Microscopic Structures
|
|
- Gabriella Anderson
- 5 years ago
- Views:
Transcription
1 Microscopic Structures Image Analysis Metal, 3D Image (Red-Green) The microscopic methods range from dark field / bright field microscopy through polarisation- and inverse microscopy to techniques like differential interference contrast (DIC) or circular polarisation (CP). The integrated software quantifies the morphological structures. Thus the computer calculates, for example, distributions or fineness of fibre bundles or areas of corrosion. Digital Optical Microscopy (DOM) Neurons The basic technique is to extract sharp image information from several virtual layers of the object like in confocal microscopy, but with the advantage to use all microscopic standard techniques. The result is visualised as 3 dimensional images. It is also possible to overlay two or more images, e. g. produced by different techniques, like DIC (differential interference contrast) combined with fluorescence. Magnifications over 2000 can be achieved. Pollen
2 Microscopic Structures Confocal Microscopy Only light coming from the focal plane is being detected. Minimal volume element: 350 nm x 350 nm and 500 nm in z-direction (Excitation at 532 nm) Pinhole is realized by optical fibers Confocal microscope, based on a Witec alpha300 system 2 µm Confocal microscopy of a test pattern for lateral resolution measurement Confocal Setup Back Scattering Microscopy Back Scattering Microscopy of a Silicon Chip Back Scattering Microscopy of a Glioblastoma multiforme cell
3 Nanoscopic Analysis Scanning Probe Microscopy (SPM) Atomic Force Microscope by Digital Instruments Scanning probe microscopy measures the distance dependent interaction between the sample surface and a sensor tip. In this way, the topography of conducting and isolating samples on an atomic scale can be analysed. Depending on the sensor tip different measuring modes can be applied. Features: - AFM, MFM - Tapping, Contact and Phase Imaging x 125 µm x 5 µm scanning range - ~7 nm x ~7 nm x ~0.2 nm resolution limit - electrochemical cell - flow cell Test grating CD groves Atomic Force Microscopy (AFM) The AFM is the most common tool for imaging, measuring and manipulating materials on a nanoscale. The topography of a surface can be imaged by scanning mechanically a silicon tip over the surface. Different surface forces lead to a deflection signal of a cantilever. The deflection is measured by a reflecting laser spot from the cantilever surface into a four quadrant diode. Tender, fragile, particulate or adhesive surfaces are scanned in phase imaging or tapping mode with an oscillating probe tip. In this way, neither the tip nor the sample can be contaminated during scanning, and no force is exerted on to the surface. Thus, material contrasts are visible. In addition, an electrochemical measuring mode can provide information of the electrochemical properties combined with topographic information. Magnetic Force Microscopy (MFM) The silicon tip is replaced by a permanent magnet, so a change in the magnetic interaction can be imaged. Chromosome
4 detection aperture detectors monochromator Nanoscopic Analysis VIS-camera SPM-Unit Zeiss Universal- Microscope-Spectral- Photometer UMSP 80 with near field unit SIL-SNOM schematic setup light sources Scanning Near Field Optical Microscopy (SNOM) and Near Field Optical Spectroscopy (SNOS) The diffraction limit of wide-field microscopy prevents resolving features smaller than half of a wavelength. Near field optical microscopy is able to extend the range of optical measurements beyond the diffraction limit. During the last years, Scanning Probe Microscopy has developed as a valuable tool to image different surface interactions even in the nanoscale. The combination of this high resolution technique and the chemical information of spectroscopy makes scanning near-field optical microscopy and -spectroscopy attractive for the characterization of the morphology and the chemistry of surfaces and cell structures. a b Apertureless SNOM: Solid Immersion Lens (SIL) Aperture-based SNOM: Pyramidal silicon tip with pinhole ( nm wide) SIL-SNOM Example Images. a: monocyte cell structures, b: test pattern for lateral resolution evaluation Topography and optical information can be acquired simultaneously by scanning near field optical microscopy (SNOM). For this purpose, either an apertureless solid immersion lens (SIL) or an aperture-based probe (pinhole pyramid) is positioned in the light path. Using a SIL enables different contrast modi and even the possibility of near field spectroscopy (SNOS): - Reflection-, Photon tunnelling-, Fluorescence contrast modi - Fluorescence Lifetime Measurements - ~30 nm x ~30 nm x ~0.2 nm resolution limit - VIS-, NIR- and Raman Spectroscopy
