OSCILLATION-BASED TEST APPLIED TO DIGITAL SPECTROMETERS

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1 OSCILLATION-BASED TEST APPLIED TO DIGITAL SPECTROMETERS Gbriel Peretti (, Edurdo Romero (, Crlos Mrqués (2 ( Grupo de Investigción y Servicios en Electrónic y Control. Fcultd Regionl Vill Mrí. Universidd Tecnológic Ncionl. Argentin gisec@frvm.utn.edu.r (2 Grupo de Desrrollo Electrónico e Instrumentl. Fcultd de Mtemátic, Astronomí y Físic. Universidd Ncionl de Córdob. Argentin mrques@fmf.unc.edu.r ABSTRACT In this work is reported the test of high-pss digitl FIR filter, using the Oscilltion-Bsed Test (OBT strtegy. The filter is employed in digitl spectrometer. The oscilltor built round the filter uses non-liner feedbck nd does not introduce significnt overhed in the circuit. The oscilltion prmeters re determined by mens of n nlysis bsed on the circuit functionlity. This pproch llows finding the nlyticl expressions of the oscilltion prmeters. The first vlidtion of the strtegy is mde t the Register Trnsfer Level (RTL, with very good results. The gtelevel fult simultion results confirm the good results obtined t RTL. Medium (pproximtely 9% nd high (more thn 95% single stuck-t fult coverges re obtined from the simultion. This fct suggests tht OBT cn be n ppeling option for testing filters like the ddressed in this work nd consequently for testing digitl spectroscopy systems.. INTRODUCTION Digitl spectrometers mesure the energy of gmm nd X photons cused by rdioctive decy processes. In contrst to nlog systems, the digitiztion of the signl is performed following the pre-mplifiction stge, with minor nlog conditioning in some cses. The converted signl is then shped nd filtered in the digitl domin, implementing lgorithms impossible to perform in the nlog domin []. The testbility of digitl shpers is importnt not only from the mnufcturer viewpoint but for number of pplictions requiring high confidence on the instrument during its opertion in field. These pplictions include, mong others, rdiologicl surveillnce in nucler fcilities, post-ccidentl re monitoring nd medicl ctivities. In [2], we presented the test of low-pss filter needed for implementing the digitl shper reported in [3]. The Oscilltion-Bsed Test (OBT ws dopted s test strtegy, obtining excellent fult coverge nd low re overhed. The promising results obtined llow devising OBT s well-suited methodology for testing digitl shpers. In this pper, we extend the OBT strtegy reported in [2] to the high-pss FIR filter of the digitl shper, in order to obtin complete solution to the problem of testing these systems. In the following, we present the oscilltor scheme nd n nlysis of the oscilltion conditions. We lso report the evlutions of the strtegy t the Register Trnsfer Level (RTL nd t gte level. 2. CIRCUIT UNDER TEST Severl uthors proposed strtegies for digitl shping of nucler pulses [3], [], [5], [6]. The Multiple Dely Line (MDL method suggests the use of Finite Impulse Response (FIR filters for the digitl sections [3]. The MDL shpers fulfill severl requirements, like time-limited pulse response, flt top, nd reduction of electronic noise. Their min chrcteristics re relxed specifictions in both the smpling frequency nd ADC

2 MDL processor Qδ(t CHARGE PRE AMPLIFIER ANTI- ALIASING FILTER ADC DIGITAL FILTERS ENERGY HISTOGRAM H H2 Figure. Multiple Dely-Line blocks. resolution nd reduction in the digitl circuitry tht hs to process reduced number of bits [7], [8]. The dopted rchitecture for the MDL processor hs been previously reported in [3] nd [8], nd is presented in Fig.. The detector is represented s current genertor with cpcitive impednce. Q is the chrge delivered by the detector, to be processed by the MDL. The chrge premplifier nd the nti-lising filter compose the nlog section chrcterized by three coincident poles. The pulse delivered by this nlog section is smpled nd quntized by the ADC. The digitl section is composed of the cscde of two FIR filters, H nd H2, nd shpes the pulse delivered by the nlog section. Finlly, the output (of the digitl section is processed in order to build n energy histogrm. The filter H reconstructs, from the nlog smpled pulse (Fig. 2, sequence of two impulses (Fig. 3. According with its time-domin behvior, H presents high-pss frequency response (Fig.. In ddition, the filter hs four symmetric coefficients in its trnsfer function, nd cscde structure (Fig. 5. Other filter chrcteristics re depicted in Tble. It should be mentioned tht H2 shpes the delt-like sequence with trpezoidl weighting function. An exhustive theory of system opertion nd filter coefficient clcultions re given in [3], nd re beyond the scope of this pper x -5 6 x -3 2 Figure 2. Input signl to H filter x -5 Figure 3. H response to the signl shown in Fig. 2. 2

