJ573, JANSR2N748U3 Electrical Characteristics @ Tj = 25 C (Unless Otherwise Specified) Parameter Min Typ Max Units Test Conditions BVDSS Drain-to-Source Breakdown Voltage V VGS = V, ID =.ma BVDSS/ TJ Temperature Coefficient of Breakdown. V/ C Reference to 25 C, ID =.ma Voltage RDS(on) Static Drain-to-Source On-State.6 Ω VGS = 2V, ID = 6A Resistance à VGS(th) Gate Threshold Voltage 2. 4. V VDS = VGS, ID =.ma gfs Forward Transconductance 3 S VDS 5V, IDS = 6A à IDSS Zero Gate Voltage Drain Current VDS= 8V,VGS = V µa 25 VDS = 8V, VGS = V, TJ = 25 C IGSS Gate-to-Source Leakage Forward VGS = 2V na IGSS Gate-to-Source Leakage Reverse - VGS = -2V Qg Total Gate Charge 5 VGS =2V, ID = 22A Qgs Gate-to-Source Charge 7.4 nc VDS = 5V Qgd Gate-to-Drain ( Miller ) Charge 2 td(on) Turn-On Delay Time 25 VDD = 5V, ID = 22A, tr Rise Time VGS =2V, RG = 7.5Ω ns td(off) Turn-Off Delay Time 35 tf Fall Time 3 LS + LD Total Inductance 4. nh Measured from the center of drain pad to center of source pad Ciss Input Capacitance 5 VGS = V, VDS = 25V Coss Output Capacitance 365 pf f =.MHz Crss Reverse Transfer Capacitance 5 Source-Drain Diode Ratings and Characteristics Parameter Min Typ Max Units Test Conditions IS Continuous Source Current (Body Diode) 22* ISM Pulse Source Current (Body Diode) À 88 A VSD Diode Forward Voltage.2 V Tj = 25 C, IS = 22A, VGS = V à trr Reverse Recovery Time 25 ns Tj = 25 C, IF = 22A, di/dt A/µs QRR Reverse Recovery Charge 85 nc VDD 25V à ton Forward Turn-On Time Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by LS + LD. * Current is limited by package Thermal Resistance Parameter Min Typ Max Units Test Conditions RthJC Junction-to-Case.67 C/W RthJ-PCB Junction-to-PC board 6.9 soldered to a 2 square copper-clad board Note: Corresponding Spice and Saber models are available on International Rectifier Web site. For footnotes refer to the last page 2 www.irf.com
Radiation Characteristics IRHNJ573, JANSR2N748U3 International Rectifier Radiation Hardened MOSFETs are tested to verify their radiation hardness capability. The hardness assurance program at International Rectifier is comprised of two radiation environments. Every manufacturing lot is tested for total ionizing dose (per notes 5 and 6) using the TO-3 package. Both pre- and post-irradiation performance are tested and specified using the same drive circuitry and test conditions in order to provide a direct comparison. Table. Electrical Characteristics @ Tj = 25 C, Post Total Dose Irradiation ÄÅ Parameter Up to 5K Rads(Si) K Rads (Si) 2 Units Test Conditions Min Max Min Max BV DSS Drain-to-Source Breakdown Voltage V V GS = V, I D =.ma VGS(th) Gate Threshold Voltage 2. 4..5 4. VGS = V DS, I D =.ma I GSS Gate-to-Source Leakage Forward na V GS = 2V I GSS Gate-to-Source Leakage Reverse - - V GS = -2 V I DSS Zero Gate Voltage Drain Current 25 µa V DS = 8V, V GS = V R DS(on) Static Drain-to-Source Ã.64.8 Ω VGS = 2V, I D =6A On-State Resistance (TO-3) R DS(on) Static Drain-to-Source Ã.6.75 Ω VGS = 2V, I D =6A On-State Resistance (SMD-.5) V SD Diode Forward Voltage Ã.2.2 V V GS = V, IS = 22A. Part numbers IRHNJ573 (JANSR2N748U3), IRHNJ533 (JANSF2N748U3) and IRHNJ543 (JANSG2N748U3) 2. Part number IRHNJ583 (JANSH2N748U3) International Rectifier radiation hardened MOSFETs have been characterized in heavy ion environment for Single Event Effects (SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2. Table 2. Typical Single Event Effect Safe Operating Area LET Energy Range VDS (V) (MeV/(mg/cm 2 )) (MeV) (µm) @VGS = @VGS = @VGS = @VGS = @VGS = V -5V -V -5V -2V 38 ± 5% 3 ± 7.5% 38 ± 7.5% 6 ± 5% 33 ± 7.5% 3 ± % 35 25 84 ± 5% 35 ± % 28 ± 7.5% 8 25 - Bias VDS (V) 2 8 6 4 2-5 - Bias VGS (V) -5-2 LET=38 ± 5% LET=6 ± 5% LET=84 ± 5% For footnotes refer to the last page Fig a. Typical Single Event Effect, Safe Operating Area www.irf.com 3
