Test Report. : 09A255R-ITCEP28V01 Report Version : V1.0

Transcription

1 Established 1981 Advanced Test Equipment Rentals ATEC (2832) Test Report Product Name : Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Model No. : AWK-6222-xx-y (x = 0-9, A - Z, blank or dash; y can be T or blank; dash can be blank if without x or y) Applicant : Moxa Inc. Address : Fl.4, No. 135, Lane 235, Pao-Chiao Rd., Shing Tien City, Taipei, Taiwan, R.O.C. Date of Receipt : 2009/10/08 Issued Date : 2009/11/09 Report No. : 09A255R-ITCEP28V01 Report Version : V1.0 The test results relate only to the samples tested. The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by TAF, NVLAP or any agency of the Government. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

2 Test Report Certification Issued Date : 2009/11/09 Report No. : 09A255R-ITCEP28V01 Product Name : Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Applicant : Moxa Inc. Address : Fl.4, No. 135, Lane 235, Pao-Chiao Rd., Shing Tien City, Taipei, Taiwan, R.O.C. Manufacturer : Moxa Inc. Model No. : AWK-6222-xx-y (x = 0-9, A - Z, blank or dash; y can be T or blank; dash can be blank if without x or y) EUT Rated Voltage : DC 12V - 48V EUT Test Voltage : DC 24V Trade Name : Moxa Applicable Standard : EN : 2006 EN : 2006 EN :2007 CISPR :2003 CISPR :2003 CISPR :2006 EN :1995+A1: 1998+A2: 2001 EN :2006 EN :2004 EN : 2006 EN :1996+A1: 2001 EN :1993+A1: 2001 EN :1993+A1: 2001 Test Result : Complied Performed Location : Quietek Corporation (Linkou Laboratory) No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang, Taipei, 244 Taiwan, R.O.C. TEL: / FAX: Documented By : ( Adm. Specialist / Jinn Chen) Reviewed By : ( Engineer / Kevin Ker ) Approved By : ( Manager / Vincent Lin ) Page: 2 of 116

3 TABLE OF CONTENTS Description Page 1. General Information EUT Description Mode of Operation Tested System Details Configuration of Tested System EUT Exercise Software Technical Test Summary of Test Result List of Test Equipment Measurement Uncertainty Test Environment Conducted Emission (Main Terminals) Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Conducted Emissions (Telecommunication Ports) Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Emission Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrostatic Discharge Page: 3 of 116

4 6.1. Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Radiated Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Electrical Fast Transient/Burst Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Surge Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Conducted Susceptibility Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Page: 4 of 116

5 10.7. Test Photograph Power Frequency Magnetic Field Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Pulsed Magnetic Field Test Specification Test Setup Limit Test Procedure Deviation from Test Standard Test Result Test Photograph Attachment EUT Photograph Page: 5 of 116

6 1. General Information 1.1. EUT Description Product Name Trade Name Model No. Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Moxa AWK-6222-xx-y (x = 0-9, A - Z, blank or dash; y can be T or blank; dash can be blank if without x or y) Component LED BOARD Moxa, PCB AWK-4121 POWER BOARD Moxa, PCB AWK-6222 WLAN CARD Moxa, PCB WAPA003 MOTHER BOARD Moxa, PCB AWK-6222 Page: 6 of 116

7 1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode Mode 1: LAN Mode(DC 24V) Mode 2: WLAN Mode(DC 24V) Mode 3: POE Mode(DC 24V) Final Test Mode Mode 1: LAN Mode(DC 24V) Emission Mode 2: WLAN Mode(DC 24V) Mode 3: POE Mode(DC 24V) Mode 1: LAN Mode(DC 24V) Immunity Mode 2: WLAN Mode(DC 24V) Mode 3: POE Mode(DC 24V) Page: 7 of 116

8 1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Test Mode Mode 1: LAN Mode(DC 24V) Product Manufacturer Model No. Serial No. Power Cord 1 Notebook PC DELL PP04X C8YYM1S Non-Shielded, 1.8m 2 Notebook PC DELL PP04X Non-Shielded, 1.8m Test Mode Mode 2: WLAN Mode(DC 24V) Product Manufacturer Model No. Serial No. Power Cord 1 Notebook PC DELL PP04X C8YYM1S Non-Shielded, 1.8m 2 Notebook PC DELL PP04X Non-Shielded, 1.8m Test Mode Mode 3: POE Mode(DC 24V) Product Manufacturer Model No. Serial No. Power Cord 1 Notebook PC DELL PP04X C8YYM1S Non-Shielded, 1.8m 2 Notebook PC DELL PP04X Non-Shielded, 1.8m 3 POE D-LINK DES-1316 N/A Non-Shielded, 1.8m Page: 8 of 116

