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1 Page 1 of 38 REPORT ON Radio testing of the VERTEX STANDARD VX-2100-G6-45 / VX-2200-G6-45 In accordance with ANSI/TIA/EIA-603-C, RSS-119 Report number TA December 2011

2 Report number TA Page 2 of 38 GENERAL INFORMATION MODEL NAME: VX-2100-G6-45 / VX-2200-G6-45 FCC ID: IC: K B MANUFACTURER: TRADE NAME: VERTEX STANDARD EUT DESCRIPTION: UHF FM Transceiver SERIAL NUMBER: 1L VOLTAGE RQUIREMENTS: 13.6 DC NUMBER OF CHANNELS: 512 SPECIFICATION ARE REFERENCED: ANSI/TIA/EIA-603-C RSS-119 TRANSMITTERS TYPE OF EMISSION: 16K0F3E / 11K0F3E FREQUENCY RANGE: 400 to 470 POWER OUTPUT RATING: 10 to 45 Switchable x Variable N/A MAXIMUM POWER RATING: 140 INPUT IMPEDANCE (MIC): 600 OUTPUT IMPEDANCE (RF): 50 Collector Voltage: 13.6 Collector Current: 10 [V] [MHz] [W] [W] [Ω] [Ω] [V] [A] RECEIVERS FREQUENCY RANGE: INTERMEDIATE FREQUENCIES: INPUT IMPEDANCE (RF): OUTPUT IMPEDANCE (SP): AUDIO OUTPUT POWER: 400 to 470 [MHz] 1st [MHz] 2nd -450 [khz] 50 [Ω] 4 [Ω] 12 [W] This report was prepared by Test performed by: Shigemitu Takahashi Chief Test Engineer Engineering Division T/A Section Date: 30 / November /2011

3 Report number TA Page 3 of 38 CH No. VX-2100-G6-45 / VX-2200-G6-45 Channel Settings [MHz] [MHz] High Low NH k 45 W NH k 45 W NH k 45 W NL k - 10 W 5 435NL k - 10 W 6 470NL k - 10 W LED Type CH No. Shown on LCD Shown on LED Transmit Frequency Transmit Frequency Receive Frequency Receive Frequency CH Spacing CH Spacing Power Power [MHz] [MHz] High Low k 45 W k 45 W k 45 W k - 10 W k - 10 W k - 10 W

4 Report number TA Page 4 of 38 R.F. Power Output (Conducted) SPECIFICATION: 47 CFR (a) GUIDE: ANSI/TIA/EIA-603-C, Paragraph TEST EQUIPMENT: As per attached page MEASUREMENT PROCEDURE The EUT was connected to a resistive coaxial attenuator of normal load impedance, and the modulated output powerwas measured by means of an R.F. power meter. Measurement accuracy is ± 4% MEASUREMENT RESULTS NOMINAL, MHz CHANNEL R.F. POWER, WATTS LOW HIGH

5 Report number TA Page 5 of 38 TRANSMITTER POWER CONDUCTED MEASUREMENTS TEST 1: R.F. POWER OUTPUT TEST 2: FREQUENCY STABILITY Test Sample (1) (2) (3) (4) Power Supply (5) Instruments Description (1) COAXUAL ATTENUATOR (2) RF COUPLER WEINSCHELL ADVANTEST TR4153 (3) POWER SENSOR Agilent 8482B (4) POWER METER Agilent 8901B POWER MODE (5) FREQUENCY COUNTER Agilent 8901B FREQUENCY MODE Calibration Date Next Calibration One year after One year after One year after One year after

6 Report number TA Page 6 of 38 Unwanted Emissions (Conducted) SPECIFICATION: 47 CFR GUIDE: ANSI/TIA/EIA-603-C, Paragraph TEST EQUIPMENT: As per attached page MEASUREMENT PROCEDURE The emissions were measured for the worst case as follows: (a): within a band of frequencies defined by the carrier frequency plus and minus one channel. (b): from the lowest frequency generated in the EUT and to at least the 10th harmonic of the carrier frequency, or 40GHz, whichever is lower. The magnitude of spurious emissions that are attenuated more than 20dB below the permissible value need not be specified. MEASUREMENT RESULTS: FREQUENCY OF CARRIER, MHz = 400, 435, 470 SPECTRUM SEARCHED, GHz = 0 to 10 x Fc MAXIMUM RESPONSE, Hz = 3000 ALL OTHER EMISSIONS = >= 20dB BELOW LIMIT

