Application Circuits 3. 3V R2. C4 100n G PI O. 0 G PI O S e t u p d a ta G PI O. 5 G PI O M o t i o n I n t G PI O. 4 G PI O.

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1 General Description The is an ultra-low power motion detector controller integrated circuit. The device is ideally suited for battery operated wireless motion sensors that make use of an MCU for handling communication. The MCU does not need to be active while the does continuous motion sensing. It only activates the external controller, when motion is detected. Motion is signaled through the push-pull output (INT). The criteria for motion detection are programmable and can be changed by the external controller. The interfaces directly with up to two conventional PIR sensors via a high impedance differential input. The PIR signal is converted to a bit digital value on chip. All signal processing is performed digitally. The is available in a SOIC- package. Ultra-Low Power Applications Wireless intruder detectors Battery powered door chimes Emergency lighting Motion and presence detection Features Programmable detection criteria and operating modes Digital signal processing On chip supply regulator for conventional PIR detectors Ultra Low power consumption Differential PIR sensor input Supply voltage measurement Temperature measurement Instantaneous settling after power up Application Circuits. V R2 C PI R LHI 9 C 0n C2 0n R M R 2. 2M B CR 202 U NP IR IN PI RI N TE ST E9. 9A-SO - VD D SE RI N I NT/ DO CI C S e t u p d a ta G PI O. 2 M o t i o n I n t G PI O. C G PI O. 0 G PI O. G PI O. 2 G PI O. R 0k P C M d a ta SW Tamper / Learn R 0k 0R R k IN 2 O UT Q BF S-A R 0R C. 2p C. 2p C 0p SA W SAW R90 Antenna Fig : Wireless Intruder Detector 0/20 Rev..

2 LHI 9 PI R PI R2 C2 C 0n C C 0n R M C R2 2. 2M U VD D NP IR IN SE RI N PI RI N I NT/ DO CI TE ST E9. 9A-SO - U2 VD D NP IR IN SE RI N 2 G PI O. G PI O. G PI O. G PI O. C G PI O. 0 G PI O. G PI O. 2 SW Tamper / Learn R 0k P CM data R k. V B. V IN 2 R 0R Q BF S-A SA W SAW R90 Antenna C. 2p LHI 9 C 0n 0n R M R 2. 2M PI RI N I NT/ DO CI TE ST E9. 9A-SO - 2 R 0k O UT R9 0R C9. 2p C0 0p Fig 2: Wireless Intruder Detector with Two Controllers C. V CL D + C B. V C SW PI R LHI 9 C2 0n C 0n R M R2 2. 2M U VD D NP IR IN SE RI N PI RI N I NT/ DO CI TE ST E9. 9A-SO - S e t u p d a ta G PI O. 2 2 M o t i o n I n t G PI O. G PI O. 0 Vin SH DN SW FB G ND 2 Fig : Emergency Lighting. V C B. V C R k PZ Piezoelectric S ounder PI R LHI 9 C2 0n C 0n R M R2 2. 2M U VD D NP IR IN SE RI N PI RI N I NT/ DO CI TE ST E9. 9A-SO - 2 S etup D AT A 2 GPIO.2 Motio n IN T GPIO. GPIO.0 Mel ody R k Q BC 9 Fig : Door Chime Page 2 of 0/20 Rev..

