ELECTRONICS TESTING CENTER, TAIWAN Report No.:13-12-RBO-024 EMC TESTING DEPARTMENT Page: 1/24

Transcription

1 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 1/24 CONFORMNCE TEST REPORT FOR EN & EN Report No.: RBO-024 ccording to: Electromagnetic Compatibility Directive: 2004/108/EC Low Voltage Directive: 2006/95/EC Radio Equipment and Telecommunications Terminal Equipment: 1999/5/EC Machinery Directives: 98/37/EC Client: Product: Model No.: Comment Issues: Manufacturer/supplier: Date test item received: 2013/12/10 Date test campaign completed: 2014/02/05 Date of issue 2014/02/10 Vecow Embedded Computing System Vecow ECS Series; ECS-XXXX; ECS-7XXX; ECS-5XXX; ECS R510EW4 N/ Vecow The test result only corresponds to the tested sample. It is not permitted to copy this report, in part or in full, without the permission of the test laboratory. Total number of pages of this test report: 24 pages Total number of pages of this test photos: 11 pages Test Engineer Checked By pproved By ndy Chang Licher Chen nderson Ku ELECTRONICS TESTING CENTER, TIWN NO. 34. LIN 5. DINGFU, LINKOU DIST., NEW TIPEI CITY, TIWN, 24442, R.O.C. TEL: (02) INT: FX: (02) INT: Laboratory Introduction: Electronics Testing Center, Taiwan is recognized, filed and mutual recognition arrangement as following: ISO9001: TüV Product Service ISO/IEC 17025: BSMI, CNL, DGT, NVLP, CCIBLC, UL, Compliance Filing: FCC, Industry Canada, VCCI MR: ustralia, Hong Kong, New Zealand, Singapore, US, Japan, Korea, China, PLC through CNL FCC Registration Number: 90588, 91094, 91095

2 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 2/24 CONTENTS EMC TEST REPORT... 1 CONTENTS TEST REPORT CERTIFICTION GENERL INFORMTIONS Description of EUT: Related Information of EUT: Tested Configuration: Deviation Record: Modification Record: Note: Measurement Uncertainty SUMMRY OF TEST RESULTS Emissions: Conducted Emissions Radiated Emissions Immunity: Immunity Criteria: Electrostatic Discharge Immunity: RF Radiated Fields Immunity: EFT/Burst Immunity: Surge Immunity: RF Common Mode Immunity: TEST DT & RELTED INFORMTIONS Emissions: Conducted Emissions Test: Conducted Emissions Test Data: Radiated Emissions Test: Radiated Emissions Test Data: Immunity: Electrostatic Discharge Immunity Test: Electrostatic Discharge Immunity Test Data: RF Radiated Fields Immunity Test: RF Radiated Fields Immunity Test Data: EFT/Burst Immunity Test: EFT/Burst Immunity Test Data: Surge Immunity Test: Surge Immunity Test Data:... 22

3 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 3/ RF Common Mode Immunity Test: RF Common Mode Immunity Test Data: EQUIPMENTS LIST FOR TESTING NNEX : PHOTOS... 1~11

4 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 4/24 1 TEST REPORT CERTIFICTION Client ddress Manufacturer ddress EUT Trade Name Model No. Comment Issues : Vecow : 12F., No. 111, Zhongcheng Rd., Tucheng Dist., New Taipei City Taiwan (R. O. C.) : Vecow : 12F., No. 111, Zhongcheng Rd., Tucheng Dist., New Taipei City Taiwan (R. O. C.) : Embedded Computing System : Vecow : Vecow ECS Series; ECS-XXXX; ECS-7XXX; ECS-5XXX; ECS R510EW4 : N/ Test Standard : EN :2006 Emissions EN 50155:2007 CISPR11:2009/1:2010 Immunity EN :2009 EN :2006/1:2008 EN :2004/1:2010/:2012 EN :2006 EN :2009 The testing described in this report has been carried out to the best of our knowledge and ability, and our responsibility is limited to the exercise of reasonable care. This certification is not intended to believe the sellers from their legal and/or contractual obligations.

