Certificate of Accreditation

PERRY JOHNSON LABORATORY ACCREDITATION, INC. Certificate of Accreditation Perry Johnson Laboratory Accreditation, Inc. has assessed the Laboratory of: Quad State Gauging and Measurement, Inc. (Hereinafter called the Organization) and hereby declares that Organization is accredited in accordance with the recognized International Standard: ISO/IEC 17025:2005 & Meets the Requirements of ANSI/NCSL Z540-1-1994 & ANSI/NCSI Z540.3-2006 sub clause 5.3 This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory quality management system (as outlined by the joint ISO-ILAC-IAF Communiqué dated April 2017): Dimensional, Electrical, Mass, Force & Weighing, Mechanical, Time & Frequency and Thermodynamic Calibration (As detailed in the supplement) Accreditation claims for such testing and/or calibration services shall only be made from addresses referenced within this certificate. This Accreditation is granted subject to the system rules governing the Accreditation referred to above, and the Organization hereby covenants with the Accreditation body s duty to observe and comply with the said rules. For PJLA: Initial Accreditation Date: Issue Date: Expiration Date: June 6, 2006 October 3, 2018 December 31, 2020 Tracy Szerszen President/Operations Manager Perry Johnson Laboratory Accreditation, Inc. (PJLA) 755 W. Big Beaver, Suite 1325 Troy, Michigan 48084 Accreditation Certificate No.: 59390 L18-472 The validity of this certificate is maintained through ongoing assessments based on a continuous accreditation cycle. The validity of this certificate should be confirmed through the PJLA website: www.pjlabs.com

Dimensional MEASURED INSTRUMENT, RANGE (AND SPECIFICATION WHERE ) CAPABILITY EXPRESSED AS AN UNCERTAINTY (±) Length - Single Axis F 0.000 356 mm to 1 200 mm 0.000 356 mm ULM (0.000 014 in to 47.244 in) Length - 5 Axis Max F 762 mm cube (30 in) 0.002 03 mm/axis High Accuracy CMM with High accuracy Probe System and Head Inside Cylindrical 0.000 24 mm to 310 mm 0.000 24 mm Comparative Ring F (0.000 009 44 in to 12.204 72 in) 0.000 56 mm to 610 mm 0.000 56 mm ULM (0.000 022 in to 24.015 7 in) 0.002 03 mm to 762 mm (0.000 079 92 in to 30 in) 0.002 03 mm High Accuracy CMM with High accuracy Probe System and Head Height F 0.000 96 mm to 900 mm (0.000 037 7 in to 35.433 07 in) 0.000 96 mm Comparative (Surface Plate, Height Gage, and Gage Block Comparative) 0.002 03 mm to 1 000 mm 0.002 03 mm High Accuracy CMM (0.000 079 9 in 39.37 in) Thread Plugs PD or 0.001 3 mm to 8 mm pitch 0.001 3 mm ULM and 3 wire method MOW F (0.000 051 18 in to 0.314 96 in) Thread Plugs Major 0.000 356 mm to 610 mm 0.000 356 mm ULM Diameter F (0.000 014 02 in to 24.015 75 in) Pipe Plugs Tapered F 0.002 6 mm to 102 mm 0.002 6 mm ULM, 3 Wires and Sine Bar (0.000 102 4 in to 4.015 75 in) Surface Plate Flatness F 0.002 03 mm to 762 mm square (0.000 079 92 in to 30 in) 0.002 03 mm/axis High Accuracy CMM and High Accuracy Probe System 300 mm to 3 100 mm square 0.001 8 mm Electronic Levels (11.811 in to 122.047 in) Thread Rings F 0.004 5 mm to 330 mm (Split Design) 0.001 5 mm Masters Class W (Functional Test) (0.000 177 in to 12.992 1 in) 0.001 mm to 330 mm 0.001 mm ULM and 2 Ball Method (Solid Design) (0.000 039 3 in to 12.992 1 in) Linear 0.000 356 mm to 1 200 mm 0.000 356 mm ULM Measurements F (0.000 014 in to 47.244 in) 0.002 03 mm to 2 000 mm (0.000 079 9 in to 78.740 in) 0.002 03 mm High Accuracy CMM and High Accuracy Probe and Head Optical Comparator 0.011 mm to 330 mm 0.011 mm OGP Calibration Kit Linearity FO (0.000 433 in to 12.992 in) Optical Comparator 0.023 to 360 0.023 Master Angle Artifacts Angularity FO Optical Comparator 0.03 X to 50 X 0.03 mm OGP Calibration Kit Magnification FO Surface Roughness 0 mm to.075 mm 0.000136 mm Profilometer Issue: 10/2018 This supplement is in conjunction with certificate #L18-472 Page 2 of 9