5 Nanoscopic Analysis Witec alpha300 system with near field unit and VIS-, snirand Raman spectrometer SIL-SNOM Contrast Modi SNOM and SNOS with Aperturebased and Aperture-less Probes Our unique, multimodal microscopy system allows SNOM and SNOS in various modi and combinations: - Use of aperture-less probes (SIL) or aperturebased probes (pinhole pyramids) - Measurement in reflexion or in transmission - SNOS: VIS-, NIR-, Raman-, Back Scattering- and Fluorescence Spectroscopy Reflectance-SNOM (R-SNOM) SNOM setup with SIL in the Witec alpha300 microscope. Photon-tunnelling SNOM (P-SNOM) The combination of AFM, near field (SNOM, SNOS) and far field techniques (e.g. Raman Imaging, confocal Microscopy) on the same instrument allows us to analyze the same sample position with various measuring setups. a b c Fluorescence SNOM (F-SNOM) SIL SNOM images in different contrast modi. a: R-SNOM, b: P-SNOM of a RAM chip (40 x 40 µm). c: F-SNOM - Intrinsic fluorescence of a flax cross section (100 x 100 µm), excitation: 395 nm 440 nm
6 Nanoscopic Analysis Scanning Near Field Optical Spectroscopy (SNOS) Using a Solid Immersion Lens (SIL) for SNOS measurements has plenty of advantages: Surface topography of human metaphase chromosomes High transmission efficiency Illumination and collection of light with a single probe Good signal/noise ratio in spectroscopy and fluorescence measurements. Optical and topographical information at the same time Suitable as near field solution for materials science as well as for life sciences. a b Optical near-field image of human metaphase chromosomes a: SIL-SNOM image of a human chromosome. Near field spectra were recorded at the points marked as p, q and c. b: Near field spectra of a human chromosome, using a Solid Immersion Lens and VIS-Spectrometer. Optical near-field image of an Al 2 O 3 -membrane-surface Near field VIS spectrum of an Al 2 O 3 -membrane-surface
Chemical Imaging. Whiskbroom Imaging. Staring Imaging. Pushbroom Imaging. Whiskbroom. Staring. Pushbroom
Chemical Imaging Whiskbroom Chemical Imaging (CI) combines different technologies like optical microscopy, digital imaging and molecular spectroscopy in combination with multivariate data analysis methods.
More informationResolution. Diffraction from apertures limits resolution. Rayleigh criterion θ Rayleigh = 1.22 λ/d 1 peak at 2 nd minimum. θ f D
Microscopy Outline 1. Resolution and Simple Optical Microscope 2. Contrast enhancement: Dark field, Fluorescence (Chelsea & Peter), Phase Contrast, DIC 3. Newer Methods: Scanning Tunneling microscopy (STM),
More informationattocfm I for Surface Quality Inspection NANOSCOPY APPLICATION NOTE M01 RELATED PRODUCTS G
APPLICATION NOTE M01 attocfm I for Surface Quality Inspection Confocal microscopes work by scanning a tiny light spot on a sample and by measuring the scattered light in the illuminated volume. First,
More informationNanonics Systems are the Only SPMs that Allow for On-line Integration with Standard MicroRaman Geometries
Nanonics Systems are the Only SPMs that Allow for On-line Integration with Standard MicroRaman Geometries 2002 Photonics Circle of Excellence Award PLC Ltd, England, a premier provider of Raman microspectral
More informationNSOM (SNOM) Overview
NSOM (SNOM) Overview The limits of far field imaging In the early 1870s, Ernst Abbe formulated a rigorous criterion for being able to resolve two objects in a light microscope: d > ë / (2sinè) where d
More informationattosnom I: Topography and Force Images NANOSCOPY APPLICATION NOTE M06 RELATED PRODUCTS G
APPLICATION NOTE M06 attosnom I: Topography and Force Images Scanning near-field optical microscopy is the outstanding technique to simultaneously measure the topography and the optical contrast of a sample.
More informationMicroscopy. Matti Hotokka Department of Physical Chemistry Åbo Akademi University
Microscopy Matti Hotokka Department of Physical Chemistry Åbo Akademi University What s coming Anatomy of a microscope Modes of illumination Practicalities Special applications Basic microscope Ocular
More informationImproving the Collection Efficiency of Raman Scattering
PERFORMANCE Unparalleled signal-to-noise ratio with diffraction-limited spectral and imaging resolution Deep-cooled CCD with excelon sensor technology Aberration-free optical design for uniform high resolution
More information3D light microscopy techniques
3D light microscopy techniques The image of a point is a 3D feature In-focus image Out-of-focus image The image of a point is not a point Point Spread Function (PSF) 1D imaging 1 1 2! NA = 0.5! NA 2D imaging
More informationNanoSpective, Inc Progress Drive Suite 137 Orlando, Florida
TEM Techniques Summary The TEM is an analytical instrument in which a thin membrane (typically < 100nm) is placed in the path of an energetic and highly coherent beam of electrons. Typical operating voltages
More information; A=4π(2m) 1/2 /h. exp (Fowler Nordheim Eq.) 2 const
Scanning Tunneling Microscopy (STM) Brief background: In 1981, G. Binnig, H. Rohrer, Ch. Gerber and J. Weibel observed vacuum tunneling of electrons between a sharp tip and a platinum surface. The tunnel
More informationSingle-photon excitation of morphology dependent resonance
Single-photon excitation of morphology dependent resonance 3.1 Introduction The examination of morphology dependent resonance (MDR) has been of considerable importance to many fields in optical science.