3 B (d e d itu M gn Bode Digrm Tble. H filter chrcteristics. Chrcteristic Vlue M, length of the filter Input width (bits 2 Output width (bits 2 Coefficient with (bits 2 3. OBT IMPLEMENTATION g e (d e P hs input Frequency (rd/sec Figure. H filter frequency response. Z - Z - + X Z - + X We exploit the nturl prtition of the system in high-pss nd low-pss sections for implementing two different oscilltors, testing the system in two sessions. It should be highlighted tht we do not mke dditionl modifictions in the internl structure of H nd H2. In this wy, we mintin low level of intrusion in the originl system to minimize degrdtions in its performnce. We dopt the rchitecture of the non-liner oscilltor tht ws successfully pplied in [2]. In Fig. 6(, the feedbck element compres the output of the filter nd pplies negtive constnt (k2 t the filter input when the output is positive or zero. Conversely, when the output is negtive pplies positive constnt (k (Fig. 6(b. A low-complexity circuit esily implements this non-liner chrcteristic in the digitl domin. Fig. 7 shows the implementtion of the bovementioned scheme for the shper. The sign bits xtest (H filter nd xtest2 (H2 filter select the constnt to be pplied t the H nd H2 inputs respectively. The signl N/T estblishes the opertion mode: norml or test. In this wy, the multiplexer MUX nd the two constnts k_h nd k2_h implement the non-liner block for the H filter. It should be noted tht our concern is the H oscilltor, nd in the following, we denominte the constnts relted to this oscilltor s k nd k2. Z - X Filter H(z k NL output + K output Feedbck element k2 NL input Figure 5. H filter structure. NL output NL Input ( (b Figure 6. ( Conceptul digrm of OBT implementtion. (b Chrcteristic of the non-liner block. 3

4 xin MUX N/T H Xtest Sign bit MUX N/T H2 Xtest2=xout Sign bit In expression (2, fclk is the clock frequency. The mximum nd the minimum of the sequence ( is the output mplitude: Aosc = [, 3 ]. (3 MUX k_h k2_h MUX2 k_h2 k2_h2 The simultion results re presented in Tble 2, for two pirs of constnts k, k2. As it cn be observed from the tble, the errors between the theoreticl nd simulted results re very low. It should be noted tht the vlues of the sequence re represented s n integer multiplied by scling fctor tht is power of two. Figure 7. OBT implementtion for the shper.. ANALYSIS OF THE OSCILLATION CONDITIONS In previous works [2], [9], [], [], [2], [3], the nlysis of the oscilltion conditions ws mde using the describing function method, simple nd intuitive pproch. However, this method requires ttenution t high frequencies from the filter, condition tht H does not fulfill. An lterntive pproch is used in this work. The oscilltion conditions (mplitude nd frequency re obtined nlyzing the filter functionlity by mens of the circuit signl flow-grph. The nlyticl expressions were vlidted through Mtlb-Simulink simultion, with fixed-point effects. For spce resons, the complete nlysis will be done elsewhere. From the bove-mentioned nlysis, we find tht the output oscilltion cn be chrcterized by the sequence {, 2, 3, }. Every term in this sequence is relted to the filter impulse-response coefficients, h, h2, h3, nd the constnts k nd k2, s in the following expressions: = k( h2 + h, 2 = k( h + h2, 3 = k( + h h2, = k( h + h2, ( if the condition (k > nd k 2 < is fulfilled. As the sequence ( goes bck to the term fter, the oscilltion frequency is: fclk fosc =. (2 Theoreticl k= k2= Simulted k= k2= Theoreticl k= k2= Simulted k= k2= Tble 2. Output sequences for the H filter. Output sequence vlues ( H RTL VALIDATION With the im of estblishing the suitbility of the OBT scheme developed in this work, we crried out fult simultion process t the RTL, dopting comptible fult model. In this wy, we obtin the first metric of the test strtegy. The gte level evlution is performed only if this metric is good. In ddition, the evlution of the test strtegy is eser t the RTL thn t the gte level, becuse the lower time required by the fult simultion nd the smller mount of informtion to be processed. From the severl models proposed in the literture [], [5], [6], [7], [8], we dopt the single stuck-t bit model nd the fult simultion procedure proposed in [9] nd [2], becuse the model is esy to use nd does not require modifictions in the VHDL source. For the filter under study, we simulte 8 fults. For the constnts k nd k2, we dopt complementry vlues s high s possible, with the im of exercising the more significnt bits of the filter.

