Application Note: Precision Displacement Test Stand Rev A

Similar documents
Large Signal Displacement Measurement with an MTI Photonic Sensor Rev B

Large Signal Displacement Measurement with an Asylum SA Atomic Force Microscope Rev B

Large Signal Displacement Measurement With Piezo Jena vibrometer Rev A

Technical Report Preventing Air Gap Breakdown Rev -

Application Note Measuring Small Signal Capacitance vs Magnetic Field Rev A

Technical Report MFIS and TFFT Testing with the Premier II Tester Rev C

Characterization of Silicon-based Ultrasonic Nozzles

OPTICS IN MOTION. Introduction: Competing Technologies: 1 of 6 3/18/2012 6:27 PM.

Actively Stabilized Scanning Single-Frequency. Ti:Sa /Dye Ring Laser External Doubling Ring Ti:Sa /Dye Standing Wave Laser

PiezoMike Linear Actuator

Deformable Membrane Mirror for Wavefront Correction

POCKET DEFORMABLE MIRROR FOR ADAPTIVE OPTICS APPLICATIONS

Nanonics Systems are the Only SPMs that Allow for On-line Integration with Standard MicroRaman Geometries

STUDY OF VIBRATION MODAL ESTIMATION FOR COMPOSITE BEAM WITH PZT THIN FILM SENSOR SYSTEM

Thin Film Deposition

Actively Stabilized Scanning Single Frequency. Ti:Sa /Dye Ring Laser

Thin Film Deposition

Precision Non-Linear Materials Testers. New Precision PiezoMEMS Analyzer

Chapter 30: Principles of Active Vibration Control: Piezoelectric Accelerometers

LECTURE 10. Dr. Teresa D. Golden University of North Texas Department of Chemistry

First Time User Manual

200mm and 300mm Test Patterned Wafers for Bonding Process Applications SKW ASSOCIATES, INC.

REV A.1 CMCP810PC SERIES RUNOUT KIT INSTRUCTION MANUAL STI VIBRATION MONITORING INC

Actuator Precision Characterization

- Near Field Scanning Optical Microscopy - Electrostatic Force Microscopy - Magnetic Force Microscopy

Non-Contact Capacitance Gauging Instrument & Series 2800 Capacitive Probes

Models Z7, Z11, Z602WA and Z820WA Impedance head operating guide

FFP-C Fiber Fabry-Perot Controller OPERATING INSTRUCTIONS. Version 1.0 MICRON OPTICS, INC.

BMC s heritage deformable mirror technology that uses hysteresis free electrostatic

Fast Tip/Tilt Platform

INDIAN INSTITUTE OF TECHNOLOGY BOMBAY

Measurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation

Piezoelectric Sensors and Actuators

THICK-FILM LASER TRIMMING PRINCIPLES, TECHNIQUES

High Precision Positioning Mechanisms for a Hard X-ray Nanoprobe Instrument. Abstract

Adaptive Optics for ELTs with Low-Cost and Lightweight Segmented Deformable Mirrors

A Laser-Based Thin-Film Growth Monitor

Standard Configuration

Design and Optimization of Ultrasonic Vibration Mechanism using PZT for Precision Laser Machining

3D Optical Motion Analysis of Micro Systems. Heinrich Steger, Polytec GmbH, Waldbronn

731A seismic accelerometer and P31 power unit/amplifier Operating guide

Fast Optical Form Measurements of Rough Cylindrical and Conical Surfaces in Diesel Fuel Injection Components

attocfm I for Surface Quality Inspection NANOSCOPY APPLICATION NOTE M01 RELATED PRODUCTS G

Vibration-compensated interferometer for measuring cryogenic mirrors

MEMS-based Micro Coriolis mass flow sensor

Embedded Surface Mount Triaxial Accelerometer

A Review of MEMS Based Piezoelectric Energy Harvester for Low Frequency Applications

