SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 & ANSI/NCSL Z540-1-1994 TRANE LA CROSSE METROLOGY LAB 2313 20th Street South La Crosse, WI 54601 Rick McKenzie Phone: 608 787 4032 CALIBRATION Valid To: October 31, 2019 Certificate Number: 3495.01 In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to this laboratory to perform the following calibrations 1 : I. Dimensional Parameter/Equipment Range CMC 2 ( ) Comments Linear Measurements Up to 100 mm 0.034 mm Mitutoyo 500-197-20 caliper II. Electrical DC/Low Frequency Parameter/Equipment Range CMC 2, 3 ( ) Comments DC Voltage Generate (16.5 to 220) mv 19 µv/v + 1.2 µv Fluke 5520A/5522A (0 to 1100) V 9.9 µv/v + 0.31 µv DC Voltage Measure 200 V to 2 kv (2 to 20) kv 1.6 V 32 V Vitrek 4600A DC Current Generate (22 to 220) µa 220 µa to 2.2 ma (2.2 to 22) ma (22 to 220) ma 220 ma to 2.2 A (2.2 to 11) A 8.1 na 17 na 180 na 960 na 13 µa 220 µa (A2LA Cert. No. 3495.01) 07/02/2018 Page 1 of 8
Parameter/Equipment Range CMC 2, 3 ( ) Comments DC Power Generate 0.5 W to 3 kw 60 µw/w + 55 µw Fluke 5520A/5522A, A40 current shunt, Agilent 3458A Resistance Measure (0.1 to 10) Ω (10 to 100) Ω 100 Ω to 1 kω (1 to 10) kω (10 to 100) kω 100 kω to 1 MΩ (1 to 10) MΩ (10 to 100) MΩ 100 MΩ to 1 GΩ 0.2 mω 1.7 mω 11 mω 110 mω 1.1 Ω 17 Ω 600 Ω 51 kω 94 kω Agilent 3458A Resistance Generate (4-wire mode) (0 to 10.9) Ω (11 to 32.9) Ω (33 to 109) Ω (110 to 329) Ω 330 Ω to 1.09 kω (1.1 to 3.29) kω (3.3 to 10.9) kω (11 to 32.9) kω (33 to 109) kω (110 to 329) kω 330 kω to 1.09 MΩ (1.1 to 3.29) MΩ (3.3 to 10.9) MΩ (11 to 32.9) MΩ (33 to 109) MΩ (110 to 329) MΩ (330 to 1100) MΩ 0.99 mω 1.8 mω 3.3 mω 7.6 mω 25 mω 78 mω 250 mω 770 mω 2.6 Ω 8.6 Ω 27 Ω 160 Ω 1 kω 7.2 kω 40 kω 730 kω 10 MΩ Fluke 5520A/5522A Fixed Points 1 Ω 1.9 Ω 10 Ω 19 Ω 100 Ω 190 Ω 1 kω 1.9 kω 10 kω 19 kω 100 kω 190 kω 1 MΩ 1.9 MΩ 10 MΩ 19 MΩ 100 MΩ 110 µω 210 µω 270 µω 550 µω 1.2 mω 2.5 mω 8.6 mω 20 mω 86 mω 200 mω 1.1 Ω 2.7 Ω 20 Ω 53 Ω 440 Ω 1.1 kω 16 kω (A2LA Cert. No. 3495.01) 07/02/2018 Page 2 of 8
Parameter/Equipment Range CMC 2 ( ) Comments Resistance Generate (4-wire mode) (cont) Fixed Points 10 kω 120 mω Fluke 742A-10k 400 Ω 3.1 mω Hart 5420-400 25 Ω 590 µω Fluke 742A-25 1 Ω 32 µω Fluke 742A-1 Electrical Calibration of Thermocouple Indicators Generate Type E (-250 to -100) C (-100 to -25) C (-25 to 350) C (350 to 650) C (650 to 1000) C 0.51 C 0.51 C 0.20 C 0.20 C 0.24 C Fluke 5520A/5522A Type K (-200 to -100) C (-100 to -25) C (-25 to 120) C (120 to 1000) C (1000 to 1372) C 0.36 C 0.35 C 0.22 C 0.29 C 0.42 C Type J (-200 to -100) C (-100 to 800) C (800 to 1200) C 0.30 C 0.29 C 0.26 C Type T (-250 to -150) C (-150 to 0) C (0 to 120) C (120 to 400) C 0.64 C 0.64 C 0.27 C 0.20 C (A2LA Cert. No. 3495.01) 07/02/2018 Page 3 of 8
Parameter/Range Frequency CMC 2, 3 ( ) Comments Capacitance Generate (0.19 to 0.399) nf (0.4 to 1.09) nf (1.1 to 3.29) nf (3.3 to 10.9) nf (11 to 32.9) nf (33 to 109.9) nf (110 to 329.9) nf (0.33 to 1.09) µf (1.1 to 3.29) µf (3.3 to 10.9) µf (11.0 to 32.9) µf (33.0 to 109.9) µf (110 to 329.9) µf (0.33 to 1.09) mf (1.1 to 3.29) mf (3.3 to 10.9) mf (11 to 32.9) mf (33 to 110) mf 10 Hz to 10 khz 10 Hz to 10 khz 10 Hz to 3 khz 10 Hz to 1 khz 10 Hz to 1 khz 10 Hz to 1 khz 10 Hz to 1 khz (10 to 600) Hz (10 to 300) Hz (10 to 150) Hz (10 to 120) Hz (10 to 80) Hz (0 to 50) Hz (0 to 20) Hz (0 to 6) Hz (0 to 2) Hz (0 to 0.6) Hz (0 to 0.2) Hz 11 pf 18 pf 24 pf 120 pf 190 pf 1.2 nf 1.4 nf 14 nf 14 nf 120 nf 170 nf 1.2 µf 3.1 µf 32 µf 54 µf 140 µf 400 µf 1.4 mf Fluke 5520A/5522A AC Voltage Measure 200 V to 2 kv (2 to 20) kv (20 to 100) Hz 3.2 V 90 V Vitrek 4600A AC Voltage Generate (2.2 to 22) mv 5.3 µv 4.9 µv 4.8 µv 4.8 µv 5.1 µv 7.1 µv (22 to 220) mv 6 µv 6.9 µv 6.7 µv 6.7 µv 9.7 µv 18 µv (0.22 to 2.2) V 76 µv 76 µv 23 µv 23 µv 39 µv 98 µv (A2LA Cert. No. 3495.01) 07/02/2018 Page 4 of 8
