Practical measurements and IEC/EN 61-4-11 - rise and fall time during short-circuits at different places of a supply installation The relating standards: IEC/EN 61-4-11 IEC/EN 61-2-8 The part IEC/EN 61-4-11 of the international IEC/EN 61 series standards defines test methods for immunity testing and test levels for voltage drops, short interruptions and voltage variations. The standard is applicable for devices intended to be connected to the public low power distribution network. The generation of voltage drops the IEC/EN 61-4-11 specifies and requires a voltage source with a rise- and fall-time of 1-5µs at 1 load. At a nominal voltage of 23V this means: 23V eff /µs up to 46V eff /µs (=325V/µs up to 65V/µs). The basics about the arising, the effects, remedial actions measuring methods and measurement results of devices to be tested according to IEC/EN 61-4-11 are defined in the IEC/TR 61-2-8 Ed. 1.. The disturbances are described as phenomena Fig. 1: Equivalent circuit for voltage drops acc. to IEC/EN 61-2-8 appearing on public low voltage supply networks and having influence on devices connected to this public grid. This document shall demonstrate, that practically the riseand fall-times of the supply voltage are in the range of 15µs (as described in the IEC/EN 61-4-11 in the chapter A2: requirements of the voltage source). One of the main reasons for voltage dips and short interruptions on the public supply network are electric shortcircuits occurring on any point of the supplying grid. Output voltage at no load: ± 5% of the residual voltage value Voltage change with load at the output of the generator: 1% output, A to 16A 8% output, A to 2A 7% output, A to 23A 4% output, A to 4A Output current capability: 16Arms per phase at Urated. The generator must be able to deliver: Peak inrush current capability: Not to be limited by the generator 2A at 8% Urated.for 5s 23A at 7% Urated. for 3s 4A at 4% Urated. for 3s Max. 1A for 25-6V mains Max. 5A for 2-24V mains Max. 25A for 1-12V mains Generator loaded with 1 resistive load Between 1µs and 5µs Generator loaded with 1 resistive load Instantaneous peak overshoot/ undershoot of the actual voltage Voltage rise (and fall) time tr (and tf) during abrupt change Phase shifting: -36 Phase relationship of voltage dips and <± 1 interruptions with the power frequency Zero crossing control of the generator: ± 1 Output impedance Predominatly resistive < (,4+j,25) Even during transitions Table 1: Requirements of the testing voltage source acc. to IEC/EN 61-4-11 page 1 of 9 pages
In electrical systems short circuits cannot be avoided at all. The amplitude of a voltage drop depends on the distance between monitoring point, short-circuit point and supplying source. This relation is shown in Fig. 2. To meet the practical values described in the technical report IEC/TR the requirements of the testing voltage source of the IEC/EN 61-4-11 are well defined in table 1. The theoretical values for riseand fall-time can be calculated by simulation software. For this simulation the parameters for the cable length must be calculated. The definition of the equivalent circuit was given as a short circuit at the load, at the local grid entry point and within the local grid. Fig. 2: Equivalent circuit diagram for short circuit in the supply line The base impedance for the simulation is the mains reference impedance defined in the IEC/EN 61-3-3 with,4+j,25 Ohm. The