Electrical Equipment to Measure DC Voltage F Equipment to Measure DC Current F Equipment to Measure Resistance F Up to 100 mv 0.025 mv Fluke 5520A 100 mv to 1 V 0.017 mv 1 V to 10 V 0.000 07 V 10 V to 100 V 0.000 6 V 100 V to 1 000 V 0.006 V -20.5 A to 20.5 A 0.000 22 A 0.1 µa to 1 µa 0.006 µa 1 µa to 10 µa 0.6 µa 10 µa to 100 µa 0.8 µa 0.1 ma to 10 ma 0.12 ma 10 ma to 100 ma 0.12 ma 0.1 A to 1 A 0.000 29 A Up to 10 Ω 0.001 4 Ω 10 Ω to 100 Ω 0.001 8 Ω 0.1 kω to 1 kω 0.000 007 kω 1 kω to 10 kω 0.000 065 kω 10 kω to 100 kω 0.000 65 kω 0.1 MΩ to 1 MΩ 0.000 006 MΩ 1 MΩ to 10 MΩ 0.000 06 MΩ 10 MΩ to 100 MΩ 0.003 7 MΩ 0.1 GΩ to 1 GΩ 0.6 MΩ Up to 100 Hz Up to 10 mv 0.006 mv 100 Hz to 1 khz Up to 10 mv 0.006 mv 1 khz to 10 khz Up to 10 mv 0.006 mv 10 khz to 100 khz Up to 10 mv 0.011 mv Issue: 10/2018 This supplement is in conjunction with certificate #L18-472 Page 3 of 9

Electrical Up to 100 Hz 10 mv to 100 mv 0.18 mv 100 Hz to 1 khz 10 mv to 100 mv 0.18 mv 1 khz to 10 khz 10 mv to 100 mv 0.20 mv 10 khz to 100 khz 10 mv to 100 mv 2.5 mv Up to 100 Hz 0.1 V to 1 V 0.000 26 V 100 Hz to 1 khz 0.1 V to 1 V 0.000 26 V 1 khz to 10 khz 0.1 V to 1 V 0.000 31 V 10 khz to 100 khz 0.1 V to 1 V 0.003 6 V Up to 100 Hz 1 V to 10 V 0.001 1 V 100 Hz to 1 khz 1 V to 10 V 0.001 1 V 1 khz to 10 khz 1 V to 10 V 0.001 2 V 10 khz to 100 khz 1 V to 10 V 0.003 1 V Up to 100 Hz 10 V to 100 V 0.006 6 V 100 Hz to 1 khz 10 V to 100 V 0.006 6 V 1 khz to 10 khz 10 V to 100 V 0.009 6 V 10 khz to 100 khz 10 V to 100 V 0.063 V Up to 100 Hz 100 V to 700 V 0.062 V 100 Hz to 1 khz 100 V to 700 V 0.062 V 1 khz to 10 khz 100 V to 700 V 0.062 V Up to 50 Hz 29 µa to 100 µa 0.28 µa 50 Hz to 100 Hz 29 µa to 100 µa 0.28 µa 100 Hz to 1 khz 29 µa to 100 µa 0.54 µa Fluke 5520A Issue: 10/2018 This supplement is in conjunction with certificate #L18-472 Page 4 of 9

