HMC906A. Amplifiers - Linear & Power - CHIP. Electrical Specifications, T A. Typical Applications. Features. General Description. Functional Diagram

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Typical Applications Features The HMC96A is ideal for: Satellite Communications Point-to-Point Radios Point-to-Multi-Point Radios VSAT Military & Space Functional Diagram Saturated Output Power: +33.5 dbm @ % PAE High Output IP3: +44 dbm @ + dbm / tone High Gain:.5 db DC Supply: +6V @ 1 ma No External Matching Required Die Size: 3.18 x 2.73 x.1 mm General Description The HMC96A is a four stage GaAs phemt MMIC 2 Watt Power Amplifier which operates between 27.3 and 33.5 GHz. The HMC96A provides.5 db of gain, and +33.5 dbm of saturated output power and % PAE from a +6V supply. The OIP3 of dbm at dbm / tone provides excellent linearity for satellite communications. The RF I/Os are DC blocked and matched to Ohms for ease of integration into Multi-Chip-Modules (MCMs). All data is taken with the chip in a Ohm test fixture connected via two. mm (1 mil) diameter wire bonds of length.31 mm (12 mils). Electrical Specifications, T A = + C, Vdd1 = Vdd2 = +6 V, Idd = 1 ma [1] Parameter Min. Typ. Max. Min. Typ. Max. Units Frequency Range 27.3-31.5 31.5-33.5 GHz Gain.5.5 db Input Return Loss 14 12 Output Return Loss 17 16 db Output Power for 1 db Compression (P1dB) 33 31.5 33.5 dbm Saturated Output Power (Psat) 33.5 dbm Output Third Order Intercept (IP3) Pout / tone = + dbm 44 43 dbm Total Supply Current (Idd) 1 1 ma Supply Voltage 5 6 6.5 5 6 6.5 V [1] Adjust Vgg (pad 2 or 12) between -2 to V to achieve Idd = 1 ma typical. Vgg typical = -.7 V 1 Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. For price, delivery, and to place orders: Analog Devices, Inc., One Technology Way, P.O. Box 916, Norwood, MA 62-916

Gain & Return Loss RESPONSE (db) 15 1 5-5 -1-15 - - 22 Gain vs. Vdd GAIN (db) 22 18 16 S21 S11 S22 14 27 29 31 33 +5V +5.5V +6V +6.5V Gain vs. Temperature GAIN (db) 22 18 16 14 27 29 31 33 Gain vs. Idd GAIN (db) 22 18 16 14 27 29 31 33 1mA 11mA 1mA 1mA Input Return Loss vs. Temperature Output Return Loss vs. Temperature RETURN LOSS (db) -5-1 -15 - RETURN LOSS (db) -5-1 -15 - - 27 29 31 33-27 29 31 33 2

Reverse Isolation vs. Temperature P1dB vs. Temperature ISOLATION (db) -1 - - - - -6-7 27 29 31 33 Psat vs. Temperature Psat (dbm) 27 29 31 33 P1dB (dbm) 27 29 31 33 P1dB vs. Vdd P1dB (dbm) 27 29 31 33 +5V +5.5V +6V +6.5V Psat vs. Vdd P1dB vs. Idd Psat (dbm) P1dB (dbm) 27 29 31 33 27 29 31 33 +5V +5.5V +6V +6.5V 11mA 1mA 1mA 3

Psat vs. Idd Power Compression @ GHz Psat (dbm) 27 29 31 33 11mA 1mA 1mA Gain and Power vs. Idd @ GHz Gain (db), P1dB (dbm), Psat (dbm) 22 11 11 11 1175 1 12 12 1275 1 Idd (ma) GAIN P1dB Psat Pout(dBm), GAIN(dB), PAE(%) 18 12 6-8 -6-4 -2 2 4 6 8 1 12 INPUT POWER (dbm) Pout Gain PAE Idd Gain and Power vs. Vdd @ GHz Gain (db), P1dB (dbm), Psat (dbm) 22 5 5.1 5.2 5.3 5.4 5.5 5.6 5.7 5.8 5.9 6 6.1 6.2 6.3 6.4 6.5 Vdd (V) GAIN P1dB Psat 21 19 17 1 1 11 Idd (ma) PAE @ Psat vs. Temperature Power Dissipation @ 85C 12 PAE(%) 15 1 5 POWER DISSIPATION (W) 11 1 9 8 7 27 29 31 33 6-8 -6-4 -2 2 4 6 8 1 12 14 INPUT POWER (dbm) GHz 29GHz GHz 31GHz GHz 33GHz 4

