Testing RFIC Power Amplifiers with Envelope Tracking. April 2014
|
|
- Elaine Pierce
- 5 years ago
- Views:
Transcription
1 Testing RFIC Power Amplifiers with Envelope Tracking April
2 Agenda Key Test Challenges Addressing Test Challenges New emerging technologies such as envelope tracking and DPD and their implications Agilent s PA Reference Solution 2
3 Power Amplifier Key Test Challenges Device complexity continues to increase Must now test 9 bands and 5 modes Amount of testing is increasing while price continues to be driven down New techniques add additional test challenges Envelope tracking & Digital Pre-distortion Need for Speed 3
4 Typical Power Amplifier (PA) Speed challenge: Adjustment routine can be a significant percentage of overall test time DUT Signal Generator RF Out Switching RF In RF In RF Out RF Out Switching Signal Analyzer RF In DUT specifications are at a specific output power level VSG level must be iteratively adjusted to achieve the correct DUT output power How do you improve measurement speed? Power Measurements: Real time signal processing to reduce power measurement time to slightly more than the signal acquisition time Changing VSG Power Level: Faster amplitude switching times and better linearity reduces the time to change the level and the number of required iterations by switching to the correct power level
5 Fast ACPR and EVM measurement challenges Large number of ACPR measurements due to increased modes and bands Need for speed has caused a shift away from traditional measurement hardware, which also changes measurement algorithms, sometimes leading to erroneous results 5
6 Harmonics Measurements Challenge Traditional spectrum analyzer designs use YIG oscillators Provide good phase noise, but are slow for tuning The 2.7 GHz LTE band requires greater than a 6 GHz analyzer to measure the third harmonic Many 6 GHz analyzers have been optimized for speed, but many of these advantages are lost with higher frequency analyzers Tuning time across bands is significantly longer, adding measureable time to harmonics measurements Typical tuning time is in the order of 20 ms Agilent Technologies 6
7 Agenda Key Test Challenges Addressing Test Challenges New emerging technologies such as envelope tracking and DPD and their implications Agilent s PA Reference Solution 7
8 Data Acquisition Modes for Fast Signal Processing with the M9391A Vector Signal Analyzer Two Data Acquisition Modes are of most interest for Power Measurements Power Mode: Configurable Bandwidth, Acquisition Time and Channel Filter Single Value for Integrated Power Measurement from IQ time record averaged in FPGA FFT Mode Data Output in Frequency Domain via Hardware FFT with 64 to 512 bins including averaging and windowing 8
9 Baseband Frequency and Amplitude Offset with the M9381A Vector Signal Generator Signal Processing ASIC in baseband generator supports changing Frequency and Amplitude of RF Signal without Adjusting Analog Hardware (fastune technology innovation) Power Servo Loop Approach: Set the RF Power Level to the maximum level that may be required from the source Use the baseband power level to adjust the power level to the required input level Up to 20 db amplitude changes in 200 µs using command interface 20 db 160 MHz < 200 us 9
10 Input Power Servo / ACPR Measurement Procedure FFT Acquisition For Fast Servo and ACPR Target output power / Expected Gain Setup VSG Output level Use VSA FFT Acquisition to Measure and Calculate DUT Output Power Is Output within Tolerance? No Yes Calculate Pin and Gain from VSG Output Adjust VSG Baseband Power Offset based on measurement Yes Can we adjust the VSG baseband power? No Use Last FFT from Power Servo to Calculate all Channels for ACPR Measurement. Set Baseband Power Offset to 0 for maximum Pout of DUT, Count set to -1 ACPR in 0 ms!
