HCF4511B BCD TO SEVEN SEGMENT LATCH/DECODER/DRIVER

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Sabrina Greene
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1 BCD TO SEEN SEGMENT LATCH/DECODER/DRIER HIGH OUTPUT SOURCING CAPABILITY (up to 25mA). INPUT LATCHES FOR BCD CODE STORAGE LAMP TEST AND BLANKING CAPABILITY. 7-SEGMENT OUTPUTS BLANKED FOR BCD INPUT CODES > 1001 QUIESCENT CURRENT SPECIF. UP TO 20 STANDARDIZED SYMMETRICAL OUTPUT CHARACTERISTICS 5, 10, AND 15 PARAMETRIC RATINGS INPUT LEAKAGE CURRENT I I = 100nA (MAX) AT DD = 18 T A = 25 C 100% TESTED FOR QUIESCENT CURRENT MEETS ALL REQUIREMENTS OF JEDEC JESD13B "STANDARD SPECIFICATIONS FOR DESCRIPTION OF B SERIES CMOS DEICES" DESCRIPTION HCF4511B is a monolithic integrated circuit fabricated in Metal Oxide Semiconductor technology available in DIP and SOP packages. HCF4511B is a BCD to 7 segment decoder driver made up of CMOS logic and n-p-n bipolar traistor output devices on a single monolithic structure. This device combines the low quiescent DIP ORDER CODES SOP PACKAGE TUBE T & R DIP HCF4511BEY SOP HCF4511BM1 HCF4511M013TR power dissipation and high noise immunity features of CMOS with n-p-n bipolar output traistor capable of sourcing up to 25mA. This capability allows HCF4511B to drive LEDs and other displays directly. Lamp Test (LT), Blanking (BL), and Latch Enable or Strobe inputs are provided to test the display, shut off or inteity-modulate it, and store or strobe a BCD code, respectively. Several different signals may be multiplexed and displayed when external multiplexing circuitry is used. PIN CONNECTION October /13

2 INPUT EQUIALENT CIRCUIT PIN DESCRIPTION PIN No SYMBOL NAME AND FUNCTION 7, 1, 2, 6 A, B, C, D Bcd Inputs 13, 12, 11, 10, 9, 15, 14 a to g 7-Segment Outputs 3 LT Lamp Test Input 4 BL Blanking Input 5 Latch Enable or Strobe LE/STROBE Input 8 SS Negative Supply oltage 16 DD Positive Supply oltage FUNCTIONAL DIAGRAM 2/13

3 LOGIC DIAGRAM TRUTH TABLE LE BL LT D C B A a b c d e f g DISPLAY X X L X X X X H H H H H H H 8 X L H X X X X L L L L L L L Blank L H H L L L L H H H H H H L 0 L H H L L L H L H H L L L L 1 L H H L L H L H H L H H L H 2 L H H L L H H H H H H L L H 3 L H H L H L L L H H L L H H 4 L H H L H L H H L H H L H H 5 L H H L H H L L L H H H H H 6 L H H L H H H H H H L L L L 7 L H H H L L L H H H H H H H 8 L H H H L L H H H H L L H H 9 L H H H L H L L L L L L L L Blank L H H H L H H L L L L L L L Blank L H H H H L L L L L L L L L Blank L H H H H L H L L L L L L L Blank L H H H H H L L L L L L L L Blank L H H H H H H L L L L L L L Blank H H H X X X X * * X: Don t Care 3/13

4 ABSOLUTE MAXIMUM RATINGS Symbol Parameter alue Unit DD Supply oltage -0.5 to +22 I DC Input oltage -0.5 to DD I I DC Input Current ± 10 ma P D Power Dissipation per Package 200 mw Power Dissipation per Output Traistor 100 mw T op Operating Temperature -55 to +125 C T stg Storage Temperature -65 to +150 C Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditio is not implied. All voltage values are referred to SS pin voltage. RECOMMENDED OPERATING CONDITIONS Symbol Parameter alue Unit DD Supply oltage 3 to 20 I Input oltage 0 to DD T op Operating Temperature -55 to 125 C 4/13