9 1.4. Configuration of Tested System Test Mode Mode 1: LAN Mode(DC 24V) Connection Diagram Signal Cable Type Signal cable Description A LAN Cable Non-shielded, 6m, two PCS. Page: 9 of 116

10 Test Mode Mode 2: WLAN Mode(DC 24V) Connection Diagram Signal Cable Type A N/A N/A Signal cable Description Page: 10 of 116

11 Test Mode Mode 3: POE Mode(DC 24V) Connection Diagram Signal Cable Type Signal cable Description A LAN Cable Non-Shielded, 6m, three PCS. Page: 11 of 116

12 1.5. EUT Exercise Software 1 Setup the EUT and simulators as shown on Turn on the power of all equipments. 3 A multi-meter was used to verify the model operation before the measurement. Page: 12 of 116

13 2. Technical Test 2.1. Summary of Test Result No deviations from the test standards Deviations from the test standards as below description: Emission Performed Item Normative References Power Line Conducted EN : 2007 Emission CISPR , CISPR , Impedance Stabilization EN : 2007 Network (ISN) CISPR 22 Radiated Emission EN : 2007 CISPR Test Performed Yes Yes Yes Deviation No No No Immunity Performed Item Normative References Test Performed Deviation Electrostatic Discharge EN : 2001 Yes No Radio-frequency electromagnetic field. (Radiated susceptibility) EN : 2006 Yes No Electrical fast transient/burst EN : 2004 Yes No Surge EN : 2006 Yes No Radio-frequency common EN : 2007 Yes No mode (Conducted susceptibility) Power frequency magnetic EN : 2001 NA NA field Pulsed magnetic field EN : 2001 Yes No Page: 13 of 116

14 2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS /10/20 LISN R&S ENV / /08/14 LISN R&S ENV /02/17 Pulse Limiter R&S ESH3-Z /09/10 Impedance Stabilization Network / SR1 Instrument Manufacturer Type No. Serial No Cal. Date Capacitive Voltage Probe Schaffner CVP2200A /11/14 EMI Test Receiver R&S ESCS /10/20 LISN R&S ENV /02/17 LISN R&S ENV / /08/14 Pulse Limiter R&S ESH3-Z /09/10 RF Current Probe FCC F-65 10KHz~1GHz /11/14 BALANCED TELECOM ISN FCC FCC-TLISN-T /11/18 BALANCED TELECOM ISN FCC FCC-TLISN-T /11/18 BALANCED TELECOM ISN FCC FCC-TLISN-T /11/18 Radiated Emission / Site2 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B /08/01 Broadband Horn Antenna Schwarzbeck BBHA /07/25 EMI Test Receiver R&S ESCS /05/20 Horn Antenna Schwarzbeck BBHA9120D /08/26 Pre-Amplifier QTK N/A N/A 2009/08/01 Spectrum Analyzer Advantest R /11/11 Electrostatic Discharge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date ESD simulator system TESEQ NSG /05/12 Horizontal Coupling Plane(HCP) QuieTek HCP AL50 N/A N/A Vertical Coupling Plane(VCP) QuieTek VCP AL50 N/A N/A Radiated susceptibility / CB5 Instrument Manufacturer Type No. Serial No Cal. Date AF-BOX R&S AF-BOX ACCUST N/A Audio Analyzer R&S UPL /04/15 Biconilog Antenna EMCO N/A Directional Coupler A&R DC N/A Dual Microphone Supply B&K /04/16 Mouth Simulator B&K /04/16 Power Amplifier A&R 30S1G N/A Power Amplifier A&R 100W10000M7 A N/A Power Amplifier SCHAFFNER CBA9413B 4020 N/A Power Amplifier AR 75A250A N/A Power Meter R&S NRVD(P.M) /04/16 Pre-Amplifier A&R 150A N/A Probe Microphone B&K /04/16 Signal Generator R&S SML /09/08 Page: 14 of 116

15 Electrical fast transient/burst / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS /03/10 Surge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS /03/10 Conducted susceptibility / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator Schaffner N/A N/A 2009/04/21 Schaffner NSG 2070 RF-Generator Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaffner CAL U100A N/A CDN Schaffner TRA U N/A CDN M016S Schaffner CAL U100A N/A CDN M016S Schaffner TRA U N/A CDN T002 Schaffner CAL U N/A CDN T002 Schaffner TRA U N/A CDN T400 Schaffner CAL U N/A CDN T400 Schaffner TRA U N/A Coupling Decoupling Network Schaffner CDN M016S /04/02 Coupling Decoupling Network Schaffner CDN T /04/02 Coupling Decoupling Network Schaffner CDN T /04/02 EM-CLAMP Schaffner KEMZ /04/02 Page: 15 of 116