11 Trusted and Correlated EVM Measurements M9381A provides good modulation performance, particularly at high power levels and very linear power level changes. Achieve continuity of measurement results from R&D to manufacturing, as well as from previous generation test systems by using X-Series measurement applications 11
12 Harmonics Measurement Speed Improvements Fast tuning LO with VCOs instead of YIG Stepped vs Swept No band switching penalties Give up a little phase noise performance but gain speed Correlation between 6 GHz & 27 GHz analyzers Common high speed signal processing Common X-series measurement applications Agilent Technologies 12
13 Agenda Key Test Challenges Addressing Test Challenges New emerging technologies such as envelope tracking and DPD and their implications Agilent s PA Reference Solution 13
14 Envelope Tracking - The How & Why Improve battery life Increase RF amplifier performance over broad frequencies Lower distortion Reduce heat dissipation 14
15 Envelope and RF Signal Timing Alignment Timing alignment of the envelope and RF signal is critical for best performance Typical alignment needs to be within 1 ns for a 20 MHz LTE signal to avoid an asymmetric ACLR 15
16 Envelope Tracking Production Test Techniques Test Requirements are still evolving! Possible Scenarios: System Functional Test: Add ETPS and AWG to Test System Test Same Parameters as before, maybe with different limits Minimal Impact on Test Time ET Benefits Improved ACPR Improved PAE Lower Operating Temperature Parametric Test: May add ETPS and AWG to System Basic Measurements such as Gain Compression, AM/AM, AM/PM Conversion and PAE Moderate Impact on Test Time Enhanced Functional Test: Add ETPS and AWG to Test System New Tests such as ACPR vs. Timing or PAE vs. Time This has the largest Impact on Test Time 16
17 Digital Pre-Distortion (DPD): The How & Why Modern communication systems Signals have high peak-to-average power ratios (PAPR). Must operate with high power-added efficiency (PAE). High PAPR is a consequence of high spectral efficiency Multiple-Carrier Signals (MC GSM, MC WCDMA) CDMA (WCDMA, CDMA2000) OFDM (LTE, WiMAX) High PAE is achieved when the RF power amplifier (PA) is driven towards saturation OUTPUT POWER Psat LINEAR REGION DPD GAIN EXPANSION DPD REGION LINEARIZED DPD + PA Maximum correctable power PA, WITH GAIN COMPRESSION INPUT POWER Operation near saturation inherently results in higher signal distortion + = DPD corrects PA nonlinearities resulting in higher performing power amplifiers 17
18 Agenda Key Test Challenges Addressing Test Challenges New emerging technologies such as envelope tracking and DPD and their implications Agilent s PA Reference Solution 18
19 RF Power Amplifier Test, Reference Solution Manufacturing / DVT N76XX Signal Studio Waveform Creation GUI examples & Test Libraries Software Envelope Generation RF signal with DPD M90XX Modular X-Series Measurement Applications M9381A PXIe Vector Signal Generator Hardware N6700B with N6782A (1 to 4) 4 channel SMU 33522B Arbitrary Waveform Generator 2 Envelope Proprietary Control RF In RFFE ETPS Vcc V.. V.. RF Out Vbat M9391A PXIe Vector Signal Analyzer M9018A PXIe Chassis M9036A Embedded Controller 19
20 X-Series Applications for Modular Products Cellular Communication LTE FDD LTE TDD W-CDMA/HSPA/HSPA+ GSM/EDGE/EDGE Evo TD-SCDMA/HSPA cdma2000/cdmaone 1xEV-DO Common algorithms, programming commands and shared library of measurement applications across X-Series signal analyzers and M9391A PXI VSA ensure consistent, repeatable results
21 Evaluation Software environment Software Reference solution added value RF PA Test Evaluation GUI Test Program: Test_WCDMA Test_LTE5MHz Test_LTE_10MHz Test_GSM Test_EVDO Test_WLAN Power Amp Test Library: Init_Instruments setupvsgvsa measpout Close_Instruments setupvsgvsafixedpin measstdacpr Load Waveforms servoinputpower measlteacpr measspecharms VSA & X-Seroes Measurement Applications Hardware M938xA IVI-COM Driver AgModularVsa IVI-COM Driver 21
22 RF PA Test Evaluation GUI C# Form Application Accelerates Evaluation Uses IVI-COM Driver for VSA/VSG Uses SCPI for X-Apps, AWG and Power Meter Power Servo, EVM, ACPR, SEM and Harmonics Measurements Control for ET ARB, RFFE Module and DC SMUs Data Logging + Test Times 22
23 LTE Envelope Tracking Setup Envelope Tracking uses 33522B AWG to play Envelope Signal Generated from Signal Studio Evaluation GUI settings DC Offset and Amplitude Nominal IQ Delay to Align RF and Envelope Signals hard coded Different values for different sample rate Offset from nominal Delay Manual Adjustment of IQ Delay from M938x SFP ACPR vs IQ delay test 23
24 Introducing the RF Power Amplifier Test Reference Solution with Envelope Tracking Highest test throughput, reduced cost, & rapid integration into power amplifier test environments Extremely fast modulation analysis, excellent accuracy and repeatability, and source code optimized for speed Fast EVM measurements < 50 ms, nom Fast Servo loop convergence < 5 ms, nom Fast ACPR measurements 0 ms, nom Key Features Adjustable RF signal/ envelope skew to ± 1 ps resolution over ± 250 ns range Real-time signal processing Test libraries and source code examples Benefits Tight synchronization between RF signal and envelope Fast measurements Easy evaluation and integration