More informationNano Scale Optics with Nearfield Scanning Optical Microscopy (NSOM)
Nano Scale Optics with Nearfield Scanning Optical Microscopy (NSOM) Presentation Overview Motivation for nearfield optics Introduction to NSOM What is NSOM today? What can you do with NSOM? November 2,
More informationChapter 2 The Study of Microbial Structure: Microscopy and Specimen Preparation
Chapter 2 The Study of Microbial Structure: Microscopy and Specimen Preparation 1 Lenses and the Bending of Light light is refracted (bent) when passing from one medium to another refractive index a measure
More informationLecture 20: Optical Tools for MEMS Imaging
MECH 466 Microelectromechanical Systems University of Victoria Dept. of Mechanical Engineering Lecture 20: Optical Tools for MEMS Imaging 1 Overview Optical Microscopes Video Microscopes Scanning Electron
More informationDIC Imaging using Laser Scanning Microscopes (LSMs) on Axio Imager Stands
DIC Imaging using Laser Scanning Microscopes (LSMs) on Axio Imager Stands Differential Interference Contrast (DIC) imaging is a technique used to increase contrast in brightfield images. In confocal systems,
More informationTRAINING MANUAL. Multiphoton Microscopy LSM 510 META-NLO
TRAINING MANUAL Multiphoton Microscopy LSM 510 META-NLO September 2010 Multiphoton Microscopy Training Manual Multiphoton microscopy is only available on the LSM 510 META-NLO system. This system is equipped
More informationInstructions for the Experiment
Instructions for the Experiment Excitonic States in Atomically Thin Semiconductors 1. Introduction Alongside with electrical measurements, optical measurements are an indispensable tool for the study of
More informationConfocal Microscopy and Related Techniques
Confocal Microscopy and Related Techniques Chau-Hwang Lee Associate Research Fellow Research Center for Applied Sciences, Academia Sinica 128 Sec. 2, Academia Rd., Nankang, Taipei 11529, Taiwan E-mail:
More information:... resolution is about 1.4 μm, assumed an excitation wavelength of 633 nm and a numerical aperture of 0.65 at 633 nm.
PAGE 30 & 2008 2007 PRODUCT CATALOG Confocal Microscopy - CFM fundamentals :... Over the years, confocal microscopy has become the method of choice for obtaining clear, three-dimensional optical images
More informationMicroscopy Techniques that make it easy to see things this small.
Microscopy Techniques that make it easy to see things this small. What is a Microscope? An instrument for viewing objects that are too small to be seen easily by the naked eye. Dutch spectacle-makers Hans
More information- Near Field Scanning Optical Microscopy - Electrostatic Force Microscopy - Magnetic Force Microscopy
- Near Field Scanning Optical Microscopy - Electrostatic Force Microscopy - Magnetic Force Microscopy Yongho Seo Near-field Photonics Group Leader Wonho Jhe Director School of Physics and Center for Near-field
More informationProbe NanoLaboratory. NTEGRA Spectra. Upright configuration. Instruction Manual
NTEGRA Probe NanoLaboratory NTEGRA Spectra Upright configuration Instruction Manual ` NTEGRA Spectra Probe NanoLaboratory (Upright Configuration with Solar TII Spectrometer) Instruction Manual 1 February
More informationDIC Imaging using Laser Scanning Microscopes (LSM) on Inverted Stands
DIC Imaging using Laser Scanning Microscopes (LSM) on Inverted Stands Differential Interference Contrast (DIC) imaging is a technique used to increase contrast in brightfield images. In confocal systems,
More informationCONFIGURING. Your Spectroscopy System For PEAK PERFORMANCE. A guide to selecting the best Spectrometers, Sources, and Detectors for your application
CONFIGURING Your Spectroscopy System For PEAK PERFORMANCE A guide to selecting the best Spectrometers, s, and s for your application Spectral Measurement System Spectral Measurement System Spectrograph
More informationObserving Microorganisms through a Microscope LIGHT MICROSCOPY: This type of microscope uses visible light to observe specimens. Compound Light Micros
PHARMACEUTICAL MICROBIOLOGY JIGAR SHAH INSTITUTE OF PHARMACY NIRMA UNIVERSITY Observing Microorganisms through a Microscope LIGHT MICROSCOPY: This type of microscope uses visible light to observe specimens.