Electrical Up to 50 Hz 0.1 ma to 1 ma 1.2 µa 50 Hz to 100 Hz 0.1 ma to 1 ma 0.001 2 ma 100 Hz to 1 khz 0.1 ma to 1 ma 0.002 4 ma 1 khz to 10 khz 0.1 ma to 1 ma 13 µa Up to 50 Hz 1 ma to 10 ma 0.007 2 ma 50 Hz to 100 Hz 1 ma to 10 ma 0.007 2 ma 100 Hz to 1 khz 1 ma to 10 ma 0.012 ma 1 khz to 10 khz 1 ma to 10 ma 0.053 ma Up to 50 Hz 10 ma to 100 ma 0.072 ma 50 Hz to 100 Hz 10 ma to 100 ma 0.072 ma 100 Hz to 1 khz 10 ma to 100 ma 0.18 ma 1 khz to 10 khz 10 ma to 100 ma 0.72 ma Up to 50 Hz 100 ma to 1 A 0.000 72 A 50 Hz to 100 Hz 100 ma to 1 A 0.000 72 A 100 Hz to 1 khz 100 ma to 1 A 0.008 4 A 1 khz to 10 khz 100 ma to 1 A 0.036 A Equipment to Measure Capacitance 10 Hz to 10 khz Up to 1 nf 0.018 nf 10 Hz to 1 khz 1 nf to 10 nf 0.042 nf 10 Hz to 1 khz 10 nf to 100 nf 0.42 nf 10 Hz to 600 Hz 100 nf to 1 µf 0.004 2 µf 10 Hz to 150 Hz 1 µf to 10 µf 0.042 µf 10 Hz to 80 Hz 10 µf to 100 µf 1.2 µf Fluke 5520A Issue: 10/2018 This supplement is in conjunction with certificate #L18-472 Page 5 of 9

Electrical Temperature Calibration, Indication and Control Equipment used with Thermocouple Type E F Temperature Calibration, Indication and Control Equipment used with Thermocouple Type J F Temperature Calibration, Indication and Control Equipment used with Thermocouple Type K F Temperature Calibration, Indication and Control Equipment used with Thermocouple Type T F -250 C to -100 C 0.6 C Electrical Simulation of -100 C to -25 C 0.2 C Thermcouple Output Fluke 5520A -25 C to 350 C 0.18 C 350 C to 650 C 0.2 C 650 C to 1 000 C 0.26 C -210 C to -100 C 0.33 C -100 C to -30 C 0.2 C -30 C to 150 C 0.18 C 150 C to 760 C 0.21 C 760 C to 1 200 C 0.28 C -200 C to -100 C 0.4 C -100 C to -25 C 0.22 C -25 C to 120 C 0.2 C 120 C to 1 000 C 0.32 C 1 000 C to 1 372 C 0.48 C -250 C to -150 C 0.76 C -150 C to 0 C 0.29 C 0 C to 120 C 0.2 C 120 C to 400 C 0.18 C Mass, Force, and Weighing Devices Weights F 0.001 g to 80 g (0.01 + 5.95 x 10-5 Wt) mg Comparative 80 g to 210 g (0.01 + 5.95 x 10-5 Wt) mg 200 g to 500 g (0.01 + 5.95 x 10-5 Wt) mg 500 g to 2 kg (0.01 + 5.95 x 10-5 Wt) mg 2 kg to 32 kg (0.01 + 5.95 x 10-5 Wt) mg Force F 0.044 N to 445 N 1.3 N Instron Test Equipment 445 N to 4 448 N 14 N 4 448 N to 222 411 N 140 N Issue: 10/2018 This supplement is in conjunction with certificate #L18-472 Page 6 of 9

Mechanical Torque Instruments F 0.001 N m to 5.65 N m (0.06 + 2.67 x 10-3 T) N m Torque Transducers 0.001 N m to 28.25 N m (0.1 + 2.67 x 10-3 T) N m and/or Torque Meter 0.001 N m to 113 N m (0.1 + 2.67 x 10-3 T) N m 0.001 N m to 340 N m (0.1 + 2.67 x 10-3 T) N m 0.001 N m to 1 358 N m (0.1 + 2.67 x 10-3 T) N m Oil Pressure F 34 kpa to 68 948 kpa 3.5 kpa Dead Weight Tester Air Pressure F 3.45 kpa to 827 kpa 3.5 kpa Comparative Tester Vacuum F 0.062 kpa to 102 kpa 0.84 kpa Comparative Tester Hardness, Surface F Indirect Verification of 100 to 600 Brinell 20 HRC to 80 HRC 2.0 respective hardness points Rockwell Hardness 20 HRB to 100 HRB Tester F 60 HRA to 90 HRA 65 H15-N to 96 H15-N 40 H30-N to 92 H30-N 60 H15-T to 95 H15-T 15 H30-T to 84 H30-T 63 Knoop to 846 Knoop Calibrated Rockwell Hardness Test Blocks Time and Frequency Equipment to measure Frequency or Time F Up to 100 Hz 0.06 Hz Fluke 5520A 100 Hz to 1 khz 0.000 6 khz Frequency/Time Measure 1 khz to 10 khz 0.006 khz 10 khz to 100 khz 0.06 khz 100 khz to 1 MHz 0.000 6 MHz Issue: 10/2018 This supplement is in conjunction with certificate #L18-472 Page 7 of 9