5 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 5/ Description of EUT: 2 GENERL INFORMTIONS Embedded Computing System DRM: Vecow Wide-Temp DDR3 4GB RM M340S-W28M1 2.2 Related Information of EUT: Power Supply : DC 24V Power Line : Nonshielded Shielded None, length: m Signal Line : Nonshielded Shielded None, length: m Control Line : Nonshielded Shielded None, length: m * For more detailed features, please refer to User s Manual. 2.3 Tested Configuration: The EUT connected with the following peripheral devices. Following peripheral devices and interface cables were connected during the measurement: Product Manufacturer Model No. Power/Line Embedded Computing System Vecow Vecow ECS Series; ECS-XXXX; ECS-7XXX; ECS-5XXX; ECS R510E W Deviation Record: (If any deviation from additions to or exclusions from test method must be stated) N/ 2.5 Modification Record: No modifications were required. (That is the EUT complied with the requirement as tested.) 2.6 Note: Implementation of the EN tests, This Product is no Ground Line.

6 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 6/ Measurement Uncertainty Electromagnetic Interference Measurement Frequency Uncertainty Conducted emissions 150kHz ~ 30MHz ±2.5dB(Mains) Conducted emission at telecommunication ports 150kHz ~ 30MHz ±2.22dB(Voltage) ±2.88dB(Current) Magnetic emissions 9kHz ~ 30MHz ±2.5dB Radiated emissions 30MHz ~ 1GHz ±3.90dB(30MHz f 300MHz) ±3.95dB(300MHz<f 1GHz) bove 1GHz ±4.42dB(1GHz f 18GHz) ±4.86dB(18GHz f 40GHz) Electromagnetic Susceptibility Measurement Item Uncertainty Electrostatic Discharges (ESD) --- ±0.22() 58.67(V) Radiated RF electromagnetic Fields --- ±1.2(dBμV) Electrical Fast Transients and bursts --- ±2.95(V) Surges --- ±2.95(V) Conducted Disturbances, induced by RF fields --- ±0.7(dB) Power-frequency Magnetic Field --- ±1.49(dB) Voltage Dips, Interruptions, and variations --- ±4.18(V) This uncertainty represents an expanded uncertainty expressed at approximately the 95% confidence level using a coverage factor of k=2.

7 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 7/ Emissions: 3 SUMMRY OF TEST RESULTS Conducted Emissions PSS(Negative) EMI value to the limit: db at MHz PSS(Positive) EMI value to the limit: db at MHz Radiated Emissions (30MHz to 1GHz) PSS(Horizontal) EMI value to the limit: PSS(Vertical) EMI value to the limit: db at MHz db at MHz Notes: The measured value lies in the limited range that is the limit plus or minus estimated measurement uncertainty. The judgment between pass or fail is decided by buyers.

8 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 8/ Immunity: Immunity Criteria: The results of all of the immunity tests performed on the EUT were evaluated according to the following criteria, and according to the manufacturer s specifications for the EUT: Performance criterion : Performance criterion B: Performance criterion C: The EUT continued to operate as intended. No degradation of performance or loss of function was allowed below a performance level specified by the manufacturer, when the EUT was used as intended. The EUT continued to operate as intended after the test. No degradation of performance or loss of function was allowed below a performance level specified by the manufacturer, when the EUT was used as intended. During the test, degradation of performance was however allowed. No change of actual operating state or stored data was allowed. Temporary loss of function was allowed, provided the function was self recoverable or could be restored by the operation of the controls Electrostatic Discharge Immunity: - No Degradation of Function - Distortion of Function - Error of Function Requirement: Criterion B (or better) - Satisfies Criterion - Satisfies Criterion B - Satisfies Criterion C RF Radiated Fields Immunity: - No Degradation of Function - Distortion of Function - Error of Function Requirement: Criterion - Satisfies Criterion - Satisfies Criterion B - Satisfies Criterion C EFT/Burst Immunity: - No Degradation of Function - Distortion of Function - Error of Function Requirement: Criterion - Satisfies Criterion - Satisfies Criterion B - Satisfies Criterion C

