The RhySearch LIDT Testing Facility at the NTB Buchs

Similar documents
KNIFE-EDGE RIGHT-ANGLE PRISM MIRRORS

End Capped High Power Assemblies

Laser Induced Damage Threshold of Optical Coatings

Laser tests of Wide Band Gap power devices. Using Two photon absorption process

Bandpass Edge Dichroic Notch & More

Practical Guide to Specifying Optical Components

30 MM CAGE CUBE MOUNTED TURNING PRISM MIRRORS

Title: Laser marking with graded contrast micro crack inside transparent material using UV ns pulse

REAL-TIME DETECTION OF OPTICAL DAMAGE INDUCED BY HIGH-POWER LASER PULSES

SUPPLEMENTARY INFORMATION

Lasers à fibres ns et ps de forte puissance. Francois SALIN EOLITE systems

Nmark AGV-HP. High Accuracy, Thermally Stable Galvo Scanner

Alex Lyubarsky OPTI 521 December 8, 2013

Characterization of Laser Eyewear Using Varying Pulse Conditions and Wavelengths

PHW Position Pinhole Wheel

Features. Applications. Optional Features

Supplementary Materials for

Study on Laser Conditioning Parameters of HfO2/SiO2 Multilayer Mirrors

Single-photon excitation of morphology dependent resonance

UV EXCIMER LASER BEAM HOMOGENIZATION FOR MICROMACHINING APPLICATIONS

Biophysical Basis of Optical Radiation Exposure Limits. Bruce E. Stuck

Effects of spherical aberrations on micro welding of glass using ultra short laser pulses

UV-NIR LASER BEAM PROFILER

Drive Beam Photo-injector Option for the CTF3 Nominal Phase

Rear Side Processing of Soda-Lime Glass Using DPSS Nanosecond Laser

photolithographic techniques (1). Molybdenum electrodes (50 nm thick) are deposited by

k λ NA Resolution of optical systems depends on the wavelength visible light λ = 500 nm Extreme ultra-violet and soft x-ray light λ = 1-50 nm

Beams and Scanning Probe Microscopy

NIST EUVL Metrology Programs

Micro- and Nano-Technology... for Optics

Section 2: Lithography. Jaeger Chapter 2. EE143 Ali Javey Slide 5-1

Luminescence study of defects in silica glasses under near-uv excitation.

PROCEEDINGS OF SPIE. 193nm high power lasers for the wide bandgap material processing

Femtosecond fiber laser direct writing of optical waveguide in glasses

All diode-pumped 4 Joule 527 nm Nd:YLF laser for pumping Ti:Sapphire lasers

Pyroelectric, Photodiode and RP Heads for Repetitive Energy Measurements

Near-field optical photomask repair with a femtosecond laser

A novel High Average Power High Brightness Soft X-ray Source using a Thin Disk Laser System for optimized Laser Produced Plasma Generation

Analytical Spectroscopy Chemistry 620: Midterm Exam Key Date Assigned: April 15, Due April 22, 2010

Mitigation of Laser Damage Growth in Fused Silica with a Galvanometer Scanned CO2 Laser

Compact EUV Source for Metrology and Inspection

771 Series LASER SPECTRUM ANALYZER. The Power of Precision in Spectral Analysis. It's Our Business to be Exact! bristol-inst.com

plasmonic nanoblock pair

Micromachining of complex channel systems in 3D quartz substrates using Q-switched Nd:YAG laser

Novel use of GaAs as a passive Q-switch as well as an output coupler for diode-pumped infrared solid-state lasers

Quantum-Well Semiconductor Saturable Absorber Mirror

Nmark AGV-HP. High Accuracy, Thermally Stable Galvo Scanner

CVI LASER OPTICS ANTIREFLECTION COATINGS

Femtosecond laser microfabrication in. Prof. Dr. Cleber R. Mendonca

PDV workshop. Albuquerque (New-Mexico) october IDIL Activities and new PDV system

High Power and Energy Femtosecond Lasers

Focusing X-ray beams below 50 nm using bent multilayers. O. Hignette Optics group. European Synchrotron Radiation Facility (FRANCE) Outline

