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1 LTE TDD What to Test and Why 2012 LitePoint Corp LitePoint, A Teradyne Company. All rights reserved.
2 Agenda LTE Overview LTE Measurements Testing LTE TDD Where to Begin? Building a LTE TDD Verification Plan Optimizing a LTE TDD Verification Plan 2012 LitePoint Corp. 32
3 Why LTE? Something for Everyone For the user.. Higher Performance (Data Rate) Instantaneous downlink peak data rate: 150 Mbit/s in a 20MHz downlink spectrum (5 bit/s/hz) Instantaneous uplink peak data rate: 75 Mbit/s in a 20MHz uplink spectrum (2.5 bit/s/hz) /H For the service provider Cell capacity more users per cell up to 200 active users per cell (5 MHz) (i.e., 200 active data clients) 1 st all-data network: packet-switched Simplifies network architecture no difference between voice & data 2012 LitePoint Corp. 33
4 Key Features of LTE Multiple access scheme Downlink (DL): OFDMA enables maximum spectrum utilization by the base station Uplink (UL): SC-FDMA relaxes the linearity requirements for the handset Multiple Uplink Transmission Modes FDD: balanced DL / UL data traffic by using different channels TDD: enables asymmetric DL / UL capacity, sharing a single channel Adaptive Modulation and Coding LTE dynamically changes modulation based on channel conditions to optimize its capacity DL modulations: QPSK, 16QAM, and 64QAM UL modulations: QPSK and 16QAM Channel Bandwidth Scalability Scalable channel bandwidth allows efficient operation in differently-sized allocated spectrum bands Multiple Antenna Technology MiMo Multiple Antenna techniques enables higher data rate, improve network reliability and data capacity 2012 LitePoint Corp. 34
5 OFDM meets Cellular LTE is the first cellular standard to use OFDMA modulation - Combining time and frequency multiplexing, enabling multiple users to operate in a single time slot OFDMA OFDM Modulation 2012 LitePoint Corp. 35
6 OFDMA Highlights LTE uses OFDMA for the downlink - Uses a large number of narrow sub-carriers for multi-carrier transmission - Resource blocks and elements Each resource block and element is defined in frequency and time (1 block = 180 khz; 0.5 ms) - Dynamically assigns these resource blocks to LTE users, thus improving spectrum utilization - Subcarrier spacing 15 khz compared to khz for WLAN The basic LTE downlink physical resource can be seen as a time-frequency grid: 2012 LitePoint Corp. 36
7 SC-FDMA The LTE uplink transmission scheme based on a pre-coded version of OFDMA known as SC-FDMA (Single Carrier Frequency Division Multiple Access). SC-FDMA operates with a lower Peak to Average Power Ratio (PAPR) than OFDM - High PAPR requires expensive and inefficient power amplifiers SC-FDMA reduces the linearity requirement for power amplifier Two LTE UL transmission modes: - FDD - TDD 2012 LitePoint Corp. 37
8 LTE-FDD & LTE-TDD FDD downlink and uplink traffic is transmitted simultaneously at separate carrier frequencies is the preferred mode by most cellular systems, wherever paired spectrum is available easy transition from existing 3G networks TDD transmission in uplink and downlink is at the same carrier frequency is a good option where spectrum (carriers) availability is lower is necessary when pair spectrum is not available FDD f DL TDD f UL f DL/UL time time 2012 LitePoint Corp. 38
9 LTE-FDD vs. LTE-TDD The two versions of LTE are actually quite similar The only differences are in the physical layer, enabling support of both TDD and FDD with a single chipset - All major LTE chipset vendors have released chipsets that support both FDD and TDD Parameter LTE-FDD LTE-TDD Paired spectrum UL / DL asymmetry Guard interval impact on data capacity Requires spectrum pairs TX and RX on different frequencies Data capacity determined by spectrum allocations Increasing guard interval (due to distance from base station) does not impact data capacity No spectrum pair required TX and RX on the same frequency Possible to dynamically change UL / DL to meet capacity demand Increasing guard interval (due to distance from base station) reduces data capacity 2012 LitePoint Corp. 39