More informationCFIM MICROSCOPY COURSE PROGRAMME PRINCIPLES OF MICROSCOPY CONFOCAL AND FLUORESCENCE MICROSCOPY
CFIM MICROSCOPY COURSE PROGRAMME PRINCIPLES OF MICROSCOPY 11.01.16-15.01.2016 CONFOCAL AND FLUORESCENCE MICROSCOPY 25.01.16-29.01.2016 PhD Course - University of Copenhagen Department of Biomedical Sciences
More informationAtomic Force Microscopes
Nanoscale Surface Characterization tomic Force Microscopes www.witec.de WITec tomic Force Microscopes Nanoscale Surface Characterization The WITec tomic Force Microscope (FM) module integrated with a research-grade
More informationApplications of Steady-state Multichannel Spectroscopy in the Visible and NIR Spectral Region
Feature Article JY Division I nformation Optical Spectroscopy Applications of Steady-state Multichannel Spectroscopy in the Visible and NIR Spectral Region Raymond Pini, Salvatore Atzeni Abstract Multichannel
More informationWhy and How? Daniel Gitler Dept. of Physiology Ben-Gurion University of the Negev. Microscopy course, Michmoret Dec 2005
Why and How? Daniel Gitler Dept. of Physiology Ben-Gurion University of the Negev Why use confocal microscopy? Principles of the laser scanning confocal microscope. Image resolution. Manipulating the
More informationFast Laser Raman Microscope RAMAN
Fast Laser Raman Microscope RAMAN - 11 www.nanophoton.jp Fast Raman Imaging A New Generation of Raman Microscope RAMAN-11 developed by Nanophoton was created by combining confocal laser microscope technology
More informationSensors and Metrology - 2 Optical Microscopy and Overlay Measurements
Sensors and Metrology - 2 Optical Microscopy and Overlay Measurements 1 Optical Metrology Optical Microscopy What is its place in IC production? What are the limitations and the hopes? The issue of Alignment
More informationAdministrative details:
Administrative details: Anything from your side? www.photonics.ethz.ch 1 What are we actually doing here? Optical imaging: Focusing by a lens Angular spectrum Paraxial approximation Gaussian beams Method
More informationEducation in Microscopy and Digital Imaging
Contact Us Carl Zeiss Education in Microscopy and Digital Imaging ZEISS Home Products Solutions Support Online Shop ZEISS International ZEISS Campus Home Interactive Tutorials Basic Microscopy Spectral
More informationSensitive measurement of partial coherence using a pinhole array
1.3 Sensitive measurement of partial coherence using a pinhole array Paul Petruck 1, Rainer Riesenberg 1, Richard Kowarschik 2 1 Institute of Photonic Technology, Albert-Einstein-Strasse 9, 07747 Jena,
More informationFast Laser Raman Microscope RAMAN
Fast Laser Raman Microscope RAMAN - 11 www.nanophoton.jp Fast Raman Imaging A New Generation of Raman Microscope RAMAN-11 developed by Nanophoton was created by combining confocal laser microscope technology
More informationBeams and Scanning Probe Microscopy
IFN-CNR, Sezione di Trento Istituto Trentino di Cultura of Trento Department of Physics University of Trento Towards the joint use of X-ray Beams and Scanning Probe Microscopy Silvia Larcheri SILS 2005
More informationFastest high definition Raman imaging. Fastest Laser Raman Microscope RAMAN
Fastest high definition Raman imaging Fastest Laser Raman Microscope RAMAN - 11 www.nanophoton.jp Observation A New Generation in Raman Observation RAMAN-11 developed by Nanophoton was newly created by
More informationECEN. Spectroscopy. Lab 8. copy. constituents HOMEWORK PR. Figure. 1. Layout of. of the
ECEN 4606 Lab 8 Spectroscopy SUMMARY: ROBLEM 1: Pedrotti 3 12-10. In this lab, you will design, build and test an optical spectrum analyzer and use it for both absorption and emission spectroscopy. The
More informationManufacturing Metrology Team
The Team has a range of state-of-the-art equipment for the measurement of surface texture and form. We are happy to discuss potential measurement issues and collaborative research Manufacturing Metrology
More informationWITec Alpha 300R Quick Operation Summary October 2018
WITec Alpha 300R Quick Operation Summary October 2018 This document is frequently updated if you feel information should be added, please indicate that to the facility manager (currently Philip Carubia,
More informationSENSOR+TEST Conference SENSOR 2009 Proceedings II
B8.4 Optical 3D Measurement of Micro Structures Ettemeyer, Andreas; Marxer, Michael; Keferstein, Claus NTB Interstaatliche Hochschule für Technik Buchs Werdenbergstr. 4, 8471 Buchs, Switzerland Introduction
More informationConfocal Raman Microscopy (WITec Alpha 300R)
Confocal Raman Microscopy (WITec Alpha 300R) Please refer to Witec Alpha300R Confocal Raman Microscope User Manual for the details of the operating procedure. Sample preparation 1. Attach your sample on