Output IP3 vs. Temperature, Pout/Tone = + dbm Output IP3 vs. Temperature, Pout/Tone = + dbm IP3 (dbm) 45 35 27 29 31 33 Output IP3 vs. Vdd, Pout/Tone = + dbm IP3 (dbm) 45 35 27 29 31 33 +5V +5.5V +6V +6.5V IP3 (dbm) 45 35 27 29 31 33 Output IP3 vs. Vdd, Pout/Tone = + dbm IP3 (dbm) 45 35 27 29 31 33 +5V +5.5V +6V +6.5V Output IP3 vs. Idd, Pout/Tone = + dbm Output IP3 vs. Idd, Pout/Tone = + dbm 45 45 IP3 (dbm) 35 IP3 (dbm) 35 27 29 31 33 27 29 31 33 11mA 1mA 1mA 11mA 1mA 1mA 5

Output IM3 @ Vdd=5V 8 Output IM3 @ Vdd=5.5V 8 IM3 (dbc) 7 6 1 12 14 16 18 22 GHz 29GHz GHz Output IM3 @ Vdd=6V IM3 (dbc) 9 8 7 6 Pout/TONE (dbm) 31GHz GHz 33GHz 1 12 14 16 18 22 Pout/TONE (dbm) GHz 29GHz GHz 31GHz GHz 33GHz IM3 (dbc) 7 6 1 12 14 16 18 22 Pout/TONE (dbm) GHz 29GHz GHz Output IM3 @ Vdd=6.5V IM3 (dbc) 8 7 6 31GHz GHz 33GHz 1 12 14 16 18 22 Pout/TONE (dbm) GHz 29GHz GHz 31GHz GHz 33GHz Igg vs. Input Power Igg(mA) 2 1-1 -2-3 -4-5 -6-7 -8-1 -8-6 -4-2 2 4 6 8 1 12 INPUT POWER (dbm) GHz 29GHz GHz 31GHz GHz 33GHz Idd vs. Vgg Representative of a Typical Device Idd(mA) 18 16 1 1 1 8 6 - -1.6-1.4-1.2-1 -.8 -.6 Vgg1(V) 6

Absolute Maximum Ratings Drain Bias Voltage (Vd) +7V Reliabilty Information Channel Temperature 175 C RF Input Power (RFIN) Continuous Pdiss (T= 85 C) (derate 146.4 mw/ C above 85 C) + dbm 13.18 W Storage Temperature -65 to +1 C Operating Temperature -55 to +85 C ESD Sensitivity (HBM) Class B - Passed 1V Nominal Junction Temperature (T=85 C, Vdd = 1V) Thermal Resistance (channel to die bottom) 1.2 C 6.83 C/W Stresses at or above those listed in the Absolute Maximum Ratings may cause permanent damage to the product. This is a stress rating only, functional operation of the product at these or any other conditions above those indicated in the operational section of this specification is not implied. Operation beyond the maximum operating condition for extended periods may affect product reliability. ELECTROSTATIC SENSITIVE DEVICE OBSERVE HANDLING PRECAUTIONS 7

Outline Drawing Die Packaging Information [1] Standard Alternate GP-1 (Gel Pack) [2] [1] Refer to the Packaging Information section on our website for die packaging dimensions. [2] For alternate packaging information contact Analog Devices Inc. NOTES: 1. ALL DIMENSIONS ARE IN INCHES [MM] 2. DIE THICKNESS IS.4 3. TYPICAL BOND PAD IS.4 SQUARE 4. BACKSIDE METALLIZATION: GOLD 5. BOND PAD METALLIZATION: GOLD 6. BACKSIDE METAL IS GROUND. 7. CONNECTION NOT REQUIRED FOR UNLABELED BOND PADS. 8. OVERALL DIE SIZE ±.2 8

