IN SITU BIASING & HEATING SOLUTIONS FOR TEM PLATFORMS
|
|
- Colin Black
- 6 years ago
- Views:
Transcription
1 IN SITU BIASING & HEATING SOLUTIONS FOR TEM PLATFORMS Solutions for In Situ Microscopy THE LIGHTNING SERIES LIGHTNING FEATURES Observe the real-time dynamics of materials under electrical and heating stimuli. Extreme Stability. Sub Ångstrom Resolution. Four-Point-Probe Measurements. Double Tilt.
2 IN SITU TEM WORKFLOW TURN YOUR TEM INTO A NANO-LAB PREPARING THE SAMPLES Samples of all sizes from nanowires to lamellas - are prepared directly onto the Nano-Chip using traditional preparation techniques. The Nano-Chip as a functionalized sample carrier has metal electrodes for applying the biasing stimuli and a metal spiral sandwiched between silicon nitride for applying the heating stimuli to the sample. LOADING THE NANO-CHIP After lifting the 4 or 8 biasing/heating needles at the tip of the holder, the Nano-Chip is easily loaded into the sample holder. The needles are lowered onto the metallic contact pads to enable the accurate and reliable biasing/heating experiments. SETTING THE PARAMETERS Once the holder is connected to the biasing power supply and heating control box, the voltage/current can be set and temperature profile programmed for total control during the in situ experiment. RUNNING IN SITU EXPERIMENT Observing the real-time sample dynamics under a controlled electrical and thermal environment at sub-angstrom resolutions enables researchers to understanding the structure-property relationship and identify new characteristics in a wide range of materials. 2 Lightning Series - In Situ Biasing & Heating Solutions for TEM platforms
3 Solutions for In Situ Microscopy In Situ Biasing & Heating Understanding a materials electrical properties and thermal characteristics requires an in-depth knowledge of its structure-property relationship. Observing the dynamic events in a real-world environment is needed to better determine how to improve, manipulate or miniaturize materials within the microelectronics field. The Lightning Series uses the latest in MEMS based technology Nano-Chips - to scale down the experiment to dramatically improve stability and resolution. Enabling biasing and/or heating, researchers can characterize their materials in complete control of each parameter to allow reproducible results. The unique design of Nano-Chips provides the most reliable and precise results during experiments and maintains the full performance of the TEM. I-V Measurement & Characterization Measuring current voltage (I-V) curves while observing the dynamic events in situ, enables researchers to determine the fundamental performance of a large variety of semiconductor materials. I V characterization of materials at elevated temperatures allows researchers to obtain new information about the relationship between the structure and electrical properties, additionally to its temperature dependence. For example, electrical properties of individual nanowires and the direct correlation to structure will open new application space in nanoelectrics, solar cells and phase change memory technology. Structure Response to Electric Field External electric field induces changes in the domain morphology of ferroelectric materials via polarization switching process. Therefore, direct observation of the structural changes during electrical poling will greatly facilitate the understanding of structure-property relationship of these materials. The Lightning Series enables researchers to understand the microstructural origins for electric field induced phenomena in ferroelectric materials, while at an elevated temperature environment. Failure Analysis Real-time monitoring of the dynamic events of semiconductor materials during electrical biasing at elevated temperature is important for determining the cause of failure and what corrective actions can be taken to improve its properties, and related performance. The Lightning Series allows for imaging the moment of morphology change and failure. I-V MEASUREMENTS ON LAMELLAS I-V MEASUREMENTS ON NANOWIRES ELECTRIC FIELD STUDIES 3
4 Real-Time Dynamics The Lightning Series for in situ basing & heating TEM provides you the power to obtain real-time information about your specimen under a controllable electrical and thermal environment. Investigate the next generation materials with the Lightning Series in order to obtain an indepth knowledge of the structure-property relationship. Key Features of the Lightning Series In situ biasing & heating Capture the real-time dynamics Maintain full TEM performance Control the electrical and thermal environment of your specimen. Analyze the real-time structural evolution of your specimen. Maintain sub-angstrom resolution and obtain quantitative data. Characterize your specimen Fast response time Understand your material Measure the electrical properties of your material and investigate its temperature dependence. Using Nano-Chip technology researchers can obtain instant and controllable response. Discover the relationship between the microstructure, electrical and thermal properties. Complete 'Plug & Play' Package 1. Nano-Chips 2. Lightning holder 3. Holder stand 4. Heating control unit Source measurement unit (Keithley) 6. Laptop with Digiheater software 7 7. Interconnect box Lightning Series - In Situ Biasing & Heating Solutions for TEM platforms