More informationBaySpec SuperGamut OEM
BaySpec SuperGamut OEM Spectrographs & Spectrometers RUGGED SOLID STATE HIGH RESOLUTION OPTIMIZED COOLING COST EFFECTIVE HIGH THROUGHPUT www.bayspec.com Specifications Model UV-NIR VIS-NIR NIR 900-1700nm
More informationIMAGING P-N JUNCTIONS BY SCANNING NEAR-FIELD OPTICAL, ATOMIC FORCE AND ELECTRICAL CONTRAST MICROSCOPY. G. Tallarida Laboratorio MDM-INFM
Laboratorio MDM - INFM Via C.Olivetti 2, I-20041 Agrate Brianza (MI) M D M Materiali e Dispositivi per la Microelettronica IMAGING P-N JUNCTIONS BY SCANNING NEAR-FIELD OPTICAL, ATOMIC FORCE AND ELECTRICAL
More informationCircular Dichroism Microscopy Free from Commingling Linear Dichroism via Discretely Modulated Circular Polarization
Supplementary information Circular Dichroism Microscopy Free from Commingling Linear Dichroism via Discretely Modulated Circular Polarization Tetsuya Narushima AB and Hiromi Okamoto A* A Institute for
More informationApplications of Optics
Nicholas J. Giordano www.cengage.com/physics/giordano Chapter 26 Applications of Optics Marilyn Akins, PhD Broome Community College Applications of Optics Many devices are based on the principles of optics
More informationHeisenberg) relation applied to space and transverse wavevector
2. Optical Microscopy 2.1 Principles A microscope is in principle nothing else than a simple lens system for magnifying small objects. The first lens, called the objective, has a short focal length (a
More informationINDIAN INSTITUTE OF TECHNOLOGY BOMBAY
IIT Bombay requests quotations for a high frequency conducting-atomic Force Microscope (c-afm) instrument to be set up as a Central Facility for a wide range of experimental requirements. The instrument
More informationExam 4. Name: Class: Date: Multiple Choice Identify the choice that best completes the statement or answers the question.
Name: Class: Date: Exam 4 Multiple Choice Identify the choice that best completes the statement or answers the question. 1. Mirages are a result of which physical phenomena a. interference c. reflection
More information3D light microscopy techniques
3D light microscopy techniques The image of a point is a 3D feature In-focus image Out-of-focus image The image of a point is not a point Point Spread Function (PSF) 1D imaging 2D imaging 3D imaging Resolution
More informationScanning Electron Microscopy
Scanning Electron Microscopy For the semiconductor industry A tutorial Titel Vorname Nachname Titel Jobtitle, Bereich/Abteilung Overview Scanning Electron microscopy Scanning Electron Microscopy (SEM)
More informationFLUORESCENCE MICROSCOPY. Matyas Molnar and Dirk Pacholsky
FLUORESCENCE MICROSCOPY Matyas Molnar and Dirk Pacholsky 1 The human eye perceives app. 400-700 nm; best at around 500 nm (green) Has a general resolution down to150-300 μm (human hair: 40-250 μm) We need
More informationSpectroscopy in the UV and Visible: Instrumentation. Spectroscopy in the UV and Visible: Instrumentation
Spectroscopy in the UV and Visible: Instrumentation Typical UV-VIS instrument 1 Source - Disperser Sample (Blank) Detector Readout Monitor the relative response of the sample signal to the blank Transmittance
More informationSpectral phase shaping for high resolution CARS spectroscopy around 3000 cm 1
Spectral phase shaping for high resolution CARS spectroscopy around 3 cm A.C.W. van Rhijn, S. Postma, J.P. Korterik, J.L. Herek, and H.L. Offerhaus Mesa + Research Institute for Nanotechnology, University
More informationDevelopment of a High-speed Super-resolution Confocal Scanner
Development of a High-speed Super-resolution Confocal Scanner Takuya Azuma *1 Takayuki Kei *1 Super-resolution microscopy techniques that overcome the spatial resolution limit of conventional light microscopy
More informationAnalytical analysis of modulated signal in apertureless scanning near-field optical microscopy C. H. Chuang and Y. L. Lo *
Research Express@NCKU Volume 5 Issue 10 - October 3, 2008 [ http://research.ncku.edu.tw/re/articles/e/20081003/2.html ] Analytical analysis of modulated signal in apertureless scanning near-field optical
More informationBio 407. Applied microscopy. Introduction into light microscopy. José María Mateos. Center for Microscopy and Image Analysis
Center for Microscopy and Image Analysis Bio 407 Applied Introduction into light José María Mateos Fundamentals of light Compound microscope Microscope composed of an objective and an additional lens (eyepiece,
More informationYou won t be able to measure the incident power precisely. The readout of the power would be lower than the real incident power.