16 2.3. Measurement Uncertainty Conducted Emission The measurement uncertainty is evaluated as ± 2.26 db. Impedance Stabilization Network The measurement uncertainty is evaluated as ± 2.26 db. Radiated Emission The measurement uncertainty is evaluated as ± 3.19 db. Electrostatic Discharge As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in EN through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Radiated susceptibility As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in EN through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 db. Electrical fast transient/burst As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant EFT/Burst standards. The immunity test signal from the EFT/Burst system meet the required specifications in EN through the calibration report with the calibrated uncertainty for the waveform of voltage, frequency and timing as being 1.63 % and 2.76%. Surge As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in EN through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Page: 16 of 116

17 Conducted susceptibility As what is concluded in the document from Note2 of clause of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in CS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant CS standards. The immunity test signal from the CS system meet the required specifications in EN through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 3.72 db and 2.78 db. Page: 17 of 116

18 2.4. Test Environment Performed Item Items Required Actual Temperature ( C) Conducted Emission Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Radiated Emission Humidity (%RH) Barometric pressure (mbar) Impedance Stabilized Temperature ( C) Network Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Electrostatic Discharge Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Radiated susceptibility Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Electrical fast Humidity (%RH) transient/burst Barometric pressure (mbar) Temperature ( C) Surge Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Conducted susceptibility Humidity (%RH) Barometric pressure (mbar) Temperature ( C) Pulsed magnetic field Humidity (%RH) Barometric pressure (mbar) Page: 18 of 116

19 3. Conducted Emission (Main Terminals) 3.1. Test Specification According to EN clause 5 and EN Table Test Setup 3.3. Limit Limits Frequency (MHz) QP (dbuv) AV (dbuv) Remarks: In the above table, the tighter limit applies at the band edges. Page: 19 of 116

20 3.4. Test Procedure According to CISPR clause and CISPR clause 4.3: The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz Deviation from Test Standard No deviation. Page: 20 of 116

21 3.6. Test Result Site : SR1 Time : 2009/11/05-15:20 Limit : CISPR_B_00M_QP Margin : 10 EUT: Industrial IEEE a/b/g dual-rf Access Probe : 8226_176(+) - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 1 Page: 21 of 116

22 Site : SR1 Time : 2009/11/05-15:22 Limit : CISPR_B_00M_QP Margin : 0 EUT: Industrial IEEE a/b/g dual-rf Access Probe : 8226_176(+) - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 22 of 116

23 Site : SR1 Time : 2009/11/05-15:22 Limit : CISPR_B_00M_AV Margin : 0 EUT: Industrial IEEE a/b/g dual-rf Access Probe : 8226_176(+) - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 23 of 116

24 Site : SR1 Time : 2009/11/05-15:24 Limit : CISPR_B_00M_QP Margin : 10 EUT: Industrial IEEE a/b/g dual-rf Access Probe : 8226_177(-) - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 1 Page: 24 of 116

25 Site : SR1 Time : 2009/11/05-15:25 Limit : CISPR_B_00M_QP Margin : 0 EUT: Industrial IEEE a/b/g dual-rf Access Probe : 8226_177(-) - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 25 of 116

26 Site : SR1 Time : 2009/11/05-15:25 Limit : CISPR_B_00M_AV Margin : 0 EUT: Industrial IEEE a/b/g dual-rf Access Probe : 8226_177(-) - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 26 of 116

27 Site : SR1 Time : 2009/11/05-15:43 Limit : CISPR_B_00M_QP Margin : 10 EUT: Industrial IEEE a/b/g dual-rf Access Probe : 8226_176(+) - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 2 Page: 27 of 116

28 Site : SR1 Time : 2009/11/05-15:45 Limit : CISPR_B_00M_QP Margin : 0 EUT: Industrial IEEE a/b/g dual-rf Access Probe : 8226_176(+) - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 28 of 116

29 Site : SR1 Time : 2009/11/05-15:45 Limit : CISPR_B_00M_AV Margin : 0 EUT: Industrial IEEE a/b/g dual-rf Access Probe : 8226_176(+) - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 29 of 116

30 Site : SR1 Time : 2009/11/05-15:46 Limit : CISPR_B_00M_QP Margin : 10 EUT: Industrial IEEE a/b/g dual-rf Access Probe : 8226_177(-) - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 2 Page: 30 of 116

31 Site : SR1 Time : 2009/11/05-15:48 Limit : CISPR_B_00M_QP Margin : 0 EUT: Industrial IEEE a/b/g dual-rf Access Probe : 8226_177(-) - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 31 of 116

32 Site : SR1 Time : 2009/11/05-15:48 Limit : CISPR_B_00M_AV Margin : 0 EUT: Industrial IEEE a/b/g dual-rf Access Probe : 8226_177(-) - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 * AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 32 of 116

33 3.7. Test Photograph Test Mode : Mode 1: LAN Mode(DC 24V) Description : Front View of Conducted Test Test Mode : Mode 1: LAN Mode(DC 24V) Description : Back View of Conducted Test Page: 33 of 116

