Electromagnetic Compatibility Test Report. Electricity Demand Management & Response Equipment Einstein Rev E

Transcription

1 Page 1 of 85 Electromagnetic Compatibility Test Report Prepared in accordance with EN :2013 EN 55011:2009+A1:2010, CISPR 11:2009+A1:2010, FCC Part 15 Subpart B:2015, ICES-003:2014 On Electricity Demand Management & Response Equipment Einstein Rev E Prepared for: Verdigris NASA AMES Research Park, Bldg. 19 Moffett Field, CA U.S.A. Prepared by: TUV Rheinland of North America, Inc Quarry Lane, Ste. A Pleasanton, CA U.S.A.

2 Revisions Page 2 of 85 Revision No. Date Reason for Change Author 0 September 7, 2016 Original Document N/A Note: Latest revision report will replace all previous reports.

3 ATTESTATION OF TEST RESULTS Page 3 of 85 Client: Verdigris NASA AMES Research Park, Bldg. 19 Moffett Field, CA U.S.A. Jonathan Chu Tel. (408) jon@verdigris.com Model Name: Verdigris Serial Number: None Model Numbers: Einstein Rev E Dates Tested: July 27 - August 29, 2016 Test Location: TUV Rheinland of North America 1279 Quarry Lane, Ste. A Pleasanton, CA U.S.A. Tel. (925) Test Specifications: Emissions: Immunity: EN 55011:2009+A1:2010, CISPR 11:2009+A1:2010, FCC Part 15 Subpart B:2015, ICES-003:2014, IEC :2006/A1:2009/A2:2009, EN :2006/A1:2009/A2:2009, IEC :2008, EN :2008 EN :2013, IEC :2008, EN :2009, IEC :2006/A1:2008/A2:2010, EN :2006/A1:2008/A2:2010 IEC : 2004+A1:2010, EN :2004+A1:2010, IEC :2005, EN :2006, IEC :2004/A2:2006, EN :2009, IEC :2009, EN :2010, IEC :2004, EN :2004 Test Result: The above product was found to be Compliant to the above test standard(s) Prepared by: Eddie Marsical Reviewed by: David Spencer September 7, 2016 Date Name Signature Other aspects: None September 7, 2016 Date Name Signature PLEASANTON US5254 Testing Cert # INDUSTRY CANADA 2932M (A-0031)

4 Page 4 of 85 TABLE OF CONTENTS 1 GENERAL INFORMATION SCOPE PURPOSE SUMMARY OF TEST RESULTS LABORATORY INFORMATION ACCREDITATIONS & ENDORSEMENTS TEST FACILITIES AND EMC SOFTWARE MEASUREMENT UNCERTAINTY CALIBRATION TRACEABILITY MEASUREMENT EQUIPMENT USED PRODUCT INFORMATION PRODUCT DESCRIPTION EQUIPMENT MODIFICATIONS TEST PLAN EMISSIONS RADIATED EMISSIONS CONDUCTED EMISSIONS IMMUNITY ELECTROSTATIC DISCHARGE (ESD) RADIATED IMMUNITY ELECTRICAL FAST TRANSIENT / BURST (EFT) SURGE IMMUNITY CONDUCTED IMMUNITY POWER FREQUENCY MAGNETIC FIELD IMMUNITY VOLTAGE DIPS, VARIATIONS, AND SHORT INTERRUPTIONS APPENDIX A TEST PLAN GENERAL INFORMATION EUT DESIGNATION EUT DESCRIPTION EQUIPMENT UNDER TEST (EUT) DESCRIPTION PRODUCT ENVIRONMENT(S) APPLICABLE DOCUMENTS EUT ELECTRICAL POWER INFORMATION EUT CLOCK/OSCILLATOR FREQUENCIES ELECTRICAL SUPPORT EQUIPMENT NON - ELECTRICAL SUPPORT EQUIPMENT EUT EQUIPMENT/CABLING INFORMATION EUT TEST PROGRAM EUT MODES OF OPERATION... 74

5 Page 5 of MONITORING OF EUT DURING TESTING EUT CONFIGURATION EMISSIONS IMMUNITY... 80

6 1 General Information Page 6 of Scope This report is intended to document the status of conformance with the listed standards based on the results of testing performed on July 27 - August 29, 2016 on the Electricity Demand Management & Response Equipment, Model No.: Einstein Rev E, manufactured by Verdigris. This report only applies to the specific samples tested under the stated test conditions. It is the responsibility of the manufacturer to assure that additional production units of this model are manufactured with identical or EMI equivalent electrical and mechanical components. This report is further intended to document changes and modifications to the EUT throughout its life cycle. All documentation will be included as a supplement. 1.2 Purpose Testing was performed to evaluate the EMC performance of the EUT (Equipment Under Test) in accordance with the applicable requirements, procedures, and criteria defined in the application of regulations and application of standards listed in this report.

7 Page 7 of Summary of Test Results Applicant Verdigris NASA AMES Research Park, Bldg. 19 Moffett Field, CA U.S.A. Contact Jonathan Chu Tel. (408) jon@verdigris.com Description Electricity Demand Management & Response Equipment Model Name Verdigris Model Number Einstein Rev E Serial Number None Input Power Vac, Hz Test Dates July 27 - August 29, 2016 Standards Description Severity Level or Limit Criteria Test Result EN :2013 Product Family Standard Emissions Information Technology Equipment Radio Disturbance See called out basic standards below See Below Complies EN :2013 Product Family Standard Immunity Information Technology Equipment Immunity See called out basic standards below See Below Complies EN 55011:2009+A1:2010, CISPR 11:2009+A1:2010, FCC Part 15 Subpart B:2015, ICES-003:2014 Radiated Emissions Class A 30MHz GHz Limit Complies