25 Questions? 25
26 Agilent PA Test Coverage Over Lifecycle R&D D&V Production Modelling & simulation ADS PNA-X N6705B N6705B Waveform creation ADS Signal Studio Synchronised RF & envelope signal generation N8241A M8190A 33522B PA distortion testing 89600v17 PXA DSO9000 Measurement of instantaneous PAE Assumes customer provides current & voltage signals 89600v B Signal Studio Signal Studio Signal Studio MXG or M9381A 33522B MXA, M9391A, or M9393A VSA DSO with DSO9000 or MXA M9381A VSG 33522B AWG M9391A or M9393A VSA M9210A 26
Keysight Technologies PXIe Measurement Accelerator Speeds RF Power Amplifier Test
Keysight Technologies PXIe Measurement Accelerator Speeds Power Amplifier Test Article Reprint Microwave Journal grants Keysight Technologies permission to reprint the article PXIe Measurement Accelerator
More informationA balancing act: Envelope Tracking and Digital Pre-Distortion in Handset Transmitters
Abstract Envelope tracking requires the addition of another connector to the RF power amplifier. Providing this supply modulation input leads to many possibilities for improving the performance of the
More informationSolutions for Power Amplifier Test in PXI PA Reference Solutions. Update on Release 3
Solutions for Power Amplifier Test in PXI PA s Update on Release 3 May 2015 Agenda Test Requirements for UE Power Amplifiers Keysight s Power Amplifier Test Solutions PA Architecture in PXI Product Details
More informationIntroducing the Keysight RF PXIe Vector Signal Analyzer & Generator M9391A & M9381A. Updated: August 2015
Introducing the Keysight RF PXIe Vector Signal Analyzer & Generator M9391A & M9381A Updated: August 2015 Agenda Page 2 M9391A PXIe vector signal generator M9381A PXIe vector signal analyzer M9380A PXIe
More informationRF 파워앰프테스트를위한 Envelope Tracking 및 DPD 기술
RF 파워앰프테스트를위한 Envelope Tracking 및 DPD 기술 한국내쇼날인스트루먼트 RF 테스트담당한정규 jungkyu.han@ni.com Welcome to the World of RFICs Low Noise Amplifiers Power Amplifiers RF Switches Duplexer and Filters 2 Transmitter Power
More information22 Marzo 2012 IFEMA, Madrid spain.ni.com/nidays.
22 Marzo 2012 IFEMA, Madrid spain.ni.com/nidays www.infoplc.net The Art of Benchmarking Speed PXI Versus Rack-and-Stack Test Equipment Filippo Persia Systems Engineer Automated Test Mediterranean Region
More informationExploring Trends in Technology and Testing in Satellite Communications
Exploring Trends in Technology and Testing in Satellite Communications Aerospace Defense Symposium Giuseppe Savoia Keysight Technologies Agenda Page 2 Evolving military and commercial satellite communications
More informationIntroduction to Envelope Tracking. G J Wimpenny Snr Director Technology, Qualcomm UK Ltd
Introduction to Envelope Tracking G J Wimpenny Snr Director Technology, Qualcomm UK Ltd Envelope Tracking Historical Context EER first proposed by Leonard Kahn in 1952 to improve efficiency of SSB transmitters
More informationUnderstanding Low Phase Noise Signals. Presented by: Riadh Said Agilent Technologies, Inc.
Understanding Low Phase Noise Signals Presented by: Riadh Said Agilent Technologies, Inc. Introduction Instabilities in the frequency or phase of a signal are caused by a number of different effects. Each
More informationFast and Accurate RF component characterization enabled by FPGA technology
Fast and Accurate RF component characterization enabled by FPGA technology Guillaume Pailloncy Senior Systems Engineer Agenda RF Application Challenges What are FPGAs and why are they useful? FPGA-based
More information9 Best Practices for Optimizing Your Signal Generator Part 2 Making Better Measurements
9 Best Practices for Optimizing Your Signal Generator Part 2 Making Better Measurements In consumer wireless, military communications, or radar, you face an ongoing bandwidth crunch in a spectrum that
More informationWideband Spectral Measurement Using Time-Gated Acquisition Implemented on a User-Programmable FPGA
Wideband Spectral Measurement Using Time-Gated Acquisition Implemented on a User-Programmable FPGA By Raajit Lall, Abhishek Rao, Sandeep Hari, and Vinay Kumar Spectral measurements for some of the Multiple
More informationLinking RF Design and Test Connecting RF Design Software to LabVIEW & Instruments
Linking RF Design and Test Connecting RF Design Software to LabVIEW & Instruments Future of RF System Design RF/Microwave Circuit Design Electromagnetic Simulation Link Budget Analysis System simulation
More informationA Product Development Flow for 5G/LTE Envelope Tracking Power Amplifiers, Part 2
Test & Measurement A Product Development Flow for 5G/LTE Envelope Tracking Power Amplifiers, Part 2 ET and DPD Enhance Efficiency and Linearity Figure 12: Simulated AM-AM and AM-PM response plots for a
More informationBehavioral Characteristics of Power Amplifiers. Understanding the Effects of Nonlinear Distortion. Generalized Memory Polynomial Model (GMP)
WHITE PAPER Testing PAs under Digital Predistortion and Dynamic Power Supply Conditions CONTENTS Introduction Behavioral Characteristics of Power Amplifiers AM-AM and AM-PM Measurements Memory Effects
More informationCharacterization and Compensation of Non-Linear Effects in Components. Dr. Florian Ramian
