Length section: New calibration and research services

Size: px
Start display at page:

Download "Length section: New calibration and research services"

Transcription

1 Length section: New calibration and research services O Kruger October 2015 T026

2 Overview Traditional traceability chart Traceability chart with length R&D projects Overview of Various R&D projects Conclusion

3 Traceability chain SI unit of length R&D Dissemination of Knowledge & Technology Maintenance & Calibration of Standards SANAS Accredited Laboratories NMISA Industry

4 Traceability chain with R&D projects

5 Research on the SI unit SI Unit for length: The metre is the length of the path travelled by light in vacuum during a time interval of of a second. Currently NMISA reproduce the unit by a Iodine stabilised HeNe laser. Laser interferometers are calibrated against the standard by generating a beat frequency and measure the offset to the standard laser.

6 Research at the SI unit, frequency comb A frequency comb allows a direct link from radio frequency standards to optical frequencies. Current frequency standards such as atomic clocks operate in the microwave region of the spectrum, and the frequency comb brings the accuracy of such clocks into the optical part of the electromagnetic spectrum

7 Refractometer for the refractive index measurements V.O.L. compensation The metre is defined as the speed of light in a vacuum but we measure in air. Therefore we need to make a correction due to the difference in refractive index. (n 1) tp = p(n 1) s p(0,5953 0,009876t) ,60 (1+0, t ) This is at standard conditions (t = 20 C, p = 100 kpa, 0,04% CO 2 content) Reading Number Refractive index from refractometer Refractive index from calculation (Edlin) Refractive index from cal. (Ciddor) Refractive index from cal. (Zygo) Refractive index from cal. (Agilent Ver 2.003) f2 Optical parallel Zygo laser f1 + f2 Vacuum tube f1 f1 Quater wave plate f2

8 Double ended interferometer system (gauge block calibration) Gauge blocks are the most used dimensional standard in industry and second most important on the traceability chain, after laser interferometers Ongoing research is phase correction and a newly design DEI Folding mirror Gauge block a Came ra Cube beam splitter Folding mirror with PZT cotroll L b Laser Turning mirror

9 Gravity national standard Gravity is used by many; Geodesy, Geophysics and Metrology Metrology, Forces and Pressure measurements and calibration

10 Improvement Surface texture calibration capability NMISA completed the upgrade of it s surface texture calibration facility. The new instrument has a resolution of only 0,2 nm over a 10 mm range and 120 mm travel. Currently adding 3D measuring capability From EURAMET L.K8 2013, inter laboratory comparison NMISA

11 Improvement in roundness measuring machine accuracies NMISA in the process of purchasing a 10nm accurate roundness measuring machine.

12 Error separation in roundness measuring

13 Angle calibration of theodolites Error separation using 5 reading heads achieve very high accuracy, repeatability of better than 0,05, and is self calibrated.

14 Coordinate metrology at NMISA. Laser tacker, 160 m range Industrial CMM, 2 m range with 3 µm accuracy High accurate CMM, 0,35 µm accurate µcmm, having a 35 µm diameter probe

15 Length in nano metrology Installation of Atomic force microscopy (AFM) having a range of 100µm x 100µm with 10µm height. Having a resolution of 0,1 nm but flatness of stage will influence the overall accuracy.

16 Length in nano metrology Index table Beam splitter Calibration of diffraction gratings use as standard for both the AFM and the SEM Calibration of gratings on diffractometer and measured with AFM Laser Grating Detector fm

17 Traditional micrometers versus new micrometers Micrometers are some of the oldest measuring instruments but are still used in industry for measuring artefacts. Till recently, micrometers have a specification to 3 µm for the linear accuracy. (BS 870 and ISO 3611) New micrometers have linear accuracy of 0,5 µm and flatness of 0,3 µm.

18 Measuring equipment for industry and NMIs As part of the new strategy in NMISA, the length section is developing measuring systems for the local and Africa metrology community. The line scale system was developed based on software which was required in-house for NMISA own line scale measuring systems. Twelve of these systems were delivered to African NMIs

19 Cell phone apps. If you can image it, there is probably an App for it already Total Number of Apps 62 Number of Unique Parameters Found 11 Number of Measurement Parameters by Apps 80 Number of Sensor Types 7

20 Dimensional Measurement Apps

21 Experimental Results so far Actual Cell A Cell B Cell C Cell D Length 1600 ± 0,5 1562, , ,75 Width 1000 ± 0,5 1006, , ,59 Depth 180 ± 0,5 207,91 225, ,67

22 Three Dimensional printing, additive manufacturing. Design part to be printed in titanium. Check for dimensional accuracy(length, flatness, etc.), surface texture, thermal expansion and long term dimensional stability.

23 Three Dimensional printing, additive manufacturing. Modification of 3D printers by adding laser interferometers.

24 Conclusion The length strategy is to service the South African and African industries through various R&D projects. The projects are selected to have an output which: i) to improve the National Measurement Standards ii) improve measurements at industry level iii) develop Human resources at NMISA and industry Invite industry to contact NMISA with measurements difficulties

A transportable optical frequency comb based on a mode-locked fibre laser

A transportable optical frequency comb based on a mode-locked fibre laser A transportable optical frequency comb based on a mode-locked fibre laser B. R. Walton, H. S. Margolis, V. Tsatourian and P. Gill National Physical Laboratory Joint meeting for Time and Frequency Club

More information

SMD ENS Metrology - National Standards. Short overview. Hugo Pirée. World Metrology Day 2018 Brussels.

