Testing RFIC Power Amplifiers with Envelope Tracking. April 2014

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1 Testing RFIC Power Amplifiers with Envelope Tracking April

2 Agenda Key Test Challenges Addressing Test Challenges New emerging technologies such as envelope tracking and DPD and their implications Agilent s PA Reference Solution 2

3 Power Amplifier Key Test Challenges Device complexity continues to increase Must now test 9 bands and 5 modes Amount of testing is increasing while price continues to be driven down New techniques add additional test challenges Envelope tracking & Digital Pre-distortion Need for Speed 3

4 Typical Power Amplifier (PA) Speed challenge: Adjustment routine can be a significant percentage of overall test time DUT Signal Generator RF Out Switching RF In RF In RF Out RF Out Switching Signal Analyzer RF In DUT specifications are at a specific output power level VSG level must be iteratively adjusted to achieve the correct DUT output power How do you improve measurement speed? Power Measurements: Real time signal processing to reduce power measurement time to slightly more than the signal acquisition time Changing VSG Power Level: Faster amplitude switching times and better linearity reduces the time to change the level and the number of required iterations by switching to the correct power level

5 Fast ACPR and EVM measurement challenges Large number of ACPR measurements due to increased modes and bands Need for speed has caused a shift away from traditional measurement hardware, which also changes measurement algorithms, sometimes leading to erroneous results 5

6 Harmonics Measurements Challenge Traditional spectrum analyzer designs use YIG oscillators Provide good phase noise, but are slow for tuning The 2.7 GHz LTE band requires greater than a 6 GHz analyzer to measure the third harmonic Many 6 GHz analyzers have been optimized for speed, but many of these advantages are lost with higher frequency analyzers Tuning time across bands is significantly longer, adding measureable time to harmonics measurements Typical tuning time is in the order of 20 ms Agilent Technologies 6

7 Agenda Key Test Challenges Addressing Test Challenges New emerging technologies such as envelope tracking and DPD and their implications Agilent s PA Reference Solution 7

8 Data Acquisition Modes for Fast Signal Processing with the M9391A Vector Signal Analyzer Two Data Acquisition Modes are of most interest for Power Measurements Power Mode: Configurable Bandwidth, Acquisition Time and Channel Filter Single Value for Integrated Power Measurement from IQ time record averaged in FPGA FFT Mode Data Output in Frequency Domain via Hardware FFT with 64 to 512 bins including averaging and windowing 8

9 Baseband Frequency and Amplitude Offset with the M9381A Vector Signal Generator Signal Processing ASIC in baseband generator supports changing Frequency and Amplitude of RF Signal without Adjusting Analog Hardware (fastune technology innovation) Power Servo Loop Approach: Set the RF Power Level to the maximum level that may be required from the source Use the baseband power level to adjust the power level to the required input level Up to 20 db amplitude changes in 200 µs using command interface 20 db 160 MHz < 200 us 9

10 Input Power Servo / ACPR Measurement Procedure FFT Acquisition For Fast Servo and ACPR Target output power / Expected Gain Setup VSG Output level Use VSA FFT Acquisition to Measure and Calculate DUT Output Power Is Output within Tolerance? No Yes Calculate Pin and Gain from VSG Output Adjust VSG Baseband Power Offset based on measurement Yes Can we adjust the VSG baseband power? No Use Last FFT from Power Servo to Calculate all Channels for ACPR Measurement. Set Baseband Power Offset to 0 for maximum Pout of DUT, Count set to -1 ACPR in 0 ms!

11 Trusted and Correlated EVM Measurements M9381A provides good modulation performance, particularly at high power levels and very linear power level changes. Achieve continuity of measurement results from R&D to manufacturing, as well as from previous generation test systems by using X-Series measurement applications 11

12 Harmonics Measurement Speed Improvements Fast tuning LO with VCOs instead of YIG Stepped vs Swept No band switching penalties Give up a little phase noise performance but gain speed Correlation between 6 GHz & 27 GHz analyzers Common high speed signal processing Common X-series measurement applications Agilent Technologies 12

13 Agenda Key Test Challenges Addressing Test Challenges New emerging technologies such as envelope tracking and DPD and their implications Agilent s PA Reference Solution 13

14 Envelope Tracking - The How & Why Improve battery life Increase RF amplifier performance over broad frequencies Lower distortion Reduce heat dissipation 14

15 Envelope and RF Signal Timing Alignment Timing alignment of the envelope and RF signal is critical for best performance Typical alignment needs to be within 1 ns for a 20 MHz LTE signal to avoid an asymmetric ACLR 15