9 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 9/ Surge Immunity: - No Degradation of Function - Distortion of Function - Error of Function Requirement: Criterion B (or better) - Satisfies Criterion - Satisfies Criterion B - Satisfies Criterion C RF Common Mode Immunity: - No Degradation of Function - Distortion of Function - Error of Function Requirement: Criterion - Satisfies Criterion - Satisfies Criterion B - Satisfies Criterion C

10 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 10/24 4 TEST DT & RELTED INFORMTIONS 4.1 Emissions: Conducted Emissions Test: Conducted Emissions Test Data:. Operating Conditions of the EUT: Operation Test Date: Dec.17,2013 Test Specification EN (CISPR11) Climatic Condition mbient Temperature: 23 Relative Humidity: 52 % RH Power Supply System DC Power: 24 Vdc Test data see the next pages.

11 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 11/24 Site : conducted #1 Date : Condition : EN QP LISN : NEUTRL Tem / Hum : 23 / 52% Test Mode : Operation Mode EUT : Embedded Computing System Power Rating : DC24V Memo : Memo : Freq Reading Factor Emission Level Limit Line Over Limit Remark (MHz) (dbuv) (db) (dbuv) (dbuv) (db) QP QP QP QP QP QP Note : 1. Result = Reading + Factor 2. Factor = LISN Factor + Cable Loss

12 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 12/24 Site : conducted #1 Date : Condition : EN QP LISN : LINE Tem / Hum : 23 / 52% Test Mode : Operation Mode EUT : Embedded Computing System Power Rating : DC24V Memo : Memo : Freq (MHz) Reading (dbuv) Factor (db) Emission Level (dbuv) Limit Line (dbuv) Over Limit (db) Remark QP QP QP QP QP QP Note : 1. Result = Reading + Factor 2. Factor = LISN Factor + Cable Loss

13 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 13/ Radiated Emissions Test: Radiated Emissions Test Data:. Operating Conditions of The EUT: Operation Mode Test Date: Dec. 18, 2013 Test Specification EN (CISPR11) Climatic Condition mbient Temperature: 23 Relative Humidity: 56 % RH Power Supply System DC Power: 24 Vdc Test data see the next pages.

14 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 14/24 (30MHz to 1GHz) Site :Open site #2 Date : EUT :Embedded Computing System nt. Pol. :HORIZONTL Model :Vecow ECS Series ECS R510EW4 Detector :QP Power Rating :DC24V Engineer :ndy.chang Limit :CLSS- Temp. :23 C Memo : Humi. :56 % Freq MHz Reading dbuv Correction Factor db Result dbuv/m Limits dbuv/m Over limit db Note : 1. Result = Reading + Corrected Factor 2. Corrected Factor = ntenna Factor + Cable Loss - mplifier Gain (if any) 3. The margin value=limit - Result

15 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 15/24 Site :Open site #2 Date : EUT :Embedded Computing System nt. Pol. :VERTICL Model :Vecow ECS Series ECS R510EW4 Detector :QP Power Rating :DC24V Engineer :ndy.chang Limit :CLSS- Temp. :23 C Memo : Humi. :56 % Freq MHz Reading dbuv Correction Factor db Result dbuv/m Limits dbuv/m Over limit db Note : 1. Result = Reading + Corrected Factor 2. Corrected Factor = ntenna Factor + Cable Loss - mplifier Gain (if any) 3. The margin value=limit - Result