SMD ENS Metrology - National Standards. Short overview. Hugo Pirée. World Metrology Day 2018 Brussels. SMD ENS Metrology - National Standards Short overview Hugo Pirée World Metrology Day 2018 Brussels Federal government FPS ECONOMY Gen. Direction QUALITY & SAFETY Division METROLOGY 14 persons National

More information

Ball and Hole plate development for evaluation of µcmm

Ball and Hole plate development for evaluation of µcmm MacroScale 2011 4 th to 6 th October 2011 Recent developments in traceable dimensional measurements Ball and Hole plate development for evaluation of µcmm NMISA O Kruger, F v d Walt and P Greeff PO BOX

More information

Uncertainty in measurements of micro-patterned thin film thickness using Nanometrological AFM - Reliability of parameters for base straight line -

Uncertainty in measurements of micro-patterned thin film thickness using Nanometrological AFM - Reliability of parameters for base straight line - Uncertainty in measurements of micro-patterned thin film thickness using Nanometrological AFM - Reliability of parameters for base straight line - Ichiko Misumi,, Satoshi Gonda, Tomizo Kurosawa, Yasushi

More information

CRITERIA FOR LABORATORY ACCREDITATION IN THE FIELD OF TIME AND FREQUENCY METROLOGY

CRITERIA FOR LABORATORY ACCREDITATION IN THE FIELD OF TIME AND FREQUENCY METROLOGY CRITERIA FOR LABORATORY ACCREDITATION IN THE FIELD OF TIME AND FREQUENCY METROLOGY Approved By: Chief Executive Officer: Ron Josias Senior Manager: Mpho Phaloane Revised By: Specialist Technical Committee

More information

TIME AND FREQUENCY ACTIVITIES AT THE CSIR NATIONAL METROLOGY LABORATORY

TIME AND FREQUENCY ACTIVITIES AT THE CSIR NATIONAL METROLOGY LABORATORY TIME AND FREQUENCY ACTIVITIES AT THE CSIR NATIONAL METROLOGY LABORATORY E. L. Marais and B. Theron CSIR National Metrology Laboratory PO Box 395, Pretoria, 0001, South Africa Tel: +27 12 841 3013; Fax:

More information

Absolute distance interferometer in LaserTracer geometry

Absolute distance interferometer in LaserTracer geometry Absolute distance interferometer in LaserTracer geometry Corresponding author: Karl Meiners-Hagen Abstract 1. Introduction 1 In this paper, a combination of variable synthetic and two-wavelength interferometry

More information

Laser Trackers and Laser Scanners for Large Scale Coordinate Metrology NACMA 2012

Laser Trackers and Laser Scanners for Large Scale Coordinate Metrology NACMA 2012 Laser Trackers and Laser Scanners for Large Scale Coordinate Metrology NACMA 2012 Steve Phillips & colleagues: D. Sawyer, B. Muralikrishnan C. Blackburn, C. Shakarji National Institute of Standards and

More information

Fabry Perot Resonator (CA-1140)

Fabry Perot Resonator (CA-1140) Fabry Perot Resonator (CA-1140) The open frame Fabry Perot kit CA-1140 was designed for demonstration and investigation of characteristics like resonance, free spectral range and finesse of a resonator.

More information

5 m-measurement system for traceable measurements of tapes and rules

5 m-measurement system for traceable measurements of tapes and rules 5 m-measurement system for traceable measurements of tapes and rules Tanfer Yandayan*, Bulent Ozgur Tubitak Ulusal Metroloji Enstitusu (UME) PK54, 4147 Gebze-KOCAELI / TURKEY ABSTRACT Line standards such

More information

A refractivity-compensated absolute distance interferometer as prospective novel primary standard for baseline calibrations

A refractivity-compensated absolute distance interferometer as prospective novel primary standard for baseline calibrations A refractivity-compensated absolute distance interferometer as prospective novel primary standard for baseline calibrations (1), Alen Bošnjakovic (2) and Florian Pollinger (1) (1) Physikalisch-Technische

More information

Optics for next generation light sources

Optics for next generation light sources Optics for next generation light sources Anton Barty Centre for Free Electron Laser Science Hamburg, Germany Key issues Optical specifications Metrology (mirror surfaces) Metrology (wavefront, focal spot)

More information

Manufacturing Metrology Team

Manufacturing Metrology Team The Team has a range of state-of-the-art equipment for the measurement of surface texture and form. We are happy to discuss potential measurement issues and collaborative research Manufacturing Metrology

More information

Nanometers and Picometers: Keys to Success with 5 Terabit/in 2 Patterned Media

Nanometers and Picometers: Keys to Success with 5 Terabit/in 2 Patterned Media Nanometers and Picometers: Keys to Success with 5 Terabit/in 2 Patterned Media Donald A. Chernoff Advanced Surface Microscopy Inc. Indianapolis, IN USA www.asmicro.com 2/10/2009 IDEMA Technical Symposium

More information

Profile Measurement of Resist Surface Using Multi-Array-Probe System

Profile Measurement of Resist Surface Using Multi-Array-Probe System Sensors & Transducers 2014 by IFSA Publishing, S. L. http://www.sensorsportal.com Profile Measurement of Resist Surface Using Multi-Array-Probe System Shujie LIU, Yuanliang ZHANG and Zuolan YUAN School