1. a) Given the transfer function of a detector (below), label and describe these terms: i. dynamic range ii. linear dynamic range iii. sensitivity iv. responsivity b) Imagine you are using an optical
More informationLecture 4 to 5 MICROSCOPY-PRINCIPLES AND TYPES
Lecture 4 to 5 MICROSCOPY-PRINCIPLES AND TYPES Microorganisms are too small to be seen by our unaided eyes and the microscopes are of crucial importance as they help to view the microbes. A microscope
More informationShreyash Tandon M.S. III Year
Shreyash Tandon M.S. III Year 20091015 Confocal microscopy is a powerful tool for generating high-resolution images and 3-D reconstructions of a specimen by using point illumination and a spatial pinhole
More informationExamination, TEN1, in courses SK2500/SK2501, Physics of Biomedical Microscopy,
KTH Applied Physics Examination, TEN1, in courses SK2500/SK2501, Physics of Biomedical Microscopy, 2009-06-05, 8-13, FB51 Allowed aids: Compendium Imaging Physics (handed out) Compendium Light Microscopy
More informationComparison of resolution specifications for micro- and nanometer measurement techniques
P4.5 Comparison of resolution specifications for micro- and nanometer measurement techniques Weckenmann/Albert, Tan/Özgür, Shaw/Laura, Zschiegner/Nils Chair Quality Management and Manufacturing Metrology
More informationStudy of shear force as a distance regulation mechanism for scanning near-field optical microscopy
Study of shear force as a distance regulation mechanism for scanning near-field optical microscopy C. Durkan a) and I. V. Shvets Department of Physics, Trinity College Dublin, Ireland Received 31 May 1995;
More informationBoulevard du Temple Daguerrotype (Paris,1838) a busy street? Nyquist sampling for movement
Boulevard du Temple Daguerrotype (Paris,1838) a busy street? Nyquist sampling for movement CONFOCAL MICROSCOPY BioVis Uppsala, 2017 Jeremy Adler Matyas Molnar Dirk Pacholsky Widefield & Confocal Microscopy
More informationInvitation for a walk through microscopy. Sebastian Schuchmann Jörg Rösner
Invitation for a walk through microscopy Sebastian Schuchmann Jörg Rösner joerg.roesner@charite.de Techniques in microscopy Conventional (light) microscopy bright & dark field, phase & interference contrast
More informationVISUAL PHYSICS ONLINE DEPTH STUDY: ELECTRON MICROSCOPES
VISUAL PHYSICS ONLINE DEPTH STUDY: ELECTRON MICROSCOPES Shortly after the experimental confirmation of the wave properties of the electron, it was suggested that the electron could be used to examine objects
More informationOperation Guide for the Leica SP2 Confocal Microscope Bio-Imaging Facility Hunter College October 2009
Operation Guide for the Leica SP2 Confocal Microscope Bio-Imaging Facility Hunter College October 2009 Introduction of Fluoresence Confocal Microscopy The first confocal microscope was invented by Princeton
More informationCutting-edge Atomic Force Microscopy techniques for large and multiple samples
Cutting-edge Atomic Force Microscopy techniques for large and multiple samples Study of up to 200 mm samples using the widest set of AFM modes Industrial standards of automation A unique combination of
More informationCCAM s Selection of. Zeiss Microscope Objectives
CCAM s Selection of Zeiss Microscope Objectives 1. Magnification Image scale 2. Resolution The minimum separation distance between two points that are clearly resolved. The resolution of an objective is
More informationBasic methods in imaging of micro and nano structures with atomic force microscopy (AFM)
Basic methods in imaging of micro and nano P2538000 AFM Theory The basic principle of AFM is very simple. The AFM detects the force interaction between a sample and a very tiny tip (
