IRFP460. N - CHANNEL 500V Ω - 20 A - TO-247 PowerMESH MOSFET

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Transcription:

IRFP460 N - CHANNEL 500V - 0.22 Ω - 20 A - TO-247 PowerMESH MOSFET TYPE V DSS R DS(on) I D IRFP460 500 V < 0.27 Ω 20 A TYPICAL RDS(on) = 0.22 Ω EXTREMELY HIGH dv/dt CAPABILITY 100% AVALANCHE TESTED VERY LOW INTRINSIC CAPACITANCES GATE CHARGE MINIMIZED DESCRIPTION This power MOSFET is designed using the company s coolidated strip layout-based MESH OVERLAY process. This technology matches and improves the performances compared with standard parts from various sources. TO-247 1 2 3 APPLICATIONS HIGH CURRENT SWITCHING UNINTERRUPTIBLE POWER SUPPLY (UPS) DC/DC COVERTERS FOR TELECOM, INDUSTRIAL, AND LIGHTING EQUIPMENT. INTERNAL SCHEMATIC DIAGRAM ABSOLUTE MAXIMUM RATINGS Symbol Parameter Value Unit V DS Drain-source Voltage (V GS =0) 500 V V DGR Drain- gate Voltage (R GS =20kΩ) 500 V V GS Gate-source Voltage ± 20 V I D Drain Current (continuous) at T c =25 o C 20 A I D Drain Current (continuous) at T c =100 o C 13 A I DM ( ) Drain Current (pulsed) 80 A P tot Total Dissipation at T c =25 o C 250 W Derating Factor 2 W/ o C dv/dt(1) Peak Diode Recovery voltage slope 3.5 V/ T stg Storage Temperature -65 to 150 Tj Max. Operating Junction Temperature 150 ( ) Pulse width limited by safe operating area ( 1) I SD 20 Α, di/dt 160 A/µs, V DD V (BR)DSS, Tj T JMAX o C o C September 1998 1/8

THERMAL DATA R thj-case Rthj-amb R thc-sink Tl Thermal Resistance Junction-case Max Thermal Resistance Junction-ambient Max Thermal Resistance Case-sink Typ Maximum Lead Temperature For Soldering Purpose 0.5 30 0.1 300 o C/W oc/w o C/W o C AVALANCHE CHARACTERISTICS Symbol Parameter Max Value Unit I AR E AS Avalanche Current, Repetitive or Not-Repetitive (pulse width limited by T j max) Single Pulse Avalanche Energy (starting T j =25 o C, I D =I AR,V DD =50V) 20 A 1000 mj ELECTRICAL CHARACTERISTICS (Tcase =25 o C unless otherwise specified) OFF Symbol Parameter Test Conditio Min. Typ. Max. Unit V (BR)DSS I DSS I GSS Drain-source Breakdown Voltage Zero Gate Voltage Drain Current (V GS =0) Gate-body Leakage Current (V DS =0) ID =250µA VGS =0 500 V V DS =MaxRating V DS = Max Rating T c =125 o C 10 100 V GS = ± 20 V ± 100 na µa µa ON ( ) Symbol Parameter Test Conditio Min. Typ. Max. Unit V GS(th) Gate Threshold Voltage V DS =V GS I D = 250 µa 2 3 4 V R DS(on) Static Drain-source On Resistance V GS =10V I D = 12 A 0.22 0.27 Ω I D(on) On State Drain Current V DS >I D(on) xr DS(on )max V GS =10V 20 A DYNAMIC Symbol Parameter Test Conditio Min. Typ. Max. Unit g fs ( ) C iss C oss C rss Forward Traconductance Input Capacitance Output Capacitance Reverse Trafer Capacitance V DS >I D(on) xr DS(on )max I D =12A 13 S V DS =25V f=1mhz V GS = 0 4200 500 50 pf pf pf 2/8

ELECTRICAL CHARACTERISTICS (continued) SWITCHING ON Symbol Parameter Test Conditio Min. Typ. Max. Unit t d(on) t r Q g Q gs Q gd Turn-on Time Rise Time Total Gate Charge Gate-Source Charge Gate-Drain Charge V DD = 250 V I D =10A R G =4.7 Ω V GS =10V (see test circuit, figure 1) 32 15 V DD = 400 V I D =20A V GS =10V 100 21 37 130 nc nc nc SWITCHING OFF Symbol Parameter Test Conditio Min. Typ. Max. Unit t r(voff) t f t c Off-voltage Rise Time Fall Time Cross-over Time V DD = 400 V I D =20A R G =4.7 Ω V GS =10V (see test circuit, figure 5) 20 25 47 SOURCE DRAIN DIODE Symbol Parameter Test Conditio Min. Typ. Max. Unit I SD I SDM ( ) Source-drain Current Source-drain Current (pulsed) V SD ( ) Forward On Voltage I SD =20A V GS =0 1.6 V t rr Reverse Recovery I SD = 20 A di/dt = 100 A/µs 700 Time V DD = 100 V T j =150 o C Q rr I RRM Reverse Recovery Charge Reverse Recovery Current (see test circuit, figure 3) 9 25 µc A ( ) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 % ( ) Pulse width limited by safe operating area 20 80 A A Safe Operating Area Thermal Impedance 3/8

Output Characteristics Trafer Characteristics Traconductance Static Drain-source On Resistance Gate Charge vs Gate-source Voltage Capacitance Variatio 4/8

Normalized Gate Threshold Voltage vs Normalized On Resistance vs Temperature Source-drain Diode Forward Characteristics 5/8

Fig. 1: Unclamped Inductive Load Test Circuit Fig. 1: Unclamped Inductive Waveform Fig. 3: Switching Times Test Circuits For Resistive Load Fig. 4: Gate Charge test Circuit Fig. 5: Test Circuit For Inductive Load Switching And Diode Recovery Times 6/8

TO-247 MECHANICAL DATA DIM. mm inch MIN. TYP. MAX. MIN. TYP. MAX. A 4.7 5.3 0.185 0.209 D 2.2 2.6 0.087 0.102 E 0.4 0.8 0.016 0.031 F 1 1.4 0.039 0.055 F3 2 2.4 0.079 0.094 F4 3 3.4 0.118 0.134 G 10.9 0.429 H 15.3 15.9 0.602 0.626 L 19.7 20.3 0.776 0.779 L3 14.2 14.8 0.559 0.413 0.582 L4 34.6 1.362 L5 5.5 0.217 M 2 3 0.079 0.118 Dia 3.55 3.65 0.140 0.144 P025P 7/8

Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no respoibility for the coequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No licee is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics. The ST logo is a registered trademark of STMicroelectronics 1998 STMicroelectronics Printed in Italy All Rights Reserved STMicroelectronics GROUP OF COMPANIES Australia - Brazil - Canada - China - France - Germany - Italy - Japan - Korea - Malaysia - Malta - Mexico - Morocco - The Netherlands - Singapore - Spain - Sweden - Switzerland - Taiwan - Thailand - United Kingdom - U.S.A.. 8/8