More information

Certificate of Accreditation

Certificate of Accreditation PERRY JOHNSON LABORATORY ACCREDITATION, INC. Certificate of Accreditation Perry Johnson Laboratory Accreditation, Inc. has assessed the Laboratory of: Acceso III No. 16 A Nave 10, Parque Industrial Benito

More information

Measurement of Surface Profile and Layer Cross-section with Wide Field of View and High Precision

Measurement of Surface Profile and Layer Cross-section with Wide Field of View and High Precision Hitachi Review Vol. 65 (2016), No. 7 243 Featured Articles Measurement of Surface Profile and Layer Cross-section with Wide Field of View and High Precision VS1000 Series Coherence Scanning Interferometer

More information

SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005, ANSI/NCSL Z , & ANSI/NCSL Z

SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005, ANSI/NCSL Z , & ANSI/NCSL Z SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005, ANSI/NCSL Z540-1-1994, & ANSI/NCSL Z540.3-2006 AGILENT TECHNOLOGIES SANTA ROSA METROLOGY SERVICES 1400 Fountain Grove Parkway Santa Rosa, CA 95403 Bob Ramirez

More information

Report of the TC Time and Frequency. Ramiz Hamid TC-TF Chair, TÜBİTAK UME, Turkey

Report of the TC Time and Frequency. Ramiz Hamid TC-TF Chair, TÜBİTAK UME, Turkey Report of the TC Time and Frequency Ramiz Hamid TC-TF Chair, TÜBİTAK UME, Turkey Contents TC-TF meeting and T&F strategy EMRP Projects and future optical redefinition of the second Time scale generation

More information

LUMINAR workshop May 2016 Scene setting

LUMINAR workshop May 2016 Scene setting LUMINAR workshop 18-19 May 2016 Scene setting Welcome to the National Physical Laboratory Introduction to LUMINAR what, why, when, who, how LUMINAR project Official title: Large Volume Metrology in Industry

More information

MEASUREMENT OF POSITIONING ACCURACY IN 1 AXIS

MEASUREMENT OF POSITIONING ACCURACY IN 1 AXIS LS 100 MEASUREMENT OF POSITIONING ACCURACY IN 1 AXIS This is the basic configuration. It is designed for positional calibrations of machine tools, coordinate measuring machines, universal length meters

More information

CO2 laser heating system for thermal compensation of test masses in high power optical cavities. Submitted by: SHUBHAM KUMAR to Prof.

CO2 laser heating system for thermal compensation of test masses in high power optical cavities. Submitted by: SHUBHAM KUMAR to Prof. CO2 laser heating system for thermal compensation of test masses in high power optical cavities. Submitted by: SHUBHAM KUMAR to Prof. DAVID BLAIR Abstract This report gives a description of the setting

More information

PREPARED BY: I. Miller DATE: 2004 May 23 CO-OWNERS REVISED DATE OF ISSUE/CHANGED PAGES

PREPARED BY: I. Miller DATE: 2004 May 23 CO-OWNERS REVISED DATE OF ISSUE/CHANGED PAGES Page 1 of 30 LIGHTMACHINERY TEST REPORT LQT 30.11-1 TITLE: HMI Michelson Interferometer Test Report Serial Number 1 - Wideband FSR INSTRUCTION OWNER HMI Project Manager PREPARED BY: I. Miller DATE: 2004

More information

attosnom I: Topography and Force Images NANOSCOPY APPLICATION NOTE M06 RELATED PRODUCTS G

attosnom I: Topography and Force Images NANOSCOPY APPLICATION NOTE M06 RELATED PRODUCTS G APPLICATION NOTE M06 attosnom I: Topography and Force Images Scanning near-field optical microscopy is the outstanding technique to simultaneously measure the topography and the optical contrast of a sample.

More information

Outline: Introduction: What is SPM, history STM AFM Image treatment Advanced SPM techniques Applications in semiconductor research and industry

Outline: Introduction: What is SPM, history STM AFM Image treatment Advanced SPM techniques Applications in semiconductor research and industry 1 Outline: Introduction: What is SPM, history STM AFM Image treatment Advanced SPM techniques Applications in semiconductor research and industry 2 Back to our solutions: The main problem: How to get nm

More information

PREPARED BY: I. Miller DATE: 2004 May 23 CO-OWNERS REVISED DATE OF ISSUE/CHANGED PAGES

PREPARED BY: I. Miller DATE: 2004 May 23 CO-OWNERS REVISED DATE OF ISSUE/CHANGED PAGES Page 1 of 30 LIGHTMACHINERY TEST REPORT LQT 30.11-2 TITLE: HMI Michelson Interferometer Test Report Serial Number 2 - Narrowband FSR INSTRUCTION OWNER HMI Project Manager PREPARED BY: I. Miller DATE: 2004

More information

A Multiwavelength Interferometer for Geodetic Lengths

A Multiwavelength Interferometer for Geodetic Lengths A Multiwavelength Interferometer for Geodetic Lengths K. Meiners-Hagen, P. Köchert, A. Abou-Zeid, Physikalisch-Technische Bundesanstalt, Braunschweig Abstract: Within the EURAMET joint research project

More information

Comparison of resolution specifications for micro- and nanometer measurement techniques