16 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 16/ Immunity: Electrostatic Discharge Immunity Test: Electrostatic Discharge Immunity Test Data:. Operating Conditions of the EUT: Operation Mode Test Date: Feb. 23, 2014 Test Specification EN Climatic Condition mbient Temperature: 23 Relative Humidity: 52 % RH tmospheric Pressure: 990 mbar Power Supply System DC Power: 24 Vdc Energy-Storage Capacitor :150 pf Contact Discharge Times :25 times/each condition Discharge Resistor :330 ir Discharge Times :10 times/each condition \ Discharge Mode Contact Discharge ir Discharge \ESD Voltage 2 kv 4 kv 6 kv kv 2 kv 4 kv 8 kv kv \Points\Result\Polarity VCP HCP P1 ~ P8, P12 ~ P P9 ~ P11, P14 ~ P Result: Complied Does not comply Criterion Required: B Criterion Met: Note: means the EUT continued to operate as intended. No degradation of performance or loss of function was allowed below a performance level specified by the manufacturer, when the EUT was used as intended.

17 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 17/24 TEST POINTS

18 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 18/24 TEST POINTS

19 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 19/ RF Radiated Fields Immunity Test: RF Radiated Fields Immunity Test Data:. Operating Conditions of the EUT: Operation Mode Test Date: Feb. 23, 2014 Test Specification EN Climatic Condition mbient Temperature: 22 Relative Humidity: 52 RH Power Supply System DC Power: 24 Vdc Frequency Range 80 MHz ~ 1000 MHz Field Strength 20 V/m Modulation (M 1kHz 80%) Sweep Rate : ecades/s Step Size : 1 % of preceding frequency value Dwell Time : 3 s Frequency Range (MHz) Polarization of Device Directing of Device Test Result Front 80 MHz ~ 1000 MHz Horizontal Rear Left Right Front 80 MHz ~ 1000 MHz Vertical Rear Left Right Frequency Range 1400 MHz ~ 2100 MHz Field Strength 10 V/m Modulation (M 1kHz 80%) Sweep Rate : ecades/s Step Size : 1 % of preceding frequency value Dwell Time : 3 s Frequency Range (MHz) Polarization of Device Directing of Device Test Result Front 1400 MHz ~ 2100 MHz Horizontal Rear Left Right Front 1400 MHz ~ 2100 MHz Vertical Rear Left Right

20 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 20/24 Frequency Range 2100 MHz ~ 2500 MHz Field Strength 5 V/m Modulation (M 1kHz 80%) Sweep Rate : ecades/s Step Size : 1 % of preceding frequency value Dwell Time : 3 s Frequency Range (MHz) Polarization of Device Directing of Device Test Result Front 2100 MHz ~ 2500 MHz Horizontal Rear Left Right Front 2100 MHz ~ 2500 MHz Vertical Rear Left Right Result: Complied Does not comply Criterion Required: Criterion Met: Note: means the EUT continued to operate as intended. No degradation of performance or loss of function was allowed below a performance level specified by the manufacturer, when the EUT was used as intended.

21 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 21/ EFT/Burst Immunity Test: EFT/Burst Immunity Test Data:. Operating Conditions of the EUT: Operation Mode Test Date : Dec. 23, 2013 Test Specification EN Climatic Condition mbient Temperature: 22 C Relative Humidity: 52 %RH tmospheric Pressure: 990 mbar Power Supply System DC Power: 24 Vdc Pulse : 5 /50ns Burst : 15ms /300ms Voltage\Polarity\Test Point\Mode\Result Repetition Rate : 5kHz Test time : 1 min/each condition 2.0 kv + - Power Line Signal Line PV+ to PV- LN Cable Result: Complied Does not comply Criterion Required: B Criterion Met: Note: means the EUT continued to operate as intended. No degradation of performance or loss of function was allowed below a performance level specified by the manufacturer, when the EUT was used as intended.

22 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 22/ Surge Immunity Test: Surge Immunity Test Data:. Operating Conditions of the EUT: Operation Mode Test Date : Feb. 23, 2014 Test Specification EN Climatic Condition mbient Temperature: 22 C Relative Humidity: 52 %RH tmospheric Pressure: 990 mbar Power Supply System DC Power : POWER OFF Waveform : 1.2/50 s(8/20 s) Repetition rate : 60 sec Times : POWER 5 time/each condition Phase\Voltage \Mode \Polarity \Result 1kV PV+ to PV- + Result: Complied Does not comply Criterion Required: B Criterion Met: Note: means the EUT continued to operate as intended. No degradation of performance or loss of function was allowed below a performance level specified by the manufacturer, when the EUT was used as intended.

