FAST CMOS 16-BIT REGISTER (3-STATE) IDT54/74FCT16374AT/CT/ET FEATURES: 0.5 MICRON CMOS Technology High-speed, low-power CMOS replacement for ABT functions Typical tsk(o) (Output Skew) < 250ps Low input and output leakage 1µA (max.) ESD > 200 per MIL-STD-883, Method 3015; > 20 using machine model (C = 200pF, R = 0) = 5V ±10% High drive outputs ( 32mA IOH, 64mA IOL) Power off disable outputs permit live insertion Typical VOLP (Output Ground Bounce) < 1. at = 5V, TA = 25 C Available in the following packages: Industrial: SSOP, TSSOP Military: CERPACK DESCRIPTION: The FCT16374T 16-bit edge-triggered D-type register is built using advanced dual metal CMOS technology. These high-speed, low-power registers are ideal for use as buffer registers for data synchronization and storage. The Output Enable (xoe) and clock (xclk) controls are organized to operate each device as two 8-bit registers or one 16-bit register with common clock. Flow-through organization of signal pins simplifies layout. All inputs are designed with hysteresis for improved noise margin. The FCT16374T is ideally suited for driving high-capacitance loads and low-impedance backplanes. The output buffers are designed with power off disable capability to allow "live insertion" of boards when used as backplane drivers. FUNCTIONAL BLOCK DIAGRAM 1OE 2OE 1CLK 2CLK 1D1 D 2D1 D C 1O1 C 2O1 TO SEVEN OTHER CHANNELS TO SEVEN OTHER CHANNELS The IDT logo is a registered trademark of Integrated Device Technology, Inc. 1 SEPTEMBER 2009 2009 Integrated Device Technology, Inc. DSC-5452/7
PIN CONFIGURATION ABSOLUTE MAXIMUM RATINGS (1) Symbol Description Max Unit 1OE 1O1 1O2 1O3 1O4 1 2 3 4 5 6 7 48 47 46 45 44 43 42 1CLK 1D1 1D2 1D3 1D4 VTERM (2) Terminal Voltage with Respect to 0.5 to 7 V VTERM (3) Terminal Voltage with Respect to 0.5 to +0.5 V TSTG Storage Temperature 65 to +150 C IOUT DC Output Current 60 to +120 ma 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. All device terminals except FCT162XXX Output and I/O terminals. 3. Outputs and I/O terminals for FCT162XXX. 1O5 8 41 1D5 1O6 9 40 1D6 CAPACITANCE (TA = +25 C, f = 1.0MHz) 1O7 10 11 39 38 1D7 Symbol Parameter (1) Conditions Typ. Max. Unit CIN Input Capacitance VIN = 3.5 6 pf COUT Output Capacitance VOUT = 3.5 8 pf 1O8 2O1 12 13 37 36 1D8 2D1 NOTE: 1. This parameter is measured at characterization but not tested. 2O2 14 35 2D2 2O3 2O4 2O5 15 16 17 18 19 34 33 32 31 30 2D3 2D4 2D5 PIN DESCRIPTION Pin Names Description xdx Data Inputs xclk Clock Inputs x O x xoe 3-State Outputs 3-State Output Enable Input (Active LOW) 2O6 20 29 2D6 21 28 2O7 22 27 2D7 FUNCTION TABLE (1) 2O8 2OE 23 24 26 25 SSOP/ TSSOP/ CERPACK TOP VIEW 2D8 2CLK Inputs Outputs Function xdx xclk xoe xox Z X L H Z X H H Z Load L L L Register H L H L H Z H H Z NOTE: 1. H = HIGH voltage level L = LOW voltage level X = Don t care Z = High-impedance = LOW-to-HIGH transition 2
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE Following Conditions Apply Unless Otherwise Specified: Industrial: TA = 40 C to +85 C, = 5. ±10%; Military: TA = 55 C to +125 C, = 5. ±10% Symbol Parameter Test Conditions (1) Min. Typ. (2) Max. Unit VIH Input HIGH Level Guaranteed Logic HIGH Level 2 V VIL Input LOW Level Guaranteed Logic LOW Level 0.8 V IIH Input HIGH Current (Input pins) (5) = Max. VI = ±1 µa Input HIGH Current (I/O pins) (5) ±1 IIL Input LOW Current (Input pins) (5) VI = ±1 Input LOW Current (I/O pins) (5) ±1 IOZH High Impedance Output Current = Max. VO = 2.7V ±1 µ A IOZL (3-State Output pins) (5) VO = 0.5V ±1 VIK Clamp Diode Voltage = Min., IIN = 18mA 0.7 1.2 V IOS Short Circuit Current = Max., VO = (3) 80 140 250 ma VH Input Hysteresis 100 mv ICCL Quiescent Power Supply Current = Max 5 500 µ A ICCH VIN = or ICCZ OUTPUT DRIVE CHARACTERISTICS Symbol Parameter Test Conditions (1) Min. Typ. (2) Max. Unit IO Output Drive Current = Max., VO = 2.5V (3) 50 180 ma VOH Output HIGH Voltage = Min. IOH = 3mA 2.5 3.5 V VIN = VIH or VIL IOH = 12mA MIL 2.4 3.5 V IOH = 15mA IND IOH = 24mA MIL 2 3 V IOL = 32mA IND (4) VOL Output LOW Voltage = Min. IOL = 48mA MIL 0.2 0.55 V VIN = VIH or VIL IOL = 64mA IND IOFF Input/Output Power Off Leakage (5) =, VIN = or VO 4.5V ±1 μa 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at = 5., +25 C ambient. 3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second. 4. Duration of the condition can not exceed one second. 5. This test limit for this parameter is ±5µA at TA = 55 C. 3