Comparison of resolution specifications for micro- and nanometer measurement techniques P4.5 Comparison of resolution specifications for micro- and nanometer measurement techniques Weckenmann/Albert, Tan/Özgür, Shaw/Laura, Zschiegner/Nils Chair Quality Management and Manufacturing Metrology

More information

RF and Microwave Power Standards: Extending beyond 110 GHz

RF and Microwave Power Standards: Extending beyond 110 GHz RF and Microwave Power Standards: Extending beyond 110 GHz John Howes National Physical Laboratory April 2008 We now wish to extend above 110 GHz Why now? Previous indecisions about transmission lines,

More information

SEM Magnification Calibration & Verification: Building Confidence in Your Scale Bar

SEM Magnification Calibration & Verification: Building Confidence in Your Scale Bar SEM Magnification Calibration & Verification: Building Confidence in Your Scale Bar Mark A. Koten, Ph.D. Senior Research Scientist Electron Optics Group McCrone Associates Why check your SEM image calibration?

More information

Agilent 5527A/B-2 Achieving Maximum Accuracy and Repeatability

Agilent 5527A/B-2 Achieving Maximum Accuracy and Repeatability Agilent 5527A/B-2 Achieving Maximum Accuracy and Repeatability Product Note With the Agilent 5527A/B Laser Position Transducer System 2 Purpose of this Product Note The ability to model the performance

More information

SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005, ANSI/NCSL Z , & ANSI/NCSL Z

SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005, ANSI/NCSL Z , & ANSI/NCSL Z SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005, ANSI/NCSL Z540-1-1994, & ANSI/NCSL Z540.3-2006 KEYSIGHT TECHNOLOGIES SANTA ROSA METROLOGY SERVICES 1400 Fountain Grove Parkway Santa Rosa, CA 95403 Allen Markovich

More information

SENSOR+TEST Conference SENSOR 2009 Proceedings II

SENSOR+TEST Conference SENSOR 2009 Proceedings II B8.4 Optical 3D Measurement of Micro Structures Ettemeyer, Andreas; Marxer, Michael; Keferstein, Claus NTB Interstaatliche Hochschule für Technik Buchs Werdenbergstr. 4, 8471 Buchs, Switzerland Introduction

More information

queensgate a brand of Elektron Technology

queensgate a brand of Elektron Technology NanoSensors NX/NZ NanoSensor The NanoSensor is a non-contact position measuring system based on the principle of capacitance micrometry. Two sensor plates, a Target and a Probe, form a parallel plate capacitor.

More information

CERTIFICATE OF ACCREDITATION

CERTIFICATE OF ACCREDITATION CERTIFICATE OF ACCREDITATION ANSI National Accreditation Board 11617 Coldwater Road, Fort Wayne, IN 46845 USA This is to certify that Productivity Quality, Inc./Advanced Inspection Services, LLC 15150

More information

Initial Results from the C-Mod Prototype Polarimeter/Interferometer

Initial Results from the C-Mod Prototype Polarimeter/Interferometer Initial Results from the C-Mod Prototype Polarimeter/Interferometer K. R. Smith, J. Irby, R. Leccacorvi, E. Marmar, R. Murray, R. Vieira October 24-28, 2005 APS-DPP Conference 1 Abstract An FIR interferometer-polarimeter

More information

Certificate of Accreditation

Certificate of Accreditation PERRY JOHNSON LABORATORY ACCREDITATION, INC. Certificate of Accreditation Perry Johnson Laboratory Accreditation, Inc. has assessed the Laboratory of: Quad State Gauging and Measurement, Inc. (Hereinafter

More information

Hellenic Accreditation System. Annex F2/15 to the Certificate No SCOPE of ACCREDITATION

Hellenic Accreditation System. Annex F2/15 to the Certificate No SCOPE of ACCREDITATION Hellenic Accreditation System Annex F2/15 to the Certificate No. 345-3 SCOPE of ACCREDITATION of the Calibration laboratory of ALGOSYSTEMS S.A. Temperature/ Temperature block calibrators Temperature measurements

More information

Advanced Nanoscale Metrology with AFM

Advanced Nanoscale Metrology with AFM Advanced Nanoscale Metrology with AFM Sang-il Park Corp. SPM: the Key to the Nano World Initiated by the invention of STM in 1982. By G. Binnig, H. Rohrer, Ch. Gerber at IBM Zürich. Expanded by the invention

More information

- Near Field Scanning Optical Microscopy - Electrostatic Force Microscopy - Magnetic Force Microscopy

- Near Field Scanning Optical Microscopy - Electrostatic Force Microscopy - Magnetic Force Microscopy - Near Field Scanning Optical Microscopy - Electrostatic Force Microscopy - Magnetic Force Microscopy Yongho Seo Near-field Photonics Group Leader Wonho Jhe Director School of Physics and Center for Near-field

More information

Repair & Metrology Services

Repair & Metrology Services Repair & Metrology Services Presents SETTING UP A 100kV MEASUREMENT SYSTEM Author: Les Wesson Co-author: Stephan Mare Content 1. Introduction 2. Setting up a suitable area 3. Purchasing equipment 4. DC

More information

Fast Optical Form Measurements of Rough Cylindrical and Conical Surfaces in Diesel Fuel Injection Components

Fast Optical Form Measurements of Rough Cylindrical and Conical Surfaces in Diesel Fuel Injection Components Fast Optical Form Measurements of Rough Cylindrical and Conical Surfaces in Diesel Fuel Injection Components Thomas J. Dunn, Robert Michaels, Simon Lee, Mark Tronolone, and Andrew Kulawiec; Corning Tropel