23 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 23/ RF Common Mode Immunity Test: RF Common Mode Immunity Test Data:. Operating Conditions of the EUT: Operation Mode Test Date : Dec.23,2013 Test Specification EN Climatic Condition mbient Temperature: 22 C Relative Humidity: 52 %RH Power Supply System DC Power: 24 Vdc Frequency Range 0.15MHz ~80MHz Test Level 10Vrms Modulation (M 1kHz 80%) Sweep Rate : decades/s Step Size : 1 % of preceding frequency value Dwell Time : 3 s Frequency Range (MHz) Tested Line Test Result 0.15MHz ~80MHz CDN-M2 0.15MHz ~80MHz CDN-RJ45 Result: Complied Does not comply Criterion Required: Criterion Met: Note: means the EUT continued to operate as intended. No degradation of performance or loss of function was allowed below a performance level specified by the manufacturer, when the EUT was used as intended.

24 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 24/24 5 EQUIPMENTS LIST FOR TESTING Item Name Manufacturer Model Calibration Date Recommended Recal. Date 1 EMI Test Receiver Rohde & Schwarz ESCI 2013/08/ /08/01 2 LISN EMCO 3625/2 2013/05/ /05/06 3 LISN Rohde & Schwarz ESH2-Z5 2013/04/ /04/11 4 Current Probe Rohde & Schwarz ESH2-Z1 2013/08/ /08/05 5 ISN FCC FCC-TLISN-T /10/ /10/04 6 ISN FCC FCC-TLISN-T /09/ /09/19 7 Test Receiver Rohde & Schwarz ESVS /05/ /05/05 8 mplifier HP 8447D 2013/08/ /08/07 9 EMI Test Receiver Rohde & Schwarz ESL 2013/09/ /09/10 10 Bi-Log ntenna ETC MCTD /01/ //01/02 11 Test Receiver Rohde & Schwarz ESU /09/ /09/23 12 mplifier HP 8449B 2014/01/ /01/14 13 Horn ntenna EMCO /08/ /08/01 14 ESD Simulator NoiseKen ESS /07/ /07/29 15 ntenna Sunal Sciences JB6 N/ N/ 16 signal Generator glient EMC /3/ /3/12 17 mplifier Ophir 5172 N/ N/ 18 mplifier Ophir 5127 N/ N/ 19 POWER METER Booton /9/ /9/26 20 EMC Immunity tester EMC-PRTNER Harmonics /08/ /08/06 21 CS TESTER FRNKONI CIT /05/ /05/05 22 CDN-M2/M3 FRNKONI M2/M3 2013/05/ /05/09 23 SCHFFUER CS-CLMP KEMZ /05/ /05/10

25 Report No.: RBO-024 EMC TESTING DEPRTMENT Page: 1/11 NNEX : PHOTOS 1. Conducted Emissions Test Setup Photos

26 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 2/11 2. Radiated Emissions Test Setup Photos (30MHz to 1GHz)

27 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 3/11 3. Electrostatic Discharge Immunity Test Setup Photo

28 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 4/11 4. RF Radiated Fields Immunity Test Setup Photo

29 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 5/11 5. EFT/Burst Immunity Test Setup Photo TEST MODE: DC TEST MODE: LN

30 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 6/11 6. Surge Immunity Test Setup Photo

31 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 7/11 7. RF Common Mode Immunity Test Setup Photo TEST MODE:DC TEST MODE:LN

32 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 8/11 8. Outside view 1 of EUT 9. Outside view 2 of EUT

33 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 9/ Outside view 3 of EUT 11. Inside view 1 of EUT

34 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 10/ Inside view 2 of EUT 13. Front view of PCB 1

35 Report No.:13-12-RBO-024 EMC TESTING DEPRTMENT Page: 11/ Rear view of PCB 1