5 Solutions for In Situ Microscopy Nano-Chip Technology The Lightning Nano-Chip is a functional consumable sample carrier that scales down the stimuli environment to the sample size required for biasing/heating. This provides researchers with ability to control the environment with extreme precision around the specimen with fast response and reduced specimen drift. Eight electrical contacts (Lightning D9+) provide an unrivalled solution for scientists, enabling reliable electrical characterization of a wide range of materials at temperatures up to 800 C. Key Features of the Lightning Nano-Chips Optimal stability High resolution Reliable output Unique design for stable, chemically inert and controllable environment. Achieve sub-angstrom resolution under induced stimuli. Four point probe ensures high accuracy. High sensitivity Fast response time Long life-time Detect current in a pa range for maximum control. Metal materials allow instant and controllable response. > 90 hours at elevated temperatures with simultaneous biasing. Lightning Nano-Chip Specifications Control Method 4 or 8 electrical contacts Dedicated Heating Max. Temperature 1300 C Heating & Biasing Max. Temperature 800 C Electric Field DC Measurements AC Measurements Minimum Detectable Current Resolution E-Field experiments I-V measurements on nanowires I-V measurements on FIB lamellas 100 kv/cm 100 V Hz pa range 0.6 Å * Specifications may vary due to experimental parameters. 5
6 Application Fields Ferroelectric Materials Research Studying of Mechanical Fatigue I-V Characterisation of Nanomaterials Low-dimensional Materials Research Resistance Switching Process of the ReRAM Materials Failure Analysis Application Examples 1. In situ TEM Characterization of Electrical Properties of Semiconductor Nanowires In current example, by means of in situ TEM authors monitored a breakdown process of InAs nanowires induced by increased current. It was proposed that breakdown mechanism is based on electromigration of In leading nanowire breakage near the cathode side. Zhang, C., et al. (2015). "In situ electrical characterization of tapered InAs nanowires in a transmission electron microscope with ohmic contacts." Nanotechnology 26(15): In Situ Material Transport during Electromigration The reversible electromigration in Pd Pt nanobridges was investigated by in situ TEM. During electromigration, voids formation occurred at the cathode side with increasing the voltage. Changing the current direction caused the voids to refill and even hillocks to grow on the former cathode side. Kozlova, T., et al. (2013). "In situ TEM and STEM studies of reversible electromigration in thin palladium platinum bridges." Nanotechnology 24(50): Lightning Series - In Situ Biasing & Heating Solutions for TEM platforms
7 Solutions for In Situ Microscopy Performance Specifications FEI COMPATIBLE JEOL COMPATIBLE Stimuli Heating or Biasing Heating or Biasing Heating and Biasing Electrical contacts Four Four Eight Alpha tilt ± 25 Beta tilt ± 25 HRP: ± 20 URP: ± 15 HRP: ± 15 URP: ± 15 HRP: ± 20 URP: ± 8 HRP: ± 15 URP: ± 15 Compatibility (PP) ST, XT, T, BioT UHP, HRP, HTP, CRP, HCP Tilt control From microscope From additional beta control unit High Resolution TEM (HR) STEM + EELS/EDX Environmental TEM Tomography EFTEM * Specifications are dependent on microscope and sample quality, listed as maximum possibility. 7
8 Visit our website For more information, visit Request a quote your details to Quote@DENSsolutions.com Main Office DENSsolutions Informaticalaan ZD Delft The Netherlands info@denssolutions.com Distributors Austria LOT-QuantumDesign GmbH lotqd_de@denssolutions.com Argentina Canada Angstrom Scientific, Inc. angstromscientific@denssolutions.com Chile China North KYKY Technology Co., Ltd kyky@denssolutions.com China South DENS ALTA Technologies Ltd. DENSalta@DENSsolutions.com Colombia Ecuador France LOT-QuantumDesign lotqd_fr@denssolutions.com Germany LOT-QuantumDesign GmbH lotqd_de@denssolutions.com Israel Eisenberg Bros. Ltd eisenbergbros@denssolutions.com Japan TSL Solutions tsljapan@denssolutions.com Mexico Nordic countries BoRAS boras@denssolutions.com Peru Russia & CIS Systems for microscopy and analysis cma@denssolutions.com South-Korea NAMOTEC namotec@denssolutions.com Switzerland LOT-QuantumDesign GmbH lotqd_de@denssolutions.com Taiwan DENS ALTA Technologies Ltd. DENSalta@DENSsolutions.com United Kingdom and Ireland LOT-QuantumDesign UK lotqd_uk@denssolutions.com United States of America Angstrom Scientific, Inc. angstromscientific@denssolutions.com Other countries DENSsolutions info@denssolutions.com Australia AXT Pty Ltd info@axt.com.au Copyright 2015 DENSsolutions B.V. All rights reserved. Unless otherwise indicated, all materials on these pages are copyrighted by DENSsolutions B.V. All rights reserved. No part of these pages, either text or image may be used for any purpose other than personal use. Therefore, reproduction, modification, storage in a retrieval system or retransmission, in any form or by any means, electronic, mechanical or otherwise, for reasons other than personal use, is strictly prohibited without prior written permission.