7 Report number TA Page 7 of 38 TRANSMITTER SPURIOUS EMISSION TEST 1: OCCUPIED BANDWIDTH (IN-BAND SPURIOUS) TEST 2: OUT-OF-BAND SPURIOUS Test (1) (2) (3) Sample Power Supply Instruments Description Calibration Date Next Calibration (1) AUDIO GENERATOR Agilent 8903B One year after (2) COAXUAL ATTENUATOR WEINSCHELL One year after (2) COAXUAL ATTENUATOR Agilent 8498A One year after (3) SPECTRUM ANALYZER ADVANTEST TR One year after

8 Report number TA Page 8 of 38 Unwanted Emissions (Conducted) LIMIT'S), dbc: -(50+10xLOG(P)) = -67 ( 45 Watts ) -(50+10xLOG(P)) = -60 ( 10 Watts ) High Power FREQUENCY FREQUENCY LEVEL, LEVEL, MARGIN, TUNED, MHz EMISSION, MHz dbm dbc db

9 Report number TA Page 9 of 38 Unwanted Emissions (Conducted) LIMIT'S), dbc: -(50+10xLOG(P)) = -67 ( 45 Watts ) -(50+10xLOG(P)) = -60 ( 10 Watts ) Low Power FREQUENCY FREQUENCY LEVEL, LEVEL, TUNED, MHz EMISSION, MHz dbm dbc MARGIN, db measurements exceed the requirements by more than 20 db

10 Report number TA Page 10 of 38 Field Strength of Spurious Radiation SPECIFICATION: 47 CFR (a) GUIDE: ANSI/TIA/EIA-603-C, Paragraph Definition: Radiated spurious emissions are emissions from the equipment when transmitting load on a frequency or frequencies which are outside an occupied band sufficient to ensure transmission of information of required quality for the class of communications desired Method of measurement MEASUREMENT PROCEDURE A) B) C) Connect the equipment as illustrated. Adjust the spectrum analyzer for the following settings: 1) Resolution Bandwidth <= 3kHz 2) Video Bandwidth >= 10kHz 3) Sweep Speed <= 2000Hz/second 4) Detector Mode = Positive Peak Place the transmitter to be tested on the turntable in the standard test site. The transmitter is transmitting into a non-radiating load which is placed on the turntable. The RF cable to this load should be of minimum length. Test antenna TRANSMITTER UNDER TEST STANDARD TRANSMITTER LOAD SPECTRUM ANALYZER STANDARD TEST SITE D) E) For each spurious measurment the test antenna should be adjusted to the correct length for the frequency involved. This length maybe determined from a calibration ruler supplied with the equipment. Measurements shall be made from the lowest radio frequency generated in the equipment to the tenth harmonic of the carrier, except for the region close to the carrier qeual to ± the test bandwidth (see section ). For each spurious frequency, raise and lower the test antenna from 1 m to 4 m to obtain a maximum reading on the spectrum analyzer with the test antenna at horizontal polarity.

11 Report number TA Page 11 of 38 Field Strength of Spurious Radiation F) Repeat step E) for each spurious frequency with the test antenna polarized vertically. Substituti on Test antenna RF SIGNAL GENERATOR SPECTRUM ANALYZER STANDARD TEST SITE G) H) I) J) K) L) M) Reconnect the equipment as illustrated. Keep the spectrum analyzer adjusted as in step B). Remove the transmitter and replace it with a substitution antenna (the antenna should be half-wavelength for each frequency involved). The center of the substitutuion antenna should be approximately at the same location as the center of the transmitter. At lower frequencies, where the substitution antenna is very long, this will be impossible to achieve when the antenna is plarized vertically. In such case the lower end of the antenna should be 0.3m above the ground. Feed the substitution antenna at the transmitter end with a signal generator connected to the antenna by means of a non-radiating cable. With the antennas at both ends horizontally polarized and with the signal generator tuned to a particular spurious frequency, raise and lower the test antenna to obtain a maximum reading at the spectrum analyzer. Adjust the level of the signal generator output untill the previusl recorded maximum reading for the set of conditions is obtained. This should be done carefully repeating the adjustment of the test antenna and generator output. Repeat step J) with both antennas vertically polarized for each spurious frequency. Calculate power in dbm into a reference ideal half-wave dipole antenna by reducing the readings obtained in step J) and K) by the power loss in the cable between the generator and the antenna and futher corrected for the gain of the substitution antenna used relative to an ideal half-wave dipole antenna. The levels recorded in step L) are absolute levels of radiated spurious emissions in dbm. The radiated spurious emissions in db can be calculated by the following: Radiated spurious emissions db = 10log(TX power in watts/0.001) - the levels in step L)

