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1 Acknowledgments Introduction xiii xi 1 Electronic meters Digital meters Nondigital (analog) meters Differential meters Digital meter displays and ranges Nondigital meter scales and ranges Meter-protection circuits Parallax problems Movement-accuracy problems Reading-error problems Basic ohnuneter (resistance) measurements 1.11 Basic voltmeter (voltage) measurements Basic ammeter (current) measurements Basic decibel measurements Testing and calibrating meters Ohnuneter test and calibration Voltmeter test and calibration Ammeter test and calibration Shop-meter test and calibration Testing meter characteristics Calculating multiplier and shunt values Fabricating temporary shunts Extending ohnuneter ranges 51 34
2 1.23 Extending voltmeter ranges Extending ammeter ranges Suppressed-zero voltag~ measurements 1.26 Measuring complex waves Matching impedances Checking individual components Checking circuit functions 65,')"4 2 Oscilloscopes The cathode-ray tube Beam-deflection system Basic frequency measurement Basic voltage measurement Basic oscilloscope circuits Storage oscilloscope SampliI\g oscilloscope Basic oscilloscope operating controls Oscilloscope specifications and performance Oscilloscope accessories Basic operating procedures and recording methods 2.12 Measuring voltage and current [ Measuring time, frequency and phase Checking components and circuits Using an oscilloscope in digital testing Generators Generator basics FM-stereo generator TVNCR-stereo generator 3.4 Color generators Vectorscopes Electronic counters and frequency standards Heterodyne, or zero-beat, frequency meter Electronic digital counter Totalizing operation Period operation Time-interval operation Ratio operation Counter display problems Counter accuracy
3 5 Probes and transducers Basic probes Low-capacitance probes High-voltage probes RF probes (supplied with meter or scope) 19~ 5.5 Demodulator probes Solid-state signal-tracing probe Probe compensation and calibration Probe testing and troubleshooting techniques An RF probe for test and troubleshooting Transducers Special-purpose test equipment Basic time-domain reflectometer operation Analyzing time-domain reflectometer displays Locating rnismatches or discontinuities on lines Wheatstone bridges Altemating-current bridges Universal bridges Standard capacitance and inductance bridges 6.8 Digital bridges Q meters Rxmeters Admittance meters Vector-impedance meters 216./6.13 LC meters Two-junction (bipolar) transistor tests 21~ 7.1 Basic two-junction transistor tests Two-junction transistor leakage tests Two-junction transistor breakdown tests Two-junction transistor gain tests Two-junction transistor-switc~ tests Testing transistors in circuit Two-junction transistor tests using a curve tracer Field-eff~ct transistor (FET) tests FET operating modes Handling MOSFETs MOSFET protection circuits FET control-voltage tests FET operating-voltage tests FET operating-current tests FET breakdown-vnjtjl.ilp tp~t~ 9;.!t{)
4 8.8 FET gate-leakage tests Dual-gate FET tests FET dynamic characteristics 242 &11 FET amplification factor FETinput-capacitance tests PET output-capacitance tests FET reverse-transfer capacitance tests 8.15 FET element-capacitance tests FET channel-resistance tests FET switching tests FET gain tests FET noise-figure tests FET cross-modulation tests PET intermodulation tests FETtests using a curve tracer Unijunction and programmable UJT (PUT) tests Basic UJT and PUT functions UJT characteristics PUT characteristics Additional UJT test circuits UJT tests using a curve tracer Solid-state diode tests Basic diode tests Diode continuity tests Diode reverse-leakage tests Diode forward voltage drop tests 10.5 Diode dynamic tests Diode switching tests Zener diode tests Tunnel diode tests Diode tests using a curve tracer Thyristor and control-rectifier (SCR) tests Thyristor and control-rectifier basics Control rectifier test parameters Basic control-rectifier and thyristor tests Blocking-voltage and leakage-current tests Gate-trigger voltage and current tests Latching and hol~current tests Average forward voltage test 315
5 12 Audio and op-amp tests Audio circuit tests Wow and flutter meters Audio voltmeters Frequency response Voltage gain Power output and power gain Input sensitivity Power bandwidth Load sensitivity Dynamic output impedance Dynamic input impedance 32 lz.12 Sine-wave analysis Square-wave analysis Harmonic distortion Intermodulation distortion Background noise Op-amp tests Feedback measurement Input-bias current Input-offset voltage and current Common-mode rejection Slew rate Power-supply sensitivity Phase shift Power-supply tests Transformer tests Measuring transformer phase relationships 13.3 Checking transformer polarity markings 13.4 Checking transformer regulation Checking transformer impedance ratio Checking transformer-winding balance Basic power-supply tests Power-supply output tests Power-supply regulation tests Power-supply internal-resistance tests Power-supply ripple tests Advanced power-supply tests Source effect or line regulation Load effect or load regulation Noise and ripple (or PARD) Drift (stability) Temperature coefficient 350.5'41 339
6 14 Radio-frequency tests Basic RF,-voltage measurements Resonant circuits Basic resonant-frequency measurements Basic coil inductance measurements Basic coil self-resonance and distributed-capacitance measurements 14.6 Basic resonant-circuit Q measurements Basic resonant-circuit impedance measurements Basic transmitter RF-circuit testing Basic receiver RF-circuit testing and adjustment RF oscillator tests Communications equipment tests Communications-equipment test instruments RF dunmly load for transmitters RF wattmeter Field-strength meter Standing-wave-ratio measurement Dip meter and adapter Spectrum analyzers and FM-deviation meters Miscellaneous communications test equipment Modulation checks with a scope Antenna and transmission-line checks with limited test means 385 Index 389 About the Author 398
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