KickStart Instrument Control Software Datasheet
KickStart Instrument Control Software Datasheet Key Features Built-in I-V characterizer, datalogger, and precision DC power applications Optional high resistivity measurement application that complies
More informationKeysight Technologies Scanning Microwave Microscope Mode. Application Note
Keysight Technologies Scanning Microwave Microscope Mode Application Note Introduction Measuring electromagnetic properties of materials can provide insight into applications in many areas of science and
More informationAutomated Frequency Response Measurement with AFG31000, MDO3000 and TekBench Instrument Control Software APPLICATION NOTE
Automated Frequency Response Measurement with AFG31000, MDO3000 and TekBench Instrument Control Software Introduction For undergraduate students in colleges and universities, frequency response testing
More informationMeasuring Vgs on Wide Bandgap Semiconductors APPLICATION NOTE
Measuring Vgs on Wide Bandgap Semiconductors This application note focuses on accurate high-side V GS measurements using the IsoVu measurement system. The measurements described in this application note
More informationSoldering a P7500 to a Nexus DDR Component Interposer
Soldering a P7500 to a Nexus DDR Component Interposer Introduction This document shows an example of how to solder P7500 tips to the oscilloscope version of a Nexus DDR Component Interposer board. The
More informationFEI Helios NanoLab 600 TEM specimen prep recipe Nicholas G. Rudawski (352) (office) (805) (cell) Last updated: 01/19/17
FEI Helios NanoLab 600 TEM specimen prep recipe Nicholas G. Rudawski ngr@ufl.edu (352) 392 3077 (office) (805) 252-4916 (cell) Last updated: 01/19/17 This recipe is based on the methods of Schaffer et
More informationSolutions for Solar Cell and Module Testing
Solutions for Solar Cell and Module Testing Agilent 663XB Power Supplies Connected in Anti-Series to Achieve Four-Quadrant Operation for Solar Cell and Module Testing Application Note Overview To fully
More informationSimplifying FET Testing with 2600B System SourceMeter SMU Instruments APPLICATION NOTE
Simplifying FET Testing with 2600B System SourceMeter SMU Instruments Introduction Field effect transistors (FETs) are important semiconductor devices with many applications because they are fundamental
More informationPassive High Voltage Probes P5100A-TPP0850-P5122-P5150-P6015A Datasheet
Passive High Voltage Probes P5100A-TPP0850-P5122-P5150-P6015A Datasheet P5150 DC to 500 MHz 2500 V Peak, 1000 V RMS CAT II 50 X Floatable up to 600 V RMS CAT II or 300 V RMS CAT III For TPS2000 and THS3000
More informationASCENT Overview. European Nanoelectronics Infrastructure Access. MOS-AK Workshop, Infineon, Munich, 13 th March 2018.
ASCENT Overview MOS-AK Workshop, Infineon, Munich, 13 th March 2018 European Nanoelectronics Infrastructure Access Paul Roseingrave The Challenge Cost/performance returns by scaling are diminishing Cost
More informationDirect Observation of Current-Induced Motion of a. 3D Vortex Domain Wall in Cylindrical Nanowires
Supporting Information Direct Observation of Current-Induced Motion of a 3D Vortex Domain Wall in Cylindrical Nanowires Yurii P. Ivanov,,, *, Andrey Chuvilin ǁ,, Sergey Lopatin, Hanan Mohammed, Jurgen
More informationKeysight Technologies Precise Low Resistance Measurements Using the B2961A and 34420A
Keysight Technologies Precise Low Resistance Measurements Using the B2961A and 34420A B2961A/B2962A 6.5 Digit Low Noise Power Source Application Note Introduction Resistance measurement is one of the most
More informationPark NX-Hivac The world s most accurate and easy to use high vacuum AFM for failure analysis.
Park NX-Hivac The world s most accurate and easy to use high vacuum AFM for failure analysis www.parkafm.com Park NX-Hivac High vacuum scanning for failure analysis applications 4 x 07 / Cm3 Current (µa)
More informationKeysight Technologies Accurate Capacitance Characterization at the Wafer Level
Keysight Technologies Accurate Capacitance Characterization at the Wafer Level 4080 Series Parametric Test Systems Application Note Introduction The continuing trend of decreasing device geometries of
More informationKeysight Technologies Using Non-Contact AFM to Image Liquid Topographies. Application Note
Keysight Technologies Using Non-Contact AFM to Image Liquid Topographies Application Note Introduction High resolution images of patterned liquid surfaces have been acquired without inducing either capillary
More informationKeysight Technologies Improve the Accuracy and Efficiency for Organic-Thin Film Transistor (Organic-TFT) Characterization
Keysight Technologies Improve the Accuracy and Efficiency for Organic-Thin Film Transistor (Organic-TFT) Characterization B1500A Semiconductor Device Analyzer Application Note Introduction Organic materials
More informationUsing the Ramp Rate Method for Making Quasistatic C-V Measurements with the 4200A-SCS Parameter Analyzer APPLICATION NOTE
Using the Ramp Rate Method for Making Quasistatic C-V Measurements with the 4200A-SCS Parameter Analyzer Introduction Capacitance-voltage (C-V) measurements are generally made using an AC measurement technique.