5 In order to consider fult s detected, we propose two detection criteri. The first one considers fult s detected if the output fulfills t lest one of the two following conditions: t lest shift in the oscilltion frequency of ±, where Tclk is the clock period; or 2Tclk output mplitude not equl to the fult-free mplitude. The second one considers fult s detected if the output fulfills the following condition: t lest one vlue of the output sequence different from the fult-free sequence. Tble 3 shows the RTL fult simultion results. From this tble, it is observed tht the fult coverge is very high for ll detection criteri. These encourging results motivte the evlution t gte level using the single stuckt fult model. By other wy, it should be highlighted tht for ll cses, nd using the criterion, the fults were detected by devitions in the mplitude nd none of them ws detected only by chnges in the frequency. Tble 3. RTL fult simultion results. Fult coverge (% Criterion Criterion 2 7. H GATE LEVEL VALIDATION From the RTL description, the H filter is synthesized t gte level, preserving the RTL structure. The equivlent gte count is of 29. The fults re simulted in Modelsim, using the simultor scripts nd mcro files tht stuck the vlue of the signls during simultion. A number of 372 fults hve been injected nd simulted. The simultion results (Tble show tht the strtegy hs good fult coverge using the criterion nd very good fult coverge using the criterion 2. Additionlly, the difference between RTL nd gte level fult coverge ws of 9.5% in the worst cse. This result suggests tht the RTL metric is good estimtor of the gte-level one. We lso confirm in these experiments tht there is no significnt test informtion in the frequency. The hrd-to-test blocks re the multipliers, which present the most of the undetected fults. It should be noted tht these structures re chrcterized by their low observbility nd controllbility [2], [22]. Despite this fct, the high fult coverge obtined (criterion 2 suggests tht the OBT scheme presented here is stisfctory for testing the multipliers embedded in the current ppliction. Tble. Gte level fult simultion results, H filter. Criterion Fult Coverge (% CONCLUSIONS In this pper, we ddress the problem of testing the highpss FIR filter of digitl shper, in order to obtin complete test solution for this kind of systems. The chrcteristics of the filter re different from the previously ddressed in [2]: it hs high-pss chrcteristic, with smll number of tps, nd presents multipliers. The oscilltion prmeters for the H filter were determined by mens of n nlysis bsed on the circuit functionlity. This pproch llowed finding the nlyticl expression of the oscilltion prmeters, with high precision. The first vlidtion of the strtegy is t the RTL. The fult coverge results were good, nd motivted the evlution of the test strtegy t gte level. The gte-level fult simultion results confirmed the good results obtined t RTL. Medium (pproximtely 9% nd high (more thn 95% fult coverges were obtined from the simultion. This fct suggests tht OBT cn be n ppeling option for testing filters like the used in this work. Although the circuits trgeted here re for specific ppliction, the strtegy developed cn be extended to nother FIR filters. Additionlly, OBT could be used in BIST context, becuse is vectorless strtegy, nd the hrdwre resources employed by the feedbck block re miniml. These chrcteristics turn OBT ttrctive for systems requiring periodic test in field, like spectrometers.. REFERENCES [] Performnce of Digitl Signl Processors for Gmm Spectrometry, Cnberr Appliction Note. [2] G. Peretti, E. Romero, C. Mrqués, D. Vázquez, Using Oscilltion Bsed Test for Digitl Spectrometers, 6th IEEE Ltin Americn Test Workshop, 3 Mrch- 2 April, 25, Brzil. [3] A. Pulli, A. Gerci, nd G. Ripmonti, Qusioptimun γ nd X Spectroscopy bsed on rel-time digitl techniques, Nucler Instruments nd Methods in Physics Reserch, Vol. A39, pp 55-6,