More information

Displacement sensor by a common-path interferometer

Displacement sensor by a common-path interferometer Displacement sensor by a common-path interferometer Kazuhide KAMIYA *a, Takashi NOMURA *a, Shinta HIDAKA *a, Hatsuzo TASHIRO **b, Masayuki MINO +c, Seiichi OKUDA ++d a Facility of Engineering, Toyama Prefectural

More information

EE119 Introduction to Optical Engineering Spring 2002 Final Exam. Name:

EE119 Introduction to Optical Engineering Spring 2002 Final Exam. Name: EE119 Introduction to Optical Engineering Spring 2002 Final Exam Name: SID: CLOSED BOOK. FOUR 8 1/2 X 11 SHEETS OF NOTES, AND SCIENTIFIC POCKET CALCULATOR PERMITTED. TIME ALLOTTED: 180 MINUTES Fundamental

More information

Exercise 8: Interference and diffraction

Exercise 8: Interference and diffraction Physics 223 Name: Exercise 8: Interference and diffraction 1. In a two-slit Young s interference experiment, the aperture (the mask with the two slits) to screen distance is 2.0 m, and a red light of wavelength

More information

REAL TIME THICKNESS MEASUREMENT OF A MOVING WIRE

REAL TIME THICKNESS MEASUREMENT OF A MOVING WIRE REAL TIME THICKNESS MEASUREMENT OF A MOVING WIRE Bini Babu 1, Dr. Ashok Kumar T 2 1 Optoelectronics and communication systems, 2 Associate Professor Model Engineering college, Thrikkakara, Ernakulam, (India)

More information

CERTIFICATE OF ACCREDITATION

CERTIFICATE OF ACCREDITATION CERTIFICATE OF ACCREDITATION ANSI-ASQ National Accreditation Board 500 Montgomery Street, Suite 625, Alexandria, VA 22314, 877-344-3044 This is to certify that Cal Tec Process Management, LLC 1400 Grange

More information

Absolute frequency measurement of wavelength standards

Absolute frequency measurement of wavelength standards Application Note METROLOGY Czech Metrology Institute (), Prague Menlo Systems, Martinsried Absolute frequency measurement of wavelength standards Authors: Petr Balling (), Benjamin Sprenger (Menlo Systems)

More information

FREQUENCY COMPARISON AT 633 NM WAVELENGTH: DETERMINATION OF DIAGONAL ELEMENTS OF MATRIX MEASUREMENTS BY USING A MASTER-SLAVE He-Ne LASER SYSTEM

FREQUENCY COMPARISON AT 633 NM WAVELENGTH: DETERMINATION OF DIAGONAL ELEMENTS OF MATRIX MEASUREMENTS BY USING A MASTER-SLAVE He-Ne LASER SYSTEM Journal of Optoelectronics and Advanced Materials Vol. 2, No. 3, September 2000, p. 267-273 FREQUENCY COMPARISON AT 633 NM WAVELENGTH: DETERMINATION OF DIAGONAL ELEMENTS OF MATRIX MEASUREMENTS BY USING

More information

Verification of large CMMs - Artefacts and Methods - Eugen Trapet, Spain (Trapet Precision and ISM3D)

Verification of large CMMs - Artefacts and Methods - Eugen Trapet, Spain (Trapet Precision and ISM3D) Verification of large CMMs - Artefacts and Methods - Eugen Trapet, Spain (Trapet Precision and ISM3D) eugen@trapet.de, www.trapet.de Contents - Quick review of ISO 10360-2 - Types of artefacts specifically

More information

A New Profile Measurement Method for Thin Film Surface

A New Profile Measurement Method for Thin Film Surface Send Orders for Reprints to reprints@benthamscience.ae 480 The Open Automation and Control Systems Journal, 2014, 6, 480-487 A New Profile Measurement Method for Thin Film Surface Open Access ShuJie Liu

More information

Spectrally resolved frequency comb interferometry for long distance measurement

Spectrally resolved frequency comb interferometry for long distance measurement Spectrally resolved frequency comb interferometry for long distance measurement Steven van den Berg, Sjoerd van Eldik, Nandini Bhattacharya Workshop Metrology for Long Distance Surveying 21 November 2014

More information

Adaptive Optics for LIGO

Adaptive Optics for LIGO Adaptive Optics for LIGO Justin Mansell Ginzton Laboratory LIGO-G990022-39-M Motivation Wavefront Sensor Outline Characterization Enhancements Modeling Projections Adaptive Optics Results Effects of Thermal

More information

Imaging interference microscope for nanometrology

Imaging interference microscope for nanometrology ACTA IMEKO September 2014, Volume 3, Number 3, 28 32 www.imeko.org Imaging interference microscope for nanometrology Igor Malinovsky 1, Iakyra B. Couceiro 1, Ricardo S. Franca 1, Mauricio S. Lima 1, Carlos

More information

Quality assurance. OEM Custom Services. comaroptics.com

Quality assurance. OEM Custom Services. comaroptics.com Quality assurance OEM Custom Services comaroptics.com Our unique approach Dependable quality Whether your product ends up on Mars or in microscopes, the last thing you want is for it to fail in the hands