Dicing Through Hard and Brittle Materials in the Micro Electronic Industry By Gideon Levinson, Dicing Tools Product Manager

PowerAmp Design. PowerAmp Design PAD196 HIGH VOLATGE OPERATIONAL AMPLIFIER

1.6 Beam Wander vs. Image Jitter

SILICON BASED CAPACITIVE SENSORS FOR VIBRATION CONTROL

Length and Position Measurement

FFP-TF2 Fiber Fabry-Perot Tunable Filter Technical Reference

Outline: Introduction: What is SPM, history STM AFM Image treatment Advanced SPM techniques Applications in semiconductor research and industry

the pilot valve effect of

attosnom I: Topography and Force Images NANOSCOPY APPLICATION NOTE M06 RELATED PRODUCTS G

APPLICATION NOTE. Mounting instructions for EasyPIM / EasyPACK modules with screw clamps. 1. General information

2007-Novel structures of a MEMS-based pressure sensor

Circular Piezoelectric Accelerometer for High Band Width Application

MEASUREMENT OF STRAIN AND POLARIZATION IN PIEZOELECTRIC AND ELECTROSTRICTIVE ACTUATORS

Laboratory investigation of an intensiometric dual FBG-based hybrid voltage sensor

Capacitive sensors capancdt

High Sensitivity Interferometric Detection of Partial Discharges for High Power Transformer Applications

This is how PI Does Measuring - Part I

Fabrication of 6.5 m f/1.25 Mirrors for the MMT and Magellan Telescopes

Active Vibration Isolation of an Unbalanced Machine Tool Spindle

Accessories for the Model 920 Lapping and Polishing Machine

MEMS Wind Direction Detection: From Design to Operation

LISA and SMART2 Optical Work in Europe

High-speed wavefront control using MEMS micromirrors T. G. Bifano and J. B. Stewart, Boston University [ ] Introduction

HAPTIC A PROMISING NEW SOLUTION FOR AN ADVANCED HUMAN-MACHINE INTERFACE

INTEGRATED ACOUSTO-OPTICAL HETERODYNE INTERFEROMETER FOR DISPLACEMENT AND VIBRATION MEASUREMENT

Evaluation of Laser Stabilization and Imaging Systems for LCLS-II

5. Transducers Definition and General Concept of Transducer Classification of Transducers

Applications of Maskless Lithography for the Production of Large Area Substrates Using the SF-100 ELITE. Jay Sasserath, PhD

LIGO PROJECT. Piezo-Electric Actuator Initial Performance Tests. Eric Ponslet April 13, Abstract

1241. Efficiency improvement of energy harvester at higher frequencies

Piezoelectric Generator for Powering Remote Sensing Networks

Prepare Sample 3.1. Place Sample in Stage. Replace Probe (optional) Align Laser 3.2. Probe Approach 3.3. Optimize Feedback 3.4. Scan Sample 3.

IN-CHIP DEVICE-LAYER THERMAL ISOLATION OF MEMS RESONATOR FOR LOWER POWER BUDGET

CTS Corporate Profile. CTS Today. Your Partner in Smart Solutions. Introduction

Investigation on Sensor Fault Effects of Piezoelectric Transducers on Wave Propagation and Impedance Measurements

Ultra-Flat Tip-Tilt-Piston MEMS Deformable Mirror

MEMS for RF, Micro Optics and Scanning Probe Nanotechnology Applications

Magnetic and Electromagnetic Microsystems. 4. Example: magnetic read/write head

Silicon Light Machines Patents

LASER. Analog Laser Displacement Transducer. LAM Series. Key-Features: Content:

Precision Temperature Measurement Using Resistance Temperature Detector

Piezo-Ceramic Glossary

Low Cost Very Large Diamond Turned Metal Mirror Contract No. NNX09CF40P (SBIR ) (MSFC)