Thermodynamic Temperature Measurement RTD Pt 385, 100 Ω F -196 C to 800 C 0.95 C Fluke 5520A Fluke 714 RTD Pt 3926, 100Ω F RTD Pt 3916, 100 Ω F RTD Pt 385, 200 Ω F RTD Pt 385, 500 Ω F RTD Pt 385, 1 000 Ω F Temperature Measurement -80 C to 260 C 0.95 C RTD Ni 120, 120 Ω F Temperature Measurement -100 C to 260 C 0.95 C RTD Cu 427, 10 Ω F Temperature Measurement -196 C to 1 200 C 4.4 C Thermocouple Type J F Temperature Measurement -196 C to 1 370 C 4.4 C Thermocouple Type K F Temperature Measurement -196 C to 400 C 4.4 C Thermocouple Type T F Temperature Measurement -196 C to 950 C 4.4 C Thermocouple Type E F Temperature Measurement -196 C to 1 300 C 4.4 C Thermocouple Type N F Temperature Measurement -20 C to 1 750 C 4.4 C Thermocouple Type R F Temperature Measurement -20 C to 1 750 C 4.4 C Thermocouple Type S F Temperature Measurement 600 C to 1 800 C 4.4 C Thermocouple Type B F Thermometers F -45 C to 650 C 1.8 C Dry Hot and Cold Deep Temperature Wells Infrared/Non-contact 50 C to 500 C 2.5 C Blackspot Thermometers F Ovens O -196 C to 1 370 C 3.5 C Fluke 724 Temperature Calibrator Issue: 10/2018 This supplement is in conjunction with certificate #L18-472 Page 8 of 9

1. The CMC (Calibration and Measurement Capability) stated for calibrations included on this scope of accreditation represents the smallest measurement uncertainty attainable by the laboratory when performing a more or less routine calibration of a nearly ideal device under nearly ideal conditions. It is typically expressed at a confidence level of 95 % using a coverage factor k (usually equal to 2). The actual measurement uncertainty associated with a specific calibration performed by the laboratory will typically be larger than the CMC for the same calibration since capability and performance of the device being calibrated and the conditions related to the calibration may reasonably be expected to deviate from ideal to some degree. 2. The laboratories range of calibration capability for all disciplines for which they are accredited is the interval from the smallest calibrated standard to the largest calibrated standard used in performing the calibration. The low end of this range must be an attainable value for which the laboratory has or has access to the standard referenced. Verification of an indicated value of zero in the absence of a standard is common practice in the procedure for many calibrations but by its definition it does not constitute calibration of zero capacity. 3. The presence of a superscript F means that the laboratory performs calibration of the indicated parameter at its fixed location. Example: Outside Micrometer F would mean that the laboratory performs this calibration at its fixed location. 4. The presence of a superscript O means that the laboratory performs calibration of the indicated parameter onsite at customer locations. Example: Outside Micrometer O would mean that the laboratory performs this calibration onsite at the customer s location. 5. The presence of a superscript FO means that the laboratory performs calibration of the indicated parameter both at its fixed location and onsite at customer locations. Example: Outside Micrometer FO would mean that the laboratory performs this calibration at its fixed location and onsite at customer locations. 6. Measurement uncertainties obtained for calibrations performed at customer sites can be expected to be larger than the measurement uncertainties obtained at the laboratories fixed location for similar calibrations. This is due to the effects of transportation of the standards and equipment and upon environmental conditions at the customer site which are typically not controlled as closely as at the laboratories fixed location. 7. The term Wt represents weight in pounds or grams (including SI multiple and submultiple units) appropriate to the uncertainty statement. 8. The term T represents torque in N m (including SI multiple and submultiple units) appropriate to the uncertainty statement. Issue: 10/2018 This supplement is in conjunction with certificate #L18-472 Page 9 of 9