IRHNJ573, JANSR2N748U3 I D, Drain-to-Source Current (A) VGS TOP 5V 2V V 9.V 8.V 7.V 6.V BOTTOM 5.V 5.V I D, Drain-to-Source Current (A) VGS TOP 5V 2V V 9.V 8.V 7.V 6.V BOTTOM 5.V 5.V 2µs PULSE WIDTH T J = 25 C. V DS, Drain-to-Source Voltage (V) 2µs PULSE WIDTH T J = 5 C. V DS, Drain-to-Source Voltage (V) Fig. Typical Output Characteristics Fig 2. Typical Output Characteristics I D, Drain-to-Source Current (A) T J = 25 C T = 5 J C V DS= 5 5V 2µs PULSE WIDTH 5. 6. 7. 8. 9.. V GS, Gate-to-Source Voltage (V) R DS(on), Drain-to-Source On Resistance (Normalized) 2.5 I D = 22A 2..5..5 V GS= 2V. -6-4 -2 2 4 6 8 2 4 6 T J, Junction Temperature ( C) Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance Vs. Temperature 4 www.irf.com
I D, Drain-to-Source Current (A) IRHNJ573, JANSR2N748U3 C, Capacitance (pf) 2 VGS = V, f = MHz Ciss = Cgs + Cgd, C ds SHORTED Crss = Cgd 6 Coss = Cds + Cgd 2 C iss 8 C oss 4 C rss V DS, Drain-to-Source Voltage (V) V GS, Gate-to-Source Voltage (V) 2 5 5 I = D 22A V DS = 8V V DS = 5V V DS = 2V FOR TEST CIRCUIT SEE FIGURE 3 2 3 4 5 Q G, Total Gate Charge (nc) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage I SD, Reverse Drain Current (A) T J = 5 C T J = 25 C V GS = V..4.6.8..2 V SD,Source-to-Drain Voltage (V). Tc = 25 C Tj = 5 C Single Pulse OPERATION IN THIS AREA LIMITED BY R DS (on) µs ms ms DC V DS, Drain-to-Source Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage Fig 8. Maximum Safe Operating Area www.irf.com 5
IRHNJ573, JANSR2N748U3 3 LIMITED BY PACKAGE V DS R D I D, Drain Current (A) 25 2 5 R G V GS V GS Pulse Width µs Duty Factor. % D.U.T. Fig a. Switching Time Test Circuit + - V DD 5 V DS 9% 25 5 75 25 5 T C, Case Temperature ( C) Fig 9. Maximum Drain Current Vs. Case Temperature % V GS t d(on) t r t d(off) t f Fig b. Switching Time Waveforms Thermal Response (Z thjc ). D =.5.2..5.2. SINGLE PULSE (THERMAL RESPONSE) Notes:. Duty factor D = t / t 2. 2. Peak T J= P DM x Z thjc + TC..... t, Rectangular Pulse Duration (sec) PDM t t2 Fig. Maximum Effective Transient Thermal Impedance, Junction-to-Case 6 www.irf.com
IRHNJ573, JANSR2N748U3 V DS R G 2V V GS I AS tp.ω 5V L DRIVER Fig 2a. Unclamped Inductive Test Circuit V (BR)DSS tp. D.U.T + - V DD A E AS, Single Pulse Avalanche Energy (mj) 2 9 6 3 TOP BOTTOM I D 9.8A 4A 22A 25 5 75 25 5 Starting T, Junction Temperature ( J C) Fig 2c. Maximum Avalanche Energy Vs. Drain Current I AS Fig 2b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. 5KΩ Q G 2V.2µF.3µF 2 V Q GS Q GD D.U.T. + V - DS V G V GS 3mA Charge I G I D Current Sampling Resistors Fig 3a. Basic Gate Charge Waveform Fig 3b. Gate Charge Test Circuit www.irf.com 7
IRHNJ573, JANSR2N748U3 Footnotes: À Repetitive Rating; Pulse width limited by maximum junction temperature. Á VDD = 5V, starting TJ = 25 C, L=.3 mh Peak IL = 22A, VGS = 2V Â ISD 22A, di/dt 55A/µs, VDD V, TJ 5 C Ã Pulse width 3 µs; Duty Cycle 2% Ä Total Dose Irradiation with VGS Bias. 2 volt VGS applied and VDS = during irradiation per MIL-STD-75, method 9, condition A. Å Total Dose Irradiation with VDS Bias. 8 volt VDS applied and VGS = during irradiation per MlL-STD-75, method 9, condition A. Case Outline and Dimensions SMD-.5 IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 9245, USA Tel: (3) 252-75 IR LEOMINSTER : 25 Crawford St., Leominster, Massachusetts 453, USA Tel: (978) 534-5776 TAC Fax: (3) 252-793 Visit us at www.irf.com for sales contact information. Data and specifications subject to change without notice. /2 8 www.irf.com