10 LTE Growth China and LTE-TDD will play a key role It is expected that t by 2016, China Mobile will represent over 15 percent of the total t LTE market, with its TDD LTE deployment LitePoint Corp. Source: Signals and Systems Telecom 4/
11 New Challenges in LTE More Bands Band Frequency Range 33 to 41 <2.69 GHz Channel Bandwidths 1.4, 3, 5, 10, 15, 20 MHz Mode TDD More bands means more test time 2012 LitePoint Corp. 41
12 New Challenges in LTE More Configurations LTE has many configurations to test more test time - Per channel 2012 LitePoint Corp. Modulation RB Config PWR Levels QPSK 50,0 4 QPSK 12,0 4 QPSK 12,38 2 QPSK 1,0 1 QPSK 1,24 1 QPSK 149 1, QAM 50, QAM 12, QAM 12, QAM 50, QAM 50,0 1 LTE threatens to reduce test throughput Higher cost test? 42
13 New Challenges in LTE More Bandwidth Spectrum Emission Mask (SEM): Adjacent Channel Leakage Ratio (ACLR): SE Mask Limit: -25 db 20 MHz Channel 25 MHz 25 MHz SEM = 70 MHz Total Bandwidth 2012 LitePoint Corp. 43
14 Testing LTE: Key Requirements RF Frequency Range The test equipment must support the frequency bands 698 MHz MHz The test equipment must support handsets with an increasing number of antennas VSA / VSG Bandwidth The test equipment must have at least 20 MHz VSA/VSG bandwidth - LTE requires support for six channel bandwidths (from 1.4 to 20 MHz) - With LTE-Advanced, this requirement will become 100 MHz - >70 MHz required for single-shot LTE ACLR & Spectrum Emission Mask testing MiMo Technology Support for accurate MiMo testing is necessary in both R&D and MFG In particular, it is essential to have multiple l VSA / VSG ports for DL / UL MIMO signal Transmission Schemes Support two transmission i schemes for downlink and uplink (OFDMA, SC-FDMA) Support two transmission modes (FDD and TDD) 2012 LitePoint Corp. 44
15 Testing LTE TDD: Where to Begin? LTE complexity introduces more than 10x configurations to test - Testing every scenario is not practical In production, we are looking to validate manufacturing quality Goal is to exercise the mobile as much as possible while minimizing test time 2012 LitePoint Corp. 45
16 Testing LTE TDD: Where to Begin? What to test in mobile manufacturing verification: - Physical layer RF measurements - TX power - TX modulation quality - TX frequency - TX / RX timing - RX sensitivity (min / max) What NOT to test in mobile manufacturing verification - Software - Digital Design - Redundant (overlapping) tests or configurations 2012 LitePoint Corp. 46
17 LTE UE Transmitter Tests Measurement TX Power Error Vector Magnitude Frequency Error ACLR Occupied Bandwidth Spectrum Emissions Mask Carrier Leakage Transmit Time Mask In-Band Emissions for non-allocated RBs 2012 LitePoint Corp. Why is this Important? LTE network performance is highly dependent on accurate power control Primary TX quality measurement detects distortions that will ultimately degrade accurate transmission of data Critically important to avoid communication interference Ensures that transmission does not interfere with neighboring channels Confirms that signal is contained within channel allocation Ensures that signal in adjacent channels rolls off to minimize interference An indication of mismatch in the I/Q modulator Verifies UE timing accuracy particularly important for LTE TDD since the UL/DL are on the same frequency Ensures that a UE s assigned RBs (within a channel) do not interfere with the unassigned RBs in the channel 3GPP Measurements 47