8 Page 8 of 85 Standards Description Severity Level or Limit Criteria Test Result EN 55011:2009+A1:2010, CISPR 11:2009+A1:2010, FCC Part 15 Subpart B:2015, ICES-003:2014 Conducted Emissions Class A 150 khz - 30 MHz Limit Complies IEC :2006/A1:2009/A2:2009, EN :2006/A1:2009/A2:2009 IEC :2008, EN :2008 IEC :2008, EN :2009 Basic test standard IEC :2006/A1:2008/A2:2010, EN :2006/A1:2008/A2:2010 Basic test standard IEC : 2004+A1:2010, EN :2004+A1:2010 Basic test standard IEC :2005, EN :2006 Basic test standard Power Harmonics Voltage Fluctuation Electrostatic Discharge Radiated Electromagnetic Field Immunity Electrical Fast Transient /Burst Immunity Surge Immunity Class A Equipment Per Clause 5 of the Standard Limit NA Per Clause 5 of the Standard Limit NA ±8 kv Air Discharge ±4 kv Contact Discharge, VCP, HCP 10 V/m, MHz 3 V/m, GHz 80%, 1 khz, AM ±2 kv on AC Mains ±1 kv on I/O Ports N/A CM Line-Gnd ±1 kv, DM Line-Line N/A on I/O Ports B A B B Complies Complies Complies Complies IEC :2004/A2:2006, EN :2009 Basic test standard Conducted Immunity 3 Vrms, MHz, AC Mains 3 Vrms, MHz, I/O Ports A Complies IEC :2009, EN :2010 Basic test standard IEC :2004, EN :2004 Basic test standard Power Frequency Magnetic Field Immunity test. Voltage Dips Voltage Interruptions Hz and 60 Hz 3 Orthogonal Orientations 0% During 1 Cycle 40% During 10 Cycles 70%,During 25 Cycles A B C C 0% During 250 Cycles C Complies Complies

9 2 Laboratory Information Page 9 of Accreditations & Endorsements US Federal Communications Commission TUV Rheinland of North America EMC test facilities located at 1279 Quarry Lane, Ste. A, Pleasanton, CA, 94566, and 2305 Mission College Blvd, Ste. 105, Santa Clara, CA 95054, are recognized by the Commission for performing testing services for the general public on a fee basis. These laboratory test facilities have been fully described in reports submitted to and accepted by the FCC (Pleasanton Registration No. US5254, Santa Clara Registration No. US5251). The laboratory Scopes of Accreditation include Title 47 CFR Parts 15, 18 and 90. The accreditations are updated every three years A2LA updated annually. TUV Rheinland of North America EMC test facilities are accredited by the American Association for Laboratory Accreditation (A2LA). The laboratories have been assessed and accredited by A2LA in accordance with ISO Standard 17025:2005 (Testing Certificate # ). The Scope of Laboratory Accreditation includes emission and immunity testing. The accreditations are Industry Canada The Pleasanton 5-meter Semi-Anechoic Chamber, Registration No. 2932M-1, has been accepted by Industry Canada to perform testing to 3 and 5 meters based on the test procedures described in ANSI C The Santa Clara 10-meter Semi-Anechoic Chamber, Registration No. 2932D-1, has been accepted by Industry Canada to perform testing to 3 and 10 meters based on the test procedures described in ANSI C Japan VCCI The Voluntary Control Council for Interference by Information Technology Equipment (VCCI) is a group that consists of Information Technology Equipment (ITE) manufacturers and EMC test laboratories. The purpose of the Council is to take voluntary control measures against electromagnetic interference from Information Technology Equipment, and thereby contribute to the development of a socially beneficial and responsible state of affairs in the realm of Information Technology Equipment in Japan. TUV Rheinland of North America EMC test facilities located at 1279 Quarry Lane, Ste. A, Pleasanton, CA, 94566, and 2305 Mission College Blvd, Ste. 105, Santa Clara, CA 95054, have been assessed and approved in accordance with the Regulations for Voluntary Control Measures. VCCI Registration No. for Pleasanton: A-0031

10 Page 10 of Test Facilities and EMC Software Test facilities are located at 1279 Quarry Lane, Ste. A, Pleasanton, California 94566, U.S.A. and 2305 Mission College Blvd., Ste. 105, Santa Clara, 95054, U.S.A. (Santa Clara is the Pleasanton Annex) Emission Test Facility The Semi-Anechoic Chambers and AC Line Conducted measurement facilities used to collect radiated and conducted emissions data have been constructed in accordance with ANSI C63.7:1992. The Santa Clara 10 meter semi-anechoic chamber has been measured in accordance with and verified to comply with the theoretical volumetric normalized site attenuation of ANSI C63.4:2009 and SVSWR requirements of CISPR Consol. Ed. 3.0 ( ), at test distances of 3 and 10 meters. This site has been described in reports dated November 1st, 2006, submitted to the FCC, and accepted by letter dated November 28, The site is listed with the FCC and accredited by A2LA (Testing Certificate # ). The Pleasanton 5 meter semi-anechoic chamber has been verified to comply with the theoretical volumetric normalized site attenuation of ANSI C63.4:2009 and SVSWR requirements of CISPR Consol. Ed. 3.0 ( ) at a test distance of 3 meters. This site has been described in reports dated November 1st, 2006, submitted to the FCC, and accepted by letter dated November 28, The site is listed with the FCC and accredited by A2LA (Testing Certificate # ) Immunity Test Facility ESD, EFT, Surge, PQF: These tests are performed in an environmentally controlled room with a 3.7 m x 3.7 m x mm thick aluminum floor connected to PE ground. For ESD testing, tabletop equipment is placed on an insulated mat with a surface resistivity of 10 9 Ohms/square on a 1.6 m x 0.8 m x 0.8 m high non-conductive table with a mm aluminum top (Horizontal Coupling Plane). The HCP is connected to the main ground plane via a low impedance ground strap through two 470 k resistors. The Vertical Coupling Plane consists of an aluminum plate 50 cm x 50 cm x mm thick. The VCP is connected to the main ground plane via a low impedance ground strap through two 470 k resistors. For each of the other tests, the HCP is removed. RF Field Immunity testing is performed in a 10m semi-anechoic chamber with absorber added to floor. RF Conducted and Magnetic Field Immunity testing is performed on a 4.9 m x 3.7 m x mm thick aluminum ground plane which is connected to one end of the anechoic chamber. All test areas allow a minimum distance of 1 meter from the EUT to walls or conducting objects.