12 Report number TA Page12 of 38 Field Strength of Spurious Radiation Note: It is permissible that other antennas provided can be referenced to a dipole. Instruments TRANSDUCER TRANSDUCER AMPLIFIER AMPLIFIER SPECTRUM ANALYZER Description Calibration Date Next Calibration Schaffner-Chase CBL EMCO Agilent 8447D One year after Agilent 8449B One year after Agilent 8561B One year after

13 Report number TA Page 13 of 38 Field Strength of Spurious Radiation LIMIT'S), dbc: -(50+10xLOG(P)) = -67 ( 45 Watts ) -(50+10xLOG(P)) = -60 ( 10 Watts ) High Power FREQUENCY FREQUENCY METER, C.F., ERP, TUNED, MHz EMISSION, MHz dbuv db dbm ERP, dbc -76.0

14 Report number TA Page 14 of 38 Field Strength of Spurious Radiation LIMIT'S), dbc: -(50+10xLOG(P)) = -67 ( 45 Watts ) -(50+10xLOG(P)) = -60 ( 10 Watts ) Low Power FREQUENCY FREQUENCY METER, C.F., ERP, TUNED, MHz EMISSION, MHz dbuv db dbm ERP, dbc measurements exceed the requirements by more than 20 db

15 Report number TA Page 15 of 38 Emission Masks (Occupied Bandwidth) SPECIFICATION: 47 CFR (c) (1) GUIDE: ANSI/TIA/EIA-603-C, Paragraph TEST EQUIPMENT: As per previous page MEASUREMENT PROCEDURE The EUT and test equipment ware set up as shown on the following page, with the spectrum analyzer connected. For EUT's supporting audio modulation, the audio signal generator was adjusted to the frequency of maxmum response and with output level set for ±2.5/±1.5kHz deviation (or 50% modulation). With level constant, the signal level was increased 16dB. For EUT's supporting digital modulation, the digital modulation mode was operated to its maximum extent. The occupied bandwidth was measured with the spectrum analyzer controls set as shown on the test results. MEASUREMENT RESULTS: ATTACHED

16 Report number TA Page 16 of 38 Emission Masks (Occupied Bandwidth) STATE: 2 : High Power REF 46.7 dbm ATTEN 10dB/ POS PK OFFSET 36.8dB 20 db AVG CENTER 400 MHz RES BW 100 Power: Modulation: Hz VBW 100 Hz SPAN 50 KHz SWP 30 s High None 12.5 khz, MASKD REF 46.7 dbm ATTEN 20 db 10dB/ POS PK OFFSET 36.8dB AVG CENTER 400 MHz SPAN 50 KHz RES BW 100 Hz VBW 100 Hz SWP 30 s Power: High Modulation: Voice 12.5 khz, MASKD

17 Report number TA Page 17 of 38 Emission Masks (Occupied Bandwidth) STATE: 2 : High Power REF 46.6 dbm ATTEN 20 db 10dB/ POS PK OFFSET 36.8dB AVG CENTER 435 MHz SPAN 50 KHz RES BW 100 Hz VBW 100 Hz SWP 30 s Power: High Modulation: None 12.5 khz, MASKD REF 46.6 dbm ATTEN 20 db 10dB/ POS PK OFFSET 36.8dB AVG CENTER 435 MHz RES BW 100 Hz VBW 100 Power: Modulation: Hz SPAN 50 KHz SWP 30 s High Voice 12.5 khz, MASKD