3 Electrical Characteristics Absolute Maximum Ratings Parameter Symbol Min Max Unit Remarks Supply Voltage V DD -0.. V Current into any pin ma One pin at a time Storage Temperature T ST - 2 C Table : Electrical Characteristics (Stresses beyond those listed above may cause permanent damage to the device. Exposure to absolute maximum ratings may affect the device reliability. ESD protection: all pins will be able to withstand a discharge of a 00pF capacitor charged to.kv through a 00Ω series resistor. Test method: MIL-STD-D method 0). Operating Conditions (T=2ºC, unless stated otherwise) Parameter Symbol Min Typ Max Unit Remarks Operating Temperature Operating temperature range -0 C Operating Voltage Supply Voltage V DD 2.. V Supply Current Supply current, V PIR Regulator On I DD µa VDD=V, no load Supply current, V PIR Regulator Off I DD µa VDD=V, no load Voltage Regulator VPIR Regulator voltage V DP 2.2 V I R = ua Regulator Output Current I R 0 µa Input SERIN Input low voltage V IL 0.2 V DD Input high voltage V IH 0. V DD Input Current I I - µa V SS<V IN<V DD Data clock low time t L 200 ns Data clock high time t H 200 ns Data bit write time t BW 2/F CLK µs Write timeout t WL /F CLK µs Input / Output INT/DOCI Input low voltage V IL 0.2 V DD Input high voltage V IH 0. V DD Output current high I OH µa V OUT = V SS Output current low I OL µa V OUT = V DD Input Capacitance pf Force read setup time t FR 2/F CLK Time to clear interrupt t CL 2/F CLK Data clock low time t L 200 t RA ns Data clock high time t H 200 ns Data bit settling time, DOCI out t bit µs CLOAD = 0pF Read timeout t RA /F CLK µs Page of 0/20 Rev..

4 PIRIN / NPIRIN Inputs PIRIN /NPIRIN input resistance to V SS 0 0 GΩ -0mV < VIN < 0mV PIRIN /NPIRIN input resistance differential 0 20 GΩ -0mV < VIN < 0mV PIRIN input voltage range - mv Resolution.9..2 µv/count ADC output range 2^- Counts ADC Offset Counts ADC Noise referred to Input Hz F = 0.Hz.. 0Hz Supply Voltage Measurement Resolution µv/count ADC output range 2^ 2^- counts Temperature Measurement Resolution 0 Counts/K ADC output range 2^- Counts Value at 00K Counts Oscillator and Filter LPF cutoff frequency F CLK *. / 20 / PI Hz HPF cutoff frequency F CLK / *. / 20 / PI Hz On chip oscillator frequency F OSC khz System Clock F CLK F OSC/2 Table 2: Operating Conditions Detailed Description PIRIN NPIRIN MUX ADC LPF HPF Comparator & Alarm Event Logic INT/DOCI VDD VPIR OSC Voltage Reg Test & Control Logic Output Serial Interface Parameter Serial Interface SERIN VSS Band Gap Voltage Ref Fig : Block diagram of MUX The multiplexer selects the source signal for the ADC. It can select between the differential PIR inputs, differential temperature sensor output and asymmetrical supply voltage divider. Page of 0/20 Rev..

5 Voltage Regulator The integrated voltage regulator provides a regulated 2.2V supply for an externally connected conventional PIR detector. The regulator can be activated through the control register. Bandgap Voltage Reference The bandgap voltage reference provides constant reference currents and voltages to the analog circuitry on chip across the specified operating temperature range of the device. In addition, it contains a temperature voltage generator (temperature sensor). Oscillator The IC contains an on chip low power oscillator. The frequency is set to khz. The timing signals and cutoff frequencies of the digital filters are derived from this frequency. Band-Pass Filter A 2nd order low-pass filter with a cut-off frequency of Hz eliminates unwanted higher frequency components. This signal is then passed to a 2 nd order high pass filter with a 0.Hz cut-off frequency. Both filter output are accessible through the serial interface. Alarm Event Logic The signal from the band pass filter is rectified. When the signal level exceeds the sensitivity threshold, an internal pulse is generated. Subsequent pulses are counted, whenever the signals changes sign and exceeds the threshold again. The conditions for an alarm event such as the amount of pulses as well as the time window in which the pulses occur are programmable. If an alarm event is cleared by resetting the interrupt, any motion detection is stopped during the programmable blind time. This feature is important to prevent self-triggering in applications, where high detection sensitivity is required. The interrupt will be cleared by driving a "0" (<0.V) for at least s (t CL). Thereafter, the processor can switch the port back to high impedance. PIR signal MCU in sleep mode MCU wakes up Possible noise from RF MCU in sleep mode Motion detect active INT E9.9 MCU busy RF comms INT MCU Programmable blind time Fig : Motion detection events t CL Serial Interface The device setup is done by programming setup registers via the SERIN pin. A simple clocked data-in protocol is used. Information from the device is read out with the INT/DOCI pin. A similar clocked data-out protocol is used. The accepts new data, whenever the SERIN has been at low level for at least system clocks and the supply voltage is above 2V. Page of 0/20 Rev..

