Variation Tolerant On-Chip Interconnects

Transcription

1 Variation Tolerant On-Chip Interconnects

2 ANALOG CIRCUITS AND SIGNAL PROCESSING Series Editors: Mohammed Ismail. The Ohio State University Mohamad Sawan. École Polytechnique de Montréal For further volumes:

3 Ethiopia Enideg Nigussie Variation Tolerant On-Chip Interconnects 123

4 Ethiopia Enideg Nigussie University of Turku Turku Finland ISBN e-isbn DOI / Springer New York Dordrecht Heidelberg London Library of Congress Control Number: Springer Science+Business Media, LLC 2012 All rights reserved. This work may not be translated or copied in whole or in part without the written permission of the publisher (Springer Science+Business Media, LLC, 233 Spring Street, New York, NY 10013, USA), except for brief excerpts in connection with reviews or scholarly analysis. Use in connection with any form of information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed is forbidden. The use in this publication of trade names, trademarks, service marks, and similar terms, even if they are not identified as such, is not to be taken as an expression of opinion as to whether or not they are subject to proprietary rights. Printed on acid-free paper Springer is part of Springer Science+Business Media (

5 Preface The design paradigm shift from single-core to multicore systems and from corecentric to interconnect-centric designs has emphasized the importance of high performance and reliable on-chip interconnects. In sub-100 nm technologies, variability has become a major challenge and it is considered one of the primary limiters for technology scaling. The inability to precisely control the manufacturing process leads to unpredictable device and wire characteristics, which in turn cause performance and power variability besides error-prone behavior. The performance and reliability of an interconnect is also affected by the environment in which it operates such as temperature, power supply voltage and noise. All these variations cause the signal propagation delay of the interconnect to be uncertain which in turn affects the performance and reliability of the communication significantly. Traditionally corner based analysis has been used to guard against yield loss resulting from these variations; however, with increasing number of sources of variation, corner based methods are becoming overly pessimistic and computationally expensive. Self-timed design methodologies can make the communication resilient to delay variations. More specifically, self-timed delay-insensitive links can operate correctly in the presence of delay variations in gates and interconnecting wires. In this monograph designs of high performance and variation tolerant on-chip interconnects are presented. The design and implementation of these interconnects are based on formulation and integration of different circuit level techniques. Since delay variations are inevitable, the design focuses on self-timed delay-insensitive communication. In this regard, design and optimization of delay-insensitive data encoding/decoding schemes as well as formulation of efficient communication protocols are performed. To compensate the delay overhead of delay-insensitive communication, high speed signaling techniques are developed and implemented. In addition, a novel high speed completion detection technique is devised and implemented to solve the performance bottleneck caused by conventional completion detection methods. A high-throughput and power efficient serial interconnect is also designed in order to be used as a long-range on-chip communication link. Furthermore, an interconnect calibration technique after every power start-up of a system is developed and implemented to ensure signal integrity of the interconnects v

6 vi Preface despite process, wearout and aging caused variations. A runtime supply voltage and temperature (VT) variation tolerance technique is also devised and implemented for the interconnects. These Process, Voltage and Temperature (PVT) variation tolerance schemes make the interconnects adaptive to the effect of variations, enabling continuous and reliable operation of the interconnect. The manuscript is organized as follows. The introduction in Chap. 1 focuses on the drive for interconnect-centric design and challenges of global on-chip communication. In Chap. 2, the design techniques used to implement the presented high performance delay-insensitive interconnects are discussed. Methods and basis for estimating wire parasitics along with the electrical level modeling of wires is discussed in Chap. 3. Design and analysis of the three delay-insensitive current sensing on-chip interconnects are presented in Chap. 4. In addition, analysis of their performance and power consumption as well as comparison with conventional delay-insensitive on-chip interconnects are presented. In Chap. 6, a high speed completion detection technique as well as its design is presented in order to enhance the performance of the delay-insensitive interconnects. Furthermore, two of the interconnects presented in Chap. 4 are redesigned and presented as case studies to demonstrate the advantage of the presented completion detection technique. Analysis of their performance, energy dissipation and area besides comparison with the reference cases are also discussed. In Chap. 6, implementation and analysis of high-throughput serial on-chip interconnect targeted for long-range communication is presented. Also, comparison of throughput, energy and area between fully bit-parallel, bit-serial and semi-serial links are performed. All the interconnects which are presented in Chaps. 4 6 are redesigned using 65 nm CMOS technology and their performance, energy dissipation, and area are compared in Chap. 7. In Chap. 8, circuit techniques as well as implementations to tolerate process, supply VT variation effects on the signal integrity of the interconnects are presented. Although much care has been made in the preparation of the manuscript, flaws and errors might still exist due to erring human nature. Suggestions and appropriate comments are highly appreciated. Turku, Finland Ethiopia Enideg Nigussie