1. INTRODUCTION. Keywords: Piezo, Mechanism, Tip-tilt, Stability, Strain gages. BSM Mechanism context

Keywords: piezoelectric, micro gyroscope, reference vibration, finite element

CMP for More Than Moore

COVENANT UNIVERSITY NIGERIA TUTORIAL KIT OMEGA SEMESTER PROGRAMME: MECHANICAL ENGINEERING

QRS14 User s Guide. MEMS GYROSCOPE Model QRS14. Systron Donner Inertial Sales and Customer Service. Phone: Fax:

Agilent 5527A/B-2 Achieving Maximum Accuracy and Repeatability

Integrated Circuits: FABRICATION & CHARACTERISTICS - 4. Riju C Issac

Report on Vibratory Stress Relief Prepared by Bruce B. Klauba Product Group Manager

Electronic Systems - B1 23/04/ /04/ SisElnB DDC. Chapter 2

ELECTRONIC SYSTEMS. Introduction. B1 - Sensors and actuators. Introduction

Transcription:

Radiant Technologies, Inc. 2835D Pan American Freeway NE Albuquerque, NM 87107 Tel: 505-842-8007 Fax: 505-842-0366 e-mail: radiant@ferrodevices.com www.ferrodevices.com Application Note: Precision Displacement Test Stand Rev A Date: January 3, 2010 Author: Joe Evans Discussion: The explosive growth in the field of thin-film piezoelectric materials highlights the greatest weakness facing researchers: some devices have displacements so small they are swamped by ambient environmental effects in the test fixtures holding the devices under test. As well, the vast majority of thinfilm devices come in a wide range of shapes and geometries leaving no possibility for standard fixturing. Radiant Technologies has been acutely aware of this problem for two reasons. First, Radiant has built into all of its testers the ability to capture displacement information from a wide variety of sensors. Radiant s products can measure bulk ceramics that move microns as well as thin film capacitors that move Ångstroms. While the bulk ceramics have proved relatively easy to measure, the full functionality of Radiant s testers cannot be applied the displacements of thin-film capacitors because their scale is smaller than the ambient environmental noise or the natural mechanical drift in the test fixtures. As well, the most sensitive non-contact displacement sensors use an optical beam and are subject to distortive turbulence in the atmosphere. Finally, thermal currents in the test fixture can cause changes in the absolute optical path difference from the sensor to the sample that are as large or larger than the sample displacements being measured. The second issue for Radiant with measuring the piezoelectric properties of thin film devices arises from Radiant s technology development. We fabricate a wide variety of thin film actuators and sensors using thin PZT films but we have been stymied in the characterization of all but the largest devices because of a lack of flexible fixturing that is quiet at the Ångstrom level. Radiant has worked for over a year to develop a low-cost solution to this issue. Our new Precision Displacement Test Stand quiets the environmental and mechanical noise levels of the test environment so that super-sensitive displacement sensors may be used in a laboratory setting to achieve clean measurements at the Ångstrom level. The PDTS was designed in conjunction with the Advanced Piezo Task in the Vision Library. The PDTS eliminates mechanical vibration and turbulence so the Advanced Piezo task can employ averaging and smoothing to improve the quality of the piezoelectric butterfly loops measured with Radiant testers. The measurement of the 15Å displacement of the top electrode surface of a 1µ-thick film of 4/20/80 PNZT using a laser vibrometer mounted in the PDTS is shown in Figure 1. 1