simulation performed the characteristic of a resistive load with 16A nominal current at a nearby (2m) occurring short circuit (with a cable diameter 1,5mm²). The rise- and fall-times of the supplying voltage at short circuit are shown in Fig. 3. And Fig. 4. In Fig. 4 (higher resolution in the time base) the fall-time of the supplying voltage can be seen in a range of 5µs. To verify the simulated values with the rise- and fall-time of the reality several practical measurements have been performed. The measurement results were then compared with the simulation results. Fig. 3: Voltage characteristic during simulation (1ms/DIV) Fig. 4: Voltage characteristic during simulation (5µs/DIV) page 2 of 9 pages
PRACTICAL SHORT CIRCUIT MEASUREMENTS To investigate the real occurring rise- and fall-times several practical measurements have been performed. The electrical installation of an existing building was provided. At two points of the installation a laboratory bench was set up. The installation of the building can be described with the following equivalent circuit diagram which was verified through a practical measurement of the installation of the building: Real vermessenes Netz: Teilstück Teilstück 1 Teilstück 2 L18 R26 L2 R28 L21 R29 L24 R35 22.491uH 8m 5.375uH 18m 17.737uH 59m 37.625uH 831m V4 VOFF = VAMPL = 325 FREQ = 5 C12 V+.5n C13 1.65n C16 3.5n V+ C17 3.3u V- V- L19 R27 19.434uH 69m C14 C15.5n 2.5n 2 L22 5.375uH L23 5.375uH 1 1 R32 R3 46m R33 R31 243m 1.531k 1.312k U4 TCLOSE = 15m TTRAN = 1n Abzweig 1 (Labortischgruppe1) Abzweig 2 (Labortischgruppe2) Fig. 5: Equivalent circuit of the building installation The equivalent circuit shows three parts of the installation ( Teilstück -2 ) and the two workbench connections ( Abzweig 1/2"). The input voltage source is an ideal source with 23V nominal voltage at 5Hz. The parts Teilstück 1, Teilstück 2 and Teilstück 3 are representing three parts of the current bar. The workbenches are connected with a supply cable with a length of 5m. Different EUT s were connected to the end of Teilstück 2 with a supply cable of 35m length. The inductive and capacitive parameters of the cabling system were determined using the technical report Simulation of short circuit on different places and influences on rise time of Mr.Lutz, Fa. EMC Partner AG as follows: L 1.75 µh m C.75 µh m The serial impedances of the single cable parts were calculated through loading and measuring the voltage drop over the cable length. page 3 of 9 pages
Practical measurement 1: Short circuit between without load fall-time approx. /µs fall-time approx. 3V/µs fall-time approx. 3V/µs Fig. 6: Voltage curve at short circuit measurement 1 (5ms/DIV) 15V Resolution 1µs/DIV 5V -V -5V - -15V 2.97ms 2.98ms 2.99ms 2.1ms 2.11ms 2.12ms 2.13ms 2.14ms 2.15ms 2.16ms 2.17ms V(R35:2,R32:1) V(R33:2,R33:1) Fig. 7: Voltage curve at short circuit measurement 1 (1µs/DIV) 15V Resolution 5µs/DIV 5V -V -5V - -15V 2.8ms 2.1ms 2.12ms 2.14ms 2.16ms 2.18ms 2.2ms 2.22ms 2.24ms 2.26ms 2.28ms 2.3ms V(R35:2,R32:1) V(R33:2,R33:1) Fig. 8: Voltage curve at short circuit measurement 1 (5µs/DIV) page 4 of 9 pages
Practical measurement 2: Short circuit between with 6W rectifier load u1 n1 3 25 2 15 1 fall-time approx. 3V/µs fall-time approx. 6V/µs fall-time approx. 35V/µs 5 5 1 15 2.499.5.51.52.53.54.55.56.57.58.59 t1 n1 1 3 t2 n2 1 3 t3 n3 1 3 Fig. 9: Voltage curve at short circuit measurement 2 (5ms/DIV) page 5 of 9 pages