More information

Development of C-Mod FIR Polarimeter*

Development of C-Mod FIR Polarimeter* Development of C-Mod FIR Polarimeter* P.XU, J.H.IRBY, J.BOSCO, A.KANOJIA, R.LECCACORVI, E.MARMAR, P.MICHAEL, R.MURRAY, R.VIEIRA, S.WOLFE (MIT) D.L.BROWER, W.X.DING (UCLA) D.K.MANSFIELD (PPPL) *Supported

More information

Schedule of Accreditation issued by United Kingdom Accreditation Service 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK

Schedule of Accreditation issued by United Kingdom Accreditation Service 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK code Location code Customers Sites 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK Calibration Centre Bolkiah Garrison BB3510 Negara Brunei Darussalam Contact: Mr Yussof Taha Tel: +673-2-386475

More information

Status Report on Time and Frequency Activities at National Physical Laboratory India

Status Report on Time and Frequency Activities at National Physical Laboratory India Status Report on Time and Frequency Activities at National Physical Laboratory India (TCTF 2015) Ashish Agarwal *, S. Panja. P. Arora, P. Thorat, S. De, S. Yadav, P. Kandpal, M. P. Olaniya, S S Rajput,

More information

A Thermal Compensation System for the gravitational wave detector Virgo

A Thermal Compensation System for the gravitational wave detector Virgo A Thermal Compensation System for the gravitational wave detector Virgo M. Di Paolo Emilio University of L Aquila and INFN Roma Tor Vergata On behalf of the Virgo Collaboration Index: 1) Thermal Lensing

More information

INTERFEROMETRIC VIBRATION DISPLACEMENT MEASUREMENT

INTERFEROMETRIC VIBRATION DISPLACEMENT MEASUREMENT Romanian Reports in Physics, Vol. 62, No. 3, P. 671 677, 2010 Dedicated to the 50 th LASER Anniversary (LASERFEST-50) INTERFEROMETRIC VIBRATION DISPLACEMENT MEASUREMENT F. GAROI 1, P.C. LOGOFATU 1, D.

More information

1.6 Beam Wander vs. Image Jitter

1.6 Beam Wander vs. Image Jitter 8 Chapter 1 1.6 Beam Wander vs. Image Jitter It is common at this point to look at beam wander and image jitter and ask what differentiates them. Consider a cooperative optical communication system that

More information

A Low-Noise 1542nm Laser Stabilized to an

A Low-Noise 1542nm Laser Stabilized to an A Low-Noise 1542nm Laser Stabilized to an Optical Cavity Rui Suo, Fang Fang and Tianchu Li Time and Frequency Division, National Institute of Metrology Background Narrow linewidth laser are crucial in

More information

CALIBRATION PROCEDURE FOR STABILIZED LASERS USING THE METHOD OF OPTICAL BEATS MEASUREMENT UNCERTAINTY

CALIBRATION PROCEDURE FOR STABILIZED LASERS USING THE METHOD OF OPTICAL BEATS MEASUREMENT UNCERTAINTY U.P.B. Sci. Bull., Series A, Vol. 69, No. 1, 007 ISSN 13-707 CALIBRATION PROCEDURE FOR STABILIZED LASERS USING THE METHOD OF OPTICAL BEATS MEASUREMENT UNCERTAINTY Elena DUGHEANU 1 Lucrarea descrie metoda

More information

High stability multiplexed fibre interferometer and its application on absolute displacement measurement and on-line surface metrology

High stability multiplexed fibre interferometer and its application on absolute displacement measurement and on-line surface metrology High stability multiplexed fibre interferometer and its application on absolute displacement measurement and on-line surface metrology Dejiao Lin, Xiangqian Jiang and Fang Xie Centre for Precision Technologies,

More information

CHAPTER 6 CARBON NANOTUBE AND ITS RF APPLICATION

CHAPTER 6 CARBON NANOTUBE AND ITS RF APPLICATION CHAPTER 6 CARBON NANOTUBE AND ITS RF APPLICATION 6.1 Introduction In this chapter we have made a theoretical study about carbon nanotubes electrical properties and their utility in antenna applications.

More information

By: Louise Brown, PhD, Advanced Engineered Materials Group, National Physical Laboratory.

By: Louise Brown, PhD, Advanced Engineered Materials Group, National Physical Laboratory. NPL The Olympus LEXT - A highly flexible tool Confocal Metrology at the NPL By: Louise Brown, PhD, Advanced Engineered Materials Group, National Physical Laboratory. www.npl.co.uk louise.brown@npl.co.uk

More information

Fiber-optic Michelson Interferometer Sensor Fabricated by Femtosecond Lasers

Fiber-optic Michelson Interferometer Sensor Fabricated by Femtosecond Lasers Sensors & ransducers 2013 by IFSA http://www.sensorsportal.com Fiber-optic Michelson Interferometer Sensor Fabricated by Femtosecond Lasers Dong LIU, Ying XIE, Gui XIN, Zheng-Ying LI School of Information

More information

European Harmonisation and Progress in the Field of Dimensional Metrology

European Harmonisation and Progress in the Field of Dimensional Metrology 1 European Harmonisation and Progress in the Field of Dimensional Metrology 1 Introduction H. Haitjema and P.H.J. Schellekens Eindhoven University of Technology The field of dimensional metrology is, contrary

More information

taccor Optional features Overview Turn-key GHz femtosecond laser

taccor Optional features Overview Turn-key GHz femtosecond laser taccor Turn-key GHz femtosecond laser Self-locking and maintaining Stable and robust True hands off turn-key system Wavelength tunable Integrated pump laser Overview The taccor is a unique turn-key femtosecond

More information

J. C. Wyant Fall, 2012 Optics Optical Testing and Testing Instrumentation

J. C. Wyant Fall, 2012 Optics Optical Testing and Testing Instrumentation J. C. Wyant Fall, 2012 Optics 513 - Optical Testing and Testing Instrumentation Introduction 1. Measurement of Paraxial Properties of Optical Systems 1.1 Thin Lenses 1.1.1 Measurements Based on Image Equation

More information

:... resolution is about 1.4 μm, assumed an excitation wavelength of 633 nm and a numerical aperture of 0.65 at 633 nm.