Parameter/Range Frequency CMC 2, 3 ( ) Comments AC Voltage Generate (cont) (2.2 to 22) V 680 µv 260 µv 120 µv 120 µv 250 µv 250 µv (22 to 220) V 6.8 mv 2.5 mv 2.5 mv 1.2 mv 1.9 mv 2.4 mv (220 to 1100) V (20 to 50) Hz 50 Hz to 1 khz 15 mv 15 mv AC Current Generate (22 to 220) μa 55 na 85 na W/5725A (0.22 to 2.2) ma 55 na 85 na (2.2 to 22) ma 730 na 450 na 450 na 310 na 640 na (22 to 220) ma 60 µa 3.1 µa 3.1 µa 3.0 µa 5.7 µa (A2LA Cert. No. 3495.01) 07/02/2018 Page 5 of 8
Parameter/Range Frequency CMC 2, 3, 4 ( ) Comments AC Current Generate (cont) (0.22 to 2.2) A 20 Hz to 1 khz 29 µa 29 µa 55 µa W/5725A (2.2 to 11) A 660 µa 660 µa 1.2 ma 5 ma to 20 A Fixed Point 60 Hz 0.045 % + 0.050 µa Fluke 5520A, Fluke A40B, and Agilent 3458A 20 A 45 Hz 100 Hz 1 khz 5 khz 20 ma 20 ma 24 ma 41 ma Fluke 5520A AC Current Transformers Ratio Error and Phase Displacement (5 to 2400) A 60 Hz Ratio: 0.000 88 Phase: 3.7 minutes TCF: 0.057 % PMT 20010 and Yokogawa Type 2241 1500:5 CT AC Power Generate 640 mw to 80.64 kw (16 to 69) Hz 0.050 % + 2.5 µw Fluke 6105A 0.5 W to 3 kw 60 Hz to 10 khz 0.047 % Fluke 5520, Fluke A40B, Agilent 3458A III. Fluid Quantities Parameter/Equipment Range CMC 2, 4 ( ) Comments Liquid Flow (0.03 to 50) GPM 0.079 % + 0.0011 GPM Flow technology MT-50 (A2LA Cert. No. 3495.01) 07/02/2018 Page 6 of 8
IV. Mechanical Parameter/Equipment Range CMC 2 ( ) Comments Pressure Measuring Equipment Pneumatic, Nitrogen (-14 to 25) psig 15 µpsi/psi + 84 µpsi Ruska 2465 (-14 to 100) psig 13 µpsi/psi + 48 µpsi (-14 to 1000) psig 40 µpsi/psi + 57 µpsi (10 to 100) in H 2 O 5.6 µpsi/psi + 32 µpsi Ruska 7250LP Hydraulic (1000 to 5000) psig 1.4 psi Fluke RPM4-E-DWT Mass Measurement (50 to 5000) g 0.054 g Ohaus EP6102C V. Thermodynamic Parameter/Equipment Range CMC 2 ( ) Comments Temperature Sensor (-40 to 101.6) C 9.4 mk Hart 7040 liquid bath, Hart 5628 PRT, Hart 1502A Humidity Measuring Equipment (10 to 95) % RH 0.61 % RH Thunder Scientific 2500 VI. Time & Frequency Parameter/Equipment Range CMC 2 ( ) Comments Frequency Measuring Equipment 3 Hz to 1 MHz 2.0 µhz/hz + 100 µhz Agilent 33250A 1 Commercial calibration service is sometimes available for this laboratory. (A2LA Cert. No. 3495.01) 07/02/2018 Page 7 of 8
2 Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC due to the behavior of the customer s device and to influences from the circumstances of the specific calibration. 3 The stated measured values are determined using the indicated instrument (see Comments). This capability is suitable for the calibration of the devices intended to measure or generate the measured value in the ranges indicated. CMCs are expressed as either a specific value that covers the full range or as a percent or fraction of the reading plus a fixed floor specification. 4 In the statement of CMC, the value is defined as the percentage of reading. (A2LA Cert. No. 3495.01) 07/02/2018 Page 8 of 8
Accredited Laboratory A2LA has accredited TRANE LA CROSSE DEVELOPMENT LAB La Crosse, WI for technical competence in the field of Calibration This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories. This laboratory also meets ANSI/NCSL Z540-1-1994 and R205 Specific Requirements: Calibration Laboratory Accreditation Program. This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory quality management system (refer to joint ISO-ILAC-IAF Communiqué dated April 2017). Presented this 2 nd day of July 2018. President and CEO For the Accreditation Council Certificate Number 3495.01 Valid to October 31, 2019 For the calibrations to which this accreditation applies, please refer to the laboratory s Calibration Scope of Accreditation.