More informationSOURCE MEASURE UNITS. Make Multiple Measurements Accurately Using a Single Instrument All While Saving Space, Time and Money
SOURCE MEASURE UNITS Make Multiple Measurements Accurately Using a Single Instrument All While Saving Space, Time and Money Do you use a power supply or digital multimeter? How about an electronic load,
More informationKeysight Technologies Why Magnification is Irrelevant in Modern Scanning Electron Microscopes. Application Note
Keysight Technologies Why Magnification is Irrelevant in Modern Scanning Electron Microscopes Application Note Introduction From its earliest inception, the Scanning Electron Microscope (SEM) has been
More information20X Low Capacitance Probe P6158 Datasheet
20X Low Capacitance Probe P6158 Datasheet Circuit board impedance testing (TDR) High-speed sampling systems P6158 DC to 3 GHz The P6158 is a 3 GHz, 20X, low-capacitance probe. The P6158 is ideal for high-speed
More informationSimplifying DC-DC Converter Characterization using a 2600B System SourceMeter SMU Instrument and MSO/DPO5000 or DPO7000 Series Scope APPLICATION NOTE
Simplifying DC-DC Characterization using a 2600B System SourceMeter SMU Instrument and MSO/DPO5000 or DPO7000 Series Scope Introduction DC-DC converters are widely used electronic components that convert
More informationP7500 Series Probes Tip Selection, Rework and Soldering Guide
How-to-Guide P7500 Series Probes Tip Selection, Rework and For Use with Memory Component Interposers P7500 Series Probe Tip Selection, Rework and for Use with Memory Component Interposers Introduction
More informationio n Data Sheet or The P5205 is a 100 MHz Active Differential Probe capable of measuring fast rise times of signals in floating circuits. This 1,300 V
High-voltage Differential Probes P5200 P5205 P5210 Data Sheet P5205 Features & Benefits Bandwidths up to 100 MHz Up to 5,600 V Differential (DC + pk AC) Up to 2,200 V Common (RMS) Overrange Indicator Safety
More informationLTS. Resisitve Temperature Sensor hygienic design. Temperature. Measuring range: C Accuracy Class A according to DIN IEC 751 p
Resisitve Sensor hygienic design measuring monitoring analysing LTS Measuring range: -50 +250 C Accuracy Class A according to DIN IEC 751 p max : 10 bar Process connection: G ½ standard, G ½ or M cavity
More informationSwitching Between C-V and I-V Measurements Using the 4200A-CVIV Multi-Switch and 4200A-SCS Parameter Analyzer APPLICATION NOTE
Switching Between CV and IV Measurements Using the 4200ACVIV MultiSwitch and 4200ASCS Parameter Analyzer Introduction Full parametric characterization of a semiconductor device usually requires an array
More informationHigh-voltage Differential Probes
High-voltage Differential Probes P5200 P5205 P5210 Data Sheet Features & Benefits Bandwidths up to 100 MHz Up to 5,600 V Differential (DC + pk AC) Up to 2,200 V Common (RMS) Overrange Indicator Safety
More informationPassive High Voltage Probes P5100 P5102 P5120 P6015A
P5120. P5100 High Voltage Probe The P5100 is a low-input capacitance High Voltage Probe (2.5 kv) designed for higher frequency applications. The probe can be compensated to match plug-ins and oscilloscopes
More informationMeasuring CNT FETs and CNT SETs Using the Agilent B1500A
Measuring CNT FETs and CNT SETs Using the Agilent B1500A Application Note B1500-1 Agilent B1500A Semiconductor Device Analyzer Introduction Exotic carbon nanotube (CNT) structures have generated a great
More informationHigh-voltage Differential Probes TMDP THDP THDP P5200A - P5202A - P5205A - P5210A
High-voltage Differential Probes TMDP0200 - THDP0200 - THDP0100 - P5200A - P5202A - P5205A - P5210A BNC interface (P5200A probes) TekVPI interface (TMDP and THDP Series probes) TekProbe interface (P5202A,
More informationThe compact test- disconnect terminal interface system for protection and secondary technology
POCON POWER Connector The compact test- disconnect terminal interface system for protection and secondary technology POCON the compact test-disconnect terminal interface system Safe control and testing
More informationKeysight Technologies E1834E/G/J/M/Z Mounted Beam Delivery Optics. Preliminary Data Sheet
Keysight Technologies E1834E/G/J/M/Z Mounted Beam Delivery Optics Preliminary Data Sheet The Keysight Technologies, Inc. E1834 family of beam delivery optics uses high performance mounts to meet the pointing
More informationKeysight Technologies Making Field Effect Transistor Characterization Using SMU
Keysight Technologies Making Field Effect Transistor Characterization Using SMU B2900A Precision Source/Measure Unit Demo Guide Introduction The Keysight s B2900A Series Precision Source/Measure Unit (SMU)
More informationL4940 series VERY LOW DROP 1.5 A REGULATORS
L4940 series VERY LOW DROP 1.5 A REGULATORS PRECISE 5 V, 8.5 V, 10 V, 12 V OUTPUTS LOW DROPOUT VOLTAGE (500 typ at 1.5A) VERY LOW QUIESCENT CURRENT THERMAL SHUTDOWN SHORT CIRCUIT PROTECTION REVERSE POLARITY