Advanced Piezo - 1u PNZT [ Type AC WHITE ] Polarization (µc/cm2) 50 25 0 5 Proc. Hyst Proc. Disp Angstroms 0-5 -10-20 -15-10 -5 0 5 10 15 20 Volts Figure 1 Piston Motion of 1µ of 4/20/80 PNZT The noise level in Figure 1 is less than 0.5Å even though the measurement was made in a warehouse. Down in the plot is away from the substrate surface and towards the sensor. Even more important, the PDTS does not require any specific sample geometry. The stand provides a high degree of freedom in sample mounting and sensor alignment so even the most basic thin-film capacitors may be mounted and measured by enterprising graduate students in a university environment. Issues with Ångstrom-Level Test Fixturing As the measurement scale approaches the Ångstrom level, the effect of ambient environmental noise becomes a major issue, primarily because the amplitude of the environmental noise may exceed that of the displacement to be measured. There are four sources for ambient noise: Vibration Thermo-mechanical drift Mechanical drift Air turbulence The Precision Displacement Test Stand and Advanced Piezo are designed to work together to reduce all four effects to manageable levels. The PDTS reduces vibration and air turbulence effects while Advanced Piezo removes the mechanical and thermal drifts. For more information about Advanced Piezo, go to www.ferrodevices.com/displacement.html. Radiant Technologies, Inc. 2

The Precision Displacement Test Stand The PDST consists of a small optical table, an air shield, cable stress reliefs, and the Brick. See Figure 2 below. Precision Displacement Test Stand with Polytec Laser Vibrometer Figure 2 Figure 2 shows the PDTS sitting on a granite base formerly belonging to an Ultratech stepper. The granite base is very stable, allowing the precision measurement in Figure 1. The optical table in the PDTS is small enough that relatively inexpensive pneumatic vibration isolation tables may be used to dampen vibration. The key to the PDTS is the granite Brick on which the sample is mounted. It has the dimensions of 6 x 4 x 2.5. It has a 5/8 hole through its center to allow double beam interferometry on the sample and bolt holes on its sample side to allow the attachment of a variety of optical mounts. The image in Figure 3 shows a packaged sample clamped to a translation table. X/Y/Rotation mounts could be used as well. Optical mounts are not necessary, though. The most quiet sample mount is electronic perf board held on the Brick by C-clamps! Radiant Technologies, Inc. 3

The Brick with a Sample and an MTI Photonic Sensor on the PDTS Figure 3 The granite gives the Brick a large mass to dampen vibration. Even more important is that the sides of the Brick are polished optically flat to match the surface of the optical table. Researchers can easily slide the brick across the table to align the sample with the sensor. The sensor itself can be clamped to the optical table for stability. The Brick is cut and polished to guarantee a 90 angle between its sample face and the optical table surface. Sample Mounting Any sample of any configuration may be mounted to the sample surface of the Brick. Electrical tape has even been used at Radiant to attach a piece of a silicon wafer to the Brick surface. Another approach is to attach the sample substrate or package to electronic perf board which itself is clamped to an optical mount on the Brick. Figure 4 illustrates such an arrangement which was used to capture the butterfly loop in Figure 1. The sample is mounted on the transistor header. The sensor is a Polytec laser vibrometer. Radiant Technologies, Inc. 4

Typical Sample Mount Configuration Figure 4 Discouraging Air Currents Air currents and local air turbulence can overwhelm displacement measurements made with optical sensors. The PDTS has an air current shield that fits over the entire optical table as seen in Figure 2. In some cases, the optical path itself must be shielded. The PDTS provides plenty of space for the user to build a smaller air shield that fits over only the optical path of the sensor. Radiant does not provide such a small air shield because the necessary dimensions will vary between every customer, every sample, and every sensor. Cable Strain Relief Note in Figure 3 that the sample is powered by mini-grabbers and small-gauge wire. To prevent strain on the sample by the tester cables, the PDTS has a strain relief module, visible in the right hand side of Figure 3. Figure 5 below provides a bird s eye view of the PDTS with the sample holder, the sensor, and the cable strain relief. Note that the arrangement of the strain relief, the sensor, and the Brick is different between Figure 5 and Figure 2. This fact highlights the flexibility of the PDTS. Radiant Technologies, Inc. 5

Cable Strain Relief on the PDTS Figure 5 Conclusion Radiant s Precision Displacement Test Stand is a quiet but highly flexible fixture that allows piezoelectric samples of any geometry to be mounted and measured down to the Ångstrom level. Radiant Technologies, Inc. 6