Practical measurement 3: Short circuit between with,1uf//268 load fall-time approx. 3V/µs fall-time approx. 8V/µs fall-time approx. 65V/µs u1 n1 35 3 25 2 15 1 5 5 1.495.497.499.51.53.55.57.59.511.513.515 t1 n1 1 3 t2 n2 1 3 t3 n3 1 3 Fig. 1: Voltage curve at short circuit measurement 3 (5ms/DIV) 4V 3V Resolution,5µs/DIV V - - 3.796ms 3.798ms 3.8ms 3.82ms 3.84ms 3.86ms 3.88ms 3.81ms 3.812ms 3.814ms 3.816ms V(R37:2,R32:1) V(R33:2,R33:1) 4V Fig. 11: Voltage curve at short circuit measurement 3 (,5µs/DIV) 3V Resolution 5µs/DIV V - - 3.78ms 3.8ms 3.82ms 3.84ms 3.86ms 3.88ms 3.9ms 3.92ms 3.94ms 3.96ms 3.98ms 4.ms V(R37:2,R32:1) V(R33:2,R33:1) Fig. 12: Voltage curve at short circuit measurement 3 (5µs/DIV) page 6 of 9 pages
Practical measurement 4: Short circuit between with 1uF in series 16,5 load fall-time approx. 2V/µs fall-time approx. 4V/µs 35 3 25 2 15 1 5 35V 5 185 187 189 191 193 195 197 199 23 25 t2 n2 1 6 t3 n3 1 6 Fig. 13: Voltage curve at short circuit measurement 4 (5ms/DIV) 3V Resolution,5µs/DIV 25V 15V 5V V 3.794ms 3.796ms 3.798ms 3.8ms 3.82ms 3.84ms 3.86ms 3.88ms 3.81ms 3.812ms 3.814ms V(C17:2,R36:1) V(R33:2,R33:1) 35V Fig. 14: Voltage curve at short circuit measurement 4 (,5µs/DIV) 3V Resolution 5µs/DIV 25V 15V 5V V 3.78ms 3.8ms 3.82ms 3.84ms 3.86ms 3.88ms 3.9ms 3.92ms 3.94ms 3.96ms 3.98ms 4.ms V(C17:2,R36:1) V(R33:2,R33:1) Fig. 15: Voltage curve at short circuit measurement 4 (5µs/DIV) page 7 of 9 pages
Practical measurement 5: Short circuit between with,1uf in series 16,5 load fall-time approx. 2V/µs fall-time approx. 4V/µs 35 3 25 2 15 1 5 4V 5 25 2552 253 254 255 256 257 258 259 26 t2 n2 1 6 t3 n3 1 6 Fig. 16: Voltage curve at short circuit measurement 5 (5ms/DIV) 3V Resolution,2µs/DIV V - 3.799ms 3.8ms 3.81ms 3.82ms 3.83ms 3.84ms 3.85ms 3.86ms 3.87ms 3.88ms 3.89ms V(C17:2,R36:1) V(R33:2,R33:1) 4V Fig. 17: Voltage curve at short circuit measurement 5 (,2µs/DIV) 3V Resolution 5µs/DIV V - 3.78ms 3.8ms 3.82ms 3.84ms 3.86ms 3.88ms 3.9ms 3.92ms 3.94ms 3.96ms 3.98ms 4.ms V(C17:2,R36:1) V(R33:2,R33:1) Fig. 18: Voltage curve at short circuit measurement 5 (5µs/DIV) page 8 of 9 pages
Practical measurement 6: Short circuit between L1 and N fall-time approx. 1V/µs fall-time approx. 18V/µs fall-time approx. 15V/µs u1 n1 4 35 3 25 2 15 1 5 5 1 15 2 25 4.999 5 5.1 5.2 5.3 5.4 5.5 5.6 5.7 5.8 5.9 t1 n1 1 3 t2 n2 1 3 t3 n3 1 3 Fig. 19: Voltage curve at short circuit measurement 6 (5ms/DIV) Practical measurement 7: Short circuit between L1 and L2 with,1uf//268 load fall-time approx. /µs fall-time approx. 3V/µs fall-time approx. 3V/µs 35 3 25 u1 n 15 1 5 5.498.499.5.51.52.53.54.55.56.57.58 t1 n1 1 3 t2 n2 1 3 t3 n3 1 3 Fig. 2: Voltage curve at short circuit measurement 7 (5ms/DIV) CONCLUSION: These practical measurements are showing clearly: 1. The nearer the short-circuit appears, so much faster are rise- and fall-times. 2. Directly at the short circuit rise- and fall-times are faster than 1us. 3. Depending on the load and the distance to the short-circuit different rise- and fall-times can be measured, but all of them are between 1-5us. In comparison between simulation and measurement data we can see, that simulation and reality are very close together. The definitions given in the IEC/EN 61-4-11 of the preferred voltage source are very important to perform realistic test cycles. Spitzenberger & Spies 216 all data are subject to change www.spitzenberger.de/weblink/115 page 9 of 9 pages