RICH2016 Bled, Slovenia Sep. 6, 2016 Extension of the MCP-PMT lifetime K. Matsuoka (KMI, Nagoya Univ.) S. Hirose, T. Iijima, K. Inami, Y. Kato, K. Kobayashi, Y. Maeda, R. Omori, K. Suzuki (Nagoya Univ.)
Photon sensors in novel RICH detectors 2 Requirements for the photon sensors are Not only a spatial resolution to reconstruct Cherenkov images Very good time resolution for single photons <50 ps for Time-Of-Propagation (TOP) Large photocoverage High efficiency Work under a high background Work in a high B-field p K C Quartz TOP cos C 1 n Only an MCP-PMT could meet every requirement.
400 mm MCP-PMT (Micro Channel Plate PMT) 3 Square shape multi-anode MCP-PMT with a large photocoverage Developed for the Belle II TOP counter at Nagoya in collaboration with HAMAMATSU Photonics K.K. Photon (Cross-section) Photocathode (NaKSbCs) e MCP x 2 4 x 4 anodes 23 mm 13 10 mm 5.275 mm Micro channel e ~1 kv / 400 mm 10 mv 1 ns Fast signal Limited by the oscilloscope. 1.9 x 10The 6 gain actual signal KT0117 is ch0 faster. 2480 V The best time resolution of photon sensors
Major problem of the MCP-PMT Aging of the photocathode In the electron multiplication, gas/ion is desorbed from the MCP. The photocathode is deteriorated by the gas/ion and the QE is depressed. Gas The amount of QE depression depends on the accumulated output charge. Define the lifetime of the MCP-PMT as an accumulated output charge Q τ at which QE(Q τ )/QE inital = 0.8 at 400 nm. 4 Photo cathode Ion Estimated accumulated output charge for Belle II TOP dominantly due to beam bkgd.: ~3.7 C/cm 2 at 50 ab 1 with 5 x 10 5 gain We have researched to achieve the lifetime longer than the estimated accumulated output charge.
How to extend the lifetime 5 Three steps of approach 1. Block the gas/ion from reaching the photocathode Conventional MCP-PMT [NIM A629 (2011) 111] 2. Suppress outgassing from the MCP ALD (Atomic Layer Deposition) MCP-PMT (2013~) 3. Reduce residual gas on the MCP Life-extended ALD MCP-PMT (2015~) Step 1 Step 2 + + Step 3 Gas Gas Ceramic block Gas Ion Al layer MCP ALD coating on the MCP surface MCP Evaluated the lifetime of each type of MCP-PMT
Test of the lifetime 6 Monitor the QE as a function of the accumulated output charge of the MCP-PMT. LED is used to load the output charge, which is measured by a CAMAC ADC. QE is monitored as the hit rate by the laser single photons. Pulse laser (400 nm) MCP-PMTs LED (100 khz) Reference PMT
at 400 nm Result of the lifetime test 7 Result of typical sample of each type Life-extended ALD (YH0205) ALD (KT0074) Conventional (XM0267) 1.0 5.6 29.4 The QE depression curve is represented by QE Q QE inital = 1 0.2 Q/Q τ 2 Longer lifetime with ALD and much longer with life-extended ALD
QE spectrum after the lifetime test 8 Measured by Xe lamp + monochromator Conventional (XM0267) ALD (KT0074) Life-extended ALD (YH0205) Consistent with the in-situ QE measurement by the laser at 400 nm. The QE drops more significantly at longer wavelengths as the work function of the photocathode increases.
Lifetime estimation halfway through the test 9 QE drop of 4 life-extended ALD MCP-PMT samples at 4.0-5.5 C/cm 2 was little. Stopped the test to keep them as spares for Belle II TOP. Estimate the lifetime of those samples by comparing the QE spectrum with another sample of which lifetime was measured to be 11.2 C/cm 2. 1 0.2 QΤQ 2 τ 1 0.2 3.3Τ11.2 2 Q τ QΤ3.3 11.2 C/cm 2 Halfway sample XM0240 13.6-18.7 C/cm 2 Lifetime = 11.2 C/cm 2 Stopped at these output charge
Lifetime (C/cm 2 ) Summary of the measured lifetime 35 30 25 8 life-extended ALD >13.6 C/cm 2 8 ALD 2.5-26.1 C/cm 2 Average: 10.4 C/cm 2 10 20 15 10 5 0 12 conventional 0.3-1.7 C/cm 2 Average: 1.1 C/cm 2 Sample The lifetime varies broadly sample-by-sample. Need to measure many samples to evaluate the lifetime. Succeeded in extending the lifetime significantly. Estimation of the lower bound Belle II TOP
SE yield Performance of the ALD MCP-PMT 11 Due to the emissive coating of the ALD, the ALD MCP has a larger secondary electron yield (SE yield) than the conventional MCP. Rough drawing ALD ~2 Conventional ~65 ~85 ~200 HV (V) We have 277 conventional, 231 ALD and 65 lifeextended ALD MCP-PMTs for Belle II TOP. Systematically studied the performance of the (lifeextended) ALD MCP-PMTs compared with the conventional ones.