POWER SUPPLY CHARACTERISTICS Symbol Parameter Test Conditions (1) Min. Typ. (2) Max. Unit ΔICC Quiescent Power Supply Current = Max. 0.5 1.5 ma TTL Inputs HIGH VIN = 3.4V (3) ICCD Dynamic Power Supply Current (4) = Max. VIN = 60 100 µ A / Outputs Open VIN = MHz xoe = One Input Toggling IC Total Power Supply Current (6) = Max. VIN = 0.6 1.5 ma Outputs Open VIN = fcp = 10MHz xoe = VIN = 3.4V 1.1 3 fi = 5MHz VIN = One Bit Toggling = Max. VIN = 3 5.5 (5) Outputs Open VIN = fcp = 10MHz xoe = VIN = 3.4V 7.5 19 (5) Sixteen Bits Toggling VIN = fi = 2.5MHz 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at = 5., +25 C ambient. 3. Per TTL driven input (VIN = 3.4V). All other inputs at or. 4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations. 5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested. 6. IC = IQUIESCENT + IINPUTS + IDYNAMIC IC = ICC + ΔICC DHNT + ICCD (fcpncp/2 + fini) ICC = Quiescent Current (ICCL, ICCH and ICCZ) ΔICC = Power Supply Current for a TTL High Input (VIN = 3.4V) DH = Duty Cycle for TTL Inputs High NT = Number of TTL Inputs at DH ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL) fcp = Clock Frequency for Register Devices (Zero for Non-Register Devices) NCP = Number of Clock Inputs at fcp fi = Input Frequency Ni = Number of Inputs at fi 4
SWITCHING CHARACTERISTICS OVER OPERATING RANGE FCT16374AT Ind. Mil. Symbol Parameter Condition (2) Min. (2) Max. Min. (2) Max. Unit tplh Propagation Delay CL = 50pF 2 6.5 2 7.2 ns tphl xclk to xox RL = 500Ω tpzh Output Enable Time 1.5 6.5 1.5 7.5 ns tpzl tphz Output Disable Time 1.5 5.5 1.5 6.5 ns tplz tsu Set-up Time HIGH or LOW, xdx to xclk 2 2 ns th Hold Time HIGH or LOW, xdx to xclk 1.5 1.5 ns tw xclk Pulse Width HIGH or LOW 5 6 ns tsk(o) Output Skew (3) 0.5 0.5 ns FCT16374CT FCT16374ET Ind. Mil. Ind. Mil. Symbol Parameter Condition (2) Min. (2) Max. Min. (2) Max. Min. (2) Max. Min. (2) Max. Unit tplh Propagation Delay CL = 50pF 2 5.2 2 6.2 1.5 3.7 ns tphl xclk to xox RL = 500Ω tpzh Output Enable Time 1.5 5.5 1.5 6.2 1.5 4.4 ns tpzl tphz Output Disable Time 1.5 5 1.5 5.7 1.5 3.6 ns tplz tsu Set-up Time HIGH or LOW, xdx to xclk 2 2 1.5 ns th Hold Time HIGH or LOW, xdx to xclk 1.5 1.5 0 ns tw xclk Pulse Width HIGH or LOW 5 6 3 (4) ns tsk(o) Output Skew (3) 0.5 0.5 0.5 ns 1. See test circuit and waveforms. 2. Minimum limits are guaranteed but not tested on Propagation Delays. 3. Skew between any two outputs, of the same package, switching in the same direction. This parameter is guaranteed by design. 4. This limit is guaranteed but not tested. 5
TEST CIRCUITS AND WAVEFORMS V CC 7. SWITCH POSITION Pulse Generator VIN RT D.U.T. VOUT 50pF CL 500Ω 500Ω Test Open Drain Disable Low Enable Low All Other Tests Switch Closed Open DEFINITIONS: CL = Load capacitance: includes jig and probe capacitance. RT = Termination resistance: should be equal to ZOUT of the Pulse Generator. Test Circuits for All Outputs DATA INPUT TIMING INPUT ASYNCHRONOUS CONTROL PRESET CLEAR ETC. SYNCHRONOUS CONTROL PRESET CLEAR CLOCK ENABLE ETC. tsu tsu trem th th LOW-HIGH-LOW PULSE HIGH-LOW-HIGH PULSE tw Pulse Width Set-up, Hold, and Release Times SAME PHASE INPUT TRANSITION OUTPUT OPPOSITE PHASE INPUT TRANSITION tplh tplh Propagation Delay tphl tphl VOH VOL CONTROL INPUT OUTPUT NORMALLY LOW OUTPUT NORMALLY HIGH ENABLE tpzl SWITCH CLOSED tpzh SWITCH OPEN 3.5V DISABLE tplz 0. tphz 0. 3.5V VOL VOH Enable and Disable Times 1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH. 2. Pulse Generator for All Pulses: Rate 1.0MHz; tf 2.5ns; tr 2.5ns. 6
ORDERING INFORMATION XX Temp. Range FCT XXX Family XXXX Device Type XX Package X Process Blank B Industrial MIL-STD-883, Class B PVG PAG Industrial Options Shrink Small Outline Package - Green Thin Shrink Small Outline Package - Green E Military Options CERPACK 374AT 374CT 374ET 16-Bit Register (3-State) 16 Double-Density, 5 Volt, High Drive 54 74 55C to +125C 40C to +85C Datasheet Document History 09/28/09 Pg. 7 Updated the ordering information by removing the "IDT" notation and non RoHS part. CORPORATE HEADQUARTERS for SALES: for Tech Support: 6024 Silver Creek Valley Road 800-345-7015 or 408-284-8200 logichelp@idt.com San Jose, CA 95138 fax: 408-284-2775 www.idt.com 7