7 Acknowledgements I would like to take this opportunity to express my sincere gratitude to the people and institutions that have helped me to accomplish this research work. This manuscript is developed from my doctoral dissertation and due to this I am grateful to my doctoral research supervisors Adj. Prof. Juha Plosila, Prof. Jouni Isoaho, and Prof. Hannu Tenhunen. Their inspiration, guidance and support has been the main driving force for this research. The support from the Department of Information Technology, University of Turku, Finland where I carried out this research is gratefully acknowledged. My heartfelt appreciation goes to Professor Mohammed Ismail, the series editor of Analog Circuits and Signal Processing, for his comments on the contents of the manuscript as well as for inviting me to write this monograph. Many thanks to the editorial staff of Springer, especially Charles B. Glaser, Senior Editor Electrical Engineering, they have been wonderfully supportive and encouraging. A large dept of gratitude is owed to my wonderful mother Yisgedu Agonafir. Though I lost you many years ago, you are still inspiring me to work hard and reach further. vii

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9 Contents 1 Introduction Emergence of Interconnect-Centric Design Device and Interconnect Scaling System-on-Chip and Multicore Systems Network-on-Chip Challenges of Global On-Chip Interconnect Performance and Power Consumption Variability and Reliability Global On-Chip Communication Techniques GALS Communication Self-timed Delay-Insensitive Communication Related Work High Performance Interconnect Variation Tolerant Interconnect High Performance and Variation Tolerant Interconnect Interconnect Design Techniques Handshaking Protocols Data Encoding Techniques Data Decoding Techniques Completion Detection Techniques Self-timed Components On-Chip Signaling Schemes Current-Mode and Current Sensing Signaling Voltage-Mode Signaling: Reference Chapter Summary On-Chip Wire Modeling Wire Parasitic Estimation and Extraction Resistance Capacitance Inductance ix

10 x Contents 3.2 Electrical Level Wire Modeling Chapter Summary Design of Delay-Insensitive Current Sensing Interconnects Level-Encoded Dual-Rail Current Sensing Interconnect Data Encoder and Driver Receiver, Decoder and Completion Detector Acknowledgment Transmission Simulation Results and Analysis Effect of Crosstalk on Timing of-4 Encoded Current Sensing Interconnect Encoder and Driver Receiver Decoder and Completion Detector Acknowledgment Transmission Reference Voltage-Mode Interconnects Simulation Results and Analysis Dual-Rail Encoded Differential Current Sensing Interconnect Encoding and Its Implementation Driver, Receiver and Completion Detector Acknowledgment Transmission Simulation Results and Analysis Chapter Summary Enhancing Completion Detection Performance Delay-Insensitive Bit Parallel Transmission High-Speed Completion Detection Technique Case Studies of-4 Encoded Current Sensing Interconnect Dual-rail Encoded Differential Current Sensing Interconnect Acknowledgment Transmission Reference Cases Simulation Results and Analysis Wire Model Simulations Setup Performance Analysis Power Analysis Noise Analysis Post-Layout Simulation Area Comparison Chapter Summary Energy Efficient Semi-Serial Interconnect Long-Range Link in NoC High-Throughput Serial On-Chip Interconnect Communication Protocol... 98

11 Contents xi Serializer and Pulse Dual-Rail Encoding High-Speed Differential Pulse Current-Mode Signaling Deserializer Acknowledgment Transmission Simulation Results and Analysis Wire Model and Simulation Waveforms Performance Power and Energy Consumption Effect of PVT Variations Bit Error Rate (BER) Fully Bit-Parallel vs Bit-Serial and Semi-Serial Links Chapter Summary Comparison of the Designed Interconnects Summary of the Interconnects Comparison of the Interconnects Performance Power Efficiency Area Chapter Summary Circuit Techniques for PVT Variation Tolerance Signal Integrity of Current Sensing Interconnect Effects of Process Variation Runtime Supply Voltage and Temperature Variations Post-Manufacture Variation Adaptation Calibration for Process Variation Tolerance Algorithm and Methodology Reconfiguration Control and Communication Circuits Runtime Management of Voltage and Temperature Variations Sensing Effects of Voltage and Temperature Variation Sensor Circuit Implementation Reconfiguration and Retransmission Simulation Results and Analysis Chapter Summary References Index

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