Characterization and Compensation of Non-Linear Effects in Components Dr. Florian Ramian Agenda ı Introduction: What Is a Non-Linear Device ı Characterization of Non-Linear Devices Characterization Parameters
More informationAdvances in RF and Microwave Measurement Technology
1 Advances in RF and Microwave Measurement Technology Chi Xu Certified LabVIEW Architect Certified TestStand Architect New Demands in Modern RF and Microwave Test In semiconductor and wireless, technologies
More informationAdvances in RF and Microwave Measurement Technology
1 Advances in RF and Microwave Measurement Technology Rejwan Ali Marketing Engineer NI Africa and Oceania New Demands in Modern RF and Microwave Test In semiconductor and wireless, technologies such as
More informationWide bandwidth measurements and Calibration
Wide bandwidth measurements and Calibration Agenda Wide bandwidth measurement definitions The need for wide bandwidth measurements Types of wide bandwidth measurements Accurate measurements and system
More informationni.com The NI PXIe-5644R Vector Signal Transceiver World s First Software-Designed Instrument
The NI PXIe-5644R Vector Signal Transceiver World s First Software-Designed Instrument Agenda Hardware Overview Tenets of a Software-Designed Instrument NI PXIe-5644R Software Example Modifications Available
More informationStephen Plumb National Instruments
RF and Microwave Test and Design Roadshow Cape Town and Midrand October 2014 Stephen Plumb National Instruments Our Mission We equip engineers and scientists with tools that accelerate productivity, innovation,
More informationVIAVI VST. Data Sheet. 6 GHz RF Vector Signal Transceiver (VST)
Data Sheet VIAVI 6 GHz RF Vector Signal Transceiver () VIAVI Solutions The Vector Signal Transceiver () is an essential building block in RF communications test solutions supplied by VIAVI Solutions. Overview
More informationAddressing Design and Test Challenges for new LTE-Advanced Standard
Addressing Design and Test Challenges for new LTE-Advanced Standard Sheri DeTomasi Modular Program Manager LTE-A Multi-channel Apps Updated December 15, 2014 The Data Challenge Internet Email Navigation
More informationKeysight Technologies N7614B Signal Studio for Power Amplifier CFR, DPD and ET Test
Keysight Technologies N7614B Signal Studio for Power Amplifier CFR, DPD and ET Test Technical Overview All-in-one test tool for performing power amplifier (PA) test flow with crest factor reduction (CFR),
More informationEven as fourth-generation (4G) cellular. Wideband Millimeter Wave Test Bed for 60 GHz Power Amplifier Digital Predistortion.
Wideband Millimeter Wave Test Bed for 60 GHz Power Amplifier Digital Predistortion Stephen J. Kovacic, Foad Arfarei Maleksadeh, Hassan Sarbishaei Skyworks Solutions, Woburn, Mass. Mike Millhaem, Michel
More informationUnderstanding RF and Microwave Analysis Basics
Understanding RF and Microwave Analysis Basics Kimberly Cassacia Product Line Brand Manager Keysight Technologies Agenda µw Analysis Basics Page 2 RF Signal Analyzer Overview & Basic Settings Overview
More informationWelcome. Jake Sanderson Application Engineer Modular Product Operation. Daren McClearnon Product Planning Manager Electronic System-Level EDA
Welcome Jake Sanderson Application Engineer Modular Product Operation Daren McClearnon Product Planning Manager Electronic System-Level EDA 1 Agenda About Digital Pre-Distortion (DPD) DPD challenges for
More informationPXI Maestro PXI Maestro, software that accelerates wireless device test speed and reduces ATE system development time.
PXI Maestro PXI Maestro, software that accelerates wireless device test speed and reduces ATE system development time. Highlights End-to-end ATE for multi-up non signalling RF test Supports single or dual
More informationVST 6 GHz RF Vector Signal Transceiver (VST)
VST 6 GHz RF Vector Signal Transceiver (VST) 2016 Datasheet The most important thing we build is trust Key features Vector signal analyser and generator in a single 3U x 3 slot wide PXIe module 65 MHz
More informationET Envelope Path from digits to PA
pushing the envelope of PA efficiency ET Envelope Path from digits to PA Gerard Wimpenny Nujira Ltd ARMMS Conference 19 th /2 th November 212 Agenda Envelope Processing ET PA Characterisation Isogain shaping
More informationPXIe Contents SPECIFICATIONS. 14 GHz and 26.5 GHz Vector Signal Analyzer
SPECIFICATIONS PXIe-5668 14 GHz and 26.5 GHz Vector Signal Analyzer These specifications apply to the PXIe-5668 (14 GHz) Vector Signal Analyzer and the PXIe-5668 (26.5 GHz) Vector Signal Analyzer with
More informationAddressing the Challenges of Wideband Radar Signal Generation and Analysis. Marco Vivarelli Digital Sales Specialist
Addressing the Challenges of Wideband Radar Signal Generation and Analysis Marco Vivarelli Digital Sales Specialist Agenda Challenges of Wideband Signal Generation Challenges of Wideband Signal Analysis
More informationAdvanced RF Measurements You Didn t Know Your Oscilloscope Could Make. Brad Frieden Philip Gresock
Advanced RF Measurements You Didn t Know Your Oscilloscope Could Make Brad Frieden Philip Gresock Agenda RF measurement challenges Oscilloscope platform overview Typical RF characteristics Bandwidth vs.