More informationKeysight Technologies Making Current-Voltage Measurement Using SMU
Keysight Technologies Making Current-Voltage Measurement Using SMU Keysight B2901A/02A/11A/12A Precision Source/Measure Unit Demonstration Guide Introduction The Keysight Technologies, Inc. B2901A/02A/11A/12A
More informationUsing the Model 4225-RPM Remote Amplifier/ Switch to Automate Switching Between DC I-V, C-V, and Pulsed I-V Measurements APPLICATION NOTE
Using the Model 4225-RPM Remote Amplifier/ Switch to Automate Switching Between DC I-V, C-V, and Pulsed I-V Measurements Characterizing a device, material, or process electrically often requires performing
More informationDifferential Probes P6248 P6247 P6246 Datasheet
Differential Probes P6248 P6247 P6246 Datasheet P6247 key performance specifications 1.0 GHz bandwidth (guaranteed) P6246 key performance specifications 400 MHz bandwidth (guaranteed) Key features Low
More informationMEMS On-wafer Evaluation in Mass Production Testing At the Earliest Stage is the Key to Lowering Costs
MEMS On-wafer Evaluation in Mass Production Testing At the Earliest Stage is the Key to Lowering Costs Application Note Recently, various devices using MEMS technology such as pressure sensors, accelerometers,
More informationKeysight Technologies MEMS On-wafer Evaluation in Mass Production
Keysight Technologies MEMS On-wafer Evaluation in Mass Production Testing at the Earliest Stage is the Key to Lowering Costs Application Note Introduction Recently, various devices using MEMS technology
More informationVerifying Power Supply Sequencing with an 8-Channel Oscilloscope APPLICATION NOTE
Verifying Power Supply Sequencing with an 8-Channel Oscilloscope Introduction In systems that rely on multiple power rails, power-on sequencing and power-off sequencing can be critical. If the power supplies
More informationInclinometer Selection Guide
POSITION AND MOTION SENSORS Inclinometer Selection Guide Page No. 1 GLOBAL PRESENCE FRABA Group Sales Partner America FRABA Inc. Hamilton, NJ, USA Asia FRABA Pte. Ltd. Singapore Europe POSITAL GmbH Cologne,
More informationWho Reads and Who Follows? What analytics tell us about the audience of academic blogging Chris Prosser Politics in
Who Reads and Who Follows? What analytics tell us about the audience of academic blogging Chris Prosser Politics in Spires @caprosser 1 What do we want to know about the audience for academic blogging?
More information7. Bipolar Junction Transistor
41 7. Bipolar Junction Transistor 7.1. Objectives - To experimentally examine the principles of operation of bipolar junction transistor (BJT); - To measure basic characteristics of n-p-n silicon transistor
More informationSTAINLESS STEEL STAINLESS STEEL MANUFACTURING STAINLESS STEEL TRADING BRIGHT BARS WIRES PRECISION COMPONENTS
STAINLESS STEEL BRIGHT BARS WIRES PRECISION COMPONENTS BHANSALI is diversified business group with interests in Stainless Steel, Textiles and ABS Plastics. Under the dynamic leadership of Mr. Pukhraj Bhansali
More informationKeysight Technologies 5500 AFM Controller Upgrade. Data Sheet
Keysight Technologies 5500 AFM Controller Upgrade Data Sheet 02 Keysight 5500 AFM Controller Upgrade - Data Sheet Upgrade Overview The Keysight 5500 AFM Controller Upgrade offers a tremendously convenient
More informationPower Measurement and Analysis Software
Power Measurement and Analysis Software TPS2PWR1 Data Sheet Features & Benefits Improve Efficiency of Power Designs with Switching-loss Measurements including Turn-on, Turn-off, and Conduction Losses Reduce
More informationPFM Experiments with High Voltage DC/AC Bias
PFM Experiments with High Voltage DC/AC Bias Support Note Shijie Wu and John Alexander Agilent Technologies Introduction Piezoelectric force microscopy (PFM) has found major applications in the study of
More informationS540 Power Semiconductor Test System Datasheet
S540 Power Semiconductor Test System Datasheet Key Features Automatically perform all wafer-level parametric tests on up to 48 pins, including high voltage breakdown, capacitance, and low voltage measurements,
More informationNanovie. Scanning Tunnelling Microscope
Nanovie Scanning Tunnelling Microscope Nanovie STM Always at Hand Nanovie STM Lepto for Research Nanovie STM Educa for Education Nanovie Auto Tip Maker Nanovie STM Lepto Portable 3D nanoscale microscope
More informationCISCO ONS /100-GHZ INTERLEAVER/DE-INTERLEAVER FOR THE CISCO ONS MULTISERVICE TRANSPORT PLATFORM
DATA SHEET CISCO ONS 15216 50/100-GHZ INTERLEAVER/DE-INTERLEAVER FOR THE CISCO ONS 15454 MULTISERVICE TRANSPORT PLATFORM The Cisco ONS 15216 50/100-GHz Interleaver/De-interleaver is an advanced 50/100-GHz
More informationEconomic Outlook for 2016
Economic Outlook for 2016 Arturo Bris Professor of Finance, IMD Director, IMD World Competitiveness Center Yale International Center for Finance European Corporate Governance Institute 2015 IMD International.