More informationDynamic Phase-Shifting Microscopy Tracks Living Cells
from photonics.com: 04/01/2012 http://www.photonics.com/article.aspx?aid=50654 Dynamic Phase-Shifting Microscopy Tracks Living Cells Dr. Katherine Creath, Goldie Goldstein and Mike Zecchino, 4D Technology
More information7 CHAPTER 7: REFRACTIVE INDEX MEASUREMENTS WITH COMMON PATH PHASE SENSITIVE FDOCT SETUP
7 CHAPTER 7: REFRACTIVE INDEX MEASUREMENTS WITH COMMON PATH PHASE SENSITIVE FDOCT SETUP Abstract: In this chapter we describe the use of a common path phase sensitive FDOCT set up. The phase measurements
More informationLateral Force: F L = k L * x
Scanning Force Microscopy (SFM): Conventional SFM Application: Topography measurements Force: F N = k N * k N Ppring constant: Spring deflection: Pieo Scanner Interaction or force dampening field Contact
More informationSUPPLEMENTAL MATERIAL
SUPPLEMENTAL MATERIAL 1 - Folios and areas of analysis Figure S1.1. Folio 4, areas of analysis for microxrf ( ), FORS ( ), micro-samples for Raman and FTIR ( ) and Raman in-situ ( ). Figure S1.2. Folio
More informationLow Voltage Electron Microscope
LVEM5 Low Voltage Electron Microscope Nanoscale from your benchtop LVEM5 Delong America DELONG INSTRUMENTS COMPACT BUT POWERFUL The LVEM5 is designed to excel across a broad range of applications in material
More informationStandard Operating Procedure of Atomic Force Microscope (Anasys afm+)
Standard Operating Procedure of Atomic Force Microscope (Anasys afm+) The Anasys Instruments afm+ system incorporates an Atomic Force Microscope which can scan the sample in the contact mode and generate
More informationLasers should be fiber coupled using - Single mode fiber with angled FC connector Solid state 532 nm,/514 nm, 633, 785nm, 20 mw
Monochromator Aberration-corrected, Raman imaging with error-correction based on closed feedback loop of scanner. 3D imaging and depth profile based on confocal configuration with Raman Depth resolution
More informationGet the full picture of your sample. Applications
Follow the Experts Get the full picture of your sample The new generation of confocal Raman microscopes offers a non-destructive and non-contact method of sample analysis at the sub-micron level. More
More informationS200 Course LECTURE 1 TEM
S200 Course LECTURE 1 TEM Development of Electron Microscopy 1897 Discovery of the electron (J.J. Thompson) 1924 Particle and wave theory (L. de Broglie) 1926 Electromagnetic Lens (H. Busch) 1932 Construction
More informationpicoemerald Tunable Two-Color ps Light Source Microscopy & Spectroscopy CARS SRS
picoemerald Tunable Two-Color ps Light Source Microscopy & Spectroscopy CARS SRS 1 picoemerald Two Colors in One Box Microscopy and Spectroscopy with a Tunable Two-Color Source CARS and SRS microscopy
More informationHoriba Jobin-Yvon LabRam Raman Confocal Microscope (GERB 120)
Horiba Jobin-Yvon LabRam Raman Confocal Microscope (GERB 120) Please contact Dr. Amanda Henkes for training requests and assistance: 979-862-5959, amandahenkes@tamu.edu Hardware LN 2 FTIR FTIR camera 1
More informationNanoscale Material Characterization with Differential Interferometric Atomic Force Microscopy
Nanoscale Material Characterization with Differential Interferometric Atomic Force Microscopy F. Sarioglu, M. Liu, K. Vijayraghavan, A. Gellineau, O. Solgaard E. L. Ginzton Laboratory University Tip-sample
More informationObserving Microorganisms through a Microscope
2016/2/19 PowerPoint Lecture Presentations prepared by Bradley W. Christian, McLennan Community College CHAPTER 3 Observing Microorganisms through a Microscope 1 Figure 3.2 Microscopes and Magnification.