More information3250 Series Spectrum Analyzer
The most important thing we build is trust ADVANCED ELECTRONIC SOLUTIONS AVIATION SERVICES COMMUNICATIONS AND CONNECTIVITY MISSION SYSTEMS 3250 Series Spectrum Analyzer > Agenda Introduction
More informationMulti-Signal, Multi-Format Analysis With Agilent VSA Software
Multi-Signal, Multi-Format Analysis With Agilent 89600 VSA Software Ken Voelker Agilent Technologies Inc. April 2012 1 April, 25 2012 Agenda Introduction: New Measurement Challenges Multi-Measurements
More informationPXI LTE FDD and LTE TDD Measurement Suites Data Sheet
PXI LTE FDD and LTE TDD Measurement Suites Data Sheet The most important thing we build is trust A production ready ATE solution for RF alignment and performance verification UE Tx output power Transmit
More informationKeysight S8900A PA Test Solution S8901A PA Test Software S8902A Noise Figure Measurement S8903A ET/DPD Measurement KS8400A Test Automation Platform
Keysight S8900A PA Test Solution S8901A PA Test Software S8902A Noise Figure Measurement S8903A ET/DPD Measurement KS8400A Test Automation Platform Signal Studio Technical Overview 02 Keysight S8900A PA
More informationM8190A 12 GSa/s Arbitrary Waveform Generator
M8190A 12 GSa/s Arbitrary Waveform Generator March 1 st Question and Answer session 1. How much are the instruments? The starting price is $78,000 containing o 1 channel option with $55,000 o 14 bit option
More informationKeysight Technologies Wideband Digital Pre-Distortion with SystemVue and PXI Modular Instruments. Application Note
Keysight Technologies Wideband Digital Pre-Distortion with SystemVue and PXI Modular Instruments Application Note Introduction A transition is now underway in the wireless communications industry, as wireless
More informationKeysight Technologies 8 Hints for Making Better Measurements Using RF Signal Generators. Application Note
Keysight Technologies 8 Hints for Making Better Measurements Using RF Signal Generators Application Note 02 Keysight 8 Hints for Making Better Measurements Using RF Signal Generators - Application Note
More informationPXI Vector Signal Transceivers
PRODUCT FLYER PXI Vector Signal Transceivers CONTENTS PXI Vector Signal Transceivers Detailed View of PXIe-5840 RF Vector Signal Transceiver Key Features Software-Defined Architecture Platform-Based Approach
More information2012 LitePoint Corp LitePoint, A Teradyne Company. All rights reserved.
LTE TDD What to Test and Why 2012 LitePoint Corp. 2012 LitePoint, A Teradyne Company. All rights reserved. Agenda LTE Overview LTE Measurements Testing LTE TDD Where to Begin? Building a LTE TDD Verification
More informationHow do I optimize desired Amplifier Specifications?
How do I optimize desired Amplifier Specifications? PAE (accuracy
More informationImproving ax Performance in Real World by Comprehensive Test Solution
Improving 802.11ax Performance in Real World by Comprehensive Test Solution Brian Su, Sr. Project Manager Ben Ling, Business Development, Keysight Dense Wi-Fi deployments Public access & offloading Outdoor
More informationReinventing the Transmit Chain for Next-Generation Multimode Wireless Devices. By: Richard Harlan, Director of Technical Marketing, ParkerVision
Reinventing the Transmit Chain for Next-Generation Multimode Wireless Devices By: Richard Harlan, Director of Technical Marketing, ParkerVision Upcoming generations of radio access standards are placing
More informationIMS2017 Power Amplifier Linearization through DPD Student Design Competition (SDC): Signals, Scoring & Test Setup Description
IMS2017 Power Amplifier Linearization through DPD Student Design Competition (SDC: Signals, Scoring & Test Setup Description I. Introduction The objective of the IMS2017 SDC is to design an appropriate
More informationTesting Upstream and Downstream DOCSIS 3.1 Devices
Testing Upstream and Downstream DOCSIS 3.1 Devices April 2015 Steve Hall DOCSIS 3.1 Business Development Manager Agenda 1. Decoding and demodulating a real downstream DOCSIS 3.1 signal and reporting key
More information5G Multi-Band Vector Transceiver
SOLUTION BRIEF Streamlining high-volume test of 5G NR base stations 5G Multi-Band Vector Transceiver Compact, scalable solution accelerates deployment of 5G equipment 5G New Radio (NR) network equipment
More informationImproving Amplitude Accuracy with Next-Generation Signal Generators