Optics for next generation light sources

Maria Smedh, Centre for Cellular Imaging. Maria Smedh, Centre for Cellular Imaging

BEAMAGE-3.0 KEY FEATURES BEAM DIAGNOSTICS AVAILABLE MODELS MAIN FUNCTIONS SEE ALSO ACCESSORIES. CMOS Beam Profiling Cameras

Design and Fabrication of an Efficient Extreme Ultraviolet Beam Splitter

OPTICAL FILTERS. lasercomponents.com

Ultra-stable flashlamp-pumped laser *

Chapter 14. Tunable Dye Lasers. Presented by. Mokter Mahmud Chowdhury ID no.:

Supporting information: Visualizing the motion of. graphene nanodrums

Custom & OEM Filter Design

Bioimaging of cells and tissues using accelerator-based sources

Drilling of Glass by Excimer Laser Mask Projection Technique Abstract Introduction Experimental details

Single-Photon and Two-Photon correlation case study on digital devices

P r i s m s I N D E X

Infrared wire grid polarizers: metrology, modeling, and laser damage threshold

A New Profile Measurement Method for Thin Film Surface

Picosecond Laser Direct Patterning of Poly(3,4-ethylene dioxythiophene)-poly(styrene sulfonate) (PEDOT:PSS) Thin Films

PLCC-2 Pkg Infrared Light Emitting Diode

CORPORATE PRESENTATION

PERFORMANCE OF PHOTODIGM S DBR SEMICONDUCTOR LASERS FOR PICOSECOND AND NANOSECOND PULSING APPLICATIONS

LASER OPTICS. lasercomponents.com

The Laser Processing of Diamond and Sapphire

Novel laser power sensor improves process control

Lithography. 3 rd. lecture: introduction. Prof. Yosi Shacham-Diamand. Fall 2004

POWER DETECTORS. How they work POWER DETECTORS. Overview

The Hong Kong University of Science and Technology Final Year Project presentation 2007

Vertical External Cavity Surface Emitting Laser

Integrated into Nanowire Waveguides

EDMUND OPTICS ULTRAVIOLET OPTICS

Development of scalable laser technology for EUVL applications

Experimental Investigation and Optimization for the Effective Parameters in the Laser Direct Structuring Process

taccor Optional features Overview Turn-key GHz femtosecond laser

ND:YAG/ND:YLF...T-26 TUNABLE LASER MIRRORS...T-28 MISCELLANEOUS MIRRORS...T-30 ANTI-REFLECTIVE OVERVIEW...T-31 0 DEGREE ANGLE OF INCIDENCE...

ESCC2006 European Supply Chain Convention

High Average Power, High Repetition Rate Side-Pumped Nd:YVO 4 Slab Laser

High Power CO 2 Laser, EUVA

Low-cost direct writing lithography system for the sub-micron range

Silicon Photodiodes - SXUV Series with Platinum Silicide Front Entrance Windows

Beam Splitters. Diameter ET Transmission Reflectance %

Nmark AGV-HPO. High Accuracy, Open Frame, Thermally Stable Galvo Scanner. Highest accuracy scanner available attains singledigit,

High-Power Femtosecond Lasers

Laser systems for science instruments

Micro- and Nano-Technology... for Optics

Opto-Mechanical Equipment of KBTEM: Present Day and the Future

Pockels Cells. Selection Guide. BBO Pockels Cells page 3.4. DQ High Repetition Rate Pockels Cell Driver for Q-Switching page 3.6

Progress in ultrafast Cr:ZnSe Lasers. Evgueni Slobodtchikov, Peter Moulton

BEAMAGE KEY FEATURES AVAILABLE MODELS. CMOS Beam Profiling Cameras

SNAPP Swiss National Applicaton Laboratory for Photonic tools and Photonic manufacturing

Femtosecond Laser Simulation Facility for SEE IC Testing

Transcription:

The RhySearch LIDT Testing Facility at the NTB Buchs Workshop on Optical Coatings for Laser Applications, Thursday, 11 th June 2015 Dr. Roelene Botha RhySearch / NTB Buchs