11 Page 11 of EMC Software - Pleasanton Manufacturer Name Version Test Type ETS-Lindgren TILE 4.0.A.5 Radiated & Conducted Emissions EMISoft Vasona 5.0 Radiated & Conducted Emissions Agilent Agilent MXE A Radiated & Conducted Emissions ETS-Lindgren TILE 3.4.K.14 Radiated & Conducted Immunity Thermo Electron - EFT/Surge/Voltage CEWare Keytek Dips & Interrupt Voltech IEC RC2 Harmonic & Flicker

12 Page 12 of Measurement Uncertainty Two types of measurement uncertainty are expressed in this report, per ISO Guide To The Expression Of Uncertainty In Measurement, 1 st Edition, The Combined Standard Uncertainty is the standard uncertainty of the result of a measurement when that result is obtained from the values of a number of other quantities, equal to the positive square root of a sum of terms, the terms being the variances or co-variances of these other quantities weighted according to how the measurement result varies with changes in these quantities. The term standard uncertainty is the result of a measurement expressed as a standard deviation. The Expanded Uncertainty defines an interval about the result of a measurement that may be expected to encompass a large fraction of the distribution of values that could reasonably be attributed to the measurand. The fraction may be viewed as the coverage probability or level of confidence of the interval Sample Calculation radiated & conducted emissions The field strength is calculated by subtracting the Amplifier Gain and adding the Cable Loss and Antenna Correction Factor to the measured reading. The basic equation is as follows: Field Strength (db V/m) = RAW - AMP + CBL + ACF Where: RAW = Measured level before correction (db V) AMP = Amplifier Gain (db) CBL = Cable Loss (db) ACF = Antenna Correction Factor (db/m) db V / m V/m = Sample radiated emissions 30 MHz Measurement +Antenna Factor Amplifier Gain+Cable loss=radiated Emissions (dbuv/m) 25 dbuv/m db 20 db db = 23.5 dbuv/m

13 Page 13 of Measurement Uncertainty Emissions Per CISPR U lab U cispr Radiated 10 meters 30 1,000 MHz 2.25 db 4.51 db Radiated 3 meters 30 1,000 MHz 2.26 db 4.52 db 1 6 GHz 2.12 db 4.25 db 6 18 GHz 2.47 db 4.93 db Conducted Mains Terminals 150 khz 30 MHz 1.09 db 2.18 db Disturbance Power Voltech PM6000A The estimated combined standard uncertainty for harmonic current and flicker measurements is ± 5.0%. Per CISPR Measurement Uncertainty Immunity The estimated expanded uncertainty for ESD immunity measurements is ± 8.2%. Per IEC The estimated expanded uncertainty for radiated immunity measurements is ± 4.10 db. The estimated expanded uncertainty for EFT fast transient immunity measurements is ± 5.84%. The estimated expanded uncertainty for surge immunity measurements is ± 5.84 %. The estimated expanded uncertainty for conducted immunity measurements with CDN is ± 3.66 db The estimated expanded uncertainty for power frequency magnetic field immunity is ± 11.6%. Per IEC Per IEC Per IEC Per IEC Per IEC The estimated expanded uncertainty for voltage variation and interruption Per IEC measurements is ± 3.48%. The expanded uncertainty at a level of 95% confidence is obtained by multiplying the combined standard uncertainty by a coverage factor of 2. Compliance criteria are not based on measurement uncertainty. 2.4 Calibration Traceability All measurement instrumentation is traceable to the National Institute of Standards and Technology (NIST). Measurement method complies with ANSI/NCSL Z and ISO Standard 17025:2005. Equipment calibration records are kept on file at the test facility.

14 Page 14 of Measurement Equipment Used Pleasanton Equipment Manufacturer Model # Serial/Inst # Last Cal mm/dd/yy Next Cal mm/dd/yy Test EMI Receiver Agilent N9038A MY /26/ /26/2017 RE 100 khz 1GHz Preamp Sonoma Instruments /18/ /18/2017 RE 1 18 GHz Preamp MITEQ TTA HG /20/ /20/2017 RE Bilog Antenna Sunol Sciences JB3 A /15/ /15/2017 RE Horn Antenna EMCO /08/ /08/2016 RE EMI Receiver Rohde & Schwarz ESI /005 01/19/ /19/2017 CE L.I.S.N. Com-Power LI /20/ /20/2017 CE Transient Limiter HP 11947A 3107A /19/ /19/2017 CE Signal Generator Anritsu MG3694A /19/ /19/2017 RI Bilog Antenna EMCO NCR NCR RI DRG Horn Antenna AH Systems SAS NCR NCR RI Wide Band Amplifier System Wide Band Amplifier System IFI SMX5005 K NCR NCR RI Amplifier Research 60S1G NCR NCR RI RF Power Meter HP E4418B MY /20/ /20/2017 RI Power Sensor HP 8481A US /20/ /20/2017 RI Field Probe Holaday HI /20/ /20/2016 RI Signal Generator HP 8656B 26304A /18/ /18/2017 CI RF Power Amplifier IFI 404P A NCR NCR CI Directional Coupler Werlatone C /19/ /19/2017 CI Coupler-Decoupler Network FCC FCC-801-M3-32A /18/ /18/2017 CI 6 db Attenuator Aeroflex/Weinschel PZ638 01/19/ /19/2017 CI ESD Simulator Schaffner NSG /26/ /26/2017 ESD Surge, EFT, Volt Dips Test Generator Capacitive Coupling Clamp TESEQ NSG /18/ /18/2017 EFT, VDSI Haefely IP /20/ /20/2017 EFT Magnetic field generator FCC F G CBU VBU MF Mag Field Immunity Loop FCC F /9/10-L- 1M CBU VBU MF E-Field Meter LakeShore /12/ /12/2016 MF