18 LTE UE Receiver Tests TX measurements give direct access to the signal via the UE antenna Unlike TX measurements, RX signal quality issues remain buried until the signal is fully decoded Measurement RX Bit Error Rate (BER) RX Sensitivity (RSSI) Notes Fundamental test of a receiver s ability to decode the inbound signal. Typically performed at both min & max RX input power Receive signal strength is a parameter often measured as part of calibration. Since the initial TX power level is calculated per the measured RSSI, accuracy of this measurement directly impacts UE power transmission 3GPP Measurements 2012 LitePoint Corp. 48
19 LTE Test Plan Development Several different approaches to develop a test plan: - Use the 3GPP standard s recommendations - Use the IC manufacturer s recommendations - Use historical data from similar devices - Apply some reasonable logic to look for likely failure modes and apply 3GPP spec conditions 2012 LitePoint Corp. 49
20 Building a LTE TDD TX Verification Test Plan Per-Band / Per-Channel A reasonable LTE test plan covered in 21 configurations Showing config 1-11 Varies in RB Offset for RB = 1, QPSK channel Varies TX Power for RB = 12 QPSK channel Test Configuration Parameters TX Power Modulation QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK RB RB Offset DL Power Measurements Power EVM EVM Flatness Frequency Accuracy Carrier Feedthrough TX Time Mask Occupied Bandwidth ACLR SEM In-Band Emissions for Non-Allocated RBs RB Offset Extremes 2012 LitePoint Corp. 50
21 Building a LTE TDD TX Verification Test Plan Per-Band / Per-Channel A reasonable LTE test plan covered in 21 configurations Showing config Min / Max Min / Max Min / Max Power Tests Absolute Power for 16 Power for 16 for QPSK Power Setting QAM QAM RB = 50 RB = 12 RB = 50 Test Configuration Parameters TX Power Modulation QPSK QPSK QPSK QPSK 16QAM 16QAM 16QAM 16QAM 16QAM 16QAM RB RB Offset DL Power Measurements Power EVM EVM Flatness Frequency Accuracy Carrier Feedthrough TX Time Mask Occupied Bandwidth ACLR SEM In-Band Emissions for Non-Allocated RBs RB Offset Extremes 2012 LitePoint Corp. 51
22 Optimizing the TX Test Plan Configurations 1, 3, 12, & 20 test the extremes of modulation and RB allocations / offsets Configuration 4 is a typical use case Test Configuration Parameters TX Power Modulation QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK 16QAM 16QAM 16QAM 16QAM 16QAM 16QAM RB RB Offset DL Power Measurements Power EVM EVM Flatness Frequency Accuracy Carrier Feedthrough TX Time Mask Occupied Bandwidth ACLR SEM In-Band Emissions for Non-Allocated RBs No Need for Mid- Covered by Already Tested Band Covered by Channel Offset Config 21 Edges in Configs 1 & 3 Config 21 Can be covered by any absolute power setting Covered by Config 20 & 21, do not need mid-rb Configurations we definitely want to keep 2012 LitePoint Corp. 52
23 Condensed Test Plan Reduced to 7 TX configurations Added RX tests Increases number of measurements while reducing test time Test Configuration Parameters T1 T2 T3 T4 T5 T6 T7 TX Power Modulation QPSK QPSK QPSK QPSK QPSK 16QAM 16QAM RB (UL / DL) RB Offset DL Power Measurements TX1 TX2 TX3 TX4 TX5 TX6 TX7 Power MPR MPR MPR EVM EVM Flatness Frequency Accuracy Carrier Feedthrough TX Time Mask Occupied Bandwidth ACLR SEM In-Band Emissions for Non-Allocated drbs Measurements RX1 RX2 RX3 RX BER RX Level 2012 LitePoint Corp. 53
24 LTE TDD Manufacturing Test LTE increases test complexity 5 to 10X - More measurements, more antennas, wider bandwidth, higher performance - IQxstream s unique architecture makes LTE test simple and fast Test plan development for LTE needs to focus on exercising the mobile device with the minimum test time A test plan can be created to maximize the coverage of the device by using the test equipment in an efficient manner - Number of configurations take more test time than number of tests - Scale test plan to multi-dut through turnkey non-signaling solutions - No sacrifice in product quality with shorter per-dut test times 2012 LitePoint Corp. 54
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