34 Test Mode : Mode 2: WLAN Mode(DC 24V) Description : Front View of Conducted Test Test Mode : Mode 2: WLAN Mode(DC 24V) Description : Back View of Conducted Test Page: 34 of 116

35 4. Conducted Emissions (Telecommunication Ports) 4.1. Test Specification According to EN clause 5 and EN Table Test Setup 4.3. Limit Limits Frequency (MHz) QP (dbuv) AV (dbuv) Remarks: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50 MHz. Page: 35 of 116

36 4.4. Test Procedure According to CISPR 22 Telecommunication Port: The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 75dB LCL ISN is used for cat. 6 cable, the 65dB LCL ISN is used for cat. 5 cable, 55dB LCL ISN is used for cat Deviation from Test Standard No deviation. Page: 36 of 116

37 4.6. Test Result Site : SR1 Time : 2009/11/05-15:50 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT: Industrial IEEE a/b/g dual-rf Access Probe : ISN_T4 - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 1, 10M Page: 37 of 116

38 Site : SR1 Time : 2009/11/05-15:52 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT: Industrial IEEE a/b/g dual-rf Access Probe : ISN_T4 - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 1, 10M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 5 * QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 38 of 116

39 Site : SR1 Time : 2009/11/05-15:52 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT: Industrial IEEE a/b/g dual-rf Access Probe : ISN_T4 - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 1, 10M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE AVERAGE AVERAGE 5 * AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 39 of 116

40 Site : SR1 Time : 2009/11/05-15:55 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT: Industrial IEEE a/b/g dual-rf Access Probe : ISN_T4 - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 1, 100M Page: 40 of 116

41 Site : SR1 Time : 2009/11/05-15:56 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT: Industrial IEEE a/b/g dual-rf Access Probe : ISN_T4 - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 1, 100M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 41 of 116

42 Site : SR1 Time : 2009/11/05-15:56 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT: Industrial IEEE a/b/g dual-rf Access Probe : ISN_T4 - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 1, 100M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE AVERAGE AVERAGE AVERAGE 6 * AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 42 of 116

43 Site : SR1 Time : 2009/11/05-14:43 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT: Industrial IEEE a/b/g dual-rf Access Probe : CVP-2200A - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 3, 100M Page: 43 of 116

44 Site : SR1 Time : 2009/11/05-14:45 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT: Industrial IEEE a/b/g dual-rf Access Probe : CVP-2200A - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 3, 100M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 44 of 116

45 Site : SR1 Time : 2009/11/05-14:45 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT: Industrial IEEE a/b/g dual-rf Access Probe : CVP-2200A - Line1 Point/Bridge/Client Power : DC 24V Note : Mode 3, 100M Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) AVERAGE AVERAGE AVERAGE AVERAGE 5 * AVERAGE AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 45 of 116

46 4.7. Test Photograph Test Mode : Mode 1: LAN Mode(DC 24V) Description : Front View of ISN Test Test Mode : Mode 1: LAN Mode(DC 24V) Description : Back View of ISN Test Page: 46 of 116

47 Test Mode : Mode 3: POE Mode(DC 24V) Description : Front View of ISN Test Test Mode : Mode 3: POE Mode(DC 24V) Description : Back View of ISN Test Page: 47 of 116

48 5. Radiated Emission 5.1. Test Specification According to EN clause 5 and EN Table Test Setup 5.3. Limit Frequency (MHz) Limits Distance (m) dbuv/m Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument antenna and the closed point of any part of the device or system. Page: 48 of 116

49 5.4. Test Procedure According to CISPR The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 30MHz to1ghz using a receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10 meters Deviation from Test Standard No deviation. Page: 49 of 116

50 5.6. Test Result Site : OATS-2 Time : 2009/10/27-15:09 Limit : CISPR_B_10M_QP Margin : 6 EUT: Industrial IEEE a/b/g dual-rf Access Probe : Site2_CBL6112_10M_ HORIZONTAL Point/Bridge/Client Power : DC 24V Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 6 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 50 of 116

51 Site : OATS-2 Time : 2009/10/27-15:50 Limit : CISPR_B_10M_QP Margin : 6 EUT: Industrial IEEE a/b/g dual-rf Access Probe : Site2_CBL6112_10M_ VERTICAL Point/Bridge/Client Power : DC 24V Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 51 of 116

52 Site : OATS-2 Time : 2009/10/27-17:53 Limit : CISPR_B_10M_QP Margin : 6 EUT: Industrial IEEE a/b/g dual-rf Access Probe : Site2_CBL6112_10M_ HORIZONTAL Point/Bridge/Client Power : DC 24V Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) QUASIPEAK QUASIPEAK 3 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 52 of 116

