Millimeter Spherical µ-lab System from Orbit/FR Jim Puri Sr. Applications Engineer Orbit/FR, Inc. a Microwave Vision Group company Keysight Technologies and MVG Orbit/FR Partners in Radiated Measurement Science 1
Agenda Introductions Who we are and What we do Our Long History with HP Agilent Keysight Examples of our Systems deployed worldwide utilizing Keysight hardware Commercial and Consumer Millimeter Wave Applications and Devices The Measurement Challenges Introduction to The µ-lab A Complete measurement Laboratory in a small portable footprint Key Features of the µ-lab System Block Diagrams and Hardware Configurations The Future expansion of this test system Literature Available How to connect with MVG Orbit/FR Closing comments and Q&A 2
The Microwave Vision Group is Microwave Vision Group (MVG) combines the technology and expertise, product portfolios and infrastructures of four industry leaders: SATIMO, Orbit/FR, AEMI and Rainford EMC Systems. 3
How Orbit/FR fits into the MVG Organization 4
Our History MVG - Orbit/FR offers a complete measurement solution utilizing the latest Keysight Technologies instrumentation and hardware. We have a long history as partners with HP/Agilent/Keysight Technologies that spans more than 30 years.. 5
Our Customers and the Industries we serve Aerospace Defense Direct Government Cellular and Computing Automotive Semiconductor Universities 6
What we do We are a Keysight Technologies Solution Partner We Integrate turnkey antenna measurement systems utilizing Keysight Technologies sources and receivers such as PNA series Network Analyzers, Spectrum Analyzers, Sources and distributed frequency converter systems. We utilize Keysight Technologies COTS Test and Measurement Equipment and combine it with our Chambers, Absorber, Positioning Systems and Software to create a Complete Turnkey Measurement System for our customers. 7
Exemples of Our Antenna Measurement Systems 8
Planar Near Field Systems Planar Near Field and Combination Far Field Compact Range Systems 9
Automotive Turntable Test Systems Automotive Single Probe Automotive Multi Probe Automotive Single/Multi Probe 10
Large Outdoor Antenna Measurement Systems 11
Devices and Challenges What are the types of devices targeting commercial and consumer applications? and What are the Challenges involved in these types of measurements? 12
Today s Consumer Millimeter Devices 77GHz Automotive Radar 13
Today s Consumer Millimeter Devices 60GHz Wireless HD RF ASIC antenna array integrated into the top layer of the RFIC. 52 Element Array 14
Today s Consumer Millimeter Devices WiGig Devices 15
Today s Consumer Millimeter Devices E Band Backhaul and Fronthaul Fixed Beam Steerable Array 16
ASIC System On a Chip Antenna Arrays on Die Substrate or built directly into System on a Chip ASICs 17
The Challenges The Challenge of Testing today s Consumer Millimeter Devices > System must be flexible for a wide variety of devices > High Accuracy is needed > Many beam states must be measured and Characterized > Chip (die) based antenna > ASIC System on a chip antenna measurements > How do we acquire a reference for phase? > Cost of test must be driven down 18
Today s Consumer Millimeter Devices Question? What do all of these devices have in common? 19
Today s Consumer Millimeter Devices Question? What do all of these devices have in common? Answer. They all have the need for Antenna Characterization. 20
Introduction to the µ-lab µ-lab from 21
MVG Orbit/FR µ-lab µ-lab The µ-lab is a Millimeter Wave Spherical Measurement System with primary operation targeting small aperture devices in V, E, and W-Bands (50GHz to 110GHz). * Other frequency coverage is available upon request. 22
µ-lab: A novel solution A patent pending turn-key millimeter wave test system called µ-lab Complete measurement laboratory in a small portable foot-print Designed to support antenna test and measurements of the demanding WiGig products as well as many other millimeter wave technologies Precise measurements using spherical geometry Cost effective solution 5ft x 5ft x 5ft anechoic chamber Fits through standard double doors (USA) 23