18 Report number TA Page 19 of 38 Emission Masks (Occupied Bandwidth) STATE: 1 : Low Power REF 39.7 dbm ATTEN 20 db 10dB/ POS PK OFFSET 36.8dB AVG CENTER 400 MHz RES BW 100 Hz VBW 100 Power: Modulation: Hz SPAN 50 KHz SWP 30 s Low None 12.5 khz, MASKD REF 39.7 dbm ATTEN 20 db 10dB/ POS PK OFFSET 36.8dB AVG CENTER 400 MHz RES BW 100 Power: Modulation: Hz VBW 100 Hz SPAN 50 KHz SWP 30 s Low Voice 12.5 khz, MASKD

19 Report number TA Page 20 of 38 Emission Masks (Occupied Bandwidth) STATE: 2 : Low Power REF 40.3 dbm ATTEN 20 db 10dB/ POS PK OFFSET 36.8dB AVG CENTER 435 MHz RES BW 100 Hz VBW 100 Power: Modulation: Hz SPAN 50 KHz SWP 30 s Low None 12.5 khz, MASKD REF 40.3 dbm ATTEN 20 db 10dB/ POS PK OFFSET 36.8dB AVG CENTER 470 MHz RES BW 100 Hz VBW 100 Power: Modulation: Hz SPAN 50 KHz SWP 30 s High Voice 12.5 khz, MASKD

20 Report number TA Page 18 of 38 Emission Masks (Occupied Bandwidth) STATE: 1 : High Power REF 47 dbm ATTEN 20 db 10dB/ POS PK OFFSET 36.8dB AVG CENTER 470 MHz SPAN 50 KHz RES BW 100 Hz VBW 100 Hz SWP 30 s Power: High Modulation: None 12.5 khz, MASKD REF 47 dbm ATTEN 20 db 10dB/ POS PK OFFSET 36.8dB AVG CENTER 470 MHz SPAN 50 KHz RES BW 100 Hz VBW 100 Hz SWP 30 s Power: High Modulation: Voice 12.5 khz, MASKD

21 Report number TA Page 21 of 38 Emission Masks (Occupied Bandwidth) STATE: 2 : Low Power REF 41.1 dbm ATTEN 20 db 10dB/ POS PK OFFSET 36.8dB AVG CENTER 470 MHz SPAN 50 KHz RES BW 100 Hz VBW 100 Hz SWP 30 s Power: Low Modulation: None 12.5 khz, MASKD REF 41.1 dbm ATTEN 20 db 10dB/ POS PK OFFSET 36.8dB AVG CENTER 470 MHz SPAN 50 KHz RES BW 100 Hz VBW 100 Hz SWP 30 s Power: Low Modulation: Voice 12.5 khz, MASKD

22 Report number TA Page 22 of 38 TRANSIENT FREQUENCY BEHAVIOR (5) Test Sample (1) (2) (3) (6) Power Supply (4) (7) Instruments Description (1) COAXUAL ATTENUATOR WEINSCHELL (2) COAXUAL ATTENUATOR WEINSCHELL (3) COMBINER IWATSU B-504D (4) CRYSTAL DETECTOR Agilent 8470B (5) RF SIGNAL GENERATOR Agilent 8642B (5) MODULATION ANALYZER Agilent 8901B (5) SCOPE Agilent DSO3062A Calibration Date Next Calibration One year after One year after One year after One year after One year after One year after One year after

23 Report number TA Page 23 of 38 Transient Frequency Behaviour STATE: 1 : High Power 12.5 Deviation [khz] Model Name: Serial Number: Test Frequency: Channel Spacing: t1 t2 Time [ms] VX-2200-G6-45 Type: Mobile/Portable 1L Trigger Direction: Rise Ref. Standard EIA Deviation [khz] t3 Time [ms] Model Name: VX-2200-G6-45 Type: Mobile/Portable Serial Number: 1L Trigger Direction: Fall Test Frequency: Channel Spacing: Ref. Standard EIA