53 Site : OATS-2 Time : 2009/10/27-18:23 Limit : CISPR_B_10M_QP Margin : 6 EUT: Industrial IEEE a/b/g dual-rf Access Probe : Site2_CBL6112_10M_ VERTICAL Point/Bridge/Client Power : DC 24V Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK 4 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 53 of 116

54 Site : OATS-2 Time : 2009/10/27-17:28 Limit : CISPR_B_10M_QP Margin : 6 EUT: Industrial IEEE a/b/g dual-rf Access Probe : Site2_CBL6112_10M_ HORIZONTAL Point/Bridge/Client Power : DC 24V Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK 7 * QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 54 of 116

55 Site : OATS-2 Time : 2009/10/27-17:10 Limit : CISPR_B_10M_QP Margin : 6 EUT: Industrial IEEE a/b/g dual-rf Access Probe : Site2_CBL6112_10M_ VERTICAL Point/Bridge/Client Power : DC 24V Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv/m) (db) (dbuv/m) QUASIPEAK 2 * QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 55 of 116

56 5.7. Test Photograph Test Mode : Mode 1: LAN Mode(DC 24V) Description : Front View of Radiated Test Test Mode : Mode 1: LAN Mode(DC 24V) Description : Back View of Radiated Test Page: 56 of 116

57 Test Mode : Mode 2: WLAN Mode(DC 24V) Description : Front View of Radiated Test Test Mode : Mode 2: WLAN Mode(DC 24V) Description : Back View of Radiated Test Page: 57 of 116

58 Test Mode : Mode 3: POE Mode(DC 24V) Description : Front View of Radiated Test Test Mode : Mode 3: POE Mode(DC 24V) Description : Back View of Radiated Test Page: 58 of 116

59 6. Electrostatic Discharge 6.1. Test Specification According to EN clause Test Setup 6.3. Limit Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Electrostatic Discharge kv(charge Voltage) ±15 Air Discharge ±8 Contact Discharge B Page: 59 of 116

60 6.4. Test Procedure According to EN Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT. Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point Deviation from Test Standard No deviation. Page: 60 of 116

61 6.6. Test Result Product Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Test Item Electrostatic Discharge Test Mode Mode 1: LAN Mode(DC 24V) Date of Test 2009/10/19 Test Site No.3 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -15kV B B A A Pass Pass Contact Discharge kV -8kV B B A A Pass Pass Indirect Discharge 25 +8kV B A Pass (HCP) 25-8kV B A Pass Indirect Discharge 25 +8kV B A Pass (VCP Front) 25-8kV B A Pass Indirect Discharge 25 +8kV B A Pass (VCP Left) 25-8kV B A Pass Indirect Discharge 25 +8kV B A Pass (VCP Back) 25-8kV B A Pass Indirect Discharge 25 +8kV B A Pass (VCP Right) 25-8kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 61 of 116

62 Product Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Test Item Electrostatic Discharge Test Mode Mode 2: WLAN Mode(DC 24V) Date of Test 2009/10/19 Test Site No.3 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -15kV B B A A Pass Pass Contact Discharge kV -8kV B B A A Pass Pass Indirect Discharge 25 +8kV B A Pass (HCP) 25-8kV B A Pass Indirect Discharge 25 +8kV B A Pass (VCP Front) 25-8kV B A Pass Indirect Discharge 25 +8kV B A Pass (VCP Left) 25-8kV B A Pass Indirect Discharge 25 +8kV B A Pass (VCP Back) 25-8kV B A Pass Indirect Discharge 25 +8kV B A Pass (VCP Right) 25-8kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 62 of 116

63 Product Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Test Item Electrostatic Discharge Test Mode Mode 3: POE Mode(DC 24V) Date of Test 2009/10/19 Test Site No.3 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge kV -15kV B B A A Pass Pass Contact Discharge kV -8kV B B A A Pass Pass Indirect Discharge 25 +8kV B A Pass (HCP) 25-8kV B A Pass Indirect Discharge 25 +8kV B A Pass (VCP Front) 25-8kV B A Pass Indirect Discharge 25 +8kV B A Pass (VCP Left) 25-8kV B A Pass Indirect Discharge 25 +8kV B A Pass (VCP Back) 25-8kV B A Pass Indirect Discharge 25 +8kV B A Pass (VCP Right) 25-8kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 63 of 116

64 6.7. Test Photograph Test Mode : Mode 1: LAN Mode(DC 24V) Description : ESD Test Setup Test Mode : Mode 2: WLAN Mode(DC 24V) Description : ESD Test Setup Page: 64 of 116