µ-lab: Key Features Source and Receiver Designed to leverage advanced capabilities of Keysight Technologies PNA and PNA-X Vector Network Analyzers Device as source and X Series Keysight Spectrum Analyzers with Smart Mixers Elevation Gantry Arm over Azimuth Positioning System Gantry Arm rotates in Azimuth around the Device Under test (DUT) This realizes a 30 centimeter sphere around the DUT. Non-Rotating Center Mount Column provides virtually invisible support for DUTs like notebook computers or other connectorized devices and antennas while providing maximum amplitude and phase stability 64Bit workstation with Orbit/FR s 959 Spectrum data acquisition and analysis software MVG Orbit/FR s industry leading positioners and position control technology 24
µ-lab: Central Test Column Configuration Stationary Central Test Column Theta Axis Elevation Axis Rotating Elevation Gantry Arm w/nf Probe Azimuth Axis Platter mmwave Module 25
µ-lab: Device and Connectorized DUT Test Configuration Notebook Device Connectorized Horn DUT 26
µ-lab: Unique Dual Mode Operation Problem Devices expected to include WiGig solutions are highly integrated subsystems or Systems on a Chip (SOC). WiGig Subsystem is expected to utilize antenna designed on chips Chip Antenna development will require non-connectorized testing (i.e. micro-probe interface to DUT) Solution Dual Mode Operation Central Support Column Option for connectorized DUT Operator removable Micro-probing Assembly Option for micro-probing DUT interface Operator removable 27
µ-lab: Micro-Probing Option Required for chip antenna testing Micro-Probing Option Includes: Micro-Probe Mount Assembly Vision System Advanced Calibration routines (software) Associated cables, and waveguide as required 28
µ-lab: Micro-Probe Mount Assembly Micro-Probe Mount Assembly Vertical structure (goose-neck) Probe positioner micro-positioning of probe Chuck Macro-X translator 29
µ-lab: Vision System Vision System Camera Monitors Mounts Deployment and stow mechanism 30
µ-lab: Vision System 31
Spherical coverage 32
µ-lab: Micro-Probing Spherical Coverage Spherical Coverage over 90% The realized final coverage is the complete sphere minus a cone +25 and -40 theta and ±25 phi directly behind the microprobe Images on this slide show the system with the chamber, absorber, and waveguide removed to illustrate Micro-probing Spherical Coverage of the RF Probe. These images show physical constraints only Additional radiation blockage exists behind the micro-probe and its positioner Upper Hemisphere complete coverage just below the equator (physical impasse with support column) Lower Hemisphere complete coverage minus the surface from θ = -65 to 130 between φ = ±25 33
µ-lab: Micro-Probing Spherical Coverage 34
µ-lab: Micro-Probing Spherical Coverage 35
µ-lab: Micro-Probing Spherical Coverage 36
µ-lab: Micro-Probing Spherical Coverage 37
System Block Diagram PNA Network Analyzer 38
System Block Diagram Spectrum Analyzer 39
Review Physical Layout 40
Review Key Features 41
µ-lab Preferred PNA and PNA X configurations PNA - N5222A 417 (4-Port, configurable test set, Source attenuators, receiver attenuators, internal second source) 080 (Frequency offset) PNA-X - N5242A 419 (4-Port, configurable test set (std.), source attenuators, receiver attenuators, internal second source) 080 (Frequency offset) Contact MVG Sales and Engineering for Compatibility with other possible PNA Configurations 42
µ-lab Preferred Spectrum Analyzer Configuration N9020A X Series Spectrum Analyzer 503 10MHz to 3.6GHz EXM External Mixing Option M1970A Waveguide Smart Mixer V Band option 002 (50 80GHz) or E Band 60 90GHz or W Band 75 110GHz 43
Future Integrating OTA with the µ-lab 44
Literature from MVG Orbit/FR http://www.orbitfr.com/sites/www.orbitfr.com/files/-lab_2014_bd.pdf 45
Literature from Keysight Technologies http://literature.cdn.keysight.com/litweb/pdf/5991-4632en.pdf 46
How to Contact us How to Connect with Anna Moyer Western Regional Sales Manager 215-674-5100 X3074 annam@orbitfr.com Tom McKeown Eastern Regional Sales Manager 215-674-5100 X3060 tom@orbitfr.com Ed Szpindor Director of RF Systems Engineering 215-674-5100 X 3021 edwards@orbitfr.com Jim Puri Sr. Applications Engineer 215-674-5100 X 3016 jimp@orbitfr.com 47
Thank you for attending today s Solution Partner webinar 48
Questions?