16 Envelope Tracking Production Test Techniques Test Requirements are still evolving! Possible Scenarios: System Functional Test: Add ETPS and AWG to Test System Test Same Parameters as before, maybe with different limits Minimal Impact on Test Time ET Benefits Improved ACPR Improved PAE Lower Operating Temperature Parametric Test: May add ETPS and AWG to System Basic Measurements such as Gain Compression, AM/AM, AM/PM Conversion and PAE Moderate Impact on Test Time Enhanced Functional Test: Add ETPS and AWG to Test System New Tests such as ACPR vs. Timing or PAE vs. Time This has the largest Impact on Test Time 16

17 Digital Pre-Distortion (DPD): The How & Why Modern communication systems Signals have high peak-to-average power ratios (PAPR). Must operate with high power-added efficiency (PAE). High PAPR is a consequence of high spectral efficiency Multiple-Carrier Signals (MC GSM, MC WCDMA) CDMA (WCDMA, CDMA2000) OFDM (LTE, WiMAX) High PAE is achieved when the RF power amplifier (PA) is driven towards saturation OUTPUT POWER Psat LINEAR REGION DPD GAIN EXPANSION DPD REGION LINEARIZED DPD + PA Maximum correctable power PA, WITH GAIN COMPRESSION INPUT POWER Operation near saturation inherently results in higher signal distortion + = DPD corrects PA nonlinearities resulting in higher performing power amplifiers 17

18 Agenda Key Test Challenges Addressing Test Challenges New emerging technologies such as envelope tracking and DPD and their implications Agilent s PA Reference Solution 18

19 RF Power Amplifier Test, Reference Solution Manufacturing / DVT N76XX Signal Studio Waveform Creation GUI examples & Test Libraries Software Envelope Generation RF signal with DPD M90XX Modular X-Series Measurement Applications M9381A PXIe Vector Signal Generator Hardware N6700B with N6782A (1 to 4) 4 channel SMU 33522B Arbitrary Waveform Generator 2 Envelope Proprietary Control RF In RFFE ETPS Vcc V.. V.. RF Out Vbat M9391A PXIe Vector Signal Analyzer M9018A PXIe Chassis M9036A Embedded Controller 19

20 X-Series Applications for Modular Products Cellular Communication LTE FDD LTE TDD W-CDMA/HSPA/HSPA+ GSM/EDGE/EDGE Evo TD-SCDMA/HSPA cdma2000/cdmaone 1xEV-DO Common algorithms, programming commands and shared library of measurement applications across X-Series signal analyzers and M9391A PXI VSA ensure consistent, repeatable results

21 Evaluation Software environment Software Reference solution added value RF PA Test Evaluation GUI Test Program: Test_WCDMA Test_LTE5MHz Test_LTE_10MHz Test_GSM Test_EVDO Test_WLAN Power Amp Test Library: Init_Instruments setupvsgvsa measpout Close_Instruments setupvsgvsafixedpin measstdacpr Load Waveforms servoinputpower measlteacpr measspecharms VSA & X-Seroes Measurement Applications Hardware M938xA IVI-COM Driver AgModularVsa IVI-COM Driver 21

22 RF PA Test Evaluation GUI C# Form Application Accelerates Evaluation Uses IVI-COM Driver for VSA/VSG Uses SCPI for X-Apps, AWG and Power Meter Power Servo, EVM, ACPR, SEM and Harmonics Measurements Control for ET ARB, RFFE Module and DC SMUs Data Logging + Test Times 22

23 LTE Envelope Tracking Setup Envelope Tracking uses 33522B AWG to play Envelope Signal Generated from Signal Studio Evaluation GUI settings DC Offset and Amplitude Nominal IQ Delay to Align RF and Envelope Signals hard coded Different values for different sample rate Offset from nominal Delay Manual Adjustment of IQ Delay from M938x SFP ACPR vs IQ delay test 23

24 Introducing the RF Power Amplifier Test Reference Solution with Envelope Tracking Highest test throughput, reduced cost, & rapid integration into power amplifier test environments Extremely fast modulation analysis, excellent accuracy and repeatability, and source code optimized for speed Fast EVM measurements < 50 ms, nom Fast Servo loop convergence < 5 ms, nom Fast ACPR measurements 0 ms, nom Key Features Adjustable RF signal/ envelope skew to ± 1 ps resolution over ± 250 ns range Real-time signal processing Test libraries and source code examples Benefits Tight synchronization between RF signal and envelope Fast measurements Easy evaluation and integration

25 Questions? 25

26 Agilent PA Test Coverage Over Lifecycle R&D D&V Production Modelling & simulation ADS PNA-X N6705B N6705B Waveform creation ADS Signal Studio Synchronised RF & envelope signal generation N8241A M8190A 33522B PA distortion testing 89600v17 PXA DSO9000 Measurement of instantaneous PAE Assumes customer provides current & voltage signals 89600v B Signal Studio Signal Studio Signal Studio MXG or M9381A 33522B MXA, M9391A, or M9393A VSA DSO with DSO9000 or MXA M9381A VSG 33522B AWG M9391A or M9393A VSA M9210A 26

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