6 Configuration Register The device contains a configuration register. Write access is through the serial input. Read access is performed through the interrupt output. The following parameters can be adjusted through the control / configuration registers:. Sensitivity The sensitivity / detection threshold is defined with the register value. The resolution of the register is.µv. The threshold is [Register Value] *.µv 2. Blind Time Ignores motion after the interrupt output is switched back to 0 Range: 0.s... s. The blind time is [Register Value] *0.s. Programmable pulse counter... pulses with sign change in between Amount of pulses = [Register Value] +. Window time For noisy environments 2s... s window Window time = [Register Value] * 2s + 2s. Motion Detect Enable 0 = disable, = enabled. Interrupt Source The interrupt source can be selected between Motion (default) or ADC Decimation Filter. If the decimation filter is selected, interrupts are generated every ms. 0 = Motion, = Filter The Interrupt can be switched off by setting the mask bit to Motion and switching off the motion detector function.. Voltage Source There is only one ADC integrated on chip. The following source voltages are selectable for the ADC: PIR Signal, BFP Output = 0 PIR Signal, LPF Output = Chip Supply Voltage = 2 On Chip Temperature Sensor = For Motion Detector Mode, 0 or has to be selected.. Supply Regulator Enable for conventional PIR Detector (2.2V) Supply a regulated 2.2V on the V REG output. = disabled, 0 = enabled 9. Start Self-Test Initiates PIR self-test procedure that takes 2seconds to complete. 0 to change = start 0. Sample Capacitor Value For different size pyro ceramics, different sample capacitors can be selected for the pyro ceramic test. Input Clamp = PIR inputs are grounded for fast settling during offset measurement 2. User test-mode Reserved, program with 0 Page of 0/20 Rev..

7 Serial Data Input The configuration data is transferred into the device via the serial input. The external microcontroller has to generate a zero to one transition on the SERIN input and subsequently apply the data bit value (0/). The zero and one time for the transition can be very short ( instruction cycle of the microcontroller). The data bit value must be applied for at least 2 system clocks (t bit) of the. Whenever the transfer of data bits is interrupted for a period greater than system clocks (t R), the last data received is latched into the configuration register. The transmission of a 2 bit data should not be interrupted for more than system clocks, as the device may latch the data already at this stage. Bit N Bit N- Bit N-2 Bit 0 Bit N Bit N- t L Data Bit Data Clock T BW t WL T H Fig : Serial Data clocked into device by MCU Page of 0/20 Rev..

8 Serial Data Output / Interrupt The serial output serves as an Interrupt output, indicating motion and as a serial output for reading status and configuration data from the circuit. Read Procedure The accepts readout with MCU defined timing. The MCU has to force DOCI to a high level for the duration of more than 2 device clock cycles (t FR) and subsequently read out the data bits as described in the timing diagram below. Reading can be terminated at any time by forcing the DOCI line to 0 for at least system clock cycles. Force Read Bit [N] Bit [N-] Bit [N-2] t FR t B t RA if Bit=0 µc senses signal t H t L t RA if Bit=0 µc drives signal Fig : Timing diagram for the DOCI interface The interrupt source for the DOCI/INT output can be selected between the ADC and the motion detect logic. If the ADC is selected, an interrupt is produced every 2 system clocks. Force Read Bit [N] Bit [N-] Bit [N-2] t FR t B t RA if Bit=0 µc senses signal t H t L t RA if Bit=0 µc drives signal Fig 9: Timing diagram for the DOCI interface If the Interrupt Source bit is 0 and Motion Detect Enable bit is the interrupt will be set when motion is detected. No interrupt will be generated while the microcontroller accesses the interface. Status and Configuration Data The PIR voltage as well as all internal data can be read through the DOCI interface. The sequence of the data is fixed due to priority. The device outputs the PIR voltage value first, followed by status and configuration information. It is not required to read all data Status & Configuration Fig 0: Data words available on DOCI interface Page of 0/20 Rev..