Pad Descriptions Pad Number Function Description Interface Schematic 1 RFIN 2, 12 Vgg 3-6 Vdd1 7 RFOUT 8-11 Vdd2 This pad is AC coupled and matched to Ohms over the operating frequency range. Gate control for amplifier. External bypass caps 1 pf,.1 µf and 4.7 µf are required. Only one pad connection is required as these two pads are connected on-chip. Drain bias voltage for the top half of the amplifier. External bypass capacitors of 1 pf required for each pad, followed by common.1 µf and 4.7 µf are capacitors.. This pad is AC coupled and matched to Ohms over the operating frequency range. Drain bias voltage for the lower half of the amplifier. External bypass capacitors of 1 pf required for each pad, followed by common.1 µf and 4.7 µf are capacitors. Die Bottom GND Die bottom must be connected to RF/DC ground. 9

Application Circuit *Vgg may be applied to either pad 2 or pad 12. Assembly Diagram [1] [1] Vgg may be applied to either pad 2 or pad 12. 1

Mounting & Bonding Techniques for Millimeterwave GaAs MMICs The die should be attached directly to the ground plane eutectically or with conductive epoxy (see HMC general Handling, Mounting, Bonding Note). Ohm Microstrip transmission lines on.127mm (5 mil) thick alumina thin film substrates are recommended for bringing RF to and from the chip (Figure 1). If.4mm (1 mil) thick alumina thin film substrates must be used, the die should be raised.1mm (6 mils) so that the surface of the die is coplanar with the surface of the substrate. One way to accomplish this is to attach the.12mm (4 mil) thick die to a.1mm (6 mil) thick molybdenum heat spreader (moly-tab) which is then attached to the ground plane (Figure 2). Microstrip substrates should be placed as close to the die as possible in order to minimize bond wire length. Typical die-to-substrate spacing is.76mm to.152 mm (3 to 6 mils). Handling Precautions Follow these precautions to avoid permanent damage. Storage: All bare die are placed in either Waffle or Gel based ESD protective containers, and then sealed in an ESD protective bag for shipment. Once the sealed ESD protective bag has been opened, all die should be stored in a dry nitrogen environment. Cleanliness: Handle the chips in a clean environment. DO NOT attempt to clean the chip using liquid cleaning systems. Static Sensitivity: Follow ESD precautions to protect against ESD strikes. Transients: Suppress instrument and bias supply transients while bias is applied. Use shielded signal and bias cables to minimize inductive pickup..12mm (.4 ) Thick GaAs MMIC.76mm (.3 ) RF Ground Plane Wire Bond.127mm (.5 ) Thick Alumina Thin Film Substrate Figure 1..12mm (.4 ) Thick GaAs MMIC.76mm (.3 ).1mm (.5 ) Thick Moly Tab RF Ground Plane Wire Bond.4mm (.1 ) Thick Alumina Thin Film Substrate Figure 2. General Handling: Handle the chip along the edges with a vacuum collet or with a sharp pair of bent tweezers. The surface of the chip may have fragile air bridges and should not be touched with vacuum collet, tweezers, or fingers. Mounting The chip is back-metallized and can be die mounted with AuSn eutectic preforms or with electrically conductive epoxy. The mounting surface should be clean and flat. Eutectic Die Attach: A 8/ gold tin preform is recommended with a work surface temperature of 5 C and a tool temperature of 5 C. When hot 9/1 nitrogen/hydrogen gas is applied, tool tip temperature should be 29 C. DO NOT expose the chip to a temperature greater than 3 C for more than seconds. No more than 3 seconds of scrubbing should be required for attachment. Epoxy Die Attach: Apply a minimum amount of epoxy to the mounting surface so that a thin epoxy fillet is observed around the perimeter of the chip once it is placed into position. Cure epoxy per the manufacturer s schedule. Wire Bonding RF bonds made with two 1 mil wires are recommended. These bonds should be thermosonically bonded with a force of -6 grams. DC bonds of.1 (. mm) diameter, thermosonically bonded, are recommended. Ball bonds should be made with a force of - grams and wedge bonds at 18-22 grams. All bonds should be made with a nominal stage temperature of 1 C. A minimum amount of ultrasonic energy should be applied to achieve reliable bonds. All bonds should be as short as possible, less than 12 mils (.31 mm). 11

Notes: 12