15 Page 15 of 85 Note: CE=Conducted Emissions, CI=Conducted Immunity, DP=Disturbance Power, EFT=Electrical Fast Transients, ESD=Electrostatic Discharge, FLI=Flicker, HAR=Harmonics, MF=Magnetic Field Immunity, NCR=No Calibration Required, RE=Radiated Emissions, RI=Radiated Immunity, SI=Surge Immunity, VDSI=Voltage Dips and Short Interruptions 3 Product Information 3.1 Product Description See Section Equipment Modifications No modifications were needed to bring product into compliance. 3.3 Test Plan The EUT product information, test configuration, mode of operation, test types, test procedures, test levels, pass/failure criteria, in this report were carried out per the product test plan located in Appendix A of this report.

16 Page 16 of 85 Figure 1 - External Photo of EUT Front

17 Page 17 of 85 Figure 2 - External Photo of EUT Back

18 4 Emissions Page 18 of Radiated Emissions This test measures the electromagnetic levels of spurious signals generated by the EUT that radiated from the EUT and may affect the performance of other nearby electronic equipment Overview of Test Results Complies (as tested per this report) Test Dates August 25, 2016 Standard EN 55011:2009+A1:2010, CISPR 11:2009+A1:2010, FCC Part 15 Subpart B:2015, ICES-003:2014 Model Number Einstein Rev E Serial # None Configuration Test Setup EUT Powered By Environmental Conditions Frequency Range See test plan for details. Tested in the 5-meter chamber, placed on turntable: see test plan for details. 230 Vac, 50 Hz August 25, 2016 Temp 19º C Humidity 45% Pressure 1008 mbar 30 MHz 18 GHz Perf. Criteria Class A Perf. Verification Readings Under Limit Mod. to EUT None Test Performed By Eddie Marsical Test Procedure Radiated emissions tests were performed using the procedures of ANSI C63.4:2014 including methods for signal maximizations and EUT configuration. The photos included with the report show the EUT in its maximized configuration. The frequency range from 30 MHz 12.5 GHz was investigated for radiated emissions Deviations There were no deviations from the test methodology listed in the test plan for the radiated emission test Final Test All final radiated emissions measurements were below the specification limits.

19 4.1.5 Plots Page 19 of 85 NOTES: Radiated Emissions Full Scan MHz Vertical / Horizontal

20 Page 20 of 85 NOTES: Radiated Emissions Full Scan No Extension GHz Vertical / Horizontal

21 Page 21 of Final Tabulated Data MHz Freq Raw Cable Level Meas Hgt Azt Limit Margin AF db Pol MHz dbuv Loss dbuv/m Type cm Deg dbuv/m db QP V QP V QP V QP V QP H QP H Final Tabulated Data GHz No Extension Freq Raw Cable Level Meas Hgt Azt Limit Margin AF db Pol MHz dbuv Loss dbuv/m Type cm Deg dbuv/m db Peak V Peak V Peak V Peak H Ave V Ave V Ave V Ave H

22 4.1.8 Photos Page 22 of 85 Figure 3 - Radiated Emissions Test Setup MHz - Front

23 Page 23 of 85 Figure 4 - Radiated Emissions Test Setup MHz - Back

24 Page 24 of 85 Figure 5 - Radiated Emissions Test Setup above 1 GHz - Front

25 Page 25 of 85 Figure 6 - Radiated Emissions Test Setup above 1 GHz - Back

26 Page 26 of Conducted Emissions This test measures the electromagnetic levels of spurious signals generated by the EUT on the AC power line that may affect the performance of other nearby electronic equipment Overview of Test Results Complies (as tested per this report) Test Date Juy 27, 2016 Standard EN 55011:2009+A1:2010, CISPR 11:2009+A1:2010, FCC Part 15 Subpart B:2015, ICES-003:2014 Model Number Einstein Rev E Serial # None Configuration Test Setup EUT Powered By Environmental Conditions Frequency Range See test plan for details. Tested in Lab 5, EUT placed on table: see test plan for details. 120 Vac, 60 Hz, 230 Vac, 50 Hz Juy 27, 2016 Temp 22º C Humidity 41% Pressure 1001 mbar Class A 150 khz - 30 MHz Perf. Criteria Class A Perf. Verification Readings Under Limit for L1 & Neutral Mod. to EUT None Test Performed By Eddie Marsical Test Procedure Conducted emissions tests were performed using the procedures of ANSI C63.4:2014 including methods for signal maximizations and EUT configuration. The photos included with the report show the EUT in its maximized configuration. The frequency range from Class A 150 khz - 30 MHz was investigated for conducted emissions. Conducted Emissions measurements were performed in the shielded room using procedures specified in the test plan and standard Deviations There were no deviations from the test methodology listed in the test plan for the conducted emission test Final Test All final conducted emissions measurements were below the specification limits.