:... resolution is about 1.4 μm, assumed an excitation wavelength of 633 nm and a numerical aperture of 0.65 at 633 nm. PAGE 30 & 2008 2007 PRODUCT CATALOG Confocal Microscopy - CFM fundamentals :... Over the years, confocal microscopy has become the method of choice for obtaining clear, three-dimensional optical images

More information

Using GNSS for optical frequency and wavelength measurements

Using GNSS for optical frequency and wavelength measurements Using GNSS for optical frequency and wavelength measurements Stephen Lea, Guilong Huang, Helen Margolis, and Patrick Gill National Physical Laboratory Teddington, Middlesex TW11 0LW, UK outline of talk

More information

Capacitive sensors capancdt

Capacitive sensors capancdt Capacitive sensors capancdt Measuring principle capacitive sensors - Principle of ideal plate capacitor - Two plate electrodes are represented by sensor and measurement object - Measurement on insulators

More information

Certificate of Accreditation

Certificate of Accreditation PERRY JOHNSON LABORATORY ACCREDITATION, INC. Certificate of Accreditation Perry Johnson Laboratory Accreditation, Inc. has assessed the Laboratory of: Horizonte #28 entre Astro Rey Sur y Nuevo Amanecer

More information

Borderline between CIPM MRA and testing activities

Borderline between CIPM MRA and testing activities Borderline between CIPM MRA and testing activities Michela Sega, EURAMET TC-MC Chair INRIM-Italy 7 th Meeting of the Focus Group on Facilitating National Metrology Infrastructure Development Zagreb, Croatia,

More information

Nanometer-level repeatable metrology using the Nanoruler

Nanometer-level repeatable metrology using the Nanoruler Nanometer-level repeatable metrology using the Nanoruler Paul T. Konkola, a) Carl G. Chen, Ralf K. Heilmann, Chulmin Joo, Juan C. Montoya, Chih-Hao Chang, and Mark L. Schattenburg Massachusetts Institute

More information

Bringing Answers to the Surface

Bringing Answers to the Surface 3D Bringing Answers to the Surface 1 Expanding the Boundaries of Laser Microscopy Measurements and images you can count on. Every time. LEXT OLS4100 Widely used in quality control, research, and development

More information

Stability of a Fiber-Fed Heterodyne Interferometer

Stability of a Fiber-Fed Heterodyne Interferometer Stability of a Fiber-Fed Heterodyne Interferometer Christoph Weichert, Jens Flügge, Paul Köchert, Rainer Köning, Physikalisch Technische Bundesanstalt, Braunschweig, Germany; Rainer Tutsch, Technische

More information

SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 & ANSI/NCSL Z

SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 & ANSI/NCSL Z SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 & ANSI/NCSL Z540-1-1994 DIGITAL MEASUREMENT METROLOGY INC. (A TRESCAL COMPANY) 26 Automatic Road, Unit 4 Brampton, Ontario, CANADA L6S 5N7 Nana Mantey Phone:

More information

Schedule of Accreditation issued by United Kingdom Accreditation Service 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK

Schedule of Accreditation issued by United Kingdom Accreditation Service 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK Metrology Division Contact: Mr K Pallett Calibration House Tel: +44 (0)1332 867 700 Castings Road E-Mail: sales@comech.co.uk Derby Website:

More information

Certificate of Accreditation

Certificate of Accreditation PERRY JOHNSON LABORATORY ACCREDITATION, INC. Certificate of Accreditation Perry Johnson Laboratory Accreditation, Inc. has assessed the Laboratory of: Guadalupe Nuevo León, México C.P. 67160 (Hereinafter

More information

Pound-Drever-Hall Locking of a Chip External Cavity Laser to a High-Finesse Cavity Using Vescent Photonics Lasers & Locking Electronics

Pound-Drever-Hall Locking of a Chip External Cavity Laser to a High-Finesse Cavity Using Vescent Photonics Lasers & Locking Electronics of a Chip External Cavity Laser to a High-Finesse Cavity Using Vescent Photonics Lasers & Locking Electronics 1. Introduction A Pound-Drever-Hall (PDH) lock 1 of a laser was performed as a precursor to

More information

Orthogonally Polarized Lasers

Orthogonally Polarized Lasers Orthogonally Polarized Lasers and their Applications Shulian Zhang and Thierry osch Precision metrologists have traditionally thought of lasers as mere light sources. Now, orthogonally polarized lasers

More information

Investigations of Digital Levels for High Precision Measurements

Investigations of Digital Levels for High Precision Measurements Investigations of Digital Levels for High Precision Measurements Georg L. Gassner, Robert E. Ruland, Brendan Dix Abstract At SLAC (Stanford Linear Accelerator Center) a fully automated vertical comparator