5 DC SPECIFICATIONS Test Condition alue Symbol Parameter I () O () I O (µa) The Noise Margin for both "1" and "0" level is: 1 min. with DD =5, 2 min. with DD =10, 2.5 min. with DD =15 DD () T A = 25 C -40 to 85 C -55 to 125 C Min. Typ. Max. Min. Max. Min. Max. I L Quiescent Current 0/ OH OL IH IL OH I OL I I C I High Level Output oltage Low Level Output oltage High Level Input oltage Low Level Input oltage Output Drive oltage Output Sink Current Input Leakage Current (any input) Input Capacitance (any input) 0/ / / / / / / / / / / / / / / / / / /18 18 ±10-5 ±0.1 ±1 ±1 µa Unit µa ma pf 5/13

6 DYNAMIC ELECTRICAL CHARACTERISTICS (T amb = 25 C, C L = 50pF, R L = 200KΩ, t r = t f = 20 ) Symbol t PHL t PLH t PHL t PLH t PHL Parameter Propagation Delay Time (DATA) Propagation Delay Time (DATA) Propagation Delay Time (BL) Propagation Delay Time (BL) Propagation Delay Time (LT) DD () (*) Typical temperature coefficient for all DD value is 0.3 %/ C. TEST CONDITION alue (*) Unit Min. Typ. Max t PLH Propagation Delay Time (LT) t TLH Traition Time t THL Traition Time t setup Setup Time t hold Hold Time t W Strobe Pulse Width /13

7 TYPICAL APPLICATIONS (Interfacing with various displays) Driving Common-cathode 7 Segment Led Displays Driving Low-voltage Fluorescent Displays Driving Incandescent Displays A medium-brightness inteity display can be obtained with low-voltage fluorescent displays such as the Tung-Sot Digivac S/G series 2 Of 7 Segment Shown Connected Resistor R from DD DD to each 7-segment driver output are chosen to keep all Numitron segments slightly on and warm 7/13

8 TEST CIRCUIT C L = 50pF or equivalent (includes jig and probe capacitance) R L = 200KΩ R T = Z OUT of pulse generator (typically 50Ω) WAEFORM 1 : PROPAGATION DELAY TIMES (f=1mhz; 50% duty cycle) 8/13

9 WAEFORM 2 : MINIMUM PULSE WIDTH (f=1mhz; 50% duty cycle) WAEFORM 3 : PROPAGATION DELAY TIMES (f=1mhz; 50% duty cycle) 9/13

10 WAEFORM 4 : PROPAGATION DELAY TIMES (f=1mhz; 50% duty cycle) WAEFORM 5 : MINIMUM SETUP AND HOLD TIME (f=1mhz; 50% duty cycle) 10/13

11 Plastic DIP-16 (0.25) MECHANICAL DATA DIM. mm. inch MIN. TYP MAX. MIN. TYP. MAX. a B b b D E e e F I L Z P001C 11/13

12 SO-16 MECHANICAL DATA DIM. mm. inch MIN. TYP MAX. MIN. TYP. MAX. A a a b b C c1 45 (typ.) D E e e F G L M S 8 (max.) PO13H 12/13

13 Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no respoibility for the coequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No licee is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specificatio mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics. The ST logo is a registered trademark of STMicroelectronics 2002 STMicroelectronics - Printed in Italy - All Rights Reserved STMicroelectronics GROUP OF COMPANIES Australia - Brazil - Canada - China - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan - Malaysia - Malta - Morocco Singapore - Spain - Sweden - Switzerland - United Kingdom - United States. 13/13

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Obsolete Product(s) - Obsolete Product(s) BCD TO SEVEN SEGMENT LATCH/DECODER/DRIVER HIGH OUTPUT SOURCING CAPABILITY (up to 25mA). INPUT LATCHES FOR BCD CODE STORAGE LAMP TEST AND BLANKING CAPABILITY. 7-SEGMENT OUTPUTS BLANKED FOR BCD INPUT CODES