More informationLight Microscopy. Upon completion of this lecture, the student should be able to:
Light Light microscopy is based on the interaction of light and tissue components and can be used to study tissue features. Upon completion of this lecture, the student should be able to: 1- Explain the
More informationPH880 Topics in Physics
PH880 Topics in Physics Modern Optical Imaging (Fall 2010) Overview of week 12 Monday: FRET Wednesday: NSOM Förster resonance energy transfer (FRET) Fluorescence emission i FRET Donor Acceptor wikipedia
More informationAgilent Cary 610/620 FTIR microscopes and imaging systems RESOLUTION FOR EVERY APPLICATION
Agilent Cary 610/620 FTIR microscopes and imaging systems RESOLUTION FOR EVERY APPLICATION AGILENT CARY 610/620 FTIR MICROSCOPES ADVANCING FTIR MICROSCOPY AND IMAGING Agilent s 610/620 FTIR microscopes
More informationNon-Descanned FLIM Detection in Multiphoton Microscopes
Non-Descanned FLIM Detection in Multiphoton Microscopes Abstract. Multiphoton microscopes use a femtosecond NIR laser to excite fluorescence in the sample. Excitation is performed via a multi-photon absorption
More informationA Novel Multipass Optical System Oleg Matveev University of Florida, Department of Chemistry, Gainesville, Fl
A Novel Multipass Optical System Oleg Matveev University of Florida, Department of Chemistry, Gainesville, Fl BACKGROUND Multipass optical systems (MOS) are broadly used in absorption, Raman, fluorescence,
More informationAqualog. CDOM Measurements Made Easy PARTICLE CHARACTERIZATION ELEMENTAL ANALYSIS FLUORESCENCE GRATINGS & OEM SPECTROMETERS OPTICAL COMPONENTS RAMAN
Aqualog CDOM Measurements Made Easy ELEMENTAL ANALYSIS FLUORESCENCE GRATINGS & OEM SPECTROMETERS OPTICAL COMPONENTS PARTICLE CHARACTERIZATION RAMAN SPECTROSCOPIC ELLIPSOMETRY SPR IMAGING CDOM measurements
More informationSpectroscopy of Ruby Fluorescence Physics Advanced Physics Lab - Summer 2018 Don Heiman, Northeastern University, 1/12/2018
1 Spectroscopy of Ruby Fluorescence Physics 3600 - Advanced Physics Lab - Summer 2018 Don Heiman, Northeastern University, 1/12/2018 I. INTRODUCTION The laser was invented in May 1960 by Theodor Maiman.
More informationSPM The Industry s Performance Leader High Resolution Closed-loop System Fast, Easy Tip & Sample Exchange Versatility and Value Powerful Research
SPM The Industry s Performance Leader High Resolution Closed-loop System Fast, Easy Tip & Sample Exchange Versatility and Value Powerful Research Flexibility Atomic resolution STM image of highly-oriented
More informationSupplementary Materials for
advances.sciencemag.org/cgi/content/full/4/2/e1700324/dc1 Supplementary Materials for Photocarrier generation from interlayer charge-transfer transitions in WS2-graphene heterostructures Long Yuan, Ting-Fung
More informationThe DCS-120 Confocal Scanning FLIM System
he DCS-120 Confocal Scanning FLIM System he bh DCS-120 confocal scanning FLIM system converts a conventional microscope into a high-performance fluorescence lifetime imaging system. he system is based
More informationATOMIC FORCE MICROSCOPY
B47 Physikalisches Praktikum für Fortgeschrittene Supervision: Prof. Dr. Sabine Maier sabine.maier@physik.uni-erlangen.de ATOMIC FORCE MICROSCOPY Version: E1.4 first edit: 15/09/2015 last edit: 05/10/2018
More informationDual-FL. World's Fastest Fluorometer. Measure absorbance spectra and fluorescence simultaneously FLUORESCENCE
Dual-FL World's Fastest Fluorometer Measure absorbance spectra and fluorescence simultaneously FLUORESCENCE 100 Times Faster Data Collection The only simultaneous absorbance and fluorescence system available
More informationRENISHAW INVIA RAMAN SPECTROMETER
STANDARD OPERATING PROCEDURE: RENISHAW INVIA RAMAN SPECTROMETER Purpose of this Instrument: The Renishaw invia Raman Spectrometer is an instrument used to analyze the Raman scattered light from samples
More informationCCAM Microscope Objectives
CCAM Microscope Objectives Things to consider when selecting an objective Magnification Numerical Aperture (NA) resolving power and light intensity of the objective Working Distance distance between the
More informationNature Protocols: doi: /nprot Supplementary Figure 1. Schematic diagram of Kőhler illumination.
Supplementary Figure 1 Schematic diagram of Kőhler illumination. The green beam path represents the excitation path and the red represents the emission path. Supplementary Figure 2 Microscope base components
More informationNear-field Optical Microscopy
Near-field Optical Microscopy R. Fernandez, X. Wang, N. Li, K. Parker, and A. La Rosa Physics Department Portland State University Portland, Oregon Near-Field SPIE Optics Microscopy East 2005 Group PSU
More information