65 Test Mode : Mode 3: POE Mode(DC 24V) Description : ESD Test Setup Page: 65 of 116

66 7. Radiated Susceptibility 7.1. Test Specification According to EN clause Test Setup 7.3. Limit Item Environmental Units Test Performance Phenomena Specification Criteria Enclosure Port Radio-Frequency MHz Electromagnetic Field Amplitude Modulated V/m(Un-modulated, rms) % AM (1kHz) A Radio-Frequency MHz Electromagnetic Field Amplitude Modulated V/m(Un-modulated, rms) % AM (1kHz) A Radio-Frequency MHz Electromagnetic Field Amplitude Modulated V/m(Un-modulated, rms) % AM (1kHz) 5 80 A Page: 66 of 116

67 7.4. Test Procedure According to EN The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 5, 10, 20V/m 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz-1000MHz for 20V/m 1400MHz-2100MHz for 10V/m 2100MHz-2500MHz for 5V/m 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 7.5. Deviation from Test Standard No deviation. Page: 67 of 116

68 7.6. Test Result Product Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Test Item Radiated susceptibility Test Mode Mode 1: LAN Mode(DC 24V) Date of Test 2009/10/20 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 20 A A PASS FRONT V 20 A A PASS BACK H 20 A A PASS BACK V 20 A A PASS RIGHT H 20 A A PASS RIGHT V 20 A A PASS LEFT H 20 A A PASS LEFT V 20 A A PASS UP H 20 A A PASS UP V 20 A A PASS DOWN H 20 A A PASS DOWN V 20 A A PASS FRONT H 10 A A PASS FRONT V 10 A A PASS BACK H 10 A A PASS BACK V 10 A A PASS RIGHT H 10 A A PASS RIGHT V 10 A A PASS LEFT H 10 A A PASS LEFT V 10 A A PASS UP H 10 A A PASS UP V 10 A A PASS DOWN H 10 A A PASS DOWN V 10 A A PASS Page: 68 of 116

69 FRONT H 5 A A PASS FRONT V 5 A A PASS BACK H 5 A A PASS BACK V 5 A A PASS RIGHT H 5 A A PASS RIGHT V 5 A A PASS LEFT H 5 A A PASS LEFT V 5 A A PASS UP H 5 A A PASS UP V 5 A A PASS DOWN H 5 A A PASS DOWN V 5 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 69 of 116

70 Product Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Test Item Radiated susceptibility Test Mode Mode 2: WLAN Mode(DC 24V) Date of Test 2009/10/20 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 20 A A PASS FRONT V 20 A A PASS BACK H 20 A A PASS BACK V 20 A A PASS RIGHT H 20 A A PASS RIGHT V 20 A A PASS LEFT H 20 A A PASS LEFT V 20 A A PASS UP H 20 A A PASS UP V 20 A A PASS DOWN H 20 A A PASS DOWN V 20 A A PASS FRONT H 10 A A PASS FRONT V 10 A A PASS BACK H 10 A A PASS BACK V 10 A A PASS RIGHT H 10 A A PASS RIGHT V 10 A A PASS LEFT H 10 A A PASS LEFT V 10 A A PASS UP H 10 A A PASS UP V 10 A A PASS DOWN H 10 A A PASS DOWN V 10 A A PASS Page: 70 of 116

71 FRONT H 5 A A PASS FRONT V 5 A A PASS BACK H 5 A A PASS BACK V 5 A A PASS RIGHT H 5 A A PASS RIGHT V 5 A A PASS LEFT H 5 A A PASS LEFT V 5 A A PASS UP H 5 A A PASS UP V 5 A A PASS DOWN H 5 A A PASS DOWN V 5 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 71 of 116

72 Product Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Test Item Radiated susceptibility Test Mode Mode 3: POE Mode(DC 24V) Date of Test 2009/10/20 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results FRONT H 20 A A PASS FRONT V 20 A A PASS BACK H 20 A A PASS BACK V 20 A A PASS RIGHT H 20 A A PASS RIGHT V 20 A A PASS LEFT H 20 A A PASS LEFT V 20 A A PASS UP H 20 A A PASS UP V 20 A A PASS DOWN H 20 A A PASS DOWN V 20 A A PASS FRONT H 10 A A PASS FRONT V 10 A A PASS BACK H 10 A A PASS BACK V 10 A A PASS RIGHT H 10 A A PASS RIGHT V 10 A A PASS LEFT H 10 A A PASS LEFT V 10 A A PASS UP H 10 A A PASS UP V 10 A A PASS DOWN H 10 A A PASS DOWN V 10 A A PASS Page: 72 of 116

73 FRONT H 5 A A PASS FRONT V 5 A A PASS BACK H 5 A A PASS BACK V 5 A A PASS RIGHT H 5 A A PASS RIGHT V 5 A A PASS LEFT H 5 A A PASS LEFT V 5 A A PASS UP H 5 A A PASS UP V 5 A A PASS DOWN H 5 A A PASS DOWN V 5 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 73 of 116