27 4.2.5 Plots Page 27 of 85 NOTES: Conducted 120 Vac/60 Hz Line / Neutral Line Neutral

28 NOTES: Conducted 230 Vac/50 Hz Line / Neutral Page 28 of 85 Line Neutral

29 Page 29 of Final Tabulated Data at 120 Vac, 60 Hz Line Freq Raw Cable Factors Level Meas Limit Margin Line MHz dbuv Loss db dbuv Type dbuv db QP Live QP Live QP Live QP Live QP Live QP Live QP Live QP Live QP Live QP Live Ave Live Ave Live Ave Live Ave Live Ave Live Ave Live Ave Live Ave Live Ave Live Ave Live Neutral Freq Raw Cable Factors Level Meas Limit Margin Line MHz dbuv Loss db dbuv Type dbuv db QP Neutral QP Neutral QP Neutral QP Neutral QP Neutral QP Neutral Ave Neutral Ave Neutral Ave Neutral Ave Neutral Ave Neutral Ave Neutral

30 Page 30 of Final Tabulated Data at 230 Vac, 50 Hz Line Freq Raw Cable Factors Level Meas Limit Margin Line MHz dbuv Loss db dbuv Type dbuv db QP Live QP Live QP Live QP Live QP Live QP Live QP Live QP Live QP Live QP Live QP Live QP Live Ave Live Ave Live Ave Live Ave Live Ave Live Ave Live Ave Live Ave Live Ave Live Ave Live Ave Live Ave Live Neutral Freq Raw Cable Factors Level Meas Limit Margin Line MHz dbuv Loss db dbuv Type dbuv db QP Neutral QP Neutral QP Neutral QP Neutral QP Neutral QP Neutral Ave Neutral Ave Neutral Ave Neutral Ave Neutral Ave Neutral Ave Neutral

31 4.2.8 Photos Page 31 of 85 Figure 7 - Conducted Emissions Test Setup - Front

32 Page 32 of 85 Figure 8 - Conducted Emissions Test Setup - Back

33 5 Immunity Page 33 of Electrostatic Discharge (ESD) This test is concerned with the EUT performance when subjected to electrostatic events from operator directly and to adjacent objects Test Overview Results Complies (as tested per this report) Test Date August 29, 2016 Standard IEC :2008, EN :2009 Model Number Einstein Rev E Serial # None Configuration Test Setup EUT Powered By Environmental Conditions See test plan for details. Tested in Lab 5, EUT placed on table: see test plan for details. 230 Vac, 50 Hz August 29, 2016 Temp 24º C Humidity 44% Pressure 1010 mbar Air Discharges ±8 kv Contact Discharges ±4 kv HCP Discharges ±4 kv VCP Discharges ±4 kv Perf. Criteria B Perf. Verification See test plan Mod to EUT None Test Performed By Kyle Germano Test Procedure Discharges were made to each of the points shown in the photograph section of this report. Ten of each polarity was made to each point specified. Test voltages were also applied using the Vertical Coupling Plane (VCP) and Horizontal Coupling Plane (HCP). Air discharge areas are shown in the photographs as A and Contact discharge points are shown as C. The results are shown in the following table. Contact Discharge Air Discharge Acceptable Climatic Conditions (Air Discharge) Relative Humidity 30% to 60% Deviations There were no deviations from the test methodology listed in the test plan for the Electrostatic Discharge (ESD) Immunity test Final Test C The EUT met the performance criteria requirement as specified in the test plan of this report and in the standards. A

34 Page 34 of Final Data Type of Discharge: AD = Air Discharge CD = Contact Discharge VCP = Vertical Coupling Plane HCP = Horizontal Coupling Plane Voltage: ±2 kv Performance Criteria Voltage: ±4 kv Voltage: ±6 kv Voltage: ±8 kv Test Result: Complies or Not Compliant AD NDP NDP NR NDP Complies CD NDP NDP NR NR Complies VCP NDP NDP NR NR Complies HCP NDP NDP NR NR Complies NDP = No degradation of performance observed DP-X = Degradation of performance to Criteria X. NR = Not Required NT = Not Tested

35 5.1.7 Photos Page 35 of 85 Figure 9 - Electrostatic Discharge Immunity (ESD) Test Setup

36 Page 36 of 85 Figure 10 - Electrostatic Discharge Immunity (ESD) Top

37 Page 37 of 85 Figure 11 - Electrostatic Discharge Immunity (ESD) Bottom

38 Page 38 of 85 Figure 12 - Electrostatic Discharge Immunity (ESD) Front

39 Page 39 of 85 Figure 13 - Electrostatic Discharge Immunity (ESD) Back

40 Page 40 of 85 Figure 14 - Electrostatic Discharge Immunity (ESD) Sensors

41 Page 41 of Radiated Immunity This test is to evaluate the performance of the EUT when subjected to radiated electromagnetic fields Test Overview Results Complies (as tested per this report) Test Date August 29, 2016 Standard IEC :2006/A1:2008/A2:2010, EN :2006/A1:2008/A2:2010 Model Number Einstein Rev E Serial # None Configuration Test Setup EUT Powered By Environmental Conditions See test plan for details. Tested in 3-meter Chamber, EUT placed on table: see test plan for details. 230 Vac, 50 Hz August 29, 2016 Temp 23º C Humidity 45% Pressure 1009 mbar Frequency Range MHz Level 10 V/m Frequency Range MHz Level 3V/m Modulation 80%, 1 khz, AM Orientations 0, 90, 180, 270 Step Size 1% Dwell 3 Sec Perf. Criteria A Perf. Verification See test plan Mod to EUT None Test Performed By Eddie Marsical Test Procedure Testing was performed according to the test plan. The EUT was placed on a wooden table 3 meters from the field-generating antenna. The field strength was set prior to placing the EUT in the chamber at the specified level with no modulation applied. The isotropic field probe was placed adjacent to the EUT to monitor the presence of field during the test. The tests were performed in 1% steps, from MHz for each of vertical and horizontal polarizations. The test was performed by rotating the table in the clockwise direction in successive steps of 90, subsequent exposures being designated as 0º, 90, 180 and Acceptable Climatic Conditions Unless otherwise specified by the committee responsible for the generic or product standard, the climatic conditions in the laboratory shall be within any limits specified for the operation of the EUT and the test equipment by their respective manufacturers. Tests shall not be performed if the relative humidity is so high as to cause condensation on the EUT or the test equipment Deviations There were no deviations from the test methodology listed in the test plan for the Radiated Immunity test.