6 [] M. Bolic, V. Drndrevic. Digitl gmm-ry spectroscopy bsed on FPGA technology, Nucler Instruments nd Methods in Physics Reserch, Vol. A82, pp , 22. [5] C. Imperile, A. Imperile, On Nucler Spectrometry Pulses Digitl Shping nd Processing, Mesurement, Vol. 3, 2, pp [6]V. Jordnov, Rel Time Digitl Pulse Shper with Vrible Weighting Function, Nucler Instruments nd Methods in Physics Reserch, Vol. A55, 23, pp [7] A. Pulli. Design-Chrt Aided Optimiztion of Digitl Spectrometers, IEEE Trnsctions on Nucler Science, Vol. 9, No., pp , August 22. [8] A. Di Odordo, Stefno Riboldi, A. Gerci nd G. Ripmonti, Dynmiclly Reconfigurble Architectures for On-line Digitl Pulse Anlysis, Nucler Science Symposium Record, 2 IEEE, Vol., pp 5-9, - Nov. 2. [9] G. Huerts, D. Vázquez, A. Rued, J. Huerts, Effective Oscilltion-Bsed Test for Appliction to DTMF Filter Bnk, Proceedings of Interntionl Test Conference (ITC99, 27 3 September 999, Atlntic City, NJ, United Sttes, pp [] G. Huerts, D. Vázquez, E. Perlís, A. Rued, J. Huerts, Prcticl Oscilltion-Bsed Test of Integrted Filters, IEEE Design & Test of Computers, Vol. 9, No. 6, November- December 22, pp [] E. Romero, G. Peretti, C. Mrqués, A Set of Oscilltors for Oscilltion Bsed Test, Proceedings of the XI Workshop Iberchip, 28-3 Mrch 25, Slvdor de Bhí, Brzil, pp [2] E. Romero, G. Peretti, C. Mrqués, On the Ability of Oscilltion Bsed Test for Detecting Devition Fults in Opertionl Amplifier Specifictions, VI IEEE Ltin Americn Test Workshop (LATW25, Slvdor de Bhí, Brzil, Mrch 3-April 2, pp [3] E. Romero, G. Peretti, G. Huerts, D. Vázquez, Test of Switched-Cpcitor Ldder Filters using OBT, Proc. th Interntionl Mixed-Signl Testing Workshop, Portlnd, Oregon, USA, June 2. [] T. Riesgo, J. Uced, A Fult Model for VHDL Descriptions t the Register Trnsfer Level, Proc. EURO-DAC 96 Europen Design Automtion with EURO-VHDL 96, Genev, Switzerlnd, September 996, pp [5] F. Ferrndi, F. Fummi, D. Sciuto. Implicit Test Genertion for Behviorl VHDL Models, Proc. Interntionl Test Conference, 998, pp [6] G. Al Hyek, Ch. Robch. From Specifiction Vlidtion to Hrdwre Testing: Unified Method, Proc. Interntionl Test Conference, 996, pp [7] C. Chen, T. Noh, VHDL Behviorl ATPG nd Fult Simultion of Digitl Systems, IEEE Trns. on Aerospce nd Electronic Systems, Vol. 3, No.2, pp. 28-7, April 998. [8] P. Tker, V. Agrwl, M. Zghloul, Register-Trnsfer Level Fult Modeling nd Test Evlution Techniques for VLSI Circuits, Proc. Int. Test Conference, pp. 9-99, 2. [9] F. Corno, G. Cumni, M. Sonz Reord nd G. Squillero, RT-level Fult Simultion Techniques bsed on Simultion Commnd Scripts, Proc. DCIS 2: XV Conference on Design of Circuits nd Integrted Systems, Le Corum, Montpellier, November 2. [2] F. Corno, G. Cumni, M. Sonz Reord nd G. Squillero, An RT-Level Fult Model with High Gte Level Correltion, Proc. IEEE Interntionl High Level Vlidtion Workshop, Berkeley, Cliforni, pp. 3-8, November 2. [2] N. Mukherjee, J. Rjski, J. Tyszer. Testing Schemes for FIR Filter Structures, IEEE Trns. On Computers, Vol. 5, No. 7, July 2. [22] A. Benso, S. Di Crlo, G. Di Ntle, P. Prinetto. Online Self-Repir of FIR Filters, IEEE Design & Test of Computers, pp. 5-57, My-June 23. 6

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