More informationKeysight Technologies HMMC GHz High-Gain Amplifier
Keysight Technologies HMMC-5620 6-20 GHz High-Gain Amplifier Data Sheet Features Wide-frequency range: 6-20 GHz High gain: 17 db Gain flatness: ± 1.0 db Return loss: Input 15 db Output 15 db Single bias
More informationAgilent 8761A/B Microwave Switches
Agilent 8761A/B Microwave Switches Technical Overview Product Description The Agilent Technologies 8761A and 8761B are single-pole, double-throw coaxial switches with excellent electrical and mechanical
More informationThe machine tool business of SKF. The profile
The machine tool business of SKF The profile High precision bearings Silicon nitride cylindrical roller bearings (SNCRB) These bearings are some of the best and simplest solutions for high-speed spindles
More informationS540 Power Semiconductor Test System Datasheet
S540 Power Semiconductor Test System Key Features Automatically perform all wafer-level parametric tests on up to 48 pins, including high voltage breakdown, capacitance, and low voltage measurements, in
More informationMexico s Fastener Imports
198 INDUSTRY Mexico s Fastener Imports Will the Industry Continue to Grow? *Note: all values in the data presented in the article are FOB value in USD and the 2016 period only represents data through the
More informationBody-Biased Complementary Logic Implemented Using AlN Piezoelectric MEMS Switches
University of Pennsylvania From the SelectedWorks of Nipun Sinha 29 Body-Biased Complementary Logic Implemented Using AlN Piezoelectric MEMS Switches Nipun Sinha, University of Pennsylvania Timothy S.
More informationR&S ENV216 Two-Line V-Network For disturbance voltage measurements on single-phase EUTs
R&S ENV216 Two-Line V-Network For disturbance voltage measurements on single-phase EUTs Test & Measurement Data Sheet 03.00 R&S ENV216 Two-Line V-Network At a glance The R&S ENV216 two-line V-network meets
More information30 A AC/DC Current Probe TCP0030A Datasheet
30 A AC/DC Current Probe TCP0030A Datasheet Split-core construction allows easy circuit connection High accuracy with typically less than 1% DC gain error Low noise and DC drift 3rd party safety certification
More informationP600 Series 6A Power Diodes
Standard Axial Rectifiers Features: High surge current capability. Void-free plastic in a P600 package. High current operation 6.0 Amperes at T A = 55 C. Exceeds environmental standards of MIL-S-19500/228.
More informationPower Analysis Application Module DPO4PWR MDO3PWR Datasheet
Power Analysis Application Module DPO4PWR MDO3PWR Datasheet Applications Power loss measurement at switching device Characterization of power semiconductor devices Optimal drive characterization of synchronous
More informationKeysight TC GHz High Power Output Amplifier
Keysight TC724 2-26.5 GHz High Power Output Amplifier 1GG7-8045 Data Sheet Features Wide Frequency Range: 2 26.5 GHz Moderate Gain: 7.5 db Gain Flatness: ± 1 db Return Loss: Input: 17 db Output: 14 db
More informationIn this lecture we will begin a new topic namely the Metal-Oxide-Semiconductor Field Effect Transistor.
Solid State Devices Dr. S. Karmalkar Department of Electronics and Communication Engineering Indian Institute of Technology, Madras Lecture - 38 MOS Field Effect Transistor In this lecture we will begin
More informationKeysight Technologies 87405C 100 MHz to 18 GHz Preamplifier. Technical Overview
Keysight Technologies 8745C 1 MHz to 18 GHz Preamplifier Technical Overview 2 Keysight 8745C 1 MHz to 18 GHz Preamplifier Technical Overview Introduction The Keysight Technologies, Inc. 8745C preamplifier
More informationDualBeam and FIB capability applied to metals research
DualBeam and FIB capability applied to metals research The values of DualBeam for metals research The availability of Focused Ion Beam (FIB) capacity on a DualBeam has allowed many researchers to open
More informationLE160 LE320 Linear Equalizer Datasheet Tektronix Linear Equalizer
LE160 LE320 Linear Equalizer Datasheet Tektronix Linear Equalizer USB programmable output duty cycle symmetry control Precision output level controls permit signaling from 0 (Return to Zero) well in excess