More information

Agilent 10705A Single Beam Interferometer and Agilent 10704A Retroreflector

Agilent 10705A Single Beam Interferometer and Agilent 10704A Retroreflector 7B Agilent 10705A Single Beam Interferometer and Agilent 10704A Retroreflector Description Description The Agilent 10705A Single Beam Interferometer (shown in Figure 7B-1) is intended for use in low-mass

More information

Measurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation

Measurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation 238 Hitachi Review Vol. 65 (2016), No. 7 Featured Articles Measurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation AFM5500M Scanning Probe Microscope Satoshi Hasumura

More information

Report to the 20th Meeting of CCTF Research Activities on Time and Frequency National Metrology Institute of Japan (NMIJ)/AIST

Report to the 20th Meeting of CCTF Research Activities on Time and Frequency National Metrology Institute of Japan (NMIJ)/AIST Report to the 20th Meeting of CCTF Research Activities on Time and Frequency National Metrology Institute of Japan (NMIJ)/AIST The National Metrology Institute of Japan (NMIJ) is responsible for almost

More information

ACLASS Accreditation Services

ACLASS Accreditation Services ACLASS Accreditation Services SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 & ANSI/NCSL Z540-1-1994 For Subcontractor Schedule B Fox Valley Metrology, LTD. 3125 Medalist Dr., Oshkosh, WI 54902 Mark Toll

More information

Physikalisch Technische Bundesanstalt

Physikalisch Technische Bundesanstalt EURAMET Intercomparison: Involute Gear Artifacts 1 Physikalisch Technische Bundesanstalt EURAMET Intercomparison Involute Gear Artifacts Technical Protocol Rev 3 EURAMET Intercomparison: Involute Gear

More information

Scanning Electron Microscopy

Scanning Electron Microscopy Scanning Electron Microscopy For the semiconductor industry A tutorial Titel Vorname Nachname Titel Jobtitle, Bereich/Abteilung Overview Scanning Electron microscopy Scanning Electron Microscopy (SEM)

More information

Templates, DTR and BPM Media

Templates, DTR and BPM Media Complete Metrology Solutions Imprint Technology Templates, DTR and BPM Media Simultaneous and Non-Destructive Measurements of Depth Top and Bottom CD Residual Layer Thickness, RLT DLC Thickness Side Wall

More information

SP-8001 UV/Visible Spectrophotometer

SP-8001 UV/Visible Spectrophotometer SP-8001 UV/Visible Spectrophotometer Provide Accurate Results High performance UV/Visible Spectrophotometer for Research, and Laboratory work Product Features The Metertech SP-8001 UV/Visible Spectrophotometer

More information

Nanoscale Material Characterization with Differential Interferometric Atomic Force Microscopy

Nanoscale Material Characterization with Differential Interferometric Atomic Force Microscopy Nanoscale Material Characterization with Differential Interferometric Atomic Force Microscopy F. Sarioglu, M. Liu, K. Vijayraghavan, A. Gellineau, O. Solgaard E. L. Ginzton Laboratory University Tip-sample

More information

Wavelength Control and Locking with Sub-MHz Precision

Wavelength Control and Locking with Sub-MHz Precision Wavelength Control and Locking with Sub-MHz Precision A PZT actuator on one of the resonator mirrors enables the Verdi output wavelength to be rapidly tuned over a range of several GHz or tightly locked

More information

2-5 Frequency Calibration

2-5 Frequency Calibration 2-5 Frequency SAITO Haruo, IWAMA Tsukasa, TSUCHIYA Shigeru, and KOYAMA Yasuhiro The Japan Standard Time (JST) and the Coordinated Universal Time (UTC(NICT)), which are constructed by National Institute

More information

Absolute distance measurement with an unraveled femtosecond frequency comb Steven van den Berg

Absolute distance measurement with an unraveled femtosecond frequency comb Steven van den Berg Absolute distance measurement with an unraveled femtosecond frequency comb Steven van den Berg Stefan Persijn Gertjan Kok Mounir Zeitouny Nandini Bhattacharya ICSO 11 October 2012 Outline Introduction

More information

Technology Days GSFC Optics Technologies. Dr. Petar Arsenovic

Technology Days GSFC Optics Technologies. Dr. Petar Arsenovic Technology Days 2011 GSFC Optics Technologies Dr. Petar Arsenovic Optics Capabilities Optical Design and Analysis Opto-mechanical Design and Fabrication Materials and Thin Films Component Development and

More information

SUPPLEMENTARY INFORMATION DOI: /NPHOTON

SUPPLEMENTARY INFORMATION DOI: /NPHOTON Supplementary Methods and Data 1. Apparatus Design The time-of-flight measurement apparatus built in this study is shown in Supplementary Figure 1. An erbium-doped femtosecond fibre oscillator (C-Fiber,

More information

v tome x m microfocus CT

v tome x m microfocus CT GE Inspection Technologies v tome x m microfocus CT Uniting premium 3D metrology and inspection with quality and speed. gemeasurement.com/ct x plore precision CT line Inspect with precision, power, and

More information

Time and Frequency Research Activity in NIM

Time and Frequency Research Activity in NIM Time and Frequency Research Activity in NIM Gao Xiaoxun National Institute of Metrology Bei San Huan Dong Lu No.18 Beijing P.R.China Abstract This paper will introduce scientific research activities in

More information