74 7.7. Test Photograph Test Mode : Mode 1: LAN Mode(DC 24V) Description : Radiated Susceptibility Test Setup Test Mode : Mode 2: WLAN Mode(DC 24V) Description : Radiated Susceptibility Test Setup Page: 74 of 116

75 Test Mode : Mode 3: POE Mode(DC 24V) Description : Radiated Susceptibility Test Setup Page: 75 of 116

76 8. Electrical Fast Transient/Burst 8.1. Test Specification According to EN clause Test Setup 8.3. Limit Item Environmental Phenomena Units Test Specificatio Signal and Telecommunication Ports Fast Transients Common Mode Input DC Power Ports Fast Transients Common Mode Input AC Power Ports Fast Transients Common Mode kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz / / /50 5 Performance Criteria A A A Page: 76 of 116

77 8.4. Test Procedure According to EN The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on the table, and uses a 0.1m insulation between the EUT and ground reference plane. The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and projected beyond the EUT by at least 0.1m on all sides. Test on I/O and communication ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1minute. Test on power supply ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT/B interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 minute. The length of the signal and power lines between the coupling device and the EUT is 0.5m Deviation from Test Standard No deviation. Page: 77 of 116

78 8.6. Test Result Product Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Test Item Electrical fast transient/burst Test Mode Mode 1: LAN Mode(DC 24V) Date of Test 2009/10/12 Test Site No.6 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L-N-PE ± 2 kv 60 Direct A A PASS LAN ± 2 kv 60 Clamp A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 78 of 116

79 Product Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Test Item Electrical fast transient/burst Test Mode Mode 2: WLAN Mode(DC 24V) Date of Test 2009/10/12 Test Site No.6 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L-N-PE ± 2 kv 60 Direct A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 79 of 116

80 Product Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Test Item Electrical fast transient/burst Test Mode Mode 3: POE Mode(DC 24V) Date of Test 2009/10/12 Test Site No.6 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result LAN ± 2 kv 60 Clamp A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 80 of 116

81 8.7. Test Photograph Test Mode : Mode 1: LAN Mode(DC 24V) Description : EFT/B Test Setup Test Mode : Mode 1: LAN Mode(DC 24V) Description : EFT/B Test Setup-Clamp Page: 81 of 116

82 Test Mode : Mode 2: WLAN Mode(DC 24V) Description : EFT/B Test Setup Test Mode : Mode 2: WLAN Mode(DC 24V) Description : EFT/B Test Setup-Clamp Page: 82 of 116

83 Test Mode : Mode 3: POE Mode(DC 24V) Description : EFT/B Test Setup-Clamp Page: 83 of 116

84 9. Surge 9.1. Test Specification According to EN clause Test Setup 9.3. Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Line to Ground Input DC Power Ports Surges Line to Ground Input AC Power Ports Surges Line to Line Line to Ground Tr/Th us kv Output Impedance Coupling Capacitance F Tr/Th us kv Output Impedance Coupling Capacitance F Tr/Th us kv kv Output Impedance Coupling Capacitance F Test Specification 1.2/50 (8/20) /50 (8/20) /50 (8/20) Performance Criteria B B B Page: 84 of 116

85 Notes: 1) Applicable only to ports which according to the manufacturer s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity test shall be required Test Procedure According to EN The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 0 0, 90 0, 180 0, and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min Deviation from Test Standard No deviation. Page: 85 of 116

86 9.6. Test Result Product Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Test Item Surge Test Mode Mode 1: LAN Mode(DC 24V) Date of Test 2009/10/12 Test Site No.6 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± -- 1kV 60 Direct B A PASS N-PE ± -- 2kV 60 Direct B A PASS L-PE ± -- 2kV 60 Direct B A PASS LAN ± -- 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 86 of 116

87 Product Test Item Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Surge Test Mode Mode 2: WLAN Mode(DC 24V) Date of Test 2009/10/12 Test Site No.6 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± -- 1kV 60 Direct B A PASS N-PE ± -- 2kV 60 Direct B A PASS L-PE ± -- 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 87 of 116

88 9.7. Test Photograph Test Mode : Mode 1: LAN Mode(DC 24V) Description : SURGE Test Setup Test Mode : Mode 2: WLAN Mode(DC 24V) Description : SURGE Test Setup Page: 88 of 116

89 10. Conducted Susceptibility Test Specification According to EN clause Test Setup CDN Test Mode EM Clamp Test Mode Page: 89 of 116

90 10.3. Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted Input DC Power Ports Radio-Frequency Continuous Conducted Input AC Power Ports Radio-Frequency Continuous Conducted Test Procedure MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) Test Specification Performance Criteria A A A According to EN The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 140dBuV(10V) Level 3 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% Deviation from Test Standard No deviation. Page: 90 of 116

91 10.6. Test Result Product Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Test Item Conducted susceptibility Test Mode Mode 1: LAN Mode(DC 24V) Date of Test 2009/10/19 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (10V) CDN DC IN A A PASS 0.15~ (10V) CDN LAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 91 of 116