More informationSure Cross Radio Certifications
Sure Cross Radio Certifications Banner's Sure Cross product line is certified by the FCC, European Union, and many other countries for operation within specific radio frequencies. FCC Certification, 900MHz
More informationAC Current Probes CT1 CT2 CT6 Data Sheet
AC Current Probes CT1 CT2 CT6 Data Sheet Features & Benefits High Bandwidth Ultra-low Inductance Very Small Form Factor Characterize Current Waveforms up to
More informationHigh-impedance Buffer Amplifier System
High-impedance Buffer Amplifier System TCA-1MEG Data Sheet Features & Benefits Bandwidth - DC to 500 MHz Input Impedance - 1 MΩ /10pF Bandwidth Limiting - Full/100 MHz/20 MHz Input Coupling - DC/AC/GND
More informationChartboost Power-Up Report
12 Advanced Tips for Promoting and Monetizing Your Mobile Game Chartboost Power-Up Report February 2015 Google Play Game Sessions Beats ios in the Americas! Middle East Territories Display Dramatic Growth
More informationA Guide to Calibration on the BioFlo 120 and BioFlo 320: Dissolved Oxygen Sensors
SHORT PROTOCOL No. 40 I May 2017 A Guide to Calibration on the BioFlo 120 and BioFlo 320: Dissolved Oxygen Sensors Stacey Willard Eppendorf Inc., USA Abstract Dissolved oxygen (DO) is a critical process
More informationKeysight Technologies Making Simpler DC Power Measurements with a Digital Multimeter
Keysight Technologies Making Simpler DC Power Measurements with a Digital Multimeter Application Brief Test Challenges: Measuring DC voltage and current with a single digital multimeter Measuring watts
More informationCisco ONS Metropolitan Dense Wavelength Division Multiplexing 100-GHz FlexLayer Filter Solution
Data Sheet Cisco ONS 15216 Metropolitan Dense Wavelength Division Multiplexing 100-GHz FlexLayer Filter Solution The Cisco ONS 15216 Metropolitan Dense Wavelength-Division Multiplexing (DWDM) FlexLayer
More informationUsing the 4200A-CVIV Multi-Switch to Make High Voltage and High Current C-V Measurements APPLICATION NOTE
Using the 4200A-CVIV Multi-Switch to Make High Voltage and High Current C-V Measurements Introduction Traditional capacitance-voltage (C-V) testing of semiconductor materials is typically limited to about
More informationSupporting Information
Supporting Information Resistive Switching Memory Effects of NiO Nanowire/Metal Junctions Keisuke Oka 1, Takeshi Yanagida 1,2 *, Kazuki Nagashima 1, Tomoji Kawai 1,3 *, Jin-Soo Kim 3 and Bae Ho Park 3
More informationTekConnect Adapters TCA75 TCA-BNC TCA-SMA TCA-N TCA-292MM TCA292D Datasheet
Adapters TCA75 TCA-BNC TCA-SMA TCA-N TCA-292MM TCA292D Datasheet TCA-SMA -to-sma DC to 18 GHz (instrument dependent) TCA-292MM -to-2.92 mm DC to 25 GHz (instrument dependent) SMA compatible TCA-292D -to-2.92
More informationProgrammable Pulse Generators PSPL10050A, PSPL10060A, PSPL10070A Datasheet
Programmable Pulse Generators PSPL10050A, PSPL10060A, PSPL10070A Datasheet Applications University education and research UWB signal source Semiconductor characterization Laser driver The PSPL10000 Series
More informationKeysight Technologies Improving Test Efficiency of MEMS Electrostatic Actuators Using the E4980A Precision LCR Meter.
Keysight Technologies Improving Test Efficiency of MEMS Electrostatic Actuators Using the E4980A Precision LCR Meter Application Note Introduction Highly accurate and repeatable measurements DC bias function
More informationTrouble-shooting Radio Links in Unlicensed Frequency Bands TUTORIAL
Trouble-shooting Radio Links in Unlicensed Frequency Bands TUTORIAL TUTORIAL With the Internet of Things comes the Interference of Things Over the past decade there has been a dramatic increase in the
More informationState of the Art Room Temperature Scanning Hall Probe Microscopy using High Performance micro-hall Probes
State of the Art Room Temperature Scanning Hall Probe Microscopy using High Performance micro-hall Probes A. Sandhu 1, 4, H. Masuda 2, A. Yamada 1, M. Konagai 3, A. Oral 5, S.J Bending 6 RCQEE, Tokyo Inst.
More informationPaladin Pellet mills.