Improving Amplitude Accuracy with Next-Generation Signal Generators Generate True Performance Signal generators offer precise and highly stable test signals for a variety of components and systems test
More informationBridging the Gap between System & Circuit Designers
Bridging the Gap between System & Circuit Designers October 27, 2004 Presented by: Kal Kalbasi Q & A Marc Petersen Copyright 2003 Agilent Technologies, Inc. The Gap System Communication System Design System
More informationRF POWER AMPLIFIERS. Alireza Shirvani SCV SSCS RFIC Course
RF POWER AMPLIFIERS Alireza Shirvani SCV SSCS RFIC Course Mobile and Base Stations in a Wireless System RF Power Amplifiers Function: Delivering RF Power to the Antenna Performance Metrics Output Power
More informationAgilent Highly Accurate Amplifier ACLR and ACPR Testing with the Agilent N5182A MXG Vector Signal Generator. Application Note
Agilent Highly Accurate Amplifier ACLR and ACPR Testing with the Agilent N5182A MXG Vector Signal Generator Application Note Introduction 1 0 0 1 Symbol encoder I Q Baseband filters I Q IQ modulator Other
More informationFrom Antenna to Bits:
From Antenna to Bits: Wireless System Design with MATLAB and Simulink Cynthia Cudicini Application Engineering Manager MathWorks cynthia.cudicini@mathworks.fr 1 Innovations in the World of Wireless Everything
More informationRF Semiconductor Test AXRF-Q Multi-Port PXI RF Sub-System
RF Semiconductor Test AXRF-Q Multi-Port PXI RF Sub-System Datasheet The most important thing we build is trust Overview AXRF-Q Multi-Port PXIe RF Subsystem is an integrated solution for testing RF semi-conductor
More informationFrom 2G to 4G UE Measurements from GSM to LTE. David Hall RF Product Manager
From 2G to 4G UE Measurements from GSM to LTE David Hall RF Product Manager Agenda: Testing 2G to 4G Devices The progression of standards GSM/EDGE measurements WCDMA measurements LTE Measurements LTE theory
More informationPayload measurements with digital signals. Markus Lörner, Product Management Signal Generation Dr. Susanne Hirschmann, Signal Processing Development
Payload measurements with digital signals Markus Lörner, Product Management Signal Generation Dr. Susanne Hirschmann, Signal Processing Development Agenda ı Why test with modulated signals? ı Test environment
More informationIntegrated Solutions for Testing Wireless Communication Systems
TOPICS IN RADIO COMMUNICATIONS Integrated Solutions for Testing Wireless Communication Systems Dingqing Lu and Zhengrong Zhou, Agilent Technologies Inc. ABSTRACT Wireless communications standards have
More informationSpectrum and signal analyzers for every requirement an overview
Spectrum and signal analyzers for every requirement an overview The introduction of the Handheld Spectrum Analyzer R&S FSH6 (page 26) expands an already full range of analyzers from Rohde & Schwarz, covering
More informationPulsed VNA Measurements:
Pulsed VNA Measurements: The Need to Null! January 21, 2004 presented by: Loren Betts Copyright 2004 Agilent Technologies, Inc. Agenda Pulsed RF Devices Pulsed Signal Domains VNA Spectral Nulling Measurement
More informationPXI UMTS Uplink Measurement Suite Data Sheet
PXI UMTS Uplink Measurement Suite Data Sheet The most important thing we build is trust A production ready ATE solution for RF alignment and performance verification Tx Max Output Power Frequency Error
More informationTransmitter Design and Measurement Challenges
Transmitter Design and Measurement Challenges Based on the book: LTE and the Evolution to 4G Wireless Chapter 6.4 4G World 2009 presented by: David L. Barner www/agilent.com/find/4gworld 1 Agilent Technologies,
More informationRF Fundamentals Part 2 Spectral Analysis
Spectral Analysis Dec 8, 2016 Kevin Nguyen Keysight Technologies Agenda Overview Theory of Operation Traditional Spectrum Analyzers Modern Signal Analyzers Specifications Features Wrap-up Page 2 Overview
More informationTransmission Signal Quality Comparison of SCM and OFDM according to the Phase Noise Characteristics of the Local Oscillator
Transmission Signal Quality Comparison of SCM and OFDM according to the Phase Noise Characteristics of the Local Oscillator Gwang-Yeol You*, Seung-Chul SHIN** * Electronic Measurement Group, Wireless Communication
More informationAgilent Back to Basics. Spectrum Analysis Back to Basics. Presented by: Michel Joussemet
Agilent Back to Basics Spectrum Analysis Back to Basics Presented by: Michel Joussemet Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Agenda Introduction Overview: What is Signal Analysis?