9 Bit-No Register Remarks [9] [0] PIR out of range Indicates, that Sensor Ceramic was discharged [:2] [:0] PIR Voltage,.µV/cnt LPF or BPF output, depending on configuration [2:] [:0] Sensitivity The values defines threshold for detection [:] [:0] Blind Time No motion detection for the time programmed, after the interrupt output changed from H to L [2:] [:0] Pulse Counter Amount of pulses during the specified time window which triggers an alarm event (interrupt = H ) [0:9] [:0] Window Time The specified time window in which the amount of pulses will trigger an alarm event (interrupt = H ) [] [0] Motion detector Enable [] [0] Interrupt Source 0 = Motion, = Filter [:] [:0] ADC / Filter Voltage source 0 = PIR (HPF), = PIR, 2 = Supply Voltage, Table : Register values and corresponding parameters = Temperature Sensor [] [0] Supply Regulator Enable 0 = Switches on supply voltage regulator for conventional detector [] [0] Start Self-Test Initiates PIR self-test procedure [2] [0] Sample capacitor size = 2 * default capacitance [] [] Clamp Input = clamp PIR input for quick offset measurement [0] [0] User test-mode select Test mode PIR Voltage Measurement a) LPF Output The ADC Source [:] has to be switched to the PIR inputs and the digital LPF output needs to be selected (=). V PIR = (ADC_out ADC_offset) *.µv. b) HPF Output The ADC Source [:] has to be switched to PIR input and the digital HPF output needs to be selected (=0). V PIR = ADC_out *.µv. Supply Voltage Measurement The ADC Source [:] has to be switched to Chip Supply (=2). V DD = (ADC_out ADC_offset) * 0µV. Temperature Measurement The ADC Source [:] has to be switched to the temperature sensor (=). Temperature = Tcal + (ADC_out ADC_offset(Tcal)) / 0 * counts/k ADC_offset = ADC VIN = 0, typical value = 2^ ADC_offset(Tcal) = ADC value at defined ambient temperature, typical value = 00@00K Page 9 of 0/20 Rev..

10 SOIC Pin Out Pin Name Pin Number Description V SS Negative supply voltage INT/DOCI 2 Soft driver, MCU interface, Data Out Clock In, or Interrupt out SERIN Input, MCU interface V DD Supply voltage V PIR Regulated supply voltage for conventional PIR Detector NPIRIN Positive PIR sensor input PIRIN Negative PIR sensor input TEST Test input, connect to VSS Table : Pin Out V SS TEST INT/DOCI 2 PIRIN SERIN NPIRIN V DD V PIR Layout and Pads VDD SERIN DOCI VSS Pad Name X Y V SS INT/DOCI SERIN V DD V PIR NPIRIN PIRIN V SS TEST Database VPIR Y X Table : Pad positions in mm NPIRIN PIRIN VSS TEST Fig : Die with pad names Page 0 of 0/20 Rev..

11 Revision History Rev. Date Remarks.0 November 2, 20. April, 20 Window Time Calculation (s..s to 2s.. s), Page.2 June, 20 E9.9A to Page and Page. July, 20 Page output current DOCI. July 2, 20 Fig, 2, and NPIRIN and PIRIN swapped. Contact Information (PTY) Ltd. Pretoria, South Africa Tel: +2 (2) 99 Fax: +2 (2) sales@mos.co.za Visit our website for the latest information Page of 0/20 Rev..