Paladin Pellet mills www.andritz.com/ft Well-proven design concept offers reliability and maximum efficiency Paladin pellet mill series Paladin 600 Paladin 3000 Developed from a design concept proven on
More informationKeysight TC231P 0-20 GHz Integrated Diode Limiter
Keysight TC231P 0-20 GHz Integrated Diode Limiter 1GC1-8235 Data Sheet Features Two Independent Limiters for Single ended or Differential Signals Can be Biased for Adjustable Limit Level and Signal Detection
More informationKeysight Technologies Measuring Low Current Consumption with a Digital Multimeter
Keysight Technologies Measuring Low Current Consumption with a Digital Multimeter Application Brief Test Challenges: Characterizing the power consumption of a battery powered device Testing the current
More informationTDA7240AV 20W BRIDGE AMPLIFIER FOR CAR RADIO
TDA7240A COMPACT HEPTAWATT PACKAGE FEW EXTERNAL COMPONENTS OUTPUT PROTECTED AGAINST SHORT CIRCUITS TO GROUND AND ACROSS LOAD DUMP TRANSIENT THERMAL SHUTDOWN. LOUDSPEAKER PROTECTION HIGH CURRENT CAPABILITY
More information100GBASE-KR4/CR4 & CAUI-4 Compliance and Characterization Solution
100GBASE-KR4/CR4 & CAUI-4 Compliance and Characterization Solution This application package is designed in conjunction with the performance levels offered by a 50 GHz 70KSX instrument pair. The 100G-TXE
More informationIsolation Addresses Common Sources of Differential Measurement Error
By Tom Neville A typical measurement system includes an oscilloscope and an oscilloscope probe that provides the connection between the device under test (DUT) and the oscilloscope. Probe selection is
More information- Near Field Scanning Optical Microscopy - Electrostatic Force Microscopy - Magnetic Force Microscopy
- Near Field Scanning Optical Microscopy - Electrostatic Force Microscopy - Magnetic Force Microscopy Yongho Seo Near-field Photonics Group Leader Wonho Jhe Director School of Physics and Center for Near-field
More informationPO01275C Tabor East Neighborhood Meeting. Monday, April 20, :30 PM 8:30 PM
PO01275C Tabor East Neighborhood Meeting Monday, April 20, 2015 6:30 PM 8:30 PM 1 Opening Remarks, Introductions, Explanation of Agenda and Procedure Lenny Borer Moderator 2 Portland Office for Community
More informationTemperature Transmitters
Temperature Transmitters measuring monitoring analysing KM O O Wide supply voltage range: 7.5... 5 V DC O O Operation, visualisation and maintenance via PC Universal setting with HART protocol T O O Fault
More informationMEASUREMENT APPLICATION GUIDE OUTER/INNER
MEASUREMENT APPLICATION GUIDE OUTER/INNER DIAMETER Measurement I N D E X y Selection Guide P.2 y Measurement Principle P.3 y P.4 y X and Y Axes Synchronous Outer Diameter Measurement P.5 y of a Large Diameter
More informationBe Sure to Capture the Complete Picture
Be Sure to Capture the Complete Picture Technical Brief Tektronix Digital Real-time (DRT) Sampling Technology As an engineer or technician, you need the confidence and trust that you re accurately capturing
More informationConductance switching in Ag 2 S devices fabricated by sulphurization
3 Conductance switching in Ag S devices fabricated by sulphurization The electrical characterization and switching properties of the α-ag S thin films fabricated by sulfurization are presented in this
More informationMeasurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation
238 Hitachi Review Vol. 65 (2016), No. 7 Featured Articles Measurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation AFM5500M Scanning Probe Microscope Satoshi Hasumura
More informationJapan s Leading Exhibition for Robotics Technologies Jan. 17[Wed]-19[Fri], 2018 Tokyo Big Sight, Japan
Japan s Leading Exhibition for Robotics Technologies Jan. 17[Wed]-19[Fri], 2018 Tokyo Big Sight, Japan Web: http://www.robodex.jp/en/ POST SHOW REPORT 2018 FACTS & FIGURES 17,186 Visitors 200 Exhibitors
More informationIMAGING P-N JUNCTIONS BY SCANNING NEAR-FIELD OPTICAL, ATOMIC FORCE AND ELECTRICAL CONTRAST MICROSCOPY. G. Tallarida Laboratorio MDM-INFM
Laboratorio MDM - INFM Via C.Olivetti 2, I-20041 Agrate Brianza (MI) M D M Materiali e Dispositivi per la Microelettronica IMAGING P-N JUNCTIONS BY SCANNING NEAR-FIELD OPTICAL, ATOMIC FORCE AND ELECTRICAL
More informationAgilent 87075C Multiport Test Set
Agilent 87075C Multiport Test Set Technical Overview A complete 75 Ω system for cable TV device manufacturers Now, focus on testing, not reconnecting! For use with the Agilent 8711 C-Series of network
More informationKeysight Technologies Accurate NBTI Characterization Using Timing-on-the-fly Sampling Mode. Application Note
Keysight Technologies Accurate NBTI Characterization Using Timing-on-the-fly Sampling Mode Application Note Introduction Keysight B1500A Semiconductor Device Analyzer Controlled dynamic recovery with 100
More informationWafer Loaders for IC Inspection Microscopes NWL200 Series. Wafer Loaders for IC Inspection Microscopes
Wafer Loaders for IC Inspection Microscopes NWL200 Wafer Loaders for IC Inspection Microscopes Wafer Loaders for IC Inspection Microscopes I Nikon s original technology ensures safe, reliable loading of
More information12.5 Gb/s Driver Amplifier LABware Module PSPL8001 Datasheet
12.5 Gb/s Driver Amplifier LABware Module PSPL8001 Datasheet The PSPL8001 12.5 Gb/s Driver Amplifier LABware Module is designed for bench-top lab use. This LABware module can simply be plugged in with
More informationThermo Scientific SPECTRONIC 200 Visible Spectrophotometer. The perfect. teaching instrument
Thermo Scientific SPECTRONIC 200 Visible Spectrophotometer The perfect teaching instrument Designed for the Teaching Laboratory Thermo Scientific SPECTRONIC spectrophotometers have served as core analytical
More informationstripax The professional stripping tool
stripax The professional stripping tool stripax the original: developed from experience Weidmüller is the world s leading manufacturer of solutions for electrical connectivity, transmission, conditioning
More information