More informationIntegration of Measurement Equipment in a Matlab Environment for the Example of Radar Chirps
Integration of Measurement Equipment in a Matlab Environment for the Example of Radar Chirps Špiro Moškov RF and Wireless Application Engineer Agilent Technologies Page 1 Agenda Signal creation and instrument
More informationPXI WLAN Measurement Suite Data Sheet
PXI WLAN Measurement Suite Data Sheet The most important thing we build is trust Bench-top R&D and production ready ATE RF performance verification tools Multi device parallel testing for higher production
More informationTransforming MIMO Test
Transforming MIMO Test MIMO channel modeling and emulation test challenges Presented by: Kevin Bertlin PXB Product Engineer Page 1 Outline Wireless Technologies Review Multipath Fading and Antenna Diversity
More informationTESTING METHODS AND ERROR BUDGET ANALYSIS OF A SOFTWARE DEFINED RADIO By Richard Overdorf
TESTING METHODS AND ERROR BUDGET ANALYSIS OF A SOFTWARE DEFINED RADIO By Richard Overdorf SDR Considerations Data rates Voice Image Data Streaming Video Environment Distance Terrain High traffic/low traffic
More informationU90xxA X-Series Measurement Applications for the EXT Wireless Communications Test Set
U90xxA X-Series Measurement Applications for the EXT Wireless Communications Test Set Leverage the industry-proven Agilent X-Series measurements applications for the EXT wireless communications test set
More informationReconfigurable 6 GHz Vector Signal Transceiver with I/Q Interface
SPECIFICATIONS PXIe-5645 Reconfigurable 6 GHz Vector Signal Transceiver with I/Q Interface Contents Definitions...2 Conditions... 3 Frequency...4 Frequency Settling Time... 4 Internal Frequency Reference...
More information2015 The MathWorks, Inc. 1
2015 The MathWorks, Inc. 1 What s Behind 5G Wireless Communications? 서기환과장 2015 The MathWorks, Inc. 2 Agenda 5G goals and requirements Modeling and simulating key 5G technologies Release 15: Enhanced Mobile
More informationM8195A 65 GSa/s Arbitrary Waveform Generator
Arbitrary Waveform Generator New AWG with the highest combination of speed, bandwidth and channel density Juergen Beck Vice President & General Mgr. Digital & Photonic Test Division September 10, 2014
More informationUsing a design-to-test capability for LTE MIMO (Part 1 of 2)
Using a design-to-test capability for LTE MIMO (Part 1 of 2) System-level simulation helps engineers gain valuable insight into the design sensitivities of Long Term Evolution (LTE) Multiple-Input Multiple-Output
More informationFull system level calibration (levels, s-parameters, noise) Full RF source and measure capability Applications Vector network analyzer capability
Semiconductor Test AXRF - Multi-Port PXI RF Subsystem Modulated Vector Source and Measurement Data Sheet The most important thing we build is trust Functionality High speed, reliable solid state design
More informationBerkeley Nucleonics Corporation
Berkeley Nucleonics Corporation A trusted source for quality and innovative instrumentation since 1963 Test And Measurement Nuclear Expertise RF/Microwave BNC at Our Core BNC Mission: Providing our customers
More informationA Flexible Testbed for 5G Waveform Generation & Analysis. Greg Jue Keysight Technologies
A Flexible Testbed for 5G Waveform Generation & Analysis Greg Jue Keysight Technologies Agenda Introduction 5G Research: Waveforms and Frequencies Desired Testbed Attributes and Proposed Approach Wireless
More informationSignal Studio for IoT
Signal Studio for IoT N7610C TECHNICAL OVERVIEW Create Keysight validated and performance-optimized reference signals compliant to IEEE 802.15.4 (for ZigBee), 802.15.4g (for Wi-SUN), LoRa CSS and ITU-T
More informationKeysight Technologies
Keysight Technologies Generating Signals Basic CW signal Block diagram Applications Analog Modulation Types of analog modulation Block diagram Applications Digital Modulation Overview of IQ modulation
More informationFundamentals of Arbitrary. Waveform Generation
Fundamentals of Arbitrary Waveform Generation History Applications Key Specifications Optimization Signal fidelity and dynamic range Embedding and de-embedding Waveform generation and automation software
More informationMicrowave & RF Device Characterization Solutions
Microwave & RF Device Characterization Solutions MT2000 Mixed-Signal Active Load Pull System (1.0 MHz to 40.0 GHz) And MT2001 System Software From Powered by Maury Microwave is ISO: 9001:2008/AS9100C Certified.
More informationPXI LTE/LTE-A Downlink (FDD and TDD) Measurement Suite Data Sheet
PXI LTE/LTE-A Downlink (FDD and TDD) Measurement Suite Data Sheet The most important thing we build is trust Designed for the production test of the base station RF, tailored for the evolving small cell
More informationSimulating and Testing of Signal Processing Methods for Frequency Stepped Chirp Radar
Test & Measurement Simulating and Testing of Signal Processing Methods for Frequency Stepped Chirp Radar Modern radar systems serve a broad range of commercial, civil, scientific and military applications.
More informationMaking Noise in RF Receivers Simulate Real-World Signals with Signal Generators
Making Noise in RF Receivers Simulate Real-World Signals with Signal Generators Noise is an unwanted signal. In communication systems, noise affects both transmitter and receiver performance. It degrades
More informationR&S CMW100 Communications Manufacturing Test Set Specifications
R&S CMW100 Communications Manufacturing Test Set Specifications Data Sheet Version 02.00 CONTENTS Definitions... 6 General technical specifications... 7 RF generator... 8 Modulation source: arbitrary waveform
More informationBase Station RF Development with MATLAB Dr Chen Ming Shanghai Bell Co., Ltd. 2015/04/24
Base Station RF with MATLAB Dr Chen Ming Shanghai Bell Co., Ltd. 2015/04/24 1 2015 The MathWorks, Inc. Agenda Background MATLAB Applied to Base Station RF Testing and ion Q&A 2 Shanghai Bell Co., Ltd.