42 Page 42 of Final Test The EUT met the performance criteria requirement as specified in the test plan of this report and in the standards Final Data EUT Side Antenna Polarization Horizontal (H) or Vertical (V) Performance Criteria Test Result: Complies or Not Compliant Front H NDP Complies Front V NDP Complies Rear H NDP Complies Rear V NDP Complies Right H NDP Complies Right V NDP Complies Left H NDP Complies Left V NDP Complies NDP = No degradation of performance observed DP-X = Degradation of performance to criteria X. NT = Not Tested

43 5.2.7 Photos Page 43 of 85 Figure 15 - Radiated Immunity Test Setup MHz

44 Page 44 of 85 Figure 16 - Radiated Immunity Test Setup above 1 GHz

45 Page 45 of Electrical Fast Transient / Burst (EFT) This test is to evaluate the performance of the EUT when subjected to repetitive fast transients (bursts) on the power and interconnecting lines Test Overview Results Complies (as tested per this report) Test Date August 26, 2016 Standard IEC : 2004+A1:2010, EN :2004+A1:2010 Model Number Einstein Rev E Serial # None Configuration Test Setup EUT Powered By Environmental Conditions See test plan for details. Tested in Lab 5, see test plans for details. 230 Vac, 50 Hz August 26, 2016 Temp 22º C Humidity 41% Pressure 1001 mbar Level on AC ±2 kv Level on I/O ±1 kv Burst Duration 15 ms Test Duration 1 Min Burst Period 300 ms Repetition Rate 5 khz Perf. Criteria B Perf. Verification See test plan Mod to EUT None Test Performed By Eddie Marsical Test Procedure AC Mains: The test voltage was applied to the AC Mains of the EUT. Test voltages were applied for 1 minute each for positive and negative polarities. The test voltages were applied at ±2 kv between the AC terminals and Ground Reference Plane. I/O Lines: The test voltage was applied to the I/O lines of the EUT. Test voltages were applied for 1 minute each for positive and negative polarities. The test voltages were applied at ±1 kv applied on the I/O cables via a capacitive coupling clamp Acceptable Climatic Conditions Unless otherwise specified by the committee responsible for the generic or product standard, the climatic conditions in the laboratory shall be within any limits specified for the operation of the EUT and the test equipment by their respective manufacturers. Tests shall not be performed if the relative humidity is so high as to cause condensation on the EUT or the test equipment Deviations There were no deviations from the test methodology listed in the test plan for the Electrical Fast Transients (EFT) Immunity test.

46 5.3.5 Final Test Page 46 of 85 The EUT met the performance criteria requirement as specified in the test plan of this report and in the standards Final Data of Electrical Fast Transients (EFT) AC Power Mains Point of application Coupling Method Performance Criteria Test Result: Complies or Not Compliant AC Mains Mains NDP Complies Note: On L2 at +2kV EUT reset itself after test. No other disturbances observed NDP = No degradation of performance observed DP-X = Degradation of performance to criteria X. NT = Not Tested Final Data of Electrical Fast Transients (EFT) I/O Cables Point of application Coupling Method Performance Criteria Test Result: Complies or Not Compliant Ethernet Port Clamp NDP Complies Note: None NDP = No degradation of performance observed DP-X = Degradation of performance to criteria X. NT = Not Tested

47 5.3.8 Photos Page 47 of 85 Figure 17 - Electrical Fast Transients (EFT) Immunity Test Setup, AC Mains - Front

48 Page 48 of 85 Figure 18 - Electrical Fast Transients (EFT) Immunity Test Setup, AC Mains Back

49 Page 49 of 85 Figure 19 - Electrical Fast Transients (EFT) Immunity Test Setup, I/O - Front

50 Page 50 of 85 Figure 20 - Electrical Fast Transients (EFT) Immunity Test Setup, I/O - Back

51 Page 51 of Surge Immunity This test is to evaluate the performance of the EUT when subjected to high-energy disturbances on the power and interconnecting lines Test Overview Results Complies (as tested per this report) Test Date August 26, 2016 Standard IEC :2005, EN :2006 Model Number Einstein Rev E Serial # None Configuration Test Setup EUT Powered By Environmental Conditions Level on AC See test plan for details. Tested in Lab 5, see test plan for details. 230 Vac, 50 Hz August 26, 2016 Temp 22º C Humidity 41% Pressure 1001 mbar CM: N/A DM: ±1 kv T1 / T2 (OC) 1.2 s / 50 s Level on I/O N/A Number of Tests 5 per level / voltage / phase Source Z on AC 2Ω L-L, 12Ω L-G Repetition Rate 1 per Minute Source Z on I/O 40 Ω Phase Angle(s) (AC) 0º, 90º, 180º, 270º Perf. Criteria B Perf. Verification See test plan Mod to EUT None Test Performed By Eddie Marsical Test Procedure AC Mains: Test voltages were applied at 1 minute intervals for positive and negative polarities. Pulses on the AC mains line were synchronized to the 0, 90, 180, and 270 degree points. Testing was performed at ±1 kv AC Differential Mode with surges coupled between L1 and L2 and at with surges coupled N/A AC Common Mode between each line and ground. A minimum of 5 surges of each polarity was applied. Lines: Test voltages were not applied to I/O lines (none met length or installation criteria for testing) Acceptable Climatic Conditions Unless otherwise specified by the committee responsible for the generic or product standard, the climatic conditions in the laboratory shall be within any limits specified for the operation of the EUT and the test equipment by their respective manufacturers. Tests shall not be performed if the relative humidity is so high as to cause condensation on the EUT or the test equipment.