Setup of the laser test 12 Single photon irradiation to each anode one by one. Dark box Reference PMT Moving stage ND filters MCP-PMT Fiber Slit Slit Light spot 1 mm f Laser MCP-PMT Pico-second pulse laser (l = 400 nm) Variable amp +19.5~35 db ATT Amp 10 db +33 db Discriminator Threshold: 20 mv ADC TDC
Gain 13 Define the gain as the mean of the output charge distribution. ALD MCP-PMT KT0449_20140717 ch4 HV Gain 2750 V (3.9 x 10 6 ) 2650 V (2.0 x 10 6 ) 2550 V (1.0 x 10 6 ) HV for 5 x 10 5 gain Conventional ALD Life-extended ALD Lower HV for ALDs to have the same gain owing to the higher SE yield.
Relative collection efficiency 14 Count the number of TDC hits. Correct the laser intensity variation with the reference PMT. Conventional ALD Life-extended ALD Higher collection efficiency of ALDs by ~15%. The variation of the collection efficiency among PMTs of each type seems to be independent of the HV for the same gain or SE yield.
TTS (Transit Time Spread) 15 Fit a double Gaussian to the TDC distribution after timewalk correction. Define the TTS as s of the primary Gaussian. Normalized to the number of incident photons JT0763_20140626 ch6 3460 V KT0162_20140612 ch6 2550 V ALD Conventional (same gain of 2 x 10 6 ) Conventional ALD Life-extended ALD Recoil Photocathode MCP1 MCP2 Higher collection efficiency is due to increase of the efficiency for the recoil photo electrons.
Performance under a high rate 16 After a micro-channel fires, electrons are depleted on the channel wall. The channel wall O(10 16 F) is recharged by the strip current through a high resistance of the micro-channel O(10 14 Ω). Dead time of a single micro-channel τ d = RC = Q out /I s = O(10 ms) for the 2 nd MCP Strip current I s ~O(10 pa) + ++ + ++ Electrons Q out ~O(0.1 pc) Under a high rate of background, a large fraction of micro-channels could be dead. (Belle II TOP: ~200 khz/anode) Drop of the gain and efficiency, depending on the MCP resistance.
Life-extended ALD MCP-PMT Test under a high background 17 Added an LED to the laser test bench to emulate background single photons of high rate. CLOCK 10 MHz 20 ns width ATT Laser 9 ~ 5 db Change the light intensity LED Tape to fade light Bkgd. single photons at a high rate LED MCP- PMT
Gain (x10 5 ) Gain under a high background 18 8 7 6 5 4 3 R of 2 nd MCP 2 1 0 0.001 0.01 0.1 1 10 Background rate (MHz/anode) 5.275 x 5.275 cm 2 Gain drops above 100 khz/anode for high R MCPs. Belle II TOP
Relative efficiency Efficiency under a high background 19 1.1 1 0.9 0.8 0.7 0.6 0.5 0.001 0.01 0.1 1 10 Background rate (MHz/anode) Belle II TOP Efficiency drops above ~1 MHz/anode.
TTS (ps) TTS under a high background 20 350 300 250 Belle II TOP 200 150 100 50 A rough guide 0 0.001 0.01 0.1 1 10 Background rate (MHz/anode) TTS deteriorates above ~200 khz/anode.
Summary 21 An MCP-PMT is a key photon sensor for novel RICH detectors. A major concern is a use under a high background: Lifetime of the photocathode Lifetime has been extensively improved by three steps: 1. Conventional MCP 1.1 C/cm 2 on average of 12 samples 2. ALD MCP 10.4 C/cm 2 on average of 8 samples 3. Life-extended ALD MCP >13.6 C/cm 2 for all 8 samples Performance degradation Drop of the gain and efficiency is little up to 1 MHz/anode for R MCP 174 MW. (A smaller R MCP is better.*) TTS deteriorates above ~200 khz/anode Independent of R MCP. Correspond to 3.7 C/cm 2 /50 ab 1 for 5 x 10 5 gain at Belle II TOP. Current limit of background rate to use the MCP-PMT. * Cannot be much smaller to avoid thermal runaway. We succeeded in developing the MCP-PMT for Belle II TOP, but further R&D is necessary for next next generation experiments.