More informationUnderstanding Probability of Intercept for Intermittent Signals
2013 Understanding Probability of Intercept for Intermittent Signals Richard Overdorf & Rob Bordow Agilent Technologies Agenda Use Cases and Signals Time domain vs. Frequency Domain Probability of Intercept
More informationKeysight Technologies Solutions for Design and Test of LTE/LTE-A Higher Order MIMO and Beamforming. Application Note
Keysight Technologies Solutions for Design and Test of LTE/LTE-A Higher Order MIMO and Beamforming Application Note 02 Keysight Solutions for Design and of Test LTE/LTE-A Higher Order MIMO and Beamforming
More informationCommon RF Test On ATE
Common RF Test On ATE ICTEST8 the 10 th test symposium COE Expert Engineer (ADVANTEST) Kevin.Yan 2017/12/15 All Rights Reserved - ADVANTEST CORPORATION 1 Agenda RF Typical test items Introduction Test
More informationCase Study: and Test Wireless Receivers
Case Study: Using New Technologies to Design and Test Wireless Receivers Agenda Architecture of a receiver Basic GPS Receiver Measurements Case Study 1: GPS Simulation How Testing Works Simulation vs.
More informationMT1000 and MT2000 Mixed-Signal Active Load Pull System (1.0 MHz to 40.0 GHz) And MT2001 System Software
MT1000 and MT0 Mixed-Signal Active Load Pull System (1.0 MHz to 40.0 GHz) And MT1 System Software DATA SHEET / 4T-097 U.S. Patent No. 8,456,175 B2 Several international patents also available // SEPTEMBER
More informationPractical Digital Pre-Distortion Techniques for PA Linearization in 3GPP LTE
Practical Digital Pre-Distortion Techniques for PA Linearization in 3GPP LTE Jinbiao Xu Agilent Technologies Master System Engineer 1 Agenda Digital PreDistortion----Principle Crest Factor Reduction Digital
More informationPXI. TD-SCDMA Measurement Suite Data Sheet. The most important thing we build is trust. Total Average Power plus Midamble / Data Power
PXI TD-SCDMA Measurement Suite Data Sheet The most important thing we build is trust Total Average Power plus Midamble / Data Power Transmit On/Off Time Mask Transmit Closed Loop Power Control (CLPC) Spectrum
More informationProduction Test and Spectral Monitoring
1 Production Test and Spectral Monitoring Stephen Plumb Key RF Building Blocks Symbol Name Types Function Amplifier (2 port) Power Amplifier Low Noise Amplifier Amplify signal before transmission (high
More informationWhat s Behind 5G Wireless Communications?
What s Behind 5G Wireless Communications? Marc Barberis 2015 The MathWorks, Inc. 1 Agenda 5G goals and requirements Modeling and simulating key 5G technologies Release 15: Enhanced Mobile Broadband IoT
More informationR&S CMW100 Communications Manufacturing Test Set Specifications
R&S CMW100 Communications Manufacturing Test Set Specifications R&S CMW100 model.k06 Data Sheet Version 03.00 CONTENTS Definitions... 4 General technical specifications... 5 RF generator... 6 RF analyzer...
More informationPower Amplifier Testing For ac APPLICATION NOTE
Power Amplifier Testing For 802.11ac APPLICATION NOTE Using z8201 RF Test Set & zprotocol WLAN Software Introduction The first Wireless LAN (WLAN) standards were used primarily to provide low data rate
More informationVector Signal Analyzer
NI PXIe-5663, NI PXIe-5663E 10 MHz to 6.6 GHz frequency range 50 MHz instantaneous bandwidth (3 db) ±0.35 db typical flatness within 20 MHz bandwidth ±0.65 db typical amplitude accuracy
More informationSpectrum Analysis Back to Basics
Spectrum Analysis Back to Basics Agilent Technologies 1 Agenda Introduction Overview: What is Spectrum and Signal Analysis? What Measurements are available? Theory of Operation Specifications Modern Signal
More informationAddressing the Challenges of Wideband Radar and SatCom Measurements
2011 Agilent RF/uW Symposium Addressing the Challenges of Wideband Radar and SatCom Measurements Presented by: Giuseppe Savoia, Agilent Technologies Agenda Applications requiring broadband uw test equipment
More informationAdvances in RF and Microwave Measurement Technology
1 Advances in RF and Microwave Measurement Technology Farris Alhorr Business Development Manager RF & Wireless Communication Farris.alhorr@ New Demands in Modern RF and Microwave Test In semiconductor
More information