RhySearch: The Rheintal Research and Innovation Centre NETWORK APPLIED RESEARCH & DEVELOPMENT INNOVATION PROCESSES Precision Manufacturing Packaging Technology Coating Technology 2 2

KTI Project: LIDT and Degradation Testing for Industrial Applications Total Investment: Industry: Personel Misc./Equipment Research: Personel 1.713 MCHF 989 kchf 330 kchf 649 kchf 734 kchf CSEM EMPA University of Neuchâtel 3 3

Some High Power Coatings Applications Deep and Extreme UV Lithography High Energy Petawatt Lasers Courtesy: ASML Space Applications str.llnl.gov/str/mperry.htm ALADIN: Atmospheric Laser Dopller Instr. www.esa.int 4 4

The RhySearch LIDT Testing Facility at the NTB Buchs Attenuator Laser Shutter Focusing Optics Offline Nomarski DIC Microscope Energy Monitoring Diode Beam Profile Camera Automation Sample Online Damage Detection System Control Unit Measurement according to ISO Norm 21254 (1 4) 5 5

An LIDT Measurement Process: S on 1 Measurement of the Laserparameters: Diameter, Profile, Pulse duration Powermeter/Energydiode calibration 6 6

An LIDT Measurement Process: S on 1 Measurement of the Laserparameters: Diameter, Profile, Pulse duration Powermeter/Energydiode calibration Define laser fluence range of interest Define the fluence steps to be used (N) Divide substrate into a matrix of sites 7 7

An LIDT Measurement Process: S on 1 Each site is irradiated with S Pulses at a specific fluence if no damage occurs, irradiate next site (increased laser fluence) If damage occurs before S Pulses, log information and irradiate next site Each fluence increment is used several times Increased statistics 8 8

An LIDT Measurement Process: S on 1 Measurement of the Laserparameters Powermeter/Energydiode calibration Define laser fluence range of interest Define the fluence steps to be used Divide substrate into a matrix of sites Each site is irradiated with S Pulses if no damage occurs, irradiate next site (increased laser fluence) If damage occurs before S Pulses, log information and irradiate next site Each fluence increment is used several times Increased statistics Post LIDT Testing damage verification using a Nomarski DIC Microscope (100x) Deviations are incorporated into the measured results 9 9

Example of an LIDT Test: Double Sided AR Coating Test procedure: 5000 on 1 Number of matrix sites: 150 Beam diameter: 190 μm ±10μm 0% LIDT: 31.6 J/cm 2 50% LIDT: 40.7 J/cm 2 Fluence Error: σ = 11.5% Damage Probability Fluency [J/cm 2 ] 10 10

Measurement Factors Influencing the LIDT of a Sample: 1. Measurement wavelength 2. Pulse duration 3. Pulse repetition frequency 4. Beam diameter and shape 5. Angle of Incidence Next Steps: 1. Montfort M Nano Laser extension to 532nm, 355nm 2. Adding a OneFive fs Laser 3. Incorporation of Degradation Testing LIDT Certification for Lifetime Testing 11 11

What Substrate and Coating Variables Cause Laser Damage? fs ns Defects and Fatigue Effects ps Elektronically induced Surface Preparation Environment T RH% P CW & μs Absorption Laser Damage Bulk Material 12 12

What Substrate and Coating Variables Cause Laser Damage? LIDT Testing Total Scattering Elektronically induced Surface Preparation Cavity Ring Down Absorption Defects and Fatigue Effects Laser Damage Environment Bulk Material Analysis Environmental Testing Stress Measurement Atomic Force Microscopy White Light Interferometer Spectrophotometer. 13 13

RhySearch Coating Technology: Future Perspectives Analysis LIDT AFM T% and R% CRD and TS Stress measurement Magnetron Sputtering DIBS Evaporation PECVD ALD Coating RhySearch Coating Technology Surface Prep Substrate Cleaning Polishing 14 14

Visit to the RhySearch LIDT Testing Facility Thank you! Room 2922 (Basement, two floors down) 15 15