24 Report number TA Page 24 of 38 Transient Frequency Behaviour STATE: 1 : High Power 12.5 Deviation [khz] t1 t2 Time [ms] Model Name: VX-2200-G6-45 Type: Mobile/Portable Serial Number: 1L Trigger Direction: Rise Test Frequency: Channel Spacing: Ref. Standard EIA 12.5 Deviation [khz] t3 Time [ms] Model Name: VX-2200-G6-45 Type: Mobile/Portable Serial Number: 1L Trigger Direction: Fall Test Frequency: Channel Spacing: Ref. Standard EIA

25 Report number TA Page 25 of 38 Transient Frequency Behaviour STATE: 1 : High Power 12.5 Deviation [khz] t1 t2 Time [ms] Model Name: VX-2200-G6-45 Type: Mobile/Portable Serial Number: 1L Trigger Direction: Rise Test Frequency: Channel Spacing: Ref. Standard EIA Deviation [khz] Model Name: Serial Number: Test Frequency: Channel Spacing: t3 Time [ms] VX-2200-G6-45 Type: Mobile/Portable 1L Trigger Direction: Fall Ref. Standard EIA

26 Report number TA Page 26 of 38 Audio Low Pass Filter (Voice Input) SPECIFICATION: 47 CFR (a) GUIDE: ANSI/TIA/EIA-603-C, Paragraph TEST EQUIPMENT: As per attached page MEASUREMENT PROCEDURE The EUT and test equipment ware set up such that the audio input was connected at the input of the modulation limiter, and the modulated stage. The audio output was connected at the output to the modulated stage. 3. MEASUREMENT RESULTS: ATTACHED TRANSMITTER TEST SET-UP TEST A: MODULATION CAPABILITY / DISTORTION TEST B: AUDIO FREQUENCY RESPONSE TEST C: HUM AND NOISE LEVEL TEST D: RESPONSE OF LOW PASS FILTER TEST E: MODULATION KIMITING (1) Test Sample (2) (3) Power Supply (4) Instruments Description (1) AUDIO GENERATOR Agilent 8903B (2) COAXIAL ATTENUATOR Agilent 8498A (2) COAXIAL ATTENUATOR Weinchel (3) MODULATION ANALYZER Agilent 8901B (4) AUDIO ANALYZER Agilent 8903B Calibration Date Next Calibration One year after One year after One year after One year after One year after

27 Report number TA Page 27 of 38 STATE: 0 : General Audio Low Pass Filter (Voice Input) Narrow 0 Response [db] Frequency [Hz]

28 Report number TA Page 28 of 38 Audio Frequency Response SPECIFICATION: 47 CFR (a) GUIDE: ANSI/TIA/EIA-603-C, Paragraph TEST EQUIPMENT: As per previous page MEASUREMENT PROCEDURE The EUT and test equipment ware set up as shown on the following page. The audio signal generator was connected to the audio input circuit/microphone of the EUT. The audio signal input was adjusted to obtain 20% modulation at 1kHz, and this point was taken as the 0dB reference level. Which input levels hold constant and below limiting at all frequencies, the audio signal generator was varied from 100Hz to 5kHz. The response in db relative to 1kHz was then measured, using the Agilent 8901B modulation analyzer. 6. MEASUREMENT RESULTS: ATTACHED

29 Report number TA Page 29 of 38 Audio Frequency Response STATE: 0 : General Response [db] Frequency [Hz] PEAK AUDIO FREQUENCY : 3000 [Hz]

30 Report number TA Page 30 of 38 Modulation Limiting SPECIFICATION: 47 CFR (b) GUIDE: ANSI/TIA/EIA-603-C, Paragraph TEST EQUIPMENT: As per previous page MEASUREMENT PROCEDURE The signal generator was connected to the input of the EUT as for "Frequency Response of the Modulating Circuit". The modulation response was measured for each of three frequencies (one of which was the frequency of maximum response), and the input voltage was varied and was observed on an Agilent 8901B modulation analyzer. The input level was varied from 30% modulation (± 1.5kHz deviation) to at least 20dB higher than the saturation point. Measurements ware performed for both negative and positive modulation and the respective results ware recorded. 5. MEASUREMENT RESULTS: ATTACHED

31 Report number TA Page 31 of 38 Modulation Limiting STATE: 0 : General Positive Peak Narrow 0 db = 6.57 [mv] Hz 1000Hz 3000Hz Limit Frequency Deviation [khz] MIC. Input Level [db] Negative Peak Narrow Hz 1000Hz 3000Hz Limit Frequency Deviation [khz] MIC. Input Level [db]