52 Page 52 of Deviations There were no deviations from the test methodology listed in the test plan for the Surge Immunity test Final Test The EUT met the performance criteria requirement as specified in the test plan of this report and in the standards Final Data of Surge on AC Power Mains Coupling Point Level Performance Criteria Test Result: Complies or Not Compliant L1, L2 ±1 kv NDP Complies L1, PE N/A NDP Complies L2, PE N/A NDP Complies Note: None NDP = No degradation of performance observed DP-X = Degradation of performance to criteria X. NT = Not Tested

53 5.4.7 Photos Page 53 of 85 Figure 21 - Surge Immunity Test Setup, AC Mains - Front

54 Page 54 of 85 Figure 22 - Surge Immunity Test Setup, AC Mains - Back

55 Page 55 of Conducted Immunity This test is to evaluate the performance of the EUT when subjected to radio frequencies from intentional transmitters on the power and interconnecting lines Test Overview Results Complies (as tested per this report) Test Date August 25, 2016 Standard IEC :2004/A2:2006, EN :2009 Model Number Einstein Rev E Serial # None Configuration Test Setup EUT Powered By Environmental Conditions See test plan for details. Tested in Lab 5, see test plan for details. 230 Vac, 50 Hz August 25, 2016 Temp 22º C Humidity 41% Pressure 1001 mbar Frequency Range MHz Modulation 80%, 1 khz, AM Level on AC 3 Vrms Level on I/O 3 Vrms Step Size 1% Dwell 3 Sec Perf. Criteria A Perf. Verification See test plan Mod to EUT None Test Performed By Eddie Marsical Test Procedure AC Mains: The EUT was setup and monitored according to the test plan and subjected to 3 Vrms RF level on the AC Mains via CDN-M3 in the frequency range of MHz. I/O Lines: The EUT was setup and monitored according to the test plan and subjected a 3 Vrms level using an injection clamp for I/O cables in the frequency range of MHz Acceptable Climatic Conditions The EUT shall be tested within its intended operating and climatic conditions. The temperature and relative humidity should be recorded in the test report.

56 Page 56 of Deviations There were no deviations from the test methodology listed in the test plan for the Conducted Immunity test Final Test The EUT met the performance criteria requirement as specified in the test plan of this report and in the standards Final Data Point of application Coupling Method Performance Criteria Test Results: Complies or Not Compliant AC Mains CDN NDP Complies I/O Port 1 Injection Clamp NDP Complies NDP = No degradation of performance observed DP-X = Degradation of performance to criteria X. NT = Not Tested

57 5.5.7 Photos Page 57 of 85 Figure 23 - Conducted Immunity Test Setup, AC Mains - Front

58 Page 58 of 85 Figure 24 - Conducted Immunity Test Setup, AC Mains - Side

59 Page 59 of 85 Figure 25 - Conducted Immunity Test Setup, I/O - Front

60 Page 60 of 85 Figure 26 - Conducted Immunity Test Setup, I/O - Back

61 Page 61 of Power Frequency Magnetic Field Immunity This test is to evaluate the performance of the EUT when subjected to magnetic fields at power line frequencies Overview of Test Results Complies (as tested per this report) Test Date August 29, 2016 Standard IEC :2009, EN :2010 Model Number Einstein Rev E Serial # None Configuration Test Setup EUT Powered By Environmental Conditions See test plan for details. Tested in Lab 5, see test plan for details. 230 Vac, 50 Hz 120 Vac, 60 Hz August 29, 2016 Temp 24º C Humidity 44% Pressure 1010 mbar Test Level 30 A/m Frequency 50 Hz and 60 Hz Perf. Criteria A Perf. Verification See test plan Mod to EUT None Test Performed By Kyle Germano Test Procedure The EUT was placed in an induction coil having dimensions of 1m x 1m. The current delivered to the coil was set to an equivalent the test level as indicated on a Magnetic Field Meter. The power was removed from the coil. The EUT was placed at the center of the coil and power was restored. The EUT performance was monitored for a period of 1 minute. This procedure was repeated for 3 different orthogonal orientations of the coil for each of the configurations Acceptable Climatic Conditions Unless otherwise specified by the committee responsible for the generic or product standard, the climatic conditions in the laboratory shall be within any limits specified for the operation of the EUT and the test equipment by their respective manufacturers. Tests shall not be performed if the relative humidity is so high as to cause condensation on the EUT or the test equipment Deviations There were no deviations from the test methodology listed in the test plan for the Power Frequency Magnetic Field Immunity test Final Test The EUT met the performance criteria requirement as specified in the test plan of this report and in the standards.

62 Page 62 of Final Data Orientation Test Level Frequency X - Orientation Y - Orientation 30 A/m 30 A/m 50 Hz and 60 Hz 50 Hz and 60 Hz 50 Hz and Z - Orientation 30 A/m 60 Hz NDP = No degradation of performance observed DP-X = Degradation of performance to criteria X. NT = Not Tested Performance Criteria NDP NDP NDP Test Results: Complies or Not Compliant Complies Complies Complies

63 5.6.7 Photos Page 63 of 85 Figure 27 - Power Frequency Magnetic Field Immunity Test Setup - X-Axis

64 Page 64 of 85 Figure 28 - Power Frequency Magnetic Field Immunity Test Setup - Y-Axis

65 Page 65 of 85 Figure 29 - Power Frequency Magnetic Field Immunity Test Setup - Z-Axis

66 Page 66 of Voltage Dips, Variations, and Short Interruptions This test is to evaluate the performance of the EUT when subjected to voltage dips, short interruptions and voltage variations Overview of Test Results Complies (as tested per this report) Test Date August 29, 2016 Standard IEC :2004, EN :2004 Model Number Einstein Rev E Serial # None Configuration Test Setup EUT Powered By Environmental Conditions Perf. Voltage Dips See test plan for details. Tested in Lab 5, see test plan for details. 230 Vac, 50 Hz August 29, 2016 Temp 24º C Humidity 44% Pressure 1010 mbar 0% During 1 Cycle 40% During 10 Cycles 70% During 25 Cycles Perf. Voltage Interruptions 0% During 250 Cycles Mod to EUT None Test Performed By Kyle Germano Test Procedure The EUT was setup according to the test plan and connected to a dropout/variation simulator and the software was set to perform Voltage Dips, Variations and Interruptions Immunity Test as stated in the Table above Acceptable Climatic Conditions Unless otherwise specified by the committee responsible for the generic or product standard, the climatic conditions in the laboratory shall be within any limits specified for the operation of the EUT and the test equipment by their respective manufacturers. Tests shall not be performed if the relative humidity is so high as to cause condensation on the EUT or the test equipment Deviations There were no deviations from the test methodology listed in the test plan for the Voltage Dips, Variations and Interruptions Immunity test Final Test The EUT met the performance criteria requirement as specified in the test plan of this report and in the standards.