92 Product Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Test Item Conducted susceptibility Test Mode Mode 2: WLAN Mode(DC 24V) Date of Test 2009/10/19 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (10V) CDN DC IN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 92 of 116

93 Product Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Test Item Conducted susceptibility Test Mode Mode 3: POE Mode(DC 24V) Date of Test 2009/10/19 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) dbuv(v) EUT Complied To 0.15~ (10V) CDN LAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 93 of 116

94 10.7. Test Photograph Test Mode : Mode 1: LAN Mode(DC 24V) Description : Conducted Susceptibility Test Setup Test Mode : Mode 1: LAN Mode(DC 24V) Description : Conducted Susceptibility Test Setup-Clamp Page: 94 of 116

95 Test Mode : Mode 2: WLAN Mode(DC 24V) Description : Conducted Susceptibility Test Setup Test Mode : Mode 3: POE Mode(DC 24V) Description : Conducted Susceptibility Test Setup Page: 95 of 116

96 11. Power Frequency Magnetic Field Test Specification According to EN clause Test Setup Limit Item Environmental Phenomena Enclosure Port Power-Frequency Magnetic Field Units Hz Hz Hz A/m (r.m.s.) A/m (r.m.s.) Test Specification Performance Criteria d.c 100 a.c. systems 300 d.c. systems A Note: Test only applies to apparatus containing devices sensitive to magnetic fields, such as Hall elements, electro-dynamic microphones etc. Page: 96 of 116

97 11.4. Test Procedure According to EN The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90 in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations) Deviation from Test Standard No deviation. Page: 97 of 116

98 11.6. Test Result Test is not required since this EUT does not contain devices sensitive to magnetic fields. Page: 98 of 116

99 12. Pulsed Magnetic Field Test Specification According to EN clause Test Setup Pulsed Magnetic Field Generator Limit Item Environmental Phenomena Enclosure Port Pulsed Magnetic Field Units Test Specification Performance Criteria A/m 300 B Page: 99 of 116

100 12.4. Test Procedure According to EN The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90 in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations) Deviation from Test Standard No deviation. Page: 100 of 116

101 12.6. Test Result Product Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Test Item Pulsed Magnetic Field Test Mode Mode 1: LAN Mode(DC 24V) Date of Test 2009/10/19 Test Site No.3 Shielded Room Polarization Pulsed Magnetic Strength (A/m) Required Performance Criteria Performance Criteria Complied To Test Result X Orientation 300 B A PASS Y Orientation 300 B A PASS Z Orientation 300 B A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 101 of 116

102 Product Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Test Item Pulsed Magnetic Field Test Mode Mode 2: WLAN Mode(DC 24V) Date of Test 2009/10/19 Test Site No.3 Shielded Room Polarization Pulsed Magnetic Strength (A/m) Required Performance Criteria Performance Criteria Complied To Test Result X Orientation 300 B A PASS Y Orientation 300 B A PASS Z Orientation 300 B A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 102 of 116

103 Product Industrial IEEE a/b/g dual-rf Access Point/Bridge/Client Test Item Pulsed Magnetic Field Test Mode Mode 3: POE Mode(DC 24V) Date of Test 2009/10/19 Test Site No.3 Shielded Room Polarization Pulsed Magnetic Strength (A/m) Required Performance Criteria Performance Criteria Complied To Test Result X Orientation 300 B A PASS Y Orientation 300 B A PASS Z Orientation 300 B A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 103 of 116

104 12.7. Test Photograph Test Mode : Mode 1: LAN Mode(DC 24V) Description : Pulsed Magnetic Field Test Setup Test Mode : Mode 2: WLAN Mode(DC 24V) Description : Pulsed Magnetic Field Test Setup Page: 104 of 116

105 Test Mode : Mode 3: POE Mode(DC 24V) Description : Pulsed Magnetic Field Test Setup Page: 105 of 116

106 13. Attachment EUT Photograph (1) EUT Photo (2) EUT Photo Page: 106 of 116

107 (3) EUT Photo (4) EUT Photo Page: 107 of 116

108 (5) EUT Photo (6) EUT Photo Page: 108 of 116

109 (7) EUT Photo (8) EUT Photo Page: 109 of 116

110 (9) EUT Photo (10) EUT Photo Page: 110 of 116

111 (11) EUT Photo (12) EUT Photo Page: 111 of 116

112 (13) EUT Photo (14) EUT Photo Page: 112 of 116

113 (15) EUT Photo (16) EUT Photo Page: 113 of 116

114 (17) EUT Photo (18) EUT Photo Page: 114 of 116

115 (19) EUT Photo (20) EUT Photo Page: 115 of 116

116 (21) EUT Photo (22) EUT Photo Page: 116 of 116