32 Report number TA Page 32 of 38 Frequency Stability (Temperature Variation) SPECIFICATION: 47 CFR (a) (1) GUIDE: ANSI/TIA/EIA-603-C, Paragraph TEST CONDITIONS: As indicated TEST EQUIPMENT: As per previous page MEASUREMENT PROCEDURE The EUT and test equipment ware set up as shown on the following page. With all power removed, the temperature was decreased to -30 and permitted to stabilize for three hours. Power was applied and themaximum change in frequency was noted within one minute. With power OFF, the temperature was raised in 10 steps. The sample was permitted to stabilize at each step for at least one-half hour. Power was applied and the maximum frequency change was noted within one minute. The temperature tests ware performed for the worst case. 5. MEASUREMENT RESULTS: ATTACHED

33 Report number TA Page 33 of 38 TRANSMITTER TEST SET-UP TEST A: OPERATIONAL STABILITY TEST B: CARRIER FREQUENCY STABILITY TEST C: OPERATIONAL PERFORMANCE STABILITY TEST D: HUMIDITY TEST E: VIBRATION TEST F: ENVIRONMENTAL TEMPERATURE TEST G: FREQUENCY STABILITY, TEMPERATURE VARIATION TEST H: FREQUENCY STABILITY, VOLTAGE VARIATION Test Sample (2) (3) (1) Power Supply (4) Instruments Description Calibration Date Next Calibration (1) TEMPERATURE CHAMBER (2) COAXIAL ATTENUATOR ESPEC PL-1KP Weinschel One year after (3) POWER METER Agilent 436A One year after (4) FREQUENCY COUNTER Agilent 8901B FREQUENCY MODE One year after

34 Report number TA Page 34 of 38 Frequency Stability (Temperature Variation) STATE: 0 : General Stability [ppm] Temperature [ ]

35 Report number TA Page 35 of 38 Frequency Stability (Voltage Variation) SPECIFICATION: 47 CFR (b) GUIDE: ANSI/TIA/EIA-603-C, Paragraph TEST EQUIPMENT: As per previous page MEASUREMENT PROCEDURE The EUT was placed in a temperature chamber at 25±5 and connected as for "Frequency Stability - Temperature Variation" test. The power supply voltage to the EUT was varied from 85% to 115% of the nominal value measured at the input to the EUT. The variation in frequency was measured for the worst case. RESULTS: Frequency Stability (Voltage Variation) STATE: 0 : General LIMIT', ppm = LIMIT', Hz = % of STV Voltage Frequency, MHz Change, Hz Change, ppm Stability [ppm] Voltage [%]

36 Report number TA Page 36 of 38 SPECIFICATION: Necessary Bandwidth and Emission Bandwidth 47 CFR (g) MODULATION = 16K0F3E NECESSARY BANDWIDTH CALUCULATION: MAXIMUM MODULATION (M), khz = 3 MAXIMUM DEVIATION (D), khz = 5 CONSTANT FACTOR (K) = 1 NECESSARY BANDWIDTH (BN), khz = (2xM) + (2xDxK) = 16 MODULATION = 11K0F3E NECESSARY BANDWIDTH CALUCULATION: MAXIMUM MODULATION (M), khz = 3 MAXIMUM DEVIATION (D), khz = 3 CONSTANT FACTOR (K) = 1 NECESSARY BANDWIDTH (BN), khz = (2xM) + (2xDxK) = 11

37 Report number TA Page 37 of 38 Receiver Spurious Emissions (Conducted) STATE: 0 : General All other emissions in the required measurement range ware mora than 20dB below the required limits. MEASUREMENT RESULTS FREQUENCY FREQUENCY LEVEL, LEVEL, TUNED, MHz EMISSION, MHz dbm nw

38 Report number TA Page 38 of 38 Receiver Spurious Emissions (Radiated) STATE: 0 : General All other emissions in the required measurement range ware mora than 20dB below the required limits. MEASUREMENT RESULTS FREQUENCY FREQUENCY CF, TUNED, MHz EMISSION, MHz dbuv db uv/m 34.1

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