67 Page 67 of Final Data Voltage Dip/Interrupt and Duration Performance Criteria Test Results: Complies or Not Compliant 0% During 1 Cycle NDP Complies 40% During 10 Cycles NDP Complies 40% During 10 Cycles NDP Complies 0% During 250 Cycles NDP Complies NDP = No degradation of performance observed DP-X = Degradation of performance to criteria X. NT = Not Tested

68 5.7.7 Photos Page 68 of 85 Figure 30 - Voltage Dips, Variations and Interruptions Immunity Test Setup

69 Appendix A Page 69 of 85 6 Test Plan This test report is intended to follow the test plan outlined herein unless otherwise stated. The test plan provides product information, reference standards, and testing details. The product information was provided by the client. Test procedure information will reference standards or internal TUV Rheinland NA procedures. 6.1 General Information Client Address Contact Person Verdigris NASA AMES Research Park, Bldg. 19 Moffett Field, CA U.S.A. Jonathan Chu Telephone (408) jon@verdigris.com 6.2 EUT Designation Model Name Model Number Verdigris Einstein Rev E 6.3 EUT Description Electricity Demand Management & Response Equipment

70 Page 70 of Equipment Under Test (EUT) Description Verdigris Rev E (Einstein) Energy Monitoring System. EUT has previously been certified, and is being retested with a PCBA modified with on-board wifi chipset, replacing the wifi dongle and associated flex cables. Concurrently testing an alternate/optional LTE Dongle Huawei E3276s-150. EUT was originally tested with Novatel U620L LTE Dongle. Either LTE dongle may be included in the EUT for use on different LTE bands. 6.5 Product Environment(s) Domestic/Residential Hospital Light Industrial/Commercial Small Clinic Industrial Doctor s office Telecommunications Center Other than Telecommunications Center Other *Check all that apply

71 6.6 Applicable Documents Page 71 of 85 Standards EN :2013 Product Family Standard Emissions EN :2013 Product Family Standard Immunity EN 55011:2009+A1:2010, CISPR 11:2009+A1:2010, FCC Part 15 Subpart B:2015, ICES-003:2014 EN 55011:2009+A1:2010, CISPR 11:2009+A1:2010, FCC Part 15 Subpart B:2015, ICES-003:2014 IEC :2006/A1:2009/A2:2009, EN :2006/A1:2009/A2:2009 IEC :2008, EN :2008 IEC :2008, EN :2009 Basic test standard IEC :2006/A1:2008/A2:2010, EN :2006/A1:2008/A2:2010 Basic test standard IEC : 2004+A1:2010, EN :2004+A1:2010 Basic test standard IEC :2005, EN :2006 Basic test standard IEC :2004/A2:2006, EN :2009 Basic test standard IEC :2009, EN :2010 Basic test standard IEC :2004, EN :2004 Basic test standard Description Information Technology Equipment Radio Disturbance Information Technology Equipment Immunity Radiated Emissions Conducted Emissions Power Harmonics Voltage Fluctuation Electrostatic Discharge Immunity Radiated Electromagnetic Field Immunity Electrical Fast Transient /Burst Immunity Surge Immunity Conducted Immunity Power Frequency Magnetic Field Immunity test. Voltage Dips Voltage Interruptions

72 Page 72 of EUT Electrical Power Information Name # of Phases Type Input Voltage Min Max AC Voltage Frequency Current Max. Voltage Terminal 1 3 None AC DC Host Batteries Hz to 60 Hz 0.3 A Notes 6.8 EUT Clock/Oscillator Frequencies Reference Designation Speed (MHz) Type WiFi Radio Oscillator Microprocessor Oscillator Microprocessor Oscillator Microprocessor Radiated Emissions, Upper Frequency Less than 108 MHz Scan to 1 GHz Less than 500 MHz Scan to 2 GHz Less than 1000 MHz Scan to 5 GHz Greater than 1000 MHz Scan to 5 th Harmonic or 40 GHz (whichever is lower)

73 Page 73 of Electrical Support Equipment Reference Designation Manufacturer Model Serial Number Laptop PC DELL LATITUDE D630 3FF4GH1 PS DELL LA90PS0-00 N/A Wireless Router ASUS RT-N56U BCIAGC AC Adapter ASUS EXA1004UH OA CT Verdigris Einstein NONE GIM Verdigris Einstein NONE 6.10 Non - Electrical Support Equipment Reference Designation Manufacturer Model Serial Number or Description (e.g., Type of Gas or Liquid) 6.11 EUT Equipment/Cabling Information NONE Cable Type EUT Port Connected To Length (Meters) Shielded Yes / No Bead Yes / No Voltage Terminal Power Socket, V, hz 1

74 Page 74 of EUT Test Program Verdigris Einstein global EMC certification. We will be testing the functional unintentional radiated and conducted emissions for the Einstein revision of our Verdigris hardware platform EUT Modes of Operation The EUT will be in data streaming mode only. The attached Current Transformers and Generic Interface Models will be active and streaming data back to the base unit. As a result, the 4Mhz SPI channels will be fully saturated. In addition, the base compute unit will be running a software routine designed to activate activity in the CPU and memory subsystems. There is just one mode of operation for this test 6.14 Monitoring of EUT during Testing We will be monitoring our device via video camera. Measurement counts will be recorded before and after the test to ensure full functional operation during the test EUT Configuration Description Notes Configuration Functional Shielded All configurations are the same except as noted above Description 100% CPU Active, fully saturated SPI chain. 100% CPU Active, fully saturated SPI chain, shielded compute board.