ELCN100 Electronic Lab. Instruments and Measurements Spring Lecture 01: Introduction

Transcription

1 ELCN100 Electronic Lab. Instruments and Measurements Spring 2018 Lecture 01: Introduction Dr. Hassan Mostafa حسن مصطفى د. LAB 1 Cairo University

2 Course Outline Course objectives To introduce to students the theory and applications of measurement and instrumentation systems for electrical, electronics and computer engineering. LAB 2 Cairo University

3 Course contents 1. Oscilloscopes 2. Measurements Errors 3. Digital Multi-meter 4. Frequency Meter 5. Logic Analyzer 6. Spectrum Analyzer LAB 3 Cairo University

4 Course Outline Instructor: Dr. Hassan Mostafa Course website: Textbook: Lecture Notes and slides References [1] Larry D. Jones / A. Foster Chin, Electronic Instruments and Measurements, Second Edition, Prentice Hall. [2] David A. Bell, "Electronic Instrumentation and Measurements", Prentice-Hall. LAB 4 Cairo University

5 Course Outline Grading: 10% Quizzes (pop-up and arranged) 15% Course Project 15% Lab. 20% Midterm Examination - (MCQ, T/F, Short answers, and Problems) 40% Final Examination - (MCQ, T/F, Short answers, and Problems) LAB 5 Cairo University

6 Semiconductor devices Semiconductor devices are electronic devices that are fabricated using semiconductor materials such as Silicon, Germanium, and Gallium Arsenide. Semiconductor devices are available as discrete components (available on shelf in electronics stores) or can be integrated with a large number of similar devices onto a single chip, called an Integrated Circuit(IC). LAB 6 Cairo University

7 Complementary Metal Oxide Semiconductor (CMOS) CMOS is a technology for constructing IC s. This technology is used in microprocessors, microcontrollers, Memories, and other digital logic circuits. Microprocessor Microcontroller RAM LAB 7 Cairo University

8 Information age The ability to fabricate billions of individual components (transistors, resistors, capacitors, etc.) on a silicon chip with an area of a few cm 2 has enabled the information age. Shrinking geometries permit more devices to be placed in a given are of silicon. It is widely expected that these historical trends will continue for at least another 5-10 years, resulting in Chips that contain tens of billions of components. LAB 8 Cairo University

9 First Transistor from Bell Labs (1947) LAB 9 Cairo University

10 Kilby first IC (1958) LAB 10 Cairo University

11 First monolithic integrated circuit 1961 Picture shows a flipflop circuit containing 6 devices, produced in planar technology. Source: R. N. Neyce, Semiconductor device-and-lead structure, U.S.Patent 2,981,877 LAB 11 Cairo University

12 first microprocessor 1971 Picture shows a four-bit microprocessor Intel μm technology 3 mm 4 mm 2300 MOS-FETs 108 khz clock frequency Source: Intel Corporation LAB 12 Cairo University

13 Pentium IV processor 2001 Picture shows a ULSI chip with 32-bit processor Intel Pentium μm CMOS technology 17.5 mm 19 mm components 1.6 GHz clock freuqncy Source: Intel Corporation LAB 13 Cairo University

14 LAB 14 Cairo University

15 LAB 15 Cairo University

16 Moore s Law In 1965, Gordon Moore predicted that the number of transistors that can be integrated on a die would double every 18 to 14 months (i.e., grow exponentially with time). Amazingly visionary million transistor/chip barrier was crossed in the 1980 s transistors, 1 MHz clock (Intel 4004) Million transistors (Ultra Sparc III) 42 Million, 2 GHz clock (Intel P4) Xilinx currently holds the "world-record" for an FPGA chip containing 20 billion transistors LAB 16 Cairo University

17 Moore s Law in Microprocessors Transistors on microprocessors double every 2 years 1,000,000 K 1 Billion Transistors 100,000 10,000 1, i386i Pentium III Pentium II Pentium Pro Pentium Source: Intel Projected Courtesy, Intel LAB 17 Cairo University

18 Moore s law scaling LAB 18 Cairo University

19 Moore and CMOS Scaling CMOS scaling will not stay forever, but, forever can be delayed Moore, 2003 LAB 19 Cairo University

20 Clean Rooms Clean room facility: Particle free walls, furniture, and accessories must be used Airflow through 0.3 microns filters LAB 20 Cairo University

21 Clean Rooms Clean room facility: Main function of clean rooms is control of particle contamination Requires control of air flow, water and chemical filtrations, human protocol Class N clean room means fewer than N particles (>0.5 µm) in 1 cubic foot of air Classes types: Class 10,000 Class 1,000 Class 100 Class 10 LAB 21 Cairo University

22 Clean Rooms Clean room facility: Class 10,000 Class 1,000 Class 100 Class 10 LAB 22 Cairo University

23 Why electronics measurements/instrumentation? Testing the chip after coming back from tape-out requires good knowledge of testing and measurements equipments such as: Oscilloscope Digital Multi-meter Frequency meter Logic Analyzer Spectrum Analyzer Frequency synthesizer FPGA based testing.. Not only you need to know how to use these equipments but you should understand briefly what is inside them.? LAB 23 Cairo University

24 Other measurements/instrumentation types: Environmental measurements: Pressure measurements Temperature measurements Humidity measurements These measurements systems are used currently in smart phones MEMS-VISION (Canadian-Egyptian company) that designed the pressure measurement circuitry for SAMSUNG to implement it in smart phones starting from S3. LAB 24 Cairo University

25 Other measurements/instrumentation types: Health measurements: Blood pressure measurements Blood sugar measurements Heart beats measurements.. These measurements are essential to provide the required health care on-time to save lives. LAB 25 Cairo University

26 LAB 26 Cairo University

27 Measurement/instrumentation system Perform signal processing such as converting analog signal to digital Convert the measured quantity into voltage Display the measured value (typically: in digital format) LAB 27 Cairo University

28 Instrumentation Programs and Companies Examples LAB 28 Cairo University

29 Virtual Instrumentation With NI LabVIEW LAB 29 Cairo University

30 NI LABVIEW LABVIEW builds virtual instruement that can be used to either: Simulate a specific design and test its performance at the simulation level Or interface with actual hardware and perform real testing and measurements NI Egypt/Lebanon are targeting job applicants with good knowledge in NI LABVIEW NI ELVIS NI RIO NI MYDAQ LAB 30 Cairo University

31 VALEO AUTOMOTIVE TESTING VALEO EGYPT: Perform testing on all the automotive products This testing includes FPGA based testing, oscilloscopes, logic analyzers. Even with simple automotive products such as wipers, exhaustive measurements MUST be conducted LAB 31 Cairo University

32 Intel Microprocessor testing Connect all the processor pins to a test benchmark Generate enough testing vectors to test most of the microprocessor functions Normally, FPGA is used in this task LAB 32 Cairo University

33 TESTING/MEASUREMENTS In general, the testbench for any new electronic product (which might include transducers or health sensors), should be designed by the testing engineer To design the testbench, you need to know the basics of measurements equipments as well as instrumentation programs such as LABVIEW Also, you should understand the measurements errors that might result in completely wrong measurements Within this course, we will